TW201614754A - Substrate processing device - Google Patents
Substrate processing deviceInfo
- Publication number
- TW201614754A TW201614754A TW104127097A TW104127097A TW201614754A TW 201614754 A TW201614754 A TW 201614754A TW 104127097 A TW104127097 A TW 104127097A TW 104127097 A TW104127097 A TW 104127097A TW 201614754 A TW201614754 A TW 201614754A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- processing container
- substrate processing
- processing device
- partition
- Prior art date
Links
- 239000000758 substrate Substances 0.000 title abstract 5
- 238000005192 partition Methods 0.000 abstract 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Plasma & Fusion (AREA)
- Drying Of Semiconductors (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014169222A JP2016046365A (ja) | 2014-08-22 | 2014-08-22 | 基板処理装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201614754A true TW201614754A (en) | 2016-04-16 |
Family
ID=55350679
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW104127097A TW201614754A (en) | 2014-08-22 | 2015-08-20 | Substrate processing device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2016046365A (zh) |
TW (1) | TW201614754A (zh) |
WO (1) | WO2016027734A1 (zh) |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3471032B2 (ja) * | 1991-12-27 | 2003-11-25 | アネルバ株式会社 | 薄膜堆積装置 |
JP2003100721A (ja) * | 2001-09-27 | 2003-04-04 | Matsushita Electric Ind Co Ltd | プラズマ処理装置 |
JP4399206B2 (ja) * | 2003-08-06 | 2010-01-13 | 株式会社アルバック | 薄膜製造装置 |
JP2009054720A (ja) * | 2007-08-24 | 2009-03-12 | Tokyo Electron Ltd | 処理装置 |
JP2011146434A (ja) * | 2010-01-12 | 2011-07-28 | Nippon Telegr & Teleph Corp <Ntt> | Cvd装置 |
-
2014
- 2014-08-22 JP JP2014169222A patent/JP2016046365A/ja active Pending
-
2015
- 2015-08-11 WO PCT/JP2015/072745 patent/WO2016027734A1/ja active Application Filing
- 2015-08-20 TW TW104127097A patent/TW201614754A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
JP2016046365A (ja) | 2016-04-04 |
WO2016027734A1 (ja) | 2016-02-25 |
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