TW201405135A - Power testing circuit - Google Patents
Power testing circuit Download PDFInfo
- Publication number
- TW201405135A TW201405135A TW101128333A TW101128333A TW201405135A TW 201405135 A TW201405135 A TW 201405135A TW 101128333 A TW101128333 A TW 101128333A TW 101128333 A TW101128333 A TW 101128333A TW 201405135 A TW201405135 A TW 201405135A
- Authority
- TW
- Taiwan
- Prior art keywords
- circuit
- voltage
- power
- power test
- conductive pole
- Prior art date
Links
Landscapes
- Dc-Dc Converters (AREA)
- Electronic Switches (AREA)
Abstract
Description
本發明係關於一種功率測試電路,尤其關於一種測試電壓變換電路中開關電晶體功率的功率測試電路。The present invention relates to a power test circuit, and more particularly to a power test circuit for testing a switching transistor power in a voltage conversion circuit.
在設計電壓變換電路時,例如降壓式變換電路(Buck電路),需要對該電路中開關電晶體的功率損耗進行測試。目前通常採用的測試方法為通過外設溫度感測元件來測試開關電晶體在開啟、導通以及關斷時的發熱量來判定該開關電晶體的功率損耗。該測試方法較容易受到測試環境的影響,並不能準確地測試開關電晶體實際的功率損耗。When designing a voltage conversion circuit, such as a buck converter circuit (Buck circuit), it is necessary to test the power loss of the switching transistor in the circuit. The commonly used test method is to determine the power loss of the switching transistor by testing the heat generated by the switching transistor during turn-on, turn-on, and turn-off by the peripheral temperature sensing element. This test method is more susceptible to the test environment and does not accurately test the actual power loss of the switching transistor.
有鑑於此,提供一種一種能夠準確測試電壓變換電路中開關電晶體的功率損耗的功率測試電路。In view of the above, a power test circuit capable of accurately testing the power loss of a switching transistor in a voltage conversion circuit is provided.
一種功率測試電路,用於測試一電壓變換電路中開關電晶體的功率,該開關電晶體包括控制極、第一傳導極與第二傳導極,該控制極用於控制該第一傳導極與第二傳導極的導通與斷開,該功率測試電路包括電流檢測電路、電壓檢測電路及運算電路,該電流檢測電路用於檢測流經該第一傳導極與第二傳導極的電流,該電壓檢測電路用於檢測該第一傳導極與該第二傳導極的電壓差,該運算電路接收該電流檢測電路檢測獲得的電流與該電壓檢測電路檢測獲得的電壓差,並且將該電流與該電壓差作乘法運算並獲得表徵該開關電晶體功率的運算結果。A power test circuit for testing the power of a switching transistor in a voltage conversion circuit, the switching transistor comprising a control pole, a first conductive pole and a second conductive pole, wherein the control pole is used for controlling the first conductive pole and the first The second conductive pole is turned on and off. The power testing circuit includes a current detecting circuit, a voltage detecting circuit and an arithmetic circuit, and the current detecting circuit is configured to detect a current flowing through the first conductive pole and the second conductive pole, and the voltage detecting The circuit is configured to detect a voltage difference between the first conductive pole and the second conductive pole, and the operating circuit receives the current difference detected by the current detecting circuit and the voltage difference detected by the voltage detecting circuit, and the current is different from the voltage difference A multiplication operation is performed and an operation result characterizing the power of the switching transistor is obtained.
相較於先前技術,本發明的功率測試電路通過檢測實際流過開關電晶體的電流以及兩個傳導極之間的電壓差來獲得開關電晶體的實際功率損耗,從而更為準確地瞭解開關電晶體的工作情況,使得工程人員較為準確、方便地對電壓變換電路進行設計。Compared with the prior art, the power test circuit of the present invention obtains the actual power loss of the switching transistor by detecting the current actually flowing through the switching transistor and the voltage difference between the two conductive electrodes, thereby more accurately understanding the switching power. The working condition of the crystal enables the engineer to design the voltage conversion circuit more accurately and conveniently.
請參閱圖1,圖1描述了本發明一較佳實施方式的功率測試電路100用於檢測電壓變換電路10中開關電晶體功率的電路示意圖。Please refer to FIG. 1. FIG. 1 is a circuit diagram of a power test circuit 100 for detecting a switching transistor power in a voltage conversion circuit 10 according to a preferred embodiment of the present invention.
電壓變換電路10包括脈寬調制(Pulse Width Modulation,PWM)控制器11、驅動器12、第一開關電晶體13、第二開關電晶體14、電感15以及電容16等元件。本實施方式中,電壓變換電路10為一典型的降壓式變換電路。The voltage conversion circuit 10 includes components such as a Pulse Width Modulation (PWM) controller 11, a driver 12, a first switching transistor 13, a second switching transistor 14, an inductor 15, and a capacitor 16. In the present embodiment, the voltage conversion circuit 10 is a typical buck conversion circuit.
脈寬調制控制器11用於輸出脈寬調制訊號(PWM訊號)至該驅動器12,驅動器12依據該PWM訊號輸出兩個相位相反的脈衝訊號至該第一開關電晶體13與第二開關電晶體14,使得第一開關電晶體13與第二開關電晶體14交替導通,從而為電感15和電容16分別提供充電與放電回路。The pulse width modulation controller 11 is configured to output a pulse width modulation signal (PWM signal) to the driver 12, and the driver 12 outputs two opposite phase pulse signals to the first switching transistor 13 and the second switching transistor according to the PWM signal. 14. The first switching transistor 13 and the second switching transistor 14 are alternately turned on to provide a charging and discharging circuit for the inductor 15 and the capacitor 16, respectively.
第一開關電晶體13包括第一控制極13a、第一傳導極13b及第二傳導極13c,第一控制極13a用於接收該脈衝訊號,並且在該脈衝訊號的控制下使得第一開關電晶體13導通或者截止。本實施方式中,第一傳導極13b電性連接於電源輸入端Vcc,以接收電源電壓。第二開關電晶體14包括第二控制極14a、第三傳導極14b及第四傳導極14c,第二控制極14a也自該驅動器12接收脈衝訊號,第三傳導極14b電性連接於第二傳導極13c,第四傳導極14c接地。The first switching transistor 13 includes a first control electrode 13a, a first conductive electrode 13b and a second conductive electrode 13c. The first control electrode 13a is configured to receive the pulse signal, and the first switch is electrically controlled under the control of the pulse signal. The crystal 13 is turned on or off. In this embodiment, the first conductive pole 13b is electrically connected to the power input terminal Vcc to receive the power supply voltage. The second switching transistor 14 includes a second control electrode 14a, a third conductive electrode 14b and a fourth conductive electrode 14c. The second control electrode 14a also receives a pulse signal from the driver 12, and the third conductive electrode 14b is electrically connected to the second. The conductive pole 13c and the fourth conductive pole 14c are grounded.
功率測試電路100用於測試該電壓變換電路10的第一開關電晶體13以及第二開關電晶體14的功耗。為便於說明,本實施例中,以描述功率測試電路100對第一開關電晶體13的功率進行測試為例進行說明。The power test circuit 100 is used to test the power consumption of the first switching transistor 13 and the second switching transistor 14 of the voltage conversion circuit 10. For convenience of description, in the embodiment, the power test circuit 100 is described to test the power of the first switching transistor 13 as an example.
該功率測試電路100包括電流檢測電路110、電壓檢測電路120、運算電路130、資料轉換單元140、顯示模組150、頻率採樣控制電路160以及均值處理電路170。The power test circuit 100 includes a current detecting circuit 110, a voltage detecting circuit 120, an arithmetic circuit 130, a data conversion unit 140, a display module 150, a frequency sampling control circuit 160, and an average processing circuit 170.
該電流檢測電路110用於檢測流經該第一傳導極13b與該第二傳導極13c的電流,該電壓檢測電路120用於檢測該第一傳導極13b與該第二傳導極13c的電壓差,該運算電路130接收該電流檢測電路110檢測獲得的電流與該電壓檢測電路120檢測獲得的電壓差,並且將該電流與該電壓差作乘法運算並獲得運算結果。The current detecting circuit 110 is configured to detect a current flowing through the first conductive pole 13b and the second conductive pole 13c, and the voltage detecting circuit 120 is configured to detect a voltage difference between the first conductive pole 13b and the second conductive pole 13c. The arithmetic circuit 130 receives the current difference detected by the current detecting circuit 110 and the voltage difference detected by the voltage detecting circuit 120, and multiplies the current by the voltage difference to obtain an operation result.
具體地,該電流檢測電路110包括檢測電阻111、第一電壓獲取電路112、第一差分放大電路113,該檢測電阻111電性連接於該電源輸入端Vcc與該第一傳導極13b之間,用於檢測流經該第一開關電晶體13中第一傳導極13b與第二傳導極13c的電流,並將該電流轉換為電壓,該電壓即為該檢測電阻111兩端的電壓差。Specifically, the current detecting circuit 110 includes a detecting resistor 111, a first voltage obtaining circuit 112, and a first differential amplifying circuit 113. The detecting resistor 111 is electrically connected between the power input terminal Vcc and the first conductive pole 13b. The current flowing through the first conductive electrode 13b and the second conductive electrode 13c in the first switching transistor 13 is detected, and the current is converted into a voltage, which is the voltage difference across the detecting resistor 111.
第一電壓獲取電路112與該檢測電阻111並聯,以獲取該檢測電阻111兩端的電壓差。一實施方式中,該第一電壓獲取電路112可以採用一電阻或者電容來實現。The first voltage obtaining circuit 112 is connected in parallel with the detecting resistor 111 to obtain a voltage difference across the detecting resistor 111. In an embodiment, the first voltage obtaining circuit 112 can be implemented by using a resistor or a capacitor.
第一差分放大電路113用於對該檢測電阻111兩端的電壓差進行放大。優選地,第一差分放大電路113對該檢測電阻111的電壓放大的倍數與檢測電阻111的電阻值的乘積為一,以使得經該第一差分放大電路113放大後的該檢測電阻111的電壓差值與流經該第一開關電晶體13的電流值實際相等,並作為電流檢測電路110檢測獲得的電流輸出至該運算電路130。The first differential amplifying circuit 113 is for amplifying the voltage difference across the detecting resistor 111. Preferably, the first differential amplifier circuit 113 multiplies the product of the voltage amplification of the detecting resistor 111 by the resistance value of the detecting resistor 111 by one, so that the voltage of the detecting resistor 111 amplified by the first differential amplifying circuit 113 is obtained. The difference is substantially equal to the current value flowing through the first switching transistor 13, and the current obtained as the current detecting circuit 110 detects is output to the arithmetic circuit 130.
該電壓檢測電路120包括第二電壓獲取電路122與第二差分放大電路123,該第二電壓獲取電路122並聯於該第一傳導極13b與第二傳導極13c之間,用於獲取該第一傳導極13b與該第二傳導極13c的電壓差。第二差分放大電路123用於對該電壓差進行放大處理。The voltage detecting circuit 120 includes a second voltage obtaining circuit 122 and a second differential amplifying circuit 123. The second voltage obtaining circuit 122 is connected in parallel between the first conductive pole 13b and the second conductive pole 13c for acquiring the first The voltage difference between the conductive pole 13b and the second conductive pole 13c. The second differential amplifying circuit 123 is for amplifying the voltage difference.
優選地,該運算電路130還依據該第二差分放大電路123的放大倍數對該運算結果作除法運算,以獲得該第一開關電晶體13的實際功率值。Preferably, the operation circuit 130 further divides the operation result according to the amplification factor of the second differential amplification circuit 123 to obtain the actual power value of the first switching transistor 13.
該資料轉換單元140用於對該運算電路130經運算後的運算結果進行數位化轉換,將該運算結果轉化為數位訊號。該顯示模組150用於顯示該運算結果。一實施例中,該資料轉換單元140可以採用包括類比/數位轉換電路(A/D轉換電路)的電路單元來實現,顯示模組150可以採用液晶顯示器或者其他顯示器來實現。The data conversion unit 140 is configured to digitally convert the calculated operation result of the operation circuit 130, and convert the calculation result into a digital signal. The display module 150 is configured to display the operation result. In an embodiment, the data conversion unit 140 can be implemented by using a circuit unit including an analog/digital conversion circuit (A/D conversion circuit), and the display module 150 can be implemented by using a liquid crystal display or other display.
頻率採樣電路160自該脈寬調制控制器11接收該PWM訊號,並且依據該PWM訊號對應輸出一控制訊號,以控制該資料轉換單元140開始對運算電路130的運算結果進行數位化轉換。The frequency sampling circuit 160 receives the PWM signal from the pulse width modulation controller 11 and outputs a control signal according to the PWM signal to control the data conversion unit 140 to start digital conversion of the operation result of the operation circuit 130.
均值處理電路用於對一預定時間段內的複數經數位化處理的該運算結果作平均處理,從而獲得該預定時間段內的第一開關電晶體13的平均功率,以使得該功率測試電路100的檢測更為準確。該預定時間可以預先進行設定,例如1分鐘。The averaging processing circuit is configured to average the operation result of the plurality of digitized processes in a predetermined time period, thereby obtaining an average power of the first switching transistor 13 in the predetermined time period, so that the power test circuit 100 The detection is more accurate. The predetermined time can be set in advance, for example, 1 minute.
應當可以理解,對第二開關電晶體14的功率進行測試的電路與功率測試電路100的原理與結構基本相同,即是將電流檢測電路110中的檢測電阻111電性連接於該第四傳導極14c與地之間,從而測試流經第二開關電晶體14的電流,電壓檢測電路120並聯於第三傳導極14b與第四傳導極14c,從而檢測獲得第三傳導極14b與第四傳導極14c的電壓差,進而通過運算電路130、資料轉換單元140獲得第二開關電晶體14在自開啟到關斷整個過程的平均功率損耗。It should be understood that the circuit for testing the power of the second switching transistor 14 is substantially the same as the principle and structure of the power testing circuit 100, that is, the detecting resistor 111 in the current detecting circuit 110 is electrically connected to the fourth conducting pole. 14c and ground, thereby testing the current flowing through the second switching transistor 14, the voltage detecting circuit 120 is connected in parallel to the third conducting pole 14b and the fourth conducting pole 14c, thereby detecting the third conducting pole 14b and the fourth conducting pole The voltage difference of 14c, and further the average power loss of the second switching transistor 14 from the turn-on to the turn-off process is obtained by the arithmetic circuit 130 and the data conversion unit 140.
相較於先前技術,本發明的功率測試電路100藉由檢測實際流過開關電晶體13、14的電流以及二傳導極之間的電壓差來獲得開關電晶體的實際功率損耗,從而更為準確地瞭解開關電晶體13、14的工作情況,使得工程人員能夠更為準確、方便地對電壓變換電路進行設計。Compared with the prior art, the power test circuit 100 of the present invention obtains the actual power loss of the switching transistor by detecting the current actually flowing through the switching transistors 13, 14 and the voltage difference between the two conductive electrodes, thereby being more accurate. Knowing the operation of the switching transistors 13, 14 allows the engineer to design the voltage conversion circuit more accurately and conveniently.
當然,本發明並不局限於上述公開的實施例,本發明還可以是對上述實施例進行各種變更。本技術領域人員可以理解,只要在本發明的實質精神範圍之內,對以上實施例所作的適當改變和變化都落在本發明要求保護的範圍之內。Of course, the present invention is not limited to the above-disclosed embodiments, and the present invention may be variously modified in the above embodiments. Those skilled in the art will appreciate that appropriate changes and modifications of the above embodiments are within the scope of the invention as claimed.
10...電壓變換電路10. . . Voltage conversion circuit
11...脈寬調制控制器11. . . Pulse width modulation controller
12...驅動器12. . . driver
13...第一開關電晶體13. . . First switching transistor
13a...第一控制極13a. . . First control pole
13b...第一傳導極13b. . . First conductivity
13c...第二傳導極13c. . . Second conduction pole
14...第二開關電晶體14. . . Second switching transistor
14a...第二控制極14a. . . Second control pole
14b...第三傳導極14b. . . Third conduction pole
14c...第四傳導極14c. . . Fourth conduction pole
15...電感15. . . inductance
16...電容16. . . capacitance
100...功率測試電路100. . . Power test circuit
110...電流檢測電路110. . . Current detection circuit
111...檢測電阻111. . . Sense resistor
112...第一電壓獲取電路112. . . First voltage acquisition circuit
113...第一差分放大電路113. . . First differential amplifying circuit
120...電壓檢測電路120. . . Voltage detection circuit
122...第二電壓獲取電路122. . . Second voltage acquisition circuit
123...第二差分放大電路123. . . Second differential amplifying circuit
130...運算電路130. . . Operation circuit
140...資料轉換單元140. . . Data conversion unit
150...顯示模組150. . . Display module
160...頻率採樣控制電路160. . . Frequency sampling control circuit
170...均值處理電路170. . . Mean processing circuit
Vcc...電源輸入端Vcc. . . Power input
圖1是本發明功率測試電路及所測試的電壓變換電路的方框示意圖。1 is a block schematic diagram of a power test circuit and a voltage conversion circuit tested according to the present invention.
10...電壓變換電路10. . . Voltage conversion circuit
11...脈寬調制控制器11. . . Pulse width modulation controller
12...驅動器12. . . driver
13...第一開關電晶體13. . . First switching transistor
13a...第一控制極13a. . . First control pole
13b...第一傳導極13b. . . First conductivity
13c...第二傳導極13c. . . Second conduction pole
14...第二開關電晶體14. . . Second switching transistor
14a...第二控制極14a. . . Second control pole
14b...第三傳導極14b. . . Third conduction pole
14c...第四傳導極14c. . . Fourth conduction pole
15...電感15. . . inductance
16...電容16. . . capacitance
100...功率測試電路100. . . Power test circuit
110...電流檢測電路110. . . Current detection circuit
111...檢測電阻111. . . Sense resistor
112...第一電壓獲取電路112. . . First voltage acquisition circuit
113...第一差分放大電路113. . . First differential amplifying circuit
120...電壓檢測電路120. . . Voltage detection circuit
122...第二電壓獲取電路122. . . Second voltage acquisition circuit
123...第二差分放大電路123. . . Second differential amplifying circuit
130...運算電路130. . . Operation circuit
140...資料轉換單元140. . . Data conversion unit
150...顯示模組150. . . Display module
160...頻率採樣控制電路160. . . Frequency sampling control circuit
170...均值處理電路170. . . Mean processing circuit
Vcc...電源輸入端Vcc. . . Power input
Claims (10)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201210267149.7A CN103575977A (en) | 2012-07-31 | 2012-07-31 | Power test circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201405135A true TW201405135A (en) | 2014-02-01 |
Family
ID=50048184
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101128333A TW201405135A (en) | 2012-07-31 | 2012-08-06 | Power testing circuit |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN103575977A (en) |
TW (1) | TW201405135A (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112630525B (en) * | 2020-11-30 | 2024-01-30 | 国网重庆市电力公司营销服务中心 | Power measurement method and device, PCB circuit structure and storage medium |
CN114034924B (en) * | 2021-09-29 | 2023-11-03 | 重庆康佳光电科技有限公司 | Control signal power measurement apparatus, system, method, and readable storage medium |
-
2012
- 2012-07-31 CN CN201210267149.7A patent/CN103575977A/en active Pending
- 2012-08-06 TW TW101128333A patent/TW201405135A/en unknown
Also Published As
Publication number | Publication date |
---|---|
CN103575977A (en) | 2014-02-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7511472B1 (en) | Power measuring apparatus | |
WO2015045267A1 (en) | Sensor signal detection device | |
JP2014220984A5 (en) | ||
WO2015039002A4 (en) | Systems and methods for detection of load impedance of a transducer device coupled to an audio device | |
TW201405135A (en) | Power testing circuit | |
RU2016129889A (en) | DETECTION OF THE TEST STRIP OF THE CONTROL AND MEASURING DEVICE FOR MEASUREMENT OF ANALYTES | |
CN108631686B (en) | Brushless direct current motor control system and bus voltage detection method and device thereof | |
US20230349960A1 (en) | Conductivity measurement device | |
JP2015137989A (en) | Signal switching circuit and impedance measurement device | |
JP5512368B2 (en) | Inspection apparatus and inspection method | |
TW201624662A (en) | Semiconductor device and AC resistance measuring system including the same | |
JP6345479B2 (en) | Power supply inspection apparatus and power supply inspection method | |
JP2017096733A (en) | Measurement device and measurement method | |
CN214041597U (en) | Power-on and power-off test system | |
KR101588963B1 (en) | Life tester | |
CN210865578U (en) | Power consumption detection circuit of display panel | |
JP5172724B2 (en) | Surge test equipment | |
JP6829432B2 (en) | Solar cell characteristic measuring device and solar cell characteristic measuring method | |
KR20160071480A (en) | Method and apparatus for measuring current of motor | |
TWI778745B (en) | Capacitance measuring system, measuring circuit and calculation device | |
JP5558251B2 (en) | Integration circuit and voltage detection device | |
JP6921279B1 (en) | Power converter | |
JP7163174B2 (en) | Contact resistance measuring device | |
KR102710006B1 (en) | Impedance measuring apparatus | |
JP2008306679A (en) | Electrostatic capacity variation detecting circuit |