TW201508954A - Optoelectronic semiconductor device and fabricating method thereof - Google Patents
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本發明是有關於一種半導體封裝結構及其製作方法,且特別是有關於一種光電半導體元件及其製作方法。 The present invention relates to a semiconductor package structure and a method of fabricating the same, and more particularly to an optoelectronic semiconductor component and a method of fabricating the same.
發光半導體元件具有低耗電量、低發熱量、操作壽命長、耐撞擊、體積小、反應速度快、無汞以及可發出穩定波長的色光等良好光電特性,隨著光電科技的進步,已被視為新世代光源的較佳選擇之一。 The light-emitting semiconductor element has good photoelectric characteristics such as low power consumption, low heat generation, long operating life, impact resistance, small volume, fast reaction speed, no mercury, and color light which can emit stable wavelength. With the advancement of photoelectric technology, it has been One of the better choices for new generation light sources.
以白光發光二極體(Light Emitting diode;LED)元件為例,傳統上係在封裝設計中係採用銲線(Wire bonding)來進行晶片的串接。然而,因打線製程上的限制,晶片與晶片之間必須預留銲線距離,不僅造成封裝結構尺寸大幅增加,而限制了晶片矩陣的構裝數量,不利於元件的微小化。再者,當使用晶片矩陣進行多顆晶片封裝時,由於晶片排列較為分散,更容易影響螢光層塗佈的均勻性,不僅會造成元件後續製程良率偏低的問題,更會因為螢光層混光不均勻,造成白光發光二極體元件偏光或偏色的問題。 For example, a white light emitting diode (LED) component is conventionally used in a package design in which wire bonding is performed for wire bonding. However, due to limitations in the wire bonding process, the wire bonding distance must be reserved between the wafer and the wafer, which not only causes a large increase in the size of the package structure, but also limits the number of wafer matrix structures, which is disadvantageous for miniaturization of components. Furthermore, when a wafer matrix is used for multi-chip packaging, since the wafer arrangement is relatively dispersed, it is more likely to affect the uniformity of the coating of the phosphor layer, which not only causes a problem that the yield of the subsequent processing of the component is low, but also because of the fluorescence. The layer is mixed unevenly, causing problems of polarized or color cast of the white light emitting diode element.
因此,有需要提供一種先進的光電半導體晶片封裝結構及其製作方法,解決習知技術所面臨的問題。 Therefore, there is a need to provide an advanced optoelectronic semiconductor chip package structure and a method of fabricating the same that solves the problems faced by the prior art.
本發明一方面是在提供一種光電半導體元件,包括基 材、第一實心介層插塞、光電半導體晶片、螢光層以及封膠體。其中,第一實心介層插塞貫穿基材。光電半導體晶片,具有一第一電極,對準並與第一實心介層插塞電性接觸。螢光層覆蓋於光電半導體晶片之至少一表面上。封膠體包覆基材、光電半導體晶片以及螢光層。 One aspect of the present invention is to provide an optoelectronic semiconductor component, including a substrate Materials, first solid via plugs, optoelectronic semiconductor wafers, phosphor layers, and encapsulants. Wherein, the first solid interlayer plug penetrates the substrate. The optoelectronic semiconductor wafer has a first electrode that is aligned and in electrical contact with the first solid via plug. The phosphor layer covers at least one surface of the optoelectronic semiconductor wafer. The encapsulant encapsulates the substrate, the optoelectronic semiconductor wafer, and the phosphor layer.
在本發明的一實施例之中,光電半導體元件更包括:位於 基材第一表面上的第一圖案化金屬層,以及位於基材第二表面上的第二圖案化金屬層。其中第二表面位於基材上相對於第一表面的相反一側。第一圖案化金屬層,具有至少一第一銲墊,對準且與第一實心介層插塞直接連觸;第二圖案化金屬層,具有至少一第二銲墊,對準且與第一實心介層插塞直接接觸。 In an embodiment of the invention, the optoelectronic semiconductor component further comprises: a first patterned metal layer on the first surface of the substrate, and a second patterned metal layer on the second surface of the substrate. Wherein the second surface is on the opposite side of the substrate relative to the first surface. a first patterned metal layer having at least one first pad aligned and directly in contact with the first solid via plug; the second patterned metal layer having at least one second pad aligned and aligned A solid via plug is in direct contact.
在本發明的一實施例之中,第一電極係經由第一銲墊與 第一實心介層插塞電性連接。 In an embodiment of the invention, the first electrode is via the first pad The first solid via plug is electrically connected.
在本發明的一實施例之中,光電半導體元件更包含:與 基材結合的一承載基板,藉由承載基板和封膠體,可將基材、發光二極體晶片以及螢光層與外部空氣隔離。 In an embodiment of the invention, the optoelectronic semiconductor component further comprises: The substrate is bonded to a carrier substrate, and the substrate, the LED wafer, and the phosphor layer are separated from the outside air by the carrier substrate and the encapsulant.
在本發明的一實施例之中,承載基板具有與第二銲墊直 接接觸的金屬線路。 In an embodiment of the invention, the carrier substrate has a straight line with the second pad Contact the metal line.
在本發明的一實施例之中,光電半導體元件更包含:貫 穿基材的第二實心介層插塞,對準且與光電半導體晶片的第二電極電性接觸。 In an embodiment of the invention, the optoelectronic semiconductor component further comprises: A second solid via plug of the substrate is aligned and in electrical contact with the second electrode of the optoelectronic semiconductor wafer.
本發明另一方面是在提供一種光電半導體元件的製作 方法,包含下述步驟:首先提供一基材以及貫穿基材的第一實心介層插塞。接著,將光電半導體晶片的第一電極,對準並與第一實心介層插塞電性接觸。然後,於光電半導體晶片之至少一個表面,塗佈螢光 層。後續,以封膠體包覆基材、發光半導體晶片以及螢光層。 Another aspect of the present invention is to provide an optoelectronic semiconductor component The method comprises the steps of first providing a substrate and a first solid via plug extending through the substrate. Next, the first electrode of the optoelectronic semiconductor wafer is aligned and in electrical contact with the first solid via plug. Then, coating the phosphor on at least one surface of the optoelectronic semiconductor wafer Floor. Subsequently, the substrate, the light-emitting semiconductor wafer, and the phosphor layer are coated with a sealant.
在本發明的一實施例之中,提供基材與第一實心介層插 塞的歩驟,更包括:於基材的第一表面上,形成具有至少一個第一銲墊的第一圖案化金屬層,使第一銲墊對準且與第一實心介層插塞直接接觸;以及於基材的第二表面上,形成具有至少一個第二銲墊的第二圖案化金屬層,對準且與第一實心介層插塞直接接觸,其中第二表面位於基材上相對於第一表面的相反一側。 In an embodiment of the invention, a substrate and a first solid interlayer are provided The step of plugging further includes: forming a first patterned metal layer having at least one first pad on the first surface of the substrate, aligning the first pad and directly interfacing with the first solid via Contacting; and forming a second patterned metal layer having at least one second pad on the second surface of the substrate, aligned and in direct contact with the first solid via plug, wherein the second surface is on the substrate The opposite side of the first surface.
在本發明的一實施例之中,提供基材與第一實心介層插 塞的歩驟,更包括於第一圖案化金屬層之上,形成一圖案化絕緣層,將第一銲墊暴露於外。 In an embodiment of the invention, a substrate and a first solid interlayer are provided The plugging step is further included on the first patterned metal layer to form a patterned insulating layer to expose the first bonding pad.
在本發明的一實施例之中,將光電半導體晶片的第一電 極,對準並與第一實心介層插塞電性接觸的步驟,包括使用錫球來連接第一電極與第一銲墊。 In an embodiment of the invention, the first electricity of the optoelectronic semiconductor wafer The step of aligning and electrically contacting the first solid via plug includes using a solder ball to connect the first electrode to the first pad.
在本發明的一實施例之中,光電半導體元件的製作方法 更包括,將一承載基板與基材結合,並使第二銲墊與該承載基板的金屬線路電性連接。 In an embodiment of the invention, a method of fabricating an optoelectronic semiconductor component The method further includes bonding a carrier substrate to the substrate and electrically connecting the second pad to the metal line of the carrier substrate.
在本發明的一實施例之中,將承載基板與基材結合的步 驟,包括使用錫球,連接承載基板的金屬線路與第二銲墊。 In an embodiment of the invention, the step of bonding the carrier substrate to the substrate The method includes using a solder ball to connect the metal line of the carrier substrate with the second pad.
在本發明的一實施例之中,將封膠體包覆基材、光電半 導體晶片以及螢光層的步驟,包括以封膠體包覆基材、光電半導體晶片、螢光層以及一部分的承載基板,藉以將基材、光電半導體晶片以及螢光層與外部空氣隔離。 In an embodiment of the invention, the encapsulant is coated on the substrate, and the photoelectric half The step of the conductor wafer and the phosphor layer includes covering the substrate, the optoelectronic semiconductor wafer, the phosphor layer, and a portion of the carrier substrate with the encapsulant, thereby isolating the substrate, the optoelectronic semiconductor wafer, and the phosphor layer from the outside air.
在本發明的一實施例之中,光電半導體元件的製作方法 更包括,提供貫穿基材的第二實心介層插塞,使光電半導體晶片的至少一個第二電極,對準且與第二實心介層插塞電性連接。 In an embodiment of the invention, a method of fabricating an optoelectronic semiconductor component Furthermore, a second solid via plug is provided through the substrate such that at least one second electrode of the optoelectronic semiconductor wafer is aligned and electrically connected to the second solid via plug.
根據上述實施例,本發明的是提供一種光電半導體元 件,其係採用覆晶接合(flip chip bonding)方式,將至少一光電半導體晶片的電極,對準並且使其與貫穿基材的實心介層插塞銲墊電性連接。之後,再將螢光層覆蓋於光電半導體晶片之至少一表面上,並以封膠體包覆基材、光電半導體晶片以及螢光層。 According to the above embodiment, the present invention provides an optoelectronic semiconductor element The device is formed by flip chip bonding, and the electrodes of at least one of the optoelectronic semiconductor wafers are aligned and electrically connected to the solid via plugs of the substrate. Thereafter, the phosphor layer is overlaid on at least one surface of the optoelectronic semiconductor wafer, and the substrate, the optoelectronic semiconductor wafer, and the phosphor layer are coated with an encapsulant.
相較於習知打線封裝技術,光電半導體晶片在進行封裝時,封裝結構必須橫向延伸,方能使打線與基材的銲墊電性連接。採用覆晶封裝結構的光電半導體晶片,其與晶片電極係縱向對準下方的實心介層插塞接觸,所需要的封裝尺寸較小,有利於光電半導體元件的微小化。 Compared with the conventional wire-bonding technology, when the optoelectronic semiconductor chip is packaged, the package structure must be laterally extended to electrically connect the wire to the pad of the substrate. The optoelectronic semiconductor wafer adopting the flip chip package structure is in contact with the solid via plug under the longitudinal alignment of the wafer electrode system, and the required package size is small, which is advantageous for miniaturization of the optoelectronic semiconductor component.
另外,由於封裝尺寸較小,可使光電半導體晶片排列更加緊密,當進行螢光層塗佈與封裝時,更可增加各個光電半導體元件之螢光層的均勻性,解決習知光電半導體元件偏光或偏色的問題。再加上,本發明的覆晶封裝技術,所採用的實心介層插塞,可有效率地將光電半導體晶片所產生的熱,傳導到基材背面,相較於習知的打線封裝技術,其散熱效果更佳,可提升光電半導體元件的效能。 In addition, due to the small package size, the optoelectronic semiconductor wafer can be arranged more closely. When the phosphor layer is coated and packaged, the uniformity of the phosphor layers of the respective optoelectronic semiconductor components can be increased, and the polarized light of the conventional optoelectronic semiconductor components can be solved. Or the problem of color cast. In addition, the flip chip packaging technology of the present invention uses a solid via plug to efficiently transfer the heat generated by the optoelectronic semiconductor wafer to the back surface of the substrate, compared to conventional wire bonding technology. The heat dissipation effect is better, and the performance of the optoelectronic semiconductor component can be improved.
100‧‧‧光電半導體元件 100‧‧‧Optoelectronic semiconductor components
101‧‧‧基材 101‧‧‧Substrate
101a‧‧‧基材的第一表面 101a‧‧‧ First surface of the substrate
101b‧‧‧基材的第二表面 101b‧‧‧Second surface of the substrate
102a‧‧‧實心介層插塞 102a‧‧‧solid interlayer plug
102b‧‧‧實心介層插塞 102b‧‧‧solid interlayer plug
103‧‧‧圖案化金屬層 103‧‧‧ patterned metal layer
103a‧‧‧銲墊 103a‧‧‧ pads
103b‧‧‧銲墊 103b‧‧‧ solder pads
104‧‧‧圖案化金屬層 104‧‧‧ patterned metal layer
104a‧‧‧銲墊 104a‧‧‧ pads
104b‧‧‧銲墊 104b‧‧‧ solder pads
105‧‧‧圖案化絕緣層 105‧‧‧patterned insulation
106‧‧‧光電半導體晶片 106‧‧‧Optoelectronic semiconductor wafer
106a‧‧‧光電半導體晶片的電極 106a‧‧‧Electroelectric semiconductor wafer electrodes
106b‧‧‧光電半導體晶片的電極 106b‧‧‧electrodes of optoelectronic semiconductor wafers
106c‧‧‧光電半導體晶片的上表面 106c‧‧‧ upper surface of optoelectronic semiconductor wafer
106d‧‧‧光電半導體晶片的側壁 106d‧‧‧ sidewalls of optoelectronic semiconductor wafers
107‧‧‧錫球 107‧‧‧ solder balls
108‧‧‧承載基板 108‧‧‧Loading substrate
108a‧‧‧金屬線路 108a‧‧‧Metal lines
109‧‧‧螢光層 109‧‧‧Fluorescent layer
110‧‧‧錫球 110‧‧‧ solder balls
111‧‧‧絕緣膠 111‧‧‧Insulating adhesive
112‧‧‧封膠體 112‧‧‧ Sealant
201‧‧‧基材 201‧‧‧Substrate
209‧‧‧螢光層 209‧‧‧Fluorescent layer
212‧‧‧晶圓切割步驟 212‧‧‧ Wafer cutting steps
300‧‧‧光電半導體元件 300‧‧‧Optoelectronic semiconductor components
308‧‧‧承載基板 308‧‧‧bearing substrate
312‧‧‧封膠體體 312‧‧‧ Sealing body
圖1A至1G係根據本發明的一實施例所繪示之製作光電半導體元件100的結構剖面圖。 1A to 1G are cross-sectional views showing the structure of an optoelectronic semiconductor device 100 according to an embodiment of the present invention.
圖2係根據本發明的另一實施例所繪示,同時在複數個光電半導體晶片上塗佈螢光層的結構剖面圖。 2 is a cross-sectional view showing a structure in which a phosphor layer is coated on a plurality of optoelectronic semiconductor wafers in accordance with another embodiment of the present invention.
圖3係根據本發明的一實施例所繪示之光電半導體元件的結構剖面圖。 3 is a cross-sectional view showing the structure of an optoelectronic semiconductor device according to an embodiment of the invention.
本發明是在提供一種具有較小封裝尺寸的光電半導體 元件及其製作方法,可增加光電半導體元件之螢光層的均勻性,解決習知光電半導體元件因螢光層混光不均,所造成的偏光或偏色等問題。為讓本發明之上述和其他目的、特徵和優點能更明顯易懂,下文特舉數個較佳實施例,並配合所附圖式,作詳細說明如下。 The present invention is to provide an optoelectronic semiconductor having a small package size The device and the method for fabricating the same can increase the uniformity of the phosphor layer of the optoelectronic semiconductor device, and solve the problems of polarized light or color cast caused by uneven light mixing of the fluorescent layer. The above and other objects, features and advantages of the present invention will become more <RTIgt;
請參照圖1A至1G,圖1A至1G係根據本發明的一實施例 所繪示之製作光電半導體元件100的結構剖面圖。製作光電半導體元件100的方法包括下述步驟:首先提供具有一第一表面101a以及第二表面101b的基材101(如圖1A所繪示)。其中,第二表面101b位於基材101上,相對於第一表面101a的相反一側。在本發明的一些實施例之中,基材101可以是導線架(lead frame)、印刷電路板(Printing Circuit Board,PCB)、軟性電路板、陶瓷基板或其他任何之晶粒承載器(die carrier)。而在本實施例之中,基材101係一印刷電路板,其材質可以例如是雙馬來醯亞胺-三氮雜苯樹脂(bismaleimide-triazine resin,BT),或者是其他類似材料。 1A to 1G, FIGS. 1A to 1G are diagrams according to an embodiment of the present invention. A cross-sectional view showing the structure of the photo-electric semiconductor device 100 is shown. The method of fabricating the optoelectronic semiconductor component 100 includes the steps of first providing a substrate 101 having a first surface 101a and a second surface 101b (as shown in FIG. 1A). The second surface 101b is located on the substrate 101 opposite to the first surface 101a. In some embodiments of the present invention, the substrate 101 may be a lead frame, a printed circuit board (PCB), a flexible circuit board, a ceramic substrate, or any other die carrier (die carrier) ). In the present embodiment, the substrate 101 is a printed circuit board, and the material thereof may be, for example, bismaleimide-triazine resin (BT), or other similar materials.
之後,於基材101之中,形成至少一個貫穿基材101的實 心介層插塞,例如實心介層插塞102a和102b,由基材101的第一表面101a延伸至第二表面101b(如圖1B所繪示)。在本發明的一些實施例之中,實心介層插塞102a和102b,則係貫穿基材101的金屬(例如銅質或鋁質)插塞。 Thereafter, at least one of the through substrates 101 is formed in the substrate 101. Cardiac interlayer plugs, such as solid via plugs 102a and 102b, extend from first surface 101a of substrate 101 to second surface 101b (as depicted in Figure IB). In some embodiments of the invention, the solid via plugs 102a and 102b are metal (e.g., copper or aluminum) plugs that extend through the substrate 101.
然後,於基材101的第一表面101a上,形成一圖案化金 屬層103,其中圖案化金屬層102至少包含一個銲墊(例如銲墊103a和103b),並且使銲墊103a和103b分別對準實心介層插塞102a和102b,且與實心介層插塞102a和102b直接連接。並於基材101的第二表面101b上,形成另一個圖案化金屬層104,其中圖案化金屬層103至少包含一 個銲墊(例如銲墊104a和104b),使銲墊104a和104b分別對準實心介層插塞102a和102b,且與實心介層插塞102a和102b直接連接(如圖1B所繪示)。 Then, on the first surface 101a of the substrate 101, a patterned gold is formed. a layer 103 in which the patterned metal layer 102 includes at least one pad (e.g., pads 103a and 103b) and the pads 103a and 103b are aligned with the solid via plugs 102a and 102b, respectively, and with a solid via plug 102a and 102b are directly connected. And forming another patterned metal layer 104 on the second surface 101b of the substrate 101, wherein the patterned metal layer 103 comprises at least one Pads (such as pads 104a and 104b), such that pads 104a and 104b are aligned with solid via plugs 102a and 102b, respectively, and are directly connected to solid via plugs 102a and 102b (as shown in FIG. 1B). .
而值得注意的是,雖然在本實施例之中,實心介層插塞 102a和102b,係先於圖案化金屬層103和104形成。但在其他實施例之中,實心介層插塞102a和102b及圖案化金屬層103或104的形成先後,並不以此為限。也可以在基材101的表面上先形成圖案化金屬層103或104,使銲墊103a和103b分別對準銲墊104a和104b。之後,再形成貫穿基材101的實心介層插塞102a和102b,使其對準且直接連接銲墊103a、103b、104a和104b。 It is worth noting that although in this embodiment, the solid interlayer plug 102a and 102b are formed prior to the patterned metal layers 103 and 104. However, in other embodiments, the formation of the solid via plugs 102a and 102b and the patterned metal layer 103 or 104 are not limited thereto. It is also possible to form the patterned metal layer 103 or 104 on the surface of the substrate 101 such that the pads 103a and 103b are aligned with the pads 104a and 104b, respectively. Thereafter, solid via plugs 102a and 102b are formed through the substrate 101 to align and directly connect the pads 103a, 103b, 104a and 104b.
接著,可選擇性的在金屬層103之上,形成一圖案化絕 緣層105,將銲墊103a和103b暴露於外(如圖1C所繪示)。在本發明的一些實施例之中,構成圖案化絕緣層105的材質,可以是例如二氧化矽、氮化矽、氮氧化矽、環氧樹脂(epoxy resin)或類似的絕緣材質。在本發明的另一些實施例之中,也可以不要製作此絕緣層105,將圖案化金屬層103暴露於外,直接定義銲墊103a和103的範圍,以節省成本。 Then, selectively forming a pattern on the metal layer 103 The edge layer 105 exposes the pads 103a and 103b to the outside (as shown in FIG. 1C). In some embodiments of the present invention, the material constituting the patterned insulating layer 105 may be, for example, ceria, tantalum nitride, hafnium oxynitride, epoxy resin or the like. In other embodiments of the present invention, the insulating layer 105 may not be formed, and the patterned metal layer 103 may be exposed to directly define the range of the pads 103a and 103 to save cost.
後續,提供至少一個光電半導體晶片106,並將光電半 導體晶片104的電極106a和106b,分別對準實心介層插塞102a和102b,並與實心介層插塞102a和102b電性接觸(如圖1D所繪示)。在本發明的一些實施例之中,光電半導體晶片106可以是發光二極體(Light-Emitting Diode,LED)晶片、有機發光二極體(Organic Light-Emitting Diode,OLED)晶片或雷射二極體(laser diode)晶片、光二極體(photodiode)晶片、電荷耦合元件(Charge-Coupled Device,CCD)晶片或太陽電池(solar cell)晶片。在本實施例之中,光電半導體晶片106係一發光二極體晶片,且此一發光二極體晶片的陰極與陽極電極(即電極104a和104b),係位於光電半導體晶片106的相同一側。 Subsequently, at least one optoelectronic semiconductor wafer 106 is provided, and the photo-electric half The electrodes 106a and 106b of the conductor wafer 104 are aligned with the solid via plugs 102a and 102b, respectively, and are in electrical contact with the solid via plugs 102a and 102b (as shown in FIG. 1D). In some embodiments of the present invention, the optoelectronic semiconductor wafer 106 may be a Light-Emitting Diode (LED) wafer, an Organic Light-Emitting Diode (OLED) wafer, or a laser diode. Laser diode wafer, photodiode wafer, charge-coupled device (CCD) wafer or solar cell wafer. In the present embodiment, the optoelectronic semiconductor wafer 106 is a light emitting diode wafer, and the cathode and anode electrodes (ie, the electrodes 104a and 104b) of the light emitting diode wafer are located on the same side of the optoelectronic semiconductor wafer 106. .
而使光電半導體晶片106的電極106a和106b,分別對準 並與實心介層插塞102a和102b電性接觸的方式,係將光電半導體晶片106放置於圖案化絕緣層105上,並使用錫球107將半導體晶片106的電極106a和106b,和暴露於外的銲墊103a和103b聯結。由於銲墊103a和103b係分別對準且直接連接實心介層插塞102a和102b;因此與銲墊103a和103b聯結的電極106a和106b,即可分別對準並與實心介層插塞102a和102b電性接觸。 The electrodes 106a and 106b of the optoelectronic semiconductor wafer 106 are aligned, respectively. And electrically contacting the solid via plugs 102a and 102b, the optoelectronic semiconductor wafer 106 is placed on the patterned insulating layer 105, and the electrodes 106a and 106b of the semiconductor wafer 106 are exposed to the outside using the solder balls 107. The pads 103a and 103b are coupled. Since the pads 103a and 103b are respectively aligned and directly connected to the solid via plugs 102a and 102b; the electrodes 106a and 106b coupled to the pads 103a and 103b are respectively aligned and aligned with the solid via plugs 102a and 102b electrical contact.
然後,於光電半導體晶片106的至少一個表面,塗佈螢 光層109。在本發明的一些實施例之中,在塗佈螢光層109之前,較佳會在錫球107以及電極106a和106b周邊,形成一絕緣膠111。之後,再於未被絕緣膠111覆蓋之光電半導體晶片106的上表面106c以及側壁106d上,塗佈螢光層109(如圖1E所繪示)。 Then, on at least one surface of the optoelectronic semiconductor wafer 106, a firefly is coated Light layer 109. In some embodiments of the present invention, an insulating paste 111 is preferably formed around the solder balls 107 and the electrodes 106a and 106b before the phosphor layer 109 is applied. Thereafter, a phosphor layer 109 (as shown in FIG. 1E) is applied over the upper surface 106c and the sidewall 106d of the optoelectronic semiconductor wafer 106 that is not covered by the insulating paste 111.
值得注意的是,前述的螢光層109塗佈步驟,可同時實 施於複數個光電半導體晶片106上。參照圖2,圖2係根據本發明的另一實施例所繪示,同時在複數個光電半導體晶片106上塗佈螢光層209的結構剖面圖。首先,藉由晶圓級製程(wafer-level processing),採用如圖1A至1D所示的步驟,將複數個光電半導體晶片106,以陣列型式排列並固定於基材101上。再同步地在複數個光電半導體晶片106上,進行如圖1E所示的螢光層209塗佈步驟。後續,進行晶圓切割(wafer dicing)步驟212,形成類似圖1E所示的結構。由於晶圓級製程,可將複數個光電半導體晶片106,緊密排列於基材101上,縮短相鄰二個光電半導體晶片106之間的間距。故而,在進行螢光層109塗佈步驟時,可增加各個光電半導體元件106之螢光層109的均勻性。 It should be noted that the aforementioned coating step of the phosphor layer 109 can be simultaneously performed. Applied to a plurality of optoelectronic semiconductor wafers 106. Referring to FIG. 2, FIG. 2 is a cross-sectional view showing a structure in which a phosphor layer 209 is coated on a plurality of optoelectronic semiconductor wafers 106 in accordance with another embodiment of the present invention. First, a plurality of optoelectronic semiconductor wafers 106 are arranged in an array pattern and fixed on a substrate 101 by wafer-level processing using steps as shown in FIGS. 1A to 1D. The phosphor layer 209 coating step as shown in FIG. 1E is performed on a plurality of optoelectronic semiconductor wafers 106 in synchronization. Subsequently, a wafer dicing step 212 is performed to form a structure similar to that shown in FIG. 1E. Due to the wafer level process, a plurality of optoelectronic semiconductor wafers 106 can be closely arranged on the substrate 101 to shorten the spacing between adjacent two optoelectronic semiconductor wafers 106. Therefore, the uniformity of the fluorescent layer 109 of each of the optoelectronic semiconductor elements 106 can be increased when the step of applying the phosphor layer 109 is performed.
接著請再參照圖1E,將與光電半導體晶片106結合的基 材101,固定於承載基板108上。在本發明的一些實施例之中,使用錫球110將基材101第二表面101的銲墊104a和104b與位於承載基板108上 的金屬線路108a連接,並且使光電半導體晶片106和承載基板108產生電性接觸(如圖1F所繪示)。在本發明的一些實施例之中,承載基板108可以是金屬核心的印刷電路板(Metal Core Printed Circuit Board,MCPCB)、陶瓷電路板(ceramic circuit board)或具有良好的熱傳導效果的基板。 Next, referring again to FIG. 1E, the base combined with the optoelectronic semiconductor wafer 106 will be used. The material 101 is fixed on the carrier substrate 108. In some embodiments of the present invention, the pads 104a and 104b of the second surface 101 of the substrate 101 are placed on the carrier substrate 108 using solder balls 110. The metal lines 108a are connected and electrically contact the optoelectronic semiconductor wafer 106 and the carrier substrate 108 (as shown in FIG. 1F). In some embodiments of the present invention, the carrier substrate 108 may be a metal core printed circuit board (MCPCB), a ceramic circuit board, or a substrate having good heat conduction effects.
由於本發明的實施例,係採用覆晶封裝結構,來對光電 半導體晶片106進行封裝。亦即是採用縱向對準,且直接和實心介層插塞102a和102b接觸的錫球107以及110,來使光電半導體晶片106固定於承載基板108上,並且與承載基板108的金屬線路108a產生電性連接。 因此封裝結構並不需要橫向延伸,所需要的封裝尺寸較小,有利於光電半導體元件100的微小化。且可使更多的光電半導體晶片106,緊密排列於承載基板108上,大幅提高光電半導體元件100的封裝密度(packaging density)。 Since the embodiment of the present invention adopts a flip chip package structure to optoelectronic The semiconductor wafer 106 is packaged. That is, the solder balls 107 and 110 which are longitudinally aligned and directly in contact with the solid via plugs 102a and 102b are used to fix the optoelectronic semiconductor wafer 106 to the carrier substrate 108 and to the metal trace 108a of the carrier substrate 108. Electrical connection. Therefore, the package structure does not need to be laterally extended, and the required package size is small, which is advantageous for miniaturization of the optoelectronic semiconductor device 100. Further, more optoelectronic semiconductor wafers 106 can be closely arranged on the carrier substrate 108, thereby greatly increasing the packaging density of the optoelectronic semiconductor device 100.
後續,以封膠體112包覆基材101、光電半導體晶片106、 螢光層109以及一部分的承載基板108,藉以將基材101、發光半導體晶106片以及螢光層109與外部空氣隔離,形成如圖1G所繪示的光電半導體晶片封裝結構100。 Subsequently, the substrate 101, the optoelectronic semiconductor wafer 106, and the encapsulant 112 are coated. The phosphor layer 109 and a portion of the carrier substrate 108 are used to isolate the substrate 101, the light-emitting semiconductor crystal 106, and the phosphor layer 109 from the outside air to form the optoelectronic semiconductor chip package structure 100 as shown in FIG. 1G.
其中,光電半導體元件100包括基材101、實心介層插塞 102a和102b、光電半導體晶片106、螢光層109、承載基板108以及封膠體112。其中,實心介層插塞102a和102b貫穿基材101。光電半導體晶片106,具有電極106a和106b,對準並與實心介層插塞102a和102b電性接觸。螢光層109覆蓋於光電半導體晶片106的上表面106c以及側壁106d上。基材101固定於承載基板108之上。封膠體112包覆基材101、光電半導體晶片106、螢光層109以及一部分的承載基板108上,藉以將基材101、發光半導體晶106片以及螢光層109與外部空氣隔離。 Wherein, the optoelectronic semiconductor component 100 comprises a substrate 101, a solid via plug 102a and 102b, optoelectronic semiconductor wafer 106, phosphor layer 109, carrier substrate 108, and encapsulant 112. Among them, the solid via plugs 102a and 102b penetrate the substrate 101. Optoelectronic semiconductor wafer 106, having electrodes 106a and 106b, is aligned and in electrical contact with solid via plugs 102a and 102b. The phosphor layer 109 covers the upper surface 106c of the optoelectronic semiconductor wafer 106 and the sidewall 106d. The substrate 101 is fixed on the carrier substrate 108. The encapsulant 112 covers the substrate 101, the optoelectronic semiconductor wafer 106, the phosphor layer 109, and a portion of the carrier substrate 108, thereby isolating the substrate 101, the light-emitting semiconductor crystal 106, and the phosphor layer 109 from the outside air.
在本發明的一些實施例中,封膠體112的材質,較佳可 以是環氧樹脂、矽膠或聚亞醯胺(Polyimide,PI)等透明的封膠體化合物(Molding Compounds)。凝固後的封膠體112,除可保護光電半導體元件100外,更可形成半球形的透明微透鏡結構,用來增進光電半導體元件100的光學效率。 In some embodiments of the present invention, the material of the encapsulant 112 is preferably It is a transparent Molding Compounds such as epoxy resin, silicone rubber or polyimide (PI). The solidified encapsulant 112, in addition to protecting the optoelectronic semiconductor component 100, can form a hemispherical transparent microlens structure for enhancing the optical efficiency of the optoelectronic semiconductor component 100.
雖然在本實施例中,封膠體112單一透明微透鏡結構, 僅包覆一個由基材101、發光半導體晶106,但本發明的其他實施例中並不以此為限。例如請參照圖3,圖3係根據本發明的一實施例所繪示之光電半導體元件300的結構剖面圖。其中,光電半導體元件300光電半導體晶片106的結構大致與光電半導體元件100相似,差別在於,光電半導體元件300中,由封膠體312所構成的單一透明微透鏡結構,可同時包覆複數個固定於承載基板208上的發光半導體晶106。 Although in the present embodiment, the encapsulant 112 has a single transparent microlens structure, Only one substrate 101 and the light-emitting semiconductor crystal 106 are coated, but other embodiments of the present invention are not limited thereto. For example, please refer to FIG. 3. FIG. 3 is a cross-sectional view showing the structure of an optoelectronic semiconductor device 300 according to an embodiment of the invention. The structure of the optoelectronic semiconductor component 300 is substantially similar to that of the optoelectronic semiconductor component 100. The difference is that in the optoelectronic semiconductor component 300, the single transparent microlens structure composed of the encapsulant 312 can be coated at the same time and fixed in plurality. The light-emitting semiconductor crystals 106 on the substrate 208 are carried.
根據上述實施例,本發明是提供一種光電半導體元件, 其係採用覆晶接合方式,將至少一光電半導體晶片的電極,直接與貫穿基材的實心介層插塞銲墊結合。之後,再將螢光層覆蓋於光電半導體晶片之至少一表面上,並以封膠體包覆基材、光電半導體晶片以及螢光層。 According to the above embodiment, the present invention provides an optoelectronic semiconductor component, The electrode of the at least one optoelectronic semiconductor wafer is directly bonded to the solid via plug through the substrate by a flip chip bonding method. Thereafter, the phosphor layer is overlaid on at least one surface of the optoelectronic semiconductor wafer, and the substrate, the optoelectronic semiconductor wafer, and the phosphor layer are coated with an encapsulant.
相較於習知打線封裝技術,光電半導體晶片在進行封裝 時,封裝結構必須橫向延伸,方能使打線與基材的銲墊電性連接。採用覆晶封裝結構的光電半導體晶片,其與晶片電極係縱向對準下方的實心介層插塞接觸,所需要的封裝尺寸較小,可使光電半導體晶片排列更加緊密有利於光電半導體元件的微小化。 Optoelectronic semiconductor wafers are packaged compared to conventional wire packaging technology When the package structure has to be extended laterally, the wire can be electrically connected to the pad of the substrate. The optoelectronic semiconductor wafer adopting the flip chip package structure is in contact with the solid via plug under the longitudinal alignment of the wafer electrode system, and the required package size is small, so that the optoelectronic semiconductor wafer arrangement is more tight and the optoelectronic semiconductor component is small. Chemical.
另外,當進行螢光層塗佈與封裝時,更可增加各個光電 半導體元件之螢光層的均勻性,解決習知光電半導體元件偏光或偏色的問題。再加上,本發明的覆晶封裝技術,所採用的實心介層插塞,可有效率地將光電半導體晶片所產生的熱,外扇到基材背面,相較於習知的打線封裝技術,其散熱效果更佳,可提升光電半導體元件的效 能。 In addition, when performing phosphor layer coating and packaging, it is possible to increase each photoelectric The uniformity of the phosphor layer of the semiconductor element solves the problem of polarized or color cast of the conventional optoelectronic semiconductor element. In addition, the flip chip packaging technology of the present invention uses a solid via plug to efficiently fan the heat generated by the optoelectronic semiconductor wafer to the back surface of the substrate, compared to conventional wire bonding technology. , its heat dissipation effect is better, which can improve the efficiency of optoelectronic semiconductor components can.
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明。任何該領域中具有通常知識者,在不脫離本發明之精神和範圍內,當可作些許之更動與潤飾。因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。 While the invention has been described above in the preferred embodiments, it is not intended to limit the invention. Anyone having ordinary knowledge in the field can make some changes and refinements without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims.
100‧‧‧光電半導體元件 100‧‧‧Optoelectronic semiconductor components
101‧‧‧基材 101‧‧‧Substrate
102a‧‧‧實心介層插塞 102a‧‧‧solid interlayer plug
102b‧‧‧實心介層插塞 102b‧‧‧solid interlayer plug
104a‧‧‧銲墊 104a‧‧‧ pads
104b‧‧‧銲墊 104b‧‧‧ solder pads
105‧‧‧圖案化絕緣層 105‧‧‧patterned insulation
106‧‧‧光電半導體晶片 106‧‧‧Optoelectronic semiconductor wafer
106a‧‧‧光電半導體晶片的電極 106a‧‧‧Electroelectric semiconductor wafer electrodes
106b‧‧‧光電半導體晶片的電極 106b‧‧‧electrodes of optoelectronic semiconductor wafers
106c‧‧‧光電半導體晶片的上表面 106c‧‧‧ upper surface of optoelectronic semiconductor wafer
106d‧‧‧光電半導體晶片的側壁 106d‧‧‧ sidewalls of optoelectronic semiconductor wafers
107‧‧‧錫球 107‧‧‧ solder balls
108‧‧‧承載基板 108‧‧‧Loading substrate
108a‧‧‧金屬線路 108a‧‧‧Metal lines
109‧‧‧螢光層 109‧‧‧Fluorescent layer
110‧‧‧錫球 110‧‧‧ solder balls
112‧‧‧封膠體 112‧‧‧ Sealant
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