201229748 六、發明說明： 【發明所屬之技術領域·】 [0001] 本發明涉及〆種祠服器及其控制通道開關的方法。 [先前技術] [0002] 在伺服器中，基板管理控制器透過I2C匯流排與多個I2C 設備（例如EEPR〇M、溫度感測器）相連接。當基板管理 控制器與I2C設備之間透過多路開關進行連接時，I2C設 備會出現通道不一樣但是位址一樣的情況，此時與12 C設 備通訊需要打開對應通道。為了保證[2C設備能夠正常工 作，需要對I2C設備進行測試。另一方面’基板管理控制 器會定時訪問12C設備中的監測敦備（例如溫度感測器） 來獲取監測資料（例如CPU的溫度）’用以監控伺服器的 運行狀態。由於測試與訪問I2C設備都需要打開對應通道 ，測試過程中打開的通道有可能由於基板管理控制器訪 問其他的12C設備而意外關閉’使得12C設備的測試無法 . :·-：.： ... 順利進行。 .·：： . . 【發明内容】 [0003] 鑒於以上内容，有必要提供一種伺服器及其控制通道開 關的方法，能夠順利對12C設備進行測試。 [0004] 一種伺服器，包括基板管理控制器、多個J2C設備及多路 開關，所述多個12C設備中包括用於監控伺服器運行狀態 的監測設備，所述多路開關將基板管理控制器連接到各 個I2C設備，每個I2C設備與基板管理控制器之間有一個 可控制開關的通道，所述伺服器安裝有測試系統，所述 測試系統包括：設置模組，用於在測試I2C設備之前設置 100100761 表單編號A0101 第4買/共16頁 1002001364-0 201229748 Ο [0005] 〇 通道標誌並設定為打開狀態；第一打開模組，用於控制 基板管理控制器打開待測的12C設備與基板管理控制器之 間的通道並且關閉其餘通道，以利用該打開的通道測試 I2C設備；關閉模組，用於在I2C設備測試結束後控制基 板管理控制器關閉I2C設備與基板管理控制器之間的通道 ;及修改模組，用於在I2C設備測試結束後將通道標誌修 改為關閉狀態；所述基板管理控制器包括：判斷模組’ 用於在訪問12C設備中的監測設備以獲取監測資料之前判 斷通道標誌是否為打開狀態；及第二打開模組，用於當 通道標誌不是打開狀態時打開要訪問的I2C設備與通道基 板管理控制器之間的通道並且關閉其餘通道，以利用該 打開的通道從12 C設備獲取監測資料> 一種伺服器控制通道開關的方法，所述伺服器包括基板 管理控制器、多個I2C設備及多路開關，所述多個I2C設 備中包括用於監控伺服器運行狀態的監測設備，所述多 .. 路開關將基板管理控制器連接到各個I2C設備，每個I2C 設備與基板管理控制器之間有一個可控制開關的通道， 所述伺服器安裝有測試系統’該方法中測試系統執行步 驟：在測試I2C設備之前，設置通道標誌益設定為打開狀 態；控制基板管理控制器打開待測的I2C設備與基板管理 控制器之間的通道並且關閉其餘通道，以利用該打開的 通道測試I2C設備；在I2C設備測試結束後控制基板管理 控制器關閉I2C設備與基板管理控制器之間的通道；及在 I2C設備測試結束後將通道標誌修改為關閉狀態；該方法 中基板管理控制器執行步驟：在訪問I2C設備中的監測設 100100761 表單編號Α0101 1002001364-0 201229748 備以獲取監測資料之前，判斷通道標誌是否為打開狀態 ，當通道標誌不是打開狀態時，打開要訪問的丨2C設備與 通道基板管理控制器之間的通道並且關閉其餘通道，以 利用該打開的通道從I 2C設備獲取監測資料。 [0006] [0007] [0008] 100100761 本發明利用通道標誌指示是否有I2C設備在進行測試，直 到沒有I2C設備在測試時基板管理控制器才訪問i2c設備 以獲取監測資料，避免了基板管理控制器訪問I2C設備造 成待測的I2C設備的對應通道意外關閉的情況，保證了 I2C設備的測試順利進行。 【實施方式】 參閱圖1所示’係本發明伺服器較佳實施例的架構圖。所 述伺服器10包括基板管理控制器11、多個I2c (inter_ Integrated Circuit，内部積體電路）設備12 (例如 EEPROM、溫度感測器）及多路開關13 β所述多路開關13 將基板管理控制器11連接到各個I2C設備12。每個I2C設 f 備12與基板管理控制器11¾間有一個可控制開關的通道 。當打開某個12C設備12與基板管理控制器11之間的通道 時，基板管理控制器11可以與該I2C設備12進行資料通訊 。所述伺服器10安裝有測試系統14，用於對I2C設備12 進行測試。所述基板管理控制器11從I2C設備12中的監測 設備（例如溫度感測器）獲取伺服器1 〇的監測資料，用 以對伺服器10的運行狀態進行監控。 所述測試系統14包括設置模組140、第一打開模組141、 關閉模組142與修改模組143。 所述設置模組140用於在測試I2C設備12之前設置通道標 表單編號A0101 第6頁/共16頁 1002001364-0 [0009] 201229748 誌並設定為打開狀態。所述通道標誌用來指示是否測試 系統14在測試I 2 C設備1 2。在本實施例中，所述通道標誌、 用一個布林變數來表示，該布林變數取值為真時表示通 道打開（即打開狀態），該布林變數取值為假時表示通 道關閉（即關閉狀態）。所述通道標誌還可以是一個整 數變數，該整數變數取值為0時表示通道打開，該整數變 數取值為1時表示通道關閉。 [0010] 所述第一打開模組141用於控制基板管理控制器11打開待 測的12C設備12與基板管理控制器11之間的通道並且關閉 其餘通道，以利群該德_的遴道測試I2C設備12。例如， 所述I2C設備12為EEPROM，第一打開模組141打開該 EEPROM與基板管理控制器11之間的通道並且關閉其餘通 道，利用該通道測試EEPROM的讀寫操作是否正常》 [0011] 所述關閉模組142用於在I2C設備12測試結束後控制基板 管理控制器11關閉12C設備12與基板管理控制器11之間 的通道。 \ [0012] 所述修改模組143用於在I2C設備12測試結束後將通道標 誌修改為關閉狀態。例如’修改模組143將通道標誌的取 值由真修改為假。 [0013] 所述基板管理控制器11包括判斷模組110與第二打開模組 111 °201229748 VI. Description of the Invention: [Technical Field of the Invention] [0001] The present invention relates to a device for controlling a device and a method for controlling the same. [Prior Art] [0002] In the server, the baseboard management controller is connected to a plurality of I2C devices (for example, EEPR〇M, temperature sensor) through an I2C bus bar. When the baseboard management controller and the I2C device are connected through the multi-way switch, the I2C device will have different channels but the same address. In this case, the corresponding channel needs to be opened for communication with the 12C device. In order to ensure that [2C equipment can work normally, I2C equipment needs to be tested. On the other hand, the baseboard management controller periodically accesses the monitoring device (e.g., temperature sensor) in the 12C device to obtain monitoring data (e.g., CPU temperature) to monitor the operating state of the server. Since both the test and the access to the I2C device need to open the corresponding channel, the channel opened during the test may be accidentally turned off due to the access of the baseboard management controller to other 12C devices. This makes the test of the 12C device impossible. :·-:.: ... Going smoothly. . . . : . . . [Invention] [0003] In view of the above, it is necessary to provide a method for the servo and its control channel switching, which can smoothly test the 12C device. [0004] A server includes a substrate management controller, a plurality of J2C devices, and a multi-way switch, wherein the plurality of 12C devices include a monitoring device for monitoring a running state of the server, and the multi-way switch controls the substrate management The device is connected to each I2C device, and each I2C device and the substrate management controller have a channel for controlling the switch, the server is equipped with a test system, and the test system includes: a setting module for testing the I2C Before the device is set 100100761 Form No. A0101 No. 4 Buy/Total 16 Pages 1002001364-0 201229748 Ο [0005] 〇Channel flag is set to open state; first open module is used to control the baseboard management controller to open the 12C device to be tested Passing the channel with the baseboard management controller and closing the remaining channels to test the I2C device with the open channel; closing the module for controlling the baseboard management controller to turn off the I2C device and the baseboard management controller after the I2C device test is completed And a modification module for modifying the channel flag to the off state after the end of the I2C device test; the substrate management control The device includes: a determining module configured to determine whether the channel flag is in an open state before accessing the monitoring device in the 12C device to obtain the monitoring data; and a second opening module, configured to open the accessing when the channel flag is not in an open state A channel between the I2C device and the channel substrate management controller and closing the remaining channels to acquire monitoring data from the 12 C device using the opened channel. A method of controlling a channel switch, the server including a substrate management controller a plurality of I2C devices and a multiplexer, wherein the plurality of I2C devices include a monitoring device for monitoring a running state of the server, the multi-way switch connecting the baseboard management controller to each I2C device, each I2C There is a channel for controlling the switch between the device and the baseboard management controller, and the server is equipped with a test system. The test system performs the steps in the method: setting the channel flag to the open state before testing the I2C device; The management controller opens the channel between the I2C device to be tested and the baseboard management controller and closes the remaining channels. To test the I2C device by using the open channel; control the substrate management controller to close the channel between the I2C device and the baseboard management controller after the I2C device test is finished; and modify the channel flag to the off state after the I2C device test ends; In the method, the baseboard management controller performs the steps: when accessing the monitoring device 100100761 in the I2C device, the form number Α0101 1002001364-0 201229748 is prepared to obtain the monitoring data, determine whether the channel flag is open, and when the channel flag is not open, open The channel between the 丨2C device to be accessed and the channel substrate management controller and the remaining channels are closed to utilize the open channel to acquire monitoring data from the I 2 C device. [0006] [0007] 100100761 The present invention utilizes a channel flag to indicate whether an I2C device is testing, until the substrate management controller accesses the i2c device to obtain monitoring data without the I2C device being tested, thereby avoiding the substrate management controller. Accessing the I2C device causes the corresponding channel of the I2C device to be tested to be accidentally shut down, ensuring that the test of the I2C device goes smoothly. [Embodiment] Referring to Figure 1 is a block diagram of a preferred embodiment of the server of the present invention. The server 10 includes a substrate management controller 11, a plurality of I2c (inter_ Integrated Circuit) devices 12 (eg, EEPROM, temperature sensor), and a multiplexer 13 β. The multiplexer 13 The management controller 11 is connected to each I2C device 12. There is a channel for controlling the switch between each I2C device 12 and the substrate management controller 113⁄4. When the channel between a certain 12C device 12 and the substrate management controller 11 is turned on, the substrate management controller 11 can perform data communication with the I2C device 12. The server 10 is equipped with a test system 14 for testing the I2C device 12. The baseboard management controller 11 acquires monitoring data of the server 1 from a monitoring device (e.g., a temperature sensor) in the I2C device 12 for monitoring the operating state of the server 10. The test system 14 includes a setting module 140, a first opening module 141, a closing module 142, and a modification module 143. The setting module 140 is configured to set a channel label before the I2C device 12 is tested. Form number A0101 Page 6 of 16 1002001364-0 [0009] 201229748 is set to the open state. The channel flag is used to indicate whether the test system 14 is testing the I 2 C device 12 . In this embodiment, the channel flag is represented by a Boolean variable. When the value of the Boolean variable is true, the channel is open (ie, the open state), and when the value of the Boolean variable is false, the channel is closed ( That is, the state is off). The channel flag may also be an integer variable. When the value of the integer variable is 0, the channel is open. When the value of the integer variable is 1, the channel is closed. [0010] The first open module 141 is configured to control the substrate management controller 11 to open a channel between the 12C device 12 to be tested and the substrate management controller 11 and close the remaining channels to facilitate the group's ramp The I2C device 12 is tested. For example, the I2C device 12 is an EEPROM, and the first open module 141 opens a channel between the EEPROM and the baseboard management controller 11 and closes the remaining channels, and uses the channel to test whether the read/write operation of the EEPROM is normal. [0011] The shutdown module 142 is configured to control the substrate management controller 11 to close the channel between the 12C device 12 and the substrate management controller 11 after the end of the I2C device 12 test. [0012] The modification module 143 is configured to modify the channel flag to the off state after the end of the I2C device 12 test. For example, the 'modification module 143 changes the value of the channel flag from true to false. [0013] The substrate management controller 11 includes a determination module 110 and a second opening module 111 °
[0014] 所述判斷模組11 〇用於在訪問12C設備12中的監測設備以 獲取監測資料之前，判斷所述通道標誌是否為打開狀態 。若通道標誌為打開狀態’表明測試系統丨4正在測試I2C 100100761 表單編號 A0I01 第 7 頁/共 16 頁 1002001364-0 201229748 設備12，則繼續判斷通道標誌是否為打開狀態。在本實 施例中，判斷模組110等待一段時間（例如2秒）後再次 判斷通道標誌是否為打開狀態。 [0015] 所述第二打開模組111用於當通道標誌不是打開狀態時打 開要訪問的I 2C設備1 2與通道基板管理控制器11之間的通 道並且關閉其餘通道，以利用該打開的通道從I2C設備12 獲取監測資料。 [0016] 參閱圖2所示，係圖1中的伺服器控制通道開關的方法較 佳實施例中測試系統的工作流程圖。 [0017] 在測試I2C設備12之前，步驟S201，設置模組140設置通 道標誌並設定為打開狀態。所述通道標誌用來指示是否 測試系統14在測試I2C設備12。在本實施例中，所述通道 標誌用一個布林變數來表示，該布林變數取值為真時表 示通道打開（即打開狀態），該布林變數取值為假時表 示通道關閉（即關閉狀態）。所述通道標誌還可以是一 個整數變數，該整數變數取值為0時表示通道打開，該整 數變數取值為1時表示通道關閉。 [0018] 步驟S202，第一打開模組141控制基板管理控制器11打 開待測的I2C設備12與基板管理控制器11之間的通道並且 關閉其餘通道，以利用該打開的通道測試I2C設備12。例 如，所述I2C設備12為EEPROM，第一打開模組141打開該 EEPROM與基板管理控制器11之間的通道並且關閉其餘通 道，利用該通道測試EEPROM的讀寫操作是否正常。 [0019] [0019] 在I2C設備12測試結束後，步驟S203，關閉模組142控制 100100761 表單編號A0101 第8頁/共16頁 1002001364-0 201229748 [0020] [0021] [0022] Ο [0023][0014] The determining module 11 is configured to determine whether the channel flag is in an open state before accessing the monitoring device in the 12C device 12 to obtain monitoring data. If the channel flag is on, indicating that test system 丨4 is testing I2C 100100761 Form No. A0I01 Page 7 of 16 1002001364-0 201229748 Device 12, continue to determine if the channel flag is on. In the present embodiment, the judging module 110 waits for a period of time (e.g., 2 seconds) to determine again whether the channel flag is on. [0015] The second opening module 111 is configured to open a channel between the I 2 C device 12 and the channel substrate management controller 11 to be accessed when the channel flag is not in an open state, and close the remaining channels to utilize the opened The channel acquires monitoring data from the I2C device 12. [0016] Referring to FIG. 2, the method for controlling the channel switch of the server in FIG. 1 is a flowchart of the operation of the test system in the preferred embodiment. [0017] Before testing the I2C device 12, in step S201, the setting module 140 sets the channel flag and sets it to the on state. The channel flag is used to indicate whether the test system 14 is testing the I2C device 12. In this embodiment, the channel identifier is represented by a Boolean variable, and when the Boolean variable is true, the channel is open (ie, the open state), and when the Boolean variable is false, the channel is closed (ie, Disabled). The channel flag may also be an integer variable. When the value of the integer variable is 0, the channel is opened. When the integer variable is 1, the channel is closed. [0018] Step S202, the first open module 141 controls the substrate management controller 11 to open the channel between the I2C device 12 to be tested and the substrate management controller 11 and close the remaining channels to test the I2C device 12 with the opened channel. . For example, the I2C device 12 is an EEPROM, and the first open module 141 opens the channel between the EEPROM and the baseboard management controller 11 and closes the remaining channels, and uses the channel to test whether the read and write operations of the EEPROM are normal. [0019] After the end of the I2C device 12 test, step S203, the close module 142 controls 100100761 Form No. A0101 Page 8 / Total 16 pages 1002001364-0 201229748 [0020] [0022] [0023]
[0024] 基板管理控制器11關閉I 2C設備1 2與基板管理控制器11 之間的通道。 在I2C設備12測試結束後，步驟S204，修改模組143將通 道標誌修改為關閉狀態。例如，修改模組143將通道標誌 的取值由真修改為假。 參閱圖3所示，係圖1中的伺服器控制通道開關的方法較 佳實施例中基板管理控制器的工作流程圖。 在訪問I2C設備12中的監測設備以獲取監測資料之前，步 驟S301，判斷模組110判斷所述通道標誌是否為打開狀態 。若通道標誌為打開狀態，表明測試系統14正在測試I2C 設備12，則繼續判斷通道標誌是否為打開狀態。在本實 施例中，判斷模組110等待一段時間（例如2秒）後再次 判斷通道標誌是否為打開狀態。 若通道標誌不是打開狀態，步驟S302，第二打開模組111 打開要訪問的12C設備12與通道基板管理控制器11之間的 通道並且關閉其餘通道，以利用該打開的通道從I2C設備 12獲取監測資料。 综上所述，本發明符合發明專利要件，爰依法提出專利 申請。惟，以上所述者僅為本發明之較佳實施例，本發 明之範圍並不以上述實施例為限，舉凡熟悉本案技藝之 人士援依本發明之精神所作之等效修飾或變化，皆應涵 蓋於以下申請專利範圍内。 【圖式簡單說明】 圖1係本發明伺服器較佳實施例的架構圖。 100100761 表單編號A0101 第9頁/共16頁 1002001364-0 [0025] 201229748 [0026] 圖2係圖1中的伺服器控制通道開關的方法較佳實施例中 測試系統的工作流程圖。 [0027] 圖3係圖1中的伺服器控制通道開關的方法較佳實施例中 基板管理控制器的工作流程圖。 【主要元件符號說明】 [0028] 伺服器： 10 [0029] 基板管理控制器 :11 [0030] 12 C設備 :12 [0031] 多路開關 ：13 [0032] 測試系統 ：14 [0033] 設置模組 ：140 [0034] 第一打開模組： 141 [0035] 關閉模組 ：142 [0036] 修改模組 ：143 [0037] 判斷模組 ：110 [0038] 第二打開模組： 111 100100761 表單編號A0101 第10頁/共16頁 1002001364-0[0024] The substrate management controller 11 turns off the channel between the I 2 C device 12 and the substrate management controller 11. After the end of the I2C device 12 test, in step S204, the modification module 143 modifies the channel flag to the off state. For example, the modification module 143 changes the value of the channel flag from true to false. Referring to Fig. 3, the method of controlling the channel switch in Fig. 1 is a flowchart of the operation of the substrate management controller in the preferred embodiment. Before accessing the monitoring device in the I2C device 12 to obtain the monitoring data, in step S301, the determining module 110 determines whether the channel flag is in an open state. If the channel flag is on, indicating that the test system 14 is testing the I2C device 12, it continues to determine if the channel flag is on. In the present embodiment, the judging module 110 waits for a period of time (e.g., 2 seconds) to determine again whether the channel flag is on. If the channel flag is not the open state, in step S302, the second open module 111 opens the channel between the 12C device 12 to be accessed and the channel substrate management controller 11 and closes the remaining channels to acquire from the I2C device 12 using the opened channel. Monitoring data. In summary, the present invention complies with the requirements of the invention patent and submits a patent application according to law. The above is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above-described embodiments, and equivalent modifications or variations made by those skilled in the art in light of the spirit of the present invention are It should be covered by the following patent application. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a block diagram of a preferred embodiment of the server of the present invention. 100100761 Form No. A0101 Page 9 of 16 1002001364-0 [0025] 201229748 [0026] FIG. 2 is a flow chart showing the operation of the test system in the preferred embodiment of the method for controlling the channel switch of the server in FIG. 1. 3 is a flow chart showing the operation of the substrate management controller in the preferred embodiment of the method for controlling a channel switch of the server of FIG. 1. [Main component symbol description] [0028] Server: 10 [0029] Baseboard management controller: 11 [0030] 12 C device: 12 [0031] Multiplexer: 13 [0032] Test system: 14 [0033] Set mode Group: 140 [0034] First open module: 141 [0035] Close module: 142 [0036] Modification module: 143 [0037] Judgment module: 110 [0038] Second open module: 111 100100761 Form number A0101 Page 10 of 16 1002001364-0