TW201327296A - Touch control electronic device and calibration method of trajectory - Google Patents
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本發明係一種觸控電子裝置及觸控軌跡的校正方法，特別是一種可計算校正點位的觸控電子裝置及觸控軌跡的校正方法。The invention relates to a touch electronic device and a method for correcting a touch track, in particular to a touch electronic device capable of calculating a correction point and a method for correcting a touch track.
目前行動電子裝置的主流，例如智慧型手機或平板電腦等，均捨棄傳統的鍵盤滑鼠裝置而改以觸控面板作為標準的輸入和輸出的介面，以因應電子裝置的微小化趨勢。透過觸控面板，行動電子裝置提供使用者藉由手指在觸控面板上的觸碰或滑動來執行觸控操作。At present, the mainstream of mobile electronic devices, such as smart phones or tablets, have abandoned the traditional keyboard mouse device and changed the touch panel as a standard input and output interface to cope with the trend of miniaturization of electronic devices. Through the touch panel, the mobile electronic device provides a user to perform a touch operation by touching or sliding a finger on the touch panel.
而隨著觸控及硬體技術的日新月異，觸控操作也愈來愈人性化，許多觸控操作方式也愈來愈細膩，因此對於觸控軌跡的解析度要求也愈來愈高，否則便容易發生誤判或者是描繪出的觸控軌跡不如預期。With the rapid development of touch and hardware technology, touch operations are becoming more and more user-friendly, and many touch operation methods are becoming more and more delicate. Therefore, the resolution requirements for touch tracks are becoming higher and higher, otherwise It is easy to misjudge or the touch track drawn is not as expected.
由於一般人在觸控面板上操控執行時，往往會因重心偏移或接觸面積變異，造成觸控點位變異使得執行軌跡呈現非平滑狀況，因此一般均不會直接使用觸控面板所偵測到的觸碰點位，而是會進一步對觸碰點位進行線性化處理。目前觸控業者對於觸控軌跡的修正多係利用內插法來平滑化使用者在觸控面板上所畫出的軌跡。Due to the shift of the center of gravity or the variation of the contact area, the touch point variation causes the execution track to be non-smooth. Therefore, it is generally not detected directly by the touch panel. Touching the point, but further linearizing the touch point. At present, the touch operator's correction of the touch track is mostly by using interpolation to smooth the trajectory drawn by the user on the touch panel.
請參照第1圖與第2圖，分別為習知技術示意圖(一)、(二)。當手指在觸控電子裝置10之觸控面板101上滑動時，觸控面板101會偵測到觸碰點位250(包含A1~A12)，此時，觸控電子裝置10的處理器會對觸碰點位250進行線性化處理而得到模擬點位260(A1’~A12’)。其中，A1’即為A1；A2’係由A1’與A2內插計算而得；A3’係由A2’與A3內插計算而得；A4’係由A3’與A4內插計算而得；依此類推。Please refer to Fig. 1 and Fig. 2, which are schematic diagrams (1) and (2) of the prior art. When the finger slides on the touch panel 101 of the touch electronic device 10, the touch panel 101 detects the touch point 250 (including A1~A12). At this time, the processor of the touch electronic device 10 will The touch point 250 is linearized to obtain the analog point 260 (A1'~A12'). Among them, A1' is A1; A2' is calculated by interpolation of A1' and A2; A3' is calculated by interpolation of A2' and A3; A4' is calculated by interpolation of A3' and A4; So on and so forth.
但線性化處理卻也造成時間遲滯的問題，亦即手指完成操作而離開觸控面板101當下所在的觸碰點位A12會與線性化處理最後所計算出的模擬點位產生落差。一種習知計算模擬點位260的方式，係當觸碰物一離開觸控面板便立即停止計算，此時，模擬點位可能僅計算至A4’便嘎然停止，導致模擬點位260所構成的軌跡與真實的觸碰軌跡不符合或差異過大。尤其當手指移動速度愈快時，差異將會愈明顯。此種差異極可能造成觸控操作的誤判或是令描繪出的觸控軌跡不如預期。However, the linearization process also causes a problem of time lag, that is, the touch point A12 where the finger is left leaving the touch panel 101 and the analog point calculated by the linearization process is dropped. A conventional way of calculating the analog point 260 is to stop the calculation as soon as the touch object leaves the touch panel. At this time, the analog point may only be calculated until A4' stops, resulting in the analog point 260. The trajectory does not match or is too different from the actual touch trajectory. Especially when the finger moves faster, the difference will be more obvious. This difference is very likely to cause misjudgment of the touch operation or make the touch track drawn as expected.
先前技術另一種作法係先將觸碰點位250存放於暫存器中，處理器再從暫存器中擷取觸碰點位250進行處理，如此一來雖然可對所有觸碰點位250進行計算而得到模擬點位250，會造成觸控操作的反應時間變長而使觸控操作產生時間延遲。Another method in the prior art is to store the touch point 250 in the scratchpad, and the processor then extracts the touch point 250 from the scratchpad for processing, so that all the touch points can be 250. Performing the calculation to obtain the analog point 250 causes the response time of the touch operation to become longer and the touch operation to generate a time delay.
有鑑於此，本發明提出一種觸控電子裝置，包含觸控面板、處理器與校正模組。其中，處理器每隔一間隔時間偵測至少一觸碰點位，處理器再根據偵測到的觸碰點位計算模擬點位。當處理器偵測到觸碰點離開觸控面板時，校正模組根據觸控面板偵測到之觸碰點離開觸控面板時之觸碰點位的座標(X1,Y1)以及處理器所最後計算出之模擬點位的座標(X2,Y2)計算複數個校正點位，用以校正模擬點位與觸碰點位之間的誤差，觸控電子裝置係藉由模擬點位與校正點位執行觸控操作。In view of this, the present invention provides a touch electronic device including a touch panel, a processor, and a correction module. The processor detects at least one touch point every interval interval, and the processor calculates an analog point according to the detected touch point. When the processor detects that the touch point leaves the touch panel, the calibration module touches the coordinates (X 1 , Y 1 ) of the touch point when the touch point is detected by the touch panel and leaves the touch panel. The coordinate (X 2 , Y 2 ) of the simulated point calculated by the device calculates a plurality of correction points to correct the error between the analog point and the touch point. The touch electronic device uses the analog point. The bit and the correction point perform a touch operation.
本發明亦提出一種觸控軌跡的校正方法，適用於具有觸控面板、處理器與校正模組之觸控電子裝置。所述觸控軌跡的校正方法包含：處理器每隔一間隔時間偵測至少一觸碰點位，處理器再根據偵測到的觸碰點位計算模擬點位；當處理器偵測到觸碰物離開觸控面板時，校正模組根據處理器所偵測到之觸碰點離開觸控面板時之觸碰點位的座標(X1,Y1)以及處理器所最後計算出之模擬點位的座標(X2,Y2)計算複數個校正點位，用以校正模擬點位與觸碰點位之間的誤差。其中，觸控電子裝置係藉由模擬點位與校正點位執行觸控操作。The invention also provides a method for correcting a touch track, which is suitable for a touch electronic device having a touch panel, a processor and a correction module. The method for correcting the touch track includes: the processor detects at least one touch point every interval time, and the processor calculates an analog point according to the detected touch point; when the processor detects the touch When the touch object leaves the touch panel, the correction module calculates the coordinates (X 1 , Y 1 ) of the touch point when the touch point is removed from the touch panel by the processor, and the simulation calculated by the processor. The coordinate of the point (X 2 , Y 2 ) calculates a plurality of correction points to correct the error between the analog point and the touch point. The touch electronic device performs a touch operation by simulating a point and a correction point.
綜上所述，本發明不需要藉助暫存器，僅需根據處理器所偵測到之觸碰點離開觸控面板時之觸碰點位的座標(X1,Y1)以及處理器所最後計算出之模擬點位的座標(X2,Y2)計算出複數個校正點位，便使觸控電子裝置得以藉由模擬點位與校正點位來執行觸控操作，解決了習知技術所具有的種種問題。In summary, the present invention does not require a register, and only needs to touch the coordinates of the touch point (X 1 , Y 1 ) and the processor according to the touch point detected by the processor when leaving the touch panel. Finally, the coordinate (X 2 , Y 2 ) of the simulated point is calculated to calculate a plurality of correction points, so that the touch electronic device can perform the touch operation by simulating the position and the correction point, thereby solving the conventional knowledge. The problems that technology has.
請參照第3圖與第4圖，分別為本發明之觸控電子裝置示意圖及本發明之觸碰點位及模擬點位示意圖。觸控電子裝置20包含：觸控面板201、電性連接於觸控面板之處理器、與電性連接於處理器之校正模組。其中，處理器每隔一間隔時間偵測至少一觸碰點位250，然後再根據觸碰點位250計算出模擬點位260，計算模擬點位260的方式於本實施例計算模擬點位260的方式係使用內插法。亦即A1’即為A1，A2’係A2與A1’二點之內插，A3’係A3與A2’二點的內插，A4’係A4與A3’二點的內插，A5’係A5與A4’二點的內插。然而計算模擬點位260的方式可依製造業者或觸控電子設備20的種類不同而有所不同，並非僅能使用前述內插法計算。Please refer to FIG. 3 and FIG. 4 , respectively for a schematic diagram of the touch electronic device of the present invention and a schematic diagram of the touch point and the simulated point of the present invention. The touch control device 20 includes a touch panel 201 , a processor electrically connected to the touch panel, and a calibration module electrically connected to the processor. The processor detects at least one touch point 250 every other interval, and then calculates the analog point 260 according to the touch point 250, and calculates the analog point 260. The analog point 260 is calculated in this embodiment. The way is to use interpolation. That is, A1' is A1, A2' is interpolated by A2 and A1' two points, A3' is interpolated by A3 and A2' two points, A4' is interpolated by A4 and A3' two points, A5' Interpolation of A5 and A4' two points. However, the manner in which the analog point 260 is calculated may vary depending on the type of manufacturer or touch electronic device 20, and may not be calculated using only the aforementioned interpolation method.
當處理器偵測到觸碰物(手指或電容式觸控筆)離開觸控面板201時(亦即未偵測到觸碰點位250時)，處理器停止計算模擬點位260，校正模組開始作用。此時最終計算出的模擬點位係為A5’，校正模組根據處理器偵測到之觸碰物離開觸控面板201時之觸碰點位A5的座標(X1,Y1)以及處理器所最後計算出之模擬點位A5’的座標(X2,Y2)計算複數個校正點位270，用以校正模擬點位250與觸碰點位260之間的誤差，觸控電子裝置20係藉由模擬點位260與校正點位270來執行觸控操作。When the processor detects that the touch object (finger or capacitive stylus) leaves the touch panel 201 (ie, when the touch point 250 is not detected), the processor stops calculating the analog point 260, and the calibration mode The group starts to work. At this time, the final calculated analog point is A5', and the correction module according to the coordinates (X 1 , Y 1 ) of the touch point A5 when the touch object is detected by the processor leaving the touch panel 201 and processing The coordinate (X 2 , Y 2 ) of the simulated point A5' calculated by the device calculates a plurality of correction points 270 for correcting the error between the analog point 250 and the touch point 260, and the touch electronic device The 20 series performs the touch operation by the analog point 260 and the correction point 270.
在一實施例中，當手指或電容式觸控筆離開觸控面板201表面時，觸控面板201將偵測不到任何觸控點位250，此時，校正模組即開始計算校正點位270。校正點位270的數量可以是三個，其中，三個校正點位270的座標係分別為及(X1,Y1)。In an embodiment, when the finger or the capacitive stylus leaves the surface of the touch panel 201, the touch panel 201 will not detect any touch point 250. At this time, the calibration module starts to calculate the correction point. 270. The number of correction points 270 may be three, wherein the coordinates of the three correction points 270 are respectively And (X 1 , Y 1 ).
校正模組並非一定要計算3個校正點位，假設校正模組係計算n個校正點位270，則所述n個校正點位270的座標公式為，其中a的值為1至n，在一實施態樣中，n的值係在3至6的範圍中。The calibration module does not have to calculate three correction points. If the correction module calculates n correction points 270, the coordinate formula of the n correction points 270 is Where a has a value from 1 to n, and in one embodiment, the value of n is in the range of 3 to 6.
各實施例無論n的值大小為何，在各個校正點位270中皆必然包含(X1,Y1)此一座標，如此一來，無論線性化處理造成多少時間延遲，手指離開觸控面板201表面時之觸控點位A5皆必然成為校正點位270中的其中一點。Regardless of the value of n of each embodiment, the (X 1 , Y 1 ) flag must be included in each of the correction point bits 270, so that the finger leaves the touch panel 201 regardless of the time delay caused by the linearization process. The touch point A5 on the surface is necessarily one of the correction points 270.
請參照第5圖，為本發明之觸控軌跡的校正方法流程圖，其適用於具有觸控面板201、處理器與校正模組之觸控電子裝置20，包含：Please refer to FIG. 5 , which is a flowchart of a method for correcting a touch track of the present invention, which is applicable to a touch electronic device 20 having a touch panel 201 , a processor and a calibration module, and includes:
步 驟S01：每隔一間隔時間偵測至少一觸碰點位。 Step S01: detecting at least one of a time interval every touch point.
處理器每隔一間隔時間偵測至少一觸碰點位250，當使用者以手指或電容式觸控筆在觸控面板201的表面移動時，便會被處理器所偵測。The processor detects at least one touch point 250 at intervals, and is detected by the processor when the user moves on the surface of the touch panel 201 with a finger or a capacitive stylus.
步驟S02：判斷觸碰物是否離開觸控面板。 Step S02: Determine whether the touch object leaves the touch panel.
由於處理器每隔一間隔時間偵測至少一觸碰點位250，當連續二次偵測不到觸碰點位250時，判斷觸碰物已經離開觸控面板。倘若觸碰物尚未離開觸控面板，則進行步驟S03；倘若觸碰物已經離開觸控面板，則進行步驟S04。Since the processor detects at least one touch point 250 every interval time, when the touch point 250 is not detected twice, it is determined that the touch object has left the touch panel. If the touch object has not left the touch panel, proceed to step S03; if the touch object has left the touch panel, proceed to step S04.
步驟S03：根據觸碰點位計算模擬點位。 Step S03: Calculate the analog point according to the touch point.
處理器根據所偵測到的觸碰點位250計算模擬點位260，計算方式依製造業者或觸控電子設備20的種類不同而有所不同，屬於習知技術。The processor calculates the analog point 260 according to the detected touch point 250. The calculation method varies according to the type of the manufacturer or the touch electronic device 20, and belongs to the prior art.
步驟S04：計算複數個校正點位。 Step S04: Calculate a plurality of correction point bits.
當觸碰物已經離開觸控面板201表面時，由於偵測不到任何觸控點位250，此時校正模組根據處理器所偵測到之觸碰點離開觸控面板201時之觸碰點位250的座標(X1,Y1)以及處理器所最後計算出之模擬點位260的座標(X2,Y2)計算複數個校正點位270，以校正模擬點位與該觸碰點位之間的誤差。而觸控電子裝置20即是根據模擬點位260與校正點位270來執行觸控操作。When the touch object has left the surface of the touch panel 201, since the touch point 250 is not detected, the touch module touches the touch panel 201 according to the touch point detected by the processor. point coordinates (X 1, Y 1) 250 and an analog of the last point processor 260 calculates the coordinates of (X 2, Y 2) calculating a plurality of correction point 270, to correct the simulated touch points The error between the points. The touch electronic device 20 performs the touch operation according to the analog point 260 and the correction point 270.
於步驟S04中，係計算三個校正點位270，其座標分別為及(X1,Y1)。此外，本步驟並非一定要計算3個校正點位270，假設校正模組係計算n個校正點位270，則所述n個校正點位270的座標公式為，其中a的值為1至n，在一實施態樣中，n的值係在3至6的範圍中。In step S04, three correction point bits 270 are calculated, the coordinates of which are respectively And (X 1 , Y 1 ). In addition, in this step, it is not necessary to calculate three correction point bits 270. Assuming that the correction module calculates n correction point bits 270, the coordinate formula of the n correction point bits 270 is Where a has a value from 1 to n, and in one embodiment, the value of n is in the range of 3 to 6.
在各實施例中，無論n的值大小為何，在各個校正點位270中皆必然包含(X1,Y1)此一座標，如此一來，無論線性化處理造成多少時間延遲，觸碰物離開觸控面板201表面時之觸控點位A5皆必然成為校正點位270中的其中一點。In each of the embodiments, regardless of the value of the value of n, the (X 1 , Y 1 ) flag must be included in each of the correction point bits 270, so that no matter how much time delay caused by the linearization process, the touch object The touch point A5 when leaving the surface of the touch panel 201 is necessarily one of the correction points 270.
雖然本發明的技術內容已經以較佳實施例揭露如上，然其並非用以限定本發明，任何熟習此技藝者，在不脫離本發明之精神所作些許之更動與潤飾，皆應涵蓋於本發明的範疇內，因此本發明之保護範圍當視後附之申請專利範圍所界定者為準。Although the technical content of the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention, and any modifications and refinements made by those skilled in the art without departing from the spirit of the present invention are encompassed by the present invention. The scope of protection of the present invention is therefore defined by the scope of the appended claims.
10．．．觸控電子裝置10. . . Touch electronic device
101．．．觸控面板101. . . Touch panel
20．．．觸控電子裝置20. . . Touch electronic device
201．．．觸控面板201. . . Touch panel
250、A1~A12．．．觸碰點位250, A1~A12. . . Touch point
260、A1’~A12’．．．模擬點位260, A1'~A12’. . . Analog point
270．．．校正點位270. . . Calibration point
第1圖為本發明之習知技術示意圖(一)。Fig. 1 is a schematic view (1) of the prior art of the present invention.
第2圖為本發明之習知技術示意圖(二)。Figure 2 is a schematic view of the prior art of the present invention (2).
第3圖為本發明之觸控電子裝置示意圖。FIG. 3 is a schematic diagram of a touch electronic device of the present invention.
第4圖為本發明之觸碰點位及模擬點位示意圖。Figure 4 is a schematic diagram of the touch point and analog point of the present invention.
第5圖為本發明之觸控軌跡的校正方法流程圖。FIG. 5 is a flow chart of a method for correcting a touch track of the present invention.
250、A1~A5．．．觸碰點位250, A1~A5. . . Touch point
260、A1’~A5’．．．模擬點位260, A1'~A5’. . . Analog point
270．．．校正點位270. . . Calibration point
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| TWI737318B (en) * | 2020-05-27 | 2021-08-21 | 禾瑞亞科技股份有限公司 | Touch sensitive processing method, apparatus and touch system |
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| US7499039B2 (en) * | 2005-01-10 | 2009-03-03 | 3M Innovative Properties Company | Iterative method for determining touch location |
| TW200803482A (en) * | 2006-06-01 | 2008-01-01 | Micro Nits Co Ltd | Image processing method of indicator input system |
| TW201032474A (en) * | 2009-02-19 | 2010-09-01 | Ideacom Technology Corp | Signal correcting apparatus and the method therefor |
| TWI403931B (en) * | 2009-06-03 | 2013-08-01 | Higgstec Inc | Touch panel with matrix parallel electrode pattern and touch detecting method thereon |
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| TWI460626B (en) | 2014-11-11 |
| CN103176671A (en) | 2013-06-26 |
| CN103176671B (en) | 2016-02-03 |
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