TW201609429A - Glass laminate and support substrate equipped with inorganic film, method for manufacturing said glass laminate and said support substrate, and method for manufacturing electronic device - Google Patents

Glass laminate and support substrate equipped with inorganic film, method for manufacturing said glass laminate and said support substrate, and method for manufacturing electronic device Download PDF

Info

Publication number
TW201609429A
TW201609429A TW104124982A TW104124982A TW201609429A TW 201609429 A TW201609429 A TW 201609429A TW 104124982 A TW104124982 A TW 104124982A TW 104124982 A TW104124982 A TW 104124982A TW 201609429 A TW201609429 A TW 201609429A
Authority
TW
Taiwan
Prior art keywords
inorganic film
support substrate
film
substrate
inorganic
Prior art date
Application number
TW104124982A
Other languages
Chinese (zh)
Inventor
Teruo Fujiwara
Masato KAMEDA
guang-yao Niu
Masahiro Kishi
Yosuke Akita
Yoshitaka Matsuyama
Original Assignee
Asahi Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Co Ltd filed Critical Asahi Glass Co Ltd
Publication of TW201609429A publication Critical patent/TW201609429A/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B17/00Layered products essentially comprising sheet glass, or glass, slag, or like fibres
    • B32B17/06Layered products essentially comprising sheet glass, or glass, slag, or like fibres comprising glass as the main or only constituent of a layer, next to another layer of a specific material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B3/00Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
    • B32B3/10Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material
    • B32B3/14Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a discontinuous layer, i.e. formed of separate pieces of material characterised by a face layer formed of separate pieces of material which are juxtaposed side-by-side
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B9/00Layered products comprising a layer of a particular substance not covered by groups B32B11/00 - B32B29/00
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00Surface treatment of glass, not in the form of fibres or filaments, by etching
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C17/00Surface treatment of glass, not in the form of fibres or filaments, by coating
    • C03C17/22Surface treatment of glass, not in the form of fibres or filaments, by coating with other inorganic material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Laminated Bodies (AREA)
  • Surface Treatment Of Glass (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

The present invention pertains to a support substrate equipped with an inorganic film and characterised by: having a support substrate and an inorganic film which is formed on the support substrate; the inorganic film comprising a plurality of island parts interspersed on the support substrate; and having exposed parts of the support substrate where the inorganic film has not been formed, which are connected to the outside in the direction of the surface of the support substrate or having protrusions and recessions comprising a plurality of protruding parts that comprise thick sections and further comprising recessed parts that comprise thin sections, said recessed parts being connected to the outside in the direction of the surface of the support substrate. The support substrate equipped with an inorganic film adheres well to a glass substrate, with which a device is formed, and is capable of preventing the occurrence of bubbles between the inorganic film and the glass substrate when processing is performed at a high temperature.

Description

附無機膜之支撐基板與玻璃積層體、以及彼等之製造方法與電子裝置之製造方法 Support substrate and glass laminate with inorganic film, and manufacturing method therefor and electronic device manufacturing method

本發明係關於一種於使用玻璃基板製造液晶面板或有機EL(Electroluminescence,電致發光)面板等電子裝置時所使用之附無機膜之支撐基板與於該附無機膜之支撐基板上積層玻璃基板而成之玻璃積層體、以及彼等之製造方法與電子裝置之製造方法。 The present invention relates to a support substrate with an inorganic film used for manufacturing an electronic device such as a liquid crystal panel or an organic EL (Electroluminescence) panel using a glass substrate, and a glass substrate laminated on the support substrate with the inorganic film. The glass laminate, and the manufacturing method thereof and the manufacturing method of the electronic device.

近年來,太陽電池(PV(Photovoltaic,光伏))、液晶面板(LCD(Liquid Crystal Display,液晶顯示器))、有機EL面板(OLED(Organic Light Emitting Diode,有機發光二極體))等電子裝置(電子機器)之薄型化、輕量化不斷發展。與此對應,不斷推進用於該等電子裝置之玻璃基板之薄板化。 In recent years, electronic devices such as photovoltaic cells (PV), liquid crystal displays (LCDs), and organic EL panels (OLED (Organic Light Emitting Diodes)) The thinning and light weight of electronic equipment are constantly evolving. In response to this, the thinning of the glass substrate for the electronic devices is continuously advanced.

另一方面,若因薄板化而導致玻璃基板之強度不足,則於電子裝置之製造步驟中,玻璃基板之處理性會下降。 On the other hand, if the strength of the glass substrate is insufficient due to the thinning, the rationality of the glass substrate is lowered in the manufacturing process of the electronic device.

因此,最近,為了應對上述課題,而於以支撐基板支撐玻璃基板之狀態下,在玻璃基板上製造電子裝置。例如,提出有如下方法:準備於玻璃製之支撐基板上形成無機膜(吸附膜)而成之附無機膜之支撐基板,作為於該支撐基板之無機膜上積層玻璃基板並使其密接而成之積層體,於該積層體之玻璃基板上製造電子裝置之後,將玻璃基板自積層體剝離(專利文獻1及2)。 Therefore, recently, in order to cope with the above problems, an electronic device is manufactured on a glass substrate in a state in which a glass substrate is supported by a support substrate. For example, a support substrate having an inorganic film (adsorption film) formed on a support substrate made of glass is prepared, and a glass substrate is laminated on the inorganic film of the support substrate to be adhered thereto. After the electronic device is fabricated on the glass substrate of the laminate, the laminate is peeled off from the laminate (Patent Documents 1 and 2).

根據該等方法,揭示有如下意旨:即便使用薄膜之玻璃基板, 亦可提高處理性,實現適當之定位,並且於特定之處理後,亦可容易地自積層體剝離配置有元件之玻璃基板。 According to these methods, it is revealed that even if a thin glass substrate is used, It is also possible to improve the handleability, achieve proper positioning, and, after a specific treatment, easily peel the glass substrate on which the component is disposed from the laminate.

又,於專利文獻3中,揭示有如下意旨:於在由支撐基板支撐之玻璃基板上製造電子裝置時,於支撐基板之與玻璃基板之接觸面例如交替地設置帶狀之粗糙面與帶狀之平滑面等,藉此設置接著力相對較強之區域與較弱之區域,由此可更容易地實現玻璃基板自積層體之剝離。 Further, Patent Document 3 discloses that when an electronic device is manufactured on a glass substrate supported by a support substrate, a strip-like rough surface and a strip shape are alternately provided on a contact surface of the support substrate with the glass substrate, for example. By smoothing the surface or the like, a region having a relatively strong adhesion force and a weak region are provided, whereby peeling of the glass substrate from the laminate can be more easily achieved.

先前技術文獻 Prior technical literature 專利文獻 Patent literature

專利文獻1:日本專利特開2011-184284號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2011-184284

專利文獻2:日本專利特開2011-201725號公報 Patent Document 2: Japanese Patent Laid-Open No. 2011-201725

專利文獻3:日本專利特開2011-162432號公報 Patent Document 3: Japanese Patent Laid-Open No. 2011-162432

另外,近年來,伴隨著電子裝置之高性能化之要求,於製造電子裝置時,期望實施更高溫條件下(例如,450℃以上)之處理。 Further, in recent years, with the demand for high performance of electronic devices, it is desirable to perform processing under higher temperature conditions (for example, 450 ° C or higher) when manufacturing an electronic device.

然而,先前之於附無機膜之支撐基板上積層玻璃基板而成之積層體係若進行450℃以上之高溫處理、特別是如500~600℃之高溫處理,則存在如下情形:附著或者包含於玻璃基板或無機膜之氣體被釋放,從而於玻璃基板與無機膜之間產生多個氣泡。 However, if a laminated system in which a glass substrate is laminated on a support substrate with an inorganic film is subjected to a high temperature treatment at 450 ° C or higher, particularly, a high temperature treatment such as 500 to 600 ° C, there is a case where it is attached or contained in the glass. The gas of the substrate or the inorganic film is released, thereby generating a plurality of bubbles between the glass substrate and the inorganic film.

又,先前之附無機膜之支撐基板亦存在如下情形:於在無機膜之表面積層玻璃基板時,密接性較差。即,亦存在如下情形:即便將支撐基板之無機膜與玻璃基板重疊,彼等不僅不會自然地密接,而且即便進行機械加壓亦不會密接,或者反而會意外剝離。 Further, the support substrate with the inorganic film described above is also inferior in adhesion to the glass substrate on the surface layer of the inorganic film. In other words, even if the inorganic film of the support substrate is overlapped with the glass substrate, they are not intimately adhered to each other, and they are not adhered to each other even by mechanical pressurization, or may be accidentally peeled off.

本發明之目的在於解決此種先前技術之問題,且在於提供一種抑制進行高溫下之處理時之玻璃基板與無機膜之間之發泡、進而無機 膜與玻璃基板之密接性亦良好的附無機膜之支撐基板與於該附無機膜之支撐基板積層玻璃基板而成之玻璃積層體、以及該附無機膜之支撐基板與玻璃積層體之製造方法、進而電子裝置之製造方法。 The object of the present invention is to solve the problems of the prior art, and to provide a method for suppressing foaming between a glass substrate and an inorganic film when performing treatment at a high temperature, and further inorganic A glass laminate comprising a support substrate with an inorganic film and a support substrate on which the inorganic film is bonded, and a support substrate and a glass laminate for the inorganic film And a method of manufacturing an electronic device.

為了達成上述目的,本發明之附無機膜之支撐基板之第1態樣提供一種附無機膜之支撐基板,其特徵在於:具有支撐基板、及形成於上述支撐基板上之無機膜,且上述無機膜包含散佈於上述支撐基板上之複數個島部,未形成有上述無機膜之上述支撐基板之露出部於上述支撐基板之面方向上連接至外部。 In order to achieve the above object, a first aspect of the support substrate with an inorganic film of the present invention provides a support substrate with an inorganic film, comprising: a support substrate; and an inorganic film formed on the support substrate, and the inorganic The film includes a plurality of island portions spread on the support substrate, and an exposed portion of the support substrate on which the inorganic film is not formed is connected to the outside in a surface direction of the support substrate.

於此種本發明之附無機膜之支撐基板之第1態樣中,較佳為上述島部之高度為40nm以下。 In the first aspect of the support substrate with an inorganic film of the present invention, it is preferable that the height of the island portion is 40 nm or less.

又,較佳為上述島部係於端部之間隔為20μm以內之位置,形成其他島部。 Moreover, it is preferable that the island portion is formed at a position where the distance between the end portions is within 20 μm, and other island portions are formed.

又,較佳為上述島部之各者之面積為0.1~10000μm2Further, it is preferable that the area of each of the island portions is 0.1 to 10000 μm 2 .

進而,較佳為上述複數個島部之合計面積以相對於上述支撐基板之表面之面積率計為11~80%。 Furthermore, it is preferable that the total area of the plurality of island portions is 11 to 80% with respect to the area ratio of the surface of the support substrate.

又,本發明之附無機膜之支撐基板之第2態樣提供一種附無機膜之支撐基板,其特徵在於:具有支撐基板、及形成於上述支撐基板上之無機膜,且上述無機膜具有包含複數個凸部與凹部之凹凸,該等複數個凸部包含較厚之部分,該凹部包含較薄之部分,且上述凹部於上述支撐基板之面方向上連接至外部。 Moreover, the second aspect of the support substrate with an inorganic film of the present invention provides a support substrate with an inorganic film, comprising: a support substrate; and an inorganic film formed on the support substrate, wherein the inorganic film has The plurality of convex portions and the concave and convex portions, the plurality of convex portions including a thick portion, the concave portion including a thin portion, and the concave portion is connected to the outside in a direction of a surface of the support substrate.

於此種本發明之附無機膜之支撐基板之第2態樣中,較佳為上述凹凸之高度之差為40nm以下。 In the second aspect of the support substrate with an inorganic film of the present invention, it is preferable that the difference in height between the concavities and convexities is 40 nm or less.

又,較佳為上述凸部係於端部之間隔為20μm以內之位置形成其 他凸部。 Further, it is preferable that the convex portion is formed at a position where the distance between the end portions is within 20 μm. He is convex.

又,較佳為上述凸部之各者之面積為0.1~10000μm2Further, it is preferable that the area of each of the convex portions is 0.1 to 10000 μm 2 .

進而,較佳為上述複數個凸部之合計面積以相對於上述支撐基板之表面之面積率計為11~80%。 Further, it is preferable that a total area of the plurality of convex portions is 11 to 80% with respect to an area ratio of a surface of the support substrate.

又,本發明之玻璃積層體係提供一種於此種本發明之附無機膜之支撐基板之無機膜上積層玻璃基板而成的玻璃積層體。 Moreover, the glass laminate system of the present invention provides a glass laminate in which a glass substrate is laminated on the inorganic film of the support substrate with an inorganic film of the present invention.

又,本發明之附無機膜之支撐基板之製造方法的第1態樣係提供一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成包含無機物之膜,且對上述包含無機物之膜進行蝕刻,藉此形成包含散佈於上述支撐基板上之複數個島部的無機膜。 Further, a first aspect of the method for producing a support substrate with an inorganic film according to the present invention provides a method for producing a support substrate with an inorganic film, characterized in that a film containing an inorganic substance is formed on a surface of the support substrate, and The film containing the inorganic material is etched, thereby forming an inorganic film including a plurality of island portions spread on the support substrate.

又,本發明之附無機膜之支撐基板之製造方法的第2態樣係提供一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成包含無機物之膜,且對上述包含無機物之膜進行蝕刻,藉此於上述包含無機物之膜形成包含複數個凸部與凹部之凹凸,該等複數個凸部包含較厚之部分,該凹部包含較薄之部分。 Further, a second aspect of the method for producing a support substrate with an inorganic film of the present invention provides a method for producing a support substrate with an inorganic film, characterized in that a film containing an inorganic substance is formed on a surface of the support substrate, and The film containing the inorganic material is etched, whereby the film containing the inorganic material forms irregularities including a plurality of convex portions and concave portions, and the plurality of convex portions include thick portions, and the concave portions include thin portions.

進而,本發明之附無機膜之支撐基板之製造方法的第3態樣係提供一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成散佈複數個非形成部之樹脂膜,將上述樹脂膜作為遮罩而於上述支撐基板上成膜無機膜,其後去除上述樹脂膜。 Further, a third aspect of the method for producing a support substrate with an inorganic film of the present invention provides a method for producing a support substrate with an inorganic film, characterized in that a resin which spreads a plurality of non-formed portions is formed on the surface of the support substrate. In the film, an inorganic film is formed on the support substrate by using the resin film as a mask, and then the resin film is removed.

於此種本發明之附無機膜之支撐基板之製造方法的第3態樣中,較佳為於成膜上述樹脂膜之前,在上述支撐基板之表面成膜基底無機膜。 In the third aspect of the method for producing a support substrate with an inorganic film of the present invention, it is preferred that a base inorganic film is formed on the surface of the support substrate before the resin film is formed.

又,本發明之玻璃積層體之製造方法係提供一種於藉由此種本發明之製造方法製造附無機膜之支撐基板之後,於上述附無機膜之支撐基板之無機膜積層玻璃基板的玻璃積層體之製造方法。 Moreover, the method for producing a glass laminate according to the present invention provides a glass laminate of an inorganic film laminated glass substrate on the support substrate with the inorganic film after the support substrate with the inorganic film is produced by the production method of the present invention. The manufacturing method of the body.

進而,本發明之電子裝置之製造方法係提供一種電子裝置之製 造方法,其特徵在於:使用上述本發明之玻璃積層體之製造方法。 Furthermore, the method of manufacturing an electronic device of the present invention provides an electronic device system A method for producing a glass laminate according to the present invention described above.

使用此種本發明之附無機膜之支撐基板的玻璃積層體於在玻璃基板上形成電子裝置時,提供良好之密接性,並且即便於製造電子裝置時進行如超過450℃之高溫處理,亦可抑制在玻璃基板與無機膜之間產生氣泡。 The glass laminate using the support substrate with an inorganic film of the present invention provides good adhesion when forming an electronic device on a glass substrate, and can be processed at a high temperature of over 450 ° C even when manufacturing an electronic device. The generation of bubbles between the glass substrate and the inorganic film is suppressed.

10‧‧‧附無機膜之支撐基板 10‧‧‧Support substrate with inorganic film

12‧‧‧支撐基板 12‧‧‧Support substrate

14‧‧‧無機膜 14‧‧‧Inorganic film

16‧‧‧玻璃基板 16‧‧‧ glass substrate

20‧‧‧玻璃積層體 20‧‧‧Glass laminate

24‧‧‧無機膜 24‧‧‧Inorganic film

24a‧‧‧凸部 24a‧‧‧ convex

24b‧‧‧凹部 24b‧‧‧ recess

30‧‧‧附無機膜之支撐基板 30‧‧‧Support substrate with inorganic film

32‧‧‧樹脂膜 32‧‧‧ resin film

34‧‧‧膜 34‧‧‧ film

d‧‧‧間隔 D‧‧‧ interval

S‧‧‧圓 S‧‧‧ Round

t‧‧‧厚度 T‧‧‧thickness

圖1(A)係概念性地表示本發明之附無機膜之支撐基板之一例的俯視圖,圖1(B)係圖1(A)之b-b線概略剖視圖,圖1(C)係概念性地表示本發明之玻璃積層體之一例的側面之剖視圖,圖1(D)係概念性地表示本發明之附無機膜之支撐基板之另一例的側面之剖視圖。 Fig. 1(A) is a plan view schematically showing an example of a support substrate with an inorganic film of the present invention, and Fig. 1(B) is a schematic cross-sectional view taken along line bb of Fig. 1(A), and Fig. 1(C) conceptually A cross-sectional view showing a side view of an example of the glass laminate of the present invention, and Fig. 1(D) is a cross-sectional view conceptually showing a side view of another example of the support substrate with an inorganic film of the present invention.

圖2係概念性地表示本發明之附無機膜之支撐基板之另一例的俯視圖。 Fig. 2 is a plan view conceptually showing another example of the support substrate with an inorganic film of the present invention.

圖3(A)~圖3(F)係用以說明本發明之附無機膜之支撐基板及玻璃積層體之製造方法之一例的概念圖,圖3(A)係側面之剖視圖,圖3(B)係俯視圖,圖3(C)係圖3(B)之c-c線剖視圖,圖3(D)~圖3(F)係側面之剖視圖。 3(A) to 3(F) are conceptual views for explaining an example of a method for producing an inorganic film-attached support substrate and a glass laminate according to the present invention, and Fig. 3(A) is a cross-sectional view of the side surface, and Fig. 3 (Fig. 3) B) is a plan view, FIG. 3(C) is a cross-sectional view taken along line cc of FIG. 3(B), and FIGS. 3(D) to 3(F) are cross-sectional views of the side.

以下,基於隨附圖式所示之較佳實施例,詳細地對本發明之附無機膜之支撐基板與玻璃積層體、以及本發明之附無機膜之支撐基板之製造方法與玻璃積層體之製造方法、進而電子裝置之製造方法進行說明。 Hereinafter, the manufacturing method of the inorganic substrate-supporting substrate and the glass laminate of the present invention, and the inorganic substrate-supporting substrate of the present invention and the manufacture of the glass laminate are described in detail based on the preferred embodiments shown in the accompanying drawings. The method and the method of manufacturing the electronic device will be described.

於圖1(A)及圖1(B)中,概念性地表示本發明之附無機膜之支撐基板之一例。再者,圖1(A)係本發明之附無機膜之支撐基板之俯視圖,圖1(B)係圖1(A)之b-b線概略剖視圖。 1(A) and 1(B), an example of a support substrate with an inorganic film of the present invention is conceptually shown. 1(A) is a plan view of a support substrate with an inorganic film of the present invention, and FIG. 1(B) is a schematic cross-sectional view taken along line b-b of FIG. 1(A).

本發明之附無機膜之支撐基板10係於製造使用玻璃基板之電子 裝置等時,被用作支撐玻璃基板之支撐基板者,基本上包含支撐基板12與無機膜14。 The support substrate 10 with an inorganic film of the present invention is used for manufacturing an electron using a glass substrate When the device or the like is used as the support substrate for supporting the glass substrate, the support substrate 12 and the inorganic film 14 are basically included.

如於圖1(C)中概念性地表示般,此種附無機膜之支撐基板10係於無機膜14積層玻璃基板16並使其密接,而製成本發明之玻璃積層體20,用於製造使用玻璃基板16之電子裝置。 As shown conceptually in FIG. 1(C), such an inorganic film-attached supporting substrate 10 is laminated on a glass substrate 16 of an inorganic film 14 and adhered thereto to form a glass laminate 20 of the present invention for use in manufacturing. An electronic device using the glass substrate 16 is used.

此處,於本發明之附無機膜之支撐基板10中,無機膜14係以散佈成島狀之方式圖案化而形成,且支撐基板12之露出部(支撐基板12之未形成無機膜14之部分)係以於支撐基板12之面方向上連接(連通)至附無機膜之支撐基板10(下述玻璃積層體20)之外部之方式形成。關於該方面將於下文詳細敍述。 Here, in the support substrate 10 with an inorganic film of the present invention, the inorganic film 14 is formed by patterning in an island shape, and the exposed portion of the support substrate 12 (the portion of the support substrate 12 where the inorganic film 14 is not formed) It is formed so as to be connected (connected) to the outside of the support substrate 10 (the following glass laminate 20) with the inorganic film in the surface direction of the support substrate 12. This aspect will be described in detail below.

支撐基板12於圖1(C)所示之玻璃積層體20中,主要支撐玻璃基板16,防止玻璃基板16之損傷或變形。 The support substrate 12 mainly supports the glass substrate 16 in the glass laminate 20 shown in FIG. 1(C) to prevent damage or deformation of the glass substrate 16.

於本發明之附無機膜之支撐基板10中,支撐基板12可利用玻璃基板、塑膠基板、SUS(Steel Use Stainless,日本不鏽鋼標準)基板等金屬基板等各種板材(板狀物)。 In the support substrate 10 with an inorganic film of the present invention, various types of plate members (plate-like members) such as a glass substrate, a plastic substrate, and a metal substrate such as a SUS (Steel Use Stainless) substrate can be used as the support substrate 12.

此處,於製造利用玻璃積層體20之電子裝置時,於具有伴隨熱處理之步驟之情形時,支撐基板12較佳為由與玻璃基板16之線膨脹係數之差較小之材料形成。 Here, in the case of manufacturing an electronic device using the glass laminate 20, the support substrate 12 is preferably formed of a material having a small difference in linear expansion coefficient from the glass substrate 16 in the case of a step accompanying the heat treatment.

具體而言,支撐基板12與玻璃基板16之25~300℃下之平均線膨脹係數(以下,簡稱為「平均線膨脹係數」)之差較佳為500×10-7/℃以下,更佳為300×10-7/℃以下,特佳為200×10-7/℃以下。 Specifically, the difference between the average linear expansion coefficient (hereinafter simply referred to as "average linear expansion coefficient") of the support substrate 12 and the glass substrate 16 at 25 to 300 ° C is preferably 500 × 10 -7 / ° C or less, more preferably of 300 × 10 -7 / ℃ or less, particularly preferably 200 × 10 -7 / ℃ or less.

藉由將支撐基板12與玻璃基板16之平均線膨脹計數之差設為500×10-7/℃以下,而於電子裝置之形成步驟中之加熱冷卻時,可防止玻璃積層體20強烈地翹曲。 By setting the difference between the average linear expansion counts of the support substrate 12 and the glass substrate 16 to 500 × 10 -7 /° C or less, it is possible to prevent the glass laminate 20 from being strongly warped during heating and cooling in the forming step of the electronic device. song.

若考慮以上方面,則支撐基板12較佳為由與玻璃基板16相同之材料形成,支撐基板12更佳為玻璃基板。特佳為支撐基板12係包含與 玻璃基板16相同之玻璃材料之玻璃基板。 In consideration of the above, the support substrate 12 is preferably formed of the same material as the glass substrate 16, and the support substrate 12 is more preferably a glass substrate. Particularly good for the support substrate 12 is included A glass substrate of the same glass material as the glass substrate 16.

支撐基板12之厚度可較下述玻璃基板16厚,亦可較其薄,或者亦可與其相同。 The thickness of the support substrate 12 may be thicker than the glass substrate 16 described below, or may be thinner or the same.

較佳為,基於玻璃基板16之厚度、無機膜14之厚度、及下述玻璃積層體20之厚度,選擇支撐基板12之厚度。例如,於電子裝置之製造步驟係設計為處理0.5mm之基板者,且玻璃基板16之厚度與無機膜14之厚度之和為0.1mm之情形時,將支撐基板12之厚度設為0.4mm。 Preferably, the thickness of the support substrate 12 is selected based on the thickness of the glass substrate 16, the thickness of the inorganic film 14, and the thickness of the glass laminate 20 described below. For example, when the manufacturing step of the electronic device is designed to handle a substrate of 0.5 mm, and the sum of the thickness of the glass substrate 16 and the thickness of the inorganic film 14 is 0.1 mm, the thickness of the support substrate 12 is set to 0.4 mm.

於通常之情形時,支撐基板12之厚度較佳為0.2~5mm。 In the usual case, the thickness of the support substrate 12 is preferably 0.2 to 5 mm.

再者,於支撐基板12為玻璃基板之情形時,就易於處理且不易破裂等理由而言,支撐基板12之厚度較佳為0.08mm以上。又,就於在形成電子裝置用構件後進行剝離時,期望如不破裂而適度地撓曲之剛性之理由而言,玻璃基板之厚度較佳為1.0mm以下。 Further, when the support substrate 12 is a glass substrate, the thickness of the support substrate 12 is preferably 0.08 mm or more for reasons of easy handling and difficulty in cracking. In addition, when peeling is performed after forming a member for an electronic device, it is desirable that the thickness of the glass substrate is 1.0 mm or less for the reason that the rigidity is appropriately flexed without being broken.

於附無機膜之支撐基板10中,在支撐基板12之一表面(主面之1面)形成無機膜14。 In the support substrate 10 with an inorganic film, an inorganic film 14 is formed on one surface (one surface of the main surface) of the support substrate 12.

無機膜14係用以於附無機膜之支撐基板10積層玻璃基板16並使該玻璃基板16可剝離地密接之膜(吸附膜)。換言之,無機膜14係如下之膜:具有易剝離性,且具備於附無機膜之支撐基板10積層、密接(貼合)玻璃基板16並保持之功能。 The inorganic film 14 is a film (adsorption film) in which the glass substrate 16 is laminated on the support substrate 10 with the inorganic film and the glass substrate 16 is peelably adhered. In other words, the inorganic film 14 is a film having a function of being easily peelable, and having a function of laminating and adhering (bonding) the glass substrate 16 to the support substrate 10 with the inorganic film.

無機膜14顯示優異之耐熱性。因此,即便將玻璃積層體20暴露於高溫條件下,層本身亦不易產生化學變化,與下述玻璃基板16之間亦不易產生化學結合,且不易產生因重剝離化而導致之無機膜14向玻璃基板16之附著。再者,所謂重剝離化係指無機膜14與玻璃基板16之界面之剝離強度大於支撐基板12與無機膜14之界面之剝離強度、及無機膜14之材料本身之強度(主體強度)中之任一者。若於無機膜14與玻璃基板16之界面產生重剝離化,則無機膜14之成分易附著在玻璃基板16表面,從而其表面之潔淨化易變得困難。所謂無機膜14向玻璃基板 16表面之附著係指如下等情形:無機膜14整體附著於玻璃基板16表面;及無機膜14表面損傷而無機膜14表面之成分之一部分附著於玻璃基板16表面。 The inorganic film 14 exhibits excellent heat resistance. Therefore, even if the glass laminate 20 is exposed to high temperature conditions, the layer itself is less likely to undergo chemical change, and chemical bonding is less likely to occur between the glass substrate 16 described below, and the inorganic film 14 is less likely to be caused by heavy peeling. Adhesion of the glass substrate 16. In addition, the term "heavy peeling" means that the peel strength at the interface between the inorganic film 14 and the glass substrate 16 is greater than the peel strength of the interface between the support substrate 12 and the inorganic film 14, and the strength (body strength) of the material itself of the inorganic film 14. Either. When the interface between the inorganic film 14 and the glass substrate 16 is heavily peeled off, the components of the inorganic film 14 tend to adhere to the surface of the glass substrate 16, and the surface thereof is easily cleaned. The inorganic film 14 is directed to the glass substrate The adhesion of the surface of the 16 is the case where the inorganic film 14 as a whole adheres to the surface of the glass substrate 16 and the surface of the inorganic film 14 is damaged and a part of the surface of the inorganic film 14 is partially adhered to the surface of the glass substrate 16.

無機膜14可利用公知之附無機膜之支撐基板中所利用之包含各種無機化合物者,該公知之附無機膜之支撐基板係於製造電子裝置等時,用以支撐形成電子裝置之玻璃基板。 The inorganic film 14 can be made of a conventionally used inorganic film-containing supporting substrate which is used for supporting an electronic device or the like to support a glass substrate for forming an electronic device.

具體而言,較佳為包含選自由氧化物、氮化物、氮氧化物、碳化物、碳氮化物、矽化物及氟化物所組成之群中之至少1種。 Specifically, it is preferable to contain at least one selected from the group consisting of oxides, nitrides, nitrogen oxides, carbides, carbonitrides, tellurides, and fluorides.

作為氧化物、氮化物、氮氧化物,例如可列舉選自Si、Hf、Zr、Ta、Ti、Y、Nb、Na、Co、Al、Zn、Pb、Mg、Bi、La、Ce、Pr、Sm、Eu、Gd、Dy、Er、Sr、Sn、In、Ce及Ba中之1種以上之元素之氧化物、氮化物、氮氧化物。更具體而言,可列舉氧化鈦(TiO2)、氧化銦(In2O3)、氧化錫(SnO2)、氧化鋅(ZnO)、氧化鎵(Ga2O3)、氧化銦錫(ITO)、氧化銦鋅(IZO)、氧化鋅錫(ZTO)、添加有鎵之氧化鋅(GZO)、氧化銦鈰(ICO)、氮化矽(Si3N4)、氮化鈦(TiN)、氮化鎢(WN)、氮化鉻(CrN)、氮化硼(BN)、氮化鉬(MoN)、氮化鋁(AlN)、氮化鋯(ZrN)等。 Examples of the oxide, the nitride, and the oxynitride include Si, Hf, Zr, Ta, Ti, Y, Nb, Na, Co, Al, Zn, Pb, Mg, Bi, La, Ce, and Pr. An oxide, a nitride, or an oxynitride of an element of one or more of Sm, Eu, Gd, Dy, Er, Sr, Sn, In, Ce, and Ba. More specifically, titanium oxide (TiO 2 ), indium oxide (In 2 O 3 ), tin oxide (SnO 2 ), zinc oxide (ZnO), gallium oxide (Ga 2 O 3 ), indium tin oxide (ITO) ), indium zinc oxide (IZO), zinc tin oxide (ZTO), gallium-doped zinc oxide (GZO), indium oxide lanthanum (ICO), tantalum nitride (Si 3 N 4 ), titanium nitride (TiN), Tungsten nitride (WN), chromium nitride (CrN), boron nitride (BN), molybdenum nitride (MoN), aluminum nitride (AlN), zirconium nitride (ZrN), and the like.

作為碳化物、碳氮化物,例如可列舉選自Ti、W、Si、Zr、Nb中之1種以上之元素之碳化物、碳氮化物。更具體而言,可列舉碳化鈦(TiC)、碳化鎢(WC)、碳化矽(SiC)、碳化鈮(NbC)、碳化鋯(ZrC)、碳氮化鈦(TiCN)、碳氮化鎢(WCN)、碳氮化矽(SiCN)、碳氮化鈮(NbCN)、碳氮化鋯(ZrCN)等。 Examples of the carbides and carbonitrides include carbides and carbonitrides of one or more elements selected from the group consisting of Ti, W, Si, Zr, and Nb. More specifically, titanium carbide (TiC), tungsten carbide (WC), tantalum carbide (SiC), niobium carbide (NbC), zirconium carbide (ZrC), titanium carbonitride (TiCN), tungsten carbonitride (for example) may be mentioned. WCN), niobium carbonitride (SiCN), niobium carbonitride (NbCN), zirconium carbonitride (ZrCN), and the like.

作為矽化物,例如可列舉選自W、Fe、Mn、Mg、Mo、Cr、Ru、Re、Co、Ni、Ta、Ti、Zr、Ba中之1種以上之元素之矽化物。 Examples of the telluride include a telluride selected from the group consisting of one or more of W, Fe, Mn, Mg, Mo, Cr, Ru, Re, Co, Ni, Ta, Ti, Zr, and Ba.

作為氟化物,例如可列舉選自Mg、Y、La、Ba中之1種以上之元素之氟化物。 The fluoride is, for example, a fluoride selected from the group consisting of one or more of Mg, Y, La, and Ba.

其中,就於電子裝置之製造步驟等中,對玻璃積層體20進行熱處理後與玻璃基板16之剝離性良好,具有耐受熱處理前之加工之密接性,並且因熱處理所致之膜特性之變化較少且再利用較為容易,可容易且低價地獲得,於成膜等中可進行控制等方面而言,較佳地例示碳化矽、氧化銦錫及氧化銦鈰。 In the manufacturing process of the electronic device, the glass laminate 20 is heat-treated and has good peelability from the glass substrate 16, and has good adhesion to the processing before heat treatment, and changes in film properties due to heat treatment. It is easy to use and can be easily reused, and can be easily and inexpensively obtained. In terms of control such as film formation, etc., cerium carbide, indium tin oxide, and indium lanthanum oxide are preferably exemplified.

無機膜14之平均線膨脹係數係只要根據支撐基板12等之形成材料適當地設定即可。 The average linear expansion coefficient of the inorganic film 14 may be appropriately set in accordance with the material for forming the support substrate 12 or the like.

例如,於使用玻璃基板作為支撐基板12之情形時,其平均線膨脹係數較佳為10×10-7~200×10-7/℃。若為該範圍,則與玻璃基板之平均線膨脹係數之差變小,可進一步抑制高溫環境下之玻璃基板16與附無機膜之支撐基板10之位置偏移。 For example, when a glass substrate is used as the support substrate 12, the average linear expansion coefficient thereof is preferably 10 × 10 -7 to 200 × 10 -7 / ° C. When the ratio is within this range, the difference between the average linear expansion coefficient and the glass substrate becomes small, and the positional deviation of the glass substrate 16 and the support substrate 10 with the inorganic film in a high temperature environment can be further suppressed.

無機膜14較佳為含有上述無機化合物中之至少1種作為主成分。 此處,所謂主成分係指彼等之總含量相對於無機膜14之總量為90質量%以上,較佳為98質量%以上,更佳為99質量%以上,特佳為99.999質量%以上。 The inorganic film 14 preferably contains at least one of the above inorganic compounds as a main component. Here, the main component means that the total content thereof is 90% by mass or more, preferably 98% by mass or more, more preferably 99% by mass or more, and particularly preferably 99.999% by mass or more based on the total amount of the inorganic film 14. .

再者,無機膜14於圖1中係記載為單層,但亦可為2層以上之積層構造。又,於2層以上之積層構造之情形時,各層亦可為不同之組成。 Further, the inorganic film 14 is described as a single layer in FIG. 1, but may have a laminated structure of two or more layers. Further, in the case of a laminated structure of two or more layers, each layer may have a different composition.

進而,無機膜14係於支撐基板12表面具有未形成無機膜14之區域(未散佈無機膜14之島之區域)。 Further, the inorganic film 14 is provided on a surface of the support substrate 12 having a region where the inorganic film 14 is not formed (a region where the island of the inorganic film 14 is not dispersed).

此處,於本發明之附無機膜之支撐基板10中,以如下方式形成島狀之無機膜14,即,無機膜14以散佈成島狀之方式圖案化而形成,且未形成有無機膜14之支撐基板12之露出部於支撐基板12之面方向上連接至外部。本發明藉由具有此種構成,而確保無機膜14與玻璃基板16之良好之密接性,又,抑制進行高溫處理時之產生於無機膜14與玻璃基板16之間之發泡。 Here, in the support substrate 10 with an inorganic film of the present invention, the island-shaped inorganic film 14 is formed in such a manner that the inorganic film 14 is formed by patterning in an island shape, and the inorganic film 14 is not formed. The exposed portion of the support substrate 12 is connected to the outside in the direction of the surface of the support substrate 12. According to the present invention, the inorganic film 14 and the glass substrate 16 are ensured to have good adhesion, and the foaming between the inorganic film 14 and the glass substrate 16 during high-temperature treatment is suppressed.

關於該方面將於下文詳細敍述。 This aspect will be described in detail below.

如於圖1(C)中概念性地表示般,本發明之玻璃積層體20係於此種本發明之附無機膜之支撐基板10之無機膜14積層玻璃基板16並使其密接而成者。 As is conceptually shown in FIG. 1(C), the glass laminate 20 of the present invention is formed by laminating the glass substrate 16 of the inorganic film 14 of the support substrate 10 with the inorganic film of the present invention. .

玻璃基板16可為普通者,例如只要適當地選擇適合LCD或OLED等使用玻璃基板16(玻璃積層體20)之電子裝置之種類、或其製造步驟之玻璃即可。 The glass substrate 16 can be an ordinary one, and for example, a glass suitable for the type of electronic device using the glass substrate 16 (glass laminate 20) such as an LCD or an OLED, or a manufacturing step thereof can be appropriately selected.

作為一例,較佳地例示無鹼硼矽酸玻璃、硼矽酸玻璃、鈉鈣玻璃、高二氧化矽玻璃、其他以氧化矽為主要成分之氧化物系玻璃等。 再者,氧化物系玻璃較佳為藉由氧化物換算所得之氧化矽之含量為40~90質量%之玻璃。 As an example, alkali-free borosilicate glass, borosilicate glass, soda lime glass, high cerium oxide glass, and other oxide-based glass containing cerium oxide as a main component are preferably exemplified. Further, the oxide-based glass is preferably a glass having a content of cerium oxide of 40 to 90% by mass in terms of oxide.

例如,於將玻璃基板16利用於LCD之情形時,由於鹼金屬成分之溶出易於對液晶造成影響,故而利用實質上不含鹼金屬成分之玻璃(無鹼玻璃(但是,通常含有鹼土類金屬成分))。 For example, when the glass substrate 16 is used in an LCD, since the elution of the alkali metal component is liable to affect the liquid crystal, a glass which does not substantially contain an alkali metal component (alkali-free glass (but usually contains an alkaline earth metal component) is used. )).

玻璃基板16係將玻璃原料熔融並將熔融玻璃成形為板狀而獲得。此種成形方法可為普通者,例如可使用浮式法、熔融(fusion)法、流孔下引法、富可法、魯伯法等。又,厚度特別薄之玻璃基板係藉由如下方法(再曳引法)成形而獲得:將暫時成形為板狀之玻璃加熱至可成形之溫度,利用延伸等方法進行拉伸而使其變薄。 The glass substrate 16 is obtained by melting a glass raw material and molding the molten glass into a plate shape. Such a molding method may be an ordinary one, and for example, a float method, a fusion method, a flow hole down method, a rich method, a Luber method, or the like may be used. Further, the glass substrate having a particularly small thickness is obtained by the following method (re-draw method): heating the glass temporarily formed into a plate shape to a temperature at which it can be formed, and stretching it by stretching or the like to make it thin .

玻璃基板16之厚度係只要根據玻璃基板16之用途或大小適當地設定即可。 The thickness of the glass substrate 16 may be appropriately set depending on the use or size of the glass substrate 16.

具體而言,就玻璃基板16之薄型化及/或輕量化之觀點而言,玻璃基板16之厚度較佳為0.8mm以下,更佳為0.3mm以下,特佳為0.15mm以下。藉由將玻璃基板16之厚度設為0.8mm以下,可較佳地滿足玻璃基板16之薄型化及/或輕量化之要求。又,藉由將玻璃基板16之厚度設為0.3mm以下,可對玻璃基板16賦予良好之可撓性。進而,藉 由將玻璃基板16之厚度設為0.15mm以下,可將玻璃基板16捲取成輥狀。 Specifically, the thickness of the glass substrate 16 is preferably 0.8 mm or less, more preferably 0.3 mm or less, and particularly preferably 0.15 mm or less from the viewpoint of reduction in thickness and/or weight reduction of the glass substrate 16 . By setting the thickness of the glass substrate 16 to 0.8 mm or less, the requirements for thinning and/or weight reduction of the glass substrate 16 can be preferably satisfied. Moreover, by setting the thickness of the glass substrate 16 to 0.3 mm or less, it is possible to impart good flexibility to the glass substrate 16. Further, borrow The glass substrate 16 can be wound into a roll shape by setting the thickness of the glass substrate 16 to 0.15 mm or less.

又,就玻璃基板16之製造較為容易且玻璃基板16之處理較為容易等理由而言,玻璃基板16之厚度較佳為0.03mm以上。 Moreover, the thickness of the glass substrate 16 is preferably 0.03 mm or more for the reason that the production of the glass substrate 16 is easy and the treatment of the glass substrate 16 is easy.

再者,玻璃基板16亦可包含2層以上,於該情形時,形成各層之材料可為同種材料,亦可為異種材料。又,於該情形時,「玻璃基板之厚度」係設為所有層之合計厚度。 Further, the glass substrate 16 may include two or more layers. In this case, the material forming each layer may be the same material or a different material. In this case, the "thickness of the glass substrate" is the total thickness of all the layers.

如上所述,於本發明之附無機膜之支撐基板10(玻璃積層體20)中,以如下方式形成島狀之無機膜14,即,無機膜14係以散佈成島狀之方式圖案化而形成,且未形成有無機膜14之支撐基板12之露出部於支撐基板12之面方向上連接至外部。 As described above, in the inorganic substrate-supporting substrate 10 (glass laminate 20) of the present invention, the island-shaped inorganic film 14 is formed in such a manner that the inorganic film 14 is patterned by being spread in an island shape. The exposed portion of the support substrate 12 on which the inorganic film 14 is not formed is connected to the outside in the direction of the surface of the support substrate 12.

本發明之附無機膜之支撐基板10係藉由具有此種構成,而於在無機膜14積層玻璃基板16而製成玻璃積層體20時,可確保無機膜14與玻璃基板16之良好之密接性,並且即便為了於玻璃基板16上形成電子裝置而進行高溫下之熱處理,亦可抑制在無機膜14與玻璃基板16之間產生氣泡。進而,本發明之附無機膜之支撐基板10係為了於玻璃基板16上形成電子裝置而進行玻璃積層體20之熱處理後之無機膜14與玻璃基板16的剝離性亦良好(具有良好之易剝離性)。 In the support substrate 10 with an inorganic film according to the present invention, when the glass substrate 16 is laminated on the inorganic film 14 to form the glass laminate 20, the adhesion between the inorganic film 14 and the glass substrate 16 can be ensured. Further, even if heat treatment at a high temperature is performed to form an electronic device on the glass substrate 16, generation of bubbles between the inorganic film 14 and the glass substrate 16 can be suppressed. Further, in the support substrate 10 with an inorganic film of the present invention, the inorganic film 14 and the glass substrate 16 are also excellent in peelability after heat treatment of the glass laminate 20 in order to form an electronic device on the glass substrate 16 (having good peelability) Sex).

作為用以於薄膜之玻璃基板上形成電子裝置之支撐體,已知有如專利文獻1或專利文獻2所示之於支撐基板上形成無機膜而成之附無機膜之支撐基板。藉由利用該附無機膜之支撐基板,即便於使用薄膜之玻璃基板之情形時,亦可確保良好之處理性,從而可精確地製作電子裝置。 As a support for forming an electronic device on a glass substrate of a film, a support substrate with an inorganic film formed by forming an inorganic film on a support substrate as disclosed in Patent Document 1 or Patent Document 2 is known. By using the support substrate with the inorganic film, even in the case of using a glass substrate of a film, it is possible to ensure goodness of rationality, and it is possible to accurately manufacture an electronic device.

此處,近年來,為了實現電子裝置之高性能化,而於製造電子裝置時,期望實施如450℃以上之高溫條件下之處理。然而,先前之附無機膜之支撐基板係若進行450℃以上之高溫處理、特別是如500~ 600℃之高溫處理,則存在如下情形:附著或者包含於玻璃基板或無機膜之氣體被釋放,而在玻璃基板與無機膜之間產生多個氣泡。 Here, in recent years, in order to realize high performance of an electronic device, it is desirable to perform processing under a high temperature condition of 450 ° C or higher when manufacturing an electronic device. However, the prior support substrate with an inorganic film is subjected to a high temperature treatment of 450 ° C or higher, particularly, for example, 500~ At a high temperature of 600 ° C, there is a case where a gas adhering or contained in a glass substrate or an inorganic film is released, and a plurality of bubbles are generated between the glass substrate and the inorganic film.

進而,先前之附無機膜之支撐基板亦存在如下情形:於積層無機膜與玻璃基板時,無機膜與玻璃基板之密接性不充分,即便將支撐基板之無機膜與玻璃基板重疊,彼等不僅不會自然地密接,而且即便進行機械加壓亦不會密接、或者反而容易剝離。 Further, in the conventional support substrate with an inorganic film, when the inorganic film and the glass substrate are laminated, the adhesion between the inorganic film and the glass substrate is insufficient, and even if the inorganic film of the support substrate is overlapped with the glass substrate, they are not only It does not naturally adhere to each other, and it does not adhere to each other even if it is mechanically pressurized, or it is easy to peel off.

相對於此,本發明之附無機膜之支撐基板10係以如下方式形成島狀之無機膜14,即,無機膜14以於支撐基板12之表面散佈成島狀之方式圖案化而形成,且未形成有無機膜14之支撐基板12之露出部於支撐基板12之面方向上連接至外部。 On the other hand, the inorganic substrate-supporting substrate 10 of the present invention is formed into an island-shaped inorganic film 14 in such a manner that the inorganic film 14 is patterned by patterning the surface of the support substrate 12 in an island shape, and is not formed. The exposed portion of the support substrate 12 on which the inorganic film 14 is formed is connected to the outside in the direction of the surface of the support substrate 12.

本發明係藉由具有此種構成,而能夠於支撐基板12之面方向上,在散佈成島狀而形成之無機膜14之間形成連接至外部之自玻璃基板16或無機膜14釋放之氣體之排放通道。因此,即便於600℃等高溫下對玻璃積層體20進行處理,氣體亦不會滯留於無機膜14與玻璃基板16之間,從而可抑制產生於無機膜14與玻璃基板16之間之氣泡。 According to the present invention, it is possible to form a gas which is released from the glass substrate 16 or the inorganic film 14 to the outside between the inorganic films 14 which are formed in an island shape in the surface direction of the support substrate 12. Discharge channel. Therefore, even if the glass laminate 20 is treated at a high temperature such as 600 ° C, the gas does not remain between the inorganic film 14 and the glass substrate 16, and bubbles generated between the inorganic film 14 and the glass substrate 16 can be suppressed.

又,將島狀之無機膜14圖案化而散佈地形成,藉此,如阻礙無機膜14與玻璃基板16之密接之凸部較少,且亦可充分地確保無機膜14與玻璃基板16之接觸面積。 Further, the island-shaped inorganic film 14 is patterned and dispersed, whereby the convex portions that prevent the inorganic film 14 from adhering to the glass substrate 16 are less, and the inorganic film 14 and the glass substrate 16 can be sufficiently ensured. Contact area.

此外,由於無機膜14與玻璃基板16並非整個面地接觸(為分散之點狀),故而於高溫下對玻璃積層體20進行熱處理後之剝離性亦良好。 Further, since the inorganic film 14 and the glass substrate 16 are not in contact with each other (in a dotted shape), the peeling property after heat-treating the glass laminate 20 at a high temperature is also good.

於本發明之附無機膜之支撐基板10中,無機膜14之厚度t(無機膜14之島之高度t)係只要根據無機膜14之島(島部)之大小、所積層之玻璃基板16之種類、無機膜14之形成材料等適當地設定即可。 In the support substrate 10 with an inorganic film of the present invention, the thickness t of the inorganic film 14 (the height t of the island of the inorganic film 14) is as long as the glass substrate 16 of the laminated layer is based on the size of the island (island portion) of the inorganic film 14. The type, the material for forming the inorganic film 14, and the like may be appropriately set.

此處,無機膜14之厚度t較佳為40nm以下,更佳為30nm以下。藉由將無機膜14之厚度t設為40nm以下,可較佳地防止於對玻璃積層 體20實施濕式處理時處理液滲入至玻璃基板16與支撐基板12之間,可提高附無機膜之支撐基板10之生產性,且可進一步提高玻璃基板16之積層性,就以上等方面而言較佳。 Here, the thickness t of the inorganic film 14 is preferably 40 nm or less, more preferably 30 nm or less. By setting the thickness t of the inorganic film 14 to 40 nm or less, it is preferable to prevent the layer from being laminated to the glass. When the body 20 is subjected to the wet treatment, the treatment liquid penetrates between the glass substrate 16 and the support substrate 12, whereby the productivity of the support substrate 10 with the inorganic film can be improved, and the layering property of the glass substrate 16 can be further improved. Better words.

又,無機膜14之厚度t較佳為5nm以上,更佳為10nm以上。藉由將無機膜14之厚度t設為5nm以上,可防止於對玻璃積層體20進行熱處理時因支撐基板12與玻璃基板16直接接觸而引起之剝離性之下降,且可更佳地防止於無機膜14與玻璃基板16之間產生氣泡,就以上等方面而言較佳。 Further, the thickness t of the inorganic film 14 is preferably 5 nm or more, and more preferably 10 nm or more. By setting the thickness t of the inorganic film 14 to 5 nm or more, it is possible to prevent the peeling property from being lowered due to the direct contact between the support substrate 12 and the glass substrate 16 during the heat treatment of the glass laminate 20, and it is possible to prevent it from being more preferably prevented. It is preferable to generate bubbles between the inorganic film 14 and the glass substrate 16 in terms of the above.

又,散佈成島狀之無機膜14之形成密度係只要根據無機膜14之厚度t、無機膜14之島之大小、所積層之玻璃基板16之種類、無機膜14之形成材料等適當地設定即可。此處,散佈成島狀之無機膜14較佳為以如下方式形成:於端部(邊緣)彼此之間隔d為20μm以內之位置,存在其他島狀之無機膜14(無機膜14之島)。 Further, the formation density of the inorganic film 14 which is dispersed in the island shape is appropriately set according to the thickness t of the inorganic film 14, the size of the island of the inorganic film 14, the type of the glass substrate 16 to be laminated, the material for forming the inorganic film 14, and the like. can. Here, the inorganic film 14 which is interspersed in an island shape is preferably formed in such a manner that other island-shaped inorganic films 14 (islands of the inorganic film 14) exist at positions where the distance d between the end portions (edges) is within 20 μm.

若存在無機膜14之島之間隔較大之區域,則存在如下情形:因支撐基板12及/或玻璃基板16之撓曲而導致兩者接觸,於對玻璃積層體20進行熱處理時,該接觸部強力地貼合。若產生此種貼合,則於將附無機膜之支撐基板10與玻璃基板16剝離時,剝離性顯著惡化,根據情形而附無機膜之支撐基板10與玻璃基板16變得無法剝離。 If there is a region where the interval between the islands of the inorganic film 14 is large, there is a case where the two are in contact due to the deflection of the support substrate 12 and/or the glass substrate 16, and the contact is performed when the glass laminate 20 is heat-treated. The department is firmly attached. When such a bonding is performed, when the support substrate 10 with the inorganic film is peeled off from the glass substrate 16, the peeling property is remarkably deteriorated, and the support substrate 10 and the glass substrate 16 with the inorganic film are not peeled off depending on the case.

相對於此,以於端部彼此之間隔d為20μm以內之位置、較佳為10μm以內之位置存在其他島狀之無機膜14之方式形成散佈成島狀之無機膜14,藉此可較佳地防止此種支撐基板12與玻璃基板16之貼合。 On the other hand, the inorganic film 14 dispersed in an island shape is formed in such a manner that the distance d between the end portions is 20 μm or less, and the island-shaped inorganic film 14 is preferably present at a position within 10 μm. The bonding of the support substrate 12 and the glass substrate 16 is prevented.

進而,就可較佳地獲得上述效果等方面而言,較佳為如於圖2中以俯視圖概念性地表示般,以無法於未形成有島狀之無機膜14之支撐基板12之露出面描繪直徑20μm以上、較佳為直徑10μm以上的圓S之方式散佈島狀之無機膜14。 Further, in order to obtain the above-described effects, it is preferable to draw the exposed surface of the support substrate 12 in which the island-shaped inorganic film 14 is not formed, as is conceptually shown in plan view in Fig. 2 . The island-shaped inorganic film 14 is dispersed so as to have a diameter S of 20 μm or more, preferably 10 μm or more in diameter.

換言之,較佳為以如下方式散佈島狀之無機膜14,即,於未形 成有島狀之無機膜14之支撐基板12之露出面描繪內接於島狀之無機膜14之端部的最大直徑之圓S時,該圓S之直徑成為20μm以下。 In other words, it is preferable to disperse the island-shaped inorganic film 14 in such a manner that it is not shaped When the exposed surface of the support substrate 12 in which the island-shaped inorganic film 14 is formed is drawn with a circle S having the largest diameter inscribed in the end portion of the island-shaped inorganic film 14, the diameter of the circle S is 20 μm or less.

再者,於圖1(A)及圖1(B)所示之例中,散佈成島狀之無機膜14係有規則地排列(圖案化)。然而,於本發明之附無機膜之支撐基板中,散佈成島狀之無機膜14可有規則地排列,亦可如上述圖2所示般無規則地排列。 Further, in the examples shown in FIG. 1(A) and FIG. 1(B), the inorganic film 14 dispersed in an island shape is regularly arranged (patterned). However, in the support substrate with an inorganic film of the present invention, the inorganic film 14 dispersed in an island shape may be regularly arranged, or may be arranged irregularly as shown in FIG. 2 described above.

進而,無論為有規則之排列抑或是無規則之排列,散佈成島狀之無機膜14均較佳為均勻地分散而散佈於支撐基板12之表面。 Further, the inorganic film 14 dispersed in an island shape is preferably uniformly dispersed and spread on the surface of the support substrate 12, whether it is a regular arrangement or an irregular arrangement.

於本發明之附無機膜之支撐基板10中,1個島狀之無機膜14(包含無機膜之1個島)之面積係只要根據無機膜14之厚度t、所積層之玻璃基板16之種類、無機膜14之形成材料等適當地設定即可。此處,各個島狀之無機膜14之面積較佳為0.1~10000μm2,更佳為0.1~100μm2In the inorganic substrate-supporting substrate 10 of the present invention, the area of one island-shaped inorganic film 14 (including one island of the inorganic film) is as long as the thickness t of the inorganic film 14 and the type of the glass substrate 16 to be laminated. The material for forming the inorganic film 14 or the like may be appropriately set. Here, the area of each of the island-shaped inorganic films 14 is preferably from 0.1 to 10,000 μm 2 , more preferably from 0.1 to 100 μm 2 .

藉由將1個島狀之無機膜14之面積設為0.1μm2以上,可使無機膜14與玻璃基板16之密接性良好,且可藉由圖案化之容易性等而降低無機膜14之形成成本,就以上等方面而言較佳。 By setting the area of one island-shaped inorganic film 14 to 0.1 μm 2 or more, the adhesion between the inorganic film 14 and the glass substrate 16 can be improved, and the inorganic film 14 can be lowered by the ease of patterning or the like. The cost of formation is preferred in terms of the above.

又,藉由將1個島狀之無機膜14之面積設為10000μm2以下,可防止在1個島狀之無機膜14與玻璃基板16之間產生氣泡,且可防止於使用下述積層體20製作電子裝置時因島狀之無機膜14而導致被視為不均勻性之情況,就以上等方面而言較佳。 In addition, by setting the area of one island-shaped inorganic film 14 to 10000 μm 2 or less, generation of bubbles between the island-shaped inorganic film 14 and the glass substrate 16 can be prevented, and the following laminated body can be prevented from being used. When the electronic device is produced, it is considered to be uneven due to the island-shaped inorganic film 14, and it is preferable in terms of the above.

再者,所謂1個島狀之無機膜14之面積係支撐基板12之面上之包含無機膜14之1個島的面積。 In addition, the area of the one island-shaped inorganic film 14 is the area of one island including the inorganic film 14 on the surface of the support substrate 12.

進而,島狀之無機膜14之合計面積亦係只要根據無機膜14之厚度t、1個島狀之無機膜14之大小、所積層之玻璃基板16之種類、無機膜14之形成材料等適當地設定即可。此處,包含複數個島(島部)之無機膜14之合計面積較佳為以相對於支撐基板12之表面的面積率(無機 膜/支撐基板)計為11~80%,更佳為18~70%。 Further, the total area of the island-shaped inorganic film 14 is also appropriately selected according to the thickness t of the inorganic film 14, the size of one island-shaped inorganic film 14, the type of the glass substrate 16 to be laminated, and the material for forming the inorganic film 14. Ground settings can be. Here, the total area of the inorganic film 14 including a plurality of islands (island portions) is preferably an area ratio with respect to the surface of the support substrate 12 (inorganic The film/support substrate is counted as 11 to 80%, more preferably 18 to 70%.

藉由將上述無機膜14之合計面積設為以相對於支撐基板12之表面之面積率計為11%以上,可使無機膜14與玻璃基板16之密接性良好,且可使進行玻璃積層體20之熱處理後之剝離性良好,就以上等方面而言較佳。 By setting the total area of the inorganic film 14 to 11% or more with respect to the surface area of the support substrate 12, the adhesion between the inorganic film 14 and the glass substrate 16 can be improved, and the glass laminate can be formed. The peelability after the heat treatment of 20 is good, and it is preferable in terms of the above.

又,藉由將上述無機膜14之合計面積設為以相對於支撐基板12之表面之面積率計為80%以下,可防止在無機膜14與玻璃基板16之間產生氣泡,就以上等方面而言較佳。 In addition, by setting the total area of the inorganic film 14 to 80% or less with respect to the surface area of the support substrate 12, generation of bubbles between the inorganic film 14 and the glass substrate 16 can be prevented. It is better.

再者,如圖1(B)所示,於附無機膜之支撐基板10中,島狀之無機膜14之平面形狀(支撐基板12之面方向之形狀)為正方形,但於本發明中,島狀之無機膜14可利用各種平面形狀。 Further, as shown in FIG. 1(B), in the support substrate 10 with an inorganic film, the planar shape of the island-shaped inorganic film 14 (the shape of the surface of the support substrate 12) is square, but in the present invention, The island-shaped inorganic film 14 can utilize various planar shapes.

作為一例,島狀之無機膜14之平面形狀亦可為圓形、橢圓形、三角形、長方形、五邊形或六邊形、其以上之多邊形等,或亦可為不定形,進而,亦可為包含正方形在內之該等形狀混合者。 As an example, the planar shape of the island-shaped inorganic film 14 may be a circular shape, an elliptical shape, a triangular shape, a rectangular shape, a pentagon shape, a hexagonal shape, a polygonal shape or the like, or may be an amorphous shape. A blend of such shapes, including squares.

圖1(A)及圖1(B)所示之附無機膜之支撐基板10具有使無機膜14呈島狀散佈於支撐基板12之表面而支撐基板12露出之區域。 The support substrate 10 with an inorganic film shown in FIG. 1(A) and FIG. 1(B) has a region in which the inorganic film 14 is spread on the surface of the support substrate 12 in an island shape, and the support substrate 12 is exposed.

然而,本發明之附無機膜之支撐基板亦可藉由無機膜覆蓋支撐基板12之整個面。 However, the support substrate with the inorganic film of the present invention may also cover the entire surface of the support substrate 12 by an inorganic film.

即,亦可為如下構成:如圖1(D)所示之附無機膜之支撐基板30般,將無機膜24設為具有包含複數個凸部24a與凹部24b之凹凸之形狀,該等複數個凸部24a包含較厚之部分,該凹部24b包含較薄之部分,且包含較薄之部分之凹部24b於支撐基板12之面方向上連接至外部。即便為該構成,亦可獲得與圖1(A)及圖1(B)所示之附無機膜之支撐基板10相同之效果。 In other words, the inorganic film 24 may have a shape including a plurality of convex portions 24a and concave portions 24b, as in the support substrate 30 with an inorganic film as shown in Fig. 1(D). The convex portion 24a includes a thick portion, and the concave portion 24b includes a thin portion, and the concave portion 24b including the thin portion is connected to the outside in the direction of the surface of the support substrate 12. Even in this configuration, the same effects as those of the support substrate 10 with an inorganic film shown in FIGS. 1(A) and 1(B) can be obtained.

於該圖1(D)所示之附無機膜之支撐基板30中,凸部24a之高度(凸部24a與凹部24b之高度之差)、凸部24a之形成間隔、凸部24a之各者 之面積及複數個凸部24a之合計面積等係依據上述附無機膜之支撐基板10中之島狀之無機膜14。 In the support substrate 30 with an inorganic film shown in Fig. 1(D), the height of the convex portion 24a (the difference between the heights of the convex portion 24a and the concave portion 24b), the interval between the convex portions 24a, and the convex portion 24a are different. The area and the total area of the plurality of convex portions 24a are based on the island-shaped inorganic film 14 in the support substrate 10 with the inorganic film.

此處,於圖1(D)所示之附無機膜之支撐基板30中,支撐基板10之整個面由無機膜24覆蓋。因此,即便支撐基板12及/或玻璃基板16撓曲而兩者接觸,亦不會相互固著。因此,於附無機膜之支撐基板30中,即便凸部24a之形成間隔(與上述無機膜14之端部彼此之間隔d對應)以超過20μm之方式變大,亦可防止對玻璃積層體20進行熱處理時之支撐基板12與玻璃基板16之貼合,從而可獲得良好之剝離性。 Here, in the support substrate 30 with an inorganic film shown in FIG. 1(D), the entire surface of the support substrate 10 is covered with the inorganic film 24. Therefore, even if the support substrate 12 and/or the glass substrate 16 are bent and the two are in contact with each other, they are not fixed to each other. Therefore, in the support substrate 30 with the inorganic film, even if the interval between the formation of the convex portions 24a (corresponding to the distance d between the end portions of the inorganic film 14) becomes larger than 20 μm, the laminated body 20 can be prevented from being formed. When the heat treatment, the support substrate 12 and the glass substrate 16 are bonded together, and good peelability can be obtained.

又,於該附無機膜之支撐基板30中,凹部24b處之無機膜24之厚度較佳為5~30nm,更佳為10~20nm。 Further, in the support substrate 30 with the inorganic film, the thickness of the inorganic film 24 at the concave portion 24b is preferably 5 to 30 nm, more preferably 10 to 20 nm.

藉由將凹部24b處之無機膜24之厚度設為上述範圍,可更確實地防止對上述玻璃積層體20進行熱處理時之支撐基板12與玻璃基板16之貼合,從而可獲得更加良好之剝離性,就以上等方面而言較佳。 By setting the thickness of the inorganic film 24 in the concave portion 24b to the above range, it is possible to more reliably prevent the bonding between the support substrate 12 and the glass substrate 16 when the glass laminate 20 is heat-treated, thereby obtaining more excellent peeling. Sex is better in terms of the above.

以下,參照圖3(A)~圖3(F),對製造圖1(A)及圖1(B)所示之附無機膜之支撐基板10之本發明之製造方法的一例進行說明。 Hereinafter, an example of a manufacturing method of the present invention for producing the inorganic substrate-attached supporting substrate 10 shown in FIGS. 1(A) and 1(B) will be described with reference to FIGS. 3(A) to 3(F).

首先,如圖3(A)所示般準備支撐基板12,且於其表面,如圖3(B)及圖3(C)所示般形成成為遮罩之樹脂膜32。 First, the support substrate 12 is prepared as shown in FIG. 3(A), and a resin film 32 to be a mask is formed on the surface thereof as shown in FIGS. 3(B) and 3(C).

該樹脂膜32係以如下方式形成:於支撐基板12之表面散佈複數個非形成部,且樹脂膜32於支撐基板12之面方向上連續至外部。於圖3(B)及圖3(C)所示之例中,以正方格子狀之圖案形成樹脂膜32。 The resin film 32 is formed by dispersing a plurality of non-formed portions on the surface of the support substrate 12, and the resin film 32 is continuous to the outside in the direction of the support substrate 12. In the examples shown in FIGS. 3(B) and 3(C), the resin film 32 is formed in a square lattice pattern.

成為遮罩之樹脂膜32之形成方法可利用與樹脂膜32之形成材料對應之各種公知之方法。作為一例,可例示利用網版印刷、軟版印刷、平版印刷、凹版印刷、噴墨等印刷之方法。或者,亦可使用光阻或進行蝕刻之光微影形成成為遮罩之樹脂膜32。 As a method of forming the resin film 32 to be masked, various known methods corresponding to the material for forming the resin film 32 can be used. As an example, a method of printing by screen printing, flexographic printing, lithography, gravure printing, inkjet, or the like can be exemplified. Alternatively, the resin film 32 to be a mask may be formed by photolithography or photolithography of etching.

再者,於形成該樹脂膜32之前,在支撐基板12之整個面形成基底無機膜,藉此可製作如圖1(D)所示之具有整個面之無機膜24之附無 機膜之支撐基板30,該整個面之無機膜24具有包含複數個凸部24a與凹部24b之凹凸,該等複數個凸部24a包含較厚之部分,該凹部24b包含較薄之部分。即,該基底無機膜之厚度成為凹部24b處之無機膜24之厚度。 Further, before the formation of the resin film 32, a base inorganic film is formed on the entire surface of the support substrate 12, whereby the inorganic film 24 having the entire surface as shown in Fig. 1(D) can be produced. The support substrate 30 of the organic film, the inorganic film 24 of the entire surface has irregularities including a plurality of convex portions 24a and concave portions 24b, and the plurality of convex portions 24a include a thick portion, and the concave portion 24b includes a thin portion. That is, the thickness of the base inorganic film becomes the thickness of the inorganic film 24 at the concave portion 24b.

基底無機膜之形成材料可為與無機膜14相同之無機物,亦可為與無機膜14不同之無機物。 The material for forming the base inorganic film may be the same inorganic material as the inorganic film 14, or may be an inorganic substance different from the inorganic film 14.

又,基底無機膜之形成係與所要形成之成為無機膜14之膜34同樣地,只要藉由與形成材料對應之公知之方法進行即可。 Further, the formation of the underlying inorganic film may be carried out by a known method corresponding to the material to be formed, similarly to the film 34 to be formed into the inorganic film 14.

繼而,如圖3(D)所示,將樹脂膜32作為遮罩,形成成為無機膜14之膜34。 Then, as shown in FIG. 3(D), the resin film 32 is used as a mask to form a film 34 which becomes the inorganic film 14.

膜34之形成方法係只要為濺鍍、真空蒸鍍(常溫、高溫)、CVD(Chemical Vapor Deposition,化學氣相沈積)、電漿CVD、溶膠凝膠法等塗佈法等可根據無機膜14之形成材料而成膜作為目標之膜者,則可利用公知之各種方法。 The method of forming the film 34 may be any coating method such as sputtering, vacuum vapor deposition (normal temperature, high temperature), CVD (Chemical Vapor Deposition), plasma CVD, or sol-gel method. The film forming material is a target film, and various known methods can be used.

繼而,去除(剝離)樹脂膜32而形成無機膜14,從而如圖3(E)所示般,製作於支撐基板12之表面散佈矩形之島狀之無機膜14的附無機膜之支撐基板10。 Then, the resin film 32 is removed (stripped) to form the inorganic film 14, and as shown in FIG. 3(E), the inorganic substrate-supporting substrate 10 on which the rectangular island-shaped inorganic film 14 is dispersed on the surface of the support substrate 12 is formed. .

樹脂膜32之去除方法亦可利用與樹脂膜32之形成材料對應之各種公知之方法。作為一例,可例示濕式蝕刻、使用純水等液體與刷之去除方法等。 The method of removing the resin film 32 can also be carried out by various known methods corresponding to the material for forming the resin film 32. As an example, wet etching, a method of removing a liquid such as pure water, a brush, or the like can be exemplified.

又,亦可視需要於形成島狀之無機膜14之後對無機膜14(無機膜24之凸部24a)之表面進行研磨。 Further, it is also possible to polish the surface of the inorganic film 14 (the convex portion 24a of the inorganic film 24) after forming the island-shaped inorganic film 14.

進而,如圖3(F)所示,於附無機膜之支撐基板10之無機膜14積層玻璃基板16並使其密接,而製成本發明之玻璃積層體20。 Further, as shown in FIG. 3(F), the glass substrate 16 is laminated on the inorganic film 14 of the support substrate 10 with the inorganic film and adhered thereto to form the glass laminate 20 of the present invention.

玻璃基板16之積層與密接可根據無機膜14之形成材料等而利用公知之各種方法。作為一例,可列舉如下方法:於在常壓環境下將附 無機膜之支撐基板10與玻璃基板16重疊後,使用輥或加壓機使彼等壓接。藉由利用輥或加壓機進行壓接,從而附無機膜之支撐基板10與玻璃基板16以更加良好之密接力密接,因此較佳。又,作為玻璃基板16之積層方法,亦可較佳地利用藉由真空層壓法或真空加壓法進行之壓接。 The laminate and adhesion of the glass substrate 16 can be carried out by various known methods depending on the material for forming the inorganic film 14. As an example, the following method can be mentioned: it is attached under normal pressure environment After the support substrate 10 of the inorganic film and the glass substrate 16 are overlapped, they are pressure-bonded using a roll or a press machine. It is preferable that the support substrate 10 with the inorganic film and the glass substrate 16 are in close contact with each other with a good adhesion by pressure bonding using a roll or a press machine. Further, as a method of laminating the glass substrate 16, it is also preferable to use pressure bonding by a vacuum lamination method or a vacuum press method.

本發明之附無機膜之支撐基板除此之外亦可利用各種方法形成。作為一例,可例示利用光微影之方法、或利用藉由雷射進行之圖案化之方法。 The support substrate with an inorganic film of the present invention can also be formed by various methods. As an example, a method using photolithography or a method of patterning by laser can be exemplified.

該等方法係首先於支撐基板12之表面形成成為無機膜14之無機物之膜。該膜之形成方法可與先前同樣地利用各種公知之方法。 These methods are first to form a film which becomes an inorganic substance of the inorganic film 14 on the surface of the support substrate 12. The method of forming the film can be carried out in the same manner as in the prior art by various known methods.

繼而,對該無機物之膜進行蝕刻,藉此製作於支撐基板12之表面散佈島狀之無機膜14的附無機膜之支撐基板10。 Then, the inorganic film is etched to form an inorganic film-attached support substrate 10 on which the island-shaped inorganic film 14 is dispersed on the surface of the support substrate 12.

無機物之膜之蝕刻方法可利用與無機物對應之公知之各種方法。 The etching method of the inorganic film can utilize various well-known methods corresponding to an inorganic substance.

作為一例,可例示如下方法:藉由旋轉塗佈或模嘴塗佈等在無機物之膜之表面形成抗蝕劑層。繼而,藉由遮罩曝光等公知之方法對抗蝕劑層進行圖案曝光,進而進行顯影,而形成包含抗蝕劑之遮罩。 繼而,藉由濕式蝕刻或者乾式蝕刻,去除未形成有遮罩之部分之無機物之膜,從而形成散佈於支撐基板12之表面的島狀之無機膜14。進而,去除殘留之抗蝕劑層,而製作於支撐基板12之表面散佈島狀之無機膜14的附無機膜之支撐基板10。 As an example, a method of forming a resist layer on the surface of a film of an inorganic material by spin coating or die coating can be exemplified. Then, the resist layer is subjected to pattern exposure by a known method such as mask exposure, and further developed to form a mask containing a resist. Then, the film of the inorganic substance in which the mask portion is not formed is removed by wet etching or dry etching, thereby forming an island-shaped inorganic film 14 dispersed on the surface of the support substrate 12. Further, the remaining resist layer is removed, and the inorganic substrate-attached support substrate 10 on which the island-shaped inorganic film 14 is dispersed on the surface of the support substrate 12 is formed.

又,亦可例示如下方法:於成膜無機物之膜後,藉由網版印刷、軟版印刷、平版印刷、凹版印刷、噴墨等印刷而形成遮罩。繼而,藉由濕式蝕刻去除未形成有遮罩之部分之無機物之膜,從而形成散佈於支撐基板12之表面之島狀之無機膜14。進而,去除殘留之遮罩,而製作於支撐基板12之表面散佈島狀之無機膜14的附無機膜之支 撐基板10。 Further, a method of forming a mask by screen printing, flexographic printing, lithography, gravure printing, inkjet, or the like after film formation of an inorganic film may be exemplified. Then, a film of an inorganic substance in which no mask portion is formed is removed by wet etching to form an island-shaped inorganic film 14 dispersed on the surface of the support substrate 12. Further, the remaining mask is removed, and the inorganic film supporting the island-shaped inorganic film 14 is formed on the surface of the support substrate 12. The substrate 10 is supported.

進而,亦可例示如下方法:於成膜無機物之膜後,藉由YAG(Yttrium Aluminum Garnet,釔-鋁-石榴石)雷射、準分子雷射、二氧化碳氣體雷射等之雷射光對膜進行圖案曝光,並藉由剝蝕等去除多餘之無機物之膜,藉此製作於支撐基板12之表面散佈島狀之無機膜14的附無機膜之支撐基板10。 Further, a method of forming a film of an inorganic material and irradiating the film with laser light such as a YAG (Yttrium Aluminum Garnet) laser, a pseudo-molecular laser, or a carbon dioxide gas laser may be exemplified. The pattern is exposed, and a film of the excess inorganic substance is removed by ablation or the like, whereby the inorganic substrate-attached supporting substrate 10 on which the island-shaped inorganic film 14 is dispersed on the surface of the support substrate 12 is formed.

於該製造方法中,藉由調節無機物之膜之蝕刻程度,而能夠製作如圖1(D)所示之具有整個面之無機膜24之附無機膜之支撐基板30,該整個面之無機膜24具有包含複數個凸部24a與凹部24b之凹凸,該等複數個凸部24a包含較厚之部分,該凹部24b包含較薄之部分。 In the manufacturing method, by adjusting the etching degree of the inorganic film, the inorganic substrate-attached supporting substrate 30 having the entire surface of the inorganic film 24 as shown in FIG. 1(D) can be produced, and the entire surface of the inorganic film can be produced. 24 has concavities and convexities including a plurality of convex portions 24a and concave portions 24b, and the plurality of convex portions 24a include a thick portion, and the concave portion 24b includes a thin portion.

此種本發明之附無機膜之玻璃基板及玻璃積層體係較佳地用於製造LCD、OLED、電子紙、電漿顯示面板、場發射面板、量子點LED(Light Emitting Diode,發光二極體)面板、MEMS(Micro Electro Mechanical Systems,微電子機械系統)、快門面板等電子裝置。 The inorganic substrate-attached glass substrate and the glass laminate system of the present invention are preferably used for manufacturing an LCD, an OLED, an electronic paper, a plasma display panel, a field emission panel, and a light emitting diode (Light Emitting Diode). Electronic devices such as panels, MEMS (Micro Electro Mechanical Systems), and shutter panels.

該等電子裝置可藉由本發明之製造方法而製造。 The electronic devices can be manufactured by the manufacturing method of the present invention.

本發明之電子裝置之製造方法係使用本發明之玻璃積層體之製造方法的電子裝置之製造方法。作為本發明之電子裝置之製造方法之一例,藉由本發明之製造方法製造玻璃積層體,於該玻璃基板之表面形成構成LCD或OLED等之電子裝置用構件,且自形成該電子裝置用構件而成之玻璃積層體將附無機膜之支撐基板剝離,而製造具有玻璃基板及電子裝置用零件之電子裝置。 The method for producing an electronic device of the present invention is a method for producing an electronic device using the method for producing a glass laminate of the present invention. As an example of the method for producing an electronic device of the present invention, a glass laminate is produced by the production method of the present invention, and a member for an electronic device such as an LCD or an OLED is formed on the surface of the glass substrate, and the member for the electronic device is formed. In the glass laminate, the support substrate with the inorganic film is peeled off, and an electronic device having a glass substrate and a component for an electronic device is manufactured.

再者,於此種本發明之電子裝置之製造方法中,電子裝置用構件係只要藉由與所要製造之電子裝置對應之公知之方法形成與所要製造之電子裝置對應之構件即可。 Further, in the method of manufacturing an electronic device of the present invention, the member for the electronic device may be formed of a member corresponding to the electronic device to be manufactured by a known method corresponding to the electronic device to be manufactured.

以上,詳細地對本發明之附無機膜之支撐基板與玻璃積層體、以及其製造方法與電子裝置之製造方法進行了說明,但本發明並不限 定於上述例,當然亦可於不脫離本發明之主旨之範圍內進行各種改良或變更。 The support substrate and the glass laminate with the inorganic film of the present invention, the method for producing the same, and the method for manufacturing the electronic device have been described in detail above, but the present invention is not limited thereto. It is a matter of course that various modifications and changes can be made without departing from the spirit and scope of the invention.

實施例 Example

以下,表示本發明之具體實施例,更詳細地對本發明進行說明。 Hereinafter, the present invention will be described in more detail with reference to specific embodiments of the invention.

[實施例1] [Example 1]

作為支撐基板,準備300×300mm且厚度為0.5mm之包含無鹼硼矽酸玻璃之玻璃基板(旭硝子公司製造之AN100)。 As a support substrate, a glass substrate (AN100 manufactured by Asahi Glass Co., Ltd.) containing an alkali-free borosilicate glass of 300 × 300 mm and a thickness of 0.5 mm was prepared.

藉由網版印刷於該支撐基板之整個表面塗佈纖維素溶液,形成線寬為18μm且線間(中心之間隔)為48μm之正方格子狀之圖案。進而,利用烘箱使該圖案乾燥而形成正方格子狀之遮罩。 A cellulose solution was applied to the entire surface of the support substrate by screen printing to form a square lattice pattern having a line width of 18 μm and a line width (center spacing) of 48 μm. Further, the pattern was dried by an oven to form a square lattice-shaped mask.

藉由使用氧化銦(In2O3)90質量%-氧化錫(SnO2)10質量%之靶材之濺鍍,於支撐基板之表面,隔著遮罩而成膜30nm之成為無機膜14之氧化銦錫。 By using sputtering of a target of indium oxide (In 2 O 3 ) 90% by mass-tin oxide (SnO 2 ) 10% by mass, the inorganic film 14 is formed on the surface of the support substrate by a film of 30 nm through a mask. Indium tin oxide.

繼而,藉由使用純水及刷之去除、以及超音波洗淨而去除(剝離)遮罩,從而製作於正交之二維方向上以18μm之等間隔排列有厚度為30nm且邊長為30μm之正方形之無機膜的附無機膜之支撐基板(島部(1個島狀之無機膜)之面積為900μm2,無機膜之面積率為39%)。 Then, the mask is removed (peeled) by using pure water, brush removal, and ultrasonic cleaning, and the thickness is 30 nm and the side length is 30 μm at equal intervals of 18 μm in the orthogonal two-dimensional direction. The inorganic film supporting substrate of the square inorganic film (the area of the island portion (one island-shaped inorganic film) was 900 μm 2 , and the area ratio of the inorganic film was 39%).

作為玻璃基板,準備300×300mm且厚度為0.2mm之包含無鹼硼矽酸玻璃之玻璃基板(旭硝子公司製造之AN100)。 As a glass substrate, a glass substrate (AN100 manufactured by Asahi Glass Co., Ltd.) containing an alkali-free borosilicate glass of 300 × 300 mm and a thickness of 0.2 mm was prepared.

於將該附無機膜之支撐基板及玻璃基板充分洗淨之後,抵接無機膜面而將兩者積層,從而製成玻璃積層體。於該玻璃積層體中,附無機膜之支撐基板與玻璃基板良好地密接,亦未產生氣泡。又,附無機膜之支撐基板與玻璃基板可容易地剝離。 After the support substrate and the glass substrate with the inorganic film are sufficiently washed, the inorganic film surface is abutted and the two are laminated to form a glass laminate. In the glass laminate, the support substrate with the inorganic film was in good contact with the glass substrate, and no bubbles were generated. Further, the support substrate with the inorganic film and the glass substrate can be easily peeled off.

進而,將玻璃積層體切斷成100×200mm,再次進行洗淨,且於600℃下進行1小時之熱處理。於熱處理後,確認玻璃積層體,結果於 內部未產生氣泡。於熱處理後將附無機膜之支撐基板與玻璃基板剝離,結果能夠以與熱處理前大致相同之力澈底地剝離。 Further, the glass laminate was cut into 100 × 200 mm, washed again, and heat-treated at 600 ° C for 1 hour. After the heat treatment, the glass laminate is confirmed, and the result is No bubbles were generated inside. After the heat treatment, the support substrate with the inorganic film was peeled off from the glass substrate, and as a result, it was peeled off with substantially the same force as before the heat treatment.

[實施例2] [Embodiment 2]

作為支撐基板,準備與實施例1相同之玻璃基板。 As the supporting substrate, the same glass substrate as in Example 1 was prepared.

藉由使用氧化銦(In2O3)80質量%-氧化鈰(CeO2)20質量%之靶材之濺鍍,於該支撐基板之整個表面成膜30nm之氧化銦鈰(以下,亦稱為ICO)之膜。 By using sputtering of a target of 20% by mass of indium oxide (In 2 O 3 ) and 20% by mass of cerium oxide (CeO 2 ), 30 nm of indium oxide bismuth is formed on the entire surface of the support substrate (hereinafter, also referred to as A film for ICO).

繼而,藉由使用光阻及曝光之通常之攝影術,形成如下之遮罩圖案:於正交之二維方向上,以端部之間隔(邊緣間距離)為10μm之等間隔排列邊長為20μm之正方形,且非形成部成為正方格子狀。 Then, by using the usual photography of the photoresist and the exposure, the following mask pattern is formed: in the two-dimensional orthogonal direction, the side lengths are arranged at equal intervals of the end portions (the distance between the edges) of 10 μm. A square of 20 μm, and the non-formed portion has a square lattice shape.

繼而,使用三氯化鐵(ferric chloride)與硝酸之混合液,對ICO膜進行20秒之蝕刻。 Then, the ICO film was etched for 20 seconds using a mixture of ferric chloride and nitric acid.

於結束ICO膜之蝕刻後,去除殘留之遮罩(光阻劑)並進行洗淨,從而製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 After the etching of the ICO film is completed, the remaining mask (photoresist) is removed and washed, and an inorganic film having a substantially square inorganic film containing ICO is arranged at equal intervals in the orthogonal two-dimensional direction. Support substrate.

使用光學顯微鏡測定所製作之附無機膜之支撐基板中之無機膜相對於支撐基板之面積率。其結果,島部之面積為256μm2(邊長為16μm),無機膜之面積率為28%。 The area ratio of the inorganic film in the support substrate with the inorganic film produced with respect to the support substrate was measured using an optical microscope. As a result, the area of the island portion was 256 μm 2 (the side length was 16 μm), and the area ratio of the inorganic film was 28%.

[實施例3] [Example 3]

將ICO膜之蝕刻設為60秒,除此之外,以與實施例2相同之方式製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 In the same manner as in Example 2, an inorganic film containing a substantially square inorganic film containing ICO was formed at equal intervals in the two-dimensional direction orthogonal to each other in the same manner as in Example 2 except that the etching of the ICO film was 60 seconds. Support the substrate.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為169μm2(邊長為13μm),無機膜之面積率為19%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 169 μm 2 (the side length was 13 μm), and the area ratio of the inorganic film was 19%.

[實施例4] [Example 4]

將ICO膜之蝕刻設為90秒,除此之外,以與實施例2相同之方式 製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 The etching of the ICO film was set to 90 seconds, except that in the same manner as in Example 2. A support substrate with an inorganic film containing a substantially square inorganic film of ICO was formed at equal intervals in two directions orthogonal to each other.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為121μm2(邊長為11μm),無機膜之面積率為13%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 121 μm 2 (the side length was 11 μm), and the area ratio of the inorganic film was 13%.

[實施例5] [Example 5]

將ICO膜之蝕刻設為120秒,除此之外,以與實施例2相同之方式製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 In the same manner as in Example 2, an inorganic film containing a substantially square inorganic film containing ICO was formed at equal intervals in the two-dimensional direction orthogonal to each other in the same manner as in Example 2 except that the etching of the ICO film was 120 seconds. Support the substrate.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為49μm2(邊長為7μm),無機膜之面積率為5%。 Example 2 was measured in the same manner with respect to the inorganic film of the substrate supporting area, the result is an area of 49 m 2 of the island portion (side length of 7 m), the inorganic film area of 5%.

[實施例6] [Embodiment 6]

使用氧化銦(In2O3)70質量%-氧化鈰(CeO2)30質量%之靶材作為濺鍍之靶材而成膜ICO膜,除此之外,以與實施例2相同之方式,製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板(ICO膜之蝕刻時間為20秒)。 The ICO film was formed by using a target of indium oxide (In 2 O 3 ) 70% by mass-CeO 2 (30% by mass) as a target of sputtering, and in the same manner as in Example 2 A support substrate with an inorganic film containing an approximately square inorganic film of ICO (an etching time of the ICO film of 20 seconds) was formed at equal intervals in two directions orthogonal to each other.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為361μm2(邊長為19μm),無機膜之面積率為40%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 361 μm 2 (side length: 19 μm), and the area ratio of the inorganic film was 40%.

[實施例7] [Embodiment 7]

將ICO膜之蝕刻設為60秒,除此之外,以與實施例6相同之方式,製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 In the same manner as in Example 6, except that the etching of the ICO film was carried out for 60 seconds, an inorganic film having a substantially square inorganic film containing ICO was formed at equal intervals in the two-dimensional direction orthogonal to each other. Support substrate.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為144μm2(邊長為12μm),無機膜之面積率為16%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 144 μm 2 (the side length was 12 μm), and the area ratio of the inorganic film was 16%.

[實施例8] [Embodiment 8]

將ICO膜之蝕刻設為90秒,除此之外,以與實施例6相同之方式,製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形 之無機膜的附無機膜之支撐基板。 In the same manner as in Example 6, except that the etching of the ICO film was performed for 90 seconds, a substantially square including ICO was arranged at equal intervals in the two-dimensional direction orthogonal to each other. A support substrate of an inorganic film with an inorganic film.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為100μm2(邊長為10μm),無機膜之面積率為11%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 100 μm 2 (the side length was 10 μm), and the area ratio of the inorganic film was 11%.

[實施例9] [Embodiment 9]

將ICO膜之蝕刻設為120秒,除此之外,以與實施例6相同之方式,製作於正交之二維方向上以等間隔排列有包含ICO之大致正方形之無機膜的附無機膜之支撐基板。 In the same manner as in Example 6, an inorganic film containing a substantially square inorganic film containing ICO was formed at equal intervals in the two-dimensional direction orthogonal to each other except that the etching of the ICO film was 120 seconds. Support substrate.

與實施例2同樣地測定無機膜相對於支撐基板之面積率,結果島部之面積為9μm2(邊長為3μm),無機膜之面積率為1%。 The area ratio of the inorganic film to the support substrate was measured in the same manner as in Example 2. As a result, the area of the island portion was 9 μm 2 (the side length was 3 μm), and the area ratio of the inorganic film was 1%.

[評估] [assessment]

針對實施例2~9之附無機膜之支撐基板,作為玻璃基板,使用與實施例1相同之玻璃基板,對積層性及氣泡之產生進行評估。 With respect to the support substrates with the inorganic films of Examples 2 to 9, the same glass substrates as in Example 1 were used as the glass substrates, and the buildup and generation of bubbles were evaluated.

<積層性> <Laminarity>

首先,於將所製作之附無機膜之支撐基板及玻璃基板充分洗淨之後,抵接無機膜形成面而將兩者積層,從而製成玻璃積層體。又,亦確認玻璃積層體之剝離性。 First, after the prepared support substrate and the glass substrate with the inorganic film are sufficiently washed, the inorganic film forming surface is abutted and the two are laminated to form a glass laminate. Moreover, the peeling property of the glass laminate was also confirmed.

於該玻璃積層體中,將附無機膜之支撐基板與玻璃基板良好地密接且於內部亦未產生氣泡之情形評估為積層性為『○』;將附無機膜之支撐基板與玻璃基板未充分地密接之情形、及/或於無機膜與玻璃基板之間產生有氣泡之情形評估為積層性為『×』。 In the glass laminate, the support substrate with the inorganic film is in close contact with the glass substrate, and no bubbles are generated inside, and the buildup property is evaluated as "○"; the support substrate with the inorganic film and the glass substrate are insufficient. The case where the ground is tightly bonded and/or the case where bubbles are generated between the inorganic film and the glass substrate is evaluated as "X".

<氣泡之產生> <Bubble generation>

繼而,將玻璃積層體切斷成100×200mm,再次進行洗淨,且於600℃下進行1小時之熱處理。 Then, the glass laminate was cut into 100 × 200 mm, washed again, and heat-treated at 600 ° C for 1 hour.

於熱處理後,確認玻璃積層體,將於玻璃積層體之內部未確認到氣泡之情形評估為氣泡之產生為『○』;將於玻璃積層體之內部確認到氣泡之情形評估為氣泡之產生為 『×』。 After the heat treatment, the glass laminate was confirmed, and the occurrence of bubbles in the inside of the glass laminate was evaluated as "○"; the bubble was confirmed inside the glass laminate as the occurrence of bubbles. 『×』.

將結果示於下述表。 The results are shown in the following table.

於上述表中,『無機膜』之『種類』欄之比係成膜無機膜之濺鍍之靶材中之氧化銦及氧化鈰之量(質量%) In the above table, the ratio of the "type" column of the "inorganic film" is the amount of indium oxide and antimony oxide in the target of the sputtering of the inorganic film (% by mass).

無機膜之厚度全部為30nm The thickness of the inorganic film is all 30nm

再者,實施例2、3及6中,進行熱處理後之附無機膜之支撐基板與玻璃基板之剝離性亦非常良好。又,實施例4及7中,進行熱處理後之附無機膜之支撐基板與玻璃基板之剝離性亦良好。 Further, in Examples 2, 3 and 6, the peeling property of the support substrate with the inorganic film and the glass substrate after the heat treatment was also very good. Further, in Examples 4 and 7, the peeling property of the support substrate with the inorganic film and the glass substrate after the heat treatment was also good.

[實施例10] [Embodiment 10]

作為支撐基板,準備300×300mm且厚度為0.5mm之包含無鹼硼矽酸玻璃之玻璃基板(旭硝子公司製造之AN100)。 As a support substrate, a glass substrate (AN100 manufactured by Asahi Glass Co., Ltd.) containing an alkali-free borosilicate glass of 300 × 300 mm and a thickness of 0.5 mm was prepared.

藉由網版印刷於該支撐基板之整個表面塗佈纖維素溶液,而形成線寬為17μm且線間(中心之間隔)為100μm之正方格子狀之圖案。進而,利用烘箱使該圖案乾燥,而形成正方格子狀之遮罩。 A cellulose solution was applied to the entire surface of the support substrate by screen printing to form a square lattice pattern having a line width of 17 μm and a line width (center spacing) of 100 μm. Further, the pattern was dried by an oven to form a square lattice-shaped mask.

藉由使用氧化銦(In2O3)80質量%-氧化鈰(CeO2)20質量%之靶材之濺鍍,於支撐基板之表面,隔著遮罩而成膜20nm之成為無機膜14之 ICO。 By using sputtering of a target of 20% by mass of indium oxide (In 2 O 3 ) and 20% by mass of cerium oxide (CeO 2 ), the inorganic film 14 is formed on the surface of the support substrate by a film of 20 nm through a mask. ICO.

繼而,藉由使用純水及刷之去除、以及超音波洗淨而去除(剝離)遮罩,從而製作於正交之二維方向上以17μm之等間隔排列有厚度為20nm且邊長為83μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為6889μm2,無機膜之面積率為69%)。 Then, the mask is removed (peeled) by the use of pure water, brush removal, and ultrasonic cleaning, and the thickness is 20 nm and the side length is 83 μm at equal intervals of 17 μm in the orthogonal two-dimensional direction. The inorganic substrate supporting substrate of the square inorganic film (the area of the island portion was 6889 μm 2 , and the area ratio of the inorganic film was 69%).

[實施例11] [Example 11]

將正方格子狀之遮罩圖案設為線寬為10μm且線間為50μm者,除此之外,與實施例10同樣地製作附無機膜之支撐基板。 A support substrate with an inorganic film was produced in the same manner as in Example 10 except that the square lattice-shaped mask pattern was set to have a line width of 10 μm and a line width of 50 μm.

因此,本例係於正交之二維方向上以10μm之等間隔排列有邊長為40μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為1600μm2,無機膜之面積率為64%)。 Therefore, in this example, an inorganic film-attached supporting substrate having a square inorganic film having a side length of 40 μm is arranged at equal intervals of 10 μm in an orthogonal two-dimensional direction (the area of the island portion is 1600 μm 2 , and the area ratio of the inorganic film is 64%).

[實施例12] [Embodiment 12]

將正方格子狀之遮罩圖案設為線寬為10μm且線間為30μm者,除此之外,與實施例10同樣地製作附無機膜之支撐基板。 A support substrate with an inorganic film was produced in the same manner as in Example 10 except that the square lattice-shaped mask pattern was set to have a line width of 10 μm and a line width of 30 μm.

因此,本例係於正交之二維方向上以10μm之等間隔排列有邊長為20μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為400μm2,無機膜之面積率為44%)。 Therefore, this example is an inorganic film-attached supporting substrate in which a square inorganic film having a side length of 20 μm is arranged at equal intervals of 10 μm in an orthogonal two-dimensional direction (the area of the island portion is 400 μm 2 , and the area ratio of the inorganic film is 44%).

[實施例13] [Example 13]

將正方格子狀之遮罩圖案設為線寬為15μm且線間為100μm者,除此之外,與實施例10同樣地製作附無機膜之支撐基板。 A support substrate with an inorganic film was produced in the same manner as in Example 10 except that the square lattice-shaped mask pattern was set to have a line width of 15 μm and a line width of 100 μm.

因此,本例係於正交之二維方向上以15μm之等間隔排列有邊長為85μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為7225μm2,無機膜之面積率為72%)。 Therefore, this example is an inorganic film-attached supporting substrate in which a square inorganic film having a side length of 85 μm is arranged at equal intervals of 15 μm in an orthogonal two-dimensional direction (the area of the island portion is 7225 μm 2 , and the area ratio of the inorganic film is 72%).

[實施例14] [Embodiment 14]

將包含ICO之無機膜之厚度設為30nm,將正方格子狀之遮罩圖案設為線寬為36μm且線間為100μm者,除此之外,與實施例10同樣 地製作附無機膜之支撐基板。 The thickness of the inorganic film containing ICO was set to 30 nm, and the mask pattern of the square lattice shape was set to have a line width of 36 μm and a line width of 100 μm, and the same as in the tenth embodiment. A support substrate with an inorganic film is produced.

因此,本例係於正交之二維方向上以36μm之等間隔排列有邊長為64μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為4096μm2,無機膜之面積率為41%)。 Therefore, in this example, an inorganic film-attached supporting substrate having a square inorganic film having a side length of 64 μm is arranged at equal intervals of 36 μm in an orthogonal two-dimensional direction (the area of the island portion is 4096 μm 2 , and the area ratio of the inorganic film is 41%).

[實施例15] [Example 15]

將包含ICO之無機膜之厚度設為30nm,將正方格子狀之遮罩圖案設為線寬為44μm且線間為100μm者,除此之外,與實施例10同樣地製作附無機膜之支撐基板。 The support of the inorganic film was produced in the same manner as in Example 10 except that the thickness of the inorganic film containing the ICO was 30 nm, and the mask pattern of the square lattice was set to have a line width of 44 μm and a line width of 100 μm. Substrate.

因此,本例係於正交之二維方向上以44μm之等間隔排列有邊長為56μm之正方形之無機膜的附無機膜之支撐基板(島部之面積為3136μm2,無機膜之面積率為31%)。 Therefore, in this example, an inorganic film-attached supporting substrate having a square inorganic film having a side length of 56 μm is arranged at equal intervals of 44 μm in an orthogonal two-dimensional direction (the area of the island portion is 3136 μm 2 , and the area ratio of the inorganic film is 31%).

[評估] [assessment]

針對實施例10~15之附無機膜之支撐基板,作為玻璃基板,使用與實施例1相同之玻璃基板,與實施例2~9同樣地對積層性及氣泡之產生進行評估。 With respect to the support substrates with the inorganic films of Examples 10 to 15, the same glass substrates as those of Example 1 were used as the glass substrates, and the buildup and the generation of bubbles were evaluated in the same manner as in Examples 2 to 9.

將結果示於下述表。 The results are shown in the following table.

濺鍍之靶材全部為[In:Ce=80:20](參照表1) The targets of the sputtering are all [In:Ce=80:20] (refer to Table 1)

再者,於任一實施例中,進行熱處理後之附無機膜之支撐基板與玻璃基板之剝離性均非常良好。 Further, in any of the examples, the peeling property of the support substrate with the inorganic film and the glass substrate after the heat treatment was very good.

[比較例1] [Comparative Example 1]

作為支撐基板,準備與實施例1相同之玻璃基板。 As the supporting substrate, the same glass substrate as in Example 1 was prepared.

使用與實施例2相同之靶材,於該支撐基板之整個表面成膜20nm之ICO膜,而製作附無機膜之支撐基板。 Using the same target material as in Example 2, a 20 nm ICO film was formed on the entire surface of the support substrate to prepare a support substrate with an inorganic film.

作為玻璃基板,準備與實施例1相同之玻璃基板。 A glass substrate similar to that of Example 1 was prepared as a glass substrate.

於將該附無機膜之支撐基板及玻璃基板充分洗淨之後,抵接無機膜面而將兩者積層,從而製成玻璃積層體。於該玻璃積層體中,附無機膜之支撐基板與玻璃基板良好地密接,亦未產生氣泡。 After the support substrate and the glass substrate with the inorganic film are sufficiently washed, the inorganic film surface is abutted and the two are laminated to form a glass laminate. In the glass laminate, the support substrate with the inorganic film was in good contact with the glass substrate, and no bubbles were generated.

進而,將玻璃積層體切斷成100×200mm,再次進行洗淨,且於600℃下進行1小時之熱處理。於熱處理後,確認玻璃積層體,結果於內部產生有多個氣泡。 Further, the glass laminate was cut into 100 × 200 mm, washed again, and heat-treated at 600 ° C for 1 hour. After the heat treatment, the glass laminate was confirmed, and as a result, a plurality of bubbles were generated inside.

根據以上之結果,本發明之效果變明確。 Based on the above results, the effects of the present invention become clear.

參照特定之態樣對本發明進行了詳細說明,但對於業者而言應明白,可於不脫離本發明之精神及範圍之前提下進行各種變更及修正。 The present invention has been described in detail with reference to the specific embodiments thereof. It is understood that various changes and modifications may be made without departing from the spirit and scope of the invention.

再者,本申請案係基於2014年8月1日申請之日本專利申請案(日本專利特願2014-158117),藉由引用而援用其整體。 In addition, the present application is based on a Japanese patent application filed on August 1, 2014 (Japanese Patent Application No. 2014-158117), the entire disclosure of which is incorporated by reference.

[產業上之可利用性] [Industrial availability]

可較佳地用於各種電子裝置之製造等中。 It can be preferably used in the manufacture of various electronic devices and the like.

10‧‧‧附無機膜之支撐基板 10‧‧‧Support substrate with inorganic film

12‧‧‧支撐基板 12‧‧‧Support substrate

14‧‧‧無機膜 14‧‧‧Inorganic film

16‧‧‧玻璃基板 16‧‧‧ glass substrate

20‧‧‧玻璃積層體 20‧‧‧Glass laminate

24‧‧‧無機膜 24‧‧‧Inorganic film

24a‧‧‧凸部 24a‧‧‧ convex

24b‧‧‧凹部 24b‧‧‧ recess

30‧‧‧附無機膜之支撐基板 30‧‧‧Support substrate with inorganic film

d‧‧‧間隔 D‧‧‧ interval

t‧‧‧厚度 T‧‧‧thickness

Claims (17)

一種附無機膜之支撐基板,其特徵在於:具有支撐基板、及形成於上述支撐基板上之無機膜,且上述無機膜包含散佈於上述支撐基板上之複數個島部,未形成有上述無機膜之上述支撐基板之露出部於上述支撐基板之面方向上連接至外部。 A support substrate with an inorganic film, comprising: a support substrate; and an inorganic film formed on the support substrate, wherein the inorganic film includes a plurality of island portions dispersed on the support substrate, and the inorganic film is not formed The exposed portion of the support substrate is connected to the outside in the surface direction of the support substrate. 如請求項1之附無機膜之支撐基板,其中上述島部之高度為40nm以下。 The support substrate of the inorganic film according to claim 1, wherein the height of the island portion is 40 nm or less. 如請求項1或2之附無機膜之支撐基板,其中上述島部係於端部之間隔為20μm以內之位置形成其他島部。 The support substrate with an inorganic film according to claim 1 or 2, wherein the island portion is formed at a position where the interval between the ends is 20 μm or less. 如請求項1至3中任一項之附無機膜之支撐基板,其中上述島部之各者之面積為0.1~10000μm2The support substrate with an inorganic film according to any one of claims 1 to 3, wherein an area of each of the island portions is 0.1 to 10000 μm 2 . 如請求項1至4中任一項之附無機膜之支撐基板,其中上述複數個島部之合計面積以相對於上述支撐基板之表面之面積率計為11~80%。 The support substrate with an inorganic film according to any one of claims 1 to 4, wherein a total area of the plurality of island portions is 11 to 80% with respect to an area ratio of a surface of the support substrate. 一種附無機膜之支撐基板,其特徵在於:具有支撐基板、及形成於上述支撐基板上之無機膜,且上述無機膜具有包含複數個凸部與凹部之凹凸,該等複數個凸部包含較厚之部分,該凹部包含較薄之部分,且上述凹部於上述支撐基板之面方向上連接至外部。 A support substrate with an inorganic film, comprising: a support substrate; and an inorganic film formed on the support substrate, wherein the inorganic film has irregularities including a plurality of convex portions and concave portions, and the plurality of convex portions include In the thick portion, the concave portion includes a thin portion, and the concave portion is connected to the outside in a direction of a surface of the support substrate. 如請求項6之附無機膜之支撐基板,其中上述凹凸之高度之差為40nm以下。 The support substrate with an inorganic film according to claim 6, wherein a difference in height between the irregularities is 40 nm or less. 如請求項6或7之附無機膜之支撐基板,其中上述凸部係於端部之間隔為20μm以內之位置形成其他凸部。 The support substrate with an inorganic film according to claim 6 or 7, wherein the convex portion is formed at a position where the interval between the end portions is within 20 μm to form other convex portions. 如請求項6至8中任一項之附無機膜之支撐基板,其中上述凸部 之各者之面積為0.1~10000μm2Attachment of an inorganic film support substrate according to any one of items 6 to 8, such as a request, wherein the area of each of those portions of the projections is 0.1 ~ 10000μm 2. 如請求項6至9中任一項之附無機膜之支撐基板,其中上述複數個凸部之合計面積以相對於上述支撐基板之面積率計為11~80%。 The support substrate with an inorganic film according to any one of claims 6 to 9, wherein a total area of the plurality of convex portions is 11 to 80% with respect to an area ratio of the support substrate. 一種玻璃積層體,其係於如請求項1至10中任一項之附無機膜之支撐基板之無機膜上積層玻璃基板而成。 A glass laminate obtained by laminating a glass substrate on an inorganic film of a support substrate with an inorganic film according to any one of claims 1 to 10. 一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成包含無機物之膜,且對上述包含無機物之膜進行蝕刻,藉此形成包含散佈於上述支撐基板上之複數個島部的無機膜。 A method for producing a support substrate with an inorganic film, comprising: forming a film containing an inorganic substance on a surface of the support substrate, and etching the film containing the inorganic material to form a plurality of islands dispersed on the support substrate The inorganic film of the part. 一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成包含無機物之膜,且對上述包含無機物之膜進行蝕刻,藉此於上述包含無機物之膜形成包含複數個凸部與凹部之凹凸,該等複數個凸部包含較厚之部分,該凹部包含較薄之部分。 A method for producing a support substrate with an inorganic film, comprising: forming a film containing an inorganic material on a surface of the support substrate, and etching the film containing the inorganic material to form a plurality of convex portions in the film containing the inorganic material; And the concavities and convexities of the recesses, the plurality of convex portions including a thicker portion, the concave portion including a thinner portion. 一種附無機膜之支撐基板之製造方法,其特徵在於:於支撐基板之表面形成散佈複數個非形成部之樹脂膜,將上述樹脂膜作為遮罩而於上述支撐基板上成膜無機膜,其後去除上述樹脂膜。 A method for producing a support substrate with an inorganic film, characterized in that a resin film in which a plurality of non-formed portions are dispersed is formed on a surface of a support substrate, and an inorganic film is formed on the support substrate by using the resin film as a mask. The above resin film is then removed. 如請求項14之附無機膜之支撐基板之製造方法,其中於成膜上述樹脂膜之前,於上述支撐基板之表面成膜基底無機膜。 The method for producing a support substrate with an inorganic film according to claim 14, wherein the base inorganic film is formed on the surface of the support substrate before the film formation of the resin film. 一種玻璃積層體之製造方法,其係於藉由如請求項12至15中任一項之製造方法形成附無機膜之支撐基板後,於無機膜積層玻璃基板。 A method for producing a glass laminate, which comprises forming a support substrate with an inorganic film by the production method according to any one of claims 12 to 15, and then laminating the glass substrate on the inorganic film. 一種電子裝置之製造方法,其特徵在於:使用如請求項16之玻璃積層體之製造方法。 A method of manufacturing an electronic device characterized by using the method for producing a glass laminate according to claim 16.
TW104124982A 2014-08-01 2015-07-31 Glass laminate and support substrate equipped with inorganic film, method for manufacturing said glass laminate and said support substrate, and method for manufacturing electronic device TW201609429A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014158117A JP2017165589A (en) 2014-08-01 2014-08-01 Supporter substrate with inorganic film and glass laminate, manufacturing method thereof, and manufacturing method of electronic device

Publications (1)

Publication Number Publication Date
TW201609429A true TW201609429A (en) 2016-03-16

Family

ID=55217550

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104124982A TW201609429A (en) 2014-08-01 2015-07-31 Glass laminate and support substrate equipped with inorganic film, method for manufacturing said glass laminate and said support substrate, and method for manufacturing electronic device

Country Status (3)

Country Link
JP (1) JP2017165589A (en)
TW (1) TW201609429A (en)
WO (1) WO2016017650A1 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI703906B (en) * 2019-06-03 2020-09-01 易華電子股份有限公司 Method for reducing residual dry film on a printed circuit board
TWI735731B (en) * 2017-01-17 2021-08-11 日商太陽油墨製造股份有限公司 Photosensitive film laminate and cured product formed by using it

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102299470B1 (en) * 2019-12-23 2021-09-08 주식회사 현대케피코 Assembly for fuel injector and coating method for the same

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3752861B2 (en) * 1998-09-25 2006-03-08 旭硝子株式会社 Fluorine-containing resin film and laminate
EP2463253B1 (en) * 2010-01-12 2019-11-06 Nippon Electric Glass Co., Ltd. Glass film laminate, method of producing the same, and method of producing glass film
WO2012060199A1 (en) * 2010-11-05 2012-05-10 旭硝子株式会社 Laminate body, panel for use in display device with support board, panel for use in display device, and display device
JPWO2012144499A1 (en) * 2011-04-22 2014-07-28 旭硝子株式会社 Laminate, production method and use thereof
WO2012169602A1 (en) * 2011-06-08 2012-12-13 旭硝子株式会社 Substrate having transparent conductive film attached thereto
JP2013184346A (en) * 2012-03-07 2013-09-19 Asahi Glass Co Ltd Glass laminate, and method for producing electronic device
KR20150023312A (en) * 2012-05-29 2015-03-05 아사히 가라스 가부시키가이샤 Glass laminate and method for manufacturing electronic device
JP6119567B2 (en) * 2013-11-11 2017-04-26 旭硝子株式会社 Method for manufacturing glass laminate and method for manufacturing electronic device
JP6176067B2 (en) * 2013-11-11 2017-08-09 旭硝子株式会社 GLASS LAMINATE AND ELECTRONIC DEVICE MANUFACTURING METHOD

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI735731B (en) * 2017-01-17 2021-08-11 日商太陽油墨製造股份有限公司 Photosensitive film laminate and cured product formed by using it
TWI703906B (en) * 2019-06-03 2020-09-01 易華電子股份有限公司 Method for reducing residual dry film on a printed circuit board

Also Published As

Publication number Publication date
WO2016017650A1 (en) 2016-02-04
JP2017165589A (en) 2017-09-21

Similar Documents

Publication Publication Date Title
JP6172362B2 (en) GLASS LAMINATE AND ELECTRONIC DEVICE MANUFACTURING METHOD
JP6176067B2 (en) GLASS LAMINATE AND ELECTRONIC DEVICE MANUFACTURING METHOD
JP6119567B2 (en) Method for manufacturing glass laminate and method for manufacturing electronic device
TW201609419A (en) Support substrate with inorganic film, glass laminate, method for producing these, and method for producing electronic device
JP6136909B2 (en) Manufacturing method of support substrate with resin layer, manufacturing method of glass laminate, manufacturing method of electronic device
JP2013184346A (en) Glass laminate, and method for producing electronic device
JP6943249B2 (en) Laminated body, manufacturing method of electronic device, manufacturing method of laminated body
WO2015163134A1 (en) Glass laminate body, and method for manufacturing electronic device
JP7070425B2 (en) Manufacturing method for laminated boards and electronic devices
JP6673354B2 (en) Method for manufacturing carrier substrate, laminate, and electronic device
TW201609429A (en) Glass laminate and support substrate equipped with inorganic film, method for manufacturing said glass laminate and said support substrate, and method for manufacturing electronic device
JP2019061975A (en) Resin substrate laminate and method of manufacturing electronic device
KR20150065606A (en) Manufacturing method of electronic device
TWI813882B (en) Laminated substrate, method of manufacturing electronic device, and method of manufacturing laminated substrate
JP2017163138A (en) Laminate, manufacturing method of laminate, manufacturing method of unit laminate, and manufacturing method of device substrate
JP2017159504A (en) Layered body, method for producing layered body, method for producing unit layered body, and method for producing device substrate
WO2016017649A1 (en) Glass laminate, supporting substrate with inorganic layer, method for manufacturing electronic device, and method for producing supporting substrate with inorganic layer
JP2017164903A (en) Glass laminate, support substrate with inorganic layer, method for producing electronic device, and method for producing support substrate with inorganic layer