TW201437434A - Electrolytic copper foil and process for producing same - Google Patents

Electrolytic copper foil and process for producing same Download PDF

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TW201437434A
TW201437434A TW103101442A TW103101442A TW201437434A TW 201437434 A TW201437434 A TW 201437434A TW 103101442 A TW103101442 A TW 103101442A TW 103101442 A TW103101442 A TW 103101442A TW 201437434 A TW201437434 A TW 201437434A
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copper foil
electrolytic copper
thiourea
electrolytic
tungsten
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TW103101442A
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Chinese (zh)
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Takeshi Ezura
Satoshi Yamazaki
Hirokazu Sasaki
Takeyoshi Matsuda
Kensaku Shinozaki
Satoru Zama
Kimiko Fujisawa
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Furukawa Electric Co Ltd
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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C32/00Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ
    • C22C32/001Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ with only oxides
    • C22C32/0015Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ with only oxides with only single oxides as main non-metallic constituents
    • C22C32/0021Matrix based on noble metals, Cu or alloys thereof
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C32/00Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ
    • C22C32/0094Non-ferrous alloys containing at least 5% by weight but less than 50% by weight of oxides, carbides, borides, nitrides, silicides or other metal compounds, e.g. oxynitrides, sulfides, whether added as such or formed in situ with organic materials as the main non-metallic constituent, e.g. resin
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D3/00Electroplating: Baths therefor
    • C25D3/02Electroplating: Baths therefor from solutions
    • C25D3/38Electroplating: Baths therefor from solutions of copper
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00Electrodes
    • H01M4/02Electrodes composed of, or comprising, active material
    • H01M4/64Carriers or collectors
    • H01M4/66Selection of materials
    • H01M4/661Metal or alloys, e.g. alloy coatings
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01MPROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00Electrodes
    • H01M4/02Electrodes composed of, or comprising, active material
    • H01M4/64Carriers or collectors
    • H01M4/66Selection of materials
    • H01M4/665Composites
    • H01M4/666Composites in the form of mixed materials
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10Energy storage using batteries

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Composite Materials (AREA)
  • Cell Electrode Carriers And Collectors (AREA)

Abstract

An electrolytic copper foil (1) characterized by comprising copper crystal grains (3) and, present inside the copper crystal grains (3) or at the boundaries thereamong, inclusions (5) having an average diameter of 0.5-100 nm, wherein the inclusions comprise an inorganic compound and/or an organic compound, the inorganic compound comprising an oxide of at least one metallic element selected from the group consisting of tungsten, molybdenum, titanium, and tellurium and the organic compound comprising at least one thiourea-based organic compound selected from the group consisting of thiourea, ethylenethiourea, tetramethylthiourea, and 1,3-dimethyl-2-thiourea.

Description

電解銅箔及其製造方法 Electrolytic copper foil and method of manufacturing same 發明領域 Field of invention

本發明關於一種電解銅箔,其用於採用合金負極活性物質之高容量鋰離子二次電池的負極集電體等。 The present invention relates to an electrolytic copper foil used for a negative electrode current collector or the like of a high capacity lithium ion secondary battery using an alloy negative electrode active material.

發明背景 Background of the invention

一直以來,電解銅箔被用於以剛性印刷線路板、柔性印刷線路板、電磁屏蔽材料、電池集電體及其他各種領域。 Electrolytic copper foil has been used for rigid printed wiring boards, flexible printed wiring boards, electromagnetic shielding materials, battery current collectors, and the like.

於該等領域內有關與聚醯亞胺薄膜貼合而成之柔性印刷線路板(以下稱“FPC”)之領域中,作為硬碟驅動器(以下稱“HDD”)懸架材料或卷帶自動結合(以下稱“TAB”)材料,要求提高銅箔之強度。 In the field of flexible printed wiring boards (hereinafter referred to as "FPC") which are bonded to polyimide film in these fields, as a hard disk drive (hereinafter referred to as "HDD") suspension material or tape automatic combination (hereinafter referred to as "TAB") material, it is required to increase the strength of the copper foil.

隨著HDD之高容量化的發展,大部分搭載於HDD上之懸架已從以往使用之鋼絲型懸架轉換為可相對於記憶媒體即碟片確保穩定之浮動磁頭之浮力及位置精度的配線一體型懸架。 With the development of high-capacity HDDs, most of the suspensions mounted on HDDs have been converted from conventionally used wire-type suspensions to wire-integrated types that ensure stable buoyancy and positional accuracy of floating heads with respect to memory media. Suspension.

該配線一體型懸架中分為以下三種類型,即:(1)FSA(flex suspension assembly,柔性懸臂組合)法懸架,對柔性印刷基板進行加工,並利用黏合劑使其貼合之類型;(2)CIS(circuit integrated suspension,線路一體懸臂)法懸架,對聚醯亞胺樹脂之前驅體即醯胺酸進行形狀加工後,使其形成聚醯亞胺,並再於所獲得之聚醯亞胺上實施電鍍加工,從而形成配線之類型;(3)TSA(trace suspension assembly,線路懸臂組合)法懸架,通過蝕刻加工將由不銹箔-聚醯亞胺樹脂-銅箔構成之3層構造之疊層體加工成規定形狀之類型。 The wiring integrated suspension is divided into the following three types, namely: (1) FSA (flex suspension assembly) suspension, which processes the flexible printed substrate and uses a bonding agent to make it fit; 2) CIS (circuit Integrated suspension, line-integrated cantilever method, suspension processing on the precursor of polyimine resin, ie, lysine, to form polyimine, and then electroplating on the obtained polyimine , thereby forming a type of wiring; (3) TSA (trace suspension assembly) suspension, processing a three-layer laminate composed of a stainless foil-polyimine resin-copper foil into a laminate by etching Specifies the type of shape.

其中,由於TSA法懸架將具有高強度之不銹箔與銅箔進行疊層,所以能夠容易地形成飛線,其形狀加工之自由度高,較為廉價並且尺寸精度高,因此正在被廣泛使用。 Among them, since the TSA suspension suspends the high-strength stainless foil and the copper foil, the flying wire can be easily formed, and the shape processing has a high degree of freedom of processing, is inexpensive, and has high dimensional accuracy, and is therefore widely used.

通過TSA法形成之疊層體係使用不銹箔之厚度為12~30μm左右、聚醯亞胺層之厚度為5~20μm左右、銅箔之厚度為7~14μm左右之材料製造。 The laminate system formed by the TSA method is made of a material having a thickness of about 12 to 30 μm in a stainless foil, a thickness of about 5 to 20 μm in a polyimide layer, and a thickness of about 7 to 14 μm in a copper foil.

製造疊層體時,首先於作為基體之不銹箔上塗佈聚醯亞胺樹脂前驅體含液。塗佈後,通過預熱除去溶劑,然後再進行加熱處理,使其形成聚醯亞胺,繼而於聚醯亞胺化之聚醯亞胺樹脂層上重疊銅箔,於300℃左右之溫度下進行加熱壓接後實施層壓,製成由不銹鋼層-聚醯亞胺層-銅層構成之疊層體。 When producing a laminate, first, a polyimide-containing resin precursor liquid is applied onto a stainless foil as a substrate. After coating, the solvent is removed by preheating, and then heat treatment is performed to form a polyimide, and then the copper foil is superposed on the polyimide layer of the polyamidimide resin at a temperature of about 300 ° C. After lamination by heating and pressure bonding, lamination was carried out to obtain a laminate comprising a stainless steel layer-polyimine layer-copper layer.

於該300℃左右之加熱下,不銹箔之尺寸基本無變化。然而,使用以往之電解銅箔時,電解銅箔會於300℃左右之溫度下退火,出現再結晶,軟化後會產生尺寸變化。因此,層壓後疊層體會產生翹起,產品之尺寸精度會降低。 Under the heating of about 300 ° C, the size of the stainless foil is substantially unchanged. However, when the conventional electrolytic copper foil is used, the electrolytic copper foil is annealed at a temperature of about 300 ° C, and recrystallization occurs, and dimensional change occurs after softening. Therefore, the laminated body is warped after lamination, and the dimensional accuracy of the product is lowered.

為使層壓後疊層體不產生翹起,要求提供一種加熱時尺寸變化儘可能小之銅箔。 In order to prevent the laminate from being lifted after lamination, it is required to provide a copper foil having a dimensional change as small as possible during heating.

作為滿足該要求之銅箔,一直以來使用軋製銅合金箔。軋製銅合金箔於300℃左右之溫度下不易發生退火,加熱時之尺寸變化小,機械強度變化亦少。 As a copper foil which satisfies this requirement, a rolled copper alloy foil has been conventionally used. The rolled copper alloy foil is less likely to be annealed at a temperature of about 300 ° C, and the dimensional change during heating is small, and the mechanical strength is also less changed.

所謂軋製銅合金箔,係指對於以銅為主成分,含有錫、鋅、鐵、鎳、鉻、磷、鋯、鎂、矽等除銅以外之至少一種以上元素之銅合金通過軋製加工箔化而成的箔。根據元素之種類及組合,該等軋製銅合金箔中之一部分於300℃左右之加熱下不易發生退火,拉伸強度、0.2%耐力、延伸率等亦基本不變化。 The rolled copper alloy foil refers to a copper alloy containing at least one or more elements other than copper such as tin, zinc, iron, nickel, chromium, phosphorus, zirconium, magnesium, or antimony as a main component of copper. Foiled foil. Depending on the type and combination of the elements, one of the rolled copper alloy foils is less likely to be annealed under heating at about 300 ° C, and tensile strength, 0.2% endurance, elongation, and the like are not substantially changed.

例如Cu-0.2mass%Cr-0.1mass%Zr-0.2mass%Zn(Cu-2000ppmCr-1000ppmZr-2000ppmZn)這類軋製銅合金箔除TSA法懸架以外,還可適用於HDD懸架材料。 For example, Cu-0.2mass%Cr-0.1mass%Zr-0.2mass%Zn (Cu-2000ppmCr-1000ppmZr-2000ppmZn) such rolled copper alloy foils can be applied to HDD suspension materials in addition to the TSA suspension.

此外,TAB材料亦與TSA法懸架、HDD懸架材料同樣,要求銅箔具有高強度。 In addition, the TAB material is also required to have high strength in copper foil, similar to the TSA suspension and the HDD suspension material.

TAB產品中,將IC晶片之多個端子直接與在位於產品之幾乎中央部之裝置孔處配置的內引線(飛線)相結合。 In the TAB product, a plurality of terminals of the IC chip are directly combined with inner leads (flying wires) disposed at the device holes located at almost the center of the product.

此時之結合可使用結合裝置(焊接機),通過瞬間通電加熱,施加一定之結合壓力。此時,對電解銅箔進行蝕刻形成而得之內部引線會存在由於結合壓力而被拉伸,導致延伸率過大之問題。 In this case, a combination device (welding machine) can be used to apply a certain bonding pressure by instantaneous energization heating. At this time, the inner lead obtained by etching the electrolytic copper foil may be stretched due to the bonding pressure, resulting in an excessive elongation.

通過提高電解銅箔之強度,內部引線難以發生鬆弛及斷裂。因此,若電解銅箔之強度過小,則會因塑性變形出現以下問題,即內部引線發生鬆弛,嚴重時斷裂。 By increasing the strength of the electrolytic copper foil, internal leads are less likely to be slack and broken. Therefore, if the strength of the electrolytic copper foil is too small, the following problems occur due to plastic deformation, that is, the inner lead is slack and severely broken.

另一方面,通過使銅箔表面低粗度化,於藉由蝕刻形成TAB配線時可防止配線側壁因過度蝕刻而過度變細,可蝕刻形成細線。其原因如下所述:通常,HDD、TAB之配線係於聚醯亞胺基材上加熱層壓銅箔後施加保護膜,通過蝕刻而形成。此時,若銅箔表面粗度較粗,銅箔陷入聚醯亞胺表面,欲通過蝕刻除去陷入部分時,配線之側壁會被過度蝕刻,致使線寬變細。為避免發生該情況,期望實現銅箔表面之低粗度化。 On the other hand, when the surface of the copper foil is made low in thickness, when the TAB wiring is formed by etching, it is possible to prevent the wiring sidewall from being excessively thinned by over-etching, and etching can form a thin line. The reason for this is as follows: Generally, the wiring of HDD and TAB is formed by heating a laminated copper foil on a polyimide substrate, and then applying a protective film to form a protective film. At this time, if the surface roughness of the copper foil is coarse, the copper foil is caught on the surface of the polyimide, and when the trapped portion is removed by etching, the side walls of the wiring are excessively etched, resulting in a narrow line width. In order to avoid this, it is desirable to achieve a low thickness of the surface of the copper foil.

因此,為了將內部引線之線寬變細,要求使用之電解銅箔具有低粗度化之粗面,並且具有高強度。 Therefore, in order to make the line width of the inner lead thinner, the electrolytic copper foil to be used is required to have a rough surface having a low thickness and a high strength.

該情況也要求銅箔或銅合金箔於常態(25℃、1個大氣壓,以下相同)下強度高,且加熱之後亦為高強度。 In this case, it is also required that the copper foil or the copper alloy foil has a high strength in a normal state (25 ° C, 1 atm, the same below), and is also high in strength after heating.

用於TAB時,使用將銅箔與聚醯亞胺層貼合之2層FPC或將銅箔、聚醯亞胺層及黏合劑層貼合之3層FPC。3層FPC在銅箔上貼合聚醯亞胺時,使用環氧類黏合劑,於180℃左右之溫度下進行貼合。此外,使用了聚醯亞胺類黏合劑之2層FPC於300℃左右之溫度下進行貼合。 For TAB, a two-layer FPC in which a copper foil and a polyimide layer are bonded or a three-layer FPC in which a copper foil, a polyimide layer, and a binder layer are bonded is used. When a three-layer FPC is bonded to a copper foil with a polyimide, it is bonded at a temperature of about 180 ° C using an epoxy-based adhesive. Further, two layers of FPC using a polyimide pigment adhesive were bonded at a temperature of about 300 °C.

以往之高強度電解銅箔由於使用有機類添加劑,常態下之機械強度較大,即使於180℃左右進行加熱,機械強度亦基本 不會發生變化,但於300℃左右下進行加熱時,則會發生退火並進行再結晶,因此會迅速軟化,機械強度會顯著降低。 In the past, high-strength electrolytic copper foils have high mechanical strength under normal conditions due to the use of organic additives. Even when heated at about 180 ° C, the mechanical strength is basically It does not change, but when it is heated at about 300 ° C, annealing occurs and recrystallization is performed, so that it softens rapidly and the mechanical strength is remarkably lowered.

已知使用有機類添加劑實現高強度化之原因在於,電解時源自銅箔內所攝入之添加劑的有機分子會阻礙再結晶。以往之高強度箔於300℃左右再結晶係有機分子之分解溫度所致,目前業界正在研究使用分解溫度更高的無機添加劑。 It is known that the use of an organic additive to achieve high strength is that organic molecules derived from an additive taken up in the copper foil during electrolysis hinder recrystallization. In the past, high-strength foils were recrystallized at around 300 ° C due to the decomposition temperature of organic molecules. Currently, the industry is investigating the use of inorganic additives with higher decomposition temperatures.

例如,專利文獻1中記載有於硫酸酸性硫酸銅電解液中加入鎢或鎢化合物,進而加入膠以及20~120mg/L之氯化物離子,用由此而得的電解液製造電解銅箔之方法。該文獻稱,作為其效果,可製造180℃時之加熱延伸率為3%以上、粗面粗度較大、針孔發生少之銅箔。 For example, Patent Document 1 discloses a method of producing an electrolytic copper foil by adding tungsten or a tungsten compound to a sulfuric acid acidic copper sulfate electrolyte, further adding a gel, and a chloride ion of 20 to 120 mg/L, and using the electrolytic solution thus obtained. . According to this document, as a result, a copper foil having a heating elongation of 3% or more at 180 ° C, a large rough surface roughness, and a small occurrence of pinholes can be produced.

專利文獻2中記載有一種含有銀(Ag)之電解銅箔。 Patent Document 2 describes an electrolytic copper foil containing silver (Ag).

該文獻稱,使用添加有會賦予規定濃度之銀離子之銀鹽的硫酸酸性硫酸銅電解液,製造電解銅箔,藉此,銀共析存在於該電解銅箔中。 This document states that an electrolytic copper foil is produced by using a sulfuric acid acidic copper sulfate electrolyte to which a silver salt of a predetermined concentration of silver ions is added, whereby silver eutectoid is present in the electrolytic copper foil.

專利文獻3中記載有一種分散強化型電解銅箔,其中銅作為微細晶粒存在,SnO2作為超細顆粒分散著。 Patent Document 3 describes a dispersion-strengthened electrolytic copper foil in which copper is present as fine crystal grains and SnO 2 is dispersed as ultrafine particles.

根據專利文獻3中之記載,使硫酸酸性硫酸銅電解液中含有銅離子、硫酸根離子及錫離子以及聚乙二醇等有機添加劑,利用含氧氣體實施鼓泡處理,使電解液中生成SnO2超細顆粒,使用該電解液獲得上述分散強化型電解銅箔。 According to the description in Patent Document 3, the sulfuric acid acidic copper sulfate electrolyte contains an organic additive such as copper ions, sulfate ions, tin ions, and polyethylene glycol, and is subjected to bubbling treatment using an oxygen-containing gas to form SnO in the electrolytic solution. 2 ultrafine particles, and the above dispersion-strengthened electrolytic copper foil was obtained using the electrolytic solution.

先前技術文獻 Prior technical literature 專利文獻 Patent literature

專利文獻1:日本專利第3238278號公報 Patent Document 1: Japanese Patent No. 3238278

專利文獻2:日本專利第3943214號公報 Patent Document 2: Japanese Patent No. 3943214

專利文獻3:日本專利特開2000-17476號公報 Patent Document 3: Japanese Patent Laid-Open Publication No. 2000-17476

發明概要 Summary of invention

因此,本發明人等基於專利文獻1,在硫酸-硫酸銅電解液中加入鎢或鎢化合物,再加入膠與20~120mg/L之氯化物離子,用所得電解液反覆實施電沉積實驗,確認根據專利文獻1記載的方法,可以製造目標銅箔即180℃下之加熱延伸率為3%以上、粗面粗度大、針孔發生少的銅箔。 Therefore, the inventors of the present invention added a tungsten or tungsten compound to a sulfuric acid-copper sulfate electrolyte according to Patent Document 1, and then added a colloidal ion with a chloride ion of 20 to 120 mg/L, and repeatedly performed an electrodeposition experiment using the obtained electrolyte to confirm According to the method described in Patent Document 1, a target copper foil, that is, a copper foil having a heating elongation at 180 ° C of 3% or more, a large rough surface, and a small occurrence of pinholes can be produced.

但是,對該銅箔進行分析後確定,該電解銅箔中幾乎不含鎢,且300℃加熱後強度會極端降低(參照後述比較例4)。 However, after analyzing the copper foil, it was confirmed that the electrolytic copper foil contained almost no tungsten, and the strength was extremely lowered after heating at 300 ° C (refer to Comparative Example 4 described later).

並且發現,專利文獻2記載之電解銅箔也與使用有機添加劑之電解銅箔同樣,在約300℃的高溫下加熱時,機械強度顯著降低(參照後述比較例14)。 In the same manner as the electrolytic copper foil using the organic additive, the electrolytic copper foil described in Patent Document 2 is also significantly reduced in mechanical strength when heated at a high temperature of about 300 ° C (see Comparative Example 14 to be described later).

專利文獻3的SnO2分散之分散強化型電解銅箔所發生之問題則是不僅因實施鼓泡處理導致製造成本增加,且SnO2微粒之粒徑相對較大,造成導電率較低(參照後述比較例13)。 The problem of the dispersion-strengthened electrolytic copper foil in which SnO 2 is dispersed in Patent Document 3 is that not only the manufacturing cost is increased by the bubbling treatment, but also the particle diameter of the SnO 2 fine particles is relatively large, resulting in a low electrical conductivity (refer to the following description). Comparative Example 13).

因此,以往之方法存在如下問題,即:無法提供作為電池用負極集電體或配線板材料時於常態下具備較大機械強度,高溫加熱時機械強度亦難以降低之電解銅箔。 Therefore, the conventional method has a problem that it is impossible to provide an electrolytic copper foil which has a large mechanical strength in a normal state when it is used as a battery negative electrode current collector or a wiring board material, and is difficult to reduce mechanical strength at the time of high-temperature heating.

本發明係鑒於上述問題開發而成,其目的在於提供一種常態下機械強度大之電解銅箔。更甚者,提供一種在約300℃之高溫下加熱時機械特性亦難以發生熱劣化的電解銅合金箔。 The present invention has been made in view of the above problems, and an object thereof is to provide an electrolytic copper foil having a high mechanical strength in a normal state. Furthermore, an electrolytic copper alloy foil in which mechanical properties are hardly deteriorated when heated at a high temperature of about 300 ° C is provided.

本發明人經過一再深入研究後發現,使含有有機化合物或無機化合物之奈米夾雜物分散於銅箔中,並令該奈米夾雜物之粒徑為規定範圍,可獲得常態下機械強度大的電解銅合金箔。 The inventors have conducted intensive studies and found that the nano inclusions containing organic or inorganic compounds are dispersed in the copper foil, and the particle size of the nano inclusions is within a predetermined range, and the mechanical strength under normal conditions can be obtained. Electrolytic copper alloy foil.

尤其更發現,使由無機化合物形成之奈米夾雜物分散於銅箔中,可獲得於約300℃下加熱時機械強度之熱劣化亦小的電解銅合金箔。 In particular, it has been found that the nano-inclusion formed of the inorganic compound is dispersed in the copper foil, and an electrolytic copper alloy foil having a small thermal deterioration of mechanical strength when heated at about 300 ° C can be obtained.

本發明係基於上述見解開發完成。 The present invention has been completed based on the above findings.

為實現上述目的,提供以下發明。 In order to achieve the above object, the following invention is provided.

(1)一種電解銅箔,其特徵在於,在銅之晶粒內部或銅之晶粒彼此間之晶界具有平均粒徑0.5~100nm之夾雜物,前述夾雜物含有無機化合物及/或有機化合物,前述無機化合物含有選自由鎢、鉬、鈦、碲所構成群組中之一種以上金屬元素的氧化物,前述有機化合物含有選自由硫脲、伸乙基硫脲、四甲基硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲所構成群組中之一種以上硫脲類有機化合物。 (1) An electrolytic copper foil characterized in that an inclusion having an average particle diameter of 0.5 to 100 nm is present in a grain boundary between copper crystal grains or copper crystal grains, and the inclusion contains an inorganic compound and/or an organic compound. The inorganic compound contains an oxide selected from one or more metal elements selected from the group consisting of tungsten, molybdenum, titanium, and niobium, and the organic compound contains a compound selected from the group consisting of thiourea, ethyl thiourea, and tetramethyl thiourea. One or more thiourea organic compounds in the group consisting of 3-dimethyl-2-thiourea and 1,3-diethyl-2-thiourea.

(2)如(1)所述之電解銅箔,其中前述晶粒之平均粒徑為100~600nm。 (2) The electrolytic copper foil according to (1), wherein the crystal grains have an average particle diameter of 100 to 600 nm.

(3)如(1)或(2)所述之電解銅箔,其中前述夾雜物之平均粒徑為0.5~50nm。 (3) The electrolytic copper foil according to (1) or (2), wherein the inclusions have an average particle diameter of 0.5 to 50 nm.

(4)如(3)所述之電解銅箔,其中前述夾雜物之平均粒徑為0.5~20nm。 (4) The electrolytic copper foil according to (3), wherein the inclusions have an average particle diameter of 0.5 to 20 nm.

(5)如(1)至(4)中任一項所述之電解銅箔,其中前述夾雜物含有無機化合物,前述電解銅箔中之金屬元素含量為10~2610ppm。 (5) The electrolytic copper foil according to any one of (1) to (4) wherein the inclusion contains an inorganic compound, and the content of the metal element in the electrolytic copper foil is 10 to 2610 ppm.

(6)如(1)至(4)中任一項所述之電解銅箔,其中前述電解銅箔中之氯含量小於1ppm。 (6) The electrolytic copper foil according to any one of (1) to (4) wherein the chlorine content in the electrolytic copper foil is less than 1 ppm.

(7)一種非水電解質二次電池用電極,其特徵在於具有:由(1)至(6)中任一項所述之電解銅箔構成的集電體、及形成於前述集電體表面且具有電極活性物質之電極活性物質層。 (7) An electrode for a non-aqueous electrolyte secondary battery, comprising: a current collector comprising the electrolytic copper foil according to any one of (1) to (6); and a surface formed on the surface of the current collector And an electrode active material layer having an electrode active material.

(8)一種非水電解質二次電池,其特徵在於,使用如(7)所述之非水電解質二次電池用電極。 (8) A nonaqueous electrolyte secondary battery using the electrode for a nonaqueous electrolyte secondary battery according to (7).

(9)一種電解銅箔之製造方法,其特徵在於,在含有硫酸與硫酸銅之硫酸-硫酸銅類電解液中添加含有無機化合物的水溶液及/或含有有機化合物的水溶液,並使用前述電解液進行電解析出,製造電解銅箔,且前述含有無機化合物的水溶液係將選自由鎢、鉬、鈦、碲所構成群組中之一種以上金屬元素之鹽溶解而得的水溶液,前述含有有機化合物的水溶液係含有選自由硫脲、伸乙基硫脲、四甲基 硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲所構成群組中之一種以上硫脲類有機化合物的水溶液。 (9) A method for producing an electrolytic copper foil, comprising adding an aqueous solution containing an inorganic compound and/or an aqueous solution containing an organic compound to a sulfuric acid-copper sulfate-based electrolytic solution containing sulfuric acid and copper sulfate, and using the electrolytic solution An electrolytic solution containing the inorganic compound is prepared by electrolysis, and the aqueous solution containing the inorganic compound is an aqueous solution obtained by dissolving a salt of at least one metal element selected from the group consisting of tungsten, molybdenum, titanium, and niobium. The aqueous solution contains a selected from the group consisting of thiourea, ethyl thiourea, tetramethyl An aqueous solution of one or more thiourea organic compounds in the group consisting of thiourea, 1,3-dimethyl-2-thiourea, and 1,3-diethyl-2-thiourea.

(10)如(9)所述之電解銅箔之製造方法,其中前述電解液中氯化物離子濃度小於3mg/L。 (10) The method for producing an electrolytic copper foil according to (9), wherein the electrolyte solution has a chloride ion concentration of less than 3 mg/L.

根據本發明,可提供一種常態下機械強度大之電解銅箔。另外,此處所述常態係指製作電解銅箔後、實施熱處理前放置於常溫常壓(25℃、1個大氣壓)下之狀態。此外,機械強度係指拉伸強度、0.2%耐力等。 According to the present invention, an electrolytic copper foil having a high mechanical strength in a normal state can be provided. In addition, the normal state here is a state in which the electrolytic copper foil is produced and placed under normal temperature and normal pressure (25 ° C, 1 atm) before the heat treatment. Further, mechanical strength means tensile strength, 0.2% endurance, and the like.

1‧‧‧電解銅箔 1‧‧‧electrolytic copper foil

3‧‧‧晶粒 3‧‧‧ grain

5‧‧‧夾雜物 5‧‧‧ inclusions

13‧‧‧X射線源 13‧‧‧X-ray source

14‧‧‧入射X射線 14‧‧‧ incident X-rays

15‧‧‧快門 15‧‧ ‧Shutter

17‧‧‧單色儀 17‧‧‧ Monochromator

19‧‧‧第1針孔 19‧‧‧1st pinhole

21‧‧‧第2針孔 21‧‧‧2 pinhole

23‧‧‧衰減器 23‧‧‧Attenuator

25‧‧‧第3針孔 25‧‧‧3rd pinhole

27‧‧‧樣本 27‧‧‧ sample

29‧‧‧透過X射線 29‧‧‧Transmission of X-rays

31‧‧‧散射X射線 31‧‧‧scatter X-ray

33‧‧‧射束阻擋器 33‧‧‧Block stopper

35‧‧‧檢測器 35‧‧‧Detector

圖1係表示本實施形態相關之電解銅箔1之構成的示意圖。 Fig. 1 is a schematic view showing the configuration of an electrolytic copper foil 1 according to the present embodiment.

圖2係進行加熱處理前之含有W之電解銅箔的TEM影像(欠焦(under focus)影像)。 Fig. 2 is a TEM image (under focus image) of the electrolytic copper foil containing W before the heat treatment.

圖3係進行加熱處理後之含有W之電解銅箔的TEM影像(欠焦影像)。 Fig. 3 is a TEM image (under focus image) of the electrolytic copper foil containing W after heat treatment.

圖4係進行加熱處理後之含有W之電解銅箔的高分辨率STEM影像(HAADF-STEM影像)。 Fig. 4 is a high-resolution STEM image (HAADF-STEM image) of the electrolytic copper foil containing W after heat treatment.

圖5係含有伸乙基硫脲與鎢兩者之銅箔的HAADF-STEM影像。 Figure 5 is a HAADF-STEM image of a copper foil containing both ethyl thiourea and tungsten.

圖6係不含W之銅箔的TEM影像(欠焦影像)。 Fig. 6 is a TEM image (under-focus image) of a copper foil containing no W.

圖7(a)係SAXS(USAXS)之裝置概要圖,圖7(b)係表示測定散射X射線之情形的圖,圖7(c)係表示測定透過X射線 之情形的圖。 Fig. 7(a) is a schematic view of a device of SAXS (USAXS), Fig. 7(b) is a view showing a case of measuring scattered X-rays, and Fig. 7(c) is a view showing measurement of transmitted X-rays. Diagram of the situation.

圖8(a)係表示含有W之電解銅箔燒成(加熱處理)前與燒成後之SAXS測定結果的圖,圖8(b)係表示含有Mo之電解銅箔燒成前與燒成後之SAXS測定結果的圖,圖8(c)係表示含有W與TU(硫脲)之電解銅箔燒成前與燒成後之SAXS測定結果的圖。 Fig. 8(a) is a view showing the results of SAXS measurement before and after firing of the electrolytic copper foil containing W, and Fig. 8(b) shows the pre-baking and firing of the electrolytic copper foil containing Mo. Fig. 8(c) is a view showing the results of SAXS measurement before and after firing of the electrolytic copper foil containing W and TU (thiourea).

圖9係含有W之電解銅箔燒成前的一維化SAXS測定結果。 Fig. 9 shows the results of one-dimensional SAXS measurement before firing of the electrolytic copper foil containing W.

圖10(a)係表示燒成前含有W之電解銅箔之SAXS測定之擬合結果的圖,圖10(b)係表示同SAXS測定之粒徑分佈的圖。 Fig. 10(a) is a view showing a fitting result of SAXS measurement of an electrolytic copper foil containing W before firing, and Fig. 10(b) is a view showing a particle size distribution measured by SAXS.

圖11(a)係表示燒成前含有W之電解銅箔之W吸收端附近XAFS測定結果的圖,圖11(b)係表示燒成前含有Mo之電解銅箔之Mo吸收端附近XAFS測定結果的圖。 Fig. 11 (a) is a view showing XAFS measurement results in the vicinity of the W absorption end of the electrolytic copper foil containing W before firing, and Fig. 11 (b) is a XAFS measurement in the vicinity of the Mo absorption end of the electrolytic copper foil containing Mo before firing. The graph of the result.

用以實施發明之形態 Form for implementing the invention (電解銅箔) (electrolytic copper foil)

以下,基於圖式,詳細說明本發明之實施形態。 Hereinafter, embodiments of the present invention will be described in detail based on the drawings.

圖1針對本發明之實施形態相關之電解銅箔1進行說明。電解銅箔1具有大量銅之晶粒3,在晶粒3內部或晶粒3彼此間之晶界具有夾雜物5。 Fig. 1 is a view showing an electrolytic copper foil 1 according to an embodiment of the present invention. The electrolytic copper foil 1 has a large number of crystal grains 3 of copper, and has inclusions 5 inside the crystal grains 3 or at grain boundaries between the crystal grains 3.

晶粒3宜為母材即銅之微細晶粒,且平均粒徑宜為100~600nm。另外,此處所述晶粒3之平均粒徑係指各粒子長軸長度的個數平均值。晶粒3之形狀為大致球形,長軸與短軸的縱橫尺 寸比為0.5~2.0左右。可以通過SIM(掃描離子顯微鏡法)觀察銅箔之研磨表面,對觀察到的圖像進行圖像處理,計算晶粒3之平均粒徑。 The crystal grains 3 are preferably fine crystal grains of a base material, that is, copper, and the average particle diameter is preferably from 100 to 600 nm. Further, the average particle diameter of the crystal grains 3 herein means the average number of the long axis lengths of the respective particles. The shape of the crystal grain 3 is a substantially spherical shape, and the longitudinal axis of the long axis and the short axis The inch ratio is about 0.5~2.0. The polished surface of the copper foil can be observed by SIM (scanning ion microscopy), and the observed image is subjected to image processing to calculate the average grain size of the crystal grains 3.

夾雜物5係含有有機化合物及/或無機化合物之微粒,係不與母材即銅製成合金,而作為微粒存在於銅箔中。夾雜物5之平均粒徑(直徑)為0.5~100nm,並以0.5~50nm為佳,0.5~20nm較佳。 The inclusions 5 are fine particles containing an organic compound and/or an inorganic compound, and are not alloyed with copper, which is a base material, but are present as fine particles in the copper foil. The average particle diameter (diameter) of the inclusions 5 is 0.5 to 100 nm, preferably 0.5 to 50 nm, and preferably 0.5 to 20 nm.

夾雜物5中所含無機化合物宜含有選自由鎢、鉬、鈦、碲所構成群組中之一種以上金屬元素,為該等之金屬氧化物更佳。該等金屬類於pH4以下之液體中作為氧化物存在。 The inorganic compound contained in the inclusion 5 preferably contains one or more metal elements selected from the group consisting of tungsten, molybdenum, titanium, and niobium, and more preferably these metal oxides. These metals exist as oxides in a liquid having a pH of 4 or less.

關於在pH4以下之酸性溶液中作為氧化物存在的金屬,係例如M.Pourbaix之Atlas of electrochemical equilibria in aqueous solutions.Pergamon Press(1966)所示之電位-pH圖中,在4以下之pH中作為氧化物存在的金屬成分,而且係利用DLS(動態光散射法:Dynamic Light Scattering)對實際添加有金屬成分之電解液實施粒度分佈測定時,添加之金屬成分作為固體顆粒被檢出的金屬成分。 Regarding the metal present as an oxide in an acidic solution of pH 4 or lower, for example, in the potential-pH diagram shown by M. Pourbaix, Atlas of electrochemical equilibria in aqueous solutions. Pergamon Press (1966), in pH below 4, The metal component in which the oxide is present is a metal component in which the added metal component is detected as a solid particle when the particle size distribution of the electrolytic solution to which the metal component is actually added is measured by DLS (Dynamic Light Scattering).

夾雜物5中所含有機化合物宜含有選自由硫脲、伸乙基硫脲、四甲基硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲所構成群組中之一種以上硫脲類有機化合物。 The organic compound contained in the inclusion 5 preferably contains a compound selected from the group consisting of thiourea, ethyl thiourea, tetramethyl thiourea, 1,3-dimethyl-2-thiourea, and 1,3-diethyl-2- More than one thiourea organic compound in the group consisting of thiourea.

在電解銅箔1所含之夾雜物5中,可以僅含有有機化合物,可以僅含有無機化合物,亦可含有有機化合物與無機化合物 兩者。無機化合物之微粒於300℃加熱時不會被熱分解,因此,通過具有無機化合物之微粒作為夾雜物5,可抑制加熱後電解銅箔的強度劣化。 The inclusion 5 contained in the electrolytic copper foil 1 may contain only an organic compound, may contain only an inorganic compound, or may contain an organic compound and an inorganic compound. Both. When the fine particles of the inorganic compound are not thermally decomposed when heated at 300 ° C, the fine particles having the inorganic compound are used as the inclusions 5, and the deterioration of the strength of the electrolytic copper foil after heating can be suppressed.

電解銅箔中構成夾雜物5的金屬之含量(攝入量),按金屬換算,宜為10~2610ppm。進而,宜為15~2610ppm,並以80~2610ppm為佳,100~2500ppm較佳,110~2460ppm更佳,210~2460ppm尤佳。若該含量過少,則耐熱效果會降低,例如於300℃下加熱後之拉伸強度變低,為常態下拉伸強度的80%以下。另一方面,若該含量過多,則拉伸強度之提高效果方面無法進一步改善,且導電率會降低。尤其是,構成夾雜物5之金屬為鎢時,電解銅箔中之鎢含量宜為280~2460ppm。其原因在於,若為該範圍,則在300℃下加熱1小時(以下簡稱“300℃×1 H”)後之拉伸強度與常態下拉伸強度之比會超過80%。 The content (intake amount) of the metal constituting the inclusion 5 in the electrolytic copper foil is preferably 10 to 2610 ppm in terms of metal. Further, it is preferably 15 to 2610 ppm, preferably 80 to 2610 ppm, preferably 100 to 2500 ppm, more preferably 110 to 2460 ppm, and particularly preferably 210 to 2460 ppm. If the content is too small, the heat resistance effect is lowered. For example, the tensile strength after heating at 300 ° C is lowered, and it is 80% or less of the normal tensile strength. On the other hand, if the content is too large, the effect of improving the tensile strength cannot be further improved, and the electrical conductivity is lowered. In particular, when the metal constituting the inclusion 5 is tungsten, the tungsten content in the electrolytic copper foil is preferably 280 to 2,460 ppm. The reason for this is that if it is in this range, the ratio of the tensile strength to the normal tensile strength after heating at 300 ° C for 1 hour (hereinafter referred to as "300 ° C × 1 H") exceeds 80%.

繼而,電解銅箔中之氯含量(攝入量)小於1ppm。當電解銅箔之氯含量為1ppm以上時,金屬氧化物之攝入量會極端減少,拉伸強度、耐熱性之提高效果降低。此外,氯含量小於1ppm還包括無氯即氯含量為0ppm之情形。 Then, the chlorine content (intake amount) in the electrolytic copper foil is less than 1 ppm. When the chlorine content of the electrolytic copper foil is 1 ppm or more, the intake amount of the metal oxide is extremely reduced, and the effect of improving the tensile strength and heat resistance is lowered. Further, a chlorine content of less than 1 ppm also includes a case where chlorine is not present, i.e., the chlorine content is 0 ppm.

(電解銅箔之製造方法) (Manufacturing method of electrolytic copper foil)

本實施形態相關之電解銅箔可按照以下製造方法進行製造。 The electrolytic copper foil according to the present embodiment can be produced by the following production method.

在硫酸銅水溶液中加入硫脲等有機化合物或無機化合物之微粒,進而使用該硫酸銅水溶液,對銅進行電解析出,從而製造電解銅箔。 An organic compound such as thiourea or an inorganic compound fine particle is added to the aqueous copper sulfate solution, and the copper sulfate aqueous solution is further used to electrically analyze the copper to produce an electrolytic copper foil.

製作含有無機化合物之電解銅箔時,首先,於硫酸銅水溶液與上述金屬之金屬鹽水溶液的混合液中添加鹽酸或水溶性含氯化合物,使氯化物離子濃度為3mg/L以下,準備電解液。其後,使用上述電解液,通過電解析出製造電解銅箔。 When the electrolytic copper foil containing an inorganic compound is produced, first, hydrochloric acid or a water-soluble chlorine-containing compound is added to a mixed liquid of the copper sulfate aqueous solution and the metal metal salt aqueous solution to prepare a electrolyte having a chloride ion concentration of 3 mg/L or less. . Thereafter, an electrolytic copper foil was produced by electrical analysis using the above electrolytic solution.

1. 電解液組成 Electrolyte composition

作為電解液,以調整為銅離子濃度50~200g/L、遊離硫酸根離子濃度30~400g/L、氯化物離子濃度3mg/L以下的含硫酸銅水溶液為基本之電解液組成。此處,在本發明中,不含氯化物離子係指氯化物離子濃度在3mg/L以下。 As the electrolytic solution, a copper sulfate-containing aqueous solution adjusted to have a copper ion concentration of 50 to 200 g/L, a free sulfate ion concentration of 30 to 400 g/L, and a chloride ion concentration of 3 mg/L or less is used as a basic electrolyte composition. Here, in the present invention, the absence of chloride ions means that the chloride ion concentration is 3 mg/L or less.

銅離子與游離硫酸根離子如果按照賦予所述各離子濃度來調整硫酸銅水溶液,即可獲得。或者,亦可於賦予規定銅離子濃度之硫酸銅水溶液中追加硫酸,調整它們之離子濃度。 Copper ions and free sulfate ions can be obtained by adjusting the aqueous copper sulfate solution in accordance with the concentration of each of the ions. Alternatively, sulfuric acid may be added to an aqueous copper sulfate solution to which a predetermined copper ion concentration is applied to adjust the ion concentration thereof.

氯化物離子可由鹽酸或水溶性含氯化合物賦予。作為水溶性含氯化合物,例如可使用氯化鈉、氯化鉀及氯化銨等。 The chloride ion can be imparted by hydrochloric acid or a water-soluble chlorine-containing compound. As the water-soluble chlorine-containing compound, for example, sodium chloride, potassium chloride, ammonium chloride or the like can be used.

2. 無機化合物類夾雜物之添加 2. Addition of inorganic compound inclusions

將溶解上述金屬之鹽而得的金屬鹽水溶液添加至pH4以下之電解液,又以添加至硫酸酸性電解液中為宜,藉此使金屬氧 化物之微粒或超細顆粒分散於電解液中,電解析出時會被攝入銅箔中。另外,本說明書中「微粒或超細顆粒」係指粒徑比常規微粒(20nm左右)小者。 The aqueous solution of the metal salt obtained by dissolving the salt of the above metal is added to the electrolyte having a pH of 4 or less, and is preferably added to the acidic electrolyte of sulfuric acid, thereby making the metal oxygen The fine particles or ultrafine particles of the compound are dispersed in the electrolyte and are taken up into the copper foil upon electrolysis. In addition, in the present specification, "fine particles or ultrafine particles" means those having a smaller particle diameter than conventional fine particles (about 20 nm).

作為上述金屬鹽,其於水(pH值大於4且小於9)、鹼(pH9以上)、熱濃硫酸等溶劑中會進行離子化,於pH4以下會成為氧化物即可,其種類並無特別限制。作為該等金屬鹽之例子,金屬為W或Mo時可列舉其各自之含氧酸鹽,金屬為Ti時可列舉其硫酸鹽。例如,可使用鎢酸鈉、鎢酸鉀、鎢酸銨等鎢酸鹽,或鉬酸鈉、鉬酸鉀、鉬酸銨等鉬酸鹽,以及硫酸鈦等鈦鹽。 The metal salt is ionized in a solvent such as water (pH greater than 4 and less than 9), alkali (pH 9 or higher), or hot concentrated sulfuric acid, and may be an oxide at pH 4 or less. limit. Examples of the metal salt include a oxyacid salt of each of the metals W or Mo, and a sulfate salt when the metal is Ti. For example, a tungstate such as sodium tungstate, potassium tungstate or ammonium tungstate, or a molybdate such as sodium molybdate, potassium molybdate or ammonium molybdate, or a titanium salt such as titanium sulfate can be used.

此外,碲通常被列為類金屬,嚴格地說其鹽並不屬於金屬鹽,但在溶劑中會進行離子化,並且於pH4以下時會成為氧化物。例如,氧化碲在熱濃硫酸中離子化後,添加至pH4以下之電解液中,會析出二氧化碲或三氧化碲。此外,將碲酸於鹼環境下溶解後之水溶液調整為pH4以下,也會析出二氧化碲或三氧化碲。 Further, ruthenium is usually classified as a metalloid, and strictly speaking, its salt does not belong to a metal salt, but ionization occurs in a solvent, and becomes an oxide at a pH of 4 or less. For example, after cerium oxide is ionized in hot concentrated sulfuric acid, it is added to an electrolyte having a pH of 4 or less, and cerium oxide or antimony trioxide is precipitated. Further, when the aqueous solution in which the citric acid is dissolved in an alkali atmosphere is adjusted to pH 4 or lower, cerium oxide or antimony trioxide is precipitated.

電解液中金屬元素之濃度宜為1mg/L~500mg/L(換算為該金屬),10mg/L~250mg/L(換算為該金屬)更佳。若其濃度過低,則難以將目的金屬充分地攝入銅箔中。另一方面,若該濃度過高,則目的金屬會於銅箔中攝入過剩,有時會導致導電率降低,或者耐熱性之提高效果飽和,反而導致耐熱性降低,加熱後之拉伸強度降低。尤其是,作為添加之金屬元素使用鎢時,電解液中金屬元素之濃度宜為10~500mg/L,30~380mg/L更佳。 The concentration of the metal element in the electrolytic solution is preferably from 1 mg/L to 500 mg/L (calculated as the metal), and more preferably from 10 mg/L to 250 mg/L (in terms of the metal). If the concentration is too low, it is difficult to sufficiently ingest the target metal into the copper foil. On the other hand, if the concentration is too high, the target metal may be excessively taken up in the copper foil, and the electrical conductivity may be lowered, or the heat resistance may be saturated, and the heat resistance may be lowered, and the tensile strength after heating may be caused. reduce. In particular, when tungsten is used as the added metal element, the concentration of the metal element in the electrolytic solution is preferably 10 to 500 mg/L, more preferably 30 to 380 mg/L.

於本實施形態中,為了調整為上述規定之氯化物濃度,用來調製電解液或金屬鹽水溶液之水宜儘量不含氯化物離子。考慮到此一觀點,宜使金屬鹽溶解於純水中調製金屬鹽水溶液。此處,純水以儘量不含金屬離子及氯化物離子之水為宜。具體而言,以氯化物離子濃度在3mg/L以下之水為佳,氯化物離子濃度小於1mg/L之水更佳。 In the present embodiment, in order to adjust to the above-mentioned predetermined chloride concentration, the water used to prepare the electrolytic solution or the aqueous metal salt solution should preferably contain no chloride ions. In view of this point of view, it is preferred to dissolve the metal salt in pure water to prepare an aqueous metal salt solution. Here, the pure water is preferably water which does not contain metal ions and chloride ions as much as possible. Specifically, water having a chloride ion concentration of 3 mg/L or less is preferred, and water having a chloride ion concentration of less than 1 mg/L is more preferred.

3. 有機化合物類夾雜物之添加 3. Addition of organic compound inclusions

作為夾雜物使用有機化合物時,與上述金屬鹽水溶液同時或取代上述金屬鹽水溶液,加入有機添加劑。即,於硫酸銅電解液中直接加入有機添加劑,或以水溶液加入有機添加劑。作為該有機添加劑,可使用硫脲、伸乙基硫脲、四甲基硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲中任一種以上有機化合物。電解液中有機添加劑之濃度宜為3mg/L~100mg/L,並以5~15mg/L為佳。 When an organic compound is used as the inclusion, an organic additive is added simultaneously with or in place of the above aqueous solution of the metal salt. That is, an organic additive is directly added to the copper sulfate electrolyte, or an organic additive is added as an aqueous solution. As the organic additive, any one of thiourea, exoethylthiourea, tetramethylthiourea, 1,3-dimethyl-2-thiourea, and 1,3-diethyl-2-thiourea can be used. The above organic compounds. The concentration of the organic additive in the electrolyte is preferably from 3 mg/L to 100 mg/L, and preferably from 5 to 15 mg/L.

使用含有有機添加劑之硫酸銅電解液進行電解析出,從而可以製造含有有機化合物之夾雜物的電解銅箔。 Electrolytic analysis using a copper sulfate electrolyte containing an organic additive can produce an electrolytic copper foil containing inclusions of an organic compound.

4. 製造條件 4. Manufacturing conditions

電解析出時之條件如下所述。 The conditions at the time of electroanalysis are as follows.

電流密度30~100A/dm2 Current density 30~100A/dm 2

溫度30~70℃ Temperature 30~70°C

可在以上條件下,製造膜厚為例如12μm之電解銅箔。 An electrolytic copper foil having a film thickness of, for example, 12 μm can be produced under the above conditions.

具體例為,可於旋轉之鈦滾筒上從上述電解液中電解析出銅,將其剝離後連續地進行捲取,從而製造電解銅箔。 Specifically, copper can be electrically analyzed from the above-mentioned electrolytic solution on a rotating titanium drum, peeled off, and continuously wound up to produce an electrolytic copper foil.

(添加夾雜物之機理) (Mechanism of adding inclusions)

於電解液中添加金屬鹽水溶液,係為了使攝入銅箔中之金屬作為其離子存在於水溶液中,並將其投入電解液中。通過此種投入方式,可於金屬離子在pH4以下之電解液中轉換為氧化物時,形成金屬氧化物之微粒或超細顆粒。與此相對,即使將金屬鹽直接投入電解液中亦無法形成金屬氧化物之微粒或超細顆粒,因此無法獲得拉伸強度及耐熱性之提高效果。 The aqueous metal salt solution is added to the electrolytic solution in order to allow the metal in the copper foil to be present as an ion thereof in the aqueous solution, and to put it into the electrolytic solution. By such an input method, fine particles or ultrafine particles of metal oxide can be formed when metal ions are converted into oxides in an electrolytic solution having a pH of 4 or less. On the other hand, even if the metal salt is directly introduced into the electrolytic solution, fine particles or ultrafine particles of the metal oxide cannot be formed, and thus the effect of improving the tensile strength and the heat resistance cannot be obtained.

將電解液中之氯化物離子抑制為3mg/L之低濃度,係為了防止於析出金屬氧化物之微粒或超細顆粒時氯特異吸附於銅表面,從而阻礙金屬氧化物之微粒或超細顆粒的吸附。若氯化物離子之濃度高於3mg/L,則攝入電解銅箔中之金屬會減少,拉伸強度、耐熱性之提高效果會急劇降低。 The chloride ion in the electrolyte is suppressed to a low concentration of 3 mg/L in order to prevent chlorine from adsorbing on the surface of the copper when the fine particles or ultrafine particles of the metal oxide are precipitated, thereby hindering the fine particles or ultrafine particles of the metal oxide. Adsorption. When the concentration of the chloride ion is higher than 3 mg/L, the amount of metal in the electrolytic copper foil is reduced, and the effect of improving tensile strength and heat resistance is drastically lowered.

(差排之阻礙效果) (the obstacle effect of the difference)

包括銅箔在內,金屬材料於加熱至再結晶溫度以上後會進行再結晶,晶粒會變粗大,其結果為強度會降低。此處,再結晶過程之起點係差排(晶格缺損等之不穩定狀態)之移動(運動)。本發明之電解銅箔中,金屬氧化物之微粒或超細顆粒會分散至母相 內,從而阻礙該微粒或該超細顆粒周圍之差排的移動。因此,銅箔中之差排變得難以移動,銅箔強度也就變高。 In the case of the copper foil, the metal material is recrystallized after heating to a temperature higher than the recrystallization temperature, and the crystal grains become coarse, and as a result, the strength is lowered. Here, the starting point of the recrystallization process is the movement (motion) of the difference row (an unstable state such as a lattice defect). In the electrolytic copper foil of the present invention, fine particles or ultrafine particles of metal oxide are dispersed to the mother phase Inside, thereby hindering the movement of the particles or the difference between the ultrafine particles. Therefore, the difference in the copper foil becomes difficult to move, and the strength of the copper foil becomes high.

此外,差排之移動需要更高能量(熱量),所以銅箔若不於更高溫度下進行加熱,就不會發生軟化。也就是說,通過阻礙差排之移動,銅箔之耐熱性提高。 In addition, the movement of the difference row requires higher energy (heat), so if the copper foil is not heated at a higher temperature, softening does not occur. That is, the heat resistance of the copper foil is improved by hindering the movement of the difference row.

於本申請中,將此情況稱為「差排之阻礙效果高」。 In the present application, this case is referred to as "the barrier effect of the difference row is high".

(電解銅箔之箔厚) (Foil thickness of electrolytic copper foil)

本實施形態之電解銅箔之箔厚並無特別限制,可根據使用用途之要求的箔厚進行調整。例如,用於柔性印刷線路板(FPC)時,箔厚調整為3~20μm即可。另一方面,用於鋰離子二次電池用負極集電體時,箔厚調整為5~30μm即可。 The foil thickness of the electrodeposited copper foil of the present embodiment is not particularly limited, and can be adjusted according to the foil thickness required for the intended use. For example, when used in a flexible printed wiring board (FPC), the foil thickness can be adjusted to 3 to 20 μm. On the other hand, when used for a negative electrode current collector for a lithium ion secondary battery, the foil thickness may be adjusted to 5 to 30 μm.

(電解銅箔之物性) (physical properties of electrolytic copper foil)

本實施形態之電解銅箔之導電率宜為55% IACS以上,65% IACS以上更佳,70% IACS以上尤佳。導電率之上限並無特別限制,有時亦會超過100% IACS。 The electrical conductivity of the electrolytic copper foil of the present embodiment is preferably 55% IACS or more, more preferably 65% IACS or more, and particularly preferably 70% IACS or more. The upper limit of the conductivity is not particularly limited, and sometimes exceeds 100% IACS.

本實施形態之電解銅箔於常態下之拉伸強度的值宜為500MPa以上,600MPa以上更佳。常態下之拉伸強度之上限並無特別限制,通常為1100MPa以下。 The value of the tensile strength of the electrodeposited copper foil according to the present embodiment in a normal state is preferably 500 MPa or more, more preferably 600 MPa or more. The upper limit of the tensile strength in the normal state is not particularly limited, but is usually 1100 MPa or less.

本發明之電解銅箔於300℃實施加熱處理後,於常溫下測定之拉伸強度之值與常態下之拉伸強度之值的比宜為50%以 上,80%以上更佳,比值為90%以上尤佳。該比值之上限並無特別限制,有時亦會超過100%(即,加熱後拉伸強度增加)。 After the electrolytic copper foil of the present invention is subjected to heat treatment at 300 ° C, the ratio of the tensile strength measured at normal temperature to the value of the tensile strength under normal conditions is preferably 50%. Above, more than 80% is better, and the ratio is more than 90%. The upper limit of the ratio is not particularly limited, and sometimes exceeds 100% (i.e., the tensile strength increases after heating).

(提高機械強度之機理) (Mechanism for improving mechanical strength)

金屬材料中,機械強度與晶粒之關係遵循霍爾-佩奇(Hall-Petch)法則。該法則中,晶粒越小,則機械強度越高。實際上,未加入添加劑之電解銅箔之晶粒尺寸為數十μm,其於常態下之機械強度為200MPa左右。另一方面,本發明之電解銅箔之晶粒為100~600nm,機械強度亦為800MPa以上。即便本發明之電解銅箔之強化並非只緣於晶粒徑之大小,也可以說電解銅箔一定程度上遵循了上述法則。 In metal materials, the relationship between mechanical strength and grain follows the Hall-Petch rule. In this rule, the smaller the crystal grains, the higher the mechanical strength. Actually, the electrolytic copper foil to which no additive is added has a crystal grain size of several tens of μm, and its mechanical strength under normal conditions is about 200 MPa. On the other hand, the electrolytic copper foil of the present invention has a crystal grain of 100 to 600 nm and a mechanical strength of 800 MPa or more. Even if the strengthening of the electrolytic copper foil of the present invention is not due to the crystal grain size, it can be said that the electrolytic copper foil follows the above rule to some extent.

然而,若對銅箔自身進行燒成,晶粒會生長,變得粗大。從而會發生電解銅箔之強度降低之問題。因此,本實施形態之電解銅箔中分散有夾雜物,其具有如下所示抑制結晶生長之釘扎效應(銷固定效應)。 However, if the copper foil itself is fired, the crystal grains grow and become coarse. As a result, the problem of the strength of the electrolytic copper foil is lowered. Therefore, in the electrodeposited copper foil of the present embodiment, inclusions are dispersed, and the pinning effect (pin fixing effect) for suppressing crystal growth is as follows.

(抑制結晶生長之釘扎效應) (the pinning effect of inhibiting crystal growth)

於300℃之高溫下機械強度之熱劣化仍較小,其原因在於作為母相之銅之晶粒沒有變粗大。如上所述,眾所周知,通常機械強度與晶粒尺寸遵循霍爾-佩奇法則。一般認為,於加熱過程中銅之晶粒不生長之原因係夾雜物的釘扎效應。 The thermal deterioration of the mechanical strength at a high temperature of 300 ° C is still small because the crystal grains of copper as the mother phase are not coarsened. As mentioned above, it is well known that mechanical strength and grain size generally follow the Hall-Page rule. It is generally believed that the reason why the crystal grains of copper do not grow during the heating process is the pinning effect of the inclusions.

根據Gibbs-Thomson公式,晶粒生長能力可近似按式(1)計算。 According to the Gibbs-Thomson formula, the grain growth ability can be approximated by the formula (1).

△G=4σV/D‧‧‧(1) △G=4σV/D‧‧‧(1)

△G:晶粒生長能力、σ:晶界能量、D:晶粒直徑、V:莫耳容積。另一方面,根據Zener-Smith模型,晶粒生長之阻力可近似按式(2)計算。 ΔG: grain growth ability, σ: grain boundary energy, D: grain diameter, V: molar volume. On the other hand, according to the Zener-Smith model, the resistance of grain growth can be approximated by the equation (2).

△Gpin=πdσnV/2‧‧‧(2) △G pin =πdσnV/2‧‧‧(2)

△Gpin:晶粒生長之阻力、σ:晶界能量、d:夾雜物直徑、V:莫耳容積、n:單位面積之夾雜物個數密度。為了抑制晶粒生長,需要△G=△Gpin。亦即,理想的是於釘扎效應顯現之狀態下,式(3)成立。 ΔG pin : resistance to grain growth, σ: grain boundary energy, d: inclusion diameter, V: molar volume, n: number of inclusions per unit area. In order to suppress grain growth, ΔG = ΔG pin is required . That is, it is desirable that the formula (3) is established in a state in which the pinning effect appears.

D=8/πdn‧‧‧(3) D=8/πdn‧‧‧(3)

由於作為母相之銅之晶粒尺寸平均為100~600nm,析出物之尺寸為0.5~100nm,析出物之密度為1.0×1016~1.0×1019個/cm3,故可期待充分之釘扎效應。以下所示為發揮釘扎效應之區域。 Since the grain size of the copper as the mother phase is 100 to 600 nm on average, the size of the precipitate is 0.5 to 100 nm, and the density of the precipitate is 1.0 × 10 16 to 1.0 × 10 19 /cm 3 , so that a sufficient nail can be expected. Tie effect. The area shown below is the pinning effect.

析出物之尺寸:0.5~20nm→最能發揮釘扎效應,高溫下亦可抑制晶粒之生長。 The size of the precipitate: 0.5~20nm→ can best exert the pinning effect, and can inhibit the growth of the grain at high temperature.

析出物之尺寸:20~50nm→可發揮釘扎效應,但並不能完全抑制結晶生長。然而,可將燒成前後機械強度之降低控制為最大80%左右。 The size of the precipitate: 20~50nm→ can exert the pinning effect, but it can not completely inhibit the crystal growth. However, the reduction in mechanical strength before and after firing can be controlled to a maximum of about 80%.

析出物之尺寸:50~100nm→可發揮釘扎效應,但觀察到大量晶粒變粗大。燒成前後機械強度之降低最大為60%。 The size of the precipitate: 50 to 100 nm → the pinning effect can be exerted, but a large amount of crystal grains are observed to be coarse. The reduction in mechanical strength before and after firing is up to 60%.

析出物之數密度:(A)1.0×1018~1.0×1019個/cm3→最能發揮釘扎效應,高溫下亦可抑制晶粒之生長。 The number density of precipitates: (A) 1.0 × 10 18 ~ 1.0 × 10 19 / cm 3 → The pinning effect is most exerted, and the growth of crystal grains can be suppressed at a high temperature.

析出物之數密度:(B)1.0×1017~1.0×1018個/cm3→可發揮釘扎效應,但並不能完全抑制結晶生長。然而,可將燒成前後機械強度之降低控制為最大80%左右。 The number density of precipitates: (B) 1.0 × 10 17 ~ 1.0 × 10 18 / cm 3 → The pinning effect can be exerted, but the crystal growth cannot be completely suppressed. However, the reduction in mechanical strength before and after firing can be controlled to a maximum of about 80%.

析出物之數密度:(C)1.0×1016~1.0×1017個/cm3→可發揮釘扎效應,但觀察到大量晶粒變粗大。燒成前後機械強度之降低最大為60%。 The number density of precipitates: (C) 1.0 × 10 16 - 1.0 × 10 17 / cm 3 → The pinning effect was exerted, but a large amount of crystal grains were observed to be coarse. The reduction in mechanical strength before and after firing is up to 60%.

因此,析出物之尺寸0.5~20nm與析出物之數密度(A)1.0×1018~1.0×1019個/cm3的組合可最大限度地發揮釘扎效應。 Therefore, the combination of the size of the precipitate of 0.5 to 20 nm and the number density of precipitates (A) of 1.0 × 10 18 to 1.0 × 10 19 /cm 3 can maximize the pinning effect.

根據以上理論考察與實驗結果,析出物之尺寸與數密度及機械強度之關係如表1所示。 According to the above theoretical investigation and experimental results, the relationship between the size of the precipitate and the number density and mechanical strength is shown in Table 1.

(作為釘扎之夾雜物之持續性) (as the persistence of pinned inclusions)

具有釘扎效應之夾雜物若加熱燒失、分解,則也會失去效果。有機化合物之夾雜物可能會由於加熱而發生分解。然而,無機化合物於300℃這一溫度區域並不會發生燒失。實際上,含有鎢之電解銅合金箔於燒成前後均為WO3,沒有改變。再者,W之氧化物之標準生成能量低於Cu,故於300℃之加熱環境下,Cu不會奪去WO3之氧。假設有可能,則會生成CuWO4這樣的三元類氧化物。然而,上述物質之結晶構造不同於Cu,不固溶地存在,因此,釘扎效應會持續。 If the inclusions with the pinning effect are burnt out and decomposed, the effect will also be lost. The inclusions of organic compounds may decompose due to heating. However, the inorganic compound does not lose heat in the temperature range of 300 °C. In fact, the electrolytic copper alloy foil containing tungsten was WO 3 before and after firing, and was not changed. Furthermore, the standard generating energy of the oxide of W is lower than that of Cu, so in the heating environment of 300 ° C, Cu does not take off the oxygen of WO 3 . It is assumed that a ternary oxide such as CuWO 4 is formed. However, the crystal structure of the above substance is different from Cu and does not exist in a solid solution, and therefore, the pinning effect continues.

(本實施形態之效果) (Effect of this embodiment)

本實施形態相關之電解銅箔於銅之晶粒內部或晶界具有夾雜物,故常態下之機械強度較高。 Since the electrolytic copper foil according to the present embodiment has inclusions in the crystal grains or grain boundaries of the copper, the mechanical strength in the normal state is high.

本實施形態中,於銅之晶粒內部或晶界具有無機化合物之夾雜物的電解銅箔於300℃下實施加熱處理後,夾雜物不會發生熱解,防止了晶粒變粗大,故於300℃下實施加熱處理後之拉伸強度值較高。 In the present embodiment, the electrolytic copper foil having inclusions of inorganic compounds in the crystal grains or at the grain boundaries of the copper is subjected to heat treatment at 300 ° C, and the inclusions are not pyrolyzed, and the crystal grains are prevented from being coarsened. The tensile strength value after heat treatment at 300 ° C is high.

(較佳實施形態) (better embodiment)

本發明之較佳實施形態係含有鎢,剩餘部分由銅及不可避免之雜質構成的電解銅箔。 A preferred embodiment of the present invention is an electrolytic copper foil containing tungsten and the remainder being composed of copper and unavoidable impurities.

此處,含有鎢係指作為鎢氧化物之微粒或超細顆粒分散存在於母材中。 Here, the inclusion of tungsten means that fine particles or ultrafine particles as tungsten oxide are dispersed in the base material.

電解銅箔中之鎢含量宜於10~2610ppm之範圍內,於280~2460ppm之範圍內更佳。此處,電解銅箔中之鎢含量係指,將作為鎢氧化物之各自之微粒或超細顆粒而含有之鎢成分換算為金屬鎢的含量。若鎢含量過少,則其添加效果基本不顯現。另一方面,若鎢之添加量過多,則其添加效果會變得飽和,盡管成本變高,卻無物性改善之效果。 The content of tungsten in the electrolytic copper foil is preferably in the range of 10 to 2610 ppm, more preferably in the range of 280 to 2460 ppm. Here, the tungsten content in the electrolytic copper foil means that the tungsten component contained as the fine particles or ultrafine particles of the tungsten oxide is converted into the content of the metal tungsten. If the tungsten content is too small, the effect of addition is substantially not apparent. On the other hand, if the amount of addition of tungsten is too large, the effect of addition is saturated, and although the cost is high, the effect of improving physical properties is not obtained.

即,鎢含量小於10ppm之電解銅箔於300℃下加熱1小時後之機械強度與不含鎢時幾乎同樣地會降低。 That is, the mechanical strength of the electrolytic copper foil having a tungsten content of less than 10 ppm after heating at 300 ° C for 1 hour is almost the same as that of the case where tungsten is not contained.

隨著鎢之添加量之增加,經300℃×1 H加熱後之強度的降低會變小,但若含量增加到一定程度,則其效果會變得飽和。 As the amount of tungsten added increases, the decrease in strength after heating at 300 ° C × 1 H becomes small, but if the content is increased to a certain extent, the effect becomes saturated.

另外,用於表示成分含量之單位“ppm”表示“mg/kg”之意。此外,0.0001mass%=1ppm。 In addition, the unit "ppm" for indicating the content of the component means "mg/kg". In addition, 0.0001 mass% = 1 ppm.

較佳實施形態之電解銅箔可通過將含有銅離子以及於pH4以下從鎢鹽中生成之鎢氧化物的pH4以下之硫酸銅類電解液進行電解而獲得。 The electrodeposited copper foil of the preferred embodiment can be obtained by electrolyzing a copper sulfate-based electrolyte solution containing copper ions and tungsten oxide formed from a tungsten salt at pH 4 or lower at pH 4 or lower.

作為電解液中含有之鎢鹽,只要於硫酸-硫酸銅溶液中溶解即可,可列舉鎢酸鈉、鎢酸銨、鎢酸鉀等。 The tungsten salt contained in the electrolytic solution may be dissolved in a sulfuric acid-copper sulfate solution, and examples thereof include sodium tungstate, ammonium tungstate, and potassium tungstate.

較佳實施形態之電解銅箔於低氯化物離子濃度之電解液中,使用該電解液對由鎢鹽生成之鎢酸根離子於pH4以下之電解液中變成之鎢氧化物進行電解析出,直接作為鎢氧化物(主要為WO3,一部分為W2O5,可能還包括WO2)攝入電解銅箔中。此處,該等鎢氧化物作為微粒或超細顆粒分散存在於作為母材之銅中。 In the electrolytic solution of the preferred embodiment, the electrolytic copper foil is electrically analyzed in the electrolyte having a low chloride ion concentration, and the tungsten oxide formed by the tungsten salt in the electrolyte having a pH of 4 or less is electrically analyzed. It is taken up in an electrolytic copper foil as a tungsten oxide (mainly WO 3 and a part of W 2 O 5 , possibly including WO 2 ). Here, the tungsten oxides are dispersed as fine particles or ultrafine particles in copper as a base material.

即,較佳實施形態之電解銅箔,係從低氯化物離子濃度之硫酸-硫酸銅電解液而且是含有鎢氧化物之電解液中,通過電解析出而形成。一般認為,於該含有鎢氧化物之硫酸-硫酸銅電解液中,鎢氧化物從鎢鹽經過鎢酸根離子(WO4 2-或者WO5 2-等),最後形成為微粒或超細顆粒狀。 That is, the electrodeposited copper foil of the preferred embodiment is formed by electrolysis from a sulfuric acid-copper sulfate electrolyte having a low chloride ion concentration and an electrolyte containing tungsten oxide. It is generally believed that in the sulfuric acid-copper sulfate electrolyte containing tungsten oxide, the tungsten oxide is passed from the tungsten salt to the tungstate ion (WO 4 2- or WO 5 2- , etc.), and finally formed into fine particles or ultrafine particles. .

若通過低氯化物離子濃度之含有鎢氧化物之硫酸-硫酸銅電解液實施銅的電解析出,形成電解銅箔,則鎢氧化物之微粒或超細顆粒被吸附於晶粒界,結晶核之生長受到抑制,晶粒變得細小,形成常態下具備較大機械強度的電解銅箔。 When electrolytic copper is electrolyzed by a tungsten oxide-containing sulfuric acid-copper sulfate electrolyte having a low chloride ion concentration to form an electrolytic copper foil, fine particles or ultrafine particles of tungsten oxide are adsorbed to the grain boundary, and the crystal nucleus The growth is suppressed, the crystal grains become fine, and an electrolytic copper foil having a large mechanical strength in a normal state is formed.

該存在於電解銅箔中之鎢氧化物之微粒或超細顆粒不會與內部銅結晶結合或被吸收,保持為鎢氧化物之微粒或超細顆粒。 The fine particles or ultrafine particles of the tungsten oxide present in the electrolytic copper foil are not combined with or absorbed by the internal copper crystals, and are retained as fine particles or ultrafine particles of tungsten oxide.

含有鎢氧化物之電解銅箔即使於300℃左右之高溫下進行加熱,鎢氧化物亦能夠防止銅之微細結晶因熱量而發生再結晶致使晶粒變粗大。 Even if the electrolytic copper foil containing tungsten oxide is heated at a high temperature of about 300 ° C, the tungsten oxide can prevent the fine crystals of copper from being recrystallized by heat to cause coarsening of crystal grains.

因此,較佳實施形態之電解銅箔具有使用含有有機添加劑之硫酸-硫酸銅類電解液製造的電解銅箔所不具備之優異特徵,即:常態下之機械強度較大,於300℃左右之高溫下進行加熱後機械強度之降低亦較小。 Therefore, the electrodeposited copper foil of the preferred embodiment has an excellent characteristic that the electrolytic copper foil produced by using the sulfuric acid-copper sulfate electrolyte containing an organic additive does not have the mechanical strength of the normal state, and is about 300 ° C. The decrease in mechanical strength after heating at a high temperature is also small.

於旋轉之鈦滾筒上從硫酸-硫酸銅類電解液中電解析出銅,將其剝離後連續地進行捲取,從而製造電解銅箔。銅箔之與電解液接觸之面稱為粗面,與鈦滾筒接觸之面稱為光澤面。 Copper was electrolyzed from a sulfuric acid-copper sulfate-based electrolytic solution on a rotating titanium drum, and after peeling off, the copper was continuously wound up to produce an electrolytic copper foil. The surface of the copper foil in contact with the electrolyte is called a rough surface, and the surface in contact with the titanium roller is called a glossy surface.

較佳實施形態之電解銅箔之粗面粗度雖因用途而異,但以Rz≦2.5μm之粗度為佳。光澤面為鈦滾筒之複製品,Rz=0.5~3.0μm左右。另外,此處Rz係指依據JISB0601-1994實施測定之Rz(十點平均粗度)。 The rough surface roughness of the electrolytic copper foil according to the preferred embodiment varies depending on the application, but is preferably Rz ≦ 2.5 μm. The shiny surface is a replica of the titanium roller, Rz=0.5~3.0μm. In addition, Rz here means Rz (10-point average roughness) measured by the implementation of JISB0601-1994.

一般認為,將有機化合物作為夾雜物時,硫酸-硫酸銅類電解液中所添加之有機添加劑於電解液中與銅、氯一起形成化合物。若利用該電解液對銅實施電解析出,形成電解銅箔,則銅-有機添加劑-氯化合物會被吸附於晶粒內部或晶粒界,結晶核之生長受到抑制,晶粒變得細小,形成常態下具備較大機械強度的電解銅箔。 It is considered that when an organic compound is used as an inclusion, the organic additive added to the sulfuric acid-copper sulfate electrolyte solution forms a compound together with copper and chlorine in the electrolytic solution. When copper is electrolyzed by the electrolytic solution to form an electrolytic copper foil, the copper-organic additive-chlorine compound is adsorbed to the inside of the crystal grain or the grain boundary, and the growth of the crystal nucleus is suppressed, and the crystal grains become fine. An electrolytic copper foil having a large mechanical strength in a normal state is formed.

然而,一般認為,該電解銅箔中所含夾雜物為銅-有機添加劑-氯之化合物,因此銅會與內部銅結晶結合或被吸收,存在於電解銅箔中之物質僅會留下有機添加劑及氯,該等有機添加劑與氯暴露於300℃左右之高溫下時會發生分解,因此導致機械強度降低。 However, it is generally believed that the inclusions contained in the electrolytic copper foil are copper-organic additives-chlorine compounds, so copper will be combined with or absorbed by the internal copper crystals, and the substances present in the electrolytic copper foil will only leave organic additives. And chlorine, these organic additives and chlorine will decompose when exposed to high temperatures of about 300 ° C, resulting in a decrease in mechanical strength.

一般認為,於300℃左右之高溫下進行加熱後拉伸強度降低之原因在於,如上所述存在於晶粒界中之夾雜物係有機化合物,有機化合物容易因300℃左右之加熱而發生分解,因此機械強度會降低。 It is considered that the reason why the tensile strength is lowered after heating at a high temperature of about 300 ° C is that the inclusion compound existing in the grain boundary as described above is an organic compound, and the organic compound is liable to be decomposed by heating at about 300 ° C. Therefore, the mechanical strength will decrease.

與此相對,較佳實施形態之電解銅箔係通過電解析出,從低氯化物離子濃度之硫酸-硫酸銅電解液中含有鎢氧化物之電解液中形成的電解銅箔。 On the other hand, the electrolytic copper foil of the preferred embodiment is an electrolytic copper foil formed by electrolytically analyzing an electrolytic solution containing tungsten oxide from a sulfuric acid-copper sulfate electrolyte having a low chloride ion concentration.

鎢成分於硫酸-硫酸銅電解液中經過鎢酸根離子(WO4 2-或者WO5 2-等),形成鎢氧化物(主要為WO3,一部分為 W2O5,可能還包括WO2)之微粒或超細顆粒,並繼續以微粒或超細顆粒狀存在於電解銅箔中。其結果為,可形成銅之結晶核之生長受到抑制,銅之晶粒變得細小,常態下具備較大機械強度的電解銅箔。 The tungsten component passes through a tungstate ion (WO 4 2- or WO 5 2- , etc.) in a sulfuric acid-copper sulfate electrolyte to form a tungsten oxide (mainly WO 3 , a part of W 2 O 5 , possibly including WO 2 ) The particles or ultrafine particles continue to exist in the electrolytic copper foil in the form of fine particles or ultrafine particles. As a result, the growth of the crystal nucleus of copper can be suppressed, and the crystal grains of copper become fine, and the electrolytic copper foil having a large mechanical strength in a normal state can be obtained.

因此,一般認為,較佳實施形態之電解銅箔使用鎢氧化物之微粒或超細顆粒作為夾雜物,不同於銅-有機添加劑-氯之化合物,鎢不會與內部銅結晶結合或者被吸收,而是繼續作為鎢氧化物之微粒或超細顆粒存在於晶粒內部或晶界。 Therefore, it is generally considered that the electrolytic copper foil of the preferred embodiment uses fine particles or ultrafine particles of tungsten oxide as inclusions, and unlike the copper-organic additive-chlorine compound, tungsten does not combine or be absorbed by internal copper crystals. Rather, it continues to exist as fine particles or ultrafine particles of tungsten oxide in the interior or grain boundaries of the grains.

因此,即使暴露於300℃左右之高溫下,鎢氧化物之微粒或超細顆粒亦會停留在晶粒內部或晶界中,防止銅之微細結晶因熱量而發生再結晶,使結晶變得粗大。 Therefore, even if exposed to a high temperature of about 300 ° C, the tungsten oxide particles or ultrafine particles will remain in the grain or in the grain boundary, preventing the fine crystallization of copper from recrystallization due to heat, making the crystal coarse. .

故於較佳實施形態中,常態下機械強度較大,即使於300℃左右之高溫下進行加熱後機械強度之降低亦較小,擁有比使用有機化合物作為夾雜物之電解銅箔更優異之特徵。 Therefore, in the preferred embodiment, the mechanical strength is large under normal conditions, and the mechanical strength is reduced even after heating at a high temperature of about 300 ° C, and is superior to the electrolytic copper foil using an organic compound as an inclusion. .

(電解銅箔之用途) (Use of electrolytic copper foil)

本發明之電解銅箔能夠適用於柔性印刷線路板(FPC)及鋰離子二次電池用負極集電體等各種用途。 The electrodeposited copper foil of the present invention can be suitably used for various applications such as a flexible printed wiring board (FPC) and a negative electrode current collector for a lithium ion secondary battery.

如上所述,用於FPC時需為低粗度,且將聚醯亞胺進行澆注或者加熱層壓後必須具有一定值以上之強度。 As described above, it is required to have a low thickness for the FPC, and it is necessary to have a strength of a certain value or more after pouring or heat laminating the polyimide.

此外,用於鋰離子二次電池用負極集電體時,使用聚醯亞胺作為黏合劑時,為使聚醯亞胺硬化會對負極進行加熱處理。該加熱後銅箔會軟化,若其硬度變得過小,則充放電時活性物質之 膨脹收縮應力會施加到銅箔上,有時會導致銅箔發生變形。更嚴重時,銅箔有可能發生斷裂。因此,負極集電體用銅箔必須在加熱後具有一定值以上之強度。 Further, when it is used for a negative electrode current collector for a lithium ion secondary battery, when polyimide is used as a binder, the negative electrode is subjected to heat treatment in order to harden the polyimide. After heating, the copper foil softens, and if the hardness becomes too small, the active material is charged and discharged. The expansion and contraction stress is applied to the copper foil, sometimes causing the copper foil to deform. In more serious cases, the copper foil may break. Therefore, the copper foil for a negative electrode collector must have a certain value or more after heating.

如此,不論是柔性印刷線路板(FPC)及鋰離子二次電池用負極集電體中之哪一種情況,為實現聚醯亞胺之加熱效果,皆必須於300℃左右之溫度下進行加熱。因此,銅箔以300℃×1 H左右之溫度加熱後,仍必須具有一定值以上之強度。 As described above, in either of the flexible printed wiring board (FPC) and the negative electrode current collector for a lithium ion secondary battery, in order to achieve the heating effect of the polyimide, it is necessary to heat at a temperature of about 300 °C. Therefore, after the copper foil is heated at a temperature of about 300 ° C × 1 H, it is necessary to have a strength of a certain value or more.

本發明之電解銅箔中,對於該等機械特性合格水平之標準,按各項目表示如下。常態下之拉伸強度為TS≧500MPa,0.2%耐力為YS≧300MPa,延伸率為El≧2%。經180℃加熱後之拉伸強度為TS≧310MPa,0.2%耐力為YS≧200MPa,延伸率為El≧1.5%。經300℃×1 H加熱後之拉伸強度為TS≧280MPa,0.2%耐力為YS≧150MPa,延伸率為El≧2.5%。此外,經300℃×1 H加熱後之拉伸強度與常態下之拉伸強度的比為60%以上。 In the electrolytic copper foil of the present invention, the criteria for the level of conformity of these mechanical properties are expressed as follows for each item. The tensile strength under normal conditions is TS ≧ 500 MPa, the 0.2% proof stress is YS ≧ 300 MPa, and the elongation is El ≧ 2%. The tensile strength after heating at 180 ° C was TS ≧ 310 MPa, the 0.2% proof stress was YS ≧ 200 MPa, and the elongation was El ≧ 1.5%. The tensile strength after heating at 300 ° C × 1 H was TS ≧ 280 MPa, the 0.2% proof stress was YS ≧ 150 MPa, and the elongation was El ≧ 2.5%. Further, the ratio of the tensile strength after heating at 300 ° C × 1 H to the tensile strength under normal conditions was 60% or more.

實施例 Example

以下,使用實施例及比較例,具體說明本發明,但本發明並不限定於此。 Hereinafter, the present invention will be specifically described using examples and comparative examples, but the present invention is not limited thereto.

〔實施例1:無有機添加劑〕 [Example 1: No organic additive]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 As the sulfuric acid-copper sulfate electrolyte, the following bath was used as the basic bath composition.

Cu=50~150g/L Cu=50~150g/L

H2SO4=20~200g/L H 2 SO 4 =20~200g/L

作為添加劑A1,將鎢酸鈉按以下量溶解,調製水溶液,並將該水溶液加入上述基本浴組成之電解液中,獲得電解液1。 As the additive A1, sodium tungstate was dissolved in the following amount to prepare an aqueous solution, and this aqueous solution was added to the electrolytic solution of the above basic bath to obtain an electrolytic solution 1.

鎢酸鈉=1mg/L~500mg/L(換算為鎢) Sodium tungstate = 1mg/L~500mg/L (converted to tungsten)

另外,上述量係指「相當於1mg/L~500mg/L鎢金屬之量的鎢酸鈉」(以下相同)。 In addition, the above amount means "sodium tungstate equivalent to the amount of tungsten metal of 1 mg/L to 500 mg/L" (the same applies hereinafter).

後述表2中,作為上述實施例1,於將作為添加劑A1之鎢酸鈉按以下七個水準之添加量添加時,以實施例1-1~1-7進行表示。 In Table 2, which will be described later, as the above-mentioned Example 1, when sodium tungstate as the additive A1 is added in the following seven levels, the results are shown in Examples 1-1 to 1-7.

實施例1-1鎢酸鈉=260mg/L(換算為鎢) Example 1-1 sodium tungstate = 260 mg / L (converted to tungsten)

實施例1-2鎢酸鈉=150mg/L(換算為鎢) Example 1-2 sodium tungstate = 150 mg / L (converted to tungsten)

實施例1-3鎢酸鈉=100mg/L(換算為鎢) Example 1-3 sodium tungstate = 100 mg / L (converted to tungsten)

實施例1-4鎢酸鈉=50mg/L(換算為鎢) Example 1-4 sodium tungstate = 50 mg / L (converted to tungsten)

實施例1-5鎢酸鈉=30mg/L(換算為鎢) Example 1-5 sodium tungstate = 30 mg / L (converted to tungsten)

實施例1-6鎢酸鈉=20mg/L(換算為鎢) Example 1-6 sodium tungstate = 20 mg / L (converted to tungsten)

實施例1-7鎢酸鈉=10mg/L(換算為鎢) Example 1-7 Sodium tungstate = 10 mg / L (converted to tungsten)

氯化物離子濃度均為0mg/L(完全沒有添加)。 The chloride ion concentration was 0 mg/L (no addition at all).

使用鎢濃度相異之該等電解液1中的任一種,按照以下條件實施電沉積,分別製造厚度為12μm之含鎢電解銅箔。 Using any of the electrolytic solutions 1 having different tungsten concentrations, electrodeposition was carried out under the following conditions to produce a tungsten-containing electrolytic copper foil having a thickness of 12 μm.

電流密度=30~100AA/dm2 Current density = 30~100AA/dm 2

溫度=30~70℃ Temperature = 30~70°C

分別對所獲得之各電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度(TS)、0.2%耐力(YS)及延伸率(El),其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及銅箔中之W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for each of the obtained electrolytic copper foils; the tensile strength (TS), 0.2% proof stress (YS) and elongation (El) under normal conditions were 180 ° C. ×1 H tensile strength after heating, 0.2% proof stress and elongation, tensile strength after heating at 300 ° C × 1 H, 0.2% endurance and elongation; and W content in copper foil. These results are shown in Table 2.

此處,粗面(M面)之表面粗度依據JIS B0601-1994實施測定,表示為Ra(算術平均粗度)及Rz(十點平均粗度)。 Here, the surface roughness of the rough surface (M surface) is measured in accordance with JIS B0601-1994, and is expressed as Ra (arithmetic mean roughness) and Rz (ten point average thickness).

此外,拉伸強度、0.2%耐力、延伸率(斷裂延伸率)依據JIS Z2241-1880實施測定。 Further, tensile strength, 0.2% proof stress, and elongation (elongation at break) were measured in accordance with JIS Z2241-1880.

關於銅箔中之W含量,將一定質量之電解銅合金箔用酸溶解後,通過ICP發射光譜法分析溶液中之W,計算出電解銅合金箔中所含之W量。將結果作為W含量(ppm)示於表2。 Regarding the W content in the copper foil, an electrolytic copper alloy foil of a certain mass was dissolved with an acid, and then W in the solution was analyzed by ICP emission spectroscopy to calculate the amount of W contained in the electrolytic copper alloy foil. The results are shown in Table 2 as the W content (ppm).

關於本實施例之銅箔之機械特性合格水平的標準,各測定項目如下所示。粗面粗度(M面粗度)為Ra≦0.5μm、Rz≦2.5μm。常態下之拉伸強度為TS≧500MPa,0.2%耐力為YS≧300MPa,延伸率為El≧2%。經180℃加熱後之拉伸強度為TS≧310MPa,0.2%耐力為YS≧200MPa,延伸率為El≧1.5%。經300℃×1 H加熱後之拉伸強度為TS≧280MPa,0.2%耐力為YS≧150MPa,延伸率為El≧2.5%。此外,經300℃×1 H加熱後之抗拉強度與常態下之抗拉強度的比(%)為50%以上。 Regarding the criteria for the acceptable level of mechanical properties of the copper foil of the present embodiment, each measurement item is as follows. The rough surface roughness (M surface roughness) was Ra ≦ 0.5 μm and Rz ≦ 2.5 μm. The tensile strength under normal conditions is TS ≧ 500 MPa, the 0.2% proof stress is YS ≧ 300 MPa, and the elongation is El ≧ 2%. The tensile strength after heating at 180 ° C was TS ≧ 310 MPa, the 0.2% proof stress was YS ≧ 200 MPa, and the elongation was El ≧ 1.5%. The tensile strength after heating at 300 ° C × 1 H was TS ≧ 280 MPa, the 0.2% proof stress was YS ≧ 150 MPa, and the elongation was El ≧ 2.5%. Further, the ratio (%) of the tensile strength after heating at 300 ° C × 1 H to the tensile strength under normal conditions was 50% or more.

〔實施例2:鎢酸銨〕 [Example 2: Ammonium tungstate]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 As the sulfuric acid-copper sulfate electrolyte, the following bath was used as the basic bath composition.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

作為添加劑A2,將鎢酸銨按以下添加量溶解,調製水溶液,並將該水溶液加入上述基本浴組成之電解液中,獲得電解液2。 As the additive A2, ammonium tungstate was dissolved in the following addition amount to prepare an aqueous solution, and this aqueous solution was added to the electrolytic solution of the above basic bath to obtain an electrolytic solution 2.

實施例2鎢酸銨=150mg/L(換算為鎢) Example 2 Ammonium Tungstate = 150 mg / L (converted to tungsten)

氯化物離子濃度為0mg/L(完全沒有添加)。 The chloride ion concentration was 0 mg/L (no addition at all).

使用該電解液2,按照以下條件實施電解析出,製造厚度為12μm之含鎢電解銅箔。 Using this electrolytic solution 2, electrolysis was carried out under the following conditions to produce a tungsten-containing electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100AA/dm2 Current density = 50~100AA/dm 2

溫度=50~70℃ Temperature = 50~70°C

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 180 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2.

〔實施例3:鎢酸鉀〕 [Example 3: Potassium tungstate]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 As the sulfuric acid-copper sulfate electrolyte, the following bath was used as the basic bath composition.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

作為添加劑A3,將鎢酸鉀按以下添加量溶解,調製水溶液,並將該水溶液加入上述基本浴組成之電解液中,獲得電解液3。 As the additive A3, potassium tungstate was dissolved in the following addition amount to prepare an aqueous solution, and this aqueous solution was added to the electrolytic solution of the above basic bath to obtain an electrolytic solution 3.

實施例3鎢酸鉀=150mg/L(換算為鎢) Example 3 Potassium Tungstate = 150 mg / L (converted to tungsten)

氯化物離子濃度為0mg/L(完全沒有添加)。 The chloride ion concentration was 0 mg/L (no addition at all).

使用該電解液3,按照以下條件實施電解析出,製造厚度為12μm之含鎢電解銅箔。 Using this electrolytic solution 3, electrolysis was carried out under the following conditions to produce a tungsten-containing electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100A/dm2 Current density = 50~100A/dm 2

溫度=50~70℃ Temperature = 50~70°C

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 180 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2.

〔比較例-1〕 [Comparative Example-1]

與實施例1一樣操作,但將W添加量改為低濃度,為鎢酸鈉=3mg/L(換算為鎢),製造厚度為12μm、W含量為5ppm之電解銅箔。 In the same manner as in Example 1, except that the amount of W added was changed to a low concentration and sodium tungstate = 3 mg/L (in terms of tungsten), an electrolytic copper foil having a thickness of 12 μm and a W content of 5 ppm was produced.

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。另外,表中有將拉伸強度表述為抗拉強度之處。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 180 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2. In addition, the table shows the tensile strength as the tensile strength.

〔比較例2〕 [Comparative Example 2]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成,不添加任何添加劑。 As the sulfuric acid-copper sulfate-based electrolyte, the following bath was used as the basic bath composition, and no additive was added.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

使用該電解液,按照以下條件實施電解析出,製造厚度為12μm之電解銅箔。 Using this electrolytic solution, electrolysis was carried out under the following conditions to produce an electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100A/dm2 Current density = 50~100A/dm 2

溫度=50~70℃ Temperature = 50~70°C

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經80℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 80 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2.

〔比較例3〕 [Comparative Example 3]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 As the sulfuric acid-copper sulfate electrolyte, the following bath was used as the basic bath composition.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

分別按照以下量,在基本浴中加入作為添加劑A1之鎢酸鈉、作為添加劑B之鹽酸,獲得電解液。 An electrolytic solution was obtained by adding sodium tungstate as the additive A1 and hydrochloric acid as the additive B to the basic bath in the following amounts.

鎢酸鈉=10mg/L~100mg/L(換算為鎢) Sodium tungstate = 10mg/L~100mg/L (converted to tungsten)

氯化物離子(CL-)=20mg/L~100mg/L Chloride ion (CL - ) = 20mg / L ~ 100mg / L

使用該電解液,按照以下條件實施電解析出,製造厚度為12μm之電解銅箔。 Using this electrolytic solution, electrolysis was carried out under the following conditions to produce an electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100A/dm2 Current density = 50~100A/dm 2

溫度=50~70℃ Temperature = 50~70°C

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 180 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2.

〔比較例4〕 [Comparative Example 4]

作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 As the sulfuric acid-copper sulfate electrolyte, the following bath was used as the basic bath composition.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

分別按照以下量,在基本浴中加入作為添加劑A1之鎢酸鈉、作為添加劑B之鹽酸、作為添加劑C之膠,獲得電解液。 An electrolytic solution was obtained by adding sodium tungstate as the additive A1, hydrochloric acid as the additive B, and the gel as the additive C to the basic bath in the following amounts.

鎢酸鈉=10mg/L~100mg/L(換算為鎢) Sodium tungstate = 10mg/L~100mg/L (converted to tungsten)

氯化物離子(CL-)=20mg/L~100mg/L Chloride ion (CL - ) = 20mg / L ~ 100mg / L

膠=2~10mg/L Glue = 2~10mg/L

使用該電解液,按照以下條件實施電解析出,製造厚度為12μm之電解銅箔。 Using this electrolytic solution, electrolysis was carried out under the following conditions to produce an electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100AA/dm2 Current density = 50~100AA/dm 2

溫度=50~70℃ Temperature = 50~70°C

分別對所獲得之電解銅箔測定粗面(M面)之表面粗度;其於常態下之拉伸強度、0.2%耐力及延伸率,其經180℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率,其經300℃×1 H加熱後之拉伸強度、0.2%耐力及延伸率;以及W含量。該等結果示於表2中。 The surface roughness of the rough surface (M surface) was measured for the obtained electrolytic copper foil; the tensile strength, the 0.2% proof stress and the elongation under normal conditions, and the tensile strength after heating at 180 ° C × 1 H, 0.2% endurance and elongation, tensile strength, 0.2% endurance and elongation after heating at 300 ° C × 1 H; and W content. These results are shown in Table 2.

實施例1-1~1-7及實施例2、實施例3之含鎢電解銅箔之表面粗度非常小,常態下之機械強度較大,經180℃×1 H加熱後及經300℃×1 H加熱後機械強度之降低均較小,例如拉伸強度保持為300MPa以上的值。 The surface roughness of the tungsten-containing electrolytic copper foil of Examples 1-1 to 1-7 and Example 2 and Example 3 is very small, and the mechanical strength under normal conditions is large, after heating at 180 ° C × 1 H and after 300 ° C The decrease in mechanical strength after heating of ×1 H is small, for example, the tensile strength is maintained at a value of 300 MPa or more.

另外,若鎢含量變為500ppm以下,會存在如下趨勢,即隨著含量變小,機械強度會成比例地降低,通過實施例1-7也可 以明確,若鎢含量為10ppm以上,則例如常態下之拉伸強度為500MPa以上。 Further, when the tungsten content is changed to 500 ppm or less, there is a tendency that the mechanical strength is proportionally decreased as the content becomes small, and the embodiment 1-7 can also be used. It is clear that when the tungsten content is 10 ppm or more, for example, the tensile strength in a normal state is 500 MPa or more.

比較例1之含鎢5ppm之電解銅箔與比較例2之完全不含鎢之電解銅箔的機械特性基本相同。若鎢含量過少,則鎢之添加效果較低,結果會導致機械特性劣於實施例。 The electrolytic copper foil containing 5 ppm of tungsten of Comparative Example 1 and the electrolytic copper foil of Comparative Example 2 completely free of tungsten were substantially the same. If the tungsten content is too small, the effect of adding tungsten is low, and as a result, mechanical properties are inferior to the examples.

比較例3之於電解液中添加鎢以及大於3mg/L之氯化物離子而獲得之電解銅箔,其常態下之機械強度不足,且經300℃×1 H加熱後機械強度降低。此外,對該銅箔中之W量實施測定,其結果為檢測下限值(1ppm(=0.0001mass%))以下。 In Comparative Example 3, an electrolytic copper foil obtained by adding tungsten and a chloride ion of more than 3 mg/L to the electrolytic solution was insufficient in mechanical strength under normal conditions, and the mechanical strength was lowered after heating at 300 ° C × 1 H. Further, the amount of W in the copper foil was measured, and as a result, the lower limit (1 ppm (=0.0001 mass%)) or less was detected.

由此可知,若電解液中含有氯化物離子,則鎢之析出受到抑制。 From this, it is understood that if chloride ions are contained in the electrolytic solution, precipitation of tungsten is suppressed.

比較例4係基於專利文獻1(日本專利第3238278號)製作而成,係於比較例3之電解液中進而添加膠,以此組成製作而成。 Comparative Example 4 was produced based on Patent Document 1 (Japanese Patent No. 3238278), and was prepared by adding a gel to the electrolytic solution of Comparative Example 3.

該電解銅箔之粗面粗度較大,常態下之機械強度亦較小,經300℃×1 H加熱後機械強度降低。此外,對該銅箔中之W量實施測定,其結果為檢測下限以下。 The thickness of the rough surface of the electrolytic copper foil is large, and the mechanical strength under normal conditions is also small, and the mechanical strength is lowered after heating at 300 ° C × 1 H. Further, the amount of W in the copper foil was measured, and as a result, the detection limit was equal to or less.

於電解液中含有超過3mg/L之氯化物離子時,會抑制鎢等難以與銅生成合金之金屬之電解析出,例如從膠等有機添加劑之添加效果確認,雖然會形成粗面粗度大之電解銅箔,但不會形成電解銅合金箔。 When the electrolyte contains more than 3 mg/L of chloride ions, it suppresses the electrical analysis of a metal such as tungsten which is difficult to form an alloy with copper. For example, it is confirmed from the effect of addition of an organic additive such as a rubber, and the rough surface roughness is large. Electrolytic copper foil, but does not form an electrolytic copper alloy foil.

如上所述,本發明人在為實現本發明而進行之研究過程中確認,使自鎢鹽產生之鎢氧化物存在於硫酸-硫酸銅電解液中,並以超過3mg/L之高濃度含有氯化物離子時,電解析出之銅中不會共析鎢。 As described above, the inventors confirmed in the research conducted for realizing the present invention that the tungsten oxide produced from the tungsten salt is present in the sulfuric acid-copper sulfate electrolyte and contains chlorine at a concentration higher than 3 mg/L. In the case of a compound ion, tungsten is not eutectoid in the electrolyzed copper.

〔實施例11~21:W、Mo、Ti、Te之使用〕 [Examples 11 to 21: Use of W, Mo, Ti, Te]

於實施例11~21以及比較例11中,作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 In Examples 11 to 21 and Comparative Example 11, as the sulfuric acid-copper sulfate-based electrolytic solution, the following bath was used as the basic bath composition.

Cu=80~120g/L Cu=80~120g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

於基本浴中,添加將表3所記載之各種金屬鹽化合物(各種金屬源)及氯化鈉(氯化物離子源)作為添加劑溶解而得之水溶液,調整為表3所記載之金屬鹽濃度及氯化物離子濃度,獲得電解液。 An aqueous solution obtained by dissolving various metal salt compounds (various metal sources) and sodium chloride (chloride ion source) described in Table 3 as an additive was added to the basic bath, and the concentration of the metal salt described in Table 3 was adjusted. The chloride ion concentration was obtained to obtain an electrolyte.

使用該各種電解液中之任一種,按照以下條件實施電解析出,分別製造厚度為12μm之電解銅箔。 Electrolytic analysis was carried out using any of the various electrolytic solutions under the following conditions to produce electrolytic copper foil having a thickness of 12 μm.

電流密度=50~100A/dm2 Current density = 50~100A/dm 2

溫度=50~70℃ Temperature = 50~70°C

基於專利文獻2(日本專利特開2000-17476號公報),如下製成比較例12。將含有CuSO4.5H2O、H2SO4以及SnSO4之電解液在空氣中實施鼓泡處理,調製由CuSO4.5H2O=250g/L、H2SO4=50g/L、SnO2微粒或超細顆粒=3g/L、SnSO4=10g/L、作為聚醚之聚乙二醇=0.001~0.1g/L構成之電解液。使用該電解液,於電流密度=10A/dm2、浴溫度=50℃之條件下實施電解析出,製造厚度為12μm之電解銅箔。 Comparative Example 12 was prepared as follows based on Patent Document 2 (Japanese Patent Laid-Open Publication No. 2000-17476). Will contain CuSO 4 . The electrolytes of 5H 2 O, H 2 SO 4 and SnSO 4 were subjected to bubbling treatment in air, and were prepared by CuSO 4 . 5H 2 O=250g/L, H 2 SO 4 =50g/L, SnO 2 fine particles or ultrafine particles=3g/L, SnSO 4 =10g/L, polyethylene glycol as polyether=0.001~0.1g/ The electrolyte composed of L. Using this electrolytic solution, electrolysis was carried out under the conditions of a current density = 10 A/dm 2 and a bath temperature = 50 ° C to produce an electrolytic copper foil having a thickness of 12 μm.

基於專利文獻3(日本專利第3943214號公報),如下製成比較例13。使用於銅離子濃度為70~120g/L、硫酸根離子濃度 為50~120g/L之硫酸酸性硫酸銅溶液中添加銀離子50ppm而成的電解液。使用該電解液,於電流密度=120A/dm2、電解液溫度=57℃之條件下實施電解析出,製造厚度為12μm之電解銅箔。 Comparative Example 13 was prepared as follows based on Patent Document 3 (Japanese Patent No. 3943214). An electrolyte solution obtained by adding 50 ppm of silver ions to a sulfuric acid acidic copper sulfate solution having a copper ion concentration of 70 to 120 g/L and a sulfate ion concentration of 50 to 120 g/L. Using this electrolytic solution, electrolysis was carried out under the conditions of a current density of 120 A/dm 2 and an electrolyte temperature of 57 ° C to produce an electrolytic copper foil having a thickness of 12 μm.

作為參考例,使用厚度為12μm之市售之Cu-0.015~0.03 Zr軋製銅合金箔(商品名:HCL-02Z、日立電線株式會社製)。 As a reference example, a commercially available Cu-0.015-0.03 Zr rolled copper alloy foil (trade name: HCL-02Z, manufactured by Hitachi Cable Co., Ltd.) having a thickness of 12 μm was used.

關於所獲得之各實施例及比較例之電解銅箔以及參考例之軋製銅合金箔,分別如下測定常態下之拉伸強度(TS)、其經300℃×1 H加熱後之拉伸強度、該等之比、導電率(EC)、氯含量、以及金屬含量。 With respect to the obtained electrodeposited copper foil of each of the examples and the comparative examples and the rolled copper alloy foil of the reference example, the tensile strength (TS) in the normal state and the tensile strength after heating at 300 ° C × 1 H were measured as follows. , the ratio, conductivity (EC), chlorine content, and metal content.

依據JIS Z2241-1880,測定拉伸強度。銅箔於常態下之拉伸強度之值為500MPa以上則判斷為良好,小於500MPa則判斷為不良。此外,以更理想態樣之條件而言,將銅箔於300℃下加熱處理1小時(300℃×1 H)後之拉伸強度之值與常態下之拉伸強度之值的比為80%以上時,判斷為良好,小於80%時,判斷為不良。 The tensile strength was measured in accordance with JIS Z2241-1880. When the value of the tensile strength of the copper foil in the normal state is 500 MPa or more, it is judged to be good, and when it is less than 500 MPa, it is judged to be bad. Further, in a more ideal condition, the ratio of the tensile strength of the copper foil after heat treatment at 300 ° C for 1 hour (300 ° C × 1 H) to the value of the tensile strength under normal conditions is 80. When it is more than %, it is judged to be good, and when it is less than 80%, it is judged to be bad.

依據JIS K6271,通過4端子法(電流電壓法)測定導電率。銅箔之導電率為65% IACS以上時判斷為優秀,50% IACS以上時判斷為良好,小於50% IACS時判斷為不良。 The conductivity was measured by a 4-terminal method (current-voltage method) in accordance with JIS K6271. When the conductivity of the copper foil was 65% IACS or more, it was judged to be excellent, and when it was 50% IACS or more, it was judged to be good, and when it was less than 50% IACS, it was judged to be bad.

關於銅箔中W等金屬及Cl之含量,將一定質量之電解銅箔用酸溶解後,通過ICP發射光譜法之分析,計算出所獲得之溶液中W等之金屬量。此外,通過氯化銀滴定法(檢測極限:1ppm)求出所得溶液中氯之含量。 Regarding the content of metal such as W in the copper foil and Cl, the electrolytic copper foil of a certain mass is dissolved with an acid, and the amount of metal such as W in the obtained solution is calculated by ICP emission spectrometry. Further, the content of chlorine in the obtained solution was determined by a silver chloride titration method (detection limit: 1 ppm).

該等結果示於表3中。 These results are shown in Table 3.

作為金屬氧化物,實施例11~17將鎢(W)之氧化物微粒或超細顆粒、實施例18及21將鉬(Mo)之氧化物微粒或超細顆粒、實施例19將鈦(Ti)之氧化物微粒或超細顆粒、實施例20將碲(Te)之氧化物微粒或超細顆粒分別攝入電解銅箔中,其含量按照各金屬換算都在10~2610ppm之範圍內。因此,具有高達500MPa以上之常態拉伸強度,並且經300℃×1 H加熱後之拉伸強度之維持率亦達50%以上。導電率亦為55%以上。 As the metal oxide, Examples 11 to 17 were oxide fine particles or ultrafine particles of tungsten (W), Examples 18 and 21 were oxide fine particles or ultrafine particles of Mo (Mo), and Example 19 was titanium (Ti). In the example 20, the oxide fine particles or the ultrafine particles of cerium (Te) were respectively taken up into the electrolytic copper foil, and the content thereof was in the range of 10 to 2610 ppm in terms of each metal. Therefore, it has a normal tensile strength of up to 500 MPa or more, and the maintenance strength of the tensile strength after heating by 300 ° C × 1 H is also 50% or more. The electrical conductivity is also 55% or more.

尤其是,實施例11~14、18、19、20之金屬元素含量在100~2500ppm之範圍內。因此,具有高達500MPa以上之常態拉伸強度,並且經300℃×1 H加熱後之拉伸強度之維持率亦超過80%。導電率亦高達65%以上。 In particular, the metal element contents of Examples 11 to 14, 18, 19, and 20 were in the range of 100 to 2,500 ppm. Therefore, it has a normal tensile strength of up to 500 MPa or more, and the maintenance strength of the tensile strength after heating by 300 ° C × 1 H is also more than 80%. The conductivity is also as high as 65% or more.

尤其是,於含有鎢之實施例11~14、17中,鎢含量為280~2460ppm,具有高達600MPa以上之常態拉伸強度,並且經300℃×1 H加熱後之拉伸強度之維持率亦超過80%。導電率亦高達65%以上。實施例1-1~1-5、2、3中亦相同。 In particular, in Examples 11 to 14, 17 containing tungsten, the tungsten content is 280 to 2,460 ppm, and the tensile strength is as high as 600 MPa or more, and the tensile strength after heating at 300 ° C × 1 H is also maintained. More than 80%. The conductivity is also as high as 65% or more. The same applies to Examples 1-1 to 1-5, 2, and 3.

實施例16僅攝入小於100ppm之鎢之氧化物微粒或超細顆粒,實施例21僅攝入小於100ppm之鉬之氧化物微粒或超細顆粒,其含量較低。因此,雖然常態下之拉伸強度足夠高,但經300℃×1 H加熱後之拉伸強度降低。 Example 16 only ingested less than 100 ppm of tungsten oxide fine particles or ultrafine particles, and Example 21 ingested only less than 100 ppm of molybdenum oxide fine particles or ultrafine particles, which was low in content. Therefore, although the tensile strength under normal conditions is sufficiently high, the tensile strength after heating at 300 ° C × 1 H is lowered.

實施例15中,鎢之氧化物微粒或超細顆粒之攝入量超過2500ppm。因此,雖然拉伸強度與耐熱性均有提高效果,但導電率低於65%。 In Example 15, the intake amount of tungsten oxide fine particles or ultrafine particles exceeded 2,500 ppm. Therefore, although both tensile strength and heat resistance are improved, the electrical conductivity is less than 65%.

實施例17中,電解液中之氯化物離子含量為3ppm。電解銅箔中未檢測出氯,但結果並不遜色於實施例11~14。 In Example 17, the chloride ion content in the electrolytic solution was 3 ppm. No chlorine was detected in the electrolytic copper foil, but the results were not inferior to Examples 11 to 14.

另外,實施例13係金屬(W)含量不同於上述實施例1-1之試驗例。一般認為,因金屬含量均較多,故所含有之夾雜物之效果飽和,兩個試驗例中實驗結果相同。 Further, Example 13 is a test example in which the metal (W) content is different from that of the above Example 1-1. It is generally believed that the effect of inclusions is saturated due to the high metal content, and the experimental results are the same in the two test cases.

此外,在SIMS(Secondary Ion Mass Spectrometry)分析中,測定電解銅箔之氯含量。SIMS分析之測定條件為,一次離子:Cs+(5kV、100nA)、二次(檢測)離子:銅(Cu)63Cu-.氯(Cl)35Cl-、濺射區域:200μm×400μm。由於電解銅箔之表面會受到污垢、氧化膜之影響,故自表面至深度方向2μm處實施濺射、除去,然後開始測定,對深至4μm處進行分析。根據各測定元素之強度之平均值與銅強度之平均值計算強度比,並與標準樣本進行比較、定量,結果確認,各實施例之電解銅箔中之氯含量小於1ppm。一般推測,由於氯含量較少,鎢量增加,對提高耐熱性發揮了作用。 Further, in the SIMS (Secondary Ion Mass Spectrometry) analysis, the chlorine content of the electrolytic copper foil was measured. The measurement conditions for SIMS analysis are: primary ions: Cs + (5kV, 100nA), secondary (detection) ions: copper (Cu) 63 Cu-. Chlorine (Cl) 35 Cl-, sputtering zone: 200 μm × 400 μm. Since the surface of the electrolytic copper foil was affected by the dirt and the oxide film, sputtering and removal were performed from the surface to the depth direction of 2 μm, and measurement was started, and the analysis was performed at a depth of 4 μm. The intensity ratio was calculated from the average of the intensities of the respective measured elements and the copper strength, and compared with the standard sample, and it was confirmed that the chlorine content in the electrolytic copper foil of each example was less than 1 ppm. It is generally estimated that the amount of tungsten increases due to the low chlorine content, which plays a role in improving heat resistance.

比較例11中,電解銅箔中含有氯2ppm。因此,電解銅箔中鎢(W)之氧化物微粒或超細顆粒之含量較少,與實施例11~21相比,拉伸強度亦為低值。 In Comparative Example 11, the electrolytic copper foil contained 2 ppm of chlorine. Therefore, the content of the oxide fine particles or the ultrafine particles of tungsten (W) in the electrolytic copper foil is small, and the tensile strength is also low as compared with Examples 11 to 21.

比較例12中,電解銅箔中含有氯6ppm。因此,電解銅箔中未檢測出鎢(W)。與實施例11~21相比,拉伸強度亦為低值。 In Comparative Example 12, the electrolytic copper foil contained 6 ppm of chlorine. Therefore, tungsten (W) was not detected in the electrolytic copper foil. The tensile strength was also lower than those of Examples 11 to 21.

比較例13係基於專利文獻2(日本專利特開2000-17476號公報)製成之試驗例。Cu-Sn作為軋製合金亦眾所周知。即使將比較例13之電解銅箔與Cu-Sn軋製合金相比,其各種特性值及製造成本也不具有優勢。此外,於硫酸酸性電解液中,通過氧鼓泡將並非氧化物之硫酸錫(SnSO4)強制氧化成SnO2微粒或超細顆粒,因此不僅要花費製造上之成本,而且在電解液中生成並被攝入銅箔中之氧化物粒徑超過20nm,粒徑大於鎢等之粒子,故導電率亦較低。 Comparative Example 13 is a test example produced based on Patent Document 2 (Japanese Patent Laid-Open Publication No. 2000-17476). Cu-Sn is also known as a rolled alloy. Even if the electrolytic copper foil of Comparative Example 13 is compared with the Cu-Sn rolled alloy, various characteristic values and manufacturing costs are not advantageous. Further, in the sulfuric acid acidic electrolyte, tin oxide (SnSO 4 ) which is not an oxide is forcibly oxidized into SnO 2 fine particles or ultrafine particles by oxygen bubbling, so that it is not only costly in production but also generated in the electrolytic solution. The oxide in the copper foil is more than 20 nm, and the particle diameter is larger than that of tungsten or the like, so the conductivity is also low.

比較例14係基於專利文獻3(日本專利第3943214號公報)製成之試驗例。比較例14之電解銅箔中,Ag與Cu固溶後,作為金屬Ag被攝入。因此,與將金屬作為氧化物之微粒或超細顆粒攝入後強化析出之本發明之實施例相比,經300℃×1 H加熱後之拉伸強度相對於常態下之拉伸強度之比(%)較差。 Comparative Example 14 is a test example produced based on Patent Document 3 (Japanese Patent No. 3943214). In the electrolytic copper foil of Comparative Example 14, after Ag and Cu were solid-solved, they were taken in as metal Ag. Therefore, the ratio of the tensile strength after heating at 300 ° C × 1 H to the tensile strength under normal conditions is compared with the embodiment of the present invention in which the metal is taken up as fine particles or ultrafine particles of the oxide to enhance precipitation. (%) is poor.

參考例為Cu-0.015~0.03 Zr軋製銅合金箔。由此可知,與軋製銅合金箔相比,本發明之電解銅箔具有同等以上之機械特性與導電率。 The reference example is Cu-0.015~0.03 Zr rolled copper alloy foil. From this, it is understood that the electrolytic copper foil of the present invention has mechanical properties and electrical conductivity equal to or higher than those of the rolled copper alloy foil.

〔實施例31~38:硫脲類有機物之使用〕 [Examples 31 to 38: Use of thiourea organic matter]

於實施例31~38中,作為硫酸-硫酸銅類電解液,使用以下浴作為基本浴組成。 In Examples 31 to 38, as the sulfuric acid-copper sulfate-based electrolytic solution, the following bath was used as the basic bath composition.

CuSO4=200~500g/L CuSO 4 =200~500g/L

H2SO4=80~120g/L H 2 SO 4 =80~120g/L

NaCl=0~55mg/L NaCl=0~55mg/L

於基本浴中,添加將表3所記載之各種金屬鹽化合物(各種金屬源)及有機物成分作為添加劑溶解而得之水溶液,調整為表3所記載之金屬鹽濃度及有機物濃度,獲得電解液。另外,金屬鹽化合物之濃度表示作為金屬所含之濃度。 An aqueous solution obtained by dissolving various metal salt compounds (various metal sources) and organic components described in Table 3 as an additive was added to the base bath, and the metal salt concentration and the organic substance concentration described in Table 3 were adjusted to obtain an electrolytic solution. Further, the concentration of the metal salt compound means the concentration contained as a metal.

使用該各種電解液中之任一種,按照以下條件實施電解析出,分別製造厚度為12μm之電解銅箔。 Electrolytic analysis was carried out using any of the various electrolytic solutions under the following conditions to produce electrolytic copper foil having a thickness of 12 μm.

電流密度=30~100AA/dm2 Current density = 30~100AA/dm 2

溫度=30~75℃ Temperature = 30~75°C

與其他實施例同樣操作,對所獲得之各實施例之電解銅箔測定常態下之拉伸強度(TS)、其經300℃×1 H加熱後於常溫下測定之拉伸強度、該等之比、以及金屬含量。該等結果示於表3中。 The tensile strength (TS) in the normal state of the obtained electrolytic copper foil of each of the obtained examples was measured in the same manner as in the other examples, and the tensile strength measured at room temperature after heating at 300 ° C × 1 H, and the like. Ratio, and metal content. These results are shown in Table 3.

實施例31~35僅添加有機物成分。實施例31~35中,電解銅箔中不含有金屬,但含有有機物成分作為夾雜物,故常態下具有超過700MPa之高拉伸強度。但是,由於夾雜物為有機物成分, 故與含有金屬微粒之實施例36~38相比,300℃下加熱1小時後於常溫下測定之拉伸強度的維持率較低。 In Examples 31 to 35, only the organic component was added. In Examples 31 to 35, the electrolytic copper foil does not contain a metal, but contains an organic component as an inclusion, so that it has a high tensile strength of more than 700 MPa in a normal state. However, since the inclusions are organic components, Therefore, compared with Examples 36 to 38 containing metal fine particles, the tensile strength retention rate measured at room temperature after heating at 300 ° C for 1 hour was low.

實施例36~38中,添加金屬鹽化合物與有機物成分兩者。實施例36~38中,電解銅箔中含有98~280ppm之金屬,並具有粒徑為5.8~6.1之夾雜物,故常態下具有超過700MPa之高拉伸強度。此外,由於夾雜物為金屬氧化物,故300℃下加熱1小時後於常溫下測定之拉伸強度的維持率較高。 In Examples 36 to 38, both a metal salt compound and an organic component were added. In Examples 36 to 38, the electrolytic copper foil contained 98 to 280 ppm of metal and had inclusions having a particle diameter of 5.8 to 6.1, so that it had a high tensile strength of more than 700 MPa in a normal state. Further, since the inclusions were metal oxides, the tensile strength retention rate measured at room temperature after heating at 300 ° C for 1 hour was high.

實施例38僅攝入小於100ppm之鎢之氧化物微粒或超細顆粒,其含量較低。因此,雖然常態下之拉伸強度足夠高,但經300℃×1 H加熱後於常溫下測定之拉伸強度降低。 Example 38 only ingested less than 100 ppm of tungsten oxide fine particles or ultrafine particles, which was low in content. Therefore, although the tensile strength under normal conditions is sufficiently high, the tensile strength measured at room temperature after heating at 300 ° C × 1 H is lowered.

此外,根據後述夾雜物之平均粒徑之測定結果,於僅添加金屬鹽化合物之實施例中,夾雜物之平均粒徑為1nm左右。但是,於實施例31~35中,源自有機物成分之夾雜物之平均粒徑超過10nm,具有相對較大之粒徑。此外,實施例36~38含有金屬氧化物微粒等以及源自有機物成分之夾雜物兩者,故平均粒徑為5nm左右。 Further, according to the measurement results of the average particle diameter of the inclusions described later, in the examples in which only the metal salt compound was added, the average particle diameter of the inclusions was about 1 nm. However, in Examples 31 to 35, the inclusions derived from the organic component had an average particle diameter of more than 10 nm and a relatively large particle diameter. Further, in Examples 36 to 38, both metal oxide fine particles and the like and inclusions derived from the organic component were contained, and the average particle diameter was about 5 nm.

(晶粒之SIM觀察) (SIM observation of the die)

此外,通過SIM(掃描離子顯微鏡法)觀察各實施例相關之電解銅箔後發現,任意電解銅箔中銅之晶粒之平均粒徑均為100~600nm,銅之晶粒的形狀均為大致球形,長軸與短軸之縱橫比為0.5~2.0左右。 Further, after observing the electrolytic copper foils of the respective examples by SIM (scanning ion microscopy), it was found that the average grain size of the crystal grains of copper in any of the electrolytic copper foils was 100 to 600 nm, and the shape of the crystal grains of the copper was substantially The spherical shape has an aspect ratio of the long axis to the short axis of about 0.5 to 2.0.

〔TEM觀察〕 [TEM observation]

為了確認含有夾雜物,對添加有W之銅箔樣本(實施例1-1)實施TEM(Transmission Electron Microscopy,穿透式電子顯微鏡)觀察。另外,製作TEM樣本時,使用Ga離子束之加速電壓為30kV之FIB(Focused Ion Beam,聚焦離子束)法。其後,為了利用FIB除去樣本表面之損壞,於對樣本表面用液態氮冷卻的同時,照射30分鐘1kV之Ar離子束。燒成處理前銅箔之TEM觀察結果如圖2所示。使用TOPCON製002BF,拍攝欠焦影像。對焦值係自正焦位置變化-300nm。若於欠焦位置進行觀察,會觀察到受夾雜物邊緣之影響,形成菲涅耳紋,強調了夾雜物。由於並非正焦,故觀察到之夾雜物大小比其本身大小要大,觀察到大量數nm大小之夾雜物。觀察到箭頭所示之夾雜物相對較大。 In order to confirm the inclusion of inclusions, a copper foil sample (Example 1-1) to which W was added was subjected to TEM (Transmission Electron Microscopy) observation. Further, in the case of producing a TEM sample, a FIB (Focused Ion Beam) method using an acceleration voltage of a Ga ion beam of 30 kV was used. Thereafter, in order to remove the damage of the sample surface by FIB, an Ar ion beam of 1 kV was irradiated for 30 minutes while cooling the surface of the sample with liquid nitrogen. The TEM observation results of the copper foil before the firing treatment are shown in Fig. 2 . Use the TOPCON system 002BF to shoot under-focus images. The focus value is changed from the positive focus position to -300 nm. If observed at the under-focus position, it is observed that the influence of the edge of the inclusions forms a Fresnel pattern, which emphasizes the inclusions. Since it is not a positive focus, the size of the inclusions observed is larger than its own size, and a large number of inclusions of several nm in size are observed. It is observed that the inclusions indicated by the arrows are relatively large.

圖3表示了對實施例1-1相關之銅箔進行300℃燒成後之銅箔TEM影像。係與圖2相同條件之欠焦影像。與燒成前之銅箔相比,觀察到夾雜物較大。觀察到圖中箭頭所示之夾雜物相對較 大。雖然一般認為通過燒成,夾雜物會凝集,但是如此大之夾雜物會發揮更強之釘扎效應,故有望成為高強度、高耐性銅箔。 Fig. 3 is a view showing a TEM image of a copper foil obtained by firing a copper foil according to Example 1-1 at 300 °C. An under-focus image of the same condition as in Figure 2. The inclusions were observed to be larger than the copper foil before firing. Observe that the inclusions shown by the arrows in the figure are relatively Big. Although it is generally considered that inclusions will agglomerate by firing, such large inclusions exert a stronger pinning effect, and thus it is expected to be a high-strength, high-resistance copper foil.

圖4表示了高分辨率STEM影像。此處,使用日本電子株式會社製像差校正STEM2100F,獲得High Angle Annular Dark Field-Scanning Transmission Electron Microscopy(HAADF-STEM,高角度環形暗場掃描式穿透電子顯微鏡)影像。於Cu晶格影像中觀察到對比度不同之由W原子形成之夾雜物。其大小為1~2nm。 Figure 4 shows a high resolution STEM image. Here, the High Angle Annular Dark Field-Scanning Transmission Electron Microscopy (HAADF-STEM) image was obtained using the aberration correction STEM 2100F manufactured by JEOL Ltd. Inclusions formed by W atoms having different contrasts were observed in the Cu lattice image. Its size is 1~2nm.

圖5表示了含有伸乙基硫脲與鎢兩者之銅箔的HAADF-STEM影像。此處,於數nm~10nm大小之晶粒內以及晶體界面觀察到夾雜物。存在於晶體界面之夾雜物發揮著釘扎力以阻止晶粒變肥大,而位於晶粒內之夾雜物,即便其後通過燒成等操作結晶變肥大,亦會發揮釘扎力,從而防止結晶進一步肥大。 Figure 5 shows a HAADF-STEM image of a copper foil containing both ethyl thiourea and tungsten. Here, inclusions were observed in the crystal grains of a size of several nm to 10 nm and at the crystal interface. The inclusions present at the crystal interface exert a pinning force to prevent the grains from becoming fat, and the inclusions located in the grains, even if they are crystallized by firing or the like, will exert a pinning force to prevent crystallization. Further hypertrophy.

圖6表示了不含W之銅箔之TEM影像,未觀察到夾雜物。進行了多視角觀察,未能觀察到圖2、3、4、5那種夾雜物。根據這一事實可知,通過添加W等金屬,本發明實施形態之銅箔中成功地形成有夾雜物。 Fig. 6 shows a TEM image of a copper foil containing no W, and no inclusions were observed. The multi-angle observation was carried out, and the inclusions of Figs. 2, 3, 4, and 5 were not observed. From this fact, it is understood that inclusions are successfully formed in the copper foil of the embodiment of the present invention by adding a metal such as W.

〔小角度X射線散射測定〕 [Small angle X-ray scattering measurement]

小角度X射線散射係直接測定內部樣本中1nm~1μm之物體尺寸及形狀、奈米級原子、分子之分佈、波動的方法。若使用本測定方法,可以計算出TEM觀察中所示之微粒之平均粒徑、尺寸分佈、數密度。 The small-angle X-ray scattering system directly measures the size and shape of an object in the internal sample, the distribution of nanometer atoms, molecules, and fluctuations. By using this measurement method, the average particle diameter, size distribution, and number density of the microparticles shown in the TEM observation can be calculated.

對添加有W之銅箔樣本(實施例1-1)、添加有Mo之銅箔樣本(實施例18)及添加有W與TU(硫脲)之銅箔樣本(實施例36)實施SAXS(small angle X-ray scattering,小角度X射線散射)與USAXS(ultra small angle X-ray scattering,超小角度X射線散射)測定。SAXS(USAXS)測定中,用Spring-8(super photonring 8 GeV,高亮度放射光裝置)之產業利用光束線BL19B2進行測定。 SAXS was applied to a copper foil sample (Example 1-1) to which W was added, a copper foil sample to which Mo was added (Example 18), and a copper foil sample (Example 36) to which W and TU (thiourea) were added (Example 36) Small angle X-ray scattering, and USXS (ultra small angle X-ray scattering). In the SAXS (USAXS) measurement, the industry using Spring-8 (super photonring 8 GeV, high-intensity radiation device) was measured by the beam line BL19B2.

圖7(a)係表示SAXS(USAXS)測定之光軸簡圖。自具有快門15之X射線源13產生之入射X射線14通過單色儀17、第1針孔19、第2針孔21、第3針孔25,照射至樣本27。自照射至樣本27之入射X射線14產生透過樣本27之透過X射線29以及被樣本27散射之散射X射線31。檢測器35設置於光軸之最後端,檢測透過X射線29或散射X射線31。 Fig. 7(a) is a schematic diagram showing the optical axis of the SAXS (USAXS) measurement. The incident X-rays 14 generated from the X-ray source 13 having the shutter 15 are irradiated to the sample 27 through the monochromator 17, the first pinhole 19, the second pinhole 21, and the third pinhole 25. The incident X-rays 14 that are illuminated from the sample 27 produce transmitted X-rays 29 that pass through the sample 27 and scattered X-rays 31 that are scattered by the sample 27. The detector 35 is disposed at the rear end of the optical axis to detect the transmitted X-rays 29 or the scattered X-rays 31.

利用檢測器35測定散射X射線31時,如圖7(b)所示,不通過衰減器23,將入射X射線14照射至樣本27,利用射束阻擋器33屏蔽透過X射線29,並利用檢測器35測定散射X射線31。 When the scattered X-rays 31 are measured by the detector 35, as shown in FIG. 7(b), the incident X-rays 14 are irradiated to the sample 27 without passing through the attenuator 23, and the X-rays 29 are shielded and transmitted by the beam blocker 33, and are utilized. The detector 35 measures the scattered X-rays 31.

利用檢測器35測定透過X射線29時,如圖7(c)所示,利用衰減器23削弱入射X射線14之強度後,將入射X射線14照射至樣本27,不利用射束阻擋器33屏蔽透過X射線29,利用檢測器35測定透過X射線29。 When the X-rays 29 are transmitted by the detector 35, as shown in FIG. 7(c), after the intensity of the incident X-rays 14 is weakened by the attenuator 23, the incident X-rays 14 are irradiated to the sample 27 without using the beam blocker 33. The shield transmits X-rays 29, and the transmitted X-rays 29 are measured by the detector 35.

將自樣本27至檢測器35之距離設為L。將透過樣本27之透過X射線29到達檢測器35之位置設為O,同樣,將自樣本 27以角度θ散射之散射X射線31到達檢測器35之位置設為A。若AO=r,則tanθ=r/L,可計算出θ。然後,SAXS以及USAXS之數據橫軸用式(4)表示,記做q(nm-1)。 The distance from the sample 27 to the detector 35 is set to L. The position at which the transmitted X-rays 29 passing through the sample 27 reach the detector 35 is set to 0, and similarly, the position at which the scattered X-rays 31 scattered from the sample 27 at the angle θ reaches the detector 35 is set to A. If AO = r, then tan θ = r / L, θ can be calculated. Then, the horizontal axis of the data of SAXS and USAXS is represented by the formula (4), and is denoted by q (nm -1 ).

q=4πsinθ/λ‧‧‧(4) q=4πsinθ/λ‧‧‧(4)

λ係入射X射線之波長。測定時,設λ=0.068nm,自樣本至檢測器之距離L=4.2m(SAXS)、L=42m(USAXS)。測定之範圍為q=0.05~4(nm-1)。檢測器使用半導體二維檢測器PILATUS。實施SAXS測定後,查看二維X射線之強度映像,確認並無非等向性後,實施一維化。圖8(a)係表示含有W之電解銅箔之圖,圖8(b)係表示含有Mo之電解銅箔之圖,圖8(c)係表示含有W+TU(硫脲)之電解銅箔之圖,圖中A表示燒成後之銅箔,圖中B表示燒成前之銅箔,圖中C表示純銅箔。縱軸表示X射線之強度,橫軸表示作為q之SAXS數據。由圖可知,對純銅箔與電解銅箔進行比較,q=0.4~2之間,X射線強度不同。這表明電解銅箔中存在10nm以下之夾雜物。 λ is the wavelength at which X-rays are incident. For the measurement, λ = 0.068 nm, and the distance from the sample to the detector L = 4.2 m (SAXS), L = 42 m (USAXS). The range of the measurement was q = 0.05 to 4 (nm -1 ). The detector uses a semiconductor two-dimensional detector PILATUS. After the SAXS measurement was performed, the intensity map of the two-dimensional X-rays was examined, and it was confirmed that there was no anisotropy, and then one-dimensionalization was performed. Fig. 8(a) is a view showing an electrolytic copper foil containing W, Fig. 8(b) is a view showing an electrolytic copper foil containing Mo, and Fig. 8(c) is an electrolytic copper containing W+TU (thiourea). In the figure of the foil, A in the figure indicates a copper foil after firing, and B in the figure indicates a copper foil before firing, and C in the figure indicates a pure copper foil. The vertical axis represents the intensity of X-rays, and the horizontal axis represents SAXS data as q. As can be seen from the figure, the pure copper foil is compared with the electrolytic copper foil, and the X-ray intensity is different between q=0.4 and 2. This indicates that inclusions of 10 nm or less were present in the electrolytic copper foil.

關於含有W之電解銅箔,根據TEM觀察與XAFS測定之結果,一般認為微粒為WO3。圖9係從含有W之電解銅箔之SAXS數據中減去純銅箔之SAXS強度,從而提取出來自WO3之X射線之散射。另外,圖中D表示燒成前之純銅,圖中E表示燒成前,圖中F表示純銅。使用該提取數據,為了計算出WO3之數密度,根 據散射X射線,計算散射剖面積,進行擬合。測定之X射線散射強度I(q)與散射剖面積dΣ/dΩ(q)具有式-(5)之關係。 Regarding the electrolytic copper foil containing W, it is generally considered that the fine particles are WO 3 as a result of TEM observation and XAFS measurement. Figure 9 is a subtraction of the SAXS intensity of a pure copper foil from the SAXS data of an electrolytic copper foil containing W, thereby extracting the X-ray scattering from WO 3 . Further, in the figure, D represents pure copper before firing, and E in the figure indicates before firing, and F in the figure indicates pure copper. Using this extracted data, in order to calculate the number density of WO 3 , the scattering cross-sectional area was calculated from the scattered X-rays, and fitting was performed. The measured X-ray scattering intensity I(q) has a relationship with the scattering cross-sectional area dΣ/dΩ(q) having the formula -(5).

Φ0為直光束之強度,η為檢測器之校正項,S為照射面積,T為透過率,D為厚度。基本上Φ0、η、S為一定值,因此Φ0‧η‧S=A=const,為裝置固有值。 Φ 0 is the intensity of the straight beam, η is the correction term of the detector, S is the irradiation area, T is the transmittance, and D is the thickness. Basically, Φ 0 , η, and S are constant values, so Φ 0 ‧ η ‧ S = A = const is the device inherent value.

關於A,將預先用已確定Φ0、η、S之裝置測定之玻璃碳,再用SPring-8-BL19B2進行測定,計算出A。式-(5)之符號S、C、N分別為Sample、Cell、Noise之縮寫,本申請中Sample為電解銅合金箔,Cell為純銅箔。由式-(5)計算散射剖面積,得到式-(6)。 Regarding A, glassy carbon measured by a device having Φ 0 , η , and S determined in advance was measured by SPring-8-BL19B2 to calculate A. The symbols S, C, and N of the formula - (5) are abbreviations of Sample, Cell, and Noise, respectively. In the present application, Sample is an electrolytic copper alloy foil, and Cell is a pure copper foil. The scatter cross-sectional area is calculated from the formula -(5) to obtain the formula -(6).

另一方面,散射剖面積以式-(7)表示。 On the other hand, the cross-sectional area of the scattering is represented by the formula -(7).

dΣ/dΩ(q)為散射剖面積,△ρ2為原子散射因子,dN為粒子數密度,V為粒子體積,F為粒子之形狀因子,N(r)為粒徑分布函數。根據TEM觀察之結果,粒子之形狀因子為球體(式-(8))。 dΣ/dΩ(q) is the scattering cross-sectional area, Δρ2 is the atomic scattering factor, dN is the particle number density, V is the particle volume, F is the particle shape factor, and N(r) is the particle size distribution function. According to the results of TEM observation, the shape factor of the particles is a sphere (formula-(8)).

使用變量q,並使用式-(6),對根據散射X射線強度計算出之散射剖面積dΣ/dΩ(q)進行擬合。其結果為,含有W之電解銅箔中所含夾雜物如圖10(a)所示,平均粒徑(半徑)為0.8nm左右,平均粒徑(直徑)為1.6nm左右。粒子之分佈以半徑0.8nm為中心,取圖10(b)所示之分佈(體積分佈f(R))。另外,圖中D表示燒成前之純銅,圖中G表示球體模型。 The variable cross-sectional area d Σ / d Ω (q) calculated from the scattered X-ray intensity is fitted using the variable q and using the formula -(6). As a result, as shown in FIG. 10( a ), the inclusions contained in the electrodeposited copper foil containing W have an average particle diameter (radius) of about 0.8 nm and an average particle diameter (diameter) of about 1.6 nm. The distribution of the particles is centered on a radius of 0.8 nm, and the distribution (volume distribution f(R)) shown in Fig. 10(b) is taken. In addition, in the figure, D represents pure copper before firing, and G in the figure represents a spherical model.

對各實施例、比較例實施同樣之測定,測定了電解銅箔中所含夾雜物之平均粒徑(直徑)。 The same measurement was carried out for each of the examples and the comparative examples, and the average particle diameter (diameter) of the inclusions contained in the electrolytic copper foil was measured.

此外,通過使強度絕對值化,得知含1900ppm左右W之實施例1-1相關之電解銅箔中含有WO3粒子之數密度為3.0×1018個/cm3。根據這一事實可以確認,通過添加W等金屬,本發明實施形態之銅箔中成功地形成有期望大小及數密度的夾雜物。 Further, by the absolute value of the strength, it was found that the electrolytic copper foil of Example 1-1 containing about 1900 ppm had a number density of 3.0 × 10 18 /cm 3 in the WO 3 particles. From this fact, it was confirmed that inclusions having a desired size and a number of densities were successfully formed in the copper foil of the embodiment of the present invention by adding a metal such as W.

〔XAFS測定〕 [XAFS measurement]

作為使用X射線之分析方法之一,XAFS(X射線吸收精細結構:X-ray Absorption Fine Structure)法為人所熟知,即一邊變化X射線能量一邊對樣本照射X射線,根據所獲得之X射線吸收光譜,對樣本中之化學結合狀態及電子狀態進行解析。作為獲得X射線吸收光譜之方法,有根據入射之X射線強度與透過之X射線強度計算X射線吸收光譜的透過法,以及隨著X射線之吸收,測定自樣本產生之螢光X射線強度之螢光法。 As one of the analysis methods using X-rays, XAFS (X-ray Absorption Fine Structure) is well known, that is, X-rays are irradiated to a sample while changing X-ray energy, according to the obtained X-rays. The absorption spectrum is used to analyze the chemical binding state and the electronic state in the sample. As a method for obtaining an X-ray absorption spectrum, there is a transmission method for calculating an X-ray absorption spectrum from an incident X-ray intensity and a transmitted X-ray intensity, and a fluorescence X-ray intensity generated from the sample as the X-ray absorption is performed. Fluorescent method.

將金屬材料等添加元素作為分析對象時,其添加量為微量,難以通過透過法獲得XAFS光譜。此時,上述螢光法為有效方法。螢光法之特徵在於,藉由從其光軸系大幅獲得X射線之照射面積,即使是微量成分之元素亦可實施XAFS測定。 When an additive element such as a metal material is used as an analysis target, the amount of addition is a small amount, and it is difficult to obtain an XAFS spectrum by a transmission method. At this time, the above-described fluorescent method is an effective method. The fluorimetry method is characterized in that XAFS measurement can be performed even with elements of a trace component by obtaining an X-ray irradiation area from the optical axis system.

本測定之目的在於了解高強度銅箔中W與Mo之化學結合狀態及電子狀態,銅箔中之W與Mo為微量,難以通過透過法獲得XAFS光譜,故選擇了螢光法。測定中,使用了SPring-8之產業利用光束線BL14B2。測定之X射線之能量範圍為10000~10434eV與19960~20600eV。前者之能量範圍中存在W之L3-吸收端(10207eV),後者之能量範圍中存在M之K-吸收端(20000eV)。 The purpose of this measurement is to understand the chemical bonding state and electronic state of W and Mo in the high-strength copper foil. The W and Mo in the copper foil are trace amounts, and it is difficult to obtain the XAFS spectrum by the transmission method, so the fluorescence method is selected. In the measurement, the industry using the SPring-8 uses the beam line BL14B2. The measured X-ray energy range is 10000~10434eV and 19960~20600eV. In the former energy range, there is a L3-absorption end (10207 eV) of W, and a K-absorbing end of M (20000 eV) exists in the energy range of the latter.

除含有鎢酸(IV)鈉250mg/L(換算為金屬)、鉬酸(IV)鈉20mg/L以外,其他均與實施例11一樣,準備含有2500ppm之W、200ppm之Mo的銅箔,將其用於測定。此外,為了進行比較,準備W箔、WO3、Mo箔、MoO3。作為結果得知,電解銅箔中之W取氧化物狀態,為WO3(圖11(a))。此外,Mo取氧化狀態, 為MoO3(圖11(b))。另外,圖中H表示W箔,圖中I表示WO3,圖中J表示銅箔,圖中K表示Mo箔,圖中L表示MoO3A copper foil containing 2,500 ppm of W and 200 ppm of Mo was prepared in the same manner as in Example 11 except that 250 mg/L of tungstic acid (IV) sodium (in terms of metal) and 20 mg/L of sodium molybdate (IV) were used. It is used for the determination. Further, for comparison, W foil, WO 3 , Mo foil, and MoO 3 were prepared . As a result, it was found that the state of W in the electrolytic copper foil was WO 3 (Fig. 11 (a)). Further, Mo is in an oxidized state and is MoO 3 (Fig. 11(b)). Further, in the figure, H denotes a W foil, and in the figure, I denotes WO 3 , and in the figure, J denotes a copper foil, and in the figure, K denotes a Mo foil, and in the figure, L denotes MoO 3 .

如上所述可知,實施例相關之電解銅箔於300℃×1 H之加熱處理前,含有平均粒徑0.8nm之WO3或MoO3之粒子狀夾雜物。 As described above, the electrolytic copper foil according to the examples contained particulate inclusions of WO 3 or MoO 3 having an average particle diameter of 0.8 nm before the heat treatment at 300 ° C × 1 H.

以上,參照隨附圖式說明了本發明較佳實施形態,但本發明並不限定於相關例。誠然,但凡本發明所屬領域中熟知此技藝者可於本申請公示之技術思想範疇內設想到各種變更例或修正例,該等變更例或修正例當然亦屬於本發明之技術範圍。 Hereinabove, the preferred embodiments of the present invention have been described with reference to the drawings, but the present invention is not limited to the related examples. It is to be understood that those skilled in the art can devise various modifications and alterations within the scope of the technical scope of the present invention, and such modifications or modifications are of course also within the technical scope of the present invention.

1‧‧‧電解銅箔 1‧‧‧electrolytic copper foil

3‧‧‧晶粒 3‧‧‧ grain

5‧‧‧夾雜物 5‧‧‧ inclusions

Claims (10)

一種電解銅箔,其特徵在於,在銅之晶粒內部或銅之晶粒彼此間之晶界具有平均粒徑0.5~100nm之夾雜物,前述夾雜物含有無機化合物及/或有機化合物,前述無機化合物含有選自由鎢、鉬、鈦、碲所構成群組中之一種以上金屬元素的氧化物,前述有機化合物含有選自由硫脲、伸乙基硫脲、四甲基硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲所構成群組中之一種以上硫脲類有機化合物。 An electrolytic copper foil characterized in that an inclusion having an average particle diameter of 0.5 to 100 nm is present in a grain boundary between copper crystal grains or copper crystal grains, and the inclusion contains an inorganic compound and/or an organic compound, and the inorganic substance The compound contains an oxide selected from the group consisting of one or more metal elements selected from the group consisting of tungsten, molybdenum, titanium, and niobium, and the organic compound contains a compound selected from the group consisting of thiourea, ethyl thiourea, tetramethyl thiourea, and 1,3- One or more thiourea organic compounds in the group consisting of dimethyl-2-thiourea and 1,3-diethyl-2-thiourea. 如請求項1之電解銅箔,其中前述晶粒之平均粒徑為100~600nm。 The electrolytic copper foil according to claim 1, wherein the crystal grains have an average particle diameter of 100 to 600 nm. 如請求項1之電解銅箔,其中前述夾雜物之平均粒徑為0.5~50nm。 The electrolytic copper foil according to claim 1, wherein the inclusions have an average particle diameter of 0.5 to 50 nm. 如請求項3之電解銅箔,其中前述夾雜物之平均粒徑為0.5~20nm。 The electrolytic copper foil according to claim 3, wherein the inclusions have an average particle diameter of 0.5 to 20 nm. 如請求項1之電解銅箔,其中前述夾雜物含有無機化合物,且前述電解銅箔中之金屬元素含量為10~2610ppm。 The electrolytic copper foil according to claim 1, wherein the inclusion contains an inorganic compound, and the content of the metal element in the electrolytic copper foil is 10 to 2610 ppm. 如請求項1之電解銅箔,其中前述電解銅箔中之氯含量小於1ppm。 The electrolytic copper foil according to claim 1, wherein the chlorine content in the electrolytic copper foil is less than 1 ppm. 一種非水電解質二次電池用電極,其特徵在於具有:由如請求項1至6項中任一項之電解銅箔構成之集電體;及形成於前述集電體表面且具有電極活性物質之電極活性物質層。 An electrode for a non-aqueous electrolyte secondary battery, comprising: a current collector comprising the electrolytic copper foil according to any one of claims 1 to 6; and an electrode active material formed on the surface of the current collector The electrode active material layer. 一種非水電解質二次電池,其特徵在於,使用如請求項7之非水電解質二次電池用電極。 A nonaqueous electrolyte secondary battery using the electrode for a nonaqueous electrolyte secondary battery according to claim 7. 一種電解銅箔之製造方法,其特徵在於,在含有硫酸與硫酸銅之硫酸-硫酸銅類電解液中添加含有無機化合物的水溶液及/或含有有機化合物的水溶液,並使用前述電解液進行電解析出,製造電解銅箔,且前述含有無機化合物的水溶液係將選自由鎢、鉬、鈦、碲所構成群組中之一種以上金屬元素之鹽溶解而得的水溶液,前述含有有機化合物的水溶液係含有選自由硫脲、伸乙基硫脲、四甲基硫脲、1,3-二甲基-2-硫脲、1,3-二乙基-2-硫脲所構成群組中之一種以上硫脲類有機化合物的水溶液。 A method for producing an electrolytic copper foil, comprising adding an aqueous solution containing an inorganic compound and/or an aqueous solution containing an organic compound to a sulfuric acid-copper sulfate-based electrolytic solution containing sulfuric acid and copper sulfate, and performing electrolysis using the electrolytic solution. The aqueous solution containing the inorganic compound is an aqueous solution obtained by dissolving a salt of at least one metal element selected from the group consisting of tungsten, molybdenum, titanium, and niobium, and the aqueous solution containing the organic compound is produced. Containing one selected from the group consisting of thiourea, ethyl thiourea, tetramethyl thiourea, 1,3-dimethyl-2-thiourea, and 1,3-diethyl-2-thiourea An aqueous solution of the above thiourea organic compound. 如請求項9之電解銅箔之製造方法,其中前述電解液中氯化物離子濃度小於3mg/L。 The method for producing an electrolytic copper foil according to claim 9, wherein the chloride ion concentration in the electrolyte solution is less than 3 mg/L.
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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4613550B2 (en) * 2004-08-26 2011-01-19 新神戸電機株式会社 Lead-acid battery current collector and lead-acid battery
JP2007294923A (en) * 2006-03-31 2007-11-08 Nikko Kinzoku Kk Manufacturing method of copper strip or copper foil having excellent strength, electric conductivity, and bendability, and electronic component using the same
TW201037105A (en) * 2009-03-23 2010-10-16 Nippon Mining Co Double layered flexible board, and copper electrolytic liquid for making the same
JP5276158B2 (en) * 2010-12-27 2013-08-28 古河電気工業株式会社 Lithium ion secondary battery, negative electrode for battery, and electrolytic copper foil for battery negative electrode current collector
JP2012201923A (en) * 2011-03-25 2012-10-22 Lixil Corp Aluminum extruded shape and extrusion molding method thereof

Cited By (2)

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