TW201542574A - 前驅化合物及使用其沉積薄膜與非晶矽層的方法 - Google Patents

前驅化合物及使用其沉積薄膜與非晶矽層的方法 Download PDF

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Publication number
TW201542574A
TW201542574A TW104107157A TW104107157A TW201542574A TW 201542574 A TW201542574 A TW 201542574A TW 104107157 A TW104107157 A TW 104107157A TW 104107157 A TW104107157 A TW 104107157A TW 201542574 A TW201542574 A TW 201542574A
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TW
Taiwan
Prior art keywords
precursor compound
group
formula
substrate
layer
Prior art date
Application number
TW104107157A
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English (en)
Chinese (zh)
Inventor
Seung-Woo Shin
Woo-Duck Jung
Sung-Kil Cho
Ho-Min Choi
Wan-Suk Oh
Koon-Woo Lee
Kang-Wook Lee
Hyuk-Lyong Gwon
Seong-Jin Park
Ki-Ho Kim
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Eugene Technology Co Ltd
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Publication date
Application filed by Eugene Technology Co Ltd filed Critical Eugene Technology Co Ltd
Publication of TW201542574A publication Critical patent/TW201542574A/zh

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    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C211/00Compounds containing amino groups bound to a carbon skeleton
    • C07C211/43Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton
    • C07C211/44Compounds containing amino groups bound to a carbon skeleton having amino groups bound to carbon atoms of six-membered aromatic rings of the carbon skeleton having amino groups bound to only one six-membered aromatic ring
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07CACYCLIC OR CARBOCYCLIC COMPOUNDS
    • C07C239/00Compounds containing nitrogen-to-halogen bonds; Hydroxylamino compounds or ethers or esters thereof
    • C07C239/02Compounds containing nitrogen-to-halogen bonds
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/02Silicon compounds
    • C07F7/08Compounds having one or more C—Si linkages
    • C07F7/10Compounds having one or more C—Si linkages containing nitrogen having a Si-N linkage
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/34Nitrides
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Chemical Vapour Deposition (AREA)
TW104107157A 2014-03-18 2015-03-06 前驅化合物及使用其沉積薄膜與非晶矽層的方法 TW201542574A (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020140031754A KR20150108664A (ko) 2014-03-18 2014-03-18 전구체 화합물 및 이를 이용한 박막 증착 방법, 어모퍼스 실리콘막의 증착방법

Publications (1)

Publication Number Publication Date
TW201542574A true TW201542574A (zh) 2015-11-16

Family

ID=54144876

Family Applications (1)

Application Number Title Priority Date Filing Date
TW104107157A TW201542574A (zh) 2014-03-18 2015-03-06 前驅化合物及使用其沉積薄膜與非晶矽層的方法

Country Status (3)

Country Link
KR (1) KR20150108664A (ko)
TW (1) TW201542574A (ko)
WO (1) WO2015141956A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108586514A (zh) * 2017-12-26 2018-09-28 浙江博瑞电子科技有限公司 一种二异丙胺硅烷合成方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7875312B2 (en) * 2006-05-23 2011-01-25 Air Products And Chemicals, Inc. Process for producing silicon oxide films for organoaminosilane precursors
JP4967066B2 (ja) * 2010-04-27 2012-07-04 東京エレクトロン株式会社 アモルファスシリコン膜の成膜方法および成膜装置
US8912353B2 (en) * 2010-06-02 2014-12-16 Air Products And Chemicals, Inc. Organoaminosilane precursors and methods for depositing films comprising same
US8771807B2 (en) * 2011-05-24 2014-07-08 Air Products And Chemicals, Inc. Organoaminosilane precursors and methods for making and using same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108586514A (zh) * 2017-12-26 2018-09-28 浙江博瑞电子科技有限公司 一种二异丙胺硅烷合成方法
CN108586514B (zh) * 2017-12-26 2020-11-10 浙江博瑞电子科技有限公司 一种二异丙胺硅烷合成方法

Also Published As

Publication number Publication date
KR20150108664A (ko) 2015-09-30
WO2015141956A1 (ko) 2015-09-24

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