TW201600924A - Pellicle mount apparatus - Google Patents

Pellicle mount apparatus Download PDF

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Publication number
TW201600924A
TW201600924A TW104116495A TW104116495A TW201600924A TW 201600924 A TW201600924 A TW 201600924A TW 104116495 A TW104116495 A TW 104116495A TW 104116495 A TW104116495 A TW 104116495A TW 201600924 A TW201600924 A TW 201600924A
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Taiwan
Prior art keywords
pellicle
original plate
bonding
pellicle frame
film
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TW104116495A
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Chinese (zh)
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TWI656399B (en
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高村一夫
小野陽介
種市大樹
佐藤泰之
廣田俊明
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三井化學股份有限公司
龍雲股份有限公司
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/62Pellicles, e.g. pellicle assemblies, e.g. having membrane on support frame; Preparation thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
    • G03F1/24Reflection masks; Preparation thereof

Abstract

A pellicle mount apparatus includes a bonding unit that includes: a bonding chamber at which bonding of a pellicle and an original plate is performed, the pellicle including a pellicle film and a pellicle frame, the pellicle frame supporting the pellicle film at a side of one end face in a thickness direction of the pellicle frame, having a groove formed at the other end face in the thickness direction of the pellicle frame, and having a through-hole passing between an outer peripheral face of the pellicle frame and a wall surface of the groove, and the original plate having a light irradiation face onto which exposure light is irradiated; and an evacuation tube for evacuating the inside of the groove via the through-hole of the pellicle frame in a state in which the pellicle and the original plate are arranged in the bonding chamber such that the other end face of the pellicle frame and the light irradiation face oppose each other.

Description

防塵薄膜安裝裝置Dust-proof film mounting device

本發明是有關於一種防塵薄膜組件安裝裝置。The present invention relates to a pellicle assembly mounting device.

半導體器件(半導體裝置)的高積體化及微細化正逐年加速。 例如,現在是藉由準分子曝光來形成線寬45 nm左右的圖案,但近年,隨著半導體器件的進一步微細化,要求形成線寬32 nm以下的圖案。藉由現有的準分子曝光難以應對此種微細加工。因此,正研究將曝光光替換為波長更短的極紫外(Extreme Ultra Violet,EUV)光。The high integration and miniaturization of semiconductor devices (semiconductor devices) are accelerating year by year. For example, a pattern having a line width of about 45 nm is formed by excimer exposure. However, in recent years, with the further miniaturization of semiconductor devices, it has been required to form a pattern having a line width of 32 nm or less. It is difficult to cope with such microfabrication by existing excimer exposure. Therefore, it is being studied to replace the exposure light with a shorter wavelength Ultra Light Violet (EUV) light.

EUV光具有容易被所有物質吸收的特性。 因此,於使用EUV光作為曝光光的光微影術(以下亦稱為「EUV微影術」)中,使用反射光學系統進行曝光。具體而言,藉由反映曝光圖案的原版(遮罩)使EUV光反射,藉由作為反射光的EUV光對抗蝕劑進行曝光。此時,若原版上附著有異物,則由於EUV光被異物吸收,或EUV光發生散射,因此存在無法曝光為所需圖案的情形。 因此,正研究以防塵薄膜組件(pellicle)保護原版的EUV光照射面,具體而言,將防塵薄膜組件裝設(安裝)於原版的EUV光照射面側。 防塵薄膜組件的構成採用具有用以保護原版的EUV光照射面的防塵薄膜(pellicle film)、及支持該防塵薄膜的防塵薄膜組件框的構成。EUV light has characteristics that are easily absorbed by all substances. Therefore, in photolithography (hereinafter also referred to as "EUV lithography") using EUV light as exposure light, exposure is performed using a reflection optical system. Specifically, the EUV light is reflected by the original plate (mask) reflecting the exposure pattern, and the resist is exposed by EUV light as reflected light. At this time, if foreign matter adheres to the original plate, the EUV light is absorbed by the foreign matter or the EUV light is scattered, so that the desired pattern cannot be exposed. Therefore, the EUV light-irradiating surface of the original plate is protected by a pellicle, and specifically, the pellicle is mounted (mounted) on the EUV light-irradiating side of the original plate. The pellicle is configured to have a pellicle film for protecting the EUV light-irradiating surface of the original plate, and a pellicle frame for supporting the pellicle.

作為EUV微影術所使用的防塵薄膜,要求對EUV光具有高透過性,且不會因照射EUV光而分解、變形。作為滿足此種要求的防塵薄膜,提出有單晶矽膜等矽結晶膜(例如,參照文獻1及文獻2)、積層於金屬網上的氮化鋁膜(例如,參照文獻3)、石墨烯膜(例如,參照文獻4)等。As a dustproof film used for EUV lithography, it is required to have high permeability to EUV light, and it is not decomposed and deformed by irradiation of EUV light. As a pellicle film which satisfies such a requirement, a ruthenium crystal film such as a single crystal ruthenium film (for example, Reference 1 and Document 2), an aluminum nitride film laminated on a metal mesh (for example, Reference 3), and graphene are proposed. A film (for example, Reference 4) or the like.

[文獻1]日本專利特開2010-256434號公報 [文獻2]日本專利特開2009-116284號公報 [文獻3]日本專利特開2005-43895號公報 [文獻4]國際公開第2011/160861號公報[Patent 1] Japanese Patent Laid-Open No. 2010-256434 [Document 2] Japanese Patent Laid-Open Publication No. 2009-116284 (Document No. 3) Japanese Patent Laid-Open No. 2005-43895 (Document 4) International Publication No. 2011/160861 Bulletin

[發明所欲解決之課題][Problems to be solved by the invention]

此外,現在於將以EUV微影術用的防塵薄膜組件為首的包含防塵薄膜及防塵薄膜組件框的防塵薄膜組件裝設(安裝)於原版時,即貼合防塵薄膜組件與原版時,有時藉由裝置、夾具、手等接觸防塵薄膜的膜面。 然而,防塵薄膜具有非常容易破損的性質,因此於防塵薄膜的處理中要求細心留意。於防塵薄膜中,含有無機系材料的防塵薄膜(例如,文獻1~文獻4所記載的防塵薄膜)不僅是難以自立的膜,而且是亦會因機械上的接觸而導致損傷或起塵的膜,因此於其處理中要求進一步留意。 另外,伴隨半導體器件的微細化,為了避免異物附著於防塵薄膜,要求進一步留意。In addition, when the pellicle module including the pellicle film and the pellicle frame is included in the original plate, which is the pellicle for EUV lithography, the pell film assembly and the original plate are sometimes attached. The film surface of the pellicle film is contacted by a device, a jig, a hand, or the like. However, the pellicle film has a property of being easily broken, and therefore it is required to pay careful attention to the treatment of the pellicle film. In the pellicle film, a pellicle film containing an inorganic material (for example, the pellicle film described in Documents 1 to 4) is not only a film that is difficult to be self-supporting, but also a film that is damaged or dusted by mechanical contact. Therefore, further attention is required in its processing. Further, in order to prevent the foreign matter from adhering to the pellicle film, it is required to further pay attention to the miniaturization of the semiconductor device.

自以上觀點出發,業界正在對藉由貼合防塵薄膜組件與原版來將防塵薄膜組件裝設(安裝)於原版時,儘量避免裝置、夾具、手等接觸防塵薄膜的膜面而將兩者貼合的防塵薄膜組件安裝裝置進行研究。From the above point of view, the industry is attaching (installing) the pellicle assembly to the original plate by attaching the pellicle and the original plate, and avoiding the contact of the device, the jig, the hand, etc. with the film surface of the pellicle. The combined pellicle assembly mounting device was studied.

本發明是鑒於所述而完成者,其課題在於達成以下目的。 即,本發明的目的在於提供一種於藉由貼合防塵薄膜組件與原版來將防塵薄膜組件裝設(安裝)於原版時,可於儘量避免接觸防塵薄膜的膜面的情況下而將兩者貼合的防塵薄膜組件安裝裝置。 [解決課題之手段]The present invention has been made in view of the above, and it is an object of the present invention to achieve the following objects. That is, an object of the present invention is to provide a method in which the pellicle film assembly is mounted (mounted) on the original plate by bonding the pellicle film assembly and the original plate, and the film surface of the pellicle film can be avoided as much as possible. Fitted pellicle assembly mounting device. [Means for solving the problem]

用以解決所述課題的具體手段如以下所述。 <1> 一種防塵薄膜組件安裝裝置,其具備貼合單元,所述貼合單元包含: 貼合腔室,用來對防塵薄膜組件與具有曝光光可照射的光照射面的原版進行貼合,所述防塵薄膜組件包含防塵薄膜及防塵薄膜組件框,所述防塵薄膜組件框於厚度方向的一端面之側支持所述防塵薄膜,且具有設置於厚度方向的另一端面的溝槽及貫通外周面與所述溝槽的壁面之間的通孔;及 排氣管,用以在所述防塵薄膜組件及所述原版以所述防塵薄膜組件框的所述另一端面與所述光照射面相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。Specific means for solving the problem are as follows. <1> A pellicle assembly mounting device comprising a bonding unit, the bonding unit comprising: a bonding chamber for bonding a pellicle film to an original plate having a light irradiation surface that can be irradiated with exposure light, The pellicle comprises a pellicle film and a pellicle frame, the pellicle frame supporting the pellicle on the side of one end face in the thickness direction, and having a groove disposed at the other end face in the thickness direction and penetrating the periphery a through hole between the surface and the wall surface of the groove; and an exhaust pipe for the other end surface of the pellicle frame and the light irradiation surface on the pellicle assembly and the original plate The inside of the groove is exhausted through the through hole of the pellicle frame in a state in which the opposing manner is disposed in the bonding chamber.

<2> 如<1>所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓的導入管。 <3> 如<2>所述的防塵薄膜組件安裝裝置,其中所述導入管包含第1導入管,所述第1導入管自與所述貼合腔室內所配置的所述防塵薄膜組件及所述原版中的所述防塵薄膜組件相對向之側導入氣體, 所述貼合單元進而包含氣體分散構件, 所述氣體分散構件用以使自所述第1導入管導入的氣體分散。 <4> 如<1>至<3>中任一項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通。 <5> 如<4>所述的防塵薄膜組件安裝裝置,其中所述連通構件被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動。 <6> 如<4>或<5>所述的防塵薄膜組件安裝裝置,其中所述連通構件具有可插入至所述通孔的開口端。<2> The pellicle assembly mounting apparatus according to <1>, wherein the bonding unit includes an introduction tube for introducing a gas into the bonding chamber to pressurize the bonding chamber. The pellicle assembly mounting device according to the above aspect, wherein the introduction pipe includes a first introduction pipe, and the first introduction pipe is from the pellicle assembly disposed in the bonding chamber and The pellicle film in the original plate introduces gas to the side, and the bonding unit further includes a gas dispersing member for dispersing a gas introduced from the first introduction pipe. The pellicle assembly mounting device according to any one of <1>, wherein the bonding unit includes a communication member in the fitting chamber and the exhaust gas One end of the tube is connected, and the exhaust pipe is communicated with the through hole of the pellicle frame. <5> The pellicle assembly mounting device according to <4>, wherein the communication member is provided to be movable in a direction of being pushed into an outer peripheral surface of the pellicle frame. <6> The pellicle assembly mounting device according to <4>, wherein the communication member has an open end insertable into the through hole.

<7> 如<1>至<6>中任一項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含原版支持構件,所述原版支持構件在所述貼合腔室內支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部。 <8> 如<1>至<7>中任一項所述的防塵薄膜組件安裝裝置,其中所述原版被收容在原版殼體而被搬入所述貼合腔室內,所述原版殼體具有使所述原版的光照射面露出的開口部,且支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部, 所述貼合單元包含原版殼體支持構件,所述原版殼體支持構件在所述貼合腔室內對收容所述原版的所述原版殼體進行支持。 <9> 如<1>至<8>中任一項所述的防塵薄膜組件安裝裝置,其進而具備對所述貼合後的所述防塵薄膜組件及所述原版進行外觀檢查的檢查單元。The pellicle assembly mounting device according to any one of <1>, wherein the bonding unit includes a master supporting member, and the master supporting member supports and houses in the fitting chamber The light-irradiating surface of the original plate is a peripheral end portion of the surface on the opposite side and at least a part of the outer peripheral surface of the original plate, and a central portion of the surface on the opposite side is not supported. The pellicle assembly mounting device according to any one of the above aspects, wherein the original plate is housed in a master casing and carried into the fitting chamber, the original casing having An opening that exposes the light-irradiating surface of the original plate, and supports at least a part of a peripheral end portion of a surface opposite to the light-irradiating surface of the original plate and an outer peripheral surface of the original plate, and does not support the opposite side In the central portion of the surface, the bonding unit includes a master housing supporting member that supports the master housing that houses the original plate in the bonding chamber. The pellicle assembly mounting apparatus according to any one of the above aspects, further comprising an inspection unit that performs an appearance inspection on the bonded pellicle assembly and the original plate.

<10> 如<1>至<9>中任一項所述的防塵薄膜組件安裝裝置,其具備: 第1測定部件,對與所述原版貼合前的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定;及 第2測定部件,對與所述原版貼合後的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定。 <11> 如<10>所述的防塵薄膜組件安裝裝置,其具備: 對準部件,於貼合所述原版與所述防塵薄膜組件之前,進行所述原版與所述防塵薄膜組件的對準;及 控制部件,基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對利用所述對準部件的對準進行前饋控制。 <12> 如<10>所述的防塵薄膜組件安裝裝置,其具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果之差,來算出藉由所述貼合而引起的所述防塵薄膜組件框的應變量。 <13> 如<12>所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動,且 所述算出部件為基於所述應變量而對所述連通構件所引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。 [發明的效果]The pellicle assembly mounting apparatus according to any one of the above aspects, comprising: the first measuring member, the dustproof member of the pellicle assembly before bonding with the original plate The shape of the film module frame is measured; and the second measuring member measures the shape of the pellicle frame of the pellicle film bonded to the original plate. <11> The pellicle assembly mounting device according to <10>, comprising: an alignment member that performs alignment of the original plate and the pellicle assembly before bonding the original plate and the pellicle assembly And a control member based on the measurement result of the shape of the pellicle frame before the bonding and the measurement result of the shape of the pellicle frame after the bonding, and the use of the alignment member Alignment for feedforward control. <12> The pellicle assembly mounting device according to <10>, comprising: a calculation member that is based on a measurement result of a shape of the pellicle frame before the bonding and the bonded portion The amount of measurement of the shape of the pellicle frame is determined by the difference between the measurement results of the pellicle frame. <13> The pellicle assembly mounting device according to <12>, wherein the bonding unit includes a communication member that is connected to one end of the exhaust pipe in the fitting chamber, and is provided The exhaust pipe communicates with the through hole of the pellicle frame, and is disposed to be movable in a direction of pushing into an outer peripheral surface of the pellicle frame, and the calculating component is based on the strain amount And a control member that performs feedforward control on the amount of pushing of the pellicle frame caused by the communicating member. [Effects of the Invention]

根據本發明,提供一種於藉由貼合防塵薄膜組件與原版來將防塵薄膜組件裝設(安裝)於原版時,可於儘量避免接觸防塵薄膜的膜面的情況下而將兩者貼合的防塵薄膜組件安裝裝置。According to the present invention, when the pellicle assembly is mounted (mounted) on the original plate by bonding the pellicle assembly and the original plate, the two can be attached while avoiding contact with the film surface of the pellicle film as much as possible. Dust-proof film assembly mounting device.

以下,一面適當參照圖式,一面對本發明的實施方式進行說明。然而,本發明並不限定於圖式等具體的實施方式。另外,存在對各圖式共通的要素標註相同符號的情況,且存在省略重複說明的情況。另外,於圖式中,為了容易觀察結構,存在省略隱藏線的一部分的情況。Hereinafter, an embodiment of the present invention will be described with reference to the drawings as appropriate. However, the present invention is not limited to the specific embodiments such as the drawings. In addition, the same reference numerals are attached to the elements common to the respective drawings, and the overlapping description will be omitted. Further, in the drawings, in order to easily observe the structure, there is a case where a part of the hidden line is omitted.

本實施方式的防塵薄膜組件安裝裝置具備貼合單元,所述貼合單元包含貼合腔室與排氣管,所述貼合腔室用來對防塵薄膜組件與具有曝光光可照射的光照射面的原版進行貼合,所述防塵薄膜組件包含防塵薄膜及防塵薄膜組件框,所述防塵薄膜組件框於厚度方向的一端面之側支持所述防塵薄膜,且具有設置於厚度方向的另一端面的溝槽及貫通外周面與所述溝槽的壁面之間的通孔,所述排氣管用以在所述防塵薄膜組件及所述原版以所述防塵薄膜組件框的所述另一端面與所述光照射面相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。The pellicle assembly mounting device of the present embodiment includes a bonding unit including a bonding chamber and an exhaust pipe for illuminating the pellicle and the light having the exposure light The pellicle is provided with a pellicle and a pellicle frame, the pellicle frame supporting the pellicle on the side of one end face in the thickness direction, and having another set in the thickness direction a groove of the end surface and a through hole penetrating between the outer peripheral surface and the wall surface of the groove, the exhaust pipe being used for the pellicle assembly and the original plate to be the other end face of the pellicle frame The inside of the groove is exhausted through the through hole of the pellicle frame in a state in which it is disposed in the bonding chamber so as to face the light irradiation surface.

本實施方式的防塵薄膜組件包含防塵薄膜及防塵薄膜組件框。該防塵薄膜組件框於厚度方向的一端面之側支持防塵薄膜。防塵薄膜組件框具有設置於其厚度方向的另一端面的溝槽。進而,防塵薄膜組件框具有貫通其外周面與所述溝槽的壁面之間的通孔。 而且,於本實施方式的貼合單元中,在防塵薄膜組件及原版以防塵薄膜組件框的另一端面與原版的光照射面相對向的方式配置的狀態下,藉由所述排氣管經由防塵薄膜組件框的通孔而對溝槽的內部進行排氣。藉此,可使壓合力於防塵薄膜組件的防塵薄膜組件框與原版之間發揮作用。因此,可於儘量避免(藉由裝置、夾具、手等)接觸防塵薄膜的膜面的情況下將兩者貼合。 因此,根據本實施方式的防塵薄膜組件安裝裝置,可發揮如下效果:於貼合防塵薄膜組件與原版而將防塵薄膜組件裝設(安裝)於原版時,可於儘量避免接觸防塵薄膜的膜面的情況下將兩者貼合。 再者,於本實施方式中,「壓合力」與吸合力含義相同。The pellicle film assembly of the present embodiment includes a pellicle film and a pellicle frame. The pellicle frame supports a pellicle film on the side of one end face in the thickness direction. The pellicle frame has a groove provided at the other end face in the thickness direction thereof. Further, the pellicle frame has a through hole penetrating between the outer peripheral surface thereof and the wall surface of the groove. Further, in the bonding unit of the present embodiment, the pellicle film and the original plate are disposed in such a manner that the other end surface of the pellicle frame is opposed to the light irradiation surface of the original plate, and the exhaust pipe is passed through the exhaust pipe. The through hole of the pellicle frame is vented to the inside of the groove. Thereby, the pressing force can be exerted between the pellicle frame of the pellicle and the original. Therefore, it is possible to avoid bonding (by a device, a jig, a hand, etc.) to the film surface of the pellicle film as much as possible. Therefore, according to the pellicle assembly mounting apparatus of the present embodiment, the film surface of the pellicle film can be prevented from being contacted as much as possible when the pellicle film assembly is mounted (mounted) on the original plate by bonding the pellicle film assembly and the original plate. In the case of the two together. Further, in the present embodiment, the "compression force" has the same meaning as the suction force.

於本說明書中,將防塵薄膜組件與原版貼合而成的結果物(即,裝設有防塵薄膜組件的原版)亦稱為「附防塵薄膜組件的原版」或「曝光原版」。本實施方式的防塵薄膜組件安裝裝置亦可稱為「附防塵薄膜組件的原版的製造裝置」或「曝光原版的製造裝置」。In the present specification, the result of bonding the pellicle assembly to the original plate (that is, the original plate on which the pellicle is mounted) is also referred to as "the original plate with the pellicle assembly" or the "exposure original". The pellicle mounting device of the present embodiment may also be referred to as a "manufacturing device for a master with a pellicle film assembly" or a "manufacturing device for exposing a master."

進而,根據本實施方式的防塵薄膜組件安裝裝置,可抑制於貼合防塵薄膜組件與原版時,因接觸防塵薄膜組件的膜面而引起的異物對防塵薄膜的附著或防塵薄膜的破損。Further, according to the pellicle assembly mounting apparatus of the present embodiment, it is possible to suppress the adhesion of the foreign matter to the pellicle film or the breakage of the pellicle film due to contact with the film surface of the pellicle film assembly when the pellicle film assembly and the original plate are bonded.

此外,近年來伴隨半導體器件的微細化,抑制異物對防塵薄膜組件的附著的要求進一步變得強烈。 另外,線寬32 nm以下的圖案形成例如可藉由EUV微影術進行。EUV微影術所使用的含有無機系材料的防塵薄膜與含有有機系材料的防塵薄膜相比,存在難以自立的傾向,另外,亦容易因機械上的接觸導致產生損傷或起塵。因此,於將具備含有無機系材料的防塵薄膜的防塵薄膜組件裝設於原版的情形時,於儘量避免接觸防塵薄膜的膜面的情況下裝設防塵薄膜組件的要求高。此處,所謂「自立」是指可單獨保持膜形狀。 根據本實施方式的防塵薄膜組件安裝裝置,可應對伴隨半導體器件的微細化的該些要求。 具體而言,本實施方式的防塵薄膜組件安裝裝置尤其適於將使用波長短的曝光光(例如,EUV光、波長較EUV光更短的光等)的微影術用防塵薄膜組件裝設(安裝)於原版,其中適於將具備含有無機系材料的防塵薄膜的防塵薄膜組件裝設(安裝)於原版。Further, in recent years, with the miniaturization of semiconductor devices, the demand for suppressing the adhesion of foreign matter to the pellicle film assembly has become stronger. In addition, the pattern formation of a line width of 32 nm or less can be performed, for example, by EUV lithography. The dust-proof film containing an inorganic material used for EUV lithography tends to be less likely to stand up than a dust-proof film containing an organic material, and is also liable to cause damage or dusting due to mechanical contact. Therefore, when the pellicle film assembly including the pellicle film containing the inorganic material is mounted on the original plate, the requirement for attaching the pellicle film assembly when the film surface of the pellicle film is contacted as much as possible is high. Here, "self-standing" means that the film shape can be maintained separately. According to the pellicle assembly mounting apparatus of the present embodiment, it is possible to cope with these requirements accompanying the miniaturization of the semiconductor device. Specifically, the pellicle assembly mounting apparatus of the present embodiment is particularly suitable for mounting a lithography dustproof film assembly using exposure light having a short wavelength (for example, EUV light, light having a shorter wavelength than EUV light, etc.) Mounted in the original, it is suitable for mounting (mounting) a pellicle having a pellicle film containing an inorganic material to the original plate.

於本實施方式中,所謂極紫外(Extreme Ultra Violet,EUV)光,是指波長5 nm~30 nm的光。 EUV光的波長較佳為5 nm~13.5 nm。 於本實施方式中,存在將EUV光、及波長較EUV光更短的光總稱為「EUV光等」的情況。In the present embodiment, the term "Extreme Ultra Violet (EUV) light" refers to light having a wavelength of 5 nm to 30 nm. The wavelength of the EUV light is preferably from 5 nm to 13.5 nm. In the present embodiment, the EUV light and the light having a shorter wavelength than the EUV light are collectively referred to as "EUV light or the like".

另外,於本實施方式中,存在將防塵薄膜組件框的「厚度方向的端面」簡稱為「端面」的情況。 另外,於本實施方式中,所謂「厚度方向的一端面及另一端面」,當然分別是指厚度方向的端面的其中一者、及厚度方向的端面的另一者。In the present embodiment, the "end surface in the thickness direction" of the pellicle frame is simply referred to as "end surface". In the present embodiment, the term "one end surface and the other end surface in the thickness direction" means, of course, the other of the end faces in the thickness direction and the other end faces in the thickness direction.

另外,於本實施方式中,將防塵薄膜組件及原版以防塵薄膜組件框的另一端面(設置有溝槽的端面)與原版的光照射面相對向的方式配置於貼合腔室內。 此處,於本實施方式的防塵薄膜組件框中,不僅在另一端面(原版的相對向面),亦可在一端面(防塵薄膜的相對向面)設置有所述溝槽(即,與通孔相通的溝槽)。即,本實施方式的防塵薄膜組件框亦可於厚度方向的一端面及另一端面這兩者具有所述溝槽(即,與通孔相通的溝槽)。 本發明具有如下優點:可於儘量避免接觸防塵薄膜的膜面的情況下,製造包含在厚度方向的一端面及另一端面這兩者具有所述溝槽的防塵薄膜組件框的防塵薄膜組件。其理由是因為可經由通孔對防塵薄膜的相對向面的一端面側的溝槽進行排氣(減壓)。詳細的機構和貼合防塵薄膜組件與原版時的機構相同。 後述的具體例是以貼合防塵薄膜組件與原版的情形為中心進行說明,所述防塵薄膜組件包含在厚度方向的一端面及另一端面這兩者具有所述溝槽的防塵薄膜組件框。然而,所述溝槽只要設置於防塵薄膜組件框的至少另一端面(原版的相對向面)即可。Further, in the present embodiment, the pellicle film assembly and the original plate are disposed in the bonding chamber such that the other end surface of the pellicle frame (the end surface on which the groove is provided) faces the light irradiation surface of the original plate. Here, in the pellicle frame of the present embodiment, the groove may be provided not only on the other end surface (opposing surface of the original plate) but also on one end surface (opposing surface of the pell film) (ie, The through hole communicates with the groove). In other words, the pellicle frame of the present embodiment may have the grooves (that is, the grooves that communicate with the through holes) in both the one end surface and the other end surface in the thickness direction. The present invention has an advantage in that a pellicle film assembly including a pellicle frame having the groove in both the one end surface and the other end surface in the thickness direction can be manufactured while avoiding contact with the film surface of the pellicle film as much as possible. The reason for this is that the groove on the one end surface side of the opposing surface of the pellicle film can be exhausted (decompressed) via the through hole. The detailed mechanism and the matte ply membrane assembly are the same as those of the original. A specific example to be described later is mainly described in the case where the pellicle is bonded to the original plate, and the pellicle comprises a pellicle frame having the groove in both the one end surface and the other end face in the thickness direction. However, the groove may be provided on at least the other end surface of the pellicle frame (opposing surface of the original plate).

另外,本實施方式的防塵薄膜組件亦可為僅包含防塵薄膜及防塵薄膜組件框者,視需要亦可具備其他要素。 作為其他要素,可列舉:以與防塵薄膜組件框的另一端面(原版的相對向面)相接的方式配置的接著劑層、配置於防塵薄膜與防塵薄膜組件框之間的接著劑層、與配置於防塵薄膜與防塵薄膜組件框之間的防塵薄膜相接的支持基板等。Further, the pellicle film assembly of the present embodiment may be a frame including only a pellicle film and a pellicle film member, and may have other elements as needed. Other elements include an adhesive layer disposed in contact with the other end surface of the pellicle frame (the opposing surface of the original plate), and an adhesive layer disposed between the pell film and the pellicle frame. A support substrate or the like that is in contact with a dustproof film disposed between the pellicle film and the pellicle frame.

另外,作為本實施方式中的原版(遮罩),只要具有光可照射的光照射面,則並無特別限制。 此處,作為原版,例如可使用含有支持基板、積層於該支持基板上的反射層、及形成於反射層上的吸收體層的原版(遮罩)。於該原版中,設置有反射層及吸收體層之側的面成為光照射面。藉由吸收體層吸收一部分EUV光等光,可於感應基板(例如,附光阻膜的半導體基板)上形成所需圖像。反射層可為鉬(Mo)與矽(Si)的多層膜。吸收體層可為鉻(Cr)或氮化鉭等EUV光等的吸收性高的材料。In addition, the original plate (mask) in the present embodiment is not particularly limited as long as it has a light irradiation surface that can be irradiated with light. Here, as the master, for example, a master (mask) including a support substrate, a reflective layer laminated on the support substrate, and an absorber layer formed on the reflective layer can be used. In the original plate, the surface on the side where the reflection layer and the absorber layer are provided becomes a light irradiation surface. By absorbing a part of EUV light or the like by the absorber layer, a desired image can be formed on the sensing substrate (for example, a semiconductor substrate with a photoresist film). The reflective layer can be a multilayer film of molybdenum (Mo) and bismuth (Si). The absorber layer may be a highly absorptive material such as EUV light such as chromium (Cr) or tantalum nitride.

另外,本實施方式中較佳為,所述貼合單元進而包含用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓的導入管。 藉由該導入管,可對貼合腔室內進行加壓,因此可進一步增大配置有防塵薄膜組件及原版的整體的環境的壓力與溝槽內部的壓力之差(差壓)。因此可進一步增大產生於防塵薄膜組件與原版之間的壓合力,可更容易地將兩者貼合。Further, in the present embodiment, it is preferable that the bonding unit further includes an introduction tube for introducing a gas into the bonding chamber to pressurize the bonding chamber. Since the introduction tube can pressurize the inside of the bonding chamber, the difference between the pressure of the entire environment in which the pellicle assembly and the original plate is disposed and the pressure inside the groove (differential pressure) can be further increased. Therefore, the pressing force generated between the pellicle and the original can be further increased, and the two can be more easily attached.

另外,本實施方式中更佳為,所述導入管包含第1導入管,所述第1導入管自與所述貼合腔室內所配置的所述防塵薄膜組件及所述原版中的所述防塵薄膜組件相對向之側導入氣體,所述貼合單元進而包含用以使自所述第1導入管導入的氣體分散的氣體分散構件。 於該態樣中,藉由第1導入管導入的氣體的流動對防塵薄膜的影響得以減少。Further, in the present embodiment, it is preferable that the introduction pipe includes a first introduction pipe, and the first introduction pipe is from the pellicle assembly disposed in the bonding chamber and the original plate The pellicle is introduced with gas to the side, and the bonding unit further includes a gas dispersing member for dispersing a gas introduced from the first introduction pipe. In this aspect, the influence of the flow of the gas introduced through the first introduction tube on the pellicle film is reduced.

於所述導入管包含所述第1導入管的情況下,所述導入管除了第1導入管,亦可包含第1導入管以外的其他導入管即第2導入管。In the case where the introduction pipe includes the first introduction pipe, the introduction pipe may include a second introduction pipe which is another introduction pipe other than the first introduction pipe, in addition to the first introduction pipe.

本實施方式中較佳為,所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通。 藉此,於經由防塵薄膜組件框的通孔而對溝槽的內部進行排氣時,可進一步提高排氣的效率。In the embodiment, it is preferable that the bonding unit includes a communication member, the communication member is connected to one end of the exhaust pipe in the bonding chamber, and the exhaust pipe and the dustproof film are The through holes of the component frame are in communication. Thereby, when the inside of the groove is exhausted through the through hole of the pellicle frame, the efficiency of the exhaust can be further improved.

所述連通構件的形狀只要為可使排氣管與通孔連通的形狀,則可為任意者。 作為所述連通構件的形狀,例如可列舉具有與防塵薄膜組件框的外周面接觸的開口端、且該開口端的直徑大於通孔的直徑的形狀。該情況下連通構件的所述開口端與通孔的位置對準變得更容易。 另外,作為所述連通構件的形狀,亦可列舉具有直徑小於通孔直徑的開口端的形狀。該情況下可將開口端插入至通孔,因此可更牢靠地連接連通構件的所述開口端與通孔。The shape of the communicating member may be any shape as long as it can connect the exhaust pipe to the through hole. The shape of the communication member is, for example, a shape having an open end that is in contact with the outer peripheral surface of the pellicle frame, and the diameter of the open end is larger than the diameter of the through hole. In this case, it is easier to align the open end of the communication member with the position of the through hole. Further, as the shape of the communicating member, a shape having an opening end having a diameter smaller than the diameter of the through hole may be cited. In this case, the open end can be inserted into the through hole, so that the open end of the communicating member and the through hole can be connected more securely.

如上所述,作為所述連通構件的形狀,例如亦可列舉具有可插入至防塵薄膜組件框的通孔的開口端的形狀。該情況下可更牢靠地連接連通構件的所述開口端與通孔。 作為所述情況下的一例,可列舉如下的例子,即防塵薄膜組件框的通孔具有隨著朝向防塵薄膜組件框的外周面而直徑增大的錐形形狀、且連通構件具有可插入至所述錐形形狀的通孔的錐形形狀的開口端。As described above, as the shape of the communication member, for example, a shape having an open end that can be inserted into the through hole of the pellicle frame can be cited. In this case, the open end of the connecting member and the through hole can be connected more securely. As an example of the above, an example in which the through hole of the pellicle frame has a tapered shape that increases in diameter toward the outer peripheral surface of the pellicle frame, and the connecting member has an insertable shape. The open end of the tapered shape of the tapered through hole.

另外,所述連通構件較佳為被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動。 藉此,可更牢靠地連接連通構件與防塵薄膜組件框。進而,即便於因經由防塵薄膜組件框的通孔對溝槽的內部進行排氣而導致防塵薄膜組件框朝排氣方向應變變形的情況下,亦可藉由預先利用連通構件而推入防塵薄膜組件框的外周面,來抑制(修正)防塵薄膜組件框的應變變形。 再者,於該情況下,當然可將連通構件設置成不僅可朝推入防塵薄膜組件框的外周面的方向移動,亦可朝其相反方向(返回方向;即,遠離外周面的方法)移動。Further, the communication member is preferably provided to be movable in a direction of being pushed into the outer peripheral surface of the pellicle frame. Thereby, the connecting member and the pellicle frame can be connected more securely. Further, even when the pellicle frame is strain-deformed in the exhaust direction by exhausting the inside of the groove through the through hole of the pellicle frame, the pellicle can be pushed in by using the communicating member in advance. The outer peripheral surface of the component frame is used to suppress (correct) the strain deformation of the pellicle frame. Further, in this case, of course, the communication member may be provided not only to move in the direction of pushing into the outer peripheral surface of the pellicle frame, but also to move in the opposite direction (return direction; that is, a method away from the outer peripheral surface). .

另外,於本實施方式中較佳為,所述貼合單元包含原版支持構件,所述原版支持構件在所述貼合腔室內支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部。 於該態樣中,可以不與原版的光照射面的相反側的面的中央部接觸的方式來貼合原版與防塵薄膜組件。 所述相反側的面的周端部較佳為距所述相反側的面的周端為5 mm以內(更佳為3 mm以內)的區域。Further, in the present embodiment, it is preferable that the bonding unit includes a master supporting member that supports a peripheral end of a surface opposite to a light irradiation surface of the original plate in the bonding chamber. At least a part of the outer peripheral surface of the portion and the original plate does not support the central portion of the surface on the opposite side. In this aspect, the master and the pellicle can be bonded together without being in contact with the central portion of the surface on the opposite side of the original light irradiation surface. The peripheral end portion of the face on the opposite side is preferably a region within 5 mm (more preferably within 3 mm) from the circumferential end of the face on the opposite side.

於本說明書中,有時將原版的光照射面稱為原版的「前表面」。 另外,於本說明書中,有時將與原版的光照射面為相反側的面稱為原版的「背面」。In the present specification, the original light irradiation surface may be referred to as the "front surface" of the original. In addition, in this specification, the surface opposite to the light irradiation surface of the original plate may be called the "back surface" of the original.

貼合單元包含所述原版支持構件的態樣尤其適於原版為EUV微影術所使用的EUV原版(EUV遮罩)的情形。 即,於EUV微影術所使用的EUV曝光裝置中,於將原版固定於曝光裝置內時,與現有的夾頭方式不同,藉由靜電夾頭方式以原版的背面與遮罩平台直接接觸的方式固定。因此,本發明者等人發現,若異物附著於原版的背面的中央部,則因異物的凹凸導致原版的平坦性受損而無法進行正常的曝光。 針對該現象,於貼合單元包含所述原版支持構件的態樣中,可於不與原版的背面的中央部接觸的情況下貼合原版與防塵薄膜組件,故異物對原版的背面的中央部的附著得到抑制。The aspect in which the fitting unit comprises the original supporting member is particularly suitable for the case where the original is an EUV original (EUV mask) used for EUV lithography. That is, in the EUV exposure apparatus used in EUV lithography, when the original plate is fixed in the exposure apparatus, unlike the conventional chuck method, the back surface of the original plate is directly in contact with the mask platform by the electrostatic chuck method. The method is fixed. Therefore, the inventors of the present invention have found that when foreign matter adheres to the central portion of the back surface of the original plate, the flatness of the original plate is impaired due to the unevenness of the foreign matter, and normal exposure cannot be performed. In this aspect, in the aspect in which the bonding unit includes the master supporting member, the original plate and the pellicle can be bonded without contacting the center portion of the back surface of the original plate, so that the foreign matter faces the center portion of the back surface of the original plate. The adhesion is suppressed.

另外,本實施方式中較佳為,所述原版被收容在原版殼體而被搬入所述貼合腔室內,所述原版殼體具有使所述原版的光照射面露出的開口部,且支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部, 所述貼合單元包含原版殼體支持構件,所述原版殼體支持構件在所述貼合腔室內對收容所述原版的所述原版殼體進行支持。 於該態樣中亦發揮與貼合單元包含所述原版支持構件的態樣相同的效果。該態樣中的中央部的較佳範圍及周端部的較佳範圍分別與貼合單元包含所述原版支持構件的態樣中的中央部的較佳範圍及周端部的較佳範圍相同。Further, in the present embodiment, it is preferable that the original plate is housed in the original casing and carried into the bonding chamber, and the original casing has an opening for exposing the light irradiation surface of the original plate, and supports The peripheral end portion of the surface opposite to the light irradiation surface of the original plate and at least a portion of the outer peripheral surface of the original plate and the central portion of the surface not supporting the opposite side, the bonding unit including the original case support The member, the master housing support member supports the original housing housing the original plate in the fitting chamber. Also in this aspect, the same effect as the aspect in which the bonding unit includes the original supporting member is exerted. The preferred range of the central portion and the preferred range of the peripheral end portion in the aspect are the same as the preferred range of the central portion and the preferred range of the peripheral end portion of the aspect in which the bonding unit includes the original supporting member. .

作為所述原版殼體,亦可使用公知的遮罩殼體的一部分。 例如,作為公知的遮罩殼體,可列舉EUV遮罩盒(pod)等。 作為可用作所述原版殼體的遮罩殼體的一部分,可列舉具備底板及罩構件的內部遮罩盒(inner pod)的罩構件。 關於EUV遮罩盒、內部遮罩盒、罩構件等,例如可適當參照國際公開第2013/186929號手冊等。As the original casing, a part of a known mask casing can also be used. For example, as a known mask case, an EUV mask or the like can be cited. As a part of the mask case which can be used as the master case, a cover member including an inner pod of the bottom plate and the cover member is exemplified. For the EUV mask box, the internal mask box, the cover member, and the like, for example, the International Publication No. 2013/186929 manual or the like can be appropriately referred to.

本實施方式的防塵薄膜組件安裝裝置較佳為,進而具備對所述貼合後的所述防塵薄膜組件及所述原版進行外觀檢查的檢查單元。 作為外觀檢查,可列舉:附著於防塵薄膜組件及原版的至少一者的異物的檢查、防塵薄膜組件框的形狀測定、防塵薄膜組件框與原版的位置對準偏差的測定等。 再者,亦可將防塵薄膜組件框與原版的「位置對準」稱為「重合」。Preferably, the pellicle assembly mounting device according to the present embodiment further includes an inspection unit that performs visual inspection of the pellted film assembly and the original plate after the bonding. For the visual inspection, the inspection of the foreign matter attached to at least one of the pellicle and the original plate, the measurement of the shape of the pellicle frame, and the measurement of the misalignment of the pellicle frame and the original plate are exemplified. Further, the "alignment" of the pellicle frame and the original plate may be referred to as "coincidence".

本實施方式的防塵薄膜組件安裝裝置較佳為具備第1測定部件與第2測定部件,所述第1測定部件是對與所述原版貼合前的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定,所述第2測定部件是對與所述原版貼合後的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定。 於該態樣中,可對貼合(尤其是所述防塵薄膜組件框的所述溝槽的內部的排氣)所引起的防塵薄膜組件框的變形的有無及變形量進行調查。The pellicle assembly mounting apparatus according to the present embodiment preferably includes a first measuring member and a second measuring member, and the first measuring member is the pellicle assembly of the pellicle assembly before bonding with the original plate. The shape of the frame was measured, and the second measuring member measures the shape of the pellicle frame of the pellicle film bonded to the original plate. In this aspect, the presence or absence of deformation of the pellicle frame caused by the bonding (especially the exhaust inside the groove of the pellicle frame) and the amount of deformation can be investigated.

於本實施方式的防塵薄膜組件安裝裝置具備第1測定部件及第2測定部件的情況下,本實施方式的防塵薄膜組件安裝裝置較佳為具備對準部件與控制部件,所述對準部件於貼合所述原版與所述防塵薄膜組件之前,進行所述原版與所述防塵薄膜組件的對準,所述控制部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對利用所述對準部件的對準進行前饋控制。 於該態樣中,藉由所述控制部件而預測到貼合所引起的防塵薄膜組件框的變形,預先以由變形引起的對準偏差(位置對準偏差)變小(較佳為經最小化)的方式,來控制利用對準部件的防塵薄膜組件與原版的對準。 於該態樣中,亦可省略控制部件,可手動地進行利用對準部件的對準的調整。In the case where the pellicle assembly mounting apparatus of the present embodiment includes the first measuring member and the second measuring member, the pellicle assembly mounting device of the present embodiment preferably includes an alignment member and a control member, and the alignment member is provided Aligning the original plate with the pellicle assembly before the original plate and the pellicle assembly are attached, the control member is based on the measurement result of the shape of the pellicle frame before the bonding The result of measurement of the shape of the bonded pellicle frame is subjected to feedforward control by alignment of the alignment member. In this aspect, the deformation of the pellicle frame caused by the bonding is predicted by the control member, and the alignment deviation (position misalignment) caused by the deformation is reduced in advance (preferably the minimum The way to control the alignment of the pellicle assembly with the alignment member with the original. In this aspect, the control member may be omitted, and the adjustment of the alignment by the alignment member may be manually performed.

於本實施方式的防塵薄膜組件安裝裝置具備第1測定部件及第2測定部件的情況下,本實施方式的防塵薄膜組件安裝裝置較佳為具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果之差,來算出藉由所述貼合而引起的所述防塵薄膜組件框的應變量。 於該態樣中,藉由所述算出部件而預測到貼合所引起的防塵薄膜組件框的應變量(例如,因經由通孔的溝槽的排氣而引起的防塵薄膜組件框的應變量),預先以防塵薄膜組件框的應變變小(較佳為經最小化)的方式,來控制連通構件所引起的防塵薄膜組件框的推入量。In the case where the pellicle assembly mounting apparatus of the present embodiment includes the first measuring member and the second measuring member, the pellicle assembly mounting device of the present embodiment preferably includes a calculating member, and the calculating member is based on the pre-bonding The measurement result of the shape of the pellicle frame is different from the measurement result of the shape of the pellicle frame after the bonding, and the pellicle frame is caused by the bonding. The dependent variable. In this aspect, the strain amount of the pellicle frame caused by the bonding is predicted by the calculation member (for example, the strain amount of the pellicle frame due to the exhaust of the groove through the through hole) In advance, the amount of pushing of the pellicle frame caused by the communicating member is controlled in such a manner that the strain of the pellicle frame becomes small (preferably minimized).

於本實施方式的防塵薄膜組件安裝裝置具備所述算出部件的情況下,本實施方式的防塵薄膜組件安裝裝置較佳為,所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動,且所述算出部件為基於所述應變量而對所述連通構件所引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。 於該態樣中,藉由所述算出部件,不僅可算出應變量,亦可控制防塵薄膜組件框的推入量。In the dust-proof membrane module mounting apparatus according to the present embodiment, in the dust-proof membrane module mounting apparatus of the present embodiment, preferably, the bonding unit includes a communication member in which the bonding member is attached. The chamber is connected to one end of the exhaust pipe, and communicates the exhaust pipe with the through hole of the pellicle frame, and is disposed to be pushed into the outer peripheral surface of the pellicle frame The direction is moved, and the calculation means is a control means for performing feedforward control of the amount of pushing of the pellicle frame caused by the communication member based on the strain amount. In this aspect, the calculation means can not only calculate the strain amount, but also control the amount of pushing of the pellicle frame.

<具體例> 繼而,參照圖1~圖20來對本實施方式的一例進行說明,但本發明並不限定於以下的一例。<Specific Example> Next, an example of the present embodiment will be described with reference to Figs. 1 to 20 , but the present invention is not limited to the following examples.

(防塵薄膜組件框的具體例) 圖1及圖2是表示於本實施方式的防塵薄膜組件安裝裝置中,作為貼合對象物之一的防塵薄膜組件的防塵薄膜組件框的一例的概略立體圖。 圖1是自可觀察到一例的防塵薄膜組件框的厚度方向的一端面的方向進行觀察的概略立體圖,圖2是自可觀察到同一例防塵薄膜組件框的厚度方向的另一端面的方向進行觀察的概略立體圖。 圖3為所述一例的防塵薄膜組件框的部分截面圖,詳細而言,為圖1的A-A線截面圖。(Specific Example of PSA Module Frame) FIG. 1 and FIG. 2 are schematic perspective views showing an example of a pellicle frame of a pellicle film which is one of the bonding objects in the pellicle assembly mounting apparatus of the present embodiment. 1 is a schematic perspective view of a direction of one end surface in the thickness direction of an example of a pellicle frame which can be observed, and FIG. 2 is a view from the other end surface in the thickness direction of the same example pellicle frame. A schematic perspective view of the observation. Fig. 3 is a partial cross-sectional view showing the dustproof film module frame of the above-described example, and is a cross-sectional view taken along line A-A of Fig. 1 in detail.

如圖1及圖2所示,防塵薄膜組件框100的形狀為矩形的框形狀。於將防塵薄膜組件框100用作防塵薄膜組件的一構件時,曝光光會透過由防塵薄膜組件框100所圍成的開口部50。 防塵薄膜組件框100的外形是由防塵薄膜組件框100的厚度方向的一端面10、另一端面20、包含四個面的外周面30、及包含四個面的內周面40所確定。 再者,防塵薄膜組件框100的自厚度方向觀察的形狀如上述般為矩形形狀,但本實施方式的防塵薄膜組件框的自厚度方向觀察的形狀並不限定於矩形形狀,亦可為矩形形狀以外的形狀(例如,梯形形狀、框的外側部分具有突起的形狀等)。As shown in FIGS. 1 and 2, the shape of the pellicle frame 100 is a rectangular frame shape. When the pellicle frame 100 is used as a member of the pellicle assembly, the exposure light passes through the opening 50 surrounded by the pellicle frame 100. The outer shape of the pellicle frame 100 is determined by one end surface 10 in the thickness direction of the pellicle frame 100, the other end surface 20, the outer peripheral surface 30 including four faces, and the inner peripheral surface 40 including four faces. In addition, the shape of the pellicle frame 100 of the present embodiment is not limited to a rectangular shape, and may be a rectangular shape as viewed from the thickness direction. A shape other than (for example, a trapezoidal shape, an outer portion of the frame having a convex shape, or the like).

如圖1及圖3所示,於一端面10設置有溝槽12。 於該實施方式中,自防塵薄膜組件框100的厚度方向觀察的溝槽12的形狀為沿防塵薄膜組件框100的形狀繞一周的無端(endless)形狀。 下文對自防塵薄膜組件框的厚度方向觀察的溝槽的形狀的變形例進行說明。As shown in FIGS. 1 and 3, a groove 12 is provided on one end surface 10. In this embodiment, the shape of the groove 12 viewed from the thickness direction of the pellicle frame 100 is an endless shape that is wound around the shape of the pellicle frame 100. Hereinafter, a modification of the shape of the groove viewed from the thickness direction of the pellicle frame will be described.

防塵薄膜組件框100具有通孔14A及通孔14B。 通孔14A及通孔14B分別貫通溝槽12的底面與外周面30之間。The pellicle frame 100 has a through hole 14A and a through hole 14B. The through hole 14A and the through hole 14B penetrate between the bottom surface of the groove 12 and the outer peripheral surface 30, respectively.

此處,通孔14A及通孔14B亦可分別貫通溝槽12的側面與外周面30之間。 另外,亦可省略通孔14A及通孔14B中的任一者。即,於防塵薄膜組件框100中,對一個溝槽(溝槽12)連接有兩個通孔(通孔14A及通孔14B),但本實施方式並不限定於該態樣。於本實施方式中,對一個溝槽(溝槽12、溝槽22)連接至少一個通孔即可。Here, the through hole 14A and the through hole 14B may also pass between the side surface of the groove 12 and the outer peripheral surface 30, respectively. Further, any of the through hole 14A and the through hole 14B may be omitted. That is, in the pellicle frame 100, two through holes (a through hole 14A and a through hole 14B) are connected to one groove (groove 12), but the embodiment is not limited to this. In the present embodiment, at least one through hole may be connected to one trench (groove 12, trench 22).

另外,如圖2及圖3所示,於與一端面10為相反側的另一端面20設置有溝槽22。 於該實施方式中,溝槽22的形狀亦與溝槽12的形狀相同,於自厚度方向觀察時,為沿防塵薄膜組件框100的形狀繞一周的無端形狀。Further, as shown in FIGS. 2 and 3, a groove 22 is provided on the other end surface 20 opposite to the one end surface 10. In this embodiment, the shape of the groove 22 is also the same as that of the groove 12, and is an endless shape that is wound around the shape of the pellicle frame 100 when viewed from the thickness direction.

防塵薄膜組件框100具有通孔24A及通孔24B。 通孔24A及通孔24B分別貫通溝槽22的底面與外周面30之間。 通孔24A及通孔24B的變化與通孔14A及通孔14B的變化相同。The pellicle frame 100 has a through hole 24A and a through hole 24B. The through hole 24A and the through hole 24B penetrate between the bottom surface of the groove 22 and the outer peripheral surface 30, respectively. The change of the through hole 24A and the through hole 24B is the same as that of the through hole 14A and the through hole 14B.

所述防塵薄膜組件框100於一端面10之側或另一端面20之側支持防塵薄膜。即,所述防塵薄膜組件框100為本實施方式的一例的防塵薄膜組件的構成構件之一。The pellicle frame 100 supports a pellicle film on the side of one end face 10 or on the side of the other end face 20. In other words, the pellicle frame 100 is one of the constituent members of the pellicle assembly of the embodiment.

以下,以於防塵薄膜組件框100的一端面10之側支持防塵薄膜的情況為中心進行說明。該情況下,防塵薄膜組件框100的另一端面20成為原版的相對向面。 然而,本實施方式中的防塵薄膜組件框於至少作為原版的相對向面的端面設置溝槽即可,因此亦可與所述情況相反,於防塵薄膜組件框100的另一端面20之側支持防塵薄膜,防塵薄膜組件框100的一端面10成為原版的相對向面。 另外,亦可省略對防塵薄膜進行支持之側的端面的溝槽、及與該溝槽相通的通孔。即,亦可省略為溝槽12、通孔14A及通孔14B的組合、以及溝槽22、通孔24A及通孔24B的組合中的任一者、且與對防塵薄膜進行支持之側的端面相關的組合。Hereinafter, the case where the dustproof film is supported on the side of one end surface 10 of the pellicle frame 100 will be mainly described. In this case, the other end surface 20 of the pellicle frame 100 becomes the opposing surface of the original plate. However, the pellicle frame of the present embodiment may be provided with a groove at least as an end surface of the opposite surface of the original plate, and thus may be supported on the side of the other end surface 20 of the pellicle frame 100 as opposed to the above case. The dust-proof film, one end surface 10 of the pellicle frame 100 becomes the opposing surface of the original plate. Further, the groove on the end face on the side where the pellicle is supported and the through hole communicating with the groove may be omitted. In other words, the groove 12, the combination of the through hole 14A and the through hole 14B, and the combination of the groove 22, the through hole 24A, and the through hole 24B may be omitted, and the side supporting the dustproof film may be omitted. End face related combinations.

以下,說明將在防塵薄膜組件框100的一端面10之側支持防塵薄膜而成的防塵薄膜組件(例如,後述的防塵薄膜組件201、防塵薄膜組件200)裝設於原版的情況。 於防塵薄膜組件框100中,在成為原版的相對向面的另一端面20設置有溝槽22,且設置有連接於該溝槽22的通孔24A及通孔24B。因此,於將原版固定於另一端面20時,經由通孔24A及通孔24B而對溝槽22的內部(例如藉由真空泵等排氣部件)進行減壓,藉此可減小防塵薄膜組件框100與原版之間的壓力。藉由該減壓,可使壓合力於防塵薄膜組件框100與原版之間發揮作用,因此可於儘量避免接觸防塵薄膜的膜面的情況下貼合防塵薄膜組件與原版。In the following, a case where a pellicle film (for example, a pellicle film assembly 201 and a pellicle film assembly 200 to be described later) which supports a pellicle film on the side of one end surface 10 of the pellicle frame 100 is attached to the original plate. In the pellicle frame 100, a groove 22 is provided on the other end surface 20 which is the opposite surface of the original plate, and a through hole 24A and a through hole 24B which are connected to the groove 22 are provided. Therefore, when the original plate is fixed to the other end surface 20, the inside of the groove 22 (for example, an exhaust member such as a vacuum pump) is decompressed via the through hole 24A and the through hole 24B, whereby the pellicle can be reduced. The pressure between box 100 and the original. By this pressure reduction, the pressing force can be exerted between the pellicle frame 100 and the original plate, so that the pellicle can be bonded to the original plate while avoiding contact with the film surface of the pellicle film as much as possible.

進而,在防塵薄膜組件框100的一端面10之側支持防塵薄膜而成的防塵薄膜組件(例如,後述的防塵薄膜組件201、防塵薄膜組件200)不僅於另一端面20設置有溝槽,亦於一端面10設置有溝槽,因此藉由和貼合防塵薄膜組件與原版時相同的原理,而具有可於儘量避免接觸防塵薄膜的膜面的情況下進行製造的優點。 進而,防塵薄膜組件框100於一端面10及另一端面20這兩者具有溝槽(溝槽12、溝槽22),因此具有與防塵薄膜及原版貼合的端面的選擇範圍廣的優點。Further, the pellicle film assembly (for example, the pellicle film assembly 201 and the pellicle film assembly 200 to be described later) which supports the pellicle film on the side of the one end surface 10 of the pellicle frame 100 is provided with a groove not only on the other end surface 20 but also Since the groove is provided on the one end surface 10, it is advantageous in that it can be manufactured while avoiding contact with the film surface of the pellicle film by the same principle as that of bonding the pellicle film assembly to the original plate. Further, since the pellicle frame 100 has grooves (grooves 12 and grooves 22) in both the one end surface 10 and the other end surface 20, there is an advantage in that the end face of the pellicle film and the original plate has a wide selection range.

防塵薄膜組件框100的尺寸例如可設為以下尺寸。 防塵薄膜組件框100的長邊方向的長度L1例如可設為135 mm~153 mm,較佳為140 mm~152 mm,更佳為145 mm~151 mm。 防塵薄膜組件框100的短邊方向的長度L2例如可設為100 mm~130 mm,較佳為105 mm~125 mm,更佳為110 mm~120 mm。 長邊方向的長度L1與短邊方向的長度L2可為相同尺寸。即,防塵薄膜組件框100的形狀亦可為正方形形狀。 防塵薄膜組件框100的框寬(flame width)W例如可設為1.0 mm~5.0 mm,較佳為1.2 mm~3.5 mm,更佳為1.5 mm~2.5 mm。於矩形形狀的防塵薄膜組件框100的四條邊中,框寬可設為相同的尺寸,亦可設為不同的尺寸。 另外,由防塵薄膜組件框100所圍成的開口部50的長邊方向的長度例如可設為130 mm~152 mm,較佳為135 mm~151 mm,更佳為140 mm~150 mm。 另外,開口部50的寬度例如可設為95 mm~130 mm,較佳為100 mm~125 mm,更佳為105 mm~120 mm。 防塵薄膜組件框的厚度t例如可設為0.5 mm~5.0 mm,較佳為0.5 mm~3.0 mm,更佳為0.5 mm~2.0 mm。The size of the pellicle frame 100 can be set, for example, to the following dimensions. The length L1 in the longitudinal direction of the pellicle frame 100 can be, for example, 135 mm to 153 mm, preferably 140 mm to 152 mm, and more preferably 145 mm to 151 mm. The length L2 of the pellicle frame 100 in the short-side direction can be, for example, 100 mm to 130 mm, preferably 105 mm to 125 mm, and more preferably 110 mm to 120 mm. The length L1 in the longitudinal direction and the length L2 in the short-side direction may be the same size. That is, the shape of the pellicle frame 100 may be a square shape. The flame width W of the pellicle frame 100 can be, for example, 1.0 mm to 5.0 mm, preferably 1.2 mm to 3.5 mm, more preferably 1.5 mm to 2.5 mm. Among the four sides of the rectangular pellicle frame 100, the frame width may be the same size or may be set to a different size. Further, the length of the opening portion 50 surrounded by the pellicle frame 100 can be, for example, 130 mm to 152 mm, preferably 135 mm to 151 mm, and more preferably 140 mm to 150 mm. Further, the width of the opening portion 50 can be, for example, 95 mm to 130 mm, preferably 100 mm to 125 mm, and more preferably 105 mm to 120 mm. The thickness t of the pellicle frame can be, for example, 0.5 mm to 5.0 mm, preferably 0.5 mm to 3.0 mm, more preferably 0.5 mm to 2.0 mm.

另外,溝槽12及溝槽22的寬度可考慮減少溝槽處的壓力損失、與防塵薄膜組件框的框寬的關係等而適當設定,例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。 另外,溝槽12及溝槽22的深度可考慮減少溝槽處的壓力損失、與防塵薄膜組件框的厚度的關係等而適當設定,例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。Further, the width of the groove 12 and the groove 22 can be appropriately set in consideration of the pressure loss at the groove, the relationship with the frame width of the pellicle frame, and the like, and can be, for example, 10 μm to 1.0 mm, preferably 50. Μm to 700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm. Further, the depth of the groove 12 and the groove 22 can be appropriately set in consideration of the relationship between the pressure loss at the groove and the thickness of the pellicle frame, and can be, for example, 10 μm to 1.0 mm, preferably 50 μm. ~700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm.

另外,通孔14A、通孔14B、通孔24A、及通孔24B的寬度可考慮減少通孔處的壓力損失、與防塵薄膜組件框的厚度的關係等而適當設定,例如可設為10 μm~1.0 mm,較佳為50 μm~700 μm,更佳為100 μm~600 μm,尤佳為200 μm~500 μm。 另外,通孔14A、通孔14B、通孔24A、及通孔24B的長度可考慮減少通孔處的壓力損失等而適當設定,例如可設為0.5 mm~10 mm,較佳為0.7 mm~5.0 mm,更佳為1.0 mm~2.0 mm。 此處,所謂通孔的寬度是指包含通孔的通路的通路寬度(於通孔的截面為圓形形狀的情形時為直徑),所謂通孔的長度是指包含通孔的通路的通路長度。In addition, the width of the through hole 14A, the through hole 14B, the through hole 24A, and the through hole 24B can be appropriately set in consideration of the relationship between the pressure loss at the through hole and the thickness of the pellicle frame, and can be set, for example, to 10 μm. ~1.0 mm, preferably 50 μm to 700 μm, more preferably 100 μm to 600 μm, and particularly preferably 200 μm to 500 μm. Further, the length of the through hole 14A, the through hole 14B, the through hole 24A, and the through hole 24B can be appropriately set in consideration of reducing the pressure loss at the through hole, and the like, and can be, for example, 0.5 mm to 10 mm, preferably 0.7 mm. 5.0 mm, more preferably 1.0 mm to 2.0 mm. Here, the width of the through hole refers to the passage width of the passage including the through hole (the diameter when the cross section of the through hole is a circular shape), and the length of the through hole refers to the length of the passage of the passage including the through hole. .

防塵薄膜組件框100的材質並無特別限制,可設為防塵薄膜組件框所使用的通常的材質。 作為防塵薄膜組件框100的材質,具體而言,可列舉:鋁、鋁合金(5000系、6000系、7000系等)、不鏽鋼、矽、矽合金、鐵、鐵系合金、碳鋼、工具鋼、陶瓷、金屬-陶瓷複合材料、樹脂等。其中,就輕量且剛性的方面而言,更佳為鋁、鋁合金。The material of the pellicle frame 100 is not particularly limited, and can be used as a normal material used for the pellicle frame. Specific examples of the material of the pellicle frame 100 include aluminum, aluminum alloy (5000 series, 6000 series, 7000 series, etc.), stainless steel, niobium, tantalum alloy, iron, iron alloy, carbon steel, and tool steel. , ceramics, metal-ceramic composites, resins, etc. Among them, aluminum and aluminum alloys are more preferable in terms of light weight and rigidity.

另外,防塵薄膜組件框100亦可於其表面具有保護膜。 作為保護膜,較佳為對存在於曝光環境中的氫自由基及EUV光具有耐受性的保護膜。 作為保護膜,例如可列舉氧化覆膜。 氧化覆膜可藉由陽極氧化等公知的方法形成。 另外,氧化覆膜可藉由黑色系染料進行著色。於防塵薄膜組件框100具有經黑色系染料著色的氧化覆膜的情形時,變得更容易檢測出防塵薄膜組件框100上的異物。 除此以外,關於防塵薄膜組件框100的其他構成,例如可適當參照日本專利特開2014-021217號公報、日本專利特開2010-146027號公報等公知的防塵薄膜組件框的構成。In addition, the pellicle frame 100 may have a protective film on its surface. As the protective film, a protective film which is resistant to hydrogen radicals and EUV light existing in an exposure environment is preferable. As a protective film, an oxide film is mentioned, for example. The oxide film can be formed by a known method such as anodization. Further, the oxide film can be colored by a black dye. When the pellicle frame 100 has an oxide film colored with a black dye, it becomes easier to detect foreign matter on the pellicle frame 100. In addition, as for the other configuration of the pellicle frame 100, for example, a configuration of a known pellicle frame such as JP-A-2014-021217 and JP-A-2010-146027 can be referred to.

繼而,對防塵薄膜組件框的變形例進行說明。 於圖1~圖3所示的防塵薄膜組件框100中,於每一端面設置有一個溝槽,但於本實施方式中,亦可於每一端面設置有兩個以上的溝槽。於在每一端面設置有兩個以上的溝槽的情況下,較佳為於兩個以上的溝槽分別連接所述通孔(例如,參照圖4)。 另外,於防塵薄膜組件框為矩形形狀的情形時,就使防塵薄膜組件框與其他構件之間的壓合力更有效地發揮作用的觀點而言,較佳為防塵薄膜組件框的四條邊存在溝槽。 此處,「防塵薄膜組件框的四條邊存在溝槽」的態樣例如包括: 跨防塵薄膜組件框的四條邊而設置有一個溝槽的態樣(例如,參照圖1及圖2)、 於防塵薄膜組件框的四條邊的每一條邊設置有一個以上的溝槽的態樣(例如,參照圖4)、 跨防塵薄膜組件框的兩條邊而設置有一個溝槽、且跨剩餘的兩條邊而設置有一個溝槽的態樣等。Next, a modification of the pellicle frame will be described. In the pellicle frame 100 shown in FIGS. 1 to 3, one groove is provided on each end surface. However, in the present embodiment, two or more grooves may be provided on each end surface. In the case where two or more grooves are provided on each end surface, it is preferable to connect the through holes to two or more grooves (for example, refer to FIG. 4). Further, in the case where the pellicle frame is rectangular, it is preferable that the four sides of the pellicle frame are grooved from the viewpoint of more effectively exerting the pressing force between the pellicle frame and other members. groove. Here, the aspect of the "there are grooves on the four sides of the pellicle frame" includes, for example, a pattern in which a groove is provided across the four sides of the pellicle frame (for example, refer to FIGS. 1 and 2). Each side of the four sides of the pellicle frame is provided with more than one groove (for example, refer to FIG. 4), a groove is provided across the two sides of the pell frame, and the remaining two sides are spanned And there is a groove shape and the like.

圖4是自可觀察到厚度方向的另一端面的方向觀察本實施方式的變形例中的防塵薄膜組件框101的概略立體圖。 如圖4所示,於防塵薄膜組件框101的另一端面20設置有四個溝槽,即溝槽22A、溝槽22B、溝槽22C、及溝槽22D。於防塵薄膜組件框101分別設置有貫通溝槽22A、溝槽22B、溝槽22C、及溝槽22D各自的底面與外周面30之間的通孔26A、通孔26B、通孔26C、及通孔26D。 於該防塵薄膜組件框101中,每個溝槽成為以防塵薄膜組件框101的角(corner)部分為中心而跨兩條邊、且於兩條邊的中途具有端部的形狀。然而,本實施方式的溝槽的形狀亦可為任意形狀。 另外,於該防塵薄膜組件框101中,於每個溝槽的一端部連接有通孔。然而,於本實施方式中,連接於溝槽的通孔的位置亦可為任意部分。總之,通孔只要貫通溝槽的壁面與防塵薄膜組件框的外周面之間即可。FIG. 4 is a schematic perspective view of the pellicle frame 101 in the modification of the embodiment as seen from the direction in which the other end face in the thickness direction is observed. As shown in FIG. 4, the other end surface 20 of the pellicle frame 101 is provided with four grooves, that is, a groove 22A, a groove 22B, a groove 22C, and a groove 22D. The pellicle frame 101 is provided with a through hole 26A, a through hole 26B, a through hole 26C, and a through hole between the bottom surface of each of the through groove 22A, the groove 22B, the groove 22C, and the groove 22D and the outer circumferential surface 30, respectively. Hole 26D. In the pellicle frame 101, each of the grooves has a shape that spans two sides around the corner portion of the pellicle frame 101 and has an end portion in the middle of the two sides. However, the shape of the groove of the present embodiment may be any shape. Further, in the pellicle frame 101, a through hole is connected to one end portion of each of the grooves. However, in the present embodiment, the position of the through hole connected to the groove may be any portion. In short, the through hole may pass between the wall surface of the groove and the outer peripheral surface of the pellicle frame.

另外,於圖4中省略圖示,但與防塵薄膜組件框100的一端面10同樣,於防塵薄膜組件框101的一端面設置有溝槽,進而設置有貫通一端面側的溝槽的壁面與外周面的通孔。然而,亦可將防塵薄膜組件框101的一端面側的溝槽的形狀設為與防塵薄膜組件框101的另一端面側的溝槽的形狀相同的形狀。 於防塵薄膜組件框101中,所述以外的構成與防塵薄膜組件框100的構成相同,較佳的範圍亦相同。Although not shown in FIG. 4, similarly to the one end surface 10 of the pellicle frame 100, a groove is formed on one end surface of the pellicle frame 101, and a wall surface penetrating through the groove on the one end side is provided. Through hole on the outer peripheral surface. However, the shape of the groove on the one end surface side of the pellicle frame 101 may be the same as the shape of the groove on the other end surface side of the pellicle frame 101. In the pellicle frame 101, the other configuration is the same as that of the pellicle frame 100, and the preferred range is also the same.

(防塵薄膜組件的具體例) 圖5是表示本實施方式的防塵薄膜組件安裝裝置所使用的防塵薄膜組件的一例的概略截面圖。 如圖5所示,防塵薄膜組件201包含防塵薄膜130與所述防塵薄膜組件框100。於防塵薄膜組件201中,防塵薄膜組件框100於厚度方向的一端面10之側支持防塵薄膜130。防塵薄膜組件框100至少具有設置於厚度方向的另一端面20的溝槽22、與貫通外周面30與溝槽22的壁面之間的通孔24A及通孔24B。進而,於防塵薄膜組件框100的厚度方向的一端面10設置有溝槽12,進而設置有貫通該溝槽12的壁面與外周面30之間的通孔14A及通孔14B。(Specific Example of PSA Module) FIG. 5 is a schematic cross-sectional view showing an example of a pellicle film assembly used in the pellicle assembly mounting apparatus of the present embodiment. As shown in FIG. 5, the pellicle film assembly 201 includes a pellicle film 130 and the pellicle frame 100. In the pellicle frame 201, the pellicle frame 100 supports the pellicle film 130 on the side of one end face 10 in the thickness direction. The pellicle frame 100 has at least a groove 22 provided in the other end surface 20 in the thickness direction, and a through hole 24A and a through hole 24B penetrating between the outer peripheral surface 30 and the wall surface of the groove 22. Further, a groove 12 is provided in one end surface 10 of the pellicle frame 100 in the thickness direction, and a through hole 14A and a through hole 14B penetrating between the wall surface of the groove 12 and the outer peripheral surface 30 are further provided.

防塵薄膜組件201的構成成為將包含所述防塵薄膜組件框100的防塵薄膜組件框構件110與包含防塵薄膜130的防塵薄膜構件120貼合的構成。 此處,防塵薄膜組件框構件110具備所述防塵薄膜組件框100、與所述防塵薄膜組件框100的一端面10相接的接著劑層102、與所述防塵薄膜組件框100的另一端面20相接的接著劑層104、及與接著劑層104相接的剝離襯墊106。 另一方面,防塵薄膜構件120是由防塵薄膜130與支持防塵薄膜130的支持基板122構成。 於防塵薄膜組件201中,防塵薄膜組件框構件110及防塵薄膜構件120是以支持基板122與接著劑層102相接的配置進行貼合。該結構的防塵薄膜組件201可藉由對通過通孔14A及通孔14B的溝槽12的內部進行排氣(減壓),於儘量避免接觸防塵薄膜130的情況下進行製造。The pellicle assembly 201 has a configuration in which the pellicle frame member 110 including the pellicle frame 100 is bonded to the pellicle member 120 including the pellicle film 130. Here, the pellicle frame member 110 includes the pellicle frame 100, an adhesive layer 102 that is in contact with one end surface 10 of the pellicle frame 100, and another end face of the pellicle frame 100. The 20-contact adhesive layer 104 and the release liner 106 that is in contact with the adhesive layer 104. On the other hand, the pellicle member 120 is composed of a pellicle film 130 and a support substrate 122 that supports the pellicle film 130. In the pellicle film assembly 201, the pellicle frame member 110 and the pellicle member 120 are bonded together with the support substrate 122 in contact with the adhesive layer 102. The pellicle film assembly 201 of this configuration can be manufactured by exhausting (decompressing) the inside of the groove 12 passing through the through hole 14A and the through hole 14B while avoiding contact with the pellicle film 130 as much as possible.

於防塵薄膜組件201中,防塵薄膜130的材質並無特別限制,可為有機系材料,亦可為無機系材料,亦可為有機系材料與無機系材料的混合材料。 作為有機系材料,可列舉氟系聚合物等。 作為無機系材料,可列舉結晶矽(例如,單晶矽、多晶矽等)、類鑽碳(Diamond-like carbon,DLC)、石墨、非晶碳、石墨烯、碳化矽、氮化矽、氮化鋁等。 防塵薄膜130可單獨含有一種所述材料,亦可含有兩種以上。In the pellicle film assembly 201, the material of the pellicle film 130 is not particularly limited, and may be an organic material, an inorganic material, or a mixture of an organic material and an inorganic material. As an organic material, a fluorine-based polymer etc. are mentioned. Examples of the inorganic material include crystalline germanium (for example, single crystal germanium, polycrystalline germanium, etc.), diamond-like carbon (DLC), graphite, amorphous carbon, graphene, tantalum carbide, tantalum nitride, and nitriding. Aluminum and so on. The pellicle film 130 may contain one type of the above material alone or two or more types.

防塵薄膜130的構成可為單層構成,亦可為包含兩層以上的構成。 防塵薄膜的厚度(於包含兩層以上的情形時為總厚度)例如可設為10 nm~200 nm,較佳為10 nm~100 nm,更佳為10 nm~70 nm,尤佳為10 nm~50 nm。The pellicle film 130 may have a single layer structure or a structure including two or more layers. The thickness of the pellicle film (the total thickness in the case of including two or more layers) can be, for example, 10 nm to 200 nm, preferably 10 nm to 100 nm, more preferably 10 nm to 70 nm, and particularly preferably 10 nm. ~50 nm.

支持基板122為用以支持防塵薄膜130的構件。 該支持基板122與防塵薄膜組件框100同樣,為框形狀的構件。即,支持基板122為在中央部具有矩形形狀的開口部的基板。 支持基板122的開口部的形狀及尺寸分別與由所述防塵薄膜組件框100所圍成的開口部50的形狀及尺寸大致相同。 然而,支持基板122的開口部的尺寸及開口部50的尺寸無須完全相同,例如可使支持基板122的開口部的尺寸小於開口部50的尺寸,亦可使支持基板122的開口部的尺寸大於開口部50的尺寸。然而,較佳為將開口部的一邊長度的差異設為2 mm以內(較佳為1 mm以內)。The support substrate 122 is a member for supporting the pellicle film 130. The support substrate 122 is a frame-shaped member similarly to the pellicle frame 100. In other words, the support substrate 122 is a substrate having an opening portion having a rectangular shape at the center portion. The shape and size of the opening of the support substrate 122 are substantially the same as the shape and size of the opening 50 surrounded by the pellicle frame 100. However, the size of the opening portion of the support substrate 122 and the size of the opening portion 50 need not be completely the same. For example, the size of the opening portion of the support substrate 122 may be smaller than the size of the opening portion 50, or the size of the opening portion of the support substrate 122 may be larger than The size of the opening 50. However, it is preferable to set the difference in the length of one side of the opening to be within 2 mm (preferably within 1 mm).

作為所述支持基板122的材質,可列舉:鋁、鋁合金(5000系、6000系、7000系等)、不鏽鋼、矽、矽合金、鐵、鐵系合金、碳鋼、工具鋼、陶瓷、金屬-陶瓷複合材料、樹脂等。其中,較佳為矽、矽合金。Examples of the material of the support substrate 122 include aluminum, aluminum alloy (5000 series, 6000 series, and 7000 series), stainless steel, niobium, tantalum alloy, iron, iron alloy, carbon steel, tool steel, ceramic, and metal. - Ceramic composite materials, resins, and the like. Among them, ruthenium and osmium alloys are preferred.

支持基板122的厚度例如可設為0.03 mm~5.0 mm,較佳為0.05 mm~3.0 mm,更佳為0.15 mm~2.0 mm,尤佳為0.3 mm~1.0 mm。The thickness of the support substrate 122 can be, for example, 0.03 mm to 5.0 mm, preferably 0.05 mm to 3.0 mm, more preferably 0.15 mm to 2.0 mm, and particularly preferably 0.3 mm to 1.0 mm.

於防塵薄膜組件201中,防塵薄膜130是由所述支持基板122支持。 該態樣的防塵薄膜構件具有即便於防塵薄膜為難以自立的膜(例如,矽結晶膜等含有無機系材料的防塵薄膜、厚度小的防塵薄膜等)的情形時,亦可一面藉由支持基板保持防塵薄膜的膜形狀、一面製造防塵薄膜組件的優點。In the pellicle film assembly 201, the pellicle film 130 is supported by the support substrate 122. In the case where the pellicle film is a film which is difficult to self-support (for example, a pellicle film containing an inorganic material such as a ruthenium crystal film or a pellicle film having a small thickness), the pellicle film member can be supported by the support substrate. The film shape of the pellicle film is maintained, and the pellicle assembly is manufactured.

包含所述支持基板122與防塵薄膜130的防塵薄膜構件120例如可藉由如下方式製作,首先,於作為支持基板122的原材料(設置開口部之前的支持基板)的矽晶圓(例如8英吋的矽晶圓)上,形成作為防塵薄膜130的矽結晶膜,繼而,自該矽晶圓的未形成矽結晶膜的面側,對矽晶圓的中央部進行蝕刻而去除該中央部的矽晶圓,從而形成開口部。再者,於製造防塵薄膜組件201時,矽晶圓的多餘的部分(自防塵薄膜組件框100的外周超出的多餘的部分)於防塵薄膜組件201的製造階段的中途被切割(去除)。 作為防塵薄膜130,除矽結晶膜以外,亦可使用氮化矽膜/矽結晶膜/氮化矽膜的構成的積層膜等其他膜。另外,作為支持基板122,亦可使用矽晶圓以外的其他基板。 即便於使用其他材料(膜、基板)的情況下,亦可藉由與所述相同的方法來製作防塵薄膜構件。The pellicle member 120 including the support substrate 122 and the pellicle film 130 can be produced, for example, by first forming a germanium wafer (for example, 8 inches) as a material for the support substrate 122 (a support substrate before the opening portion is provided). On the tantalum wafer, a tantalum crystal film is formed as the pellicle film 130, and then the central portion of the tantalum wafer is etched from the surface of the tantalum wafer on which the tantalum film is not formed, and the central portion is removed. The wafer is formed to form an opening. Further, when the pellicle film assembly 201 is manufactured, the excess portion of the crucible wafer (the excess portion that is beyond the outer circumference of the pellicle frame 100) is cut (removed) in the middle of the manufacturing stage of the pellicle assembly 201. As the pellicle film 130, in addition to the ruthenium crystal film, another film such as a laminate film of a ruthenium nitride film, a ruthenium crystal film, or a tantalum nitride film may be used. Further, as the support substrate 122, other substrates than the germanium wafer may be used. That is, in the case where other materials (films, substrates) are easily used, the pellicle member can be produced by the same method as described above.

於防塵薄膜組件201中,接著劑層102是接著支持基板122與防塵薄膜組件框100的層,且含有接著劑。 於本實施方式中,「接著劑」是指廣義的接著劑,「接著劑」的概念亦包含黏著劑。 作為接著劑層102所含有的接著劑,可列舉:丙烯酸樹脂接著劑、環氧樹脂接著劑、聚醯亞胺樹脂接著劑、矽酮樹脂接著劑、無機系接著劑、雙面黏著帶、矽酮樹脂黏著劑、丙烯酸系黏著劑、聚烯烴系黏著劑等。 其中較佳為丙烯酸樹脂接著劑、環氧樹脂接著劑、聚醯亞胺樹脂接著劑、矽酮樹脂接著劑、無機系接著劑。 接著劑層102的厚度並無特別限制,較佳為1 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。In the pellicle film assembly 201, the adhesive layer 102 is a layer that supports the substrate 122 and the pellicle frame 100, and contains an adhesive. In the present embodiment, the "adhesive" means a generalized adhesive, and the concept of "adhesive" also includes an adhesive. Examples of the adhesive agent contained in the adhesive layer 102 include an acrylic resin adhesive, an epoxy resin adhesive, a polyimide resin adhesive, an anthrone resin adhesive, an inorganic adhesive, a double-sided adhesive tape, and a crucible. A ketone resin adhesive, an acrylic adhesive, a polyolefin adhesive, or the like. Among them, an acrylic resin adhesive, an epoxy resin adhesive, a polyimide resin adhesive, an anthrone resin adhesive, and an inorganic adhesive are preferable. The thickness of the subsequent agent layer 102 is not particularly limited, but is preferably 1 μm to 500 μm, more preferably 10 μm to 400 μm, still more preferably 20 μm to 300 μm.

於防塵薄膜組件201中,接著劑層104為於利用本實施方式的防塵薄膜組件安裝裝置而將防塵薄膜組件裝設於原版(即,防塵薄膜組件與原版的貼合)時,用以接著原版與防塵薄膜組件框100的層,且含有接著劑。 作為接著劑層104所含有的接著劑,可列舉與接著劑層102所含有的接著劑相同者,其中較佳為雙面黏著帶、矽酮樹脂黏著劑、丙烯酸系黏著劑、聚烯烴系黏著劑。 接著劑層104的厚度並無特別限制,較佳為1 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。In the pellicle film assembly 201, the adhesive layer 104 is used to mount the pellicle film assembly on the original plate (that is, the pellicle film assembly and the original plate) by using the pellicle assembly mounting device of the present embodiment. It is a layer of the pellicle frame 100 and contains an adhesive. The adhesive agent contained in the adhesive layer 104 may be the same as the adhesive contained in the adhesive layer 102. Among them, a double-sided adhesive tape, an anthrone resin adhesive, an acrylic adhesive, and a polyolefin adhesive are preferable. Agent. The thickness of the subsequent agent layer 104 is not particularly limited, but is preferably 1 μm to 500 μm, more preferably 10 μm to 400 μm, still more preferably 20 μm to 300 μm.

再者,於防塵薄膜組件201中,接著劑層104被設置於防塵薄膜組件框100的另一端面20中除溝槽22以外的部分。藉此可效率佳地進行通過通孔24A及通孔24B的溝槽22的排氣。 關於所述接著劑層102,亦同樣地被設置於防塵薄膜組件框100的一端面10中除溝槽12以外的部分。Further, in the pellicle film assembly 201, the adhesive layer 104 is provided in a portion other than the groove 22 in the other end surface 20 of the pellicle frame 100. Thereby, the exhaust of the grooves 22 passing through the through holes 24A and the through holes 24B can be efficiently performed. The adhesive layer 102 is similarly provided in a portion other than the groove 12 in one end surface 10 of the pellicle frame 100.

剝離襯墊106為於利用本實施方式的防塵薄膜組件安裝裝置而將防塵薄膜組件裝設於原版之前(即,防塵薄膜組件與原版的貼合前),用以防止異物對接著劑層104的附著的構件。 剝離襯墊106於將防塵薄膜組件裝設於原版之前,自防塵薄膜組件201去除(剝離)。後述的防塵薄膜組件200(圖6等)為自防塵薄膜組件201去除剝離襯墊106後的防塵薄膜組件。 剝離襯墊106自防塵薄膜組件201的去除可於本實施方式的防塵薄膜組件安裝裝置內進行,亦可預先於本實施方式的防塵薄膜組件安裝裝置外進行。The release liner 106 is used to prevent the foreign matter from adhering to the adhesive layer 104 by attaching the pellicle assembly to the original plate (that is, before bonding the pellicle assembly to the original plate) by using the pellicle assembly mounting device of the present embodiment. Attached components. The release liner 106 is removed (peeled) from the pellicle assembly 201 before the pellicle assembly is mounted on the original. The pellicle film assembly 200 (FIG. 6 and the like) to be described later is a pellicle film assembly after the release liner 106 is removed from the pellicle film assembly 201. The removal of the release liner 106 from the pellicle assembly 201 can be performed in the pellicle assembly mounting apparatus of the present embodiment, or can be performed in advance of the pellicle assembly mounting apparatus of the present embodiment.

剝離襯墊為亦被稱作剝離膜或隔片的構件。 作為剝離襯墊,可無特別限制地使用具有矽酮化合物等的剝離層的聚對苯二甲酸乙二酯(Polyethylene terephthalate,PET)膜等公知者。 於防塵薄膜組件201中,剝離襯墊106的自厚度方向觀察的形狀成為跨防塵薄膜組件框100及開口部50(由防塵薄膜組件框100所圍成的開口部)的形狀,即不具有開口部的平板形狀。然而,剝離襯墊106的形狀亦可為任意者。剝離襯墊亦可為僅與接著劑層104的表面相接的框形狀的構件(具有開口部的構件)。另外,剝離襯墊可為大於防塵薄膜組件框100的構件,例如亦可為自防塵薄膜組件框100的厚度方向觀察時,具有自防塵薄膜組件框100的外側超出的大小的構件。The release liner is a member also referred to as a release film or separator. As the release liner, a polyethylene terephthalate (PET) film having a release layer such as an anthrone compound can be used without any particular limitation. In the pellicle film assembly 201, the shape of the release liner 106 as viewed from the thickness direction is a shape that spans the pellicle frame 100 and the opening 50 (the opening surrounded by the pellicle frame 100), that is, does not have an opening. The shape of the flat plate. However, the shape of the release liner 106 may be any. The release liner may be a frame-shaped member (a member having an opening) that is in contact only with the surface of the adhesive layer 104. Further, the release liner may be a member larger than the pellicle frame 100, and may have a member that is larger than the outer side of the pellicle frame 100 when viewed from the thickness direction of the pellicle frame 100.

剝離襯墊106的厚度並無特別限制,較佳為5 μm~500 μm,更佳為10 μm~400 μm,尤佳為20 μm~300 μm。The thickness of the release liner 106 is not particularly limited, but is preferably 5 μm to 500 μm, more preferably 10 μm to 400 μm, and still more preferably 20 μm to 300 μm.

於防塵薄膜組件201中,各構件的厚度的較佳範圍如上所述。 各構件的厚度較佳為以防塵薄膜組件200的總厚度成為5.0 mm以下(更佳為3.0 μm以下,進而佳為2.0 mm以下)的方式調整。In the pellicle assembly 201, the preferred range of the thickness of each member is as described above. The thickness of each member is preferably adjusted so that the total thickness of the pellicle film assembly 200 is 5.0 mm or less (more preferably 3.0 μm or less, and further preferably 2.0 mm or less).

於防塵薄膜組件201的至少一個構成構件(其中,剝離襯墊106除外)亦可形成用以提高與原版的對準(位置對準)精度的對準標記。At least one constituent member of the pellicle film assembly 201 (excluding the release liner 106) may also form an alignment mark for improving the alignment (position alignment) accuracy with the original plate.

(貼合單元的具體例) 圖6及圖7是表示本實施方式的防塵薄膜組件安裝裝置中的貼合單元的一例的概略構成圖。貼合單元為獨自亦作為防塵薄膜組件安裝裝置發揮功能的單元。 圖6為著眼於在貼合單元的貼合腔室內進行防塵薄膜組件與原版的貼合的形態的概略截面圖。於圖6中,關於貼合腔室內的詳細構成,省略圖示。 圖7為著眼於貼合腔室內的詳細構成、及將防塵薄膜構件搬入至貼合腔室的形態的概略截面圖。於圖7中,關於防塵薄膜組件的詳細構成,省略圖示。(Specific Example of Bonding Unit) FIG. 6 and FIG. 7 are schematic configuration diagrams showing an example of a bonding unit in the pellicle assembly mounting apparatus according to the present embodiment. The bonding unit is a unit that functions as a pellicle mounting device alone. Fig. 6 is a schematic cross-sectional view showing a state in which a pellicle film assembly and an original plate are bonded together in a bonding chamber of a bonding unit. In FIG. 6, the detailed structure of the bonding chamber is omitted. Fig. 7 is a schematic cross-sectional view showing a detailed configuration of the inside of the bonding chamber and a form in which the pellicle member is carried into the bonding chamber. In FIG. 7, the detailed structure of the pellicle film assembly is omitted.

如圖6所示,於貼合單元300的貼合腔室310內配置有防塵薄膜組件200及原版250。 此處,防塵薄膜組件200為自所述防塵薄膜組件201去除了剝離襯墊106者。剝離襯墊106自防塵薄膜組件201的去除可於本實施方式的防塵薄膜組件安裝裝置內進行,亦可預先於本實施方式的防塵薄膜組件安裝裝置外進行。As shown in FIG. 6, the pellicle film assembly 200 and the original plate 250 are disposed in the bonding chamber 310 of the bonding unit 300. Here, the pellicle film assembly 200 is one in which the release liner 106 is removed from the pellicle film assembly 201. The removal of the release liner 106 from the pellicle assembly 201 can be performed in the pellicle assembly mounting apparatus of the present embodiment, or can be performed in advance of the pellicle assembly mounting apparatus of the present embodiment.

原版250具有前表面252(曝光光可照射的面;光照射面)及背面254(前表面252的相反側的面)。 作為原版250,例如使用含有支持基板、積層於該支持基板上的反射層、及形成於反射層上的吸收體層的EUV原版(EUV遮罩)。於該原版中,設置有反射層及吸收體層之側的面成為前表面252(光照射面)。前表面252的相反側的面(支持基板的面)為背面254。於該例中,藉由吸收體層吸收一部分EUV光,可於感應基板(例如,附光阻膜的半導體基板)上形成所需圖像。反射層可為鉬(Mo)與矽(Si)的多層膜。吸收體層可為鉻(Cr)或氮化鉭等EUV光等的吸收性高的材料。The original plate 250 has a front surface 252 (a surface on which an exposure light can be irradiated; a light irradiation surface) and a back surface 254 (a surface on the opposite side of the front surface 252). As the master 250, for example, an EUV master (EUV mask) including a support substrate, a reflective layer laminated on the support substrate, and an absorber layer formed on the reflective layer is used. In the original plate, the surface on the side where the reflection layer and the absorber layer are provided becomes the front surface 252 (light irradiation surface). The surface on the opposite side of the front surface 252 (the surface supporting the substrate) is the back surface 254. In this example, a desired image can be formed on the sensing substrate (e.g., the semiconductor substrate with the photoresist film) by absorbing a portion of the EUV light by the absorber layer. The reflective layer can be a multilayer film of molybdenum (Mo) and bismuth (Si). The absorber layer may be a highly absorptive material such as EUV light such as chromium (Cr) or tantalum nitride.

於貼合腔室310內,防塵薄膜組件200及原版250以防塵薄膜組件200的接著劑層104與原版250的前表面252相對向的方式進行配置。 於防塵薄膜組件200中防塵薄膜組件框100的與原版250相對向之側的端面(另一端面20)設置有溝槽22。而且,接著劑層104被設置於防塵薄膜組件框100的另一端面20上的除溝槽22以外的部分。 於貼合腔室310內,藉由排氣管(圖6中未圖示。圖7中為排氣管312A及排氣管312B),經由通孔24B來進行溝槽22的內部的排氣(減壓)(箭頭E2),且經由通孔24A來進行溝槽22的內部的排氣(減壓)(箭頭E1)。藉由該些的排氣(減壓),可使吸合力F(即,壓合力)於防塵薄膜組件200與原版250之間發揮作用。藉由該力F的作用,可於儘量避免接觸防塵薄膜130的情況下將兩者貼合。 此時,較佳為藉由未圖示的導入管,將氣體導入貼合腔室310內而對貼合腔室310內進行加壓。藉此,可進一步增大配置有防塵薄膜組件200及原版250的貼合腔室310內整體的環境的壓力、與溝槽22內部的壓力之差(差壓),因此可使所述力F更有效地發揮作用。In the bonding chamber 310, the pellicle film assembly 200 and the original plate 250 are disposed such that the adhesive layer 104 of the pellicle film assembly 200 faces the front surface 252 of the original plate 250. A groove 22 is provided in the end surface (the other end surface 20) of the pellicle frame 100 on the side opposite to the original plate 250 in the pellicle film assembly 200. Further, the adhesive layer 104 is provided on a portion other than the groove 22 on the other end surface 20 of the pellicle frame 100. In the bonding chamber 310, the inside of the trench 22 is exhausted through the through hole 24B by an exhaust pipe (not shown in FIG. 6; the exhaust pipe 312A and the exhaust pipe 312B in FIG. 7). (decompression) (arrow E2), and exhaust (decompression) inside the groove 22 is performed via the through hole 24A (arrow E1). By the exhaust (decompression), the suction force F (i.e., the pressing force) can be made to function between the pellicle assembly 200 and the original plate 250. By the action of the force F, the two can be bonded together as much as possible while avoiding contact with the pellicle film 130. At this time, it is preferable to introduce the gas into the bonding chamber 310 by an introduction pipe (not shown) to pressurize the inside of the bonding chamber 310. Thereby, the difference between the pressure of the entire environment in the bonding chamber 310 in which the pellicle film assembly 200 and the master 250 is disposed and the pressure inside the groove 22 (differential pressure) can be further increased, so that the force F can be made. Play a more effective role.

所述力F(對防塵薄膜組件框整體施加的力)較佳為1 N以上,更佳為2 N以上。 所述力F(對防塵薄膜組件框整體施加的力)進而較佳為10 N以上,尤佳為20 N以上。 所述力F(對防塵薄膜組件框整體施加的力)的上限並無特別限制,就生產性等方面而言,例如為500 N,較佳為400 N。The force F (the force applied to the entire pellicle frame) is preferably 1 N or more, more preferably 2 N or more. The force F (the force applied to the entire pellicle frame) is more preferably 10 N or more, and particularly preferably 20 N or more. The upper limit of the force F (the force applied to the entire pellicle frame) is not particularly limited, and is, for example, 500 N, preferably 400 N, in terms of productivity and the like.

繼而,參照圖7對貼合單元300的構成進行說明。 如圖7所示,貼合單元300具備貼合腔室310、用以將氣體導入貼合腔室310內而對貼合腔室310內進行加壓的第1導入管322及第2導入管326、以及用以經由防塵薄膜組件200的防塵薄膜組件框100的通孔24A及通孔24B而對溝槽22的內部進行排氣的排氣管312A及排氣管312B。Next, the configuration of the bonding unit 300 will be described with reference to Fig. 7 . As shown in FIG. 7 , the bonding unit 300 includes a bonding chamber 310 and a first introduction tube 322 and a second introduction tube for introducing gas into the bonding chamber 310 to pressurize the inside of the bonding chamber 310 . 326 and an exhaust pipe 312A and an exhaust pipe 312B for exhausting the inside of the groove 22 through the through hole 24A and the through hole 24B of the pellicle frame 100 of the pellicle film assembly 200.

此處,第1導入管322於將防塵薄膜組件200及原版250配置於貼合腔室310內時,被配置於可自與防塵薄膜組件200(防塵薄膜130)相對向之側(於該例中,自貼合腔室310的上表面)導入氣體的位置。貼合單元300亦可具備多個第1導入管322。 另一方面,第2導入管326於將防塵薄膜組件200及原版250配置於貼合腔室310內時,被配置於可自原版250的下方且貼合腔室310的側面導入氣體的位置。第2導入管326並不限於該位置,可設置於能夠將氣體導入貼合腔室310內的所有位置。另外,貼合單元300亦可具備多個第2導入管326。Here, when the pellicle film assembly 200 and the original plate 250 are disposed in the bonding chamber 310, the first introduction tube 322 is disposed on the side opposite to the pellicle film assembly 200 (the pellicle film 130) (in this example). The position of the gas is introduced from the upper surface of the bonding chamber 310. The bonding unit 300 may include a plurality of first introduction tubes 322. On the other hand, when the pellicle film assembly 200 and the original plate 250 are disposed in the bonding chamber 310, the second introduction pipe 326 is disposed at a position where the gas can be introduced from the lower side of the original plate 250 and the side surface of the bonding chamber 310. The second introduction pipe 326 is not limited to this position, and may be provided at all positions where gas can be introduced into the bonding chamber 310. Further, the bonding unit 300 may include a plurality of second introduction tubes 326.

第1導入管322及第2導入管326的另一端分別可(視需要經由其他配管等)連接於貯氣瓶等氣體供給部件。 另外,亦可於第1導入管322及第2導入管326的中途設置用以切換是否進行氣體導入的閥門(未圖示)。該閥門亦可為具備調整氣體流量等的機構的調整閥。 再者,經由第1導入管322及第2導入管326而供給的氣體並無特別限制,例如可使用乾燥空氣、惰性氣體等。The other ends of the first introduction pipe 322 and the second introduction pipe 326 may be connected to a gas supply member such as a gas cylinder, respectively (via other piping or the like as necessary). Further, a valve (not shown) for switching whether or not to introduce gas may be provided in the middle of the first introduction pipe 322 and the second introduction pipe 326. The valve may also be an adjustment valve having a mechanism for adjusting a gas flow rate or the like. In addition, the gas supplied through the first introduction pipe 322 and the second introduction pipe 326 is not particularly limited, and for example, dry air, an inert gas, or the like can be used.

排氣管312A及排氣管312B分別可經由與一端連接的連通構件而連接於防塵薄膜組件200的防塵薄膜組件框的通孔。The exhaust pipe 312A and the exhaust pipe 312B are respectively connectable to the through holes of the pellicle frame of the pellicle unit 200 via a communication member connected to one end.

圖8是概念性地表示圖7中的排氣管的其中一個即排氣管312B連接於防塵薄膜組件框的通孔的形態的部分截面圖。 如圖8所示,於排氣管312B的一端連接有使防塵薄膜組件框100的通孔24B與排氣管312B連通的連通構件314。藉由貼合單元300具備該連通構件314,於對通過通孔24B的溝槽22的內部進行排氣時,進一步提高排氣的效率。連通構件314無須相對於排氣管312B而為獨立的構件。即,排氣管312B與連通構件314亦可為經一體成形的一個構件。Fig. 8 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes of Fig. 7, that is, the exhaust pipe 312B is connected to the through hole of the pellicle frame. As shown in FIG. 8, a communication member 314 that communicates the through hole 24B of the pellicle frame 100 with the exhaust pipe 312B is connected to one end of the exhaust pipe 312B. When the bonding unit 300 includes the communication member 314, when the inside of the groove 22 passing through the through hole 24B is exhausted, the efficiency of the exhaust gas is further improved. The communication member 314 does not need to be an independent member with respect to the exhaust pipe 312B. That is, the exhaust pipe 312B and the communication member 314 may be one member that is integrally formed.

連通構件314的形狀成為具有與防塵薄膜組件框100的外周面接觸的開口端、且該開口端的直徑大於通孔的直徑的形狀。藉由連通構件314的形狀為該形狀,可容易地進行連通構件314的開口端與通孔14B的位置對準。更具體而言,連通構件314的形狀成為隨著遠離排氣管312B的一端而直徑增大的錐形形狀。The shape of the communication member 314 is a shape having an open end that is in contact with the outer peripheral surface of the pellicle frame 100, and the diameter of the open end is larger than the diameter of the through hole. By the shape of the communication member 314 being the shape, the positional alignment of the open end of the communication member 314 with the through hole 14B can be easily performed. More specifically, the shape of the communication member 314 becomes a tapered shape that increases in diameter as it goes away from one end of the exhaust pipe 312B.

另外,連通構件314被設置成可朝推入防塵薄膜組件框100的外周面的方向(箭頭J2的方向)移動。藉此,可更牢靠地連接連通構件314與防塵薄膜組件框100。進而,即便於因經由防塵薄膜組件框100的通孔24B對溝槽22的內部進行排氣而導致防塵薄膜組件框100朝排氣方向(箭頭E2的方向)應變變形的情況下,亦可藉由預先利用連通構件314而推入防塵薄膜組件框100的外周面,來修正防塵薄膜組件框100的應變變形。 再者,當然連通構件314亦可朝與箭頭J2相反的方向(返回方向)移動。Further, the communication member 314 is provided to be movable in a direction (direction of the arrow J2) that is pushed into the outer peripheral surface of the pellicle frame 100. Thereby, the communication member 314 and the pellicle frame 100 can be connected more securely. Further, even if the pellicle frame 100 is strain-deformed in the exhaust direction (direction of the arrow E2) by exhausting the inside of the groove 22 through the through hole 24B of the pellicle frame 100, it is possible to borrow The strain deformation of the pellicle frame 100 is corrected by pushing the outer peripheral surface of the pellicle frame 100 in advance by the communication member 314. Further, of course, the communication member 314 can also move in the opposite direction (return direction) from the arrow J2.

图9是概念性地表示於本實施方式的變形例中,排氣管的其中一個與防塵薄膜組件框的通孔連接的形態的部分截面圖,且是與所述一例中的圖8的部分截面圖相對應的圖。 如圖9所示,變形例中的防塵薄膜組件框103的通孔124B具有隨著朝向防塵薄膜組件框103的外周面而直徑增大的錐形形狀。變形例中的連通構件316具有可插入至通孔124B的錐形形狀的部分的錐形形狀。 根據該變形例,可藉由將連通構件316插入至通孔124B的錐形形狀的部分(參照箭頭J12)來更牢靠地連接排氣管312B與通孔124B。 於所述變形例中,關於除所述以外的方面,與所述一例相同,較佳態樣亦相同。 再者,即便於連通構件及通孔為除錐形形狀以外的形狀時,只要為可將連通構件插入至通孔的結構,亦發揮與所述變形例相同的效果。例如於連通構件為圓筒形狀的構件且通孔為圓柱形狀的空間時,可藉由使連通構件的直徑小於通孔的直徑來將連通構件插入至通孔。FIG. 9 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes is connected to the through hole of the pellicle frame in the modification of the embodiment, and is a portion of FIG. 8 in the example; The corresponding diagram of the section view. As shown in FIG. 9, the through hole 124B of the pellicle frame 103 in the modification has a tapered shape which increases in diameter as it goes toward the outer peripheral surface of the pellicle frame 103. The communication member 316 in the modification has a tapered shape that can be inserted into a tapered shape portion of the through hole 124B. According to this modification, the exhaust pipe 312B and the through hole 124B can be more firmly connected by inserting the communication member 316 into the tapered portion of the through hole 124B (refer to the arrow J12). In the above-described modification, the aspects other than the above are the same as the above-described example, and the preferred aspects are also the same. In addition, even when the communicating member and the through hole have a shape other than the tapered shape, the same effect as the above-described modification can be exerted as long as the connecting member can be inserted into the through hole. For example, when the communication member is a cylindrical member and the through hole is a cylindrical shape, the communication member can be inserted into the through hole by making the diameter of the communication member smaller than the diameter of the through hole.

另外,於本實施方式中亦可省略連通構件。總之,於本實施方式中,只要為可將排氣管與通孔連通的構成即可。Further, in the present embodiment, the communication member may be omitted. In short, in the present embodiment, a configuration may be adopted in which the exhaust pipe can communicate with the through hole.

繼而,返回到圖7,將排氣管312A及排氣管312B的另一端(未圖示)配置於貼合腔室310外,該些的另一端分別可(視需要經由其他配管等)連接於真空汞等排氣部件。 另外,亦可於排氣管312A及排氣管312B的中途設置用以調換是否進行溝槽22的排氣的閥門(未圖示)。該閥門亦可為具備調整氣體流量等的機構的調整閥。Then, returning to FIG. 7, the other end (not shown) of the exhaust pipe 312A and the exhaust pipe 312B is disposed outside the bonding chamber 310, and the other ends of the exhaust pipe 312A and the exhaust pipe 312B are connected to each other (if necessary, via other pipes, etc.) Exhaust parts such as vacuum mercury. Further, a valve (not shown) for exchanging the exhaust of the groove 22 may be provided in the middle of the exhaust pipe 312A and the exhaust pipe 312B. The valve may also be an adjustment valve having a mechanism for adjusting a gas flow rate or the like.

再者,於貼合單元300中,與連接於防塵薄膜組件框100的溝槽22的通孔的數量(兩個)相應地,設置有兩個排氣管,但本實施方式中的排氣管的數量當然不限定於兩個。排氣管的數量並無特別限制,較佳為使排氣管的端部的數量與所述通孔的數量一致。另外,作為排氣管,亦可使用分支的排氣管。總之,於本實施方式中,較佳為可於連接於溝槽的各通孔處連接排氣管的各端部,所述溝槽設置於防塵薄膜組件框的與防塵薄膜構件相對向的一側的端面。Further, in the bonding unit 300, two exhaust pipes are provided corresponding to the number (two) of the through holes connected to the grooves 22 of the pellicle frame 100, but the exhaust gas in the present embodiment The number of tubes is of course not limited to two. The number of the exhaust pipes is not particularly limited, and it is preferable to make the number of the ends of the exhaust pipe coincide with the number of the through holes. Further, as the exhaust pipe, a branched exhaust pipe can also be used. In short, in the embodiment, it is preferable that each end portion of the exhaust pipe is connected to each of the through holes connected to the groove, and the groove is disposed on a side of the pellicle frame opposite to the pellicle member. Side end face.

如圖7所示,於貼合腔室310內設置有支持原版250的原版支持構件330。 原版支持構件330以與原版250的外周面的一部分接觸、不與原版250的背面254接觸的方式支持原版250。然而,作為原版支持構件330的變形例,亦可使用與原版的外周面的一部分接觸、且與背面254的周端部的一部分接觸的原版支持構件。 如該些例子般,貼合單元300較佳為具備原版支持構件,所述原版支持構件在貼合腔室310內,以與原版250的背面254的周端部及原版250的外周面的至少一部分接觸、不與背面254的中央部接觸的方式來支持原版250。藉此,可於不與原版的背面的中央部接觸的情況下貼合原版與防塵薄膜組件,故異物對原版的背面的中央部的附著得到抑制。As shown in FIG. 7, a master support member 330 supporting the master 250 is disposed in the bonding chamber 310. The master support member 330 supports the master 250 in such a manner as to be in contact with a portion of the outer peripheral surface of the master 250 and not in contact with the back surface 254 of the master 250. However, as a modification of the master supporting member 330, a master supporting member that is in contact with a part of the outer peripheral surface of the original plate and that is in contact with a part of the peripheral end portion of the back surface 254 may be used. As in the above examples, the bonding unit 300 preferably includes a master supporting member, and the master supporting member is in the bonding chamber 310 at least with the peripheral end portion of the back surface 254 of the original plate 250 and the outer peripheral surface of the original plate 250. The original plate 250 is supported in such a manner that a part of the contacts does not contact the central portion of the back surface 254. Thereby, the original plate and the pellicle can be bonded together without being in contact with the central portion of the back surface of the original plate, so that the adhesion of the foreign matter to the central portion of the back surface of the original plate is suppressed.

同樣地,較佳為由保持部件(未圖示)來保持原版250並進行原版250向貼合腔室310內的搬入,所述保持部件是以與原版250的背面254的周端部及原版250的外周面的至少一部分接觸、不與背面254的中央部接觸的方式來支持原版250。作為該保持部件,可列舉搬運機器人所具備的手構件。Similarly, it is preferable that the original plate 250 is held by a holding member (not shown) and the original plate 250 is carried into the bonding chamber 310, which is the peripheral end portion of the back surface 254 of the original plate 250 and the original plate. The original plate 250 is supported in such a manner that at least a part of the outer peripheral surface of the 250 contacts and does not contact the central portion of the back surface 254. Examples of the holding member include a hand member provided in the transport robot.

背面254的中央部較佳為比原版250的有效曝光區域寬的區域。 另外,自背面254的中央部的外周至背面的周端的距離較佳為5 mm以下,更佳為3 mm以下。The central portion of the back surface 254 is preferably a region wider than the effective exposure region of the original plate 250. Further, the distance from the outer periphery of the central portion of the back surface 254 to the peripheral end of the back surface is preferably 5 mm or less, more preferably 3 mm or less.

另外,背面254的周端部較佳為距背面的周端為5 mm以內(更佳為3 mm以內)的區域。Further, the peripheral end portion of the back surface 254 is preferably a region within 5 mm (more preferably within 3 mm) from the peripheral end of the back surface.

繼而,關於本實施方式的變形例,參照圖10~圖13,對支持貼合腔室310內的原版250的機構的變形例進行說明。 再者,於該些的變形例中,背面的中央部及周端部的較佳範圍與所述一例相同。Next, a modification of the mechanism for supporting the original plate 250 in the bonding chamber 310 will be described with reference to FIGS. 10 to 13 in a modification of the present embodiment. Further, in the modified examples, the preferred range of the central portion and the peripheral end portion of the back surface is the same as the above-described example.

於圖10所示的變形例中,原版250以被收容在原版殼體260的狀態而被搬入(收容)至貼合腔室310內,所述原版殼體260具有使原版250的前表面252露出的開口部。於該情況下,貼合單元300具備原版殼體支持構件332(載置板),所述原版殼體支持構件332(載置板)於貼合腔室310內對收容有原版250的原版殼體260進行支持。於該變形例中,於保持將原版250收容於原版殼體260的狀態下,進行原版250與防塵薄膜組件200的貼合。 再者,該變形例中的原版殼體260向貼合腔室310內的搬入可使用能夠保持原版殼體260的保持部件(例如,搬運機器人所具備的手構件)進行。保持原版殼體260的保持構件可與原版殼體260的外側的任意部分接觸。 於該變形例中,原版250的背面254的周端部的一部分與設置於原版殼體260的凸起262接觸,且不與背面254的中央部的任一部分接觸。 藉此,可於不與原版的背面的中央部接觸的情況下貼合原版與防塵薄膜組件,故異物對原版的背面的中央部的附著得到抑制。 凸起262的材質或形狀等並無特別要求,但作為材質,理想的是具有可撓性且難以發生起塵的材料、或具有導電性的材料。作為此種材質,例如可列舉碳-聚醯亞胺化合物等。 設置凸起262的位置亦無特別限制,但較佳為原版250的背面254的四個角部。In the modification shown in FIG. 10, the master 250 is carried (accommodated) into the bonding chamber 310 in a state of being housed in the original casing 260 having the front surface 252 of the original plate 250. The exposed opening. In this case, the bonding unit 300 includes a master case supporting member 332 (mounting plate) in which the original housing supporting member 332 (mounting plate) accommodates the original plate of the original plate 250. Body 260 is supported. In this modification, the original plate 250 and the pellicle assembly 200 are bonded together while the original plate 250 is held in the original casing 260. Further, the loading of the master casing 260 into the bonding chamber 310 in the modification can be performed using a holding member (for example, a hand member provided in the conveyance robot) capable of holding the original casing 260. The retaining member that holds the master housing 260 can be in contact with any portion of the outer side of the master housing 260. In this modification, a part of the peripheral end portion of the back surface 254 of the master 250 is in contact with the projection 262 provided on the master casing 260, and is not in contact with any portion of the central portion of the back surface 254. Thereby, the original plate and the pellicle can be bonded together without being in contact with the central portion of the back surface of the original plate, so that the adhesion of the foreign matter to the central portion of the back surface of the original plate is suppressed. The material, shape, and the like of the projections 262 are not particularly required. However, as the material, a material having flexibility and difficulty in dusting or a material having conductivity is preferable. As such a material, for example, a carbon-polyimine compound or the like can be mentioned. The position at which the projections 262 are provided is also not particularly limited, but is preferably the four corners of the back surface 254 of the original plate 250.

於圖11所示的變形例中,原版250於貼合腔室310內被載置於載置板334。於該變形例中,原版250的背面254的周端部的一部分與設置於載置板334的凸起362接觸,且不與背面254的中央部的任一部分接觸。 藉此,可於不與原版的背面的中央部接觸的情況下貼合原版與防塵薄膜組件,故異物對原版的背面的中央部的附著得到抑制。 凸起362的較佳材質與凸起262的較佳材質相同。 設置有凸起362的位置的較佳態樣亦與設置有凸起262的位置的較佳態樣相同。In the modification shown in FIG. 11, the master 250 is placed on the mounting plate 334 in the bonding chamber 310. In this modification, a part of the peripheral end portion of the back surface 254 of the master 250 is in contact with the projection 362 provided on the placing plate 334, and is not in contact with any portion of the central portion of the back surface 254. Thereby, the original plate and the pellicle can be bonded together without being in contact with the central portion of the back surface of the original plate, so that the adhesion of the foreign matter to the central portion of the back surface of the original plate is suppressed. The preferred material of the protrusions 362 is the same as the preferred material of the protrusions 262. The preferred embodiment of the position in which the projections 362 are provided is also the same as the preferred embodiment in which the projections 262 are provided.

於圖12所示的變形例中,原版250與之前的例子不同,原版250以前表面252成為下側、背面254成為上側的方式而被配置於貼合腔室310內。於該變形例中,在貼合腔室310內設置有以與原版250的外周面接觸、不與原版250的背面254接觸的方式支持原版250的原版支持構件336。於該變形例的情況下,防塵薄膜組件200亦與之前的例子不同,防塵薄130以成為下側的朝向而被搬入貼合腔室310內。關於將防塵薄膜組件200裝設於原版250的前表面252的方面,與之前的例子相同。 於該變形例中,可於不與原版的背面的中央部及周端部接觸的情況下貼合原版與防塵薄膜組件,故異物對原版的背面的附著得到抑制。In the modification shown in FIG. 12, the original plate 250 is different from the previous example, and the original plate 250 is disposed in the bonding chamber 310 such that the front surface 252 is on the lower side and the back surface 254 is on the upper side. In this modification, the master support member 336 that supports the master 250 so as to be in contact with the outer peripheral surface of the master 250 and not in contact with the back surface 254 of the master 250 is provided in the bonding chamber 310. In the case of this modification, the pellicle film assembly 200 is different from the previous example in that the dust-proof thin film 130 is carried into the bonding chamber 310 in the downward direction. The aspect in which the pellicle film assembly 200 is attached to the front surface 252 of the original plate 250 is the same as the previous example. In this modification, the original plate and the pellicle can be bonded together without being in contact with the center portion and the peripheral end portion of the back surface of the original plate, so that the adhesion of foreign matter to the back surface of the original plate is suppressed.

圖13所示的變形例除圖12中的原版支持構件336使用如下的原版支持構件337以外,與圖12所示的變形例相同,所述原版支持構件337與原版250的外周面的一部分接觸、且亦與原版250的前表面252的周端部接觸。The modification shown in FIG. 13 is the same as the modification shown in FIG. 12 except that the original support member 336 in FIG. 12 uses the following original support member 337, and the original support member 337 is in contact with a part of the outer peripheral surface of the original plate 250. And also in contact with the peripheral end portion of the front surface 252 of the master 250.

繼而,返回到圖7,原版支持構件330亦可設置成能夠使原版250沿水平方向(更詳細而言,彼此正交的X方向及Y方向、以及作為旋轉方向的θ方向)移動,藉此可進行防塵薄膜組件200與原版250的對準(位置對準)調整。 即,該情況下的原版支持構件330作為對準部件而發揮功能。 再者,關於所述各變形例中的原版支持構件、載置板、原版殼體支持構件,亦同樣地較佳為作為對準部件而發揮功能。Then, returning to FIG. 7, the original supporting member 330 may be provided so that the original plate 250 can be moved in the horizontal direction (more specifically, the X direction and the Y direction orthogonal to each other, and the θ direction as the rotation direction), whereby The alignment (position alignment) adjustment of the pellicle assembly 200 to the master 250 can be performed. That is, the master support member 330 in this case functions as an alignment member. Further, in the same manner as the original supporting member, the placing plate, and the original housing supporting member in the respective modifications, it is preferable to function as an alignment member.

於貼合腔室310內進而設置有多個感測器340。 感測器340為用以讀取防塵薄膜組件200(防塵薄膜組件框100)於貼合腔室310內的位置的構件。感測器340例如讀取有時設置於防塵薄膜組件200的一部分的對準標記的位置、防塵薄膜組件框100的外周端的位置、防塵薄膜組件框100的內周端的位置等。 感測器340被設置成可相應於讀取對象(對準標記、防塵薄膜組件框100的外周端的位置、防塵薄膜組件框100的內周端的位置)的位置而移動。 利用感測器340的讀取可藉由圖像辨別來進行。 作為感測器340,可較佳地應用纖維感測器。A plurality of sensors 340 are further disposed in the bonding chamber 310. The sensor 340 is a member for reading the position of the pellicle assembly 200 (the pellicle frame 100) in the fitting chamber 310. The sensor 340 reads, for example, the position of the alignment mark which is sometimes provided in a part of the pellicle assembly 200, the position of the outer peripheral end of the pellicle frame 100, the position of the inner peripheral end of the pellicle frame 100, and the like. The sensor 340 is disposed to be movable in accordance with the position of the reading object (the alignment mark, the position of the outer peripheral end of the pellicle frame 100, and the position of the inner peripheral end of the pellicle frame 100). The reading by the sensor 340 can be performed by image discrimination. As the sensor 340, a fiber sensor can be preferably applied.

再者,關於貼合單元中的對準的機構(原版支持基板的移動、利用中心的位置的讀取等),亦可應用曝光裝置(例如步進機)、晶片安裝裝置等公知裝置的公知的對準機構。Further, a known mechanism such as an exposure device (for example, a stepper) or a wafer mounting device can be applied to the alignment mechanism in the bonding unit (the movement of the original support substrate, the reading of the position using the center, and the like). Alignment mechanism.

另外,於貼合腔室310內進而設置有用以使自第1導入管322導入的氣體分散的氣體分散構件324。氣體分散構件324採用覆蓋第1導入管322的端部(氣體的導入口)與貼合腔室310上部的內壁面的一部分的罩形狀的構件。而且,於氣體分散構件324的與防塵薄膜130的相對向面側設置有多個孔(未圖示)。自第1導入管322導入的氣體首先到達由貼合腔室310上部的內壁面與氣體分散構件324形成的空間內,繼而藉由所述多個孔而加以分散。 藉此,來自第1導入管322的氣體的流動對防塵薄膜130的影響得以減少。自進一步減少氣體的流動對防塵薄膜的影響的觀點出發,較佳為所述多個孔以氣體不與防塵薄膜130的中央部分碰觸的配置而設置。Further, a gas dispersion member 324 for dispersing a gas introduced from the first introduction pipe 322 is further provided in the bonding chamber 310. The gas dispersion member 324 is a cover-shaped member that covers an end portion (a gas introduction port) of the first introduction pipe 322 and a part of an inner wall surface of the upper portion of the bonding chamber 310. Further, a plurality of holes (not shown) are provided on the opposing surface side of the gas dispersion member 324 and the pellicle film 130. The gas introduced from the first introduction pipe 322 first reaches the space formed by the inner wall surface of the upper portion of the bonding chamber 310 and the gas dispersion member 324, and is then dispersed by the plurality of holes. Thereby, the influence of the flow of the gas from the first introduction pipe 322 on the pellicle film 130 is reduced. From the viewpoint of further reducing the influence of the flow of the gas on the pellicle film, it is preferable that the plurality of holes are provided in such a manner that the gas does not come into contact with the central portion of the pellicle film 130.

另外,雖省略圖示,但於貼合腔室310設置有構件進出口。 經由構件進出口來進行針對貼合腔室310的各構件的搬入及搬出。具體而言,經由構件進出口,將貼合前的防塵薄膜組件200及貼合前的原版250分別搬入貼合腔室310內。另外,經由構件進出口,將貼合後的防塵薄膜組件200及原版250搬出至貼合腔室310外。另外,於貼合單元300設置有用以進行構件進出口的開放及閉合的擋門(未圖示)。Further, although not shown in the drawings, the member inlet and outlet are provided in the bonding chamber 310. The loading and unloading of the respective members of the bonding chamber 310 is performed via the member inlet and outlet. Specifically, the pellicle film assembly 200 before bonding and the original plate 250 before bonding are carried into the bonding chamber 310 through the member inlet and outlet. Further, the bonded pellicle film assembly 200 and the original plate 250 are carried out of the bonding chamber 310 via the member inlet and outlet. Further, a closing door (not shown) for opening and closing the member inlet and outlet is provided in the bonding unit 300.

關於將原版250搬入貼合腔室310內的情況如上所述。 另外,防塵薄膜組件200較佳為藉由與防塵薄膜組件框100的外周面相接且不與防塵薄膜130及接著劑層104接觸的手構件(未圖示)而搬入貼合腔室310內。而且,於貼合腔室310內,亦藉由與防塵薄膜組件框100的外周面相接且不與防塵薄膜130及接著劑層104接觸的支持構件(未圖示)而受到支持。The case where the original plate 250 is carried into the bonding chamber 310 is as described above. Further, the pellicle film assembly 200 is preferably carried into the bonding chamber 310 by a hand member (not shown) that is in contact with the outer peripheral surface of the pellicle frame 100 and that does not contact the pellicle film 130 and the adhesive layer 104. . Further, the bonding chamber 310 is also supported by a supporting member (not shown) that is in contact with the outer peripheral surface of the pellicle frame 100 and that does not come into contact with the pellicle film 130 and the adhesive layer 104.

繼而,參照圖14~圖17來表示利用所述貼合單元300(貼合腔室310)而進行的貼合處理的流程的一例。 於圖14~圖17中,為了更易於理解貼合處理的流程,省略貼合單元300的構成的一部分及貼合腔室310的構成的一部分的圖示。Next, an example of the flow of the bonding process by the bonding unit 300 (the bonding chamber 310) will be described with reference to FIGS. 14 to 17 . In FIGS. 14 to 17 , in order to make it easier to understand the flow of the bonding process, a part of the configuration of the bonding unit 300 and a part of the configuration of the bonding chamber 310 are omitted.

首先,如圖14所示,將原版250及防塵薄膜組件200分別搬入貼合腔室310內。 繼而,如圖14及圖15所示,將排氣管312A及排氣管312B分別連接於防塵薄膜組件200的防塵薄膜組件框100的通孔24A及通孔24B(箭頭J1及箭頭J2)。該連接的詳細情況如上所述。First, as shown in FIG. 14, the master 250 and the pellicle assembly 200 are respectively carried into the bonding chamber 310. Then, as shown in FIGS. 14 and 15, the exhaust pipe 312A and the exhaust pipe 312B are respectively connected to the through hole 24A and the through hole 24B (arrow J1 and arrow J2) of the pellicle frame 100 of the pellicle film assembly 200. The details of this connection are as described above.

繼而,進行防塵薄膜組件200與原版250的對準(位置對準)調整。 繼而,如圖16所示,經由排氣管312A及排氣管312B、以及防塵薄膜組件框100的通孔,對防塵薄膜組件框100的溝槽22的內部進行排氣(減壓)。該排氣(減壓)是藉由與各排氣管的貼合腔室310外的端部連接的排氣部件(例如真空汞)而進行。藉由該排氣,如已參照圖6進行說明般,使吸合力F(即,壓合力)於防塵薄膜組件200與原版250之間發揮作用,從而進行兩者的貼合。 藉此,可於儘量避免接觸防塵薄膜的膜面的情況下貼合防塵薄膜組件200與原版250。Then, alignment (position alignment) adjustment of the pellicle assembly 200 with the original plate 250 is performed. Then, as shown in FIG. 16, the inside of the groove 22 of the pellicle frame 100 is exhausted (decompressed) via the exhaust pipe 312A, the exhaust pipe 312B, and the through hole of the pellicle frame 100. The exhaust (decompression) is performed by an exhaust member (for example, vacuum mercury) connected to an end portion of the exhaust pipe that is outside the bonding chamber 310. By this exhaust gas, as described with reference to Fig. 6, the suction force F (i.e., the pressing force) acts between the pellicle film assembly 200 and the original plate 250 to bond the two. Thereby, the pellicle film assembly 200 and the original plate 250 can be bonded together while avoiding contact with the film surface of the pellicle film as much as possible.

繼而,如圖17所示,經由第1導入管322而將氣體導入貼合腔室310內。經導入的氣體藉由氣體分散構件324而分散於貼合腔室310內。此時,較佳為以氣體至少不與防塵薄膜130的中央部分碰觸的方式而分散氣體(參照箭頭G1)。 藉由氣體向貼合腔室310內的導入,貼合腔室310內經加壓,從而配置有防塵薄膜組件及原版的貼合腔室310內的整體的環境的壓力與溝槽22內部的壓力之差(差壓)增大。因該差壓而所述力F變強,防塵薄膜組件200與原版250彼此更強烈地進行推壓。再者,圖17中省略圖示,但除利用第1導入管322來進行氣體的導入(加壓)以外,亦可利用第2導入管來進行氣體的導入(加壓)。Then, as shown in FIG. 17, the gas is introduced into the bonding chamber 310 via the first introduction pipe 322. The introduced gas is dispersed in the bonding chamber 310 by the gas dispersion member 324. At this time, it is preferable to disperse the gas so that the gas does not at least touch the central portion of the pellicle film 130 (see an arrow G1). By the introduction of the gas into the bonding chamber 310, the bonding chamber 310 is pressurized, thereby arranging the pressure of the entire environment in the pellicle film assembly and the bonding chamber 310 of the original plate and the pressure inside the groove 22. The difference (differential pressure) increases. Due to the differential pressure, the force F becomes strong, and the pellicle assembly 200 and the original plate 250 are pressed more strongly with each other. In addition, although illustration is abbreviate|omitted in FIG. 17, in addition to the introduction of the gas (pressurization) by the 1st introduction tube 322, the introduction of the gas (pressurization) can also be performed by the 2nd introduction tube.

以由貼合腔室310內的整體壓力與溝槽內部的壓力之差(差壓)而產生的、防塵薄膜組件與原版之間的壓合力F(對防塵薄膜組件框整體施加的力)成為所述較佳範圍內(例如,2 N左右)的方式,來調整所述加壓及所述減壓的程度。 例如,以貼合腔室310內的壓力成為例如0.15 MPa左右的方式進行調整。The pressing force F (the force applied to the entire dustproof film assembly frame) between the pellicle film assembly and the original plate, which is caused by the difference between the overall pressure in the bonding chamber 310 and the pressure inside the groove (differential pressure), becomes Within the preferred range (e.g., about 2 N), the degree of pressurization and the reduced pressure is adjusted. For example, the pressure in the bonding chamber 310 is adjusted to, for example, about 0.15 MPa.

(防塵薄膜組件安裝裝置的具體例) 本實施方式的防塵薄膜組件安裝裝置可為僅包含貼合單元(例如所述貼合單元300)的裝置,但亦可為具備貼合單元與其他單元的裝置。 圖18為本實施方式的防塵薄膜組件安裝裝置的一例,且為具備貼合單元與其他單元的防塵薄膜組件安裝裝置的概略構成圖。(Specific example of the pellicle assembly mounting device) The pellicle assembly mounting device according to the present embodiment may be a device including only a bonding unit (for example, the bonding unit 300), but may be provided with a bonding unit and other units. Device. 18 is a schematic configuration diagram of a pellicle assembly mounting device including a bonding unit and another unit, which is an example of the pellicle assembly mounting device of the embodiment.

如圖18所示,防塵薄膜組件安裝裝置600具備:作為搬運部件的搬運機器人400、原版裝載器610、防塵薄膜組件裝載器620、所述貼合單元300、檢查單元650、以及卸載器630。As shown in FIG. 18, the pellicle assembly mounting apparatus 600 includes a conveyance robot 400 as a conveyance member, a master loader 610, a pellicle assembly loader 620, the bonding unit 300, an inspection unit 650, and an unloader 630.

搬運機器人400為用以將原材料(防塵薄膜組件及原版)及製造物(附防塵薄膜組件的原版(曝光原版))搬運至各單元(包含各裝載器、卸載器。以下相同)的搬運部件。The transport robot 400 is a transport member for transporting a material (a pellicle film and a master) and an article of manufacture (an original plate (exposure original) with a pellicle film assembly) to each unit (including the respective loaders and unloaders, the same applies hereinafter).

當然,原版裝載器610及防塵薄膜組件裝載器620分別為安置(set)有原版250及防塵薄膜組件200的單元。Of course, the original loader 610 and the pellicle assembly loader 620 are respectively units in which the original plate 250 and the pellicle assembly 200 are placed.

關於貼合單元300如上所述。 貼合單元300較佳為具備對與防塵薄膜構件貼合前的防塵薄膜組件框構件的防塵薄膜組件框的形狀進行測定的第1測定部件。 作為此處所述的防塵薄膜組件框的形狀,可列舉所述長邊方向的長度L1、所述短邊方向的長度L2(以上,參照圖1)、防塵薄膜組件框的正交度等。 另外,作為第1測定部件,可列舉具有對防塵薄膜組件框的形狀進行測定的功能的所述感測器340。另外,於貼合單元300內,亦可設置對與防塵薄膜組件框的接觸進行檢測的部件作為第1測定部件。The bonding unit 300 is as described above. The bonding unit 300 preferably includes a first measuring member that measures the shape of the pellicle frame of the pellicle frame member before bonding with the pellicle member. The shape of the pellicle frame as described herein may be, for example, the length L1 in the longitudinal direction, the length L2 in the short-side direction (see FIG. 1 above), the degree of orthogonality of the pellicle frame, and the like. Further, the first measuring member includes the sensor 340 having a function of measuring the shape of the pellicle frame. Further, in the bonding unit 300, a member that detects contact with the pellicle frame may be provided as the first measuring member.

另外,貼合單元300較佳為具備於貼合防塵薄膜組件與原版之前,進行防塵薄膜組件與原版的對準(位置對準)的對準部件。作為對準部件,如上所述可列舉:被設置成可沿水平方向(X方向、Y方向及q方向)移動的原版支持構件、原版殼體支持構件。 另外,於防塵薄膜組件安裝裝置600中,亦可輔助性地併用具有水平方向的位置調整功能的搬運機器人400的機械手臂作為對準部件。Further, it is preferable that the bonding unit 300 is provided with an alignment member that performs alignment (position alignment) of the pellicle film assembly and the original plate before bonding the pellicle film assembly and the original plate. As the alignment member, as described above, a master support member and a master case support member which are provided to be movable in the horizontal direction (X direction, Y direction, and q direction) can be cited. Further, in the pellicle assembly mounting device 600, a robot arm of the transfer robot 400 having a position adjustment function in the horizontal direction may be used in an auxiliary manner as an alignment member.

檢查單元650為對貼合後的防塵薄膜組件及原版進行外觀檢查的單元。 作為外觀檢查,可列舉:附著於防塵薄膜組件及原版的至少一者的異物的檢測、防塵薄膜組件框的形狀測定、防塵薄膜組件與原版的位置對準測定等。 檢查單元650尤佳為具備對與原版貼合後的防塵薄膜組件的防塵薄膜組件框的形狀進行測定的第2測定部件。 作為第2測定部件的例子,可列舉與第1測定部件相同的例子。The inspection unit 650 is a unit that performs visual inspection of the bonded pellicle and the original. Examples of the visual inspection include detection of foreign matter adhering to at least one of the pellicle and the original plate, measurement of the shape of the pellicle frame, and measurement of the position of the pellicle and the original plate. The inspection unit 650 is preferably a second measurement member that measures the shape of the pellicle frame of the pellicle that is bonded to the original. Examples of the second measuring member include the same examples as the first measuring member.

卸載器630為收容最終製造的附防塵薄膜組件的原版(曝光原版)的單元。The unloader 630 is a unit that houses the original (exposed original) of the finally manufactured pellicle-attached film assembly.

防塵薄膜組件安裝裝置600進而具備控制部件660。 控制部件660為基於貼合前的防塵薄膜組件框的形狀的測定結果(藉由第1測定部件的測定結果)與貼合後的防塵薄膜組件框的形狀的測定結果(藉由第2測定部件的測定結果),對藉由對準部件的對準進行前饋控制(FF(feedforward)控制)的控制部件。 其中,亦可省略控制部件660。The pellicle assembly mounting device 600 further includes a control member 660. The control member 660 is a measurement result based on the shape of the pellicle frame before bonding (the measurement result by the first measuring member) and the measurement result of the shape of the pellicle frame after bonding (by the second measuring member) The measurement result) is a control unit that performs feedforward control (FF (feedforward) control) by alignment of the alignment members. However, the control unit 660 may be omitted.

防塵薄膜組件安裝裝置600進而具備算出部件670。 算出部件670為基於貼合前的防塵薄膜組件框的形狀的測定結果(藉由第1測定部件的測定結果)與貼合後的防塵薄膜組件框的形狀的測定結果(藉由第2測定部件的測定結果),來算出藉由貼合單元中的貼合而引起的防塵薄膜組件框的應變量的算出部件。該算出部件670進而亦具備基於所述應變量而對連通構件314所引起的防塵薄膜組件框100的推入量進行前饋控制(FF控制)的功能。 其中,亦可省略算出部件670。The pellicle assembly mounting device 600 further includes a calculation member 670. The calculation member 670 is a measurement result based on the shape of the pellicle frame before bonding (the measurement result by the first measurement member) and the measurement result of the shape of the pellicle frame after bonding (by the second measurement member) The measurement result) is a calculation means for calculating the amount of strain of the pellicle frame by the bonding in the bonding unit. The calculation unit 670 further includes a function of performing feedforward control (FF control) on the amount of pushing of the pellicle frame 100 by the communication member 314 based on the strain amount. However, the calculation unit 670 may be omitted.

另外,防塵薄膜組件安裝裝置600雖具備所述各單元,但亦可適當省略除貼合單元300以外的單元。 即,除貼合單元300以外的單元亦可作為獨立於具備貼合單元300的防塵薄膜組件安裝裝置的裝置而設置。Further, although the pellicle assembly mounting apparatus 600 includes the above-described units, the units other than the bonding unit 300 may be omitted as appropriate. That is, the unit other than the bonding unit 300 may be provided as a device that is independent of the pellicle assembly mounting device including the bonding unit 300.

另外,防塵薄膜組件安裝裝置600亦可具備所述各單元以外的其他單元。 例如,於防塵薄膜組件安裝裝置600安置附剝離襯墊的防塵薄膜組件(例如,所述的具備剝離襯墊106的防塵薄膜組件201)的情況下,亦可具備剝離襯墊剝離單元。 另外,於防塵薄膜組件安裝裝置600安置未設置有與原版的接著用的接著劑層的防塵薄膜組件(例如,所述的自防塵薄膜組件200去除了接著劑層104的防塵薄膜組件)的情況下,亦可具備用以形成與原版的接著用的接著劑層的接著劑層形成單元(接著劑塗佈單元)。Further, the pellicle assembly mounting device 600 may be provided with other units than the respective units. For example, when a pellicle having a release liner (for example, the pellicle assembly 201 having the release liner 106) is attached to the pellicle assembly mounting device 600, a release liner peeling unit may be provided. In addition, in the pellicle assembly mounting device 600, a pellicle assembly that is not provided with an adhesive layer for subsequent use of the original plate (for example, the pellicle assembly from which the self-adhesive film member 200 is removed) is disposed. Next, an adhesive layer forming unit (adhesive coating unit) for forming an adhesive layer for subsequent use with the original may be provided.

另外,本實施方式中的防塵薄膜組件安裝裝置亦可具備使各構件(防塵薄膜組件及原版)上下反轉的反轉機構。 另外,EUV原版(例如,原版250)通常利用被稱為EUV遮罩盒的容器來進行保管或輸送等。而且,於裝設防塵薄膜組件之前,將EUV遮罩盒拆開而取出原版。作為所述的原版殼體260,可使用EUV遮罩盒中的內部遮罩盒的罩構件。 另外,使EUV遮罩盒反轉或者拆開的操作亦可於安裝防塵薄膜組件時的任一時間點實施。Further, the pellicle assembly mounting device according to the present embodiment may include an inversion mechanism that reverses each member (the pellicle assembly and the original plate) upside down. In addition, the EUV original (for example, the original 250) is usually stored or transported by a container called an EUV mask. Moreover, before installing the pellicle, the EUV mask is taken apart and the original is taken out. As the original housing 260, a cover member of an inner hood in an EUV mask can be used. In addition, the operation of reversing or disassembling the EUV mask can be performed at any time when the pellicle is mounted.

(利用防塵薄膜組件安裝裝置600的防塵薄膜組件裝設流程的一例) 繼而,參照圖19來表示利用防塵薄膜組件安裝裝置的防塵薄膜組件裝設流程(即,將防塵薄膜組件裝設於原版的裝設流程)的一例。防塵薄膜組件裝設流程亦可稱為附防塵薄膜組件的原版的製造流程。 再者,於圖19的各步驟中,由虛線所圍成的步驟(步驟702、步驟706、步驟708)是指於該一例中可省略的步驟。(An example of the flow of the pellicle assembly by the pellicle assembly mounting device 600) Next, the pellicle assembly mounting process using the pellicle assembly mounting device will be described with reference to Fig. 19 (i.e., the pellicle assembly is mounted on the original plate). An example of the installation process). The process of installing the pellicle film assembly may also be referred to as the manufacturing process of the original plate with the pellicle film assembly. Furthermore, in each step of FIG. 19, the steps (step 702, step 706, step 708) surrounded by broken lines refer to steps that can be omitted in this example.

如圖19所示,首先,作為步驟700,將防塵薄膜組件安置於防塵薄膜組件裝載器,且將原版安置於原版裝載器。繼而,藉由機器人搬運,來將防塵薄膜組件及原版分別搬入貼合腔室內。 繼而,作為步驟702,於貼合腔室內,藉由第1測定部件來測定防塵薄膜組件的防塵薄膜組件框的形狀(貼合前的形狀)。 繼而,作為步驟704,於貼合腔室內,藉由對準部件來進行防塵薄膜組件與原版的對準。繼而,於貼合腔室內進行防塵薄膜組件與原版的貼合。 繼而,作為步驟706,將防塵薄膜組件及原版搬運至外觀檢查單元,於外觀檢查單元中,藉由第2測定部件來測定防塵薄膜組件框的形狀(貼合後的形狀)。 此處,視需要基於藉由第1測定部件的測定結果及藉由第2測定部件的測定結果,來進行步驟704中的對準部件的前饋控制(以下,亦稱為「FF1(對準修正)」)。FF1(對準修正)是藉由控制部件660來進行。As shown in Fig. 19, first, as a step 700, the pellicle assembly is placed on the pellicle assembly loader, and the master is placed on the original loader. Then, the pellicle and the original plate are respectively carried into the bonding chamber by robot transportation. Then, as a step 702, the shape (the shape before bonding) of the pellicle frame of the pellicle is measured by the first measuring member in the bonding chamber. Then, in step 704, the alignment of the pellicle assembly with the original is performed by the alignment member in the bonding chamber. Then, the pellicle assembly is bonded to the original in the bonding chamber. Then, in step 706, the pellicle and the original plate are transported to the visual inspection unit, and in the visual inspection unit, the shape of the pellicle frame (the shape after bonding) is measured by the second measuring member. Here, the feedforward control of the alignment member in step 704 is performed based on the measurement result by the first measurement member and the measurement result by the second measurement member as needed (hereinafter, also referred to as "FF1 (alignment) Correct))). FF1 (alignment correction) is performed by the control unit 660.

繼而,作為步驟708,基於藉由第1測定部件的測定結果及藉由第2測定部件的測定結果,來算出藉由貼合而引起的防塵薄膜組件框的應變量。應變量的算出是藉由算出部件670來進行。 此處,視需要基於所算出的應變量,而對步驟704的貼合處理中連通構件314所引起的防塵薄膜組件框100的推入量進行前饋控制(以下,亦稱為「FF2(應變修正)」)。於該一例中,FF2(應變修正)亦是藉由算出部件670來進行。然而,作為變形例,亦可獨立於算出應變量的算出部件而設置進行FF2(應變修正)的控制部件。Then, in step 708, the strain amount of the pellicle frame by the bonding is calculated based on the measurement result by the first measuring member and the measurement result by the second measuring member. The calculation of the dependent variable is performed by the calculation unit 670. Here, the feed-in control of the pellicle frame 100 caused by the communication member 314 in the bonding process of the step 704 is performed based on the calculated strain amount (hereinafter, also referred to as "FF2 (strain). Correct))). In this example, FF2 (strain correction) is also performed by the calculation unit 670. However, as a modification, a control member that performs FF2 (strain correction) may be provided independently of the calculation means for calculating the strain amount.

繼而,作為步驟710,將防塵薄膜組件及原版(即,附防塵薄膜組件的原版(曝光原版))搬運至卸載器並加以收納。Then, as a step 710, the pellicle film assembly and the original plate (that is, the original plate (exposure original plate) with the pellicle film assembly) are conveyed to the unloader and stored.

以上,示出了利用防塵薄膜組件安裝裝置的防塵薄膜組件裝設流程的一例,但本實施方式並不限定於該一例。 例如,如上所述,於防塵薄膜組件安裝裝置600中,亦可省略控制部件660及算出部件670。即,亦可手動進行FF1(對準修正)及FF2(應變修正),來代替藉由控制部件的自動進行。 另外,於防塵薄膜組件安裝裝置600中,控制部件660與算出部件670亦可為同一控制部件。即,亦可藉由一個控制部件來進行FF1(對準修正)、應變量的算出、及FF2(應變修正)。 若進一步而言,如上所述,本實施方式的防塵薄膜組件安裝裝置亦可為僅包含貼合單元的裝置。即,藉由僅進行步驟704中的貼合處理,便可於儘量避免接觸防塵薄膜的情況下貼合防塵薄膜組件及原版,從而將防塵薄膜組件裝設於原版。Although an example of the flow of the pellicle assembly installation using the pellicle assembly mounting apparatus has been described above, the present embodiment is not limited to this example. For example, as described above, in the pellicle assembly mounting device 600, the control member 660 and the calculation member 670 may be omitted. That is, FF1 (alignment correction) and FF2 (strain correction) can be manually performed instead of being automatically performed by the control unit. Further, in the pellicle assembly mounting device 600, the control member 660 and the calculation member 670 may be the same control member. That is, FF1 (alignment correction), calculation of the strain amount, and FF2 (strain correction) can be performed by one control unit. Further, as described above, the pellicle assembly mounting device of the present embodiment may be a device including only the bonding unit. In other words, by merely performing the bonding process in step 704, the pellicle film assembly and the original plate can be bonded together while avoiding contact with the pellicle film, thereby attaching the pellicle film assembly to the original plate.

(具備附防塵薄膜組件的原版(曝光原版)的曝光裝置的具體例) 藉由本實施方式而製造的附防塵薄膜組件的原版(曝光原版)是於曝光裝置內使用。 圖20是具備藉由本實施方式而製造的附防塵薄膜組件的原版的一例的曝光裝置的一例、即EUV曝光裝置800的概略截面圖。 如圖20所示,EUV曝光裝置800具備:放射EUV光的光源831、作為本實施方式的曝光原版的一例的曝光原版850、及將自光源831放射的EUV光導向曝光原版850的照明光學系統837。 曝光原版850具備包含防塵薄膜812及防塵薄膜組件框814的防塵薄膜組件810、及原版833(EUV遮罩)。該曝光原版850是以自光源831放射的EUV光透過防塵薄膜812而向原版833照射的方式而配置。 原版833是將所照射的EUV光以圖案狀反射者。(Specific Example of Exposure Apparatus Providing Original Plate (Exposure Original) Attaching PSA Module) The original plate (exposure original plate) with the pellicle film assembly manufactured by the present embodiment is used in an exposure apparatus. FIG. 20 is a schematic cross-sectional view of an EUV exposure apparatus 800 which is an example of an exposure apparatus including an example of a master of the pellicle film assembly manufactured by the present embodiment. As shown in FIG. 20, the EUV exposure apparatus 800 includes a light source 831 that emits EUV light, an exposure master 850 that is an example of an exposure master of the present embodiment, and an illumination optical system that guides EUV light emitted from the light source 831 to the exposure master 850. 837. The exposure master 850 includes a pellicle film 810 including a pellicle film 812 and a pellicle frame 814, and a master 833 (EUV mask). The exposure original plate 850 is disposed such that EUV light emitted from the light source 831 passes through the pellicle film 812 and is irradiated onto the original plate 833. The original 833 is a person who reflects the irradiated EUV light in a pattern.

防塵薄膜組件810與所述的防塵薄膜組件200相對應。 防塵薄膜812與所述的防塵薄膜130相對應。 防塵薄膜組件框814與所述的支持基板122、所述的接著劑層102、所述的防塵薄膜組件框100、及所述的接著劑層104的複合體相對應。The pellicle assembly 810 corresponds to the pellicle assembly 200. The pellicle film 812 corresponds to the pellicle film 130 described above. The pellicle frame 814 corresponds to the composite of the support substrate 122, the adhesive layer 102, the pellicle frame 100, and the adhesive layer 104 described above.

於EUV曝光裝置800中,在光源831與照明光學系統837之間、及照明光學系統837與原版833之間分別設置有濾波窗(filter window)820及濾波窗825。 另外,EUV曝光裝置800具備將原版833反射的EUV光導向感應基板834的投影光學系統838。In the EUV exposure apparatus 800, a filter window 820 and a filter window 825 are provided between the light source 831 and the illumination optical system 837, and between the illumination optical system 837 and the original 833, respectively. Further, the EUV exposure apparatus 800 includes a projection optical system 838 that guides the EUV light reflected by the original 833 to the sensing substrate 834.

於EUV曝光裝置800中,由原版833所反射的EUV光經由投影光學系統838被導向感應基板834上,而將感應基板834曝光為圖案狀。再者,利用EUV進行的曝光是於減壓條件下進行。In the EUV exposure apparatus 800, the EUV light reflected by the original 833 is guided onto the sensing substrate 834 via the projection optical system 838, and the sensing substrate 834 is exposed in a pattern. Further, the exposure by EUV was carried out under reduced pressure.

EUV光源831朝向照明光學系統837而放射EUV光。 於EUV光源831中包含靶材、及脈衝雷射照射部等。藉由將脈衝雷射照射至該靶材而使之產生電漿,可獲得EUV。若將靶材設為Xe,則可獲得波長13 nm~14 nm的EUV。EUV光源發出的光的波長並不限於13 nm~14 nm,只要為波長5 nm~30 nm的範圍內的適合目的的波長的光即可。The EUV light source 831 emits EUV light toward the illumination optical system 837. The EUV light source 831 includes a target, a pulsed laser irradiation unit, and the like. EUV can be obtained by irradiating a pulsed laser onto the target to produce a plasma. When the target is set to Xe, EUV having a wavelength of 13 nm to 14 nm can be obtained. The wavelength of the light emitted by the EUV light source is not limited to 13 nm to 14 nm, and may be any suitable wavelength of light in the range of 5 nm to 30 nm.

照明光學系統837對自EUV光源831照射的光進行集光,將照度均一化而向原版833照射。 於照明光學系統837中包含用以調整EUV的光路的多片多層膜反射鏡832、及光耦合器(光學積分器(optical integrator))等。多層膜反射鏡是交替積層鉬(Mo)、矽(Si)而成的多層膜等。The illumination optical system 837 collects light irradiated from the EUV light source 831, and uniformizes the illuminance to illuminate the original 833. The illumination optical system 837 includes a plurality of multilayer film mirrors 832 for adjusting the optical path of the EUV, an optical coupler (optical integrator), and the like. The multilayer film mirror is a multilayer film in which molybdenum (Mo) or bismuth (Si) is alternately laminated.

濾波窗820、濾波窗825的裝設方法並無特別限制,可列舉經由接著劑等貼附的方法、或機械固定於EUV曝光裝置內的方法等。 配置於光源831與照明光學系統837之間的濾波窗820捕捉自光源產生的飛散粒子(碎屑(debris)),以避免飛散粒子(碎屑)附著於照明光學系統837內部的元件(例如多層膜反射鏡832)。 另一方面,配置於照明光學系統837與原版833之間的濾波窗825捕捉自光源831側飛散的粒子(碎屑),以避免飛散粒子(碎屑)附著於原版833。The method of installing the filter window 820 and the filter window 825 is not particularly limited, and examples thereof include a method of attaching via an adhesive or the like, or a method of mechanically fixing the same in an EUV exposure apparatus. A filter window 820 disposed between the light source 831 and the illumination optics 837 captures scattered particles (debris) generated from the light source to prevent scattered particles (debris) from adhering to components within the illumination optics 837 (eg, multiple layers) Membrane mirror 832). On the other hand, the filter window 825 disposed between the illumination optical system 837 and the original 833 captures particles (debris) scattered from the side of the light source 831 to prevent scattered particles (debris) from adhering to the original 833.

另外,由於附著於原版的異物會吸收EUV光、或使EUV光發生散射,故而會對晶圓引起解析不良。因此,防塵薄膜組件810是以覆蓋原版833的EUV照射區的方式裝設。EUV光透過防塵薄膜812而向原版833照射。Further, since foreign matter adhering to the original plate absorbs EUV light or scatters EUV light, the wafer is poorly analyzed. Therefore, the pellicle assembly 810 is installed in such a manner as to cover the EUV irradiation area of the original 833. The EUV light is irradiated to the original 833 through the pellicle film 812.

由原版833所反射的EUV光透過防塵薄膜812,並經由投影光學系統838而向感應基板834照射。 投影光學系統838對由原版833所反射的光進行集光,而向感應基板834照射。於投影光學系統838中包含用以製備EUV的光路的多片多層膜反射鏡835、多層膜反射鏡836等。The EUV light reflected by the original 833 passes through the pellicle film 812 and is irradiated to the sensing substrate 834 via the projection optical system 838. The projection optical system 838 collects light reflected by the original 833 and irradiates the sensing substrate 834. A plurality of multilayer film mirrors 835, a multilayer film mirror 836, and the like for preparing an optical path of the EUV are included in the projection optical system 838.

感應基板834是於半導體晶圓上塗佈有抗蝕劑的基板等,藉由由原版833所反射的EUV,抗蝕劑被曝光為圖案狀。藉由將該抗蝕劑顯影,並對半導體晶圓進行蝕刻,而於半導體晶圓形成所需的圖案。The sensing substrate 834 is a substrate or the like on which a resist is applied on a semiconductor wafer, and the resist is exposed in a pattern shape by EUV reflected by the original plate 833. The desired pattern is formed on the semiconductor wafer by developing the resist and etching the semiconductor wafer.

將於2014年5月27日提出申請的日本專利申請案2014-109482所揭示的所有內容以參照的方式併入至本說明書中。 關於本說明書中記載的所有文獻、專利申請案、及技術標準,是與以下情況同樣地以參照的方式併入至本說明書中,所述情況為具體且分別記載將各文獻、專利申請案、及技術標準以參照的方式併入的情況。All of the contents disclosed in Japanese Patent Application No. 2014-109482, filed on May 27, 2014, is hereby incorporated by reference. All the documents, patent applications, and technical standards described in the present specification are incorporated into the present specification in the same manner as the following, which is specific and separately describes each document, patent application, And the case where technical standards are incorporated by reference.

10‧‧‧一端面
12、22、22A、22B、22C、22D‧‧‧溝槽
14A、14B、24A、24B、26A、26B、26C、26D、124B‧‧‧通孔
20‧‧‧另一端面
30‧‧‧外周面
40‧‧‧內周面
50‧‧‧開口部
100、101、103、814‧‧‧防塵薄膜組件框
102、104‧‧‧接著劑層
106‧‧‧剝離襯墊
110‧‧‧防塵薄膜組件框構件
120‧‧‧防塵薄膜構件
122‧‧‧支持基板
130、812‧‧‧防塵薄膜
200、201、810‧‧‧防塵薄膜組件
250‧‧‧原版
252‧‧‧前表面(光照射面)
254‧‧‧背面
260‧‧‧原版殼體
262、362‧‧‧凸起
300‧‧‧貼合單元
310‧‧‧貼合腔室
312A、312B‧‧‧排氣管
314、316‧‧‧連通構件
322‧‧‧第1導入管
324‧‧‧氣體分散構件
326‧‧‧第2導入管
330‧‧‧原版支持構件
332‧‧‧原版殼體支持構件(載置板)
334‧‧‧載置板
336、337‧‧‧原版支持構件
340‧‧‧感測器
400‧‧‧搬運機器人
600‧‧‧防塵薄膜組件安裝裝置
610‧‧‧原版裝載器
620‧‧‧防塵薄膜組件裝載器
630‧‧‧卸載器
650‧‧‧檢查單元
660‧‧‧控制部件
670‧‧‧算出部件
700~710‧‧‧步驟
800‧‧‧EUV曝光裝置
820、825‧‧‧濾波窗
831‧‧‧光源
832、835、836‧‧‧多層膜反射鏡
833‧‧‧原版(EUV遮罩)
834‧‧‧感應基板
837‧‧‧照明光學系統
838‧‧‧投影光學系統
850‧‧‧曝光原版
E1、E2、G1、J1、J2、J12‧‧‧箭頭
F‧‧‧吸合力(壓合力)
L1‧‧‧防塵薄膜組件框100的長邊方向的長度
L2‧‧‧防塵薄膜組件框100的短邊方向的長度
t‧‧‧防塵薄膜組件框的厚度
W‧‧‧防塵薄膜組件框100的框寬
10‧‧‧One end
12, 22, 22A, 22B, 22C, 22D‧‧‧ trenches
14A, 14B, 24A, 24B, 26A, 26B, 26C, 26D, 124B‧‧‧ through holes
20‧‧‧Other end face
30‧‧‧ outer perimeter
40‧‧‧ inner circumference
50‧‧‧ openings
100, 101, 103, 814‧‧‧Plastic membrane module frame
102, 104‧‧‧ adhesive layer
106‧‧‧Release liner
110‧‧‧Plastic membrane module frame member
120‧‧‧Dust film components
122‧‧‧Support substrate
130, 812‧‧‧Dust film
200, 201, 810‧‧‧Plastic membrane components
250‧‧‧ original
252‧‧‧ front surface (lighted surface)
254‧‧‧Back
260‧‧‧ original shell
262, 362‧‧ ‧ raised
300‧‧‧Finishing unit
310‧‧‧Fitting chamber
312A, 312B‧‧‧ exhaust pipe
314, 316‧‧‧Connected components
322‧‧‧1st introduction tube
324‧‧‧Gas dispersing members
326‧‧‧2nd introduction tube
330‧‧‧Original support components
332‧‧‧Original shell support member (mounting plate)
334‧‧‧Loading board
336, 337‧‧‧ original support components
340‧‧‧ sensor
400‧‧‧Handling robot
600‧‧‧Pneumatic film assembly mounting device
610‧‧‧Original loader
620‧‧‧Dust film assembly loader
630‧‧‧ Unloader
650‧‧‧Check unit
660‧‧‧Control components
670‧‧‧ Calculated parts
700-710‧‧‧Steps
800‧‧‧EUV exposure device
820, 825‧‧‧ filter window
831‧‧‧Light source
832, 835, 836‧‧‧ multilayer film mirror
833‧‧‧ original (EUV mask)
834‧‧‧Induction substrate
837‧‧‧Lighting optical system
838‧‧‧Projection optical system
850‧‧‧Expo original
E1, E2, G1, J1, J2, J12‧‧‧ arrows
F‧‧‧ suction force (compression force)
L1‧‧‧ Length of the long-side direction of the pellicle frame 100
L2‧‧‧ Length of the short-side direction of the pellicle frame 100
t‧‧‧Thickness of the pellicle frame
W‧‧‧Frame width of the pellicle frame 100

圖1是自可觀察到厚度方向的一端面的方向觀察本實施方式中的防塵薄膜組件框的一例的概略立體圖。 圖2是自可觀察到厚度方向的另一端面的方向觀察圖1所示的防塵薄膜組件框的概略立體圖。 圖3是圖1的A-A線截面圖。 圖4是自可觀察到厚度方向的另一端面的方向觀察本實施方式中的防塵薄膜組件框的變形例的概略立體圖。 圖5是表示本實施方式中防塵薄膜組件的一例的概略截面圖。 圖6是表示本實施方式的防塵薄膜組件安裝裝置中的貼合單元的一例的概略構成圖。 圖7是表示本實施方式的防塵薄膜組件安裝裝置中的貼合單元的一例的概略截面圖。 圖8是概念性地表示於本實施方式的一例中,排氣管的其中一個與防塵薄膜組件框的通孔連接的形態的部分截面圖。 圖9是概念性地表示於本實施方式的變形例中,排氣管的其中一個與防塵薄膜組件框的通孔連接的形態的部分截面圖。 圖10是表示於本實施方式的變形例中,對貼合腔室內的原版進行支持的機構的概略截面圖。 圖11是表示於本實施方式的變形例中,對貼合腔室內的原版進行支持的機構的概略截面圖。 圖12是表示於本實施方式的變形例中,對貼合腔室內的原版進行支持的機構的概略截面圖。 圖13是表示於本實施方式的變形例中,對貼合腔室內的原版進行支持的機構的概略截面圖。 圖14是表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖15是表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖16是表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖17是表示本實施方式的一例中的貼合處理的流程的概略步驟圖。 圖18是表示本實施方式的防塵薄膜組件安裝裝置的一例的概略構成圖。 圖19是表示利用本實施方式的一例中的防塵薄膜組件安裝裝置,而將防塵薄膜組件裝設於原版的裝設流程的一例的流程圖。 圖20為具備藉由本實施方式而製造的曝光原版的曝光裝置的一例,即EUV曝光裝置的概略截面圖。FIG. 1 is a schematic perspective view showing an example of a pellicle frame in the present embodiment as seen from a direction in which one end surface in the thickness direction is observed. Fig. 2 is a schematic perspective view of the pellicle frame shown in Fig. 1 as seen from the direction in which the other end face in the thickness direction is observed. Fig. 3 is a cross-sectional view taken along line A-A of Fig. 1; FIG. 4 is a schematic perspective view showing a modification of the pellicle frame of the present embodiment as seen from the direction of the other end surface in the thickness direction. Fig. 5 is a schematic cross-sectional view showing an example of a pellicle according to the embodiment. FIG. 6 is a schematic configuration diagram showing an example of a bonding unit in the pellicle assembly mounting apparatus according to the embodiment. FIG. 7 is a schematic cross-sectional view showing an example of a bonding unit in the pellicle assembly mounting apparatus according to the embodiment. FIG. 8 is a partial cross-sectional view conceptually showing an example in which one of the exhaust pipes is connected to a through hole of the pellicle frame in the example of the embodiment. Fig. 9 is a partial cross-sectional view conceptually showing a state in which one of the exhaust pipes is connected to a through hole of the pellicle frame in the modification of the embodiment. FIG. 10 is a schematic cross-sectional view showing a mechanism for supporting an original plate in a bonding chamber in a modification of the embodiment. FIG. 11 is a schematic cross-sectional view showing a mechanism for supporting an original plate in a bonding chamber in a modification of the embodiment. FIG. 12 is a schematic cross-sectional view showing a mechanism for supporting an original plate in a bonding chamber in a modification of the embodiment. FIG. 13 is a schematic cross-sectional view showing a mechanism for supporting the original plate in the bonding chamber in a modification of the embodiment. FIG. 14 is a schematic flow chart showing the flow of the bonding process in the example of the embodiment. FIG. 15 is a schematic flowchart showing the flow of the bonding process in the example of the embodiment. FIG. 16 is a schematic flowchart showing the flow of the bonding process in the example of the embodiment. 17 is a schematic flow chart showing the flow of the bonding process in the example of the embodiment. FIG. 18 is a schematic configuration diagram showing an example of a pellicle assembly mounting device according to the present embodiment. FIG. 19 is a flowchart showing an example of a flow of installation of the pellicle assembly in the original plate by the pellicle assembly mounting device in the example of the embodiment. FIG. 20 is a schematic cross-sectional view showing an example of an exposure apparatus including an exposure master manufactured by the present embodiment, that is, an EUV exposure apparatus.

22‧‧‧溝槽 22‧‧‧ trench

24A、24B‧‧‧通孔 24A, 24B‧‧‧through holes

100‧‧‧防塵薄膜組件框 100‧‧‧Plastic membrane module frame

102、104‧‧‧接著劑層 102, 104‧‧‧ adhesive layer

122‧‧‧支持基板 122‧‧‧Support substrate

130‧‧‧防塵薄膜 130‧‧‧Plastic film

200‧‧‧防塵薄膜組件 200‧‧‧Pneumatic film assembly

250‧‧‧原版 250‧‧‧ original

252‧‧‧前表面(光照射面) 252‧‧‧ front surface (lighted surface)

254‧‧‧背面 254‧‧‧Back

300‧‧‧貼合單元 300‧‧‧Finishing unit

310‧‧‧貼合腔室 310‧‧‧Fitting chamber

E1、E2‧‧‧箭頭 E1, E2‧‧‧ arrows

F‧‧‧吸合力(壓合力) F‧‧‧ suction force (compression force)

Claims (13)

一種防塵薄膜組件安裝裝置,其具備貼合單元,所述貼合單元包含: 貼合腔室,用來對防塵薄膜組件與具有曝光光可照射的光照射面的原版進行貼合,所述防塵薄膜組件包含防塵薄膜及防塵薄膜組件框,所述防塵薄膜組件框於厚度方向的一端面之側支持所述防塵薄膜,且具有設置於厚度方向的另一端面的溝槽及貫通外周面與所述溝槽的壁面之間的通孔;及 排氣管,用以在所述防塵薄膜組件及所述原版以所述防塵薄膜組件框的所述另一端面與所述光照射面相對向的方式配置於所述貼合腔室內的狀態下,經由所述防塵薄膜組件框的所述通孔而對所述溝槽的內部進行排氣。A pellicle assembly mounting device comprising a bonding unit, the bonding unit comprising: a bonding chamber for bonding a pellicle film and an original plate having a light irradiation surface that can be irradiated with exposure light, the dustproof The film assembly includes a dustproof film and a pellicle frame, the pellicle frame supporting the pellicle on the side of one end face in the thickness direction, and having a groove disposed on the other end surface in the thickness direction and a through-peripheral surface a through hole between the wall surfaces of the groove; and an exhaust pipe for opposing the light-irradiating surface on the other end surface of the pellicle frame and the original plate The inside of the groove is exhausted through the through hole of the pellicle frame in a state in which the method is disposed in the bonding chamber. 如申請專利範圍第1項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含用以將氣體導入所述貼合腔室內而對所述貼合腔室內進行加壓的導入管。The pellicle assembly mounting device according to claim 1, wherein the bonding unit includes an introduction tube for introducing a gas into the bonding chamber to pressurize the bonding chamber. 如申請專利範圍第2項所述的防塵薄膜組件安裝裝置,其中所述導入管包含第1導入管,所述第1導入管自與所述貼合腔室內所配置的所述防塵薄膜組件及所述原版中的所述防塵薄膜組件相對向之側導入氣體, 所述貼合單元進而包含氣體分散構件, 所述氣體分散構件用以使自所述第1導入管導入的氣體分散。The pellicle assembly mounting device according to the second aspect of the invention, wherein the introduction tube includes a first introduction tube, and the first introduction tube is configured from the pellicle assembly disposed in the bonding chamber and The pellicle film in the original plate introduces gas to the side, and the bonding unit further includes a gas dispersing member for dispersing a gas introduced from the first introduction pipe. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通。The pellicle assembly mounting device according to any one of claims 1 to 3, wherein the bonding unit includes a communication member in the fitting chamber and the exhaust One end of the tube is connected, and the exhaust pipe is communicated with the through hole of the pellicle frame. 如申請專利範圍第4項所述的防塵薄膜組件安裝裝置,其中所述連通構件被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動。The pellicle assembly mounting device according to claim 4, wherein the communication member is provided to be movable in a direction of being pushed into an outer peripheral surface of the pellicle frame. 如申請專利範圍第4項所述的防塵薄膜組件安裝裝置,其中所述連通構件具有可插入至所述通孔的開口端。The pellicle assembly mounting device of claim 4, wherein the communication member has an open end insertable into the through hole. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含原版支持構件,所述原版支持構件在所述貼合腔室內支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部。The pellicle assembly mounting device according to any one of claims 1 to 3, wherein the bonding unit includes a master supporting member, and the master supporting member supports and houses in the fitting chamber The light-irradiating surface of the original plate is a peripheral end portion of the surface on the opposite side and at least a part of the outer peripheral surface of the original plate, and a central portion of the surface on the opposite side is not supported. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件安裝裝置,其中所述原版被收容在原版殼體而被搬入所述貼合腔室內,所述原版殼體具有使所述原版的光照射面露出的開口部,且支持與所述原版的光照射面為相反側的面的周端部及所述原版的外周面的至少一部分、不支持所述相反側的面的中央部, 所述貼合單元包含原版殼體支持構件,所述原版殼體支持構件在所述貼合腔室內對收容所述原版的所述原版殼體進行支持。The pellicle assembly mounting device according to any one of claims 1 to 3, wherein the original plate is housed in a master casing and carried into the fitting chamber, the original casing having An opening that exposes the light-irradiating surface of the original plate, and supports at least a part of a peripheral end portion of a surface opposite to the light-irradiating surface of the original plate and an outer peripheral surface of the original plate, and does not support the opposite side In the central portion of the surface, the bonding unit includes a master housing supporting member that supports the master housing that houses the original plate in the bonding chamber. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件安裝裝置,其進而具備對所述貼合後的所述防塵薄膜組件及所述原版進行外觀檢查的檢查單元。The pellicle assembly mounting device according to any one of the first to third aspects of the present invention, further comprising an inspection unit that performs an appearance inspection on the bonded pellicle assembly and the original plate. 如申請專利範圍第1項至第3項中任一項所述的防塵薄膜組件安裝裝置,其具備: 第1測定部件,對與所述原版貼合前的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定;及 第2測定部件,對與所述原版貼合後的所述防塵薄膜組件的所述防塵薄膜組件框的形狀進行測定。The pellicle assembly mounting device according to any one of the first to third aspect of the invention, further comprising: a first measuring member that is dust-proofing the pellicle assembly before bonding with the original plate The shape of the film module frame is measured; and the second measuring member measures the shape of the pellicle frame of the pellicle film bonded to the original plate. 如申請專利範圍第10項所述的防塵薄膜組件安裝裝置,其具備: 對準部件,於貼合所述原版與所述防塵薄膜組件之前,進行所述原版與所述防塵薄膜組件的對準;及 控制部件,基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果,對利用所述對準部件的對準進行前饋控制。The pellicle assembly mounting device according to claim 10, further comprising: an alignment member that performs alignment of the original plate and the pellicle assembly before bonding the original plate and the pellicle assembly And a control member based on the measurement result of the shape of the pellicle frame before the bonding and the measurement result of the shape of the pellicle frame after the bonding, and the use of the alignment member Alignment for feedforward control. 如申請專利範圍第10項所述的防塵薄膜組件安裝裝置,其具備算出部件,所述算出部件基於所述貼合前的所述防塵薄膜組件框的形狀的測定結果與所述貼合後的所述防塵薄膜組件框的形狀的測定結果之差,來算出藉由所述貼合而引起的所述防塵薄膜組件框的應變量。The pellicle assembly mounting device according to claim 10, further comprising: a calculation member that is based on a measurement result of a shape of the pellicle frame before the bonding and the bonded portion The amount of measurement of the shape of the pellicle frame is determined by the difference between the measurement results of the pellicle frame. 如申請專利範圍第12項所述的防塵薄膜組件安裝裝置,其中所述貼合單元包含連通構件,所述連通構件在所述貼合腔室內與所述排氣管的一端連接、且使所述排氣管與所述防塵薄膜組件框的所述通孔連通,並被設置成可朝推入所述防塵薄膜組件框的外周面的方向移動,且 所述算出部件為基於所述應變量而對所述連通構件所引起的所述防塵薄膜組件框的推入量進行前饋控制的控制部件。The pellicle assembly mounting device of claim 12, wherein the bonding unit includes a communication member that is connected to one end of the exhaust pipe in the bonding chamber, and is The exhaust pipe communicates with the through hole of the pellicle frame, and is disposed to be movable in a direction of pushing into an outer peripheral surface of the pellicle frame, and the calculating component is based on the strain amount And a control member that performs feedforward control on the amount of pushing of the pellicle frame caused by the communicating member.
TW104116495A 2014-05-27 2015-05-22 Pellicle mount apparatus TWI656399B (en)

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