TW201413204A - Evaporation source, vacuum vapor deposition device and manufacturing method for organic electroluminescent display device - Google Patents

Evaporation source, vacuum vapor deposition device and manufacturing method for organic electroluminescent display device Download PDF

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TW201413204A
TW201413204A TW102128110A TW102128110A TW201413204A TW 201413204 A TW201413204 A TW 201413204A TW 102128110 A TW102128110 A TW 102128110A TW 102128110 A TW102128110 A TW 102128110A TW 201413204 A TW201413204 A TW 201413204A
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vapor deposition
evaporation source
substrate
organic electroluminescence
layer
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TW102128110A
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Chinese (zh)
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Tatsuya Miyake
Hiroyasu Matsuura
Hideaki Minekawa
Akio Yazaki
Tomohiko Ogata
Kenichi Yamamoto
Toshiaki Kusunoki
Takeshi Tamakoshi
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Hitachi High Tech Corp
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/243Crucibles for source material
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/24Vacuum evaporation
    • C23C14/26Vacuum evaporation by resistance or inductive heating of the source
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/542Controlling the film thickness or evaporation rate
    • C23C14/545Controlling the film thickness or evaporation rate using measurement on deposited material
    • C23C14/547Controlling the film thickness or evaporation rate using measurement on deposited material using optical methods
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/54Controlling or regulating the coating process
    • C23C14/548Controlling the composition

Abstract

To provide an evaporation source, a vacuum vapor deposition device and a manufacturing method for organic electroluminescent display device for continuously forming film and capable of reducing thermal radiation, using a power-saving evaporation source, high speed forming a metal film, which is mainly made of aluminum material, corresponding to a large substrate. To utilize a ceramic crucible as an evaporation source, and arrange a heat reflective component by clamping a flange section, so as to effectively block heat flowing out along the flange section. Therefore, the present invention can effectively heat the crucible with little electricity, and prevent the flange section from temperature rise.

Description

蒸發源、真空蒸鍍裝置及有機電致發光顯示裝置製造方法 Evaporation source, vacuum evaporation device, and method of manufacturing organic electroluminescence display device

本發明係關於蒸發源、真空蒸鍍裝置及有機 電致發光顯示裝置製造方法,特別是在大型的基板上形成有機電致發光顯示裝置之用的有效的蒸發源、真空蒸鍍裝置及有機電致發光顯示裝置製造方法。 The invention relates to an evaporation source, a vacuum evaporation device and an organic An electroluminescence display device manufacturing method, in particular, an effective evaporation source, a vacuum vapor deposition device, and an organic electroluminescence display device manufacturing method for forming an organic electroluminescence display device on a large substrate.

使用於有機電致發光(electroluminescence,以下亦簡稱EL)顯示裝置或照明裝置的有機EL元件,為由上下以陽極與陰極之一對電極夾住有機材料構成的有機層的構造,其工作原理係藉由對電極施加電壓而由陽極側對有機層注入正孔由陰極側注入電子,藉由這些進行再結合而發光。 An organic EL element used in an organic electroluminescence (EL) display device or an illumination device is a structure in which an organic layer composed of an organic material is sandwiched between an anode and a cathode, and the working principle is Electrons are injected from the cathode side by injecting a positive hole into the organic layer from the anode side by applying a voltage to the electrode, and recombination is performed to emit light.

此有機層,為包含正孔注入層、正孔輸送層、發光層、電子輸送層、電子注入層之多層膜被層積之構造。作為形成此有機層的材料使用高分子材料與低分子材料。其中使用低分子材料的場合,使用真空蒸鍍裝置形成有機薄膜。 This organic layer is a structure in which a multilayer film including a positive hole injection layer, a positive hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer is laminated. As the material for forming the organic layer, a polymer material and a low molecular material are used. When a low molecular material is used, an organic thin film is formed using a vacuum evaporation apparatus.

有機EL裝置的特性受有機層的膜厚的影響很 大。另一方面,形成有機薄膜的基板每一年都在大型化。亦即,使用真空蒸鍍裝置的場合,必須要高精度控制形成於大型基板上的有機薄膜或電極用金屬薄膜的膜厚,而且必須要可以長時間連續工作。電極用金屬薄膜伴隨著大型化,有低電阻化的必要,特別是作為顯示裝置用的有機層的上部的電極材料(蒸鍍材料)以鋁或銀、鎂材料為最有潛力。 The characteristics of the organic EL device are affected by the film thickness of the organic layer. Big. On the other hand, the substrate on which the organic thin film is formed is enlarged every year. In other words, when a vacuum vapor deposition apparatus is used, it is necessary to control the film thickness of the organic thin film or the electrode metal thin film formed on the large substrate with high precision, and it is necessary to continuously operate for a long time. In order to increase the size of the metal thin film for an electrode, it is necessary to reduce the resistance. In particular, an electrode material (vapor deposition material) which is an upper portion of an organic layer for a display device is most likely to be aluminum, silver or magnesium.

作為在真空蒸鍍在基板連續形成薄膜之用的蒸發源,在專利文獻1揭示了可以防止由坩堝飛散的原料繞回而附著於加熱器等,或者是傳送於坩堝內壁之原料的攀爬現象導致的故障之蒸發源。 As an evaporation source for continuously forming a thin film on a substrate by vacuum deposition, Patent Document 1 discloses that it is possible to prevent the raw material scattered by the crucible from being entangled and attached to the heater or the like, or to climb the raw material of the inner wall of the crucible. The evaporation source of the fault caused by the phenomenon.

[先前技術文獻] [Previous Technical Literature] [專利文獻] [Patent Literature]

[專利文獻1]日本專利特開平9-170882號公報 [Patent Document 1] Japanese Patent Laid-Open No. Hei 9-170882

於專利文獻1,揭示了配置熱屏蔽(heat shield),可以減低原料的攀爬或繞回現象導致往加熱器等附著所引起的故障之蒸發源。但是,未考慮到對基板側之熱輻射對策或是加熱器電力的省電力化。 Patent Document 1 discloses that a heat shield is disposed, which can reduce an evaporation source of a failure caused by adhesion to a heater or the like due to climbing or wraparound of a raw material. However, countermeasures against heat radiation on the substrate side or power saving of heater power are not considered.

本發明之目的在於提供減低熱輻射,使用可 以省電力化的蒸發源,高速成膜出對應於大型基板,以鋁材料為主的金屬薄膜,而可以連續成膜之蒸發源、真空蒸鍍裝置及有機EL(電致發光)顯示裝置製造方法。 The object of the present invention is to provide heat radiation reduction, and the use thereof The evaporation source of the electric power is used to form a metal film which is mainly composed of an aluminum material corresponding to a large substrate, and can be continuously formed into an evaporation source, a vacuum evaporation device, and an organic EL (electroluminescence) display device. method.

本發明,為了解決前述目的,至少具有以下之特徵。 The present invention has at least the following features in order to solve the aforementioned object.

本發明之蒸發源,特徵為具備:收納蒸發材料的坩堝、供放出被收容於該坩堝的蒸發材料的蒸氣用的坩堝出口、以包圍該坩堝出口之至少一部分的方式設置的熱反射構件、以及以包圍該坩堝的外側壁的方式設置的加熱器。 The evaporation source of the present invention is characterized in that it includes a crucible for storing an evaporation material, a crucible outlet for discharging a vapor contained in the crucible, and a heat reflecting member provided to surround at least a part of the crucible outlet, and A heater disposed to surround the outer side wall of the crucible.

此外,前述熱反射構件之中,設於加熱器側的熱反射構件,亦可以其一部分位於坩堝本體與該加熱器之間的方式來設置。 Further, among the heat reflecting members, the heat reflecting member provided on the heater side may be provided so that a part thereof is located between the crucible body and the heater.

進而,亦可於前述坩堝出口具備供防止材料往前述熱反射構件附著之用的噴嘴。 Further, a nozzle for preventing the adhesion of the material to the heat reflecting member may be provided at the port.

此外,亦可把加熱器分割於前述坩堝出口方向,個別地進行溫度控制。 Further, the heater may be divided into the aforementioned exit direction and temperature control may be performed individually.

進而,亦可具備以夾住前述無鍔的前述坩堝之前述無鍔的處所的方式設置的前述熱反射構件。 Further, the heat reflecting member may be provided to sandwich the aforementioned flawless space of the aforementioned cymbal.

此外,把鍔部的溫度在1100℃至1200℃進行溫度控制亦可。 In addition, the temperature of the crotch portion may be controlled at a temperature of 1100 ° C to 1200 ° C.

進而,本發明之真空蒸鍍裝置,特徵為具 備:前述任一所記載之1個以上的蒸發源,檢測出藉由前述蒸發源產生之往基板的蒸鍍量的膜厚監測器,以及根據前述膜厚監測器的檢測結果,控制前述蒸發源的控制部。 Further, the vacuum evaporation apparatus of the present invention is characterized by A film thickness monitor that detects a vapor deposition amount of a substrate generated by the evaporation source by one or more evaporation sources described in any one of the above, and controls the evaporation according to a detection result of the film thickness monitor Source control unit.

此外,本發明之有機電致發光顯示裝置製造 方法,係藉由密封基板密封住被形成薄膜電晶體、有機電致發光層、及夾著前述有機電致發光層的電極層的薄膜電晶體(TFT)基板之有機電致發光顯示裝置製造方法,特徵為:把被形成薄膜電晶體的TFT基板配置於真空蒸鍍裝置的蒸鍍室內,對向於前述TFT基板,配設1個以上收容供成膜前述有機電致發光層或電極層之用的蒸鍍材料的蒸發源,藉由在前述TFT基板蒸鍍前述蒸鍍材料,而形成前述有機電致發光(EL)層。 Further, the organic electroluminescent display device of the present invention is manufactured Method for manufacturing an organic electroluminescence display device that seals a thin film transistor (TFT) substrate on which a thin film transistor, an organic electroluminescence layer, and an electrode layer sandwiching the organic electroluminescence layer are sealed by a sealing substrate In the vapor deposition chamber of the vacuum vapor deposition apparatus, the TFT substrate on which the thin film transistor is formed is disposed, and one or more of the TFT substrates are placed to form the organic electroluminescent layer or the electrode layer. The evaporation source of the vapor deposition material is formed by depositing the vapor deposition material on the TFT substrate to form the organic electroluminescence (EL) layer.

進而,於前述之有機EL顯示裝置製造方法, 亦可於前述蒸鍍室內,具備對各個前述蒸發源供給蒸鍍材料之用的材料供給機,在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料。 Further, in the above-described method of manufacturing an organic EL display device, In the vapor deposition chamber, a material supply device for supplying a vapor deposition material to each of the evaporation sources may be provided, and the vapor deposition material may be supplied while maintaining the vacuum state of the vapor deposition chamber.

根據本發明的話,於使用陶瓷製的坩堝之蒸發源,可以藉由以夾住鍔部的方式設置熱反射構件,可以有效果地遮斷沿著鍔部流出之熱,可以很少的電力有效果地加熱坩堝。此外,可以防止鍔部的溫度上升,可防止攀爬。 According to the present invention, by using the evaporation source of the ceramic crucible, the heat reflecting member can be provided by sandwiching the crotch portion, and the heat flowing out along the crotch portion can be effectively blocked, and there is little electric power. Effectively heat the crucible. In addition, it can prevent the temperature of the crotch from rising and prevent climbing.

1‧‧‧基板 1‧‧‧Substrate

2‧‧‧蒸氣 2‧‧‧Vapor

3、3A~3E、3AH~3EH‧‧‧蒸發源 3, 3A~3E, 3AH~3EH‧‧‧ evaporation source

32‧‧‧坩堝 32‧‧‧坩埚

33a‧‧‧坩堝本體 33a‧‧‧坩埚Ontology

33‧‧‧加熱器 33‧‧‧heater

34‧‧‧鍔部 34‧‧‧锷

35‧‧‧加熱器的保持構件 35‧‧‧Maintenance components for heaters

36‧‧‧前加熱器 36‧‧‧ Front heater

37‧‧‧後加熱器 37‧‧‧After heater

38‧‧‧坩堝 38‧‧‧坩埚

39‧‧‧熱電偶 39‧‧‧ thermocouple

310‧‧‧無鍔 310‧‧‧Innocent

5‧‧‧蒸鍍室 5‧‧‧vapor deposition chamber

7‧‧‧膜厚監測器 7‧‧‧ film thickness monitor

8‧‧‧膜厚控制計 8‧‧‧ Film thickness control meter

9‧‧‧蒸發源電源 9‧‧‧Evaporation source power supply

10‧‧‧控制用電腦 10‧‧‧Control computer

11~15‧‧‧熱反射構件 11~15‧‧‧ Heat reflecting member

圖1係顯示在直立的基板上蒸鍍蒸鍍材料之本發明的蒸發源可以適用的縱型真空蒸鍍裝置之一實施型態之圖。 Fig. 1 is a view showing an embodiment of a vertical vacuum vapor deposition apparatus to which an evaporation source of the present invention is vapor-deposited on an upright substrate.

圖2係顯示在水平配置的基板上蒸鍍蒸鍍材料之本發明的蒸發源可以適用的橫型真空蒸鍍裝置之一實施型態之圖。 Fig. 2 is a view showing an embodiment of a horizontal vacuum vapor deposition apparatus to which an evaporation source of the present invention is vapor-deposited on a horizontally disposed substrate.

圖3係顯示本發明之第1實施例之蒸發源構成之剖面圖。 Fig. 3 is a cross-sectional view showing the configuration of an evaporation source according to a first embodiment of the present invention.

圖4係顯示第1實施例的變形例之蒸發源構成之剖面圖。 Fig. 4 is a cross-sectional view showing the configuration of an evaporation source according to a modification of the first embodiment.

圖5係顯示本發明之第2實施例之蒸發源構成之剖面圖。 Fig. 5 is a cross-sectional view showing the structure of an evaporation source according to a second embodiment of the present invention.

圖6係顯示第2實施例的變形例之蒸發源構成之剖面圖。 Fig. 6 is a cross-sectional view showing the configuration of an evaporation source according to a modification of the second embodiment.

圖7係顯示本發明之第3實施例之蒸發源構成之剖面圖。 Fig. 7 is a cross-sectional view showing the structure of an evaporation source according to a third embodiment of the present invention.

圖8係顯示第3實施例的變形例之蒸發源構成之剖面圖。 Fig. 8 is a cross-sectional view showing the configuration of an evaporation source according to a modification of the third embodiment.

圖9係顯示本發明之第4實施例之蒸發源構成之剖面圖。 Fig. 9 is a cross-sectional view showing the configuration of an evaporation source in a fourth embodiment of the present invention.

圖10係顯示第4實施例的變形例之蒸發源構成之剖面圖。 Fig. 10 is a cross-sectional view showing the configuration of an evaporation source according to a modification of the fourth embodiment.

圖11係顯示本發明之第5實施例之蒸發源構成之剖 面圖。 Figure 11 is a cross-sectional view showing the constitution of an evaporation source according to a fifth embodiment of the present invention. Surface map.

圖12係顯示第5實施例的變形例之蒸發源構成之剖面圖。 Fig. 12 is a cross-sectional view showing the configuration of an evaporation source according to a modification of the fifth embodiment.

圖13顯示各蒸鍍材料的飽和蒸汽壓下對坩堝溫度之圖。 Figure 13 is a graph showing the temperature versus saturation for each vapor deposition material under saturated vapor pressure.

圖14係顯示本發明之有機EL顯示裝置生產步驟之一例之步驟圖。 Fig. 14 is a view showing the steps of an example of the production steps of the organic EL display device of the present invention.

圖15係顯示從前例之蒸發源構成之剖面圖。 Figure 15 is a cross-sectional view showing the evaporation source of the prior art.

本發明,為了防止在鋁蒸鍍會成為問題的濕潤或攀爬,採用一體的陶瓷製的坩堝構造,坩堝的材質使用不與鋁材料反應的熱分解性氮化硼(PBN),藉由在該PBN坩堝的鍔部,或者出口部分設置熱反射構件,防止攀爬、基板溫度上升,而可以省電力地進行蒸鍍。 In order to prevent wetting or climbing which may become a problem in aluminum vapor deposition, an integrated ceramic crucible structure is used, and a crucible material is made of thermally decomposable boron nitride (PBN) which does not react with an aluminum material. The PBN crucible or the outlet portion is provided with a heat reflecting member to prevent climbing and the substrate temperature from rising, and the vapor deposition can be performed with power saving.

以下,使用實施例及圖式詳細說明本發明之內容。 Hereinafter, the contents of the present invention will be described in detail using the embodiments and the drawings.

但是,本發明並不以下述說明的實施型態為限,在本發明所屬技術領域,具有通常知識者也可以根據本發明的思想與精神而稍微修正或者變更本發明所完成之發明當然也包含在內。 However, the present invention is not limited to the embodiments described below, and those skilled in the art can also modify or modify the invention according to the spirit and scope of the present invention. Inside.

又,於各圖之說明,對於具有相同功能的構成要素賦予同一參照符號,為了避免重複,儘量地省略說明。 In the description of the drawings, the same reference numerals will be given to the components having the same functions, and the description will be omitted as much as possible in order to avoid redundancy.

圖1係顯示在直立的基板上蒸鍍蒸鍍材料之 本發明的蒸發源可以適用的縱型真空蒸鍍裝置之一實施型態之圖。圖2係顯示在水平配置的基板上蒸鍍蒸鍍材料之本發明的蒸發源可以適用的橫型真空蒸鍍裝置之一實施型態之圖。 Figure 1 shows the evaporation of vapor-deposited material on an upright substrate. A schematic diagram of one embodiment of a vertical vacuum evaporation apparatus to which the evaporation source of the present invention can be applied. Fig. 2 is a view showing an embodiment of a horizontal vacuum vapor deposition apparatus to which an evaporation source of the present invention is vapor-deposited on a horizontally disposed substrate.

兩真空蒸鍍裝置,係於蒸鍍室5內,具有基 板1、蒸發源3、膜厚監測器7;於兩真空蒸鍍裝置,例如蒸發源3所示由外部供給電源。 Two vacuum evaporation devices are installed in the vapor deposition chamber 5 and have a base The plate 1, the evaporation source 3, and the film thickness monitor 7 are externally supplied with a power source as shown in the two vacuum evaporation devices, for example, the evaporation source 3.

另一方面,於蒸鍍室5外,具有控制膜厚之用的膜厚控制計8,控制蒸發源的溫度之用的蒸發源電源9,以及使膜厚控制計8與蒸發源電源9連動而控制,記錄蒸鍍資料之用的控制部亦即控制用電腦10。 On the other hand, outside the vapor deposition chamber 5, a film thickness controller 8 for controlling the film thickness, an evaporation source power source 9 for controlling the temperature of the evaporation source, and a film thickness controller 8 linked to the evaporation source power source 9 are provided. The control unit for controlling the vapor deposition data, that is, the control computer 10 is controlled.

在圖1所示的縱型真空蒸鍍裝置,基板1與蒸發源列32藉由改變相對位置,而可以在基板全面成膜。在本實施型態,可以使蒸發源3配合所要的基板尺寸,縱向排列,使蒸發源列32僅橫向之一軸移動就可以成膜。此外,可以使蒸發源3配合所要的基板尺寸,橫向排列,使蒸發源列32僅上下之一軸移動,也可以成膜。又,固定蒸發源列32而使基板移動亦可。 In the vertical vacuum vapor deposition apparatus shown in Fig. 1, the substrate 1 and the evaporation source row 32 can be integrally formed on the substrate by changing the relative positions. In the present embodiment, the evaporation source 3 can be arranged in the longitudinal direction in accordance with the desired substrate size, and the evaporation source column 32 can be formed into a film by moving only one of the lateral axes. Further, the evaporation source 3 can be arranged in the lateral direction in accordance with the desired substrate size, and the evaporation source row 32 can be moved only by one of the upper and lower axes, and can be formed into a film. Further, the evaporation source row 32 may be fixed to move the substrate.

在圖2所示的橫型真空蒸鍍裝置,為成膜於水平基板1的場合之構成圖。基板1與蒸發源列32藉由改變相對位置,可以在基板全面成膜。在本實施型態,顯示固定蒸發源列32,而於不同的處理室搬送基板之沿線(in-line)方式之例。 The horizontal vacuum vapor deposition apparatus shown in FIG. 2 is a configuration diagram in the case where the horizontal substrate 1 is formed. By changing the relative position of the substrate 1 and the evaporation source row 32, it is possible to form a film on the entire substrate. In the present embodiment, an example in which the evaporation source row 32 is fixed and the substrate is conveyed in a different processing chamber is shown in an in-line manner.

圖15係顯示從前例之蒸發源構成之剖面圖。 從前的蒸發源3J的坩堝32,以加熱器33進行加熱。蒸鍍材料4,例如在鋁的場合,被加熱至1200℃以上,由坩堝出口放出蒸氣2,往基板1放出蒸氣2而成膜。此時,加熱溫度係以坩堝底部附近的熱電偶39來監視。藉由膜厚監視器7的訊號,成膜速度受到控制,可以形成所要的膜厚。 Figure 15 is a cross-sectional view showing the evaporation source of the prior art. The crucible 32 of the former evaporation source 3J is heated by the heater 33. For example, in the case of aluminum, the vapor deposition material 4 is heated to 1200 ° C or higher, and the vapor 2 is discharged from the crucible outlet, and the vapor 2 is discharged to the substrate 1 to form a film. At this time, the heating temperature was monitored by a thermocouple 39 near the bottom of the crucible. By the signal of the film thickness monitor 7, the film formation speed is controlled, and a desired film thickness can be formed.

以下,以本發明的特徵之蒸發源為主體進行說明。 Hereinafter, the evaporation source of the feature of the present invention will be mainly described.

(實施例1) (Example 1)

圖3係顯示本發明的蒸發源之第1實施例3A的構成之剖面圖。蒸發源3A,例如為努特生池(Knudsen Cell,以下稱為K池)。此K池,係由:以陶瓷(PBN、氧化鋁、碳材料等)為材質的坩堝32,供加熱該坩堝之用的加熱器33、供控制坩堝溫度之熱電偶19、供給蒸鍍材料4的材料供給機20、為了使熱不漏到外部之未圖示的熱屏蔽,以及水冷屏蔽所構成的。材料供給機20,藉由僅在供給時移動到坩堝出口投入材料,來防止蒸鍍時材料往材料供給機20上附著。 Fig. 3 is a cross-sectional view showing the configuration of a first embodiment 3A of the evaporation source of the present invention. The evaporation source 3A is, for example, a Knudsen Cell (hereinafter referred to as a K-cell). The K pool is composed of a crucible 32 made of ceramics (PBN, alumina, carbon material, etc.), a heater 33 for heating the crucible, a thermocouple 19 for controlling the crucible temperature, and a vapor deposition material 4 The material supply device 20 is composed of a heat shield (not shown) that does not leak heat to the outside, and a water-cooled shield. The material supply machine 20 prevents the material from adhering to the material supply machine 20 at the time of vapor deposition by moving to the crucible outlet input material only at the time of supply.

蒸發源3A,為了防止蒸鍍材料4亦即鋁材料的攀爬,減低熱輻射,達成省電力化的目的,為了放出蒸氣而被開口一部分,以夾住坩堝32的鍔部34的方式設置熱反射構件11、12。藉由以夾住鍔部34的方式設置熱反射構件11、12,可以有效地遮斷沿著鍔部34流出的熱, 可以少量的電力有效果地進行坩堝的加熱。此外,來自加熱器的熱輻射在熱反射構件11被反射,防止鍔部34的溫度上升,可以減低基板溫度上升,可防止在冷掉的鍔部發生蒸鍍材料的攀爬。 In order to prevent the vapor deposition material 4, that is, the aluminum material from climbing, the evaporation source 3A is reduced in heat radiation, and the purpose of power saving is achieved. In order to release the vapor, a part of the opening is opened, and heat is set so as to sandwich the crotch portion 34 of the crucible 32. Reflecting members 11, 12. By providing the heat reflecting members 11 and 12 in such a manner as to sandwich the crotch portion 34, the heat flowing out along the crotch portion 34 can be effectively blocked. The heating of the crucible can be effected with a small amount of electric power. Further, the heat radiation from the heater is reflected by the heat reflecting member 11, and the temperature of the crotch portion 34 is prevented from rising, so that the substrate temperature rise can be reduced, and the climbing of the vapor deposition material can be prevented from occurring in the cold crotch portion.

圖4係顯示實施例1的變形例亦即蒸發源 3AH的構成之剖面圖。蒸發源3AH與蒸發源3A不同之處,在於加入複數個(在圖中為2個)熱反射構件11、12這一點。其他方面,蒸發源3AH與蒸發源3A相同。 藉由加入複數個熱反射構件11、12,可以進而減低熱輻射,可以增加省電力化、防止攀爬的效果。 4 is a view showing a modification of Embodiment 1, that is, an evaporation source. A cross-sectional view of the structure of 3AH. The evaporation source 3AH differs from the evaporation source 3A in that a plurality of (two in the drawing) heat reflecting members 11, 12 are added. Otherwise, the evaporation source 3AH is the same as the evaporation source 3A. By adding a plurality of heat reflecting members 11 and 12, heat radiation can be further reduced, and the effect of saving power and preventing climbing can be increased.

(實施例2) (Example 2)

圖5係顯示本發明的蒸發源的第2實施例3B的構成之剖面圖。 Fig. 5 is a cross-sectional view showing the configuration of a second embodiment 3B of the evaporation source of the present invention.

在實施例1,為了減低熱輻射,在蒸氣2放出方向上,亦即以夾住坩堝32的鍔部34的方式設置熱反射構件11、12。在本實施例,為了進而促進防止攀爬的效果,除設置在加熱器33側的熱反射構件11之外,另外以位在非鍔部34的坩堝本體32a與加熱器33之間的方式設置熱反射構件13,減低往鍔部34或坩堝32的出口附近之熱輻射。熱反射構件11與13也可以是一體的。在該場合,以熱反射構件的一部分位於坩堝本體32a與加熱器33之間的方式配置的話,可以得到同樣的效果。此外,如在圖4所說明的效果,熱反射構件11、12、13亦可重 疊配設2個以上。 In the first embodiment, in order to reduce the heat radiation, the heat reflecting members 11, 12 are provided in the direction in which the vapor 2 is discharged, that is, the crotch portion 34 of the crucible 32 is sandwiched. In the present embodiment, in order to further promote the effect of preventing the climbing, in addition to the heat reflecting member 11 provided on the heater 33 side, it is additionally disposed in such a manner as to be positioned between the weir body 32a of the non-twist portion 34 and the heater 33. The heat reflecting member 13 reduces heat radiation in the vicinity of the exit of the turn 34 or the weir 32. The heat reflecting members 11 and 13 may also be integral. In this case, the same effect can be obtained when a part of the heat reflecting member is disposed between the crucible body 32a and the heater 33. Further, as the effect illustrated in FIG. 4, the heat reflecting members 11, 12, 13 may also be heavy More than two stacks are arranged.

圖6係顯示實施例2的變形例亦即蒸發源 3BH的構成之剖面圖。蒸發源3BH與蒸發源3B不同之處,在於防止蒸發源3周邊之熱對蒸鍍室5內的機器的影響,或者是防止加熱器33的熱逃逸到蒸發源3BH的外部,實現省電力化,而在周邊設置熱反射構件14、15這一點。在本實施例,熱反射構件14、15係說明只有單重的場合,但重疊2個以上可以提高絕熱效果進而更省電力化,實現坩堝溫度的安定化。 6 is a view showing a modification of Embodiment 2, that is, an evaporation source. A cross-sectional view of the composition of 3BH. The evaporation source 3BH differs from the evaporation source 3B in that it prevents the influence of heat around the evaporation source 3 on the machine in the vapor deposition chamber 5, or prevents the heat of the heater 33 from escaping to the outside of the evaporation source 3BH, thereby realizing power saving. The heat reflecting members 14, 15 are provided at the periphery. In the present embodiment, the heat reflecting members 14 and 15 are described as being single-only. However, by superimposing two or more, it is possible to improve the heat insulating effect and further reduce the power consumption, thereby realizing the stabilization of the helium temperature.

(實施例3) (Example 3)

圖7係顯示本發明的蒸發源之第3實施例3C的構成之剖面圖。 Fig. 7 is a cross-sectional view showing the configuration of a third embodiment 3C of the evaporation source of the present invention.

在實施例1及實施例2,熱反射構件12,會由坩堝32的出口接觸到蒸氣2,所以會有蒸鍍材料附著於熱反射構件12而產生故障的情形。在本實施例,為了解決前述材料附著問題,於坩堝32的出口,設置噴嘴16,使蒸氣2不會接觸到熱反射構件12。噴嘴16使用蒸鍍材料附著也不成問題的陶瓷材質。例如,蒸鍍材料為鋁的場合,為了防止破損,採用與坩堝相同的PBN材質。也可以是氮化鋁或氮化硼複合材料等其他種類的陶瓷材料。 In the first embodiment and the second embodiment, since the heat reflecting member 12 is in contact with the vapor 2 from the outlet of the crucible 32, there is a case where the vapor deposition material adheres to the heat reflecting member 12 to cause a failure. In the present embodiment, in order to solve the aforementioned problem of material adhesion, the nozzle 16 is provided at the outlet of the crucible 32 so that the vapor 2 does not come into contact with the heat reflecting member 12. The nozzle 16 is made of a ceramic material which is not problematic by using a vapor deposition material. For example, when the vapor deposition material is aluminum, in order to prevent breakage, the same PBN material as that of tantalum is used. Other types of ceramic materials such as aluminum nitride or boron nitride composite materials may also be used.

圖8係顯示實施例3的變形例亦即蒸發源3CH的構成之剖面圖。蒸發源3CH與蒸發源3C不同之 處,在於防止蒸發源3周邊之熱對蒸鍍室5內的機器的影響,或者是防止加熱器33的熱逃逸到外部,實現省電力化,而在周邊設置熱反射構件14、15這一點。在本實施例,熱反射構件14、15係說明只有單重的場合,但重疊2個以上可以提高絕熱效果可以進而更省電力化,實現坩堝溫度的安定化。 Fig. 8 is a cross-sectional view showing the configuration of an evaporation source 3CH which is a modification of the third embodiment. The evaporation source 3CH is different from the evaporation source 3C It is to prevent the influence of the heat around the evaporation source 3 on the machine in the vapor deposition chamber 5, or to prevent the heat of the heater 33 from escaping to the outside, thereby achieving power saving, and providing the heat reflecting members 14 and 15 at the periphery. . In the present embodiment, the heat reflecting members 14 and 15 are described as being single-only. However, by superimposing two or more, the heat insulating effect can be improved, and power can be further reduced, and the temperature of the helium can be stabilized.

(實施例4) (Example 4)

圖9係顯示本發明的蒸發源之第4實施例3D的構成之剖面圖。 Fig. 9 is a cross-sectional view showing the configuration of a fourth embodiment 3D of the evaporation source of the present invention.

在實施例1至實施例3,加熱器33為1個, 以覆蓋坩堝32外壁的方式設置。在本實施例,為了對坩堝32的底部或出口等部分分別進行溫度控制,如圖9所示分割設置為前加熱器36、後加熱器37。在本實施例,藉由分割坩堝的溫度而分別控制為所要的溫度,可以防止攀爬或蒸鍍材料的附著。又,35為前加熱器36、後加熱器37的保持構件。 In the first embodiment to the third embodiment, the heater 33 is one. Set to cover the outer wall of the 坩埚32. In the present embodiment, in order to separately control the temperature of the bottom portion or the outlet portion of the crucible 32, the front heater 36 and the rear heater 37 are divided and disposed as shown in Fig. 9 . In the present embodiment, by separately dividing the temperature of the crucible to be controlled to a desired temperature, it is possible to prevent the adhesion of the climbing or vapor deposition material. Further, 35 is a holding member of the front heater 36 and the rear heater 37.

圖10係顯示實施例4的變形例亦即蒸發源 3DH的構成之剖面圖。蒸發源3DH與蒸發源3D不同之處,在於防止蒸發源3周邊之熱對蒸鍍室5內的機器的影響,或者是防止加熱器33的熱逃逸到外部,實現省電力化,而在周邊設置熱反射構件14、15這一點。在本變形例,設置3重熱反射構件14、15,但設置1個,或者是更多個也可以提高絕熱效果,可以實現省電力化,坩堝溫 度的安定化。 Figure 10 is a view showing a modification of Embodiment 4, that is, an evaporation source. A cross-sectional view of the composition of 3DH. The evaporation source 3DH differs from the evaporation source 3D in that it prevents the influence of the heat around the evaporation source 3 on the machine in the vapor deposition chamber 5, or prevents the heat of the heater 33 from escaping to the outside, thereby achieving power saving, while surrounding The heat reflecting members 14, 15 are provided. In the present modification, the three heat reflecting members 14 and 15 are provided. However, if one or more are provided, the heat insulating effect can be improved, and power saving can be achieved. Degree of stability.

(實施例5) (Example 5)

圖11係顯示本發明的蒸發源之第5實施例3E的構成之剖面圖。 Fig. 11 is a cross-sectional view showing the configuration of a fifth embodiment 3E of the evaporation source of the present invention.

在實施例1至實施例4,藉由把坩堝32的鍔 部34以熱反射構件11、12、13覆蓋,可以有效果地遮斷沿著鍔部流出的熱,能夠以少量的電力有效果地加熱坩堝。此外,來自加熱器的熱輻射在熱反射構件11被反射,可以防止鍔部34的溫度上升,可防止在冷掉的鍔部34發生蒸鍍材料的攀爬。 In the first embodiment to the fourth embodiment, by 坩埚32 The portion 34 is covered by the heat reflecting members 11, 12, and 13, and the heat flowing out along the crotch portion can be effectively blocked, and the crucible can be efficiently heated with a small amount of electric power. Further, the heat radiation from the heater is reflected by the heat reflecting member 11, and the temperature of the crotch portion 34 can be prevented from rising, and the climbing of the vapor deposition material in the crotch portion 34 can be prevented from occurring.

在本實施例,於無鍔310的坩堝38的場合, 也藉由設置熱反射構件11、12、13,而可以防止基板溫度上升,及蒸鍍材料的攀爬。 In the present embodiment, in the case of the 坩埚38 of the flawless 310, Also by providing the heat reflecting members 11, 12, 13, it is possible to prevent the substrate temperature from rising and the vapor deposition material from climbing.

圖12係顯示實施例5的變形例亦即蒸發源 3EH的構成之剖面圖。蒸發源3EH與蒸發源3D不同之處,與圖6所示的蒸發源3BH同樣,是在於防止蒸發源周邊之熱對蒸鍍室5內的機器的影響,或者是防止加熱器33的熱逃逸到外部,實現省電力化,而在周邊設置熱反射構件14、15的場合之剖面圖。在本發明,熱反射構件14、15係說明只有單重的場合,但重疊2個以上可以提高絕熱效果可以進而更省電力化,實現坩堝溫度的安定化。 Figure 12 is a view showing a modification of Embodiment 5, that is, an evaporation source. A cross-sectional view of the composition of 3EH. The evaporation source 3EH differs from the evaporation source 3D in that, similarly to the evaporation source 3BH shown in FIG. 6, it is to prevent the influence of heat around the evaporation source on the machine in the vapor deposition chamber 5, or to prevent the heat escape of the heater 33. A cross-sectional view of the case where the heat reflecting members 14 and 15 are provided in the periphery while the power is saved to the outside. In the present invention, the heat reflecting members 14 and 15 are described as being single-only. However, by superimposing two or more, the heat insulating effect can be improved, and power can be further reduced, and the temperature of the helium can be stabilized.

(實施例6) (Example 6)

圖13係顯示鋁Al、銀Ag、鎂Mg的溫度T與蒸氣壓P的關係之蒸氣壓曲線。 Fig. 13 is a graph showing the vapor pressure curve of the relationship between the temperature T of the aluminum Al, the silver Ag, and the magnesium Mg and the vapor pressure P.

在實施例1至實施例5,鍔部34的溫度雖然沒有測定,但在本實施例由圖13所示的蒸氣壓曲線,可以得知成膜所必要的蒸氣壓,例如蒸鍍鋁材料的場合,為了要得到數Pa~數十Pa(帕斯卡)的蒸氣壓,必須使蒸鍍材料的溫度上升至1300℃~1400℃。此外,可知攀爬在鍔部的溫度為1200℃以上會顯著發生。但是由實驗可知鍔部的溫度在1000℃以下的話,會因為鍔部的冷卻而使蒸氣2附著,而附著於坩堝壁。因此,藉由把鍔部34的溫度控制在1100℃至1200℃之間,可以防止鋁的攀爬,同時可以成膜。 In the first to fifth embodiments, although the temperature of the crotch portion 34 is not measured, in the present embodiment, the vapor pressure curve shown in Fig. 13 can be used to know the vapor pressure necessary for film formation, for example, the vapor deposition of aluminum material. In order to obtain a vapor pressure of several Pa to several tens of Pa (Pascal), it is necessary to raise the temperature of the vapor deposition material to 1300 ° C to 1400 ° C. In addition, it can be seen that climbing at a temperature of 1200 ° C or more in the crotch occurs remarkably. However, it is known from experiments that the temperature of the crotch portion is 1000 ° C or lower, and the vapor 2 adheres to the crucible wall due to the cooling of the crotch portion. Therefore, by controlling the temperature of the crotch portion 34 between 1100 ° C and 1200 ° C, it is possible to prevent the climbing of the aluminum while forming a film.

(實施例7) (Example 7)

在實施例1至實施例6說明了蒸發源的構成,在本實施例,使用實施例1至實施例6所用的蒸發源,如圖1或圖2所示設置縱型真空蒸鍍裝置或橫型真空蒸鍍裝置,而實現可以實現所要的成膜之真空蒸鍍裝置。在圖1、圖2,係設置複數個蒸發源之例。但是,即使藉由1個蒸發源在基板上成膜,也可以在大型的基板進行均一膜厚的成膜。 The constitution of the evaporation source is explained in the first to sixth embodiments. In the present embodiment, the evaporation source used in the first to sixth embodiments is used, and the vertical vacuum evaporation apparatus or the horizontal direction is provided as shown in FIG. 1 or FIG. A vacuum evaporation apparatus is used to realize a vacuum evaporation apparatus capable of achieving a desired film formation. In Figs. 1 and 2, an example of a plurality of evaporation sources is provided. However, even if a film is formed on a substrate by one evaporation source, a film having a uniform film thickness can be formed on a large substrate.

(實施例8) (Example 8)

圖14係顯示有機EL顯示裝置生產步驟之一例之步驟圖。在實施例1~實施例7,僅以此生產步驟的金屬蒸鍍的步驟為主來進行說明。 Fig. 14 is a view showing the steps of an example of the production steps of the organic EL display device. In the first to seventh embodiments, only the steps of metal deposition in the production step will be mainly described.

在圖14的步驟圖,分別形成被形成控制流動於有機層與有機層之電流的薄膜電晶體(TFT)的TFT基板,與保護有機層不受外部濕氣影響的密封基板,於密封步驟/密封硬化步驟之密封步驟被組合。 In the step diagram of FIG. 14, a TFT substrate formed with a thin film transistor (TFT) for controlling a current flowing between the organic layer and the organic layer, and a sealing substrate for protecting the organic layer from external moisture are respectively formed in the sealing step/ The sealing steps of the seal hardening step are combined.

於圖14的TFT基板之製造步驟,對被濕式洗 淨的基板進行乾式洗淨。乾式洗淨,也包含藉由紫外線照射之洗淨。 In the manufacturing step of the TFT substrate of FIG. 14, the wet type is washed. The clean substrate is dry cleaned. Dry cleaning also includes washing by ultraviolet radiation.

被乾式洗淨的TFT基板,首先被形成TFT。於TFT上被形成鈍化膜及平坦化膜,於其上形成有機EL層的下部電極。下部電極與TFT之汲極電極接續。下部電極為陽極的場合,例如使用ITO(lndium Tinoxide)膜。 The dry-cleaned TFT substrate is first formed with a TFT. A passivation film and a planarization film are formed on the TFT, and a lower electrode of the organic EL layer is formed thereon. The lower electrode is connected to the drain electrode of the TFT. When the lower electrode is an anode, for example, an ITO (lndium Tinoxide) film is used.

其次,於下部電極之上形成有機EL層(有機 蒸鍍)。有機EL層由複數之層所構成。下部電極為陽極的場合,由下方起例如為電孔注入層、電孔輸送層、發光層、電子輸送層、電子注入層。如此般有機EL層藉由蒸鍍而形成,於其上被形成上部電極層。上部電極層,藉由實施例1~實施例7所述的真空蒸鍍裝置或者有機EL顯示裝置製造方法來形成。 Second, an organic EL layer is formed on the lower electrode (organic Evaporation). The organic EL layer is composed of a plurality of layers. When the lower electrode is an anode, for example, an electric hole injection layer, a hole transport layer, a light-emitting layer, an electron transport layer, and an electron injection layer are formed from the lower side. The organic EL layer is thus formed by vapor deposition, and an upper electrode layer is formed thereon. The upper electrode layer is formed by the vacuum vapor deposition apparatus described in Examples 1 to 7, or the organic EL display device manufacturing method.

於有機EL層之上,各畫素共通,以覆蓋膜的形式以實施例1至5之任一之蒸發源形成上部電極(金屬蒸鍍)。有機EL顯示裝置為頂發射的場合,於上部電極使 用IZO(登錄商標,In2O3-ZnO)等透明電極,有機EL顯示裝置為底發射的場合,使用鋁等金屬膜。 On the organic EL layer, the respective pixels were common, and an upper electrode (metal vapor deposition) was formed in the form of a cover film by using the evaporation source of any of Examples 1 to 5. When the organic EL display device is a top emission, a transparent electrode such as IZO (registered trademark, In 2 O 3 -ZnO) is used for the upper electrode, and a metal film such as aluminum is used for the organic EL display device.

於圖14之密封基板投入步驟,對進行濕式洗淨及乾式洗淨的密封基板配置乾燥劑(desiccant)。有機EL層,若有水分會劣化,為了除去內部的水分而使用乾燥劑。乾燥劑可以使用種種材料,隨著有機EL顯示裝置為頂發射或是底發射的不同,乾燥劑的配置方法也不同。 In the sealing substrate charging step of Fig. 14, a desiccant is disposed on the sealing substrate subjected to wet cleaning and dry cleaning. When the organic EL layer is degraded by moisture, a desiccant is used to remove the internal moisture. Various materials can be used for the desiccant, and the method of disposing the desiccant differs depending on whether the organic EL display device is different in top emission or bottom emission.

如此,分別被製造的TFT基板與密封基板, 於密封步驟被組合。密封TFT基板與密封基板之用的密封材,被形成於密封基板。組合密封基板與TFT基板之後,對密封部照射紫外線,使密封部硬化而結束密封。 Thus, the TFT substrate and the sealing substrate which are respectively manufactured, They are combined in the sealing step. A sealing material for sealing the TFT substrate and the sealing substrate is formed on the sealing substrate. After the sealing substrate and the TFT substrate are combined, the sealing portion is irradiated with ultraviolet rays, and the sealing portion is cured to complete the sealing.

對於如此進行而形成的有機EL顯示裝置進行 點燈檢查。於點燈檢查,即使在產生黑點、白點等缺陷的場合也對可以修正缺陷者進行修正,而完成有機EL顯示裝置。 The organic EL display device formed in this manner is performed Light check. In the lighting inspection, even when a defect such as a black dot or a white dot is generated, the defect can be corrected, and the organic EL display device is completed.

藉由本發明,可以抑制異物的污染,而且可 以在短時間內就形成複數層形成的有機EL層,所以可以降低有機EL顯示裝置的製造成本,可以提高生產率。進而,可以正確地控制有機EL層之各層的成分,所以可以提高特性的再現性,而且可製造可信賴性高的有機EL顯示裝置。 By the present invention, contamination of foreign matter can be suppressed, and Since the organic EL layer formed of the plurality of layers is formed in a short time, the manufacturing cost of the organic EL display device can be reduced, and the productivity can be improved. Further, since the components of the respective layers of the organic EL layer can be accurately controlled, the reproducibility of characteristics can be improved, and an organic EL display device having high reliability can be manufactured.

(實施例9) (Example 9)

在本實施例並沒有圖示,但可以在實施例7的有機 EL顯示裝置製造方法,於前述蒸鍍室5內,具備對複數設置的前述蒸發源3分別供給蒸鍍材料之材料供給機,可以藉由在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料,而延長蒸鍍裝置的工作時間。 This embodiment is not illustrated, but can be organic in the embodiment 7. In the method of manufacturing an EL display device, a material supply device that supplies a vapor deposition material to the plurality of evaporation sources 3 provided in a plurality of the vapor deposition chambers 5 is provided, and the steam supply can be supplied while maintaining the vacuum chamber in the vapor deposition chamber. Plating material while extending the working time of the evaporation device.

2‧‧‧蒸氣 2‧‧‧Vapor

3A‧‧‧蒸發源 3A‧‧‧ evaporation source

4‧‧‧蒸鍍材料 4‧‧‧ evaporation materials

11,12‧‧‧熱反射構件 11,12‧‧‧ Heat reflecting member

20‧‧‧材料供給機 20‧‧‧Material feeder

32‧‧‧坩堝 32‧‧‧坩埚

33‧‧‧加熱器 33‧‧‧heater

34‧‧‧鍔部 34‧‧‧锷

39‧‧‧熱電偶 39‧‧‧ thermocouple

Claims (18)

一種蒸發源,其特徵為具備:收納蒸發材料的坩堝、供放出被收容於該坩堝的蒸發材料的蒸氣用的坩堝出口、以包圍該坩堝出口之至少一部分的方式設置的熱反射構件、以及以包圍該坩堝的外側壁的方式設置的加熱器。 An evaporation source comprising: a crucible for storing an evaporation material; a crucible outlet for discharging a vapor contained in the crucible evaporation material; and a heat reflection member provided to surround at least a portion of the crucible outlet; A heater disposed in a manner surrounding the outer side wall of the crucible. 如申請專利範圍第1項之蒸發源,其中前述熱反射構件之中,設於加熱器側的熱反射構件,係以其一部分位於坩堝本體與該加熱器之間的方式設置的。 An evaporation source according to claim 1, wherein among the heat reflecting members, the heat reflecting member provided on the heater side is disposed such that a part thereof is located between the crucible body and the heater. 如申請專利範圍第1項之蒸發源,其中於前述坩堝出口具備供防止材料往前述熱反射構件附著之用的噴嘴。 An evaporation source according to claim 1, wherein the nozzle is provided with a nozzle for preventing adhesion of the material to the heat reflecting member. 如申請專利範圍第1至3項之任一項之蒸發源,其中把前述加熱器分割於前述坩堝出口方向,個別地進行溫度控制。 The evaporation source according to any one of claims 1 to 3, wherein the heater is divided in the direction of the exit port, and temperature control is performed individually. 如申請專利範圍第1至3項之任一項之蒸發源,其中具備以包圍前述坩堝出口之至少一部份的方式設置的鍔部,前述熱反射構件以夾住該鍔部的方式設置。 The evaporation source according to any one of claims 1 to 3, further comprising a crotch portion provided to surround at least a portion of the crotch outlet, wherein the heat reflecting member is provided to sandwich the crotch portion. 如申請專利範圍第5項之蒸發源,其中把前述鍔部的溫度由1100℃至1200℃進行溫度控制。 For example, in the evaporation source of claim 5, wherein the temperature of the aforementioned crotch portion is controlled from 1100 ° C to 1200 ° C. 一種真空蒸鍍裝置,其特徵為具備:申請專利範圍第1至3項之任一項所記載之1個以上的蒸發源,檢測出藉由前述蒸發源產生之往基板的蒸鍍量的膜厚監測器,以及根據前述膜厚監測器的檢測結果,控制前述蒸發源的控制部。 A vacuum vapor deposition apparatus comprising: one or more evaporation sources described in any one of claims 1 to 3; and a film for detecting a vapor deposition amount of the substrate by the evaporation source The thick monitor, and the control portion of the evaporation source are controlled according to the detection result of the film thickness monitor described above. 一種真空蒸鍍裝置,其特徵為具備:申請專利範圍第4項所記載之1個以上的蒸發源,檢測出藉由前述蒸發源產生之往基板的蒸鍍量的膜厚監測器,以及根據前述膜厚監測器的檢測結果,控制前述蒸發源的控制部。 A vacuum vapor deposition apparatus comprising: one or more evaporation sources described in claim 4, and a film thickness monitor for detecting a vapor deposition amount of the substrate generated by the evaporation source, and The detection result of the film thickness monitor controls the control unit of the evaporation source. 一種真空蒸鍍裝置,其特徵為具備:申請專利範圍第5項所記載之1個以上的蒸發源,檢測出藉由前述蒸發源產生之往基板的蒸鍍量的膜厚監測器,以及根據前述膜厚監測器的檢測結果,控制前述蒸發源的控制部。 A vacuum vapor deposition apparatus comprising: one or more evaporation sources described in claim 5, and a film thickness monitor for detecting a vapor deposition amount of the substrate by the evaporation source, and The detection result of the film thickness monitor controls the control unit of the evaporation source. 一種真空蒸鍍裝置,其特徵為具備:申請專利範圍第6項所記載之1個以上的蒸發源, 檢測出藉由前述蒸發源產生之往基板的蒸鍍量的膜厚監測器,以及根據前述膜厚監測器的檢測結果,控制前述蒸發源的控制部。 A vacuum vapor deposition apparatus comprising: one or more evaporation sources described in claim 6 of the patent application scope; A film thickness monitor that detects the vapor deposition amount of the substrate generated by the evaporation source and a control unit that controls the evaporation source according to the detection result of the film thickness monitor. 一種有機電致發光(EL)顯示裝置製造方法,係藉由密封基板密封住被形成薄膜電晶體、有機電致發光層、及夾著前述有機電致發光層的電極層的薄膜電晶體(TFT)基板之有機電致發光顯示裝置製造方法,其特徵為:把被形成前述薄膜電晶體的前述TFT基板配置於真空蒸鍍裝置的蒸鍍室內,對向於前述TFT基板,配設1個以上收容供成膜前述有機電致發光層或電極層之用的蒸鍍材料的申請專利範圍第1至3項之任一項所記載的蒸發源,藉由在前述TFT基板蒸鍍前述蒸鍍材料,而形成前述有機電致發光(EL)層。 A method of manufacturing an organic electroluminescence (EL) display device for sealing a thin film transistor (TFT) in which a thin film transistor, an organic electroluminescence layer, and an electrode layer sandwiching the organic electroluminescence layer are sealed by a sealing substrate In the method of manufacturing a substrate of an organic electroluminescence display device, the TFT substrate on which the thin film transistor is formed is placed in a vapor deposition chamber of a vacuum vapor deposition apparatus, and one or more TFT substrates are disposed. An evaporation source according to any one of claims 1 to 3, wherein the vapor deposition material for depositing the organic electroluminescent layer or the electrode layer is formed by vapor deposition of the vapor deposition material on the TFT substrate. And forming the aforementioned organic electroluminescence (EL) layer. 如申請專利範圍第11項之有機EL顯示裝置製造方法,其中於前述蒸鍍室內,具備對各個前述蒸發源供給前述蒸鍍材料之用的材料供給機,在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料。 The method of manufacturing an organic EL display device according to claim 11, wherein the vapor deposition chamber includes a material supply device for supplying the vapor deposition material to each of the evaporation sources, and maintaining a vacuum state of the vapor deposition chamber The vapor deposition material is supplied. 一種有機電致發光顯示裝置製造方法,係藉由密封基板密封住被形成薄膜電晶體、有機電致發光層、及夾著前述有機電致發光層的電極層的薄膜電晶體(TFT)基板之有機電致發光顯示裝置製造方法,其特徵為:把被形成前述薄膜電晶體的前述TFT基板配置於真 空蒸鍍裝置的蒸鍍室內,對向於前述TFT基板,配設1個以上收容供成膜前述有機電致發光層或電極層之用的蒸鍍材料的申請專利範圍第4項所記載的蒸發源,藉由在前述TFT基板蒸鍍前述蒸鍍材料,而形成前述有機電致發光(EL)層。 A method of manufacturing an organic electroluminescence display device for sealing a thin film transistor (TFT) substrate on which a thin film transistor, an organic electroluminescence layer, and an electrode layer sandwiching the organic electroluminescence layer are sealed by a sealing substrate A method of manufacturing an organic electroluminescence display device, characterized in that the TFT substrate on which the thin film transistor is formed is disposed in a true In the vapor deposition chamber of the air vapor deposition device, one or more vapor deposition materials for accommodating the organic electroluminescence layer or the electrode layer are disposed on the TFT substrate, and the fourth embodiment of the patent application is described in the fourth aspect of the patent application. The evaporation source is formed by vapor-depositing the vapor deposition material on the TFT substrate to form the organic electroluminescence (EL) layer. 如申請專利範圍第13項之有機EL顯示裝置製造方法,其中於前述蒸鍍室內,具備對各個前述蒸發源供給前述蒸鍍材料之用的材料供給機,在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料。 The method of manufacturing an organic EL display device according to claim 13, wherein the vapor deposition chamber includes a material supply device for supplying the vapor deposition material to each of the evaporation sources, and maintaining a vacuum state of the vapor deposition chamber The vapor deposition material is supplied. 一種有機電致發光顯示裝置製造方法,係藉由密封基板密封住被形成薄膜電晶體、有機電致發光層、及夾著前述有機電致發光層的電極層的薄膜電晶體(TFT)基板之有機電致發光顯示裝置製造方法,其特徵為:把被形成前述薄膜電晶體的前述TFT基板配置於真空蒸鍍裝置的蒸鍍室內,對向於前述TFT基板,配設1個以上收容供成膜前述有機電致發光層或電極層之用的蒸鍍材料的申請專利範圍第5項所記載的蒸發源,藉由在前述TFT基板蒸鍍前述蒸鍍材料,而形成前述有機電致發光(EL)層。 A method of manufacturing an organic electroluminescence display device for sealing a thin film transistor (TFT) substrate on which a thin film transistor, an organic electroluminescence layer, and an electrode layer sandwiching the organic electroluminescence layer are sealed by a sealing substrate In the method of manufacturing an organic electroluminescence display device, the TFT substrate on which the thin film transistor is formed is placed in a vapor deposition chamber of a vacuum vapor deposition apparatus, and one or more storage units are provided for the TFT substrate. In the evaporation source according to the fifth aspect of the invention, the vapor deposition material for the organic electroluminescence layer or the electrode layer is formed by vapor deposition of the vapor deposition material on the TFT substrate to form the organic electroluminescence ( EL) layer. 如申請專利範圍第15項之有機EL顯示裝置製造方法,其中於前述蒸鍍室內,具備對各個前述蒸發源供給前述蒸鍍材料之用的材料供給機,在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料。 The method of producing an organic EL display device according to claim 15, wherein the vapor deposition chamber includes a material supply device for supplying the vapor deposition material to each of the evaporation sources, and maintaining a vacuum state of the vapor deposition chamber. The vapor deposition material is supplied. 一種有機電致發光顯示裝置製造方法,係藉由密 封基板密封住被形成薄膜電晶體、有機電致發光層、及夾著前述有機電致發光層的電極層的薄膜電晶體(TFT)基板之有機電致發光顯示裝置製造方法,其特徵為:把被形成前述薄膜電晶體的前述TFT基板配置於真空蒸鍍裝置的蒸鍍室內,對向於前述TFT基板,配設1個以上收容供成膜前述有機電致發光層或電極層之用的蒸鍍材料的申請專利範圍第6項所記載的蒸發源,藉由在前述TFT基板蒸鍍前述蒸鍍材料,而形成前述有機電致發光(EL)層。 Method for manufacturing organic electroluminescent display device A method for manufacturing an organic electroluminescence display device in which a sealing substrate is sealed with a thin film transistor (TFT) substrate on which a thin film transistor, an organic electroluminescent layer, and an electrode layer sandwiching the organic electroluminescent layer are formed, and is characterized in that: The TFT substrate on which the thin film transistor is formed is placed in a vapor deposition chamber of a vacuum vapor deposition apparatus, and one or more of the TFT substrates are placed to accommodate the organic electroluminescent layer or the electrode layer. In the evaporation source described in the sixth aspect of the vapor deposition material, the organic electroluminescence (EL) layer is formed by vapor-depositing the vapor deposition material on the TFT substrate. 如申請專利範圍第17項之有機EL顯示裝置製造方法,其中於前述蒸鍍室內,具備對各個前述蒸發源供給前述蒸鍍材料之用的材料供給機,在維持前述蒸鍍室的真空狀態下,供給前述蒸鍍材料。 The method of producing an organic EL display device according to claim 17, wherein the vapor deposition chamber includes a material supply device for supplying the vapor deposition material to each of the evaporation sources, and maintaining a vacuum state of the vapor deposition chamber The vapor deposition material is supplied.
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