TW201424056A - Light-emitting device - Google Patents

Light-emitting device Download PDF

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Publication number
TW201424056A
TW201424056A TW102138116A TW102138116A TW201424056A TW 201424056 A TW201424056 A TW 201424056A TW 102138116 A TW102138116 A TW 102138116A TW 102138116 A TW102138116 A TW 102138116A TW 201424056 A TW201424056 A TW 201424056A
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Taiwan
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light
film
led chip
metal film
emitting device
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TW102138116A
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Chinese (zh)
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Takeshi Miyashita
Masayuki Isotani
Shin Miyasaka
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Ccs Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/58Optical field-shaping elements
    • H01L33/60Reflective elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/44Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/48Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
    • H01L33/52Encapsulations

Abstract

This invention provides a light-emitting device that is able to reduce the amount of light taken into a coating film and improve the efficiency to take out light output from a LED chip even if a coating film is provided to prevent oxidation or vulcanization of a metal film. To this end, the light-emitting device comprises a substrate 1, a metal film 2 formed on the surface of the substrate 1, a LED chip 4 provided on the metal film 2 and a coating film 3 formed on the metal film. The coating film 3 has a through hole 31 which penetrates in the direction of the film thickness and in which the LED chip 4 is placed. The through hole 31 is larger than the LED chip 4 in a plane view, and a gap between the outer periphery of the LED chip 4 and the inner periphery of the through hole 3 is formed.

Description

發光裝置 Illuminating device

本發明係關於一種發光裝置,其包含:基板;金屬膜,形成於基板的表面上;以及LED晶片,設於金屬膜上。 The present invention relates to a light-emitting device comprising: a substrate; a metal film formed on a surface of the substrate; and an LED chip disposed on the metal film.

以往,已知有種發光裝置係將反射光線的金屬膜形成於基板上並將LED晶片載置於該金屬膜上,使得自LED晶片射出的光線之中,例如往基板側射出的光線,返回期望的光照射側。 Conventionally, there has been known a light-emitting device in which a metal film that reflects light is formed on a substrate and an LED chip is placed on the metal film, so that light emitted from the LED chip, for example, light emitted toward the substrate side is returned. The desired light illuminates the side.

但是,在此種發光裝置中,金屬膜接觸於外氣時,逐漸氧化或硫化而變黑,所以具有以下問題:金屬膜的反射率降低,自LED晶片射出的光線難以往光照射側反射,而光線的萃取效率降低。 However, in such a light-emitting device, when the metal film is in contact with the outside air, it gradually oxidizes or vulcanizes and turns black. Therefore, the reflectance of the metal film is lowered, and it is difficult for the light emitted from the LED chip to be reflected toward the light-irradiated side. The extraction efficiency of light is reduced.

所以,為了解決此種問題,有人提案圖6(a)所示的發光裝置100A,在此發光裝置100A中,為了防止外氣與金屬膜2A之接觸,而藉由具有氣體隔絕性的玻璃膜3A來包覆前述金屬膜2A,並將LED晶片4A載置於該玻璃膜3A之上(參照專利文獻1)。此外,元件符號6A係透光性樹脂層,通常其折射率係低於玻璃膜3A。 Therefore, in order to solve such a problem, a light-emitting device 100A shown in Fig. 6(a) in which a glass film having gas barrier properties is provided in order to prevent contact between the outside air and the metal film 2A has been proposed. 3A covers the metal film 2A, and the LED wafer 4A is placed on the glass film 3A (see Patent Document 1). Further, the component symbol 6A is a light-transmitting resin layer, and generally has a refractive index lower than that of the glass film 3A.

但是,如此發光裝置100A的方式,將LED晶片4A載置於玻璃膜3A之上,自LED晶片4A往金屬膜2A側射出的光線入射至玻璃膜3A,入射 得光線大部分因為玻璃膜3A與透光性樹脂層6A之折射率的關係而在玻璃膜3A內重複反射而無法萃取往光射出側。亦即,前述發光裝置100A雖然可防止金屬膜2A隨時間經過的變化,但因為存在有導入至玻璃膜3A內的光線,所以有光線的萃取效率降低下之問題。再加上,因為在熱傳導性不如金屬的玻璃膜3A上載置有LED晶片4A,所以LED晶片4A所產生的熱不會往基板1A側散熱,難以獲得期望的性能。 However, in the manner of the light-emitting device 100A, the LED chip 4A is placed on the glass film 3A, and the light emitted from the LED chip 4A toward the metal film 2A side is incident on the glass film 3A, and is incident. Most of the light rays are repeatedly reflected in the glass film 3A due to the relationship between the refractive index of the glass film 3A and the light-transmitting resin layer 6A, and cannot be extracted to the light-emitting side. That is, although the light-emitting device 100A can prevent the change of the metal film 2A over time, since there is light introduced into the glass film 3A, there is a problem that the extraction efficiency of light is lowered. In addition, since the LED wafer 4A is placed on the glass film 3A having less thermal conductivity than the metal, the heat generated by the LED wafer 4A does not dissipate heat to the substrate 1A side, and it is difficult to obtain desired performance.

此外,亦有人提案圖6(b)所示的發光裝置100B,在此發光裝置100B中,將LED晶片4B載置於金屬膜2B上,並藉由玻璃膜3B來包覆金屬膜2B與LED晶片4B雙方,以防止金屬膜2B隨時間經過的變化(專利文獻2參照)。此外,元件符號6B係與上述同樣係透光性樹脂層,其折射率係低於玻璃膜3B。 Further, a light-emitting device 100B shown in FIG. 6(b) is proposed, in which the LED chip 4B is placed on the metal film 2B, and the metal film 2B and the LED are covered by the glass film 3B. Both of the wafers 4B prevent changes in the metal film 2B over time (refer to Patent Document 2). Further, the component code 6B is a light-transmitting resin layer similar to the above, and has a refractive index lower than that of the glass film 3B.

但是,如前述發光裝置100B的方式利用玻璃膜3B來包覆金屬膜2B及LED晶片4B,因為金屬膜2B與玻璃膜3B的熱膨脹率不同而其熱變形量不同,所以變成對於LED晶片4B施加熱應力。並且,因為施加此種熱應力,所以LED晶片4B會產生裂開,其發光特性會改變。 However, in the manner of the light-emitting device 100B, the metal film 2B and the LED wafer 4B are covered with the glass film 3B. Since the thermal expansion rates of the metal film 2B and the glass film 3B are different, the amount of thermal deformation is different, so that the LED chip 4B is applied. Heating stress. Also, since such thermal stress is applied, the LED wafer 4B is cracked and its light-emitting characteristics are changed.

【先行技術文獻】 [First technical literature]

【專利文獻】 [Patent Literature]

專利文獻1:日本特開2010-34487號公報 Patent Document 1: Japanese Laid-Open Patent Publication No. 2010-34487

專利文獻2:日本特開2009-33107號公報 Patent Document 2: JP-A-2009-33107

本發明係用來一舉解決如上所述的問題,目的在於提供一種發光裝置,藉由鍍膜來防止金屬膜的氧化與硫化等,可減低自LED晶片射出的光線導入至此鍍膜內的量而提升光線萃取效率,並且能防止因為鍍膜而妨礙LED晶片之散熱與因為各構成構件之熱變形降低LED晶片的特性。 The present invention is to solve the above problems in one place, and an object of the invention is to provide a light-emitting device which can prevent oxidation and vulcanization of a metal film by plating, and can reduce the amount of light emitted from the LED wafer into the coating film to enhance light. The extraction efficiency and the prevention of heat dissipation of the LED wafer due to the plating film and the deterioration of the characteristics of the LED wafer due to thermal deformation of the respective constituent members can be prevented.

亦即,本發明之發光裝置,其特徵在於包含:基板;金屬膜,形成於基板之表面上;LED晶片,設於該金屬膜上;以及鍍膜,形成於該金屬膜上;且該鍍膜形成有:貫穿孔貫穿膜厚方向並於內部配置有該LED晶片;在俯視中,該貫穿孔係形成為比該LED晶片更大,該LED晶片的外周面及該貫穿孔的內周面之間形成有間隙。 That is, the light-emitting device of the present invention includes: a substrate; a metal film formed on a surface of the substrate; an LED chip disposed on the metal film; and a plating film formed on the metal film; and the plating film is formed The through hole penetrates the film thickness direction and is internally disposed with the LED chip; in a plan view, the through hole is formed larger than the LED chip, and between the outer peripheral surface of the LED chip and the inner peripheral surface of the through hole A gap is formed.

此外,就前述金屬膜而言,有舉例如有能反射光線者,就前述鍍膜而言,可舉例如有具備透光性與氣體隔絕性者。只要如此,因為前述LED晶片的外周面與前述貫穿孔的內周面之間形成有間隙,LED晶片的周圍附近不存在有鍍膜,所以從LED晶片往金屬膜側射出的光線,大部分不入射至鍍膜,而在金屬膜進行反射。因此,可減低入射至鍍膜的光線比例,且使得光線不封閉在該鍍膜內。 In addition, as for the above-mentioned metal film, for example, there is a person who can reflect light, and the coating film may be, for example, light transmissive or gas barrier. In this case, since a gap is formed between the outer peripheral surface of the LED chip and the inner peripheral surface of the through hole, there is no plating film in the vicinity of the periphery of the LED wafer, and therefore most of the light emitted from the LED chip toward the metal film side is not incident. To the coating, and reflect on the metal film. Therefore, the proportion of light incident on the plating film can be reduced, and the light is not enclosed in the plating film.

所以,可利用鍍膜包覆金屬膜來防止金屬膜隨時間經過的變化,並且減少導入至鍍膜內的光線量,提高光線萃取效率。 Therefore, the coating can be coated with a metal film to prevent the change of the metal film over time, and the amount of light introduced into the coating film can be reduced, and the light extraction efficiency can be improved.

又,因為前述LED晶片未直接配置於前述金屬膜上,所以在LED晶片產生的熱經由金屬膜而有效率地往基板側進行散熱。所以,能防止因為LED晶片的溫度上昇而使得LED晶片之性能降低。 Further, since the LED chip is not directly disposed on the metal film, heat generated in the LED wafer is efficiently dissipated to the substrate side via the metal film. Therefore, it is possible to prevent the performance of the LED chip from being lowered due to the temperature rise of the LED chip.

又,因為藉由LED晶片與貫穿孔之間的間隙使得LED晶片與鍍膜不接觸,所以LED晶片只受到金屬膜的熱變形之影響。因此,因為沒有熱變形量不同的多數構件接觸至LED晶片,所以不將過度的熱應力施加於LED晶片,能防止LED晶片產生龜裂、發光特性改變。 Moreover, since the LED wafer is not in contact with the plating film by the gap between the LED wafer and the through hole, the LED wafer is only affected by the thermal deformation of the metal film. Therefore, since many members having different amounts of thermal deformation are in contact with the LED wafer, excessive thermal stress is not applied to the LED wafer, and cracking and luminescence characteristics of the LED wafer can be prevented from being changed.

為使氣體隔絕性高並能藉由前述鍍膜來合適地防止前述金屬膜的氧化與硫化,只要前述鍍膜係玻璃膜即可。 In order to make the gas barrier property high and to prevent oxidation and vulcanization of the metal film by the plating film as described above, the coating film may be a glass film.

為保護前述LED晶片,只要更具有包覆在前述鍍膜及前述LED晶片上的透光性樹脂層即可。 In order to protect the LED chip, a light transmissive resin layer coated on the plating film and the LED wafer may be further provided.

在設有前述透光性樹脂層時,為使從LED晶片射出的光線難以導入至鍍膜內,不使光線萃取效率降低,只要採用例如使前述鍍膜的折射率比前述透光性樹脂層之折射率更大者即可。 When the light-transmitting resin layer is provided, it is difficult to introduce the light emitted from the LED wafer into the plating film, and the light extraction efficiency is not lowered. For example, the refractive index of the plating film is made to be smaller than that of the light-transmitting resin layer. The rate is even greater.

此外,前述間隙的大小可從降低入射至鍍膜的光線,以及防止金屬膜之氧化與硫化來決定,就可兼顧良好兩者平衡的大小而言,不一定要限定於此,但可係例如5μm以上500μm以下。間隙未滿5μm時,無法充分地減低入射導入至鍍膜的光線比例,另一方面,間隙超過500μm時,則金屬膜的氧化與硫化的防止變得不足。其中,有些情況下間隙在5μm以上,LED晶片也會與鍍膜產生干渉而難以安裝,所以間隙宜係50μm以上較佳。 Further, the size of the gap may be determined by reducing the amount of light incident on the plating film and preventing oxidation and vulcanization of the metal film, and the size of the balance between the two may not be limited thereto, but may be, for example, 5 μm. Above 500 μm. When the gap is less than 5 μm, the proportion of light incident on the plating film cannot be sufficiently reduced. On the other hand, when the gap exceeds 500 μm, the oxidation and vulcanization of the metal film are prevented from becoming insufficient. Among them, in some cases, the gap is 5 μm or more, and the LED chip is also dry and difficult to mount with the plating film, so the gap is preferably 50 μm or more.

如此依據本發明之發光裝置,因為在配置於鍍膜的貫穿孔內之LED晶片的外周面以及貫穿孔的內周面之間形成有間隙,所以可使自LED晶片射出的光線難以導入至鍍膜內,能防止鍍膜所致的光線萃取效率降低。又,因為將LED晶片直接載置於金屬膜,所以能有效率地進行該LED晶片之散熱,不易產生LED晶片之溫度上昇所致的性能降低。又,前述LED晶片係藉由前述間隙而只是受到前述金屬膜的熱變形之影響,也不易產生由接觸於LED晶片的構件之熱變形量差異致使LED晶片產生龜裂等熱應力所致的問題。 According to the light-emitting device of the present invention, since a gap is formed between the outer peripheral surface of the LED wafer disposed in the through hole of the plating film and the inner peripheral surface of the through hole, it is difficult to introduce light emitted from the LED wafer into the plating film. It can prevent the light extraction efficiency caused by the coating from being lowered. Further, since the LED wafer is directly placed on the metal film, heat dissipation of the LED chip can be efficiently performed, and performance degradation due to an increase in temperature of the LED wafer is less likely to occur. Further, the LED chip is only affected by the thermal deformation of the metal film by the gap, and is less likely to cause thermal stress such as cracking of the LED wafer due to a difference in the amount of thermal deformation of the member contacting the LED chip. .

再者,因為前述金屬膜在前述LED晶片的設置場所以外受到前述鍍膜所包覆,所以能防止前述金屬膜之氧化與硫化等所致的變色,不易因變色致使反射率降低而使光線的萃取效率降低。 Further, since the metal film is coated with the plating film other than the installation place of the LED chip, it is possible to prevent discoloration due to oxidation and vulcanization of the metal film, and it is difficult to reduce the reflectance due to discoloration and to extract light. Reduced efficiency.

1、1A‧‧‧基板 1, 1A‧‧‧ substrate

2、2A、2B、2C‧‧‧金屬膜 2, 2A, 2B, 2C‧‧‧ metal film

3、3A、3B‧‧‧鍍膜 3, 3A, 3B‧‧ ‧ coating

3C‧‧‧玻璃膜 3C‧‧‧glass film

4、4A、4B、4C‧‧‧LED晶片 4, 4A, 4B, 4C‧‧‧ LED chips

6、6A、6B、6C‧‧‧透光性樹脂層 6, 6A, 6B, 6C‧‧‧Transparent resin layer

11‧‧‧孔洞 11‧‧‧ hole

31‧‧‧貫穿孔 31‧‧‧through holes

51‧‧‧陰極 51‧‧‧ cathode

52‧‧‧陽極 52‧‧‧Anode

100、100A、100B、100C‧‧‧發光裝置 100, 100A, 100B, 100C‧‧‧ illuminating devices

圖1係本發明一實施形態之發光裝置的示意性頂面圖。 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic top plan view of a light-emitting device according to an embodiment of the present invention.

圖2係同實施形態中的發光裝置之示意性剖視圖。 Fig. 2 is a schematic cross-sectional view of a light-emitting device in the same embodiment.

圖3係顯示圖6(a)所示的習知的發光裝置中的模擬結果之示意圖。 Fig. 3 is a view showing a simulation result in the conventional light-emitting device shown in Fig. 6(a).

圖4係顯示該實施形態之發光裝置中的模擬結果之示意圖。 Fig. 4 is a view showing a simulation result in the light-emitting device of the embodiment.

圖5係顯示LED晶片與玻璃膜之間不存在有間隙時的模擬結果之示意圖。 Fig. 5 is a view showing a simulation result when there is no gap between the LED wafer and the glass film.

圖6(a)~(b)係顯示習知的發光裝置之構成的示意性剖視圖。 6(a) to 6(b) are schematic cross-sectional views showing the configuration of a conventional light-emitting device.

【實施發明之較佳形態】 [Preferred form of implementing the invention]

以下參照各圖來說明本發明的一實施形態。圖1係本實施形態之發光裝置100的俯視圖,圖2係圖1的A-A線段剖視圖。另,圖2中的厚度方向尺寸為便於理解而將高度方向之尺寸加大,與實際的比例有所不同。 Hereinafter, an embodiment of the present invention will be described with reference to the drawings. Fig. 1 is a plan view of a light-emitting device 100 of the present embodiment, and Fig. 2 is a cross-sectional view taken along line A-A of Fig. 1. In addition, the dimension in the thickness direction in FIG. 2 is increased in size in order to facilitate understanding, and is different from the actual ratio.

如圖1及圖2所示,本實施形態之發光裝置100係包含:基板1;金屬膜2,形成於基板1的表面上;LED晶片4,設於前述金屬膜2上;玻璃膜(鍍膜)3,形成為包覆在前述金屬膜2的大致全區;以及透光性樹脂層6,設為包覆在前述玻璃膜3及前述LED晶片4上。並且,本實施形態的發光裝置100,特徵係在於前述LED晶片4上及該LED晶片4的周圍未設有前述玻璃膜3。 As shown in FIGS. 1 and 2, the light-emitting device 100 of the present embodiment includes a substrate 1; a metal film 2 formed on the surface of the substrate 1; an LED chip 4 provided on the metal film 2; and a glass film (coating film) 3 is formed to cover substantially the entire region of the metal film 2, and the light transmissive resin layer 6 is coated on the glass film 3 and the LED wafer 4. Further, in the light-emitting device 100 of the present embodiment, the glass film 3 is not provided on the LED wafer 4 and around the LED wafer 4.

以下說明各部分。 The following sections are explained below.

前述基板1係例如利用陶瓷材料來形成,如圖1所示,使面板部為大致正方形形狀。該基板1之表面的中央部形成有凹部,即孔洞11,其底部設有藉由配線而與各LED晶片4進行連接的陽極52與陰極51。 The substrate 1 is formed, for example, of a ceramic material, and as shown in FIG. 1, the panel portion has a substantially square shape. A central portion of the surface of the substrate 1 is formed with a recess, that is, a hole 11, and an anode 52 and a cathode 51 which are connected to the LED chips 4 by wiring are provided at the bottom.

前述金屬膜2係形成為包覆在前述孔洞11之表面上的銀(Ag)膜,用於將自前述LED晶片4往前述基板1側射出的光加以反射而回到光照射側。 如圖2所示,此金屬膜2形成為包覆在前述孔洞11之側面及底面的全部。在本實施形態中,藉由銀來構成前述金屬膜2,但只要是其他銅、鋁、金、鎢、鐵、鎳等金屬或各種合金等,具有將自LED晶片4射出的光線有效地加以反射之材料特性者即可。 The metal film 2 is formed of a silver (Ag) film which is coated on the surface of the hole 11 and reflects light emitted from the LED chip 4 toward the substrate 1 side to return to the light irradiation side. As shown in FIG. 2, the metal film 2 is formed to cover all of the side surface and the bottom surface of the hole 11. In the present embodiment, the metal film 2 is formed of silver. However, as long as it is a metal such as copper, aluminum, gold, tungsten, iron, or nickel, or various alloys, the light emitted from the LED chip 4 is effectively applied. The material properties of the reflection can be.

前述玻璃膜3係由折射率大於前述透光性樹脂層6的玻璃來構成,具有透光性及氣體隔絕性,防止前述金屬膜2與外氣進行接觸而氧化或硫化。並且,如圖1所示,前述玻璃膜3係於前述孔洞11的底面形成為:在安裝前述LED晶片4的部分,具有貫穿孔31。又,設置陽極52、陰極51的部分亦形成有電極露出孔。 The glass film 3 is made of glass having a refractive index higher than that of the light-transmitting resin layer 6, and has light transmissivity and gas barrier properties, and prevents the metal film 2 from coming into contact with the outside air to be oxidized or vulcanized. Further, as shown in FIG. 1, the glass film 3 is formed on the bottom surface of the hole 11 so as to have a through hole 31 in a portion where the LED chip 4 is mounted. Further, an electrode exposure hole is also formed in a portion where the anode 52 and the cathode 51 are provided.

前述貫穿孔31如圖1及圖2所示,形成為在俯視中大於前述LED晶片4,並於其大致中央配置有LED晶片4。因此,貫穿孔31與LED晶片4係分開既定距離,在貫穿孔31的內周面與LED晶片4的外周面之間形成有間隙,成為兩者不進行接觸。所以,在此貫穿孔31的部分露出LED晶片4與其周圍的金屬膜2。此外,前述間隙部分填充有前述透光性樹脂層6。 As shown in FIGS. 1 and 2, the through hole 31 is formed to be larger than the LED chip 4 in plan view, and the LED wafer 4 is disposed substantially at the center thereof. Therefore, the through hole 31 is separated from the LED wafer 4 by a predetermined distance, and a gap is formed between the inner peripheral surface of the through hole 31 and the outer peripheral surface of the LED wafer 4, and the two are not in contact with each other. Therefore, the portion of the through hole 31 is exposed to the LED film 4 and the metal film 2 therearound. Further, the gap portion is filled with the light transmissive resin layer 6 described above.

就前述間隙的大小而言,舉例可為5μm以上500μm以下。若間隙小,則無法充分減低入射並導入至玻璃膜3的光線比例,另一方面,若間隙大,則金屬膜2之氧化與硫化的防止變得不足。所以,若為5μm以上500μm以下大小的間隙,可以減低入射至玻璃膜3的光比例,亦可提高光的萃取效率,且能充分防止金屬膜2之氧化與硫化。其中,有些情況下,即使間隙有5μm以上,LED晶片4也會與玻璃膜3產生干渉而難以安裝,所以間隙宜係50μm以上較佳。 The size of the aforementioned gap may be, for example, 5 μm or more and 500 μm or less. When the gap is small, the proportion of light incident on the glass film 3 can not be sufficiently reduced. On the other hand, if the gap is large, the oxidation and vulcanization of the metal film 2 are insufficient. Therefore, when the gap is 5 μm or more and 500 μm or less, the proportion of light incident on the glass film 3 can be reduced, the extraction efficiency of light can be improved, and the oxidation and vulcanization of the metal film 2 can be sufficiently prevented. In some cases, even if the gap is 5 μm or more, the LED wafer 4 is dry and difficult to mount with the glass film 3, so the gap is preferably 50 μm or more.

此外,此貫穿孔31與前述電極露出孔可藉由下述方法形成:例如對於金屬膜2上的全區,首先進行玻璃鍍層(coating),之後利用蝕刻等方式,對於安裝有前述LED晶片4之處與配置有陽極52、陰極51之處移除玻璃。 Further, the through hole 31 and the electrode exposure hole may be formed by, for example, performing a glass coating on the entire region on the metal film 2, and then mounting the aforementioned LED wafer 4 by etching or the like. The glass is removed where the anode 52 and the cathode 51 are disposed.

如此,因為前述玻璃膜3包覆在前述LED晶片4之周圍以外的前述金 屬膜2而防止與外氣之接觸,所以不易產生由金屬膜2的氧化與硫化所致的變色,來自前述LED晶片4的光線之萃取效率不易降低。亦即,本實施形態之發光裝置100不易產生隨時間經過的變化,能長期間保有既定性能。 Thus, the aforementioned glass film 3 is coated with the aforementioned gold other than the periphery of the aforementioned LED wafer 4. Since the film 2 is prevented from coming into contact with the outside air, discoloration due to oxidation and vulcanization of the metal film 2 is less likely to occur, and the extraction efficiency of light from the LED chip 4 is not easily lowered. In other words, the light-emitting device 100 of the present embodiment is less prone to change over time, and can maintain a predetermined performance for a long period of time.

再者,因為前述玻璃膜3之貫穿孔31的內周面與前述LED晶片4的外周面之間形成有間隙,所以如後所述,使得自LED晶片4往基板1側射出的光線不易導入至玻璃膜3內。 In addition, since a gap is formed between the inner circumferential surface of the through hole 31 of the glass film 3 and the outer circumferential surface of the LED wafer 4, light rays emitted from the LED chip 4 toward the substrate 1 side are not easily introduced as will be described later. To the glass film 3.

所以,能藉由玻璃膜3來金屬膜2隨時間經過的變化,並使光線萃取效率高於習知。 Therefore, the change of the metal film 2 over time by the glass film 3 can be made, and the light extraction efficiency is higher than conventionally.

又,以往均使玻璃與金屬此等熱膨脹率大幅不同的材料接觸於前述LED晶片4的上下面,使得在LED晶片4施加過大的熱應力而產生龜裂等,若為本實施形態,LED晶片4藉由前述間隙而只受到金屬膜2的熱變形之影響,亦不會產生如上所述的問題。再者,因為LED晶片4係直接載置於金屬膜2之上,所以能藉由此金屬膜2而往基板1側有效率地進行放熱。藉由此等事項,可防止因為熱使得LED晶片4之發光特性改變。 Further, in the related art, a material having a large difference in thermal expansion coefficient between glass and metal is in contact with the upper and lower surfaces of the LED wafer 4, and excessive thermal stress is applied to the LED wafer 4 to cause cracks or the like. In the present embodiment, the LED wafer is used. 4 is only affected by the thermal deformation of the metal film 2 by the aforementioned gap, and the problem as described above does not occur. Further, since the LED wafer 4 is directly placed on the metal film 2, heat can be efficiently radiated to the substrate 1 side by the metal film 2. By such a matter, it is possible to prevent the light-emitting characteristics of the LED wafer 4 from being changed due to heat.

此外,在本實施形態中,LED晶片4受到透光性樹脂層6所包覆,又於前述間隙填充有透光性樹脂層6,因為此透光性樹脂層6比玻璃柔軟,所以透光性樹脂層6不易將熱應力施加於LED晶片4,此外,即使有施加亦相當輕微。所以,不會產生透光性樹脂層6將熱應力施加於LED晶片4的、如玻璃時的問題。 Further, in the present embodiment, the LED wafer 4 is covered with the light-transmitting resin layer 6, and the light-transmitting resin layer 6 is filled in the gap. Since the light-transmitting resin layer 6 is softer than glass, it is transparent. The resin layer 6 is not easy to apply thermal stress to the LED wafer 4, and further, even if it is applied, it is rather slight. Therefore, there is no problem that the light transmissive resin layer 6 applies thermal stress to the LED wafer 4 such as glass.

最後詳細說明將前述LED晶片4配置於前述貫穿孔31內,並且使前述玻璃膜3與前述LED晶片4分開,藉以提升光線萃取效率。 Finally, the LED chip 4 is disposed in the through hole 31, and the glass film 3 is separated from the LED chip 4, thereby improving light extraction efficiency.

圖3係顯示在圖6(a)所示的習知發光裝置100A中,從前述LED晶片4A往基板1A側射出的光線軌跡之模擬結果。又,圖4係顯示本實施形態之發光裝置100中從前述LED晶片4往基板1側射出的光線軌跡之模擬結 果。再加上,圖5係顯示玻璃膜3C的貫穿孔內配置有LED晶片4C,貫穿孔的內周面與LED晶片4C的外周面相接時,從LED晶片4C往基板側射出的光線軌跡之模擬結果。此外,就模擬條件而言,玻璃膜3A、3、3C,透光性樹脂層6A、6、6C,LED晶片4A、4、4C之折射率,分別設定於1.5、1.4及1.7。 Fig. 3 is a view showing a simulation result of a ray trajectory emitted from the LED chip 4A toward the substrate 1A side in the conventional light-emitting device 100A shown in Fig. 6(a). 4 is a simulation diagram showing a ray trajectory emitted from the LED chip 4 toward the substrate 1 side in the light-emitting device 100 of the embodiment. fruit. In addition, FIG. 5 shows that the LED wafer 4C is disposed in the through hole of the glass film 3C, and when the inner peripheral surface of the through hole is in contact with the outer peripheral surface of the LED chip 4C, the trajectory of the light emitted from the LED chip 4C toward the substrate side is shown. Simulation results. Further, in terms of the simulation conditions, the refractive indices of the glass films 3A, 3, and 3C, the translucent resin layers 6A, 6, and 6C and the LED chips 4A, 4, and 4C were set to 1.5, 1.4, and 1.7, respectively.

如圖3所示,在玻璃膜3A上載置有前述LED晶片4A時,得知從前述LED晶片4A往基板1A側射出的光線,入射至前述玻璃膜3A內,入射的光線,大部分由於玻璃膜3A與透光性樹脂層6A之折射率的關係而在此玻璃膜3A內重複反射,變得無法萃取往光照射側。亦即,習知中,導入至玻璃膜3A內的光量成為損失,光線萃取效率會降低。 As shown in FIG. 3, when the LED chip 4A is placed on the glass film 3A, the light emitted from the LED chip 4A toward the substrate 1A is incident on the glass film 3A, and most of the incident light is due to the glass. The relationship between the refractive index of the film 3A and the translucent resin layer 6A is repeatedly reflected in the glass film 3A, and it becomes impossible to extract to the light irradiation side. That is, in the prior art, the amount of light introduced into the glass film 3A is lost, and the light extraction efficiency is lowered.

另一方面,若為本實施形態之發光裝置100,因為前述LED晶片4的周圍附近不存在有玻璃膜3,所以依設定的間隙量,如圖4所示從LED晶片4往基板1側射出的光線受到金屬膜2往光照射側反射,僅有微少光線入射至玻璃膜3。所以得知,由於玻璃膜3與透光性樹脂層6之折射率的關係而在該玻璃膜3內重複反射的光線微少,幾乎沒有導入至玻璃膜3的光線。亦即,若為本實施形態之發光裝置100,因為可以使得入射至玻璃膜3內的光線本身減少,所以在此玻璃膜3內重複反射的光線當然變少,能提升光線萃取效率。 On the other hand, in the light-emitting device 100 of the present embodiment, since the glass film 3 does not exist in the vicinity of the periphery of the LED wafer 4, the amount of the gap is set to be emitted from the LED chip 4 toward the substrate 1 as shown in FIG. The light is reflected by the metal film 2 toward the light-irradiating side, and only a small amount of light is incident on the glass film 3. Therefore, it is understood that the amount of light repeatedly reflected in the glass film 3 due to the relationship between the refractive index of the glass film 3 and the light-transmitting resin layer 6 is small, and there is almost no light introduced into the glass film 3. In other words, in the light-emitting device 100 of the present embodiment, since the light incident on the glass film 3 itself can be reduced, the amount of light repeatedly reflected in the glass film 3 is of course reduced, and the light extraction efficiency can be improved.

再者,與本實施形態不同,在貫穿孔的內周面與LED晶片4C的外周面之間不形成間隙地使玻璃膜3C與LED晶片4C接觸時(發光裝置100C),得知如圖5所示,在LED晶片4C周圍附近射出的光線,係與前述發光裝置100A同樣地將其一部分入射至玻璃膜3C內,入射的光線,大部分由於玻璃膜3C與透光性樹脂層6C的折射率之關係而在該玻璃膜3C內重複反射。所以,即使在貫穿孔的內周面與LED晶片4C的外周面之間不設置間隙之情形,也產生玻璃膜3C所致的光線損失,光線萃取效率會降低。 Further, unlike the present embodiment, when the glass film 3C is brought into contact with the LED chip 4C without forming a gap between the inner peripheral surface of the through hole and the outer peripheral surface of the LED chip 4C (light-emitting device 100C), as shown in FIG. 5 As shown in the above, the light emitted from the vicinity of the periphery of the LED chip 4C is partially incident on the glass film 3C in the same manner as the light-emitting device 100A, and most of the incident light is refracted by the glass film 3C and the light-transmitting resin layer 6C. The reflection is repeated in the glass film 3C in relation to the rate. Therefore, even if a gap is not provided between the inner circumferential surface of the through hole and the outer circumferential surface of the LED wafer 4C, light loss due to the glass film 3C occurs, and the light extraction efficiency is lowered.

相反而言,如本實施形態之發光裝置100的方式,藉由在貫穿孔31的 內周面與LED晶片4的外周面之間形成間隙而首先減低導入至玻璃膜3內的光線量,得知即使在設有玻璃膜3之情形,亦能提升光線萃取效率。 On the contrary, the mode of the light-emitting device 100 of the present embodiment is adopted in the through hole 31. A gap is formed between the inner peripheral surface and the outer peripheral surface of the LED wafer 4, and the amount of light introduced into the glass film 3 is first reduced, and it is found that the light extraction efficiency can be improved even when the glass film 3 is provided.

以下說明其他實施形態 Other embodiments will be described below

在前述實施形態中,係將玻璃膜定為鍍膜,亦可將其他具有氣體隔絕性的材料定為鍍膜。又,就玻璃的組成而言,無論為何種材料,只要不易產生裂痕等即可。總而言之,前述金屬膜無論為何種材料,只要能長期均防止外氣接觸、具有透光性的材料即可。 In the above embodiment, the glass film is set as a plating film, and other materials having gas barrier properties may be formed as a plating film. Further, in terms of the composition of the glass, any material may be used as long as it is less likely to cause cracks or the like. In short, the metal film may be any material that can prevent external air contact and light transmissive properties for a long period of time.

又,LED晶片的形狀、射出的光線波長等並未特別受到限定,可藉由各式各樣的LED晶片來構成本發明。再者,亦可將多數之LED晶片配置於孔洞內,而非如前述實施形態地將1個LED晶片配置於孔洞內。 Further, the shape of the LED chip, the wavelength of the emitted light, and the like are not particularly limited, and the present invention can be constituted by various LED chips. Further, a plurality of LED chips may be disposed in the holes instead of arranging one LED chip in the holes as in the above embodiment.

又,在上例中,係分別採用具有反射光線的性質者作為金屬膜,採用具有透光性與氣體隔絕性者作為鍍膜,但不必限定於此,金屬膜或鍍膜亦可採用不具有此種性質者。 Further, in the above example, a person having a property of reflecting light is used as the metal film, and a person having light transmissivity and gas barrier property is used as the plating film, but it is not limited thereto, and the metal film or the plating film may not be used. Nature.

此外,只要不違反本發明之主旨精神,亦可進行各種變形或實施形態之組合。 Further, various modifications or combinations of embodiments may be made without departing from the spirit and scope of the invention.

【產業利用性】 [Industry Utilization]

本發明可利用作為隨時間經過的變化小且光線萃取效率高的發光裝置。 The present invention can utilize a light-emitting device which has a small change over time and a high light extraction efficiency.

1‧‧‧基板 1‧‧‧Substrate

2‧‧‧金屬膜 2‧‧‧Metal film

3‧‧‧鍍膜 3‧‧‧ coating

4‧‧‧LED晶片 4‧‧‧LED chip

6‧‧‧透光性樹脂層 6‧‧‧Transparent resin layer

11‧‧‧孔洞 11‧‧‧ hole

31‧‧‧貫穿孔 31‧‧‧through holes

100‧‧‧發光裝置 100‧‧‧Lighting device

Claims (4)

一種發光裝置,其特徵在於包含:基板;金屬膜,形成於該基板之表面上;LED晶片,設於該金屬膜上;以及鍍膜,形成於該金屬膜上;且該鍍膜形成有:貫穿孔,貫穿該鍍膜之膜厚方向,並於內部配置有該LED晶片;在俯視中,該貫穿孔係形成為比該LED晶片更大,在該LED晶片的外周面與該貫穿孔的內周面之間形成有間隙。 A light-emitting device, comprising: a substrate; a metal film formed on a surface of the substrate; an LED chip disposed on the metal film; and a plating film formed on the metal film; and the plating film is formed with: a through hole The LED chip is disposed inside the film thickness direction of the plating film; the through hole is formed to be larger than the LED chip in a plan view, and the outer peripheral surface of the LED chip and the inner peripheral surface of the through hole are formed There is a gap formed between them. 如申請專利範圍第1項之發光裝置,其中,該鍍膜係玻璃膜。 The light-emitting device of claim 1, wherein the coating film is a glass film. 如申請專利範圍第1項之發光裝置,其中,更具有覆蓋於該鍍膜及該LED晶片上的透光性樹脂層。 The light-emitting device of claim 1, further comprising a light-transmitting resin layer covering the plating film and the LED wafer. 如申請專利範圍第3項之發光裝置,其中,該鍍膜之折射率比該透光性樹脂層之折射率更大。 The light-emitting device of claim 3, wherein the coating has a refractive index greater than a refractive index of the light-transmitting resin layer.
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