TW201334054A - The method of single-side smooth etching of a silicon substrate - Google Patents

The method of single-side smooth etching of a silicon substrate Download PDF

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TW201334054A
TW201334054A TW101147380A TW101147380A TW201334054A TW 201334054 A TW201334054 A TW 201334054A TW 101147380 A TW101147380 A TW 101147380A TW 101147380 A TW101147380 A TW 101147380A TW 201334054 A TW201334054 A TW 201334054A
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substrate
layer
solar cell
germanium substrate
etching
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Katrin Weise
Cornelia Klein
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Rena Gmbh
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • H01L31/1804Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic System
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

Abstract

Method for smoothing a silicon substrate (50) by etching (16) on one side, wherein a protective layer (54; 56) is formed (12; 24) at least on a first side of the silicon substrate, then a second side of the silicon substrate (50) is smoothed by etching (16) by means of an alkaline etching solution having a temperature in the range of between 50 DEG C and 90 DEG C, and, during this process of smoothing by etching (16), those regions of the silicon substrate (50) on which the protective layer (54; 56) has been formed are protected against action of the etching solution by means of the protective layer (54; 56).

Description

矽基板的單面平坦化蝕刻方法 Single-sided planarization etching method of germanium substrate

本發明係有關於一種矽基板的單面平坦化蝕刻方法。 The present invention relates to a one-sided planarization etching method for a tantalum substrate.

特別是當今各種太陽能電池的製造,要求作為太陽能電池基板使用之矽基板之一儘可能之平滑的背面。於此背面理解為太陽能電池基板亦或矽基板之大面積之面,且其係設以通常於太陽能電池運作時遠離入射光。儘可能地平滑之背面使在矽基板亦或太陽能電池基板之背面所產生的電荷載體重組的下降。與具有非平滑的背面的太陽能電池相比,經過鈍化處理背面之表面狀態能夠增加效能達1%。特別是太陽能電池基板經過紋理平坦化之背面能夠產生顯著地效能提升。 In particular, the manufacture of various solar cells today requires a smooth back surface which is one of the substrates used as a solar cell substrate. The back side is understood to be the surface of the solar cell substrate or the large area of the substrate, and is designed to be remote from the incident light when the solar cell is in operation. The smoothed back side reduces the recombination of charge carriers generated on the tantalum substrate or the back side of the solar cell substrate. The passivated surface condition of the back side can increase the efficiency by up to 1% compared to a solar cell having a non-smooth back side. In particular, the back side of the solar cell substrate that has been textured and flattened can produce significant performance improvements.

迄今矽基板的背面係藉由酸性拋光蝕刻液平坦化蝕刻。然而各種太陽能電池製造方法,依據經驗顯示,使用酸性拋光蝕刻液會產生不良或不必要的副作用。特別是從而導致背面藉由酸性拋光蝕刻液之一蝕刻過程可能侵 蝕太陽能電池基板之其他範圍。依據經驗顯示,經過發射極摻雜的範圍會嚴重受損。因此,酸性拋光蝕刻液在許多情形只能在形成發射極摻雜前被使用。其並非適用於所有太陽能電池製程。 Up to now, the back side of the substrate has been planarized by an acid polishing etch liquid. However, various solar cell manufacturing methods have empirically shown that the use of an acidic polishing etchant can cause undesirable or unnecessary side effects. In particular, the back side may be invaded by an etching process of an acid polishing etchant. Other ranges of etched solar cell substrates. Experience has shown that the range of emitter doping can be severely impaired. Therefore, the acid polishing etchant can only be used in many cases before forming the emitter doping. It is not suitable for all solar cell processes.

有鑑於此,為克服上述習用技藝之各種問題,本發明主要目的在提供可彈性應用之一種矽基板的單面平坦化蝕刻方法。 In view of the above, in order to overcome various problems of the above-described conventional techniques, the main object of the present invention is to provide a single-sided planarization etching method for a tantalum substrate which can be elastically applied.

本發明之目的可藉由如本發明申請專利範圍第1項所述之權利要求及特徵來達成。 The object of the present invention can be achieved by the claims and features as set forth in claim 1 of the present invention.

更多較佳的實施例分別係本發明附屬各項申請專利範圍之標的。 The more preferred embodiments are the subject matter of the respective patent applications of the present invention.

根據本發明之一種矽基板的單面平坦化蝕刻方法包括有,至少形成一保護層於矽基板之第一面上。接著藉由一鹼性蝕刻液而平坦化蝕刻矽基板之一第二面,鹼性蝕刻液具有介於50℃~90℃之一溫度。於平坦化蝕刻過程中,在矽基板已形成保護層的範圍藉由保護層來抵抗蝕刻液之作用而被保護。 A single-sided planarization etching method for a germanium substrate according to the present invention includes forming at least one protective layer on a first side of a germanium substrate. Then, one of the second faces of the ruthenium substrate is planarized by an alkaline etch solution having a temperature between 50 ° C and 90 ° C. In the planarization etching process, the protective layer is protected by the protective layer in the range in which the protective layer has been formed.

根據本發明之平坦化蝕刻係指矽基板之表面至少一部份平坦化。換句話說,平坦化蝕刻係指矽基板之表面至少一部份平整。 The planarization etching according to the present invention means that at least a portion of the surface of the germanium substrate is planarized. In other words, the planarization etch refers to at least a portion of the surface of the germanium substrate being flat.

由此,鹼性蝕刻液較高的溫度能實現鹼性蝕刻液的一等向蝕刻特性,其使能夠平坦化蝕刻矽基板之第二 面。矽基板之第一面能夠例如藉由一矽酸鹽玻璃層或一氮化矽層避免受到低費用的鹼性蝕刻液之作用被保護。此外,依據經驗顯示,藉由本發明之方法平坦化蝕刻所述之第二面而成本低於使用一酸性蝕刻液。上述鹼性蝕刻液之優點來自於低化學成本,並且相對於酸性拋光蝕刻液使用壽命也比較長。 Thus, the higher temperature of the alkaline etchant can achieve an isotropic etch characteristic of the alkaline etchant, which enables the second of the etched ruthenium substrate to be planarized. surface. The first side of the ruthenium substrate can be protected from the action of a low cost alkaline etchant, for example by a bismuth silicate glass layer or a tantalum nitride layer. Furthermore, it has been empirically shown that planarizing the second side by etching by the method of the present invention is less costly than using an acidic etchant. The advantages of the above alkaline etching solution come from low chemical cost and long service life with respect to the acid polishing etchant.

至於鹼性蝕刻液,氫氧化鈉(NaOH)水溶液或氫氧化鉀(KOH)水溶液經實驗證實合適。 As for the alkaline etching solution, an aqueous solution of sodium hydroxide (NaOH) or an aqueous solution of potassium hydroxide (KOH) has been experimentally confirmed to be suitable.

較佳地,第一面位於第二面之對面。特別是更佳為,太陽能電池基板之第一面係指一正面以及太陽能電池基板之第二面係指一背面。上述太陽能電池基板之背面係指於太陽能電池運作時設以遠離入射光之面。反之,太陽能電池基板的正面係指於太陽能電池作業時設以對準入射光之面。 Preferably, the first side is located opposite the second side. More preferably, the first side of the solar cell substrate refers to a front side and the second side of the solar cell substrate refers to a back side. The back surface of the solar cell substrate refers to a surface that is disposed away from incident light when the solar cell is in operation. Conversely, the front side of the solar cell substrate refers to the surface on which the incident light is placed when the solar cell is in operation.

為達成矽基板之背面的平坦化蝕刻,矽基板係部份地或完全地被浸入於蝕刻液中。尤其是平坦化蝕刻能夠藉由單面蝕刻來實現,例如安排只有矽基板的背面係為蝕刻液所浸潤,且矽基板之正面高於蝕刻液的水位。多數矽基板能夠被堆疊式或持續地被平坦化蝕刻。因此本方法不但能與堆疊式作業設備且能與自動化生產線相容。 In order to achieve planarization etching of the back surface of the germanium substrate, the germanium substrate is partially or completely immersed in the etching liquid. In particular, the planarization etching can be achieved by single-sided etching, for example, the back surface of the germanium substrate is arranged to be infiltrated by the etching liquid, and the front surface of the germanium substrate is higher than the water level of the etching liquid. Most germanium substrates can be planarly or continuously planarized. Therefore, the method can be compatible not only with stacked work equipment but also with automated production lines.

較佳地,一矽酸鹽玻璃層或一氮化矽層係形成作為保護層。利用此方式,保護層能夠藉由現有太陽能電池製造技術來實現。特別是經實驗證明磷矽酸鹽玻璃層與硼矽酸鹽玻璃層可作為保護層。 Preferably, a tantalate glass layer or a tantalum nitride layer is formed as a protective layer. In this way, the protective layer can be realized by existing solar cell manufacturing techniques. In particular, it has been experimentally confirmed that a phosphonate glass layer and a borosilicate glass layer can be used as a protective layer.

根據本發明之一變化態樣,太陽能電池基板係單面拋光蝕刻,並且於發射極擴散之過程中形成一含摻雜物的矽酸鹽玻璃層作為保護層。利用此方式,保護層能夠在一種對於太陽能電池製造不可缺少的發射極擴散步驟之過程中而低成本製造。特別是經實驗證明一磷矽酸鹽玻璃層或一硼矽酸鹽玻璃層可作為含摻雜物的矽酸鹽玻璃層。 According to a variant of the invention, the solar cell substrate is single-sided polished and etched, and a dopant-containing tellurite glass layer is formed as a protective layer during the diffusion of the emitter. In this way, the protective layer can be manufactured at low cost during an emitter diffusion step that is indispensable for solar cell fabrication. In particular, it has been experimentally proven that a monophosphoric acid glass layer or a borosilicate glass layer can be used as a dopant-containing tellurite glass layer.

發射極擴散實質上能利用任何現有方式來實現,在此能使用單面或多面發射極擴散之方法。尤其是一管擴散經實驗證實有效。在發射極擴散之過程,例如倘若係利用管擴散時,在矽基板之第二面上形成含摻雜物的矽酸鹽玻璃層,因此含摻雜物的矽酸鹽玻璃層較佳為於平坦化蝕刻前被移除。在此例如能夠藉由現有單面蝕刻之方法來實現,特別是利用低濃度氫氟酸溶液。較佳地,矽基板之第二面上含摻雜物的矽酸鹽玻璃層在一邊緣分離步驟之過程時移除。利用此包括一邊緣分離之方式相對於太陽能電池製造方法,不需要額外的邊緣分離步驟。一製程步驟通常稱為邊緣分離步驟,其中,於矽基板之第二面上的表面從發射極摻雜被電性絕緣。為此目的,例如矽基板之第二面的發射極摻雜被蝕刻移除,以便於蝕刻之過程中含摻雜物的矽酸鹽玻璃層能以低成本自矽基板之第二面移除。 The emitter diffusion can be substantially achieved by any existing means, where a single-sided or multi-sided emitter diffusion method can be used. In particular, a tube diffusion has been experimentally proven to be effective. In the process of emitter diffusion, for example, if a dopant-containing tellurite glass layer is formed on the second side of the germanium substrate by diffusion of the tube, the dopant-containing tellurite glass layer is preferably It is removed before planarization etching. In this case, for example, it can be achieved by a conventional one-sided etching method, in particular using a low-concentration hydrofluoric acid solution. Preferably, the dopant-containing tellurite glass layer on the second side of the germanium substrate is removed during the edge separation step. With this method including edge separation, an additional edge separation step is not required with respect to the solar cell manufacturing method. A process step is generally referred to as an edge separation step in which the surface on the second side of the germanium substrate is electrically insulated from the emitter doping. For this purpose, for example, the emitter doping of the second side of the germanium substrate is etched away so that the dopant-containing tellurite glass layer can be removed from the second side of the germanium substrate at low cost during etching. .

較佳地,在發射極擴散之過程所形成的含摻雜物的矽酸鹽玻璃層通過於矽基板之第二面之濕式化學蝕刻被移除。特別是更佳為,為此目的,可藉由第一種類之一矽酸鹽玻璃蝕刻液,包括水,10 g/l至50/l之氫氟酸,200 g/l 至1000 g/l之硫酸及/或250 g/l至500 g/l之硝酸。利用此方式必要時能夠藉由第一種類之矽酸鹽玻璃蝕刻液同時移除矽基板之第二面之發射極摻雜。在此亦可能矽基板之第二面的含摻雜物的矽酸鹽玻璃層之移除的一結合亦能夠藉由邊緣分離達成。 Preferably, the dopant-containing tellurite glass layer formed during the diffusion of the emitter is removed by wet chemical etching of the second side of the germanium substrate. More preferably, for this purpose, one of the first types of citrate glass etchants, including water, 10 g/l to 50/l hydrofluoric acid, 200 g/l To 1000 g/l of sulfuric acid and/or 250 g/l to 500 g/l of nitric acid. In this way, the emitter doping of the second side of the germanium substrate can be simultaneously removed by the first type of tellurite glass etching solution if necessary. It is also possible here that a combination of the removal of the dopant-containing tellurite glass layer on the second side of the substrate can also be achieved by edge separation.

較佳地,於矽基板之第二面之平坦化蝕刻後,於矽基板之第一面上所形成的含摻雜物的矽酸鹽玻璃層可藉由第二種類之一矽酸鹽玻璃蝕刻液移除,並且矽基板之第二面係藉由第二種類之矽酸鹽玻璃蝕刻液過度蝕刻。利用此方式,於平坦化蝕刻後,能於矽基板之第二面上所可能殘留之結構進一步被平坦化處理。殘留邊緣能夠被磨平。經實驗證實,含有氫氟酸與硝酸之一種水溶液可作為第二種類的矽酸鹽玻璃蝕刻液。 Preferably, after the planarization etching on the second side of the germanium substrate, the dopant-containing tellurite glass layer formed on the first side of the germanium substrate can be made of a second type of tellurite glass. The etchant is removed and the second side of the germanium substrate is overetched by a second type of tellurite glass etchant. In this manner, after planarization etching, the structure that may remain on the second surface of the germanium substrate is further planarized. The residual edges can be smoothed. It has been experimentally confirmed that an aqueous solution containing hydrofluoric acid and nitric acid can be used as the second type of tellurite glass etching solution.

根據本發明另一變化態樣,由此一太陽能電池基板被單面平坦化蝕刻,一氮化矽層係於矽基板之第一面上形成作為保護層。氮化矽層進一步於矽基板上保留作為抗反射層。這樣的變化態樣係提供另一種可選擇的以較低成本形成保護層的可能性,因為於眾多的太陽能電池製程上氮化矽層之形成係設置作為抗反射層。 According to another aspect of the present invention, a solar cell substrate is planarized by single-sided etching, and a tantalum nitride layer is formed on the first surface of the tantalum substrate as a protective layer. The tantalum nitride layer is further retained as an antireflection layer on the tantalum substrate. Such a variation provides another option for forming a protective layer at a lower cost because the formation of a tantalum nitride layer on a plurality of solar cell processes is provided as an anti-reflective layer.

一太陽能電池之製造包括一發射極之形成。較佳地,在氮化矽層形成前,實行一發射極擴散而且在此於矽基板上形成一含摻雜物的矽酸鹽玻璃層。在形成氮化矽層前,含摻雜物的矽酸鹽玻璃層係被完全移除。利用此方式,設以作為保護層之氮化矽層保留在矽基板上作為抗反 射層。含摻雜物的矽酸鹽玻璃層較佳地係濕式化學移除,例如藉由第二種類之矽酸鹽玻璃蝕刻液。一種可能的邊緣分離,如利用上述第一種類的矽酸鹽玻璃蝕刻液的邊緣分離,較佳地也是於氮化矽層形成前實行。 The fabrication of a solar cell includes the formation of an emitter. Preferably, before the formation of the tantalum nitride layer, an emitter diffusion is performed and a dopant-containing tellurite glass layer is formed on the germanium substrate. The dopant-containing tellurite glass layer is completely removed prior to forming the tantalum nitride layer. In this way, the tantalum nitride layer as a protective layer is left on the germanium substrate as an anti-reverse Shot layer. The dopant-containing tellurite glass layer is preferably wet chemically removed, such as by a second type of tellurite glass etchant. One possible edge separation, such as edge separation using the first type of tellurite glass etchant described above, is preferably also performed prior to the formation of the tantalum nitride layer.

一種變化態樣提供,在形成保護層前,矽基板至少部份具有一表面紋理。利用此方式,於太陽能電池基板之例子中,例如能夠將光線耦合進入太陽能電池基板內,從而增加加工後之太陽能電池的效能。表面紋理較佳地於矽基板之第一面以及第二面上被形成。在矽基板之第二面上表面紋理所形成之組成部分然後於接下來的平坦化蝕刻被平坦化。表面紋理較佳為藉由濕式化學紋理蝕刻被形成。 A variation provides that the germanium substrate has at least a portion of a surface texture prior to forming the protective layer. In this way, in the example of a solar cell substrate, for example, light can be coupled into the solar cell substrate, thereby increasing the efficiency of the processed solar cell. The surface texture is preferably formed on the first side and the second side of the tantalum substrate. The component formed by the surface texture on the second side of the ruthenium substrate is then planarized by the subsequent planarization etch. The surface texture is preferably formed by wet chemical texturing.

較佳地,矽基板之第二面係藉由一氫氧化鉀水溶液被平坦化蝕刻。經實驗證明,特別是具有氫氧化鉀濃度10至30重量百分比之之一氫氧化鉀水溶液。 Preferably, the second side of the ruthenium substrate is planarized by an aqueous solution of potassium hydroxide. It has been experimentally confirmed that, in particular, an aqueous potassium hydroxide solution having a potassium hydroxide concentration of 10 to 30% by weight.

較佳地,矽基板之第二面藉由一鹼性蝕刻液被平坦化蝕刻,其具有介於70℃~85℃之一溫度。所述之溫度範圍經實驗證明特別有效。 Preferably, the second side of the germanium substrate is planarized by an alkaline etching solution having a temperature between 70 ° C and 85 ° C. The stated temperature range has proven to be particularly effective.

此外,經實驗證明,第二面可於10至300秒被平坦化蝕刻,較佳為30秒至300秒。 Further, it has been experimentally confirmed that the second side can be planarized and etched at 10 to 300 seconds, preferably 30 seconds to 300 seconds.

結果表明,本發明方法可以被應用於生產具有鈍化的背面之太陽能電池或具有經鈍化的發射極與鈍化背面之太陽能電池,即所謂的PERC((Passivated Emitter and Rear Cell)型-電池。於鈍化的發射極係以理解在發射極範圍 內具有電氣的鈍化表面狀態,於鈍化的背面係指在太陽能電池的背面上具有鈍化的表面狀態。 The results show that the method of the invention can be applied to the production of solar cells with passivated backside or solar cells with passivated emitters and passivated backside, so-called PERC (Passivated Emitter and Rear Cell) type batteries. Emitter system to understand the range of emitters There is an electrically inactive surface state inside, and the passivated back side refers to a surface state having a passivation on the back side of the solar cell.

為使能對本創作作更進一步的認識與了解,茲舉實施例配合圖示,進一步詳細說明如下:在此凡是相同作用的元件係以相同的元件符號來表示。然而,本發明可具有各種不同的實施方式而非侷限於在此示出的實施例以及所述的功能特徵。迄今的說明以及下述的圖示說明具有多數的在附屬請求項部份被納入多數特徵。然而,這些特徵以及其他所有上述與下述的圖示說明所揭露的特徵是熟悉本技術領域者也能單獨參考及進一步組合者。尤其是這些特徵能夠分別或適當地組合附屬項所述的方法來達成。 In order to enable a further understanding and understanding of the present invention, the embodiments are described in detail with reference to the accompanying drawings, wherein the same elements are designated by the same reference numerals. However, the invention may be embodied in a variety of different embodiments and is not limited to the embodiments shown and described. The description so far and the following illustrations have a majority of the features included in the subsidiary claims section. However, these features, as well as all of the features described above and in the following description, are those of ordinary skill in the art that can be individually referenced and further combined. In particular, these features can be achieved separately or in combination with the methods described in the dependent items.

10‧‧‧紋理蝕刻太陽能電池矽基板 10‧‧‧Texture etched solar cell 矽 substrate

12‧‧‧管發射極擴散帶有含摻雜物的矽酸鹽玻璃層之形成 12‧‧‧ Tube emitter diffusion with the formation of a tantalum-containing glass layer containing dopants

14‧‧‧移除背面之含摻雜物的矽酸鹽玻璃層 14‧‧‧Remove the doped tellurite glass layer on the back side

16‧‧‧在具有介於70℃至85℃之溫度的氫氧化鉀溶液中平坦化蝕刻背面 16‧‧‧ planarizing the back side in a potassium hydroxide solution having a temperature between 70 ° C and 85 ° C

18‧‧‧移除含摻雜物的矽酸鹽玻璃層的殘留物質以及過度蝕刻背面 18‧‧‧Remove residual material from the doped tellurite glass layer and overetch the back

20‧‧‧濕式化學邊緣分離 20‧‧‧ Wet chemical edge separation

22‧‧‧含摻雜物的矽酸鹽玻璃層之完全移除 22‧‧‧ Complete removal of the doped tellurite glass layer

24‧‧‧沉積氮化矽層於正面上 24‧‧‧ deposited tantalum nitride layer on the front side

50‧‧‧太陽能電池矽基板 50‧‧‧Solid battery substrate

51‧‧‧表面紋理 51‧‧‧ surface texture

52‧‧‧發射極摻雜 52‧‧‧ emitter doping

54‧‧‧含摻雜物的矽酸鹽玻璃層 54‧‧‧Doped tellurite glass layer

56‧‧‧氮化矽層 56‧‧‧layer of tantalum nitride

圖1:係表示本發明之方法的第一實施例之示意圖 Figure 1 is a schematic view showing a first embodiment of the method of the present invention

圖2:係表示本發明之方法的第二實施例之示意圖 Figure 2 is a schematic view showing a second embodiment of the method of the present invention

圖3:係表示本發明如圖1所示方法之太陽能電池基板各項製程步驟示意圖 FIG. 3 is a schematic view showing various process steps of the solar cell substrate of the method shown in FIG. 1 of the present invention;

圖4:係表示本發明如圖2所示方法之太陽能電池基板各項製程步驟示意圖 4 is a schematic view showing various process steps of the solar cell substrate of the method shown in FIG. 2 of the present invention;

圖1及圖3係說明本發明之方法的第一實施例 之示意圖。在本實施例中,首先,一太陽能電池矽基板50係紋理蝕刻10。在此,如圖3所示朝向上方之太陽能電池矽基板50之一正面同樣地具有如同圖3所示朝向下方之太陽能電池矽基板50之一背面的表面紋理51。此外,太陽能電池矽基板的其餘表面範圍亦具有表面紋理51。為了更易明瞭,在圖3及圖4之示意圖中在太陽能電池矽基板50之邊緣避開表面紋理51之示意。太陽能電池矽基板50之制絨蝕刻10較佳地藉由一濕式化學紋理蝕刻液來實行。 1 and 3 illustrate a first embodiment of the method of the present invention Schematic diagram. In the present embodiment, first, a solar cell 矽 substrate 50 is textured etched 10. Here, as shown in FIG. 3, the front surface of one of the solar cell stack substrates 50 facing upward has the surface texture 51 of the back surface of one of the solar cell stack substrates 50 facing downward as shown in FIG. In addition, the remaining surface area of the solar cell 矽 substrate also has a surface texture 51. For the sake of clarity, the schematic illustration of the surface texture 51 is avoided at the edge of the solar cell raft substrate 50 in the schematic views of FIGS. 3 and 4. The texturing etch 10 of the solar cell raft substrate 50 is preferably carried out by a wet chemical texture etchant.

接著,進行管發射極擴散12。在此係指一種管擴散,以係形成一發射極摻雜52,其如圖3所示係以一虛線而示意地表示。在管發射極擴散之過程形成含摻雜物的矽酸鹽玻璃層54。在此,較佳為磷矽酸鹽玻璃層或硼矽酸鹽玻璃層。 Next, tube emitter diffusion 12 is performed. By this is meant a tube diffusion to form an emitter doping 52, which is schematically represented by a dashed line as shown in FIG. A dopant-containing tellurite glass layer 54 is formed during the diffusion of the emitter of the tube. Here, a phosphonate glass layer or a borosilicate glass layer is preferred.

於後續方法步驟中,太陽能電池矽基板50之背面的含摻雜物的矽酸鹽玻璃層54係移除14。舉例來說,能夠藉由第二種類之一矽酸鹽玻璃蝕刻液而實行。在其餘區域中含摻雜物的矽酸鹽玻璃層54係留在太陽能電池矽基板50上並且作為保護層抵抗隨後之一平坦化蝕刻16。 In a subsequent method step, the dopant-containing tellurite glass layer 54 on the back side of the solar cell germanium substrate 50 is removed 14. For example, it can be carried out by using a bismuth silicate glass etching solution of the second type. The dopant-containing tellurite glass layer 54 in the remaining regions remains on the solar cell germanium substrate 50 and acts as a protective layer against the subsequent planarization etch 16.

所述之平坦化蝕刻16係於一氧化鉀水溶液實行,其溫度介於70℃至85℃。為了平坦化蝕刻16之目的,可將太陽能電池矽基板50完全浸入於氫氧化鉀水溶液中。於平坦化蝕刻16過程中,太陽能電池矽基板50之背面上的表面紋理51可經由上述所給定溫度的氫氧化鉀溶液等向蝕刻作用被平坦化。除了太陽能電池矽基板50之背面外,太 陽能電池矽基板50反而係透過含摻雜物的矽酸鹽玻璃層54抵抗氫氧化鉀溶液的作用而被保護,使得能夠保留表面紋理51。 The planarization etch 16 is carried out in an aqueous solution of potassium monoxide at a temperature between 70 ° C and 85 ° C. For the purpose of planarizing the etch 16, the solar cell ruthenium substrate 50 can be completely immersed in an aqueous potassium hydroxide solution. During the planarization etching 16, the surface texture 51 on the back surface of the solar cell substrate 50 can be planarized by etching action via the potassium hydroxide solution or the like at a given temperature. Except for the back side of the solar cell 矽 substrate 50, too The solar cell crucible substrate 50 is instead protected by the action of the potassium hydroxide solution containing dopants against the action of the potassium hydroxide solution, so that the surface texture 51 can be retained.

接著,含摻雜物的矽酸鹽玻璃層54之殘留部分被移除18。在此能夠例如利用第二種類的矽磷酸蝕刻液來完成。此外,太陽能電池矽基板之背面50被過度蝕刻,由此如果在太陽能電池矽基板50之背面上有未完全平坦化之表面時,其能夠進一步被平坦化。 Next, the remaining portion of the dopant-containing tellurite glass layer 54 is removed 18. This can be done, for example, using a second type of phosphonium phosphate etching solution. Further, the back surface 50 of the solar cell ruthenium substrate is over-etched, whereby if it has a surface that is not completely planarized on the back surface of the solar cell ruthenium substrate 50, it can be further planarized.

因此,留下具有一發射極摻雜52之一太陽能電池矽基板50,其正面具有表面紋理51以及平坦化其背面。太陽能電池矽基板50能夠由習知的現有技術被加工成太陽能電池。特別是能夠製造具有鈍化背面之太陽能電池,例如PERC型(Passivated Emitter and Rear Cell)-太陽能電池。 Thus, a solar cell substrate 50 having one emitter doping 52 is left with a surface texture 51 on the front side and a back surface flattened thereon. The solar cell crucible substrate 50 can be processed into a solar cell by the prior art. In particular, it is possible to manufacture a solar cell having a passivated back surface, such as a PERC type (Passivated Emitter and Rear Cell)-solar cell.

圖2及圖4係說明本發明之方法的另一實施例。同樣地,首先,太陽能電池矽基板50係紋理蝕刻10。在此接著又是管發射極擴散12帶有含摻雜物的矽酸鹽玻璃層54之形成。圖及圖3所示之實施例不同在於,在此係進一步實施濕式化學邊緣分離20,以便能以一較低成本方式移除在太陽能電池矽基板50之背面上的含摻雜物的矽酸鹽玻璃層54及發射極摻雜52。在此能夠例如藉由第一種類的矽酸鹽玻璃蝕刻液來實現。在如圖1及圖3所示實施例中,背面上之含摻雜物的矽酸鹽玻璃層之移除14能夠經由在如圖2與圖4所示實施例之濕式化學邊緣分離20來取 代。利用此方式產生本發明之方法的另一實施例。 2 and 4 illustrate another embodiment of the method of the present invention. Similarly, first, the solar cell 矽 substrate 50 is textured etched 10. This is followed by the formation of a tube oxide diffusion layer 12 with a dopant-containing tellurite glass layer 54. The embodiment shown in FIG. 3 differs from the embodiment shown in FIG. 3 in that wet chemical edge separation 20 is further implemented to remove dopant-containing defects on the back side of the solar cell substrate 50 in a relatively low cost manner. The acid salt glass layer 54 and the emitter doping 52. This can be achieved, for example, by a first type of tellurite glass etching solution. In the embodiment shown in Figures 1 and 3, the removal of the dopant-containing tellurite glass layer on the back side can be separated by wet chemical edge separation in the embodiment shown in Figures 2 and 4 Come to generation. Another way of producing the method of the invention is produced in this manner.

在如圖2及圖4所示之實施例中,含摻雜物的矽酸鹽玻璃層54之完全移除22接在濕式化學邊緣分離20後。在此能夠利用第二種類的矽酸鹽玻璃蝕刻液來實現。 In the embodiment shown in Figures 2 and 4, the complete removal 22 of the dopant-containing tellurite glass layer 54 is followed by wet chemical edge separation 20. This can be achieved using a second type of tellurite glass etchant.

接著,沉積一氮化矽層56於太陽能電池矽基板50之正面上24。在此能夠藉由習知的化學氣相沉積方法(CVD法)來達成。因為含摻雜物的矽酸鹽玻璃層54在氮化矽層56之沉積24前需完全被移除22,氮化矽層56能夠進一步保留在太陽能電池矽基板50上而作為抗反射層。當含摻雜物的矽酸鹽玻璃層54在先前並未完全移除時,只要於當時的太陽能電池處理製程中含摻雜物的矽酸鹽玻璃層54之移除為不必要的,氮化矽層56顯然也可保留作抗反射層。 Next, a tantalum nitride layer 56 is deposited on the front side 24 of the solar cell substrate 50. This can be achieved by a conventional chemical vapor deposition method (CVD method). Since the dopant-containing tellurite glass layer 54 needs to be completely removed 22 before the deposition of the tantalum nitride layer 56, the tantalum nitride layer 56 can remain on the solar cell germanium substrate 50 as an anti-reflective layer. When the dopant-containing tellurite glass layer 54 was not completely removed before, as long as the removal of the dopant-containing tellurite glass layer 54 in the current solar cell processing process is unnecessary, nitrogen The ruthenium layer 56 can obviously also remain as an anti-reflection layer.

進一步,太陽能電池矽基板50之背面於一溫度為介於70℃至85℃的氫氧化鉀溶液中被平坦化蝕刻16。為此目的,例如能將太陽能電池矽基板50完全浸入氫氧化鉀溶液中。在這樣的平坦化蝕刻16下,太陽能電池矽基板50之背面被平坦化,且於過程中氮化矽層56在其餘區域係作為保護層並且保護太陽能電池矽基板50抵抗氫氧化鉀溶液的影響。 Further, the back surface of the solar cell ruthenium substrate 50 is planarized and etched 16 in a potassium hydroxide solution having a temperature of 70 ° C to 85 ° C. For this purpose, for example, the solar cell crucible substrate 50 can be completely immersed in a potassium hydroxide solution. Under such planarization etching 16, the back surface of the solar cell germanium substrate 50 is planarized, and in the process, the tantalum nitride layer 56 serves as a protective layer in the remaining regions and protects the solar cell germanium substrate 50 against the influence of the potassium hydroxide solution. .

因此,所得到之太陽能電池矽基板50,其係於正面具有表面紋理51,以及一發射極摻雜52與一氮化矽層56作抗反射層,並且具有平坦化之背面。能藉由習知的現有技術進一步加工太陽能電池矽基板50為太陽能電池。太陽能電池矽基板50之正面上的發射極摻雜之金屬接觸能為 以習知的現有技術燒結穿透氮化矽層以達到此目的。此太陽能電池矽基板50之平坦化背面提供理想的先決條件於製造具有一鈍化背面之一太陽能電池。因為藉由氮化矽層56亦能實現發射極之一鈍化處理,所以也能製造具有鈍化發射極以及鈍化背面之一太陽能電池。 Therefore, the obtained solar cell crucible substrate 50 has a surface texture 51 on the front surface, and an emitter doping 52 and a tantalum nitride layer 56 as an antireflection layer, and has a flattened back surface. The solar cell crucible substrate 50 can be further processed into a solar cell by the prior art. The metal-contact energy of the emitter doping on the front surface of the solar cell 矽 substrate 50 is The tantalum nitride layer is sintered by conventional prior art techniques for this purpose. The flattened back side of this solar cell 矽 substrate 50 provides the ideal prerequisite for fabricating a solar cell having a passivated back surface. Since one passivation treatment of the emitter can also be achieved by the tantalum nitride layer 56, it is also possible to manufacture a solar cell having a passivated emitter and a passivated back surface.

10‧‧‧紋理蝕刻太陽能電池矽基板 10‧‧‧Texture etched solar cell 矽 substrate

12‧‧‧管發射極擴散帶有含摻雜物的矽酸鹽玻璃層之形成 12‧‧‧ Tube emitter diffusion with the formation of a tantalum-containing glass layer containing dopants

14‧‧‧移除背面之含摻雜物的矽酸鹽玻璃層 14‧‧‧Remove the doped tellurite glass layer on the back side

16‧‧‧在具有介於70℃至85℃之溫度的氫氧化鉀溶液中平坦化蝕刻背面 16‧‧‧ planarizing the back side in a potassium hydroxide solution having a temperature between 70 ° C and 85 ° C

18‧‧‧移除含摻雜物的矽酸鹽玻璃層的殘留物質以及過度蝕刻背面 18‧‧‧Remove residual material from the doped tellurite glass layer and overetch the back

Claims (14)

一種矽基板(50)的單面平坦化蝕刻方法(16),其中,- 至少形成(12;24)一保護層(54;56)於該矽基板之一第一面上;- 接著藉由一鹼性蝕刻液而平坦化蝕刻(16)該矽基板(50)之一第二面,該鹼性蝕刻液具有介於50℃至90℃之一溫度;- 於該平坦化蝕刻(16)過程中,在該矽基板(50)已形成該保護層(54;56)的範圍藉由該保護層(54;56)來抵抗該蝕刻液之作用而被保護;其中,一矽酸鹽玻璃層(54)或一氮化矽層(56)係形成(12;24)作為保護層(54;56)。 A single-sided planarization etching method (16) for a germanium substrate (50), wherein - at least (12; 24) a protective layer (54; 56) is formed on a first side of the germanium substrate; An alkaline etching solution planarizes etching (16) a second side of the germanium substrate (50), the alkaline etching liquid having a temperature between 50 ° C and 90 ° C; - the planarization etching (16) In the process, the protective layer (54; 56) is formed on the germanium substrate (50) by the protective layer (54; 56) to protect against the action of the etching liquid; wherein the tantalate glass A layer (54) or a tantalum nitride layer (56) is formed (12; 24) as a protective layer (54; 56). 如申請專利範圍第1項所述之方法,其中,一磷矽酸鹽玻璃層或一硼矽酸鹽玻璃層係形成(12)作為保護層(54)。 The method of claim 1, wherein the monophosphoric acid phosphate layer or the borosilicate glass layer is formed as a protective layer (54). 如上述申請專利範圍其中任一項所述之方法,其中,該太陽能電池基板(50)係單面平坦化蝕刻(16)。 A method according to any one of the preceding claims, wherein the solar cell substrate (50) is a single-sided planarization etch (16). 如申請專利範圍第3項所述之方法,其中。於一發射極擴散(12)之過程,一含摻雜物的矽酸鹽玻璃層(54)係形成(12)作保護層(54),較佳為磷矽酸鹽玻璃層或硼矽酸鹽玻璃層。 The method of claim 3, wherein the method of claim 3, wherein. During the process of emitter diffusion (12), a dopant-containing tellurite glass layer (54) is formed as (12) as a protective layer (54), preferably a phosphonate glass layer or a boronic acid. Salt glass layer. 如申請專利範圍第4項所述之方法,其中,在該發射極擴散(12)之過程形成(的該含摻雜物的矽酸鹽玻璃層(54)係於該矽基板(50)之該第二面的平坦化蝕刻(16)前被移除(14)。 The method of claim 4, wherein the dopant-containing tellurite glass layer (54) formed during the emitter diffusion (12) is attached to the germanium substrate (50) The planarization etch (16) of the second side is removed (14). 如申請專利範圍第5項所述之方法,其中,在該發射極擴散(12)之過程形成的該含摻雜物的矽酸鹽玻璃層(54)係藉由該矽基板之該第二面的濕式化學蝕刻(14)而被移除(14),較佳地,藉由第一種類之一矽酸鹽玻璃蝕刻液,包括水,10 g/l至50/l之氫氟酸,200 g/l至1000 g/l之硫酸及/或250 g/l至500 g/l之硝酸。 The method of claim 5, wherein the dopant-containing tellurite glass layer (54) formed during the emitter diffusion (12) is by the second of the germanium substrate The surface is wet chemically etched (14) and removed (14), preferably by a first type of bismuth silicate glass etchant, including water, 10 g/l to 50/l hydrofluoric acid , from 200 g/l to 1000 g/l of sulfuric acid and/or from 250 g/l to 500 g/l of nitric acid. 如申請專利範圍第4項至第6項其中一項所述之方法,其中,該矽基板(50)之該第二面之平坦化蝕刻(16)後,該在矽基板(50)之該第一面上所形成的含摻雜物的矽酸鹽玻璃層(54)藉由第二種類之一矽玻璃蝕刻液移除(18)而且該矽基板之該第二面係藉由第二種類之該矽玻璃蝕刻液過度蝕刻(18)。 The method of any one of claims 4 to 6, wherein after the planarization etching (16) of the second surface of the germanium substrate (50), the germanium substrate (50) The dopant-containing tellurite glass layer (54) formed on the first side is removed (18) by one of the second type of bismuth glass etching solution and the second side of the germanium substrate is second The bismuth glass etchant of the type is over-etched (18). 如申請專利範圍第3項所述之方法,其中,一氮化矽層(56)係形成於該矽基板(50)之該第一面上作為保護層(56)以及係保留(於該矽基板上作為抗反射層(24)。 The method of claim 3, wherein a tantalum nitride layer (56) is formed on the first surface of the germanium substrate (50) as a protective layer (56) and is retained (in the The substrate serves as an anti-reflection layer (24). 如申請專利範圍第8項所述之方法,其中,- 在該氮化矽層(56)之形成(24)前,實行一發射極擴散(12)並且在此於在矽基板(50)上形成(12)一含摻雜物的矽酸鹽玻璃層(54);以及- 在該氮化矽層(56)之形成(24)前,該含摻雜物的矽酸鹽玻璃層(54)係完全被移除(22)。 The method of claim 8, wherein - before the formation of the tantalum nitride layer (56), an emitter diffusion (12) is performed and is applied to the substrate (50). Forming (12) a dopant-containing tellurite glass layer (54); and - prior to forming the tantalum nitride layer (56) (24), the dopant-containing tellurite glass layer (54) ) is completely removed (22). 如上述申請專利範圍任一項所述之方法,其中,在該保護層(54;56)之形成(12;24)前,該矽基板(50)係至少部 份地具有一表面紋理(51),由此該表面紋理(51)較佳地於該矽基板(50)之該第一面以及該第二面上被形成(10)。 The method of any of the preceding claims, wherein the ruthenium substrate (50) is at least partially before the formation of the protective layer (54; 56) The portion has a surface texture (51) whereby the surface texture (51) is preferably formed (10) on the first side and the second side of the base substrate (50). 如上述申請專利範圍任一項所述之方法,其中,該矽基板(50)之該第二面藉由一氫氧化鉀水溶液被平坦化蝕刻(16),較佳地藉由具有氫氧化鉀濃度10至30重量百分比之一氫氧化鉀水溶液。 The method of any of the preceding claims, wherein the second side of the ruthenium substrate (50) is planarized (16) by an aqueous potassium hydroxide solution, preferably by having potassium hydroxide. A concentration of 10 to 30% by weight of an aqueous potassium hydroxide solution. 如上述申請專利範圍任一項所述之方法,其中,該矽基板(50)之該第二面藉由該鹼性蝕刻液係被平坦化蝕刻(16),而且該蝕刻液具有介於70℃至85℃之一溫度(16)。 The method of any one of the preceding claims, wherein the second side of the germanium substrate (50) is planarized by the alkaline etching liquid (16), and the etching liquid has a ratio of 70 One temperature (16) from °C to 85 °C. 如上述申請專利範圍任一項所述之方法,其中,該第二面16)於10秒至300秒期間內被平坦化蝕刻,較佳為30秒至300秒。 The method of any of the preceding claims, wherein the second side 16) is planarized and etched during a period of from 10 seconds to 300 seconds, preferably from 30 seconds to 300 seconds. 如申請專利範圍第3項至第13項其中一項所述之方法,其中,由該太陽能電池基板(50)製造具有鈍化的背面之一太陽能電池,較佳為具有鈍化之發射極以及鈍化的背面之一太陽能電池。 The method of any one of claims 3 to 13, wherein the solar cell substrate (50) is fabricated with a passivated backside solar cell, preferably with a passivated emitter and passivated One of the solar cells on the back.
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