TW201547011A - Optical sensor and method for manufacturing the same - Google Patents

Optical sensor and method for manufacturing the same Download PDF

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Publication number
TW201547011A
TW201547011A TW103120480A TW103120480A TW201547011A TW 201547011 A TW201547011 A TW 201547011A TW 103120480 A TW103120480 A TW 103120480A TW 103120480 A TW103120480 A TW 103120480A TW 201547011 A TW201547011 A TW 201547011A
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Taiwan
Prior art keywords
substrate
light
item
manufacturing
grooves
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TW103120480A
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Chinese (zh)
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TWI634648B (en
Inventor
Kuan-Chin Kao
Ming-Jing Lee
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Everlight Electronics Co Ltd
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Publication of TWI634648B publication Critical patent/TWI634648B/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/93Batch processes
    • H01L2224/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L2224/97Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Abstract

An optical sensor is provided, which includes a substrate, an enclosure structure, a light emitting chip, a light receiving chip and an encapsulating body. The substrate has a surface on which a recess is formed; the enclosure structure is disposed around the substrate and forms a closed space on the surface, and the enclosure structure has a blocking wall sunk into the recess. The light emitting and receiving chips are disposed on the surface of the substrate and electrically connected with the substrate, and the light emitting and receiving chips locate at both sides of the blocking wall. The encapsulating body covers the light emitting and receiving chips. A method for manufacturing optical sensor is provided to manufacture the above optical sensor. Therefore, the optical sensor can have an enclosure structure which is easily fabricated and has a good bonding force.

Description

光感測器及其製造方法Light sensor and manufacturing method thereof 【0001】【0001】

本發明有關一種感測器及其製造方法,特別關於一種光感測器及其製造方法。The present invention relates to a sensor and a method of fabricating the same, and more particularly to a photosensor and a method of fabricating the same.

【0002】【0002】

習知的光感測器至少包含一光發射元件及一光接收元件,該光發射元件可向外發射光線,若該發射之光線撞擊到偵測物而反射時,該光接收元件可接收該反射光線並使光感測器輸出一感測訊號。The conventional light sensor includes at least one light emitting element and a light receiving element, and the light emitting element can emit light outward, and the light receiving element can receive the light when the emitted light hits the detecting object and is reflected. The light is reflected and the light sensor outputs a sensing signal.

【0003】[0003]

為了使光發射元件所發射出之光線不會直接傳遞至光接收元件,習知的光感測器另包含一金屬外殼。該金屬外殼覆蓋該光發射及光接收元件,且將該光發射元件及該光接收元件相間隔開;如此,金屬外殼可阻擋光發射元件所發射出之光線直接地傳遞至光接收元件,藉此增加光感測器的感測可靠度。In order to prevent the light emitted from the light-emitting element from being directly transmitted to the light-receiving element, the conventional photo sensor further includes a metal casing. The metal casing covers the light emitting and light receiving component, and the light emitting component and the light receiving component are spaced apart; thus, the metal casing can block the light emitted by the light emitting component from being directly transmitted to the light receiving component. This increases the sensing reliability of the light sensor.

【0004】[0004]

然而,該金屬外殼較難適用於體積較小的光感測器中,因為金屬外殼不易製造成小尺寸者;易言之,金屬外殼若需製作成小尺寸者時,金屬外殼的製造成本會較高,而製造精度亦較難控制。此外,小尺寸的金屬外殼與光發射器的其他部分之間的結合力亦會較差,造成光發射器較難組裝;若使用黏膠來增加結合力時,該黏膠亦不易塗佈在小尺寸的金屬外殼上。However, the metal casing is difficult to apply to a small-sized photosensor because the metal casing is not easily manufactured into a small size; in other words, if the metal casing needs to be made into a small size, the manufacturing cost of the metal casing will be Higher, and manufacturing accuracy is more difficult to control. In addition, the bonding force between the small-sized metal casing and other parts of the light emitter is also poor, which makes the light emitter difficult to assemble; if the adhesive is used to increase the bonding force, the adhesive is not easily coated on the small Size on the metal casing.

【0005】[0005]

另一方面,在組裝金屬外殼至光發射器中的時候,僅能一次組裝一個金屬外殼至一個光發射器中,無法同時組裝多個金屬外殼至多個光發射器中,造成組裝時間增加。On the other hand, when assembling the metal casing into the light emitter, only one metal casing can be assembled to one light emitter at a time, and it is impossible to assemble a plurality of metal casings into a plurality of light emitters at the same time, resulting in an increase in assembly time.

【0006】[0006]

有鑑於此,如何改善至少一種上述缺失,乃為此業界待解決的問題。In view of this, how to improve at least one of the above-mentioned shortcomings is a problem to be solved in the industry.

【0007】【0007】

本發明之一目的在於提供一種光感測器及其製造方法,其解決的技術問題至少為:「使光感測器易於製造,進而使製造成本降低」。An object of the present invention is to provide a photosensor and a method of manufacturing the same, which solves at least the technical problem of "making the photosensor easy to manufacture and further reducing the manufacturing cost".

【0008】[0008]

為達上述目的,本發明所揭露的光感測器包含:一基板,具有一表面,且在該表面上形成有一凹槽;一圍牆結構,設置於該基板的周圍並在該表面上形成一封閉空間,該圍牆結構具有一擋牆嵌入至該凹槽中;一光發射晶片,設置於該基板的該表面上,與該基板電性連接,且位於該擋牆的一側;一光接收晶片,設置於該基板的該表面上,與該基板電性連接,且位於該擋牆的另一側;以及一封膠體,覆蓋該光發射晶片及該光接收晶片。To achieve the above objective, the optical sensor disclosed in the present invention comprises: a substrate having a surface, and a recess is formed on the surface; a wall structure disposed around the substrate and forming a surface on the surface a closed space, the wall structure has a retaining wall embedded in the recess; a light emitting chip disposed on the surface of the substrate, electrically connected to the substrate, and located at one side of the retaining wall; a light receiving The wafer is disposed on the surface of the substrate, electrically connected to the substrate, and located on the other side of the retaining wall; and a gel covering the light emitting chip and the light receiving wafer.

【0009】【0009】

為達上述目的,本發明所揭露的光感測器的製造方法包含:提供一基板;形成多個凹槽於該基板的一表面上;形成多個圍牆結構於該基板的該表面上,各該圍牆結構具有一擋牆,各該擋牆嵌入至各該凹槽中;設置多個光發射晶片於該基板的該表面上,並電性連接該些光發射晶片與該基板,其中各該光發射晶片位於各該擋牆的一側;設置多個光接收晶片於該基板的該表面上,並電性連接該些光發射晶片與該基板,其中各該光接收晶片位於各該擋牆的另一側;形成一封膠體於該基板上,以覆蓋該些光發射晶片及該些光接收晶片;以及切割該基板,以形成該光感測器。In order to achieve the above object, a method for manufacturing a photosensor according to the present invention includes: providing a substrate; forming a plurality of grooves on a surface of the substrate; forming a plurality of surrounding structures on the surface of the substrate, each The wall structure has a retaining wall, and each of the retaining walls is embedded in each of the recesses; a plurality of light-emitting wafers are disposed on the surface of the substrate, and the light-emitting wafers and the substrate are electrically connected to each other. a light emitting chip is disposed on one side of each of the retaining walls; a plurality of light receiving wafers are disposed on the surface of the substrate, and the light emitting wafers are electrically connected to the substrate, wherein each of the light receiving wafers is located at each of the retaining walls The other side; forming a gel on the substrate to cover the light-emitting wafers and the light-receiving wafers; and cutting the substrate to form the photo sensor.

【0010】[0010]

為讓上述目的、技術特徵及優點能更明顯易懂,下文係以較佳之實施例配合所附圖式進行詳細說明。The above objects, technical features and advantages will be more apparent from the following description.

【0059】[0059]

1、2、3‧‧‧光感測器
10‧‧‧基板
11‧‧‧表面
12‧‧‧凹槽
20、20’‧‧‧圍牆結構
21‧‧‧擋牆
211‧‧‧露出部
212‧‧‧嵌入部
22‧‧‧側牆
23‧‧‧遮光蓋體
231‧‧‧開口
30‧‧‧光發射晶片、晶片
40‧‧‧光接收晶片、晶片
50、50’‧‧‧封膠體
51‧‧‧透鏡部
52、53‧‧‧凹槽
60、60’‧‧‧遮光蓋體
61‧‧‧開口
S801~S813、S901~S911‧‧‧步驟
1, 2, 3‧ ‧ light sensor
10‧‧‧Substrate
11‧‧‧ surface
12‧‧‧ Groove
20, 20'‧‧‧ wall structure
21‧‧‧Retaining wall
211‧‧‧Exposed Department
212‧‧‧ embedded department
22‧‧‧ Side wall
23‧‧‧Lighting cover
231‧‧‧ openings
30‧‧‧Light emitting wafers, wafers
40‧‧‧Light receiving wafers, wafers
50, 50'‧‧‧ Sealant
51‧‧‧Lens Department
52, 53‧‧‧ Groove
60, 60'‧‧‧ opaque cover
61‧‧‧ openings
S801~S813, S901~S911‧‧‧ steps

【0011】[0011]

第1圖為依據本發明之第一實施例之光感測器之俯視圖。
第2圖為依據本發明之第一實施例之光感測器之剖視圖。
第3圖為依據本發明之第一實施例之光感測器之俯視圖(遮光蓋體未示)。
第4圖為依據本發明之第二實施例之光感測器之剖視圖。
第5圖為依據本發明之第二實施例之光感測器之俯視圖。
第6圖為依據本發明之第二實施例之光感測器之立體圖。
第7圖為依據本發明之第三實施例之光感測器之剖視圖。
第8A圖至第8H圖為依據本發明之第四較佳實施例之光感測器之製造方法之步驟示意圖。
第9A圖至第9G圖為依據本發明之第五較佳實施例之光感測器之製造方法之步驟示意圖。
Figure 1 is a plan view of a photosensor according to a first embodiment of the present invention.
Fig. 2 is a cross-sectional view showing a photosensor according to a first embodiment of the present invention.
Fig. 3 is a plan view of a photosensor according to a first embodiment of the present invention (a light-shielding cover is not shown).
Figure 4 is a cross-sectional view of a photosensor in accordance with a second embodiment of the present invention.
Fig. 5 is a plan view of a photo sensor according to a second embodiment of the present invention.
Figure 6 is a perspective view of a photosensor according to a second embodiment of the present invention.
Figure 7 is a cross-sectional view showing a photosensor according to a third embodiment of the present invention.
8A to 8H are schematic diagrams showing the steps of a method of manufacturing a photosensor according to a fourth preferred embodiment of the present invention.
9A to 9G are schematic diagrams showing the steps of a method of manufacturing a photosensor according to a fifth preferred embodiment of the present invention.

【0012】[0012]

請參閱第1圖至第3圖,其為依據本發明之第一較佳實施例之光感測器之俯視圖及剖視圖。於第一實施例中,一光感測器1被揭露,而該光感測器1可包含一基板10、一圍牆結構20、一光發射晶片30、一光接收晶片40及一封膠體50。上述元件特徵將依序說明如下。Please refer to FIG. 1 to FIG. 3, which are top and cross-sectional views of a photosensor according to a first preferred embodiment of the present invention. In the first embodiment, a photo sensor 1 is disclosed, and the photo sensor 1 can include a substrate 10, a wall structure 20, a light emitting chip 30, a light receiving chip 40, and a gel 50. . The above component features will be described below in order.

【0013】[0013]

該基板10用以承載其他元件,且可具有傳遞電流訊號之功能,故其可具有電路結構、接點等(圖未示)。在結構上,該基板10具有一表面11及一凹槽12,該表面11可為上表面,而在該表面11上形成該凹槽12;該凹槽12的深度較佳地可大於等於(≧)該基板10之厚度的二分之一,以增加後述的擋牆21的遮光效果。The substrate 10 is used to carry other components and can have the function of transmitting current signals, so it can have a circuit structure, contacts, etc. (not shown). Structurally, the substrate 10 has a surface 11 and a groove 12, and the surface 11 can be an upper surface, and the groove 12 is formed on the surface 11; the depth of the groove 12 can preferably be greater than or equal to ( ≧) One-half of the thickness of the substrate 10 to increase the light-shielding effect of the retaining wall 21 to be described later.

【0014】[0014]

該圍牆結構20設置於該基板10的周圍,即該圍牆結構20沿著基板10之周圍而設置、並非集中於基板10之中央處。該圍牆結構20可在基板10之表面11上形成一封閉空間(或稱一限制空間),以定義出該光發射晶片30及該光接收晶片40在表面11上的設置區域。The wall structure 20 is disposed around the substrate 10, that is, the wall structure 20 is disposed along the periphery of the substrate 10, and is not concentrated at the center of the substrate 10. The wall structure 20 can form a closed space (or a confined space) on the surface 11 of the substrate 10 to define a set area of the light-emitting wafer 30 and the light-receiving wafer 40 on the surface 11.

【0015】[0015]

在材料上,該圍牆結構20可由透光材料(例如環氧化合物(epoxy)、塑材(plastic)或矽材(silicon))為基材,然後添加不透光之染料,使整體成為不透光者。易言之,該圍牆結構20包括一光阻隔膠體。該圍牆結構20可藉由壓模成型(compression molding)、射出成型(injection molding)、點膠(dispensing)或轉移成型(transfer molding)等來形成,具體的說明將於後述的製造方法部分為之。In terms of materials, the wall structure 20 can be made of a light-transmitting material (such as epoxy, plastic or silicon), and then an opaque dye is added to make the whole impervious. Light. In other words, the wall structure 20 includes a light barrier gel. The wall structure 20 can be formed by compression molding, injection molding, dispensing, or transfer molding, and the specific description will be made in a part of the manufacturing method described later. .

【0016】[0016]

在結構上,該圍牆結構20可具有一擋牆21及多個側牆22,該擋牆21嵌入至基板10的凹槽12中,而該些側牆22設置於基板10的表面11上;該些側牆22與擋牆21相連接,以圍繞出該封閉空間。該擋牆21及該側牆22用以阻擋光線穿過其中,而嵌入至基板10之凹槽12中的擋牆21更可使光線難以從擋牆21與基板10之間的空隙中穿過。Structurally, the wall structure 20 can have a retaining wall 21 and a plurality of side walls 22, the retaining wall 21 is embedded in the recess 12 of the substrate 10, and the side walls 22 are disposed on the surface 11 of the substrate 10; The side walls 22 are connected to the retaining wall 21 to surround the enclosed space. The retaining wall 21 and the side wall 22 are for blocking light from passing therethrough, and the retaining wall 21 embedded in the recess 12 of the substrate 10 makes it difficult for light to pass through the gap between the retaining wall 21 and the substrate 10. .

【0017】[0017]

此外,該擋牆21可分為一露出部211及一嵌入部212,該露出部211係位於該表面11上,而該嵌入部212係位於凹槽12中。該嵌入部212之高度與該凹槽12之深度相同,故該嵌入部212之高度較佳地大於等於該基板10之厚度的二分之一;當嵌入部212具有如此的高度時,可有效地阻擋光線穿過。In addition, the retaining wall 21 can be divided into an exposed portion 211 and an embedded portion 212. The exposed portion 211 is located on the surface 11 , and the embedded portion 212 is located in the recess 12 . The height of the embedded portion 212 is the same as the depth of the recess 12, so the height of the embedded portion 212 is preferably greater than or equal to one-half of the thickness of the substrate 10. When the embedded portion 212 has such a height, it can be effective. The ground blocks light from passing through.

【0018】[0018]

另一方面,較佳地,該露出部211可厚於該嵌入部212;換言之,該露出部211之厚度不受限於該凹槽12的寬度。當露出部211之厚度較大時,可增加擋牆21的遮光效果。該擋牆21的最大厚度較佳地可為0.3mm~0.5mm。On the other hand, preferably, the exposed portion 211 may be thicker than the embedded portion 212; in other words, the thickness of the exposed portion 211 is not limited to the width of the recess 12. When the thickness of the exposed portion 211 is large, the light blocking effect of the retaining wall 21 can be increased. The maximum thickness of the retaining wall 21 may preferably be from 0.3 mm to 0.5 mm.

【0019】[0019]

該側牆22的厚度可較小,且可小於該擋牆21的厚度,原因在於:該側牆22係用以阻擋來自外界光線,而外界光線的強度通常較弱,故較薄之側牆22即足以阻擋。The thickness of the side wall 22 can be smaller and can be smaller than the thickness of the retaining wall 21 because the side wall 22 is used to block light from outside, and the intensity of external light is generally weak, so the thin side wall is thin. 22 is enough to block.

【0020】[0020]

該光發射晶片30及該光接收晶片40皆設置於該基板10的該表面11,且皆與該基板10電性地連接(透過打線方式或覆晶方式);該些晶片30及40皆被圍牆結構20圍繞,且該光發射晶片30位於該擋牆21的一側,而該光接收晶片40位於該擋牆21的另一側。該光發射晶片30可受控制而發射一光線(如紅外光),該所發射之光線接觸到一外物而反射時,該光接收晶片40可接收該反射的光線,然後因應產生一感測訊號給基板10傳遞。The light emitting chip 30 and the light receiving chip 40 are disposed on the surface 11 of the substrate 10, and are electrically connected to the substrate 10 (through a wire bonding method or a flip chip method); the wafers 30 and 40 are both The wall structure 20 is surrounded, and the light-emitting wafer 30 is located on one side of the retaining wall 21, and the light-receiving wafer 40 is located on the other side of the retaining wall 21. The light emitting chip 30 can be controlled to emit a light (such as infrared light). When the emitted light is reflected and touched by a foreign object, the light receiving chip 40 can receive the reflected light, and then generate a sensing. The signal is transmitted to the substrate 10.

【0021】[0021]

另說明的是,該些晶片30及40之具體規格(例如功率、光波長範圍等)可依據光感測器1之實際應用情況而選擇不同者。It should be noted that the specific specifications (such as power, optical wavelength range, etc.) of the wafers 30 and 40 may be different depending on the actual application of the photo sensor 1.

【0022】[0022]

該封膠體50亦設置於該基板10的表面11上、被該圍牆結構20圍繞、且覆蓋該光發射晶片30及該光接收晶片40。該封膠體50可保護該些晶片30及40不易受到環境因素影響。The encapsulant 50 is also disposed on the surface 11 of the substrate 10, surrounded by the surrounding structure 20, and covers the light emitting chip 30 and the light receiving wafer 40. The encapsulant 50 protects the wafers 30 and 40 from environmental factors.

【0023】[0023]

在材料上,該封膠體50可由透光材料(例如環氧化合物(epoxy)、塑材(plastic)或矽材(silcon))等為基材,且整體為透光者。易言之,該封膠體50包括一可透光膠體,不會阻擋光線傳遞。該封膠體50可藉由一壓模成型、一射出成型、一點膠或一轉移成型等來形成,具體的說明將於後述的製造方法部分為之。In terms of materials, the encapsulant 50 may be made of a light transmissive material (for example, an epoxy, a plastic, or a silcon), and the whole is a light transmissive. In other words, the encapsulant 50 includes a light transmissive colloid that does not block light transmission. The encapsulant 50 can be formed by a press molding, an injection molding, a point glue or a transfer molding, and the specific description will be made in a part of the manufacturing method to be described later.

【0024】[0024]

藉由上述特徵,光感測器1可藉由光發射晶片30及光接收晶片40來感測一外物是否接近光感測器1,且光感測器1可藉由圍牆結構20來增加本身的感測準確度,亦即圍牆結構20可阻擋非預期的光線被光接收晶片40感測,例如阻擋來自環境的光線、或是阻擋來自光發射晶片30的直接光線。With the above features, the photo sensor 1 can sense whether a foreign object is close to the photo sensor 1 by the light emitting chip 30 and the light receiving chip 40, and the photo sensor 1 can be increased by the wall structure 20 The sensing accuracy of itself, that is, the wall structure 20, can block unintended light from being sensed by the light receiving wafer 40, such as blocking light from the environment, or blocking direct light from the light emitting wafer 30.

【0025】[0025]

此外,本發明之光感測器1可選擇包含一遮光蓋體60,以進一步增加光感測器1的感測準確度。In addition, the photo sensor 1 of the present invention may optionally include a light shielding cover 60 to further increase the sensing accuracy of the photo sensor 1.

【0026】[0026]

具體而言,該遮光蓋體60設置於該圍牆結構20上,且該遮光蓋體60具有多個開口61(本實施例中,該些開口61為兩個,以對應該些晶片30及40的數目)。該些開口61暴露出部分的該封膠體50,且分別位於該些晶片30及40的上方。該光發射晶片30的光線可透過該些開口61的其中之一向外發射,而該光接收晶片40可透過該些開口61的其中另一接收反射自該光發射晶片30的光線。Specifically, the light-shielding cover 60 is disposed on the wall structure 20, and the light-shielding cover 60 has a plurality of openings 61. In the embodiment, the openings 61 are two to correspond to the wafers 30 and 40. Number of). The openings 61 expose a portion of the encapsulant 50 and are located above the wafers 30 and 40, respectively. Light from the light-emitting wafer 30 can be emitted outward through one of the openings 61, and the light-receiving wafer 40 can receive light reflected from the light-emitting wafer 30 through the other of the openings 61.

【0027】[0027]

該遮光蓋體60可由不透光材料所製成,且可藉由印刷製程(printing process)、噴塗或貼片來形成。該貼片係指先將遮光蓋體60獨立製作出,然後再貼固於圍牆結構20上。The light-shielding cover 60 can be made of an opaque material and can be formed by a printing process, spraying or patching. The patch means that the light-shielding cover 60 is separately fabricated and then attached to the wall structure 20.

【0028】[0028]

該遮光蓋體60可限制光線通過的區域,使得特定路徑之反射光線才得以通過遮光蓋體60、然後進入至封膠體50而被該光接收晶片40接收。該特定路徑可對應光感測器1的特定感測範圍,在該特定感測範圍內的外物才得以被光感測器1感測。The light-shielding cover 60 can restrict the area through which the light passes, so that the reflected light of the specific path can be received by the light-receiving wafer 40 through the light-shielding cover 60 and then into the sealant 50. The specific path may correspond to a specific sensing range of the photo sensor 1 , and the foreign object within the specific sensing range is sensed by the photo sensor 1 .

【0029】[0029]

請參閱第4圖至第6圖,其為依據本發明之第二較佳實施例之光感測器之俯視圖、剖視圖及立體圖。於第二實施例中,另一光感測器2被揭露,而該光感測器2如同光感測器1般可包含一基板10、一圍牆結構20、一光發射晶片30、一光接收晶片40及一封膠體50。Please refer to FIG. 4 to FIG. 6 , which are top, cross-sectional and perspective views of a photo sensor according to a second preferred embodiment of the present invention. In the second embodiment, another photo sensor 2 is disclosed, and the photo sensor 2 can include a substrate 10, a wall structure 20, a light emitting chip 30, and a light as the photo sensor 1. The wafer 40 and a gel 50 are received.

【0030】[0030]

不同的是,光感測器2包含另一遮光蓋體60’,該遮光蓋體60’可僅設置於封膠體50上、或延伸地覆蓋至該圍牆結構20上;不論是何種形式,該遮光蓋體60’同樣地具有多個開口61,以限制光線通過的區域。The difference is that the light sensor 2 includes another light shielding cover 60 ′. The light shielding cover 60 ′ can be disposed only on the sealing body 50 or extended to cover the wall structure 20; The light-shielding cover 60' likewise has a plurality of openings 61 to limit the area through which light passes.

【0031】[0031]

請參閱第7圖,其為依據本發明之第三較佳實施例之光感測器之剖視圖。於第三實施例中,又一光感測器3被揭露,而該光感測器3如同光感測器1般可包含一基板10、一光發射晶片30、一光接收晶片40及一封膠體50’。Please refer to FIG. 7, which is a cross-sectional view of a photosensor according to a third preferred embodiment of the present invention. In the third embodiment, a further photo sensor 3 is disclosed, and the photo sensor 3 can include a substrate 10, a light emitting chip 30, a light receiving chip 40 and a light sensor 1 Sealant 50'.

【0032】[0032]

不同的是,光感測器3包含另一圍牆結構20’,該圍牆界夠20’本身具有一遮光蓋體23,即該圍牆結構20’的擋牆21及側牆22與遮光蓋體23為一體成型;此外,該擋牆21具有均一的厚度。另一方面,封膠體50’更具有多個透鏡部51,該些透鏡部51分別設置於該遮光蓋體23的多個開口231中;該些透鏡部51用以匯聚光線,以使光線更易被該光接收晶片40感測。The difference is that the light sensor 3 includes another wall structure 20 ′, which has a light-shielding cover 23 , that is, the retaining wall 21 and the side wall 22 of the wall structure 20 ′ and the light-shielding cover 23 . In one piece, the retaining wall 21 has a uniform thickness. On the other hand, the encapsulant 50' further has a plurality of lens portions 51 respectively disposed in the plurality of openings 231 of the light-shielding cover 23; the lens portions 51 are used to concentrate light to make the light easier. It is sensed by the light receiving wafer 40.

【0033】[0033]

上述段落說明了依據本發明之實施例的光感測器1~3,而從上述段落應可知悉到,光感測器1~3的圍牆結構20(20’)可直接形成於基板10上(即圍牆結構20並非是預先製作出,然後才組裝至基板10上),因此圍牆結構20與基板10之間的結合性可較佳,且可省略圍牆結構20與基板10的組裝步驟;此外,藉由壓模或射出成型來形成圍牆結構20時,圍牆結構20的尺寸較易控制。The above paragraphs illustrate the photosensors 1 to 3 according to an embodiment of the present invention, and it should be understood from the above paragraph that the wall structure 20 (20') of the photo sensors 1 to 3 can be directly formed on the substrate 10. (that is, the wall structure 20 is not pre-made and then assembled onto the substrate 10), so the bonding between the wall structure 20 and the substrate 10 is better, and the assembly steps of the wall structure 20 and the substrate 10 can be omitted; When the wall structure 20 is formed by compression molding or injection molding, the size of the wall structure 20 is relatively easy to control.

【0034】[0034]

請參閱第8A圖至第8H圖,其為依據本發明之第四較佳實施例之光感測器之製造方法之步驟示意圖。於第四實施例中,一光感測器之製造方法(以下簡稱為製造方法)被揭露,該製造方法可製造出一個或多個如上述光感測器1及2般的光感測器,因此該製造方法的技術內容與光感測器1及2的技術內容可相互參考。該製造方法可包括以下步驟:Please refer to FIG. 8A to FIG. 8H, which are schematic diagrams showing the steps of a method for manufacturing a photosensor according to a fourth preferred embodiment of the present invention. In the fourth embodiment, a method of manufacturing a photosensor (hereinafter simply referred to as a manufacturing method) is disclosed, which can manufacture one or more photosensors such as the photosensors 1 and 2 described above. Therefore, the technical content of the manufacturing method and the technical contents of the photo sensors 1 and 2 can be referred to each other. The manufacturing method can include the following steps:

【0035】[0035]

如第8A圖及第8B圖所示,於步驟S801及步驟S803中,先提供一基板10,然後形成多個凹槽12於該基板10的一表面11上。該些凹槽12可藉由一切割製程來形成,且在切割出該些凹槽12時,該基板10的表面11應是一平面者、沒有被彎曲;因此,在切割該些凹槽12時,該些凹槽12的切割深度可較為一致,且較易控制。As shown in FIGS. 8A and 8B, in step S801 and step S803, a substrate 10 is first provided, and then a plurality of grooves 12 are formed on a surface 11 of the substrate 10. The grooves 12 can be formed by a cutting process, and when the grooves 12 are cut, the surface 11 of the substrate 10 should be a flat surface and not bent; therefore, the grooves 12 are cut. The depth of the grooves 12 can be more consistent and easier to control.

【0036】[0036]

如第8C圖所示,於步驟S805中,接著形成多個圍牆結構20於該基板10的該表面11上,各該圍牆結構20具有一擋牆21,各該擋牆21嵌入至各該凹槽12中。該些圍牆結構20可藉由包括一壓模成型、一射出成型、一點膠或一轉移成型來直接地形成於基板10上,也就是,具有凹槽12之基板10可放置入一模具(圖未示)中,然後圍牆結構20之原料再注入該模具中、然後固化成該圍牆結構20。As shown in FIG. 8C, in step S805, a plurality of wall structures 20 are formed on the surface 11 of the substrate 10. Each of the wall structures 20 has a retaining wall 21, and each of the retaining walls 21 is embedded in each of the recesses. In the slot 12. The wall structure 20 can be directly formed on the substrate 10 by including a press molding, an injection molding, a point glue or a transfer molding, that is, the substrate 10 having the groove 12 can be placed into a mold ( In the drawings, the raw material of the wall structure 20 is then injected into the mold and then solidified into the wall structure 20.

【0037】[0037]

步驟S805可限制於S803後實行,也就是,於該些凹槽12形成於該基板10的該表面11上之後,該些圍牆結構20才被形成於該基板10的該表面11上。Step S805 can be performed after S803 is performed, that is, after the recesses 12 are formed on the surface 11 of the substrate 10, the wall structures 20 are formed on the surface 11 of the substrate 10.

【0038】[0038]

如第8D圖所示,於步驟S807-1中,接著設置多個光發射晶片30及多個光接收晶片40於該基板10的該表面11上,其中各該光發射晶片30位於各該擋牆21的一側,而各該光接收晶片40位於各該擋牆21的另一側。如第8E圖所示,於步驟S807-2中,接著藉由打線方式(亦可藉由覆晶方式),電性連接該些晶片30及40與該基板10。As shown in FIG. 8D, in step S807-1, a plurality of light emitting wafers 30 and a plurality of light receiving wafers 40 are disposed on the surface 11 of the substrate 10, wherein each of the light emitting wafers 30 is located in each of the blocks. One side of the wall 21, and each of the light receiving wafers 40 is located on the other side of each of the retaining walls 21. As shown in FIG. 8E, in step S807-2, the wafers 30 and 40 and the substrate 10 are electrically connected by a wire bonding method (also by flip chip bonding).

【0039】[0039]

步驟S807-1及S807-2通常是在步驟S805之後才執行,然而步驟S807-1及S807-2亦可於步驟S805之前執行,也就是,於該些晶片30及40設置於該基板10的該表面11上之後,該些圍牆結構20才被形成於該基板10的該表面11上。Steps S807-1 and S807-2 are generally performed after step S805. However, steps S807-1 and S807-2 may also be performed before step S805, that is, the wafers 30 and 40 are disposed on the substrate 10. After the surface 11 is formed, the wall structures 20 are formed on the surface 11 of the substrate 10.

【0040】[0040]

如第8F圖所示,於步驟S809中,接著形成一封膠體50於該基板10上,以覆蓋該些光發射晶片30及該些光接收晶片40。該封膠體50可藉由一壓模成型、一射出成型、一點膠或一轉移成型等來形成;若藉由點膠時,封膠體50之原料會通過一或多個噴嘴(圖未標號)而注入至基板10上及該些圍牆結構20之封閉空間中,然後固化成該封膠體50。相較於壓模成型或射出成型,藉由點膠來形成封膠體50時,可不需使用模具。As shown in FIG. 8F, in step S809, a glue 50 is formed on the substrate 10 to cover the light-emitting wafers 30 and the light-receiving wafers 40. The encapsulant 50 can be formed by a compression molding, an injection molding, a bit of glue or a transfer molding; if by dispensing, the raw material of the encapsulant 50 passes through one or more nozzles (not labeled) And injected into the closed space of the substrate 10 and the wall structures 20, and then solidified into the sealant 50. When the encapsulant 50 is formed by dispensing as compared to compression molding or injection molding, it is not necessary to use a mold.

【0041】[0041]

如第8G圖所示,於步驟S811中,接著形成一遮光蓋體60於該圍牆結構20上,並使該遮光蓋體60具有多個開孔61。藉此,該些光發射晶片30的光線分別透過一部分的該些開口61向外發射,而該些光接收晶片40分別透過另一部分的該些開口61接收反射自該些光發射晶片30的光線。該遮光蓋體60可藉由一印刷製程、噴塗或貼片來形成。As shown in FIG. 8G, in step S811, a light shielding cover 60 is formed on the wall structure 20, and the light shielding cover 60 has a plurality of openings 61. Thereby, the light of the light-emitting wafers 30 is emitted outward through a portion of the openings 61, and the light-receiving wafers 40 respectively receive the light reflected from the light-emitting wafers 30 through the openings 61 of the other portion. . The light shielding cover 60 can be formed by a printing process, spraying or patching.

【0042】[0042]

如第8H圖所示,於步驟S813中,最後切割該基板10,以形成一個或多個光感測器1。切割時,刀具會切過該遮光蓋體60、該封膠體50、該些圍牆結構20及該基板10。As shown in FIG. 8H, in step S813, the substrate 10 is finally cut to form one or more photo sensors 1. When cutting, the cutter cuts the light-shielding cover 60, the sealant 50, the wall structure 20, and the substrate 10.

【0043】[0043]

另說明的是,若光感測器1選擇不包括遮光蓋體60時,該步驟S811可省略,而該步驟S813即可於步驟S809後立即執行。In addition, if the photo sensor 1 selects not to include the light-shielding cover 60, the step S811 may be omitted, and the step S813 may be performed immediately after the step S809.

【0044】[0044]

藉此,該製造方法可同時製造出多個具有圍牆結構20的光感測器1或2,且該製造方法可使基板10的凹槽12的切割深度易於控制(即不會使凹槽12的切割深度過大而不慎切斷基板10),此外該製造方法可節省模具的使用數目,以減少製造成本(即封膠體50的形成可不需藉助模具)。Thereby, the manufacturing method can simultaneously manufacture a plurality of photo sensors 1 or 2 having the wall structure 20, and the manufacturing method can make the cutting depth of the groove 12 of the substrate 10 easy to control (ie, does not make the groove 12 The cutting depth is too large and the substrate 10 is inadvertently cut. In addition, the manufacturing method can save the number of molds used to reduce the manufacturing cost (i.e., the formation of the sealant 50 can be performed without the aid of a mold).

【0045】[0045]

請參閱第9A圖至第9G圖,其為依據本發明之第五較佳實施例之光感測器之製造方法之步驟示意圖。於第五實施例中,另一光感測器之製造方法(以下簡稱為另一製造方法)被揭露,該另一製造方法可製造出一個或多個如上述光感測器3般的光感測器,因此該另一製造方法的技術內容與光感測器3的技術內容可相互參考;該另一製造方法與前述的該製造方法的技術內容亦可相互參考。該另一製造方法可包括以下步驟:Please refer to FIGS. 9A to 9G, which are schematic diagrams showing the steps of a method of manufacturing a photosensor according to a fifth preferred embodiment of the present invention. In the fifth embodiment, another method of manufacturing a photosensor (hereinafter simply referred to as another manufacturing method) is disclosed, which can produce one or more light such as the photosensor 3 described above. The sensor, and thus the technical content of the other manufacturing method and the technical content of the photo sensor 3 can be referred to each other; the technical content of the other manufacturing method and the aforementioned manufacturing method can also be referred to each other. The other manufacturing method can include the following steps:

【0046】[0046]

如第9A圖所示,於步驟S901中,先提供一基板10,該基板10具有一表面11。如第9B圖及第9C圖所示,於步驟S903-1及S903-2中,接著設置多個光發射晶片30及多個光接收晶片40於該基板10的該表面11上,然後藉由打線方式(或覆晶方式),電性連接該些晶片30及40與該基板10。As shown in FIG. 9A, in step S901, a substrate 10 having a surface 11 is provided. As shown in FIGS. 9B and 9C, in steps S903-1 and S903-2, a plurality of light-emitting wafers 30 and a plurality of light-receiving wafers 40 are subsequently disposed on the surface 11 of the substrate 10, and then The wire bonding method (or flip chip method) electrically connects the wafers 30 and 40 and the substrate 10.

【0047】[0047]

如第9D圖所示,於步驟S905中,接著形成一封膠體50’於該基板10上,以覆蓋該些晶片30及40;該封膠體50’可藉由一壓模成型或一射出成型來形成。該封膠體50’具有多個凹槽52,各該凹槽52位於各該光發射晶片30及各該光接收晶片40之間。As shown in FIG. 9D, in step S905, a glue 50' is formed on the substrate 10 to cover the wafers 30 and 40. The sealant 50' can be formed by a compression molding or an injection molding. To form. The encapsulant 50' has a plurality of recesses 52, each of the recesses 52 being located between each of the light-emitting wafers 30 and each of the light-receiving wafers 40.

【0048】[0048]

該些凹槽52可於壓模成型或射出成型時,一併形成於封膠體50’上;該些凹槽52亦可藉由切割製程來形成於封膠體50’上。The recesses 52 may be formed on the encapsulant 50' during compression molding or injection molding. The recesses 52 may also be formed on the encapsulant 50' by a cutting process.

【0049】[0049]

該封膠體50’的形成過程中可能會導致基板10彎曲(原因可能是封膠體50’固化時的收縮、或成型時的壓力),故於封膠體50’形成後,可進行一整平製程,以使彎曲的基板10恢復平整。During the formation of the encapsulant 50', the substrate 10 may be bent (the reason may be the shrinkage of the encapsulant 50' when curing, or the pressure during molding), so that after the encapsulant 50' is formed, a flattening process can be performed. In order to restore the curved substrate 10 to a flat surface.

【0050】[0050]

如第9E圖所示,於步驟S907中,接著,沿著該封膠體50的該些凹槽52,於該基板10的該表面11上形成多個凹槽12;該些凹槽12分別形成於該些凹槽52之下。該些凹槽12可藉由一切割製程來形成,具體而言,一或多個切割刀具會通過該些凹槽52,然後切除基板10的部分材料,以形成該些凹槽12。該些凹槽12與該些凹槽52可具有相同之寬度。As shown in FIG. 9E, in step S907, a plurality of grooves 12 are formed on the surface 11 of the substrate 10 along the grooves 52 of the sealant 50; the grooves 12 are respectively formed. Below the grooves 52. The grooves 12 can be formed by a cutting process. Specifically, one or more cutting tools pass through the grooves 52, and then part of the material of the substrate 10 is cut to form the grooves 12. The grooves 12 and the grooves 52 may have the same width.

【0051】[0051]

另外,在該些凹槽12形成的同時、之前、或之後,可於封膠體50’上形成多個凹槽53,各該凹槽53位於各該兩凹槽52之間。In addition, a plurality of grooves 53 may be formed on the sealant 50' at the same time, before, or after the formation of the grooves 12, and the grooves 53 are located between the two grooves 52.

【0052】[0052]

如第9F圖所示,於步驟S909中,接著形成多個圍牆結構20’於該基板10的該表面11上,各該圍牆結構20’具有一擋牆21,各該擋牆21嵌入至各該凹槽12及各該凹槽52中;各該圍牆結構20’具有多個側牆22,各該側牆22嵌入至各該凹槽53中。As shown in FIG. 9F, in step S909, a plurality of surrounding wall structures 20' are formed on the surface 11 of the substrate 10, and each of the surrounding wall structures 20' has a retaining wall 21, and each of the retaining walls 21 is embedded in each The groove 12 and each of the grooves 52; each of the wall structures 20' has a plurality of side walls 22, and each of the side walls 22 is embedded in each of the grooves 53.

【0053】[0053]

由上述步驟可知,於該封膠體50’形成該基板10上、且覆蓋該些光發射晶片30及該些光接收晶片40之後,該些凹槽12才被形成於該基板10的該表面11上;此外,當該些凹槽12形成後,該些圍牆結構20’才被形成於該基板10的該表面11上。It can be seen from the above steps that after the encapsulant 50' is formed on the substrate 10 and covers the light-emitting wafers 30 and the light-receiving wafers 40, the grooves 12 are formed on the surface 11 of the substrate 10. In addition, the wall structures 20' are formed on the surface 11 of the substrate 10 after the grooves 12 are formed.

【0054】[0054]

於該些圍牆結構20’形成時,可同時形成一遮光蓋體23於各該圍牆結構20’上,並使該遮光蓋體23具有多個開孔231。該遮光蓋體23可與該圍牆結構20’為一體成型。When the wall structures 20' are formed, a light-shielding cover 23 can be simultaneously formed on each of the wall structures 20', and the light-shielding cover 23 has a plurality of openings 231. The light shielding cover 23 can be integrally formed with the wall structure 20'.

【0055】[0055]

如第9G圖所示,於步驟S911中,最後切割該基板10,以形成一個或多個光感測器3。As shown in FIG. 9G, in step S911, the substrate 10 is finally cut to form one or more photo sensors 3.

【0056】[0056]

另說明的是,基板10及其凹槽12亦可以下列步驟來製作(圖未示):先提供二板體,即一上板及一下板;然後,利用鑽孔、切割,或與前述鑽孔或切割相似或同等的方式來形成多個貫穿槽於該上板,而此時該下板未有被形成凹槽或貫穿槽;爾後,結合該上板與該下板(藉由黏膠等固定手段),以形成該基板10;該上板的該些貫穿槽即分別構成該基板的該些凹槽。In addition, the substrate 10 and the recess 12 thereof can also be fabricated by the following steps (not shown): first, a second plate body, that is, an upper plate and a lower plate; then, drilling, cutting, or drilling with the foregoing Holes or cuts are similar or equivalent to form a plurality of through grooves in the upper plate, while the lower plate is not formed with grooves or through grooves; then, the upper plate and the lower plate are combined (by adhesive And fixing means) to form the substrate 10; the through grooves of the upper plate respectively constitute the grooves of the substrate.

【0057】[0057]

綜合上述,本發明之各實施例所揭露的光感測器及其製造方法可具有特點如下:In summary, the photo sensor and the method of manufacturing the same disclosed in various embodiments of the present invention may have the following features:

  1、光感測器可不需外加之金屬外殼來遮光,故光感測器沒有習知金屬外殼所帶來的缺失。1. The light sensor can be shielded without the need of an external metal casing, so the light sensor does not have the defects caused by the conventional metal casing.

  2、光感測器的圍牆結構可有效地阻擋光線穿過,增加感測器的準確度;此外,圍牆結構的擋牆還嵌入至基板中,以進一步增加阻擋光線的效果。2. The wall structure of the light sensor can effectively block the passage of light and increase the accuracy of the sensor; in addition, the retaining wall of the wall structure is embedded in the substrate to further increase the effect of blocking light.

  3、圍牆結構可直接形成於基板上,故不需額外的組裝步驟;此外,圍牆結構與基板之間能有良好的結合力。3. The wall structure can be directly formed on the substrate, so no additional assembly steps are required; in addition, a good bonding force between the wall structure and the substrate can be achieved.

  4、封膠體可不需藉由模具來形成於基板上,因此可節省模具的製造成本。4. The sealant can be formed on the substrate without using a mold, thereby saving the manufacturing cost of the mold.

  5、基板的凹槽在形成前,基板可為平整狀態,故凹槽的形成深度較易控制。5. Before the groove of the substrate is formed, the substrate can be flat, so the formation depth of the groove is easier to control.

  6、遮光蓋體可採用印刷製程來形成,使得遮光蓋體的形成位置及開口尺寸可輕易控制。6. The light-shielding cover body can be formed by a printing process, so that the formation position and the opening size of the light-shielding cover body can be easily controlled.

【0058】[0058]

上述之實施例僅用來例舉本發明之實施態樣,以及闡釋本發明之技術特徵,並非用來限制本發明之保護範疇。任何熟悉此技術者可輕易完成之改變或均等性之安排均屬於本發明所主張之範圍,本發明之權利保護範圍應以申請專利範圍為準。The embodiments described above are only intended to illustrate the embodiments of the present invention, and to explain the technical features of the present invention, and are not intended to limit the scope of protection of the present invention. Any changes or equivalents that can be easily made by those skilled in the art are within the scope of the invention. The scope of the invention should be determined by the scope of the claims.

1‧‧‧光感測器 1‧‧‧Light sensor

10‧‧‧基板 10‧‧‧Substrate

11‧‧‧表面 11‧‧‧ surface

12‧‧‧凹槽 12‧‧‧ Groove

20‧‧‧圍牆結構 20‧‧‧Wall structure

21‧‧‧擋牆 21‧‧‧Retaining wall

211‧‧‧露出部 211‧‧‧Exposed Department

212‧‧‧嵌入部 212‧‧‧ embedded department

22‧‧‧側牆 22‧‧‧ Side wall

30‧‧‧光發射晶片 30‧‧‧Light emitting chip

40‧‧‧光接收晶片 40‧‧‧Light receiving chip

50‧‧‧封膠體 50‧‧‧ Sealant

60‧‧‧遮光蓋體 60‧‧‧Lighting cover

61‧‧‧開口 61‧‧‧ openings

Claims (19)

【第1項】[Item 1] 一種光感測器,包含:
  一基板,具有一表面,且在該表面上形成有一凹槽;
  一圍牆結構,設置於該基板的周圍並在該表面上形成一封閉空間,該圍牆結構具有一擋牆嵌入至該凹槽中;
  一光發射晶片,設置於該基板的該表面上,與該基板電性連接,且位於該擋牆的一側;
  一光接收晶片,設置於該基板的該表面上,與該基板電性連接,且位於該擋牆的另一側;以及
  一封膠體,覆蓋該光發射晶片及該光接收晶片。
A light sensor comprising:
a substrate having a surface and having a groove formed on the surface;
a wall structure disposed around the substrate and forming a closed space on the surface, the wall structure having a retaining wall embedded in the groove;
a light emitting chip disposed on the surface of the substrate, electrically connected to the substrate, and located at one side of the retaining wall;
A light receiving chip is disposed on the surface of the substrate, electrically connected to the substrate, and located on the other side of the retaining wall; and a gel covering the light emitting chip and the light receiving wafer.
【第2項】[Item 2] 如請求項1所述的光感測器,其中,該封膠體包括一可透光膠體,而該圍牆結構包括一光阻隔膠體。The photo sensor of claim 1, wherein the encapsulant comprises a light transmissive colloid, and the wall structure comprises a light blocking colloid. 【第3項】[Item 3] 如請求項1所述的光感測器,更包含一遮光蓋體,設置於該圍牆結構上且具有多個開口,該些開口暴露出部分的該封膠體;該光發射晶片的光線透過該些開口的其中之一向外發射,而該光接收晶片透過該些開口的其中另一接收反射自該光發射晶片的光線。The light sensor of claim 1, further comprising a light shielding cover disposed on the wall structure and having a plurality of openings, the openings exposing a portion of the sealing body; the light of the light emitting chip is transmitted through the One of the openings emits outwardly, and the light receiving wafer transmits light reflected from the light emitting wafer through the other of the openings. 【第4項】[Item 4] 如請求項3所述的光感測器,其中,該遮光蓋體與該圍牆結構係為一體成型。The photo sensor of claim 3, wherein the light shielding cover is integrally formed with the wall structure. 【第5項】[Item 5] 如請求項3所述的光感測器,其中,該圍牆結構的該擋牆的厚度為0.3mm~0.5mm。The photo sensor of claim 3, wherein the retaining wall of the wall structure has a thickness of 0.3 mm to 0.5 mm. 【第6項】[Item 6] 如請求項1所述的光感測器,其中,該基板的該凹槽的深度,係大於等於該基板厚度的二分之一。The photosensor of claim 1, wherein the depth of the groove of the substrate is greater than or equal to one-half of the thickness of the substrate. 【第7項】[Item 7] 如請求項1所述的光感測器,其中,該圍牆結構的該擋牆的位於該表面上的部分,係厚於該擋牆的嵌入該凹槽的部分。The photo sensor according to claim 1, wherein a portion of the retaining wall of the wall structure on the surface is thicker than a portion of the retaining wall in which the recess is embedded. 【第8項】[Item 8] 一種光感測器的製造方法,包含:
  提供一基板;
  形成多個凹槽於該基板的一表面上;
  形成多個圍牆結構於該基板的該表面上,各該圍牆結構具有一擋牆,各該擋牆嵌入至各該凹槽中;
  設置多個光發射晶片於該基板的該表面上,並電性連接該些光發射晶片與該基板,其中各該光發射晶片位於各該擋牆的一側;
  設置多個光接收晶片於該基板的該表面上,並電性連接該些光發射晶片與該基板,其中各該光接收晶片位於各該擋牆的另一側;
  形成一封膠體於該基板上,以覆蓋該些光發射晶片及該些光接收晶片;以及
  切割該基板,以形成該光感測器。
A method of manufacturing a photosensor comprising:
Providing a substrate;
Forming a plurality of grooves on a surface of the substrate;
Forming a plurality of surrounding wall structures on the surface of the substrate, each of the surrounding wall structures having a retaining wall, each of the retaining walls being embedded in each of the grooves;
a plurality of light emitting wafers are disposed on the surface of the substrate, and electrically connected to the light emitting wafers and the substrate, wherein each of the light emitting wafers is located at one side of each of the retaining walls;
a plurality of light receiving wafers are disposed on the surface of the substrate, and electrically connected to the light emitting wafers and the substrate, wherein each of the light receiving wafers is located on the other side of each of the retaining walls;
Forming a gel on the substrate to cover the light-emitting wafers and the light-receiving wafers; and cutting the substrate to form the photo sensor.
【第9項】[Item 9] 如請求項8所述的製造方法,其中,係藉由一切割製程(cuttingprocess)來形成該些凹槽。The manufacturing method according to claim 8, wherein the grooves are formed by a cutting process. 【第10項】[Item 10] 如請求項8所述的製造方法,其中,於該些凹槽形成於該基板的該表面上之後,該些圍牆結構才被形成於該基板的該表面上。The manufacturing method of claim 8, wherein the wall structures are formed on the surface of the substrate after the grooves are formed on the surface of the substrate. 【第11項】[Item 11] 如請求項8所述的製造方法,其中,於該些光發射晶片及該些光接收晶片設置於該基板的該表面上之後,該些圍牆結構才被形成於該基板的該表面上。The manufacturing method of claim 8, wherein the wall structures are formed on the surface of the substrate after the light emitting wafers and the light receiving wafers are disposed on the surface of the substrate. 【第12項】[Item 12] 如請求項8所述的製造方法,其中,該些圍牆結構係藉由包括一壓模成型(compression molding)、一點膠(dispensing)、一轉移成型(transfer molding)或一射出成型(injection molding)來形成。The manufacturing method according to claim 8, wherein the wall structure comprises a compression molding, a dispensing, a transfer molding or an injection molding. ) to form. 【第13項】[Item 13] 如請求項8所述的製造方法,其中,於該封膠體形成該基板上、且覆蓋該些光發射晶片及該些光接收晶片之後,該些凹槽才被形成於該基板的該表面上;當該些凹槽形成後,該些圍牆結構才被形成於該基板的該表面上。The manufacturing method of claim 8, wherein the recesses are formed on the surface of the substrate after the encapsulant is formed on the substrate and after covering the light-emitting wafers and the light-receiving wafers The wall structures are formed on the surface of the substrate when the grooves are formed. 【第14項】[Item 14] 如請求項13所述的製造方法,其中,該封膠體被形成有多個凹槽,而該基板的該些凹槽分別形成於該封膠體的該些凹槽之下。The manufacturing method of claim 13, wherein the encapsulant is formed with a plurality of grooves, and the grooves of the substrate are respectively formed under the grooves of the encapsulant. 【第15項】[Item 15] 如請求項13所述的製造方法,其中,該封膠體係藉由包括一壓模成型(compression molding)、一點膠(dispensing)、一轉移成型(transfer molding)或一射出成型(injection molding)來形成。The manufacturing method according to claim 13, wherein the sealant system comprises a compression molding, a dispensing, a transfer molding or an injection molding. To form. 【第16項】[Item 16] 如請求項8所述的製造方法,其中,該基板的提供及該凹槽的形成係包含:
  提供一上板及一下板;
  形成有多個貫穿槽於該上板;以及
  結合該上板與該下板,以形成該基板;
  其中,該些貫穿槽分別構成該基板的該些凹槽。
The manufacturing method of claim 8, wherein the providing of the substrate and the forming of the groove comprise:
Providing an upper plate and a lower plate;
Forming a plurality of through grooves in the upper plate; and combining the upper plate and the lower plate to form the substrate;
The through grooves respectively constitute the grooves of the substrate.
【第17項】[Item 17] 如請求項8~16任一項所述的製造方法,更包含:
  於切割該基板之前,形成一遮光蓋體於各該圍牆結構上,該遮光蓋體具有多個開孔,該些光發射晶片的光線分別透過一部分的該些開口向外發射,而該些光接收晶片分別透過另一部分的該些開口接收反射自該些光發射晶片的光線。
The manufacturing method according to any one of claims 8 to 16, further comprising:
Before the substrate is cut, a light-shielding cover body is formed on each of the wall structures. The light-shielding cover body has a plurality of openings, and the light of the light-emitting chips is respectively emitted through a part of the openings, and the light is emitted. The receiving wafer receives light reflected from the light emitting wafers through the openings of the other portion.
【第18項】[Item 18] 如請求項17所述的製造方法,其中,該遮光蓋體與該些圍牆結構係為一體成型。The manufacturing method according to claim 17, wherein the light shielding cover and the plurality of wall structures are integrally formed. 【第19項】[Item 19] 如請求項17所述的製造方法,其中該遮光蓋體係藉由一印刷製程(printing process)、噴塗或貼片來形成。The manufacturing method of claim 17, wherein the light-shielding cover system is formed by a printing process, spraying or patching.
TW103120480A 2014-06-13 2014-06-13 Method for manufacturing optical sensor TWI634648B (en)

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