TW201535881A - Socket mounting constuction and spring member - Google Patents

Socket mounting constuction and spring member Download PDF

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Publication number
TW201535881A
TW201535881A TW103140404A TW103140404A TW201535881A TW 201535881 A TW201535881 A TW 201535881A TW 103140404 A TW103140404 A TW 103140404A TW 103140404 A TW103140404 A TW 103140404A TW 201535881 A TW201535881 A TW 201535881A
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TW
Taiwan
Prior art keywords
hole
substrate
socket
holding member
holes
Prior art date
Application number
TW103140404A
Other languages
Chinese (zh)
Other versions
TWI548159B (en
Inventor
Yoshio Yamada
Yoshihisa Tani
Kohei Hironaka
Takashi Nidaira
Tomohiro Yoneda
Original Assignee
Nhk Spring Co Ltd
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Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of TW201535881A publication Critical patent/TW201535881A/en
Application granted granted Critical
Publication of TWI548159B publication Critical patent/TWI548159B/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2464Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
    • H01R13/2471Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point pin shaped
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70Coupling devices
    • H01R12/71Coupling devices for rigid printing circuits or like structures
    • H01R12/712Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0483Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

This invention provides a socket mounting construction which has a substrate, a holder member, a plurality of supporting members extending from a major surface to be inserted in the through holes of the substrate provided in the holder member and a spring member (plate spring 5) fixed onto the plurality of supporting members in such state to urge the holder member carried by the substrate against the substrate, wherein first through holes (through holes 52a-52d) extend in the direction of the thickness of the supporting member are formed in the spring member, and a fixing part for holding and fixing the supporting member is provided, the fixing part forming a part of the side wall of at least one of the plurality of first through holes.

Description

插座安裝構造及彈簧構件 Socket mounting structure and spring member

本發明是關於半導體積體電路或液晶面板等檢查對象的導通狀態檢查或動作特性檢查時所使用的測試用插座的插座安裝構造、以及該插座安裝構造所使用的彈簧構件。 The present invention relates to a socket mounting structure of a test socket used for an ON state inspection or an operation characteristic inspection of an inspection object such as a semiconductor integrated circuit or a liquid crystal panel, and a spring member used in the socket mounting structure.

以往,在進行半導體積體電路或液晶面板等檢查對象的導通狀態檢查或動作特性檢查時,為了謀求檢查對象與具有輸出檢查用訊號之電路基板的訊號處理裝置之間的電性連接,係使用用來收容複數個接觸探針的測試用插座(以下稱為插座)。伴隨近年來之半導體積體電路及液晶面板的高積體化、微細化的進展,在插座中係藉由使接觸探針間的間距狹小化,而使亦可適用於高積體化、微細化的檢查對象的技術正在進步中。 In the past, when performing an on-state inspection or an operation characteristic inspection of an inspection target such as a semiconductor integrated circuit or a liquid crystal panel, in order to electrically connect the inspection target to a signal processing device having a circuit board that outputs an inspection signal, the system uses A test socket (hereinafter referred to as a socket) for accommodating a plurality of contact probes. With the progress of the integration and miniaturization of the semiconductor integrated circuit and the liquid crystal panel in recent years, the pitch between the contact probes is narrowed in the socket, so that it can be applied to high integration and fineness. The technology of the inspection object is progressing.

以往的插座具有:複數個接觸探針;依照預定的圖案收容並保持複數個接觸探針的探針保持具;以及設在該探針保持具之周圍,用來抑制檢查時與複數個接觸探針接觸的半導體積體電路之位置偏移之發生的保持構 件。插座係藉由將保持構件螺固在訊號處理裝置的電路基板上而被固定,且可與接觸探針電性連接(例如,參照專利文獻1)。 The conventional socket has: a plurality of contact probes; a probe holder for accommodating and holding a plurality of contact probes according to a predetermined pattern; and a periphery of the probe holder for suppressing inspection and a plurality of contact probes Holding structure of the positional deviation of the semiconductor integrated circuit in contact with the needle Pieces. The socket is fixed by screwing the holding member to the circuit board of the signal processing device, and can be electrically connected to the contact probe (for example, refer to Patent Document 1).

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

專利文獻1:日本特開2010-3511號公報 Patent Document 1: Japanese Patent Laid-Open Publication No. 2010-3511

然而,在訊號處理裝置有時會依半導體積體電路的種類設有複數個電路基板。在該情況下,必須依檢查對象的半導體積體電路將上述插座分別安裝在訊號處理裝置(電路基板上)。插座是藉由螺固而固定在基板,因此安裝、拆卸作業所需的時間恐怕相當長。而且,該作業所需的勞力也相當大,因此期望一種可簡單進行插座與電路基板之裝拆的技術。 However, in the signal processing device, a plurality of circuit substrates are sometimes provided depending on the type of the semiconductor integrated circuit. In this case, it is necessary to mount the above-mentioned sockets on the signal processing device (on the circuit board) in accordance with the semiconductor integrated circuit to be inspected. The socket is fixed to the substrate by screwing, so the time required for installation and disassembly operations may be quite long. Moreover, the labor required for this work is also quite large, and therefore a technique for easily attaching and detaching the socket and the circuit board is desired.

本發明是鑑於上述情況而完成者,其目的在於提供一種可簡單進行插座與電路基板之裝拆的插座安裝構造及彈簧構件。 The present invention has been made in view of the above circumstances, and an object thereof is to provide a socket mounting structure and a spring member which can easily attach and detach a socket and a circuit board.

為了解決上述課題並達成目的,本發明之插座安裝構造是將插座安裝於基板的插座安裝構造,該插座具有:以長邊方向的兩端分別與前述基板及被接觸體接觸的複數個接觸探針;依照預定的圖案收容並保持前述複 數個接觸探針的探針保持具;以及設在該探針保持具周圍的保持構件;該插座安裝構造係具備:從前述基板的主面延伸出去,且分別插通在設於前述保持構件的插通孔的複數個支撐構件;以及在將載置於前述基板上的前述保持構件朝前述基板側彈壓的狀態下安裝在前述複數個支撐構件的板狀的彈簧構件,前述彈簧構件形成有朝板厚方向貫穿且可供前述支撐構件插通的第1貫穿孔,並且具有固定部,其係形成複數個前述第1貫穿孔中的至少一個第1貫穿孔之側壁的一部分,以保持並固定前述支撐構件。 In order to solve the above problems and achieve the object, the socket mounting structure of the present invention is a socket mounting structure in which a socket is mounted on a substrate, and the socket has a plurality of contact probes that are in contact with the substrate and the contacted body at both ends in the longitudinal direction. Needle; accommodate and maintain the aforementioned complex in accordance with a predetermined pattern a plurality of probe holders for contacting the probe; and a holding member disposed around the probe holder; the socket mounting structure includes: extending from the main surface of the substrate, and respectively inserted in the holding member a plurality of support members for inserting through holes; and a plate-shaped spring member attached to the plurality of support members in a state in which the holding member placed on the substrate is biased toward the substrate side, and the spring member is formed a first through hole that penetrates the plate thickness direction and is inserted into the support member, and has a fixing portion that forms a part of a side wall of at least one of the plurality of first through holes to hold The aforementioned support member is fixed.

又,本發明之插座安裝構造是在上述發明中,前述彈簧構件具有:形成大致帶狀的基部;以及從前述基部之長邊方向的兩端分別在板面所通過的平面上朝向與前述基部之長邊方向大致垂直的方向延伸,且中央部彎曲成弧狀的兩個臂部,在朝著與前述基部之板面垂直的方向俯視時形成大致C字狀,前述第1貫穿孔是分別設在前述臂部。 Further, in the above-described invention, the spring member has a base portion formed in a substantially strip shape, and both ends of the base portion in the longitudinal direction thereof face the base portion on a plane through which the plate surface passes. The two arm portions that are curved in a substantially vertical direction in the longitudinal direction and that are curved in the center portion are formed in a substantially C-shape when viewed in a direction perpendicular to the plate surface of the base portion, and the first through holes are respectively It is provided in the aforementioned arm.

又,本發明之插座安裝構造是在上述發明中,前述支撐構件形成柱狀,具有設在前端側且直徑比其他部分小的小徑部,前述第1貫穿孔具有:直徑比前述支撐構件之最大直徑大的第1孔部;以及以均一的寬度從前述第1孔部的端部延伸至與前述臂部之前端側不同的一側,該寬度與前述小徑部的直徑大致相等的第2孔部;前述固定部是藉由從前述第2孔部的側壁延伸的開縫而形成,且為用來卡止前述支撐構件的爪部。 Further, in the above-described invention, the support member is formed in a columnar shape and has a small diameter portion provided on the distal end side and having a smaller diameter than the other portions, and the first through hole has a diameter larger than that of the support member. a first hole portion having a largest diameter; and a uniform width extending from an end portion of the first hole portion to a side different from a front end side of the arm portion, the width being substantially equal to a diameter of the small diameter portion The hole portion is formed by a slit extending from a side wall of the second hole portion, and is a claw portion for locking the support member.

又,本發明之插座安裝構造是在上述發明中,在前述兩個臂部分別設有藉由將與彼此相對向之側相反之一側的緣端部折彎而形成的彎曲部。 Further, in the above-described invention, in the socket mounting structure of the present invention, the two arm portions are each provided with a bent portion formed by bending an edge end portion on the side opposite to the side opposite to each other.

又,本發明之插座安裝構造是在上述發明中,在前述保持構件設有可供螺絲螺合的螺絲孔,在前述臂部設有與前述螺絲孔相應地朝板厚方向貫穿的第2貫穿孔,前述保持構件與前述彈簧構件藉由插通在前述第2貫穿孔且螺合在前述螺絲孔的前述螺絲而連結。 Further, in the above-described invention, in the socket mounting structure of the present invention, the holding member is provided with a screw hole through which a screw can be screwed, and the arm portion is provided with a second through hole penetrating in the thickness direction corresponding to the screw hole. In the hole, the holding member and the spring member are coupled by a screw that is inserted into the second through hole and screwed into the screw hole.

又,本發明之插座安裝構造是在上述發明中,前述保持構件具有兩個槽口部,該槽口部是分別設在上表面側之相對向的外緣側,並且沿著該外緣形成切口,用以引導前述彈簧構件在前述保持構件上之安裝位置。 Further, in the socket mounting structure of the present invention, in the above aspect of the invention, the holding member has two notch portions which are respectively provided on opposite outer edge sides of the upper surface side, and are formed along the outer edge. a slit for guiding a mounting position of the aforementioned spring member on the aforementioned holding member.

又,本發明之彈簧構件是為了將插座安裝於基板而使用的板狀的彈簧構件,該插座具有:以長邊方向的兩端分別與前述基板及被接觸體接觸的複數個接觸探針;依照預定的圖案收容並保持前述複數個接觸探針的探針保持具;以及設在該探針保持具周圍的保持構件;該彈簧構件之特徵為:形成有複數個第1貫穿孔,其係朝板厚方向貫穿,在相對於載置於前述基板上的前述保持構件朝前述基板側施加荷重的狀態下,供從前述基板的主面延伸出去且分別插通在設於前述保持構件的插通孔的複數個支撐構件插通,並且具有固定部,其係形成複數個前述第1貫穿孔中的至少一個第1貫穿孔之側壁,以保持並固定前述支撐構件。 Further, the spring member of the present invention is a plate-shaped spring member used for mounting a socket on a substrate, and the socket has a plurality of contact probes that are in contact with the substrate and the contacted body at both ends in the longitudinal direction; a probe holder for accommodating and holding the plurality of contact probes according to a predetermined pattern; and a holding member provided around the probe holder; the spring member is characterized in that a plurality of first through holes are formed The plate is inserted in the plate thickness direction, and is extended from the main surface of the substrate in a state in which the load is applied to the substrate side with respect to the holding member placed on the substrate, and is inserted into the insertion member provided in the holding member. The plurality of support members of the through hole are inserted and have a fixing portion that forms a side wall of at least one of the plurality of first through holes to hold and fix the support member.

根據本發明,發揮可相對於電路基板簡單地裝拆插座的效果。 According to the present invention, the effect of easily attaching and detaching the socket with respect to the circuit board is exhibited.

1‧‧‧插座 1‧‧‧ socket

2‧‧‧接觸探針(探針) 2‧‧‧Contact probe (probe)

3‧‧‧探針保持具 3‧‧‧ probe holder

4‧‧‧保持構件 4‧‧‧Retaining components

5‧‧‧板簧 5‧‧‧ leaf spring

21‧‧‧第1柱塞 21‧‧‧1st plunger

22‧‧‧第2柱塞 22‧‧‧2nd plunger

23‧‧‧管構件 23‧‧‧ pipe components

31‧‧‧第1構件 31‧‧‧1st component

32‧‧‧第2構件 32‧‧‧2nd component

33、34‧‧‧保持孔 33, 34‧‧‧ Keep the hole

33a、34a、211a至211d‧‧‧小徑部 33a, 34a, 211a to 211d‧‧‧ Small Trails

33b、34b‧‧‧大徑部 33b, 34b‧‧‧The Great Trails Department

40‧‧‧主體部 40‧‧‧ Main body

41a、41b‧‧‧槽口部 41a, 41b‧‧‧ notch

50‧‧‧基部 50‧‧‧ base

51a、51b‧‧‧臂部 51a, 51b‧‧‧arms

52a至52d、53a、53b‧‧‧貫穿孔 52a to 52d, 53a, 53b‧‧‧through holes

100‧‧‧半導體積體電路 100‧‧‧Semiconductor integrated circuit

101‧‧‧連接用電極 101‧‧‧Connecting electrode

200‧‧‧電路基板 200‧‧‧ circuit substrate

201‧‧‧電極 201‧‧‧ electrodes

201a至201d‧‧‧軸 201a to 201d‧‧‧ axes

401a、401b‧‧‧螺絲 401a, 401b‧‧‧ screws

411‧‧‧嵌入孔 411‧‧‧ embedded hole

412a至412d‧‧‧插通孔 412a to 412d‧‧‧ inserted through holes

413a、413b‧‧‧螺絲孔 413a, 413b‧‧‧ screw holes

511a、511b‧‧‧第1延伸部 511a, 511b‧‧‧1st extension

511c、511d‧‧‧彎曲部 511c, 511d‧‧‧bend

512a、512b‧‧‧第2延伸部 512a, 512b‧‧‧2nd extension

521、526‧‧‧第1孔部 521, 526‧‧‧1st hole

522、527‧‧‧第2孔部 522, 527‧‧‧2nd hole

523、524‧‧‧開縫 523, 524‧‧‧ slit

525‧‧‧爪部 525‧‧‧ claws

第1圖是顯示本發明實施形態的插座安裝構造之概略構造的立體圖。 Fig. 1 is a perspective view showing a schematic structure of a socket mounting structure according to an embodiment of the present invention.

第2圖是顯示本發明實施形態的插座之要部構造的局部剖面圖。 Fig. 2 is a partial cross-sectional view showing the structure of a main part of a socket according to an embodiment of the present invention.

第3圖是顯示本發明實施形態的半導體積體電路之檢查時的插座之主要部分構造的局部剖面圖。 Fig. 3 is a partial cross-sectional view showing the structure of a main part of a socket in the inspection of the semiconductor integrated circuit according to the embodiment of the present invention.

第4圖是顯示本發明實施形態的插座安裝構造之主要部分構造的立體圖。 Fig. 4 is a perspective view showing a structure of a main part of a socket mounting structure according to an embodiment of the present invention.

第5圖是顯示本發明實施形態的插座安裝構造之主要部分構造的立體圖。 Fig. 5 is a perspective view showing a structure of a main part of a socket mounting structure according to an embodiment of the present invention.

第6圖是顯示本發明實施形態的插座安裝構造之主要部分構造的立體圖。 Fig. 6 is a perspective view showing a structure of a main part of a socket mounting structure according to an embodiment of the present invention.

第7圖是顯示第6圖所示的板簧之主要部分構造的俯視圖。 Fig. 7 is a plan view showing the configuration of a main part of the leaf spring shown in Fig. 6.

第8圖是顯示本實施形態之插座的主要部分構造的立體圖。 Fig. 8 is a perspective view showing the structure of a main part of the socket of the embodiment.

第9圖是顯示本發明實施形態的插座之主要部分構造的局部剖面圖。 Fig. 9 is a partial cross-sectional view showing the structure of a main part of a socket according to an embodiment of the present invention.

第10圖是顯示本發明實施形態的插座之主要部分構 造的立體圖。 Figure 10 is a view showing the main part of the socket of the embodiment of the present invention. A three-dimensional map.

第11圖是顯示本發明實施形態的插座之主要部分構造的局部剖面圖。 Figure 11 is a partial cross-sectional view showing the structure of a main part of a socket according to an embodiment of the present invention.

第12圖是顯示本發明實施形態的插座之主要部分構造的立體圖。 Fig. 12 is a perspective view showing the structure of a main part of a socket according to an embodiment of the present invention.

第13圖是顯示本發明實施形態的插座之主要部分構造的局部剖面圖。 Figure 13 is a partial cross-sectional view showing the structure of a main part of a socket according to an embodiment of the present invention.

以下,連同圖式來詳細說明本發明之實施形態。此外,本發明並不受以下實施形態所限定。並且,以下說明中所參照的各個圖式只不過是以可理解本發明之內容的程度概略地顯示形狀、大小及位置關係。亦即,本發明並不只限定於各圖式所例示的形狀、大小及位置關係。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Further, the present invention is not limited by the following embodiments. Further, each of the drawings referred to in the following description schematically shows the shape, size, and positional relationship to the extent that the contents of the present invention can be understood. That is, the present invention is not limited to the shapes, sizes, and positional relationships illustrated in the respective drawings.

第1圖是本發明實施形態的插座安裝構造之概略構造的立體圖。第1圖所示的插座1是進行作為檢查對象物的半導體積體電路100之電氣特性檢查時所使用的裝置,且為將半導體積體電路100與將檢查用訊號輸出至半導體積體電路100的電路基板200之間予以電性連接的裝置。 Fig. 1 is a perspective view showing a schematic structure of a socket mounting structure according to an embodiment of the present invention. The socket 1 shown in FIG. 1 is a device used for performing electrical characteristic inspection of the semiconductor integrated circuit 100 as an inspection target, and outputs the semiconductor integrated circuit 100 and the inspection signal to the semiconductor integrated circuit 100. The device between the circuit substrates 200 is electrically connected.

插座1具有:分別以長邊方向的一方端部側與作為被接觸體的半導體積體電路100的一個電極(被接觸體)接觸,以另一方端部側與電路基板200之不同的電極接觸的複數個接觸探針2(以下簡稱為「探針2」);依照預定的圖案收容並保持複數個探針2的探針保持具3;設在 探針保持具3之周圍,且用來抑制檢查時與複數個探針2接觸的半導體積體電路100之位置偏移之發生的保持構件4;以及安裝在保持構件4的上表面,且將保持構件4朝電路基板200側推壓而固定保持構件4及電路基板200的板簧5(彈簧構件)。 The socket 1 has one end side in the longitudinal direction and one electrode (contacted body) of the semiconductor integrated circuit 100 as the contacted body, and the other end side is in contact with the electrode of the circuit board 200. a plurality of contact probes 2 (hereinafter referred to as "probe 2"); a probe holder 3 for accommodating and holding a plurality of probes 2 in accordance with a predetermined pattern; a holding member 4 around the probe holder 3 and for suppressing occurrence of a positional deviation of the semiconductor integrated circuit 100 in contact with the plurality of probes 2 at the time of inspection; and mounting on the upper surface of the holding member 4, and The holding member 4 is pressed toward the circuit board 200 side to fix the holding member 4 and the leaf spring 5 (spring member) of the circuit board 200.

第2圖是顯示收容在探針保持具3的探針2之詳細構造的圖。第2圖所示的探針2具備:進行半導體積體電路100之檢查時與該半導體積體電路100的連接用電極接觸的第1柱塞21;與具備檢查電路的電路基板200之電極接觸的第2柱塞22;以及介設於第1柱塞21及第2柱塞22之間且用來包覆彈簧構件(未圖示)之外圍的管構件23。構成探針2的第1柱塞21及第2柱塞22、以及管構件23是具有同一軸線。探針2是在使其接觸半導體積體電路100時,藉由管構件23內部的彈簧構件朝軸線方向伸縮來緩和半導體積體電路100對於連接用電極的衝擊,並且對半導體積體電路100及電路基板200施加荷重。此外,由於第1柱塞21會與例如半導體積體電路100中形成半球狀的連接用電極101(參照第3圖)接觸,因此具有複數個形成尖細前端形狀的銳端部。 FIG. 2 is a view showing a detailed structure of the probe 2 housed in the probe holder 3. The probe 2 shown in FIG. 2 includes a first plunger 21 that comes into contact with the connection electrode of the semiconductor integrated circuit 100 when the semiconductor integrated circuit 100 is inspected, and an electrode contact with the circuit substrate 200 including the inspection circuit. The second plunger 22; and a pipe member 23 interposed between the first plunger 21 and the second plunger 22 and covering the periphery of the spring member (not shown). The first plunger 21, the second plunger 22, and the tube member 23 constituting the probe 2 have the same axis. When the probe 2 is brought into contact with the semiconductor integrated circuit 100, the spring member in the tube member 23 expands and contracts in the axial direction to relax the impact of the semiconductor integrated circuit 100 on the connection electrode, and the semiconductor integrated circuit 100 and The circuit substrate 200 applies a load. In addition, the first plunger 21 is in contact with, for example, the hemispherical connection electrode 101 (see FIG. 3) in the semiconductor integrated circuit 100, and thus has a plurality of sharp end portions forming a tapered tip shape.

探針保持具3是使用樹脂、可機械加工的陶瓷、矽等絕緣性材料而形成,且積層有位於第2圖之上表面側的第1構件31及位於下表面側的第2構件32而成者。在第1構件31及第2構件32中,分別各形成有相同數量之用來收容複數個探針2的保持孔33及34,收容探針2 的保持孔33及34是以彼此的軸線一致的方式形成。保持孔33及34的形成位置是依半導體積體電路100的配線圖案而決定。 The probe holder 3 is formed of an insulating material such as a resin, a machined ceramic, or a crucible, and has a first member 31 on the upper surface side of the second drawing and a second member 32 on the lower surface side. Adult. In the first member 31 and the second member 32, the same number of holding holes 33 and 34 for accommodating the plurality of probes 2 are respectively formed, and the probe 2 is housed. The holding holes 33 and 34 are formed in such a manner that their axes coincide with each other. The formation positions of the holding holes 33 and 34 are determined in accordance with the wiring pattern of the semiconductor integrated circuit 100.

保持孔33及34都是形成直徑沿著貫穿方向而不同的階梯孔形狀。亦即,保持孔33是由在探針保持具3之上端面具有開口的小徑部33a、以及直徑比該小徑部33a大的大徑部33b所構成。小徑部33a的直徑是比第1柱塞21的直徑稍大。而大徑部33b的直徑是比管構件23的直徑稍大。 Both of the holding holes 33 and 34 have a stepped hole shape in which the diameter is different along the through direction. In other words, the holding hole 33 is composed of a small diameter portion 33a having an opening on the upper end surface of the probe holder 3 and a large diameter portion 33b having a larger diameter than the small diameter portion 33a. The diameter of the small diameter portion 33a is slightly larger than the diameter of the first plunger 21. The diameter of the large diameter portion 33b is slightly larger than the diameter of the pipe member 23.

另一方面,保持孔34是由在探針保持具3之下端面具有開口的小徑部34a、以及直徑比該小徑部34a大的大徑部34b所構成。小徑部34a的直徑是比第2柱塞22稍大。而大徑部34b的直徑是比管構件23的直徑稍大。這些保持孔33及34的形狀是依所要收容的探針2之構造而決定。 On the other hand, the holding hole 34 is composed of a small diameter portion 34a having an opening at the lower end surface of the probe holder 3 and a large diameter portion 34b having a larger diameter than the small diameter portion 34a. The diameter of the small diameter portion 34a is slightly larger than that of the second plunger 22. The diameter of the large diameter portion 34b is slightly larger than the diameter of the pipe member 23. The shape of these holding holes 33 and 34 is determined depending on the structure of the probe 2 to be accommodated.

管構件23具有藉由抵接於保持孔33的小徑部33a與大徑部33b的交界壁面,以防止探針2從探針保持具3脫落的功能。並且,管構件23具有藉由抵接於保持孔34的小徑部34a與大徑部34b的交界壁面,以防止探針2從探針保持具3脫落的功能。此外,管構件23之長邊方向的長度是只要第1柱塞21及第2柱塞22分別從探針保持具3突出,即使比在大徑部33b與大徑部34b連通的狀態下之軸線方向的長度小亦可適用。 The pipe member 23 has a function of preventing the probe 2 from coming off the probe holder 3 by abutting against the boundary wall surface of the small diameter portion 33a of the holding hole 33 and the large diameter portion 33b. Further, the pipe member 23 has a function of preventing the probe 2 from coming off the probe holder 3 by abutting against the boundary wall surface between the small diameter portion 34a and the large diameter portion 34b of the holding hole 34. In addition, the length of the pipe member 23 in the longitudinal direction is such that the first plunger 21 and the second plunger 22 protrude from the probe holder 3, respectively, even in a state in which the large diameter portion 33b and the large diameter portion 34b are in communication with each other. A small length in the axial direction can also be applied.

第3圖是使用探針保持具3進行半導體積體 電路100之檢查時的狀態之圖。進行半導體積體電路100之檢查時,管構件23內部的彈簧構件會因為來自半導體積體電路100的接觸荷重而成為沿著長邊方向被壓縮的狀態。第1柱塞21會伴隨該彈簧構件的壓縮而進入管構件23內。在檢查時從電路基板200被供應至半導體積體電路100的檢查用訊號是從電路基板200的電極201分別經由探針2到達半導體積體電路100的連接用電極101。具體而言,在探針2中經由第2柱塞22、管構件23內部的彈簧構件、第1柱塞21而到達半導體積體電路100的連接用電極101。 Figure 3 is a semiconductor assembly using the probe holder 3 A diagram of the state of the circuit 100 at the time of inspection. When the semiconductor integrated circuit 100 is inspected, the spring member inside the tube member 23 is compressed in the longitudinal direction due to the contact load from the semiconductor integrated circuit 100. The first plunger 21 enters the tubular member 23 in association with the compression of the spring member. The inspection signal supplied from the circuit board 200 to the semiconductor integrated circuit 100 at the time of inspection is the connection electrode 101 which reaches the semiconductor integrated circuit 100 from the electrode 201 of the circuit board 200 via the probe 2, respectively. Specifically, the probe 2 reaches the connection electrode 101 of the semiconductor integrated circuit 100 via the second plunger 22 , the spring member inside the tube member 23 , and the first plunger 21 .

又,由於第1柱塞21的前端形成為尖細狀,因此即使在連接用電極101的表面形成有氧化被膜時,也可刺破氧化被膜,使前端直接與連接用電極101接觸。此外,第1柱塞21及第2柱塞22的前端是可依接觸對象的形狀而適當地變更。 Further, since the tip end of the first plunger 21 is formed in a tapered shape, even when an oxide film is formed on the surface of the connection electrode 101, the oxide film can be pierced and the tip end can be directly brought into contact with the connection electrode 101. Further, the tips of the first plunger 21 and the second plunger 22 are appropriately changed depending on the shape of the object to be contacted.

第4圖是本實施形態之插座安裝構造的主要部分構造的立體圖。第5圖是本實施形態之插座安裝構造的保持構件4之構造的立體圖。保持構件4具有使用鐵系、黃銅、不鏽鋼(SUS)等金屬而形成,或是使用對合成樹脂或陶瓷、前述金屬等施行絕緣加工等者而形成的主體部40。又,在主體部40設置可供探針保持具3嵌入的嵌入孔411。又,主體部40具有槽口部41a、41b,其係分別設在上表面側之相對向的外緣側,且沿著該外緣形成切口,用以引導板簧5之安裝位置。在槽口部41a、41b形成有:可 供從電路基板200突出的軸201a至201d(支撐構件,參照第1、4圖)分別插通的插通孔412a至412d;以及可分別與用來將板簧5安裝於主體部40的螺絲401a、401b螺合的螺絲孔413a、413b。 Fig. 4 is a perspective view showing the structure of a main part of the socket mounting structure of the embodiment. Fig. 5 is a perspective view showing the structure of the holding member 4 of the socket mounting structure of the embodiment. The holding member 4 is formed by using a metal such as iron, brass, or stainless steel (SUS), or a main body portion 40 formed by performing an insulating process such as a synthetic resin, a ceramic, or the like. Further, an insertion hole 411 into which the probe holder 3 is fitted is provided in the main body portion 40. Further, the main body portion 40 has notch portions 41a and 41b which are respectively provided on the opposite outer edge sides of the upper surface side, and a slit is formed along the outer edge for guiding the mounting position of the leaf spring 5. Formed in the notch portions 41a, 41b: Inserting holes 412a to 412d through which the shafts 201a to 201d (supporting members, see FIGS. 1 and 4) protruding from the circuit board 200 are respectively inserted; and screws respectively for attaching the leaf spring 5 to the main body portion 40 401a, 401b screw holes 413a, 413b.

軸201a至201d是從電路基板200的主面朝鉛直方向大致圓柱狀地延伸。軸201a至201d具有設在前端側,且直徑比其他部分小的小徑部211a至211d。 The shafts 201a to 201d extend substantially cylindrically from the main surface of the circuit board 200 in the vertical direction. The shafts 201a to 201d have small diameter portions 211a to 211d provided on the front end side and having a smaller diameter than the other portions.

第6圖是顯示本實施形態之插座安裝構造的板簧5之構造的立體圖。第7圖是顯示第6圖所示的板簧5之主要部分構造的俯視圖。板簧5是使用具有彈簧特性的金屬材料、例如SUS301等不鏽鋼而形成,且具有形成大致帶狀的基部50、以及從基部50之長邊方向的兩端分別在板面所通過的平面上朝向與基部50之長邊方向大致垂直的方向帶狀地延伸的臂部51a、51b,在朝著與基部50之板面垂直的方向俯視時形成大致C字狀。 Fig. 6 is a perspective view showing the structure of the leaf spring 5 of the socket mounting structure of the embodiment. Fig. 7 is a plan view showing the configuration of a main portion of the leaf spring 5 shown in Fig. 6. The leaf spring 5 is formed of a metal material having a spring characteristic, for example, stainless steel such as SUS301, and has a base portion 50 formed in a substantially strip shape, and both ends in the longitudinal direction of the base portion 50 are oriented on a plane through which the board surface passes. The arm portions 51a and 51b extending in a strip shape in a direction substantially perpendicular to the longitudinal direction of the base portion 50 are formed in a substantially C-shape when viewed in a direction perpendicular to the plate surface of the base portion 50.

臂部51a具有:從基部50之一端部延伸的第1延伸部511a;以及從第1延伸部511a之前端弧狀地延伸的第2延伸部512a。臂部51a係位在第1延伸部511a通過基部50之板面的平面上,並且形成第2延伸部512a朝離開該平面之方向彎曲的形狀。 The arm portion 51a has a first extending portion 511a extending from one end portion of the base portion 50, and a second extending portion 512a extending in an arc shape from a front end of the first extending portion 511a. The arm portion 51a is positioned on a plane on which the first extending portion 511a passes through the plate surface of the base portion 50, and is formed in a shape in which the second extending portion 512a is curved in a direction away from the plane.

臂部51b具有:從基部50之另一端部延伸的第1延伸部511b;以及從第1延伸部511b弧狀地延伸的第2延伸部512b。臂部51b是位在第1延伸部511b通過基部50之板面的平面上,並且形成第2延伸部512b朝離 開該平面的方向彎曲的形狀。 The arm portion 51b has a first extending portion 511b extending from the other end portion of the base portion 50, and a second extending portion 512b extending in an arc shape from the first extending portion 511b. The arm portion 51b is located on a plane on which the first extension portion 511b passes through the plate surface of the base portion 50, and the second extension portion 512b is formed away from The shape in which the direction of the plane is curved.

又,在臂部51a、51b,與插通孔412a至412d相應分別形成有朝板厚方向貫穿的貫穿孔52a至52d(第1貫穿孔),並且與螺絲孔413a、413b相應分別形成有朝板厚方向貫穿的貫穿孔53a、53b(第2貫穿孔)。在此,貫穿孔52a、52b是設在第2延伸部512a、512b,貫穿孔52c、52d是設在臂部51a、51b的第1延伸部511a、511b。並且,貫穿孔53a是分別設在貫穿孔52a與貫穿孔52c之間。貫穿孔53b是設在貫穿孔52b與貫穿孔52d之間。 Further, the arm portions 51a and 51b are formed with through holes 52a to 52d (first through holes) penetrating in the thickness direction of the insertion holes 412a to 412d, respectively, and are formed with the screw holes 413a and 413b, respectively. Through holes 53a and 53b (second through holes) penetrating in the thickness direction. Here, the through holes 52a and 52b are provided in the second extending portions 512a and 512b, and the through holes 52c and 52d are the first extending portions 511a and 511b provided in the arm portions 51a and 51b. Further, the through holes 53a are provided between the through holes 52a and the through holes 52c, respectively. The through hole 53b is provided between the through hole 52b and the through hole 52d.

貫穿孔52a具有:直徑比軸201a之最大徑(插通部分中的最大直徑)大的第1孔部521;以及從第1孔部521之一端朝與前端側不同之一側(第1延伸部511a側)延伸,且寬度比第1孔部521之開口直徑小的第2孔部522。第2孔部522具有爪部525(固定部),該爪部是由從該第2孔部522之側部延伸的開縫523、以及從第2孔部522之前端朝長邊方向延伸的開縫524而形成,並且形成第2孔部522之側壁的一部分,用以卡止軸201a的小徑部211a。第2孔部522是與小徑部211a的直徑大致相等,並且以均一的寬度延伸。開縫523是形成:朝第2孔部522之寬度方向延伸之後彎曲,然後朝臂部51a之長邊方向延伸的L字形。 The through hole 52a has a first hole portion 521 having a diameter larger than the maximum diameter of the shaft 201a (the largest diameter in the insertion portion), and one side from the end of the first hole portion 521 toward the front end side (the first extension) The portion 511a side) extends and has a second hole portion 522 having a smaller width than the opening diameter of the first hole portion 521. The second hole portion 522 has a claw portion 525 (fixed portion) which is a slit 523 extending from a side portion of the second hole portion 522 and extends from a front end of the second hole portion 522 toward a longitudinal direction. The slit 524 is formed, and a part of the side wall of the second hole portion 522 is formed to lock the small diameter portion 211a of the shaft 201a. The second hole portion 522 is substantially equal in diameter to the small diameter portion 211a and extends in a uniform width. The slit 523 is formed in an L shape that is bent in the width direction of the second hole portion 522 and then bent in the longitudinal direction of the arm portion 51a.

在貫穿孔52a形成有可藉由與和第2孔部522之與第1孔部521連結之側不同之側的端部以及爪部525(突出部525a),插通並保持小徑部211a的保持部522a。 與保持部522a之外緣相接的圓是與小徑部211a之外周所形成的圓大致相等。亦即,小徑部211a是以插通在保持部522a的狀態卡止在突出部525a,並形成固定在貫穿孔52a的狀態。 An end portion and a claw portion 525 (projecting portion 525a) on the side different from the side of the second hole portion 522 that is coupled to the first hole portion 521 are formed in the through hole 52a, and the small diameter portion 211a is inserted and held. Holding portion 522a. A circle that is in contact with the outer edge of the holding portion 522a is substantially equal to a circle formed on the outer circumference of the small diameter portion 211a. In other words, the small diameter portion 211a is locked to the protruding portion 525a in a state of being inserted into the holding portion 522a, and is fixed to the through hole 52a.

爪部525是在與主面平行的平面上可移動於開縫523、524所形成的間隙。並且,在爪部525的前端部設有朝第2孔部522側(寬度方向)突出的突出部525a。在沒有荷重施加於爪部525的狀態下,突出部525a的前端與面向突出部525a的第2孔部522之壁面所形成的寬度W1(最小寬度)是比第2孔部522的寬度W2小。此外,在本實施形態中,上述貫穿孔52b也具有同樣的構造。 The claw portion 525 is a gap that can be moved by the slits 523, 524 on a plane parallel to the main surface. Further, a protruding portion 525a that protrudes toward the second hole portion 522 side (width direction) is provided at the front end portion of the claw portion 525. In a state where no load is applied to the claw portion 525, the width W1 (minimum width) formed by the front end of the protruding portion 525a and the wall surface of the second hole portion 522 facing the protruding portion 525a is smaller than the width W2 of the second hole portion 522. . Further, in the present embodiment, the through hole 52b also has the same structure.

貫穿孔52c具有:直徑比軸201a之最大直徑(插通部分中的最大直徑)大的第1孔部526;以及從第1孔部526的一端朝與前端側不同之一側延伸,且寬度比第1孔部526之直徑小的第2孔部527。第2孔部527的直徑與小徑部211c的直徑大致相等,並且以均一的寬度延伸。而且,貫穿孔52d也具有同樣的構造。 The through hole 52c has a first hole portion 526 having a diameter larger than the maximum diameter of the shaft 201a (the largest diameter in the insertion portion); and a width extending from one end of the first hole portion 526 toward the front end side, and the width The second hole portion 527 is smaller than the diameter of the first hole portion 526. The diameter of the second hole portion 527 is substantially equal to the diameter of the small diameter portion 211c, and extends in a uniform width. Moreover, the through hole 52d also has the same configuration.

貫穿孔53a、53b是朝向與上述第2孔部522延伸之方向平行的方向延伸。貫穿孔53a、53b之朝上述方向延伸的長度為貫穿孔52a至52d之從臂部51a、51b的長邊方向的一端到另一端的長度以上。 The through holes 53a and 53b extend in a direction parallel to the direction in which the second hole portion 522 extends. The length of the through holes 53a and 53b extending in the above direction is equal to or longer than the length of one end of the through holes 52a to 52d from the longitudinal direction of the arm portions 51a and 51b to the other end.

在第1延伸部511a設有藉由將與第2延伸部512b相對向之側的相反側的緣端部折彎而形成的彎曲部511c。彎曲部511c是以相對於第1延伸部511a朝向第 2延伸部512a彎曲之側相同側彎起的方式被折彎。在第1延伸部511b也設有同樣的彎曲部511d。 The first extension portion 511a is provided with a curved portion 511c which is formed by bending an edge end portion on the opposite side to the side opposite to the second extension portion 512b. The curved portion 511c is oriented toward the first extending portion 511a 2 The side of the curved portion of the extending portion 512a is bent in such a manner that the same side is bent. The same curved portion 511d is also provided in the first extension portion 511b.

彎曲部511c是在貫穿孔52c與貫穿孔53a之間且為從各自的貫穿孔以預定距離分離的位置設有第2延伸部512a側的端部。彎曲部511d是在貫穿孔52d與貫穿孔53b之間、且為從各自的貫穿孔以預定距離分離的位置設有第2延伸部512b側的端部。 The curved portion 511c is an end portion on the side of the second extending portion 512a between the through hole 52c and the through hole 53a and separated from the respective through holes by a predetermined distance. The curved portion 511d is an end portion on the side of the second extending portion 512b on the side between the through hole 52d and the through hole 53b and separated from the respective through holes by a predetermined distance.

在此,插通孔412a至412d及第1孔部521的直徑是比軸201a至201d的最大直徑大。又,第2孔部522的寬度是比小徑部211a至211d的直徑大,且比軸201a至201d的最大直徑小。軸201a至201d是藉由與插通孔412a至412d螺合,而設置成相對於電路基板200裝拆自如。 Here, the diameters of the insertion holes 412a to 412d and the first hole portion 521 are larger than the maximum diameter of the shafts 201a to 201d. Further, the width of the second hole portion 522 is larger than the diameters of the small diameter portions 211a to 211d and smaller than the maximum diameter of the shafts 201a to 201d. The shafts 201a to 201d are detachably attached to the circuit board 200 by being screwed into the insertion holes 412a to 412d.

並且,板簧5是藉由將臂部51a、51b配設在槽口部41a、41b的上表面而安裝於保持構件4。為了防止從保持構件4的脫離,板簧5是藉由插通在貫穿孔53a、53b的螺絲401a、401b而固定。螺絲401a、401b是以分別插通在貫穿孔53a、53b的狀態與螺絲孔413a、413b螺合,藉此安裝於電路基板200(參照第4圖)。 Further, the leaf spring 5 is attached to the holding member 4 by disposing the arm portions 51a and 51b on the upper surfaces of the notch portions 41a and 41b. In order to prevent detachment from the holding member 4, the leaf spring 5 is fixed by screws 401a, 401b inserted through the through holes 53a, 53b. The screws 401a and 401b are screwed to the screw holes 413a and 413b in a state in which they are inserted into the through holes 53a and 53b, respectively, and are attached to the circuit board 200 (see FIG. 4).

接下來,參照第8圖至第13圖,說明將保持構件4安裝在電路基板200的步驟。第8圖、第10圖及第12圖是顯示本實施形態之插座的主要部分構造的立體圖,且為顯示將保持構件4安裝於電路基板200的步驟的圖。第9圖、第11圖及第13圖是顯示本實施形態之插座的主要部分構造的局部剖面圖,且為顯示將保持構件4安 裝於電路基板200的步驟的圖。 Next, the step of mounting the holding member 4 on the circuit substrate 200 will be described with reference to Figs. 8 to 13 . Figs. 8, 10, and 12 are perspective views showing a structure of a main part of the socket of the embodiment, and are views showing a step of attaching the holding member 4 to the circuit board 200. Fig. 9, Fig. 11, and Fig. 13 are partial cross-sectional views showing the configuration of a main portion of the socket of the embodiment, and showing the holding member 4 A diagram of a step of mounting on the circuit board 200.

首先,在板簧5之臂部51a、51b位於槽口部41a、41b上,且保持構件4的插通孔412a、412b與貫穿孔52a、52b的第1孔部521各自連通的狀態下,將保持構件4安裝在電路基板200。此時,軸201a至201d是分別插通在插通孔412a至412d及貫穿孔52a、52b(參照第8圖)。此時,例如軸201a的小徑部211a是位於貫穿孔52a的第1孔部521內(參照第9圖)。板簧5是形成:第2延伸部512a、512b與槽口部41a、41b接觸,除了第2延伸部512a、512b之外,從主體部40的上表面分離而傾斜的狀態。 First, in a state in which the arm portions 51a and 51b of the leaf spring 5 are located in the notch portions 41a and 41b, and the insertion holes 412a and 412b of the holding member 4 communicate with the first hole portions 521 of the through holes 52a and 52b, respectively. The holding member 4 is mounted on the circuit substrate 200. At this time, the shafts 201a to 201d are respectively inserted into the insertion holes 412a to 412d and the through holes 52a and 52b (refer to Fig. 8). At this time, for example, the small diameter portion 211a of the shaft 201a is located in the first hole portion 521 of the through hole 52a (see Fig. 9). The leaf spring 5 is formed in a state in which the second extending portions 512a and 512b are in contact with the notch portions 41a and 41b, and are separated from the upper surface of the main body portion 40 in addition to the second extending portions 512a and 512b.

接下來,使第2延伸部512a、512b沿著槽口部41a、41b滑動之後,對板簧5的基部50施加接近主體部40之方向的荷重,使第1延伸部511a、511b與主體部40接近或接觸(參照第10圖)。在此,在第8圖的狀態下,臂部51a、51b是因為軸201a、201b插通在貫穿孔52a、52b,所以第2延伸部512a、512b的前端部是固定的。在該狀態下使基部50接近主體部40的情況時,例如當臂部51a的第1延伸部511a接近保持構件4時,因欲回到臂部51b之初期狀態的彎曲形狀的荷重,而成為第2延伸部512b(彎曲部分)壓接於保持構件4的狀態。藉此,成為板簧5將保持構件4朝電路基板200側推壓的狀態。 Next, after the second extending portions 512a and 512b are slid along the notch portions 41a and 41b, a load close to the main body portion 40 is applied to the base portion 50 of the leaf spring 5, and the first extending portions 511a and 511b and the main body portion are moved. 40 close or contact (refer to Figure 10). Here, in the state of Fig. 8, the arm portions 51a and 51b are inserted into the through holes 52a and 52b, so that the distal end portions of the second extending portions 512a and 512b are fixed. When the base portion 50 is brought close to the main body portion 40 in this state, for example, when the first extending portion 511a of the arm portion 51a approaches the holding member 4, it is intended to return to the load of the curved shape in the initial state of the arm portion 51b. The second extension portion 512b (curved portion) is in a state of being pressed against the holding member 4. Thereby, the leaf spring 5 is in a state in which the holding member 4 is pressed toward the circuit board 200 side.

使基部50接近於主體部40時,軸201c、201d分別插通在貫穿孔52c、52d。此時,例如軸201c的 小徑部211c是位於貫穿孔52c的第1孔部526內。 When the base portion 50 is brought close to the main body portion 40, the shafts 201c and 201d are respectively inserted into the through holes 52c and 52d. At this time, for example, the shaft 201c The small diameter portion 211c is located in the first hole portion 526 of the through hole 52c.

又,藉由臂部51a、51b的滑動,例如位於第1孔部521內的縮徑部211a會移動至第2孔部522。此時,小徑部211a是在與爪部525的突出部525a抵接之後,使爪部525朝開縫523側移動,使第2孔部522的寬度擴大(參照第11圖)。又,在貫穿孔52c中,也是小徑部211c移動至第2孔部527。 Further, by the sliding of the arm portions 51a and 51b, for example, the reduced diameter portion 211a located in the first hole portion 521 moves to the second hole portion 522. At this time, after the small-diameter portion 211a comes into contact with the protruding portion 525a of the claw portion 525, the claw portion 525 is moved toward the slit 523 side, and the width of the second hole portion 522 is widened (see FIG. 11). Further, in the through hole 52c, the small diameter portion 211c also moves to the second hole portion 527.

使臂部51a、51b進一步滑動時,軸201a至201d會抵接於穿孔52a至54d的端部(第2孔部側的端部)(參照第12圖)。此時,如第13圖所示,小徑部211a被收容在保持部522a。藉此可抑制小徑部211a朝第1孔部521側移動並固定板簧5。在該狀態下,板簧5是將保持構件4推壓並固定至電路基板200側,因此保持構件4被固定至電路基板200。 When the arm portions 51a and 51b are further slid, the shafts 201a to 201d abut against the end portions (end portions on the second hole portion side) of the through holes 52a to 54d (see Fig. 12). At this time, as shown in Fig. 13, the small diameter portion 211a is housed in the holding portion 522a. Thereby, the small diameter portion 211a can be prevented from moving toward the first hole portion 521 side and the leaf spring 5 can be fixed. In this state, the leaf spring 5 presses and fixes the holding member 4 to the circuit board 200 side, and thus the holding member 4 is fixed to the circuit board 200.

藉由如上所述的構造及動作,只要對板簧5施加荷重,並使之相對於載置於電路基板200上的保持構件4滑動,即可將板簧5固定在電路基板200,且將保持構件4安裝於電路基板200。並且,藉由軸201a至201d而固定在保持構件4上的板簧5,是利用因臂部51a、51b之彎曲所產生的荷重,由保持構件4推壓電路基板200,因此可使保持構件4密接於電路基板200。 With the configuration and operation as described above, the leaf spring 5 can be fixed to the circuit substrate 200 by applying a load to the leaf spring 5 and sliding it relative to the holding member 4 placed on the circuit substrate 200, and The holding member 4 is mounted on the circuit substrate 200. Further, the leaf spring 5 fixed to the holding member 4 by the shafts 201a to 201d is pressed by the holding member 4 by the load generated by the bending of the arm portions 51a and 51b, so that the leaf holder 5 can be held. The member 4 is in close contact with the circuit substrate 200.

並且,在將保持構件4從電路基板200拆下的情況時,只要使板簧5朝與安裝時的滑動方向相反之方向滑動,便可從電路基板20拆下。 Further, when the holding member 4 is detached from the circuit board 200, the leaf spring 5 can be detached from the circuit board 20 by sliding it in a direction opposite to the sliding direction at the time of mounting.

又,彎曲部511c是相對於第1延伸部511a朝與第2延伸部512a形成弧狀之側相同之一側折彎,亦即,是朝與將保持構件4安裝於電路基板200時對板簧5施加荷重方向的相反之方向折彎,因此可提升臂部51a相對於該荷重的強度。藉此,可提升反覆使用板簧5時的耐久性。 Further, the curved portion 511c is bent on the same side as the side in which the first extending portion 511a is curved toward the second extending portion 512a, that is, when the holding member 4 is attached to the circuit board 200. The spring 5 is bent in the opposite direction to which the load direction is applied, so that the strength of the arm portion 51a with respect to the load can be increased. Thereby, the durability when the leaf spring 5 is repeatedly used can be improved.

又,由於彎曲部511c之第2延伸部512a側的端部是設在貫穿孔52c與貫穿孔53a之間、且為從各自的貫穿孔以預定距離分離的位置,因此與該端部配設在貫穿孔52c或貫穿孔53a附近的情形相比較,可提升臂部51a的強度。藉此,可提升反覆使用板簧5時的耐久性。 Further, since the end portion of the curved portion 511c on the second extending portion 512a side is provided between the through hole 52c and the through hole 53a and is separated from the respective through holes by a predetermined distance, the end portion is disposed at the end portion. The strength of the arm portion 51a can be increased in comparison with the case of the through hole 52c or the vicinity of the through hole 53a. Thereby, the durability when the leaf spring 5 is repeatedly used can be improved.

此外,在彎曲部511d中也可獲得與上述彎曲部511c同樣的效果。 Further, the same effect as the above-described curved portion 511c can be obtained also in the curved portion 511d.

根據上述實施形態,由於是只對安裝在保持構件4上的板簧5施加荷重而使其滑動,並卡止在軸上,以將保持構件4安裝在電路基板200,因此可將保持構件4相對於電路基板200簡單地裝拆。 According to the above embodiment, the holding member 4 is attached to the circuit board 200 by applying a load to the leaf spring 5 attached to the holding member 4 and sliding it, thereby locking the holding member 4 to the circuit board 200. It is simply attached and detached with respect to the circuit board 200.

又,根據上述實施形態,由於彎曲部511c、511d安裝於保持構件4時是朝向從該保持構件4分離的方向折彎,因此不論保持構件4的大小皆可安裝。並且,藉由設置彎曲部511c、511d,與未設置彎曲部511c、511d的情形相比較,可提升使用者把持板簧5(臂部51a、51b)時的作業性。 Moreover, according to the above-described embodiment, since the curved portions 511c and 511d are bent in the direction away from the holding member 4 when they are attached to the holding member 4, they can be attached regardless of the size of the holding member 4. Further, by providing the curved portions 511c and 511d, the workability when the user grips the leaf springs 5 (the arm portions 51a and 51b) can be improved as compared with the case where the curved portions 511c and 511d are not provided.

又,如以往藉由螺固而將保持構件及電路 基板予以固定的情況時,必須考慮螺絲的轉矩。另一方面,本實施形態的插座安裝構造是在保持構件4與電路基板200的固定上並不需要螺絲,因此能夠以不考慮轉矩之方式進行固定。 Moreover, as in the past, the holding member and the circuit are fixed by screwing When the substrate is fixed, the torque of the screw must be considered. On the other hand, the socket mounting structure of the present embodiment does not require a screw for fixing the holding member 4 and the circuit board 200, and therefore can be fixed without considering torque.

又,上述實施形態中,由於軸201a至201d是可安裝在習知的螺絲安裝用的螺絲孔,因此在基板未設置專用孔之情形下亦可實現。 Further, in the above-described embodiment, since the shafts 201a to 201d can be attached to the conventional screw holes for screw mounting, it is also possible to realize that the substrate is not provided with a dedicated hole.

此外,在上述實施形態中雖說明了在軸201a至201d設置小徑部211a至211d的形態,但是亦可為形成只有軸的前端比第2孔部522的寬度大而擴徑的形狀之形態。 Further, in the above-described embodiment, the small diameter portions 211a to 211d are provided in the shafts 201a to 201d. However, the shape in which the distal end of the shaft is larger than the width of the second hole portion 522 and the diameter is increased may be employed. .

又,上述實施形態中說明了在貫穿孔52a、52b設置爪部525的形態,但是亦可在貫穿孔52c、52d設置爪部,或是在貫穿孔52a至52d全部或是任意的貫穿孔設置爪部。 Further, in the above-described embodiment, the claw portions 525 are provided in the through holes 52a and 52b. However, the claw portions may be provided in the through holes 52c and 52d, or all or any of the through holes 52a to 52d may be provided in the through holes. Claws.

又,上述實施形態說明了固定部是由開縫523、524所形成,並且具有突出部525a的爪部525,但只要可藉由板簧5的移動來保持並固定小徑部211a,則只是從第2孔部522之側壁突出的爪部(相當於突出部525a)亦可。 Further, in the above-described embodiment, the fixing portion is formed by the slits 523 and 524 and has the claw portion 525 of the protruding portion 525a. However, as long as the small diameter portion 211a can be held and fixed by the movement of the leaf spring 5, The claw portion (corresponding to the protruding portion 525a) that protrudes from the side wall of the second hole portion 522 may be used.

又,上述實施形態說明了板簧5藉由螺絲401a、401b而安裝於保持構件4的形態,但是亦可不是事先安裝,亦可在將保持構件4配置於電路基板200上之後,將板簧5安裝於保持構件4,然後利用螺絲401a、401b來 進行螺固。 Further, in the above-described embodiment, the leaf spring 5 is attached to the holding member 4 by the screws 401a and 401b. However, the leaf spring may be attached not to the prior art, and the leaf spring may be placed after the holding member 4 is placed on the circuit board 200. 5 is mounted to the holding member 4, and then by screws 401a, 401b Screw the screw.

上述實施形態說明了連接用電極101形成半球狀的形態,但是亦可為使用於QFP(Quad Flat Package,四面扁平封裝)等之形成平板狀的導腳。 In the above-described embodiment, the connection electrode 101 is formed in a hemispherical shape. However, a guide pin formed in a flat shape such as a QFP (Quad Flat Package) may be used.

此外,探針2並不限於如第2圖之由柱塞及管構件所構成者,亦可為不具有管構件的探針(由柱塞及螺旋彈簧所構成的探針)、或是使金屬線撓曲成弓狀而獲得荷重的線探針。 Further, the probe 2 is not limited to the one composed of the plunger and the tube member as shown in Fig. 2, and may be a probe having no tube member (a probe composed of a plunger and a coil spring) or A wire probe that is deflected into a bow shape to obtain a load.

又,上述實施形態說明了探針保持具與保持構件為分體形成的構造,但是亦可為一體形成者,或是探針保持具單體具有上述保持構件之構造。 Further, in the above embodiment, the probe holder and the holding member are formed separately. However, the probe holder may be integrally formed or the probe holder may have the above-described holding member.

[產業上之可利用性] [Industrial availability]

如以上所述,本發明之插座安裝構造及彈簧構件是在相對於電路基板簡單裝拆插座之方面相當有用。 As described above, the socket mounting structure and the spring member of the present invention are quite useful in that the socket is simply attached and detached with respect to the circuit board.

5‧‧‧板簧 5‧‧‧ leaf spring

50‧‧‧基部 50‧‧‧ base

51a、51b‧‧‧臂部 51a, 51b‧‧‧arms

52a至52d、53a、53b‧‧‧貫穿孔 52a to 52d, 53a, 53b‧‧‧through holes

511a、511b‧‧‧第1延伸部 511a, 511b‧‧‧1st extension

511c、511d‧‧‧彎曲部 511c, 511d‧‧‧bend

512a、512b‧‧‧第2延伸部 512a, 512b‧‧‧2nd extension

526‧‧‧第1孔部 526‧‧‧1st hole

527‧‧‧第2孔部 527‧‧‧2nd hole

Claims (7)

一種插座安裝構造,係將插座安裝於基板的插座安裝構造,該插座具有:以長邊方向的兩端分別與前述基板及被接觸體接觸的複數個接觸探針;依照預定的圖案收容並保持前述複數個接觸探針的探針保持具;以及設在該探針保持具周圍的保持構件;該插座安裝構造係具備:從前述基板的主面延伸出去,且分別插通在設於前述保持構件的插通孔的複數個支撐構件;以及在將載置於前述基板上的前述保持構件朝前述基板側彈壓的狀態下安裝在前述複數個支撐構件的板狀的彈簧構件,前述彈簧構件係形成有第1貫穿孔,其係朝板厚方向貫穿,且可供前述支撐構件插通,並且具有固定部,其係形成複數個前述第1貫穿孔中的至少一個第1貫穿孔之側壁的一部分,以保持並固定前述支撐構件。 A socket mounting structure is a socket mounting structure for mounting a socket on a substrate, the socket having: a plurality of contact probes respectively contacting the substrate and the contact body at both ends in the longitudinal direction; receiving and holding according to a predetermined pattern a probe holder for the plurality of contact probes; and a holding member provided around the probe holder; the socket mounting structure includes: extending from the main surface of the substrate, and respectively inserted in the holding a plurality of support members of the insertion hole of the member; and a plate-shaped spring member attached to the plurality of support members in a state in which the holding member placed on the substrate is biased toward the substrate side, the spring member a first through hole is formed in the plate thickness direction, and the support member is inserted through the support member, and has a fixing portion that forms a side wall of at least one of the plurality of first through holes A portion to hold and fix the aforementioned support member. 如申請專利範圍第1項所述之插座安裝構造,其中,前述彈簧構件具有:形成大致帶狀的基部;以及從前述基部之長邊方向的兩端分別在板面所通過的平面上朝與前述基部之長邊方向大致垂直的方向延伸,且中央部彎曲成弧狀的兩個臂部;在朝著與前述基部之板面垂直的方向俯視時形成 大致C字狀,前述第1貫穿孔係分別設在前述臂部。 The socket mounting structure according to Item 1, wherein the spring member has a base portion formed in a substantially strip shape, and both ends of the base portion in the longitudinal direction thereof face each other on a plane through which the board surface passes. The arm portion of the base portion extends in a direction substantially perpendicular to the longitudinal direction, and the central portion is curved into two arc-shaped arms; and is formed when viewed in a direction perpendicular to a plate surface of the base portion. The first through hole is provided in the arm portion in a substantially C shape. 如申請專利範圍第2項所述之插座安裝構造,其中,前述支撐構件係形成柱狀,具有設在前端側且直徑比其他部分小的小徑部,前述第1貫穿孔具有:直徑比前述支撐構件之最大直徑大的第1孔部;以及以均一的寬度從前述第1孔部的端部延伸至與前述臂部之前端側不同的一側,且該寬度與前述小徑部之直徑大致相等的第2孔部;前述固定部係藉由從前述第2孔部的側壁延伸的開縫而形成,且為用來卡止前述支撐構件的爪部。 The socket mounting structure according to the second aspect of the invention, wherein the support member is formed in a columnar shape, and has a small diameter portion provided on the distal end side and having a smaller diameter than the other portion, wherein the first through hole has a diameter larger than that a first hole portion having a maximum diameter of the support member; and a uniform width extending from an end portion of the first hole portion to a side different from a front end side of the arm portion, and the width and a diameter of the small diameter portion The second hole portion is substantially equal; the fixing portion is formed by a slit extending from a side wall of the second hole portion, and is a claw portion for locking the support member. 如申請專利範圍第2項或第3項所述之插座安裝構造,其中,在前述兩個臂部分別設有藉由將與彼此相對向之側相反之一側的緣端部折彎而形成的彎曲部。 The socket mounting structure according to the second or third aspect of the invention, wherein the two arm portions are respectively formed by bending an edge end portion on a side opposite to the side opposite to each other. The bend. 如申請專利範圍第2項所述之插座安裝構造,其中,在前述保持構件設有可供螺絲螺合的螺絲孔,在前述臂部設有與前述螺絲孔相應地朝板厚方向貫穿的第2貫穿孔,前述保持構件與前述彈簧構件係藉由插通在前述第2貫穿孔且螺合在前述螺絲孔的前述螺絲而連結。 The socket mounting structure according to the second aspect of the invention, wherein the holding member is provided with a screw hole through which a screw can be screwed, and the arm portion is provided with a thread penetrating in a thickness direction corresponding to the screw hole. In the 2 through hole, the holding member and the spring member are coupled by a screw that is inserted into the second through hole and screwed into the screw hole. 如申請專利範圍第1項所述之插座安裝構造,其中,前述保持構件具有兩個槽口部,該槽口部係分別設在 上表面側之相對向的外緣側,且沿著該外緣形成切口,並引導前述彈簧構件在前述保持構件上的安裝位置。 The socket mounting structure according to claim 1, wherein the holding member has two notch portions, and the notch portions are respectively disposed at The opposite outer edge side of the upper surface side, and a slit is formed along the outer edge, and guides the mounting position of the spring member on the aforementioned holding member. 一種彈簧構件,係為了將插座安裝於基板而使用的板狀的彈簧構件,該插座具有:以長邊方向的兩端分別與前述基板及被接觸體接觸的複數個接觸探針;依照預定的圖案收容並保持前述複數個接觸探針的探針保持具;以及設在該探針保持具周圍的保持構件;該彈簧構件之特徵為:形成有複數個第1貫穿孔,其係朝板厚方向貫穿,在相對於載置於前述基板上的前述保持構件朝前述基板側施加荷重的狀態下,供從前述基板的主面延伸出去且分別插通在設於前述保持構件的插通孔的複數個支撐構件插通,並且具有固定部,其係形成複數個前述第1貫穿孔中的至少一個第1貫穿孔之側壁的一部分,以保持並固定前述支撐構件。 A spring member is a plate-shaped spring member used for mounting a socket on a substrate, the socket having: a plurality of contact probes respectively contacting the substrate and the contacted body at both ends in the longitudinal direction; a pattern holder for accommodating and holding the plurality of contact probes; and a holding member disposed around the probe holder; the spring member is characterized in that a plurality of first through holes are formed, which are formed toward the plate thickness The direction penetrates and extends from the main surface of the substrate in a state in which the holding member placed on the substrate is loaded toward the substrate side, and is respectively inserted into the insertion hole provided in the holding member. The plurality of support members are inserted and have a fixing portion that forms a part of a side wall of at least one of the plurality of first through holes to hold and fix the support member.
TW103140404A 2013-11-22 2014-11-21 Socket mounting constuction and spring member TWI548159B (en)

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TWI554763B (en) * 2015-10-28 2016-10-21 旺矽科技股份有限公司 Probe head

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EP3112881A1 (en) * 2015-07-02 2017-01-04 Multitest elektronische Systeme GmbH System for mounting a test socket and a test board to each other, test board and test socket
US11382231B2 (en) 2020-04-30 2022-07-05 Tyco Electronics Japan G.K. Socket connector and cable assembly for a communication system

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JP2004325306A (en) * 2003-04-25 2004-11-18 Yokowo Co Ltd Coaxial probe for inspection, and inspection unit using the same
JP4755267B2 (en) * 2005-03-10 2011-08-24 山一電機株式会社 Contact terminal cartridge
JP5828734B2 (en) * 2011-10-07 2015-12-09 株式会社エンプラス Socket for electrical parts
JP5972366B2 (en) * 2012-05-22 2016-08-17 日本発條株式会社 Socket mounting structure and spring member

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TWI554763B (en) * 2015-10-28 2016-10-21 旺矽科技股份有限公司 Probe head

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JP6170176B2 (en) 2017-07-26

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