201226909 六、發明說明： 【發明所屬之技術領域】 [0001]本發明涉及一種探棒固定裳置。 【先前技術】 [_研發過程中’常需用示波器對電路板（如電腦主機板） 進仃Κ㉟$知不波器探棒__般採用軟導線連接於 -轉接頭’自身無法固定過程中需用手持，或於 主機板上焊接導線再連接於樓接ο 、探棒，或另置固定裝置。而 Ο 現有之固定裝置一般盔法鏟叙 +乂 …法轉動，只有放置於測試物件旁 邊方可使用’非常不便。 【發明内容】 [0003] 鑒於以上，有必要槎供_接+ , 晋托供種方便固定探棒並定位之探棒 固定裝置。 _ —種探棒固定裝置，用以固定示波器探棒，包括一底座 爽持探棒之夾具及一两端綱痒接於讓底座及夾具 之轉動部’該轉動部由軟金屬材料製成，容易f曲及定 〇 型。 闺相較f知技術，該探棒固定裝置透過彎轉該轉動部可任 意調整定㈣核雜棒，操作簡單，測試方便。 【實施方式】 [_請參照圖1，本發明探棒固定裝置用以固定一示波器探棒 (圖未示），包括—底座心-轉動部20及-爽具30。 [〇〇〇7]該底座10概呈方形’由重型材質製成^ 國該轉動部20由軟金屬材料製成，方便彎曲及定型。 099145666 表單編號A0101 0992078618-0 201226909 [0009] 該夾具30包括一連接部32及延伸自該連接部32—側之夾. 持部34，該夾持部34由兩彼此間隔之波浪形夾持片36構 成。 [0010] 該轉動部20之一端連接於該底座10之頂部，另一端連接 於該夾具30之連接部32之另一侧。 [0011] 使用時，將該探棒固定裝置放置於待測主機板（圖未示 )旁邊，將示波器探棒夾置於該夾具30之兩夾持片36之 間。彎折轉動該轉動部20帶動該夾具30，即可將該探棒 定位於該主機板上之待測對象。由於該底座10由重型材 質製成，於轉動該轉動部20時不會輕易挪動，方便進行 測試。 [0012] 由於該夾具30之兩夾持片36呈波浪形，將探棒夾置於凹 處，不易滑動，還可夾持多個探棒。無需測試時亦可將 探棒懸掛於夾具30上。 [0013] 综上所述，本發明確已符合發明專利之要件，遂依法提 出專利申請。惟，以上所述者僅為本發明之較佳實施方 式，自不能以此限制本案之申請專利範圍。舉凡熟悉本 案技藝之人士爰依本發明之精神所作之等效修飾或變化 ，皆應涵蓋於以下申請專利範圍内。 【圖式簡單說明】 [0014] 圖1係本發明探棒固定裝置之較佳實施方式之立體組裝圖 〇 【主要元件符號說明】 [0015] 底座：10 099145666 表單編號A0101 第4頁/共7頁 0992078618-0 201226909 [0016] 轉動部 , [0017]夾具： [0018] 連接部 [0019] 夾持部 [0020] 夾持片 ：20 30 ：32 ：34 :36201226909 VI. Description of the Invention: [Technical Field of the Invention] [0001] The present invention relates to a probe fixed skirt. [Prior technology] [_In the process of development, it is often necessary to use an oscilloscope to board a circuit board (such as a computer motherboard). $35$知波器棒__like the use of a flexible wire to connect to the - connector' itself can not be fixed process It is necessary to use a hand-held device, or to solder a wire on the motherboard and then connect it to the floor ο, the probe, or another fixture. However, the existing fixtures generally use the Helmet method to rotate, and can only be used next to the test object to be used. SUMMARY OF THE INVENTION [0003] In view of the above, it is necessary to provide a probe for fixing the probe and positioning it. _ — A probe fixing device for fixing an oscilloscope probe, comprising a base and a clamp for holding the probe and a hinge for connecting the base and the rotating portion of the clamp. The rotating portion is made of a soft metal material. Easy to f and fixed. Compared with the f-knowledge technology, the probe fixing device can arbitrarily adjust the fixed (four) nuclear hybrid rod by bending the rotating portion, and the operation is simple and the test is convenient. [Embodiment] [Please refer to FIG. 1 , the probe fixing device of the present invention is used for fixing an oscilloscope probe (not shown), including a base core-rotating portion 20 and a cooling device 30. [〇〇〇7] The base 10 has a square shape. It is made of a heavy-duty material. The rotating portion 20 is made of a soft metal material for easy bending and shaping. 099145666 Form No. A0101 0992078618-0 201226909 [0009] The jig 30 includes a connecting portion 32 and a clamping portion 34 extending from the side of the connecting portion 32. The clamping portion 34 is formed by two wave-shaped clamping pieces spaced apart from each other. 36 constitutes. [0010] One end of the rotating portion 20 is connected to the top of the base 10, and the other end is connected to the other side of the connecting portion 32 of the clamp 30. [0011] In use, the probe fixing device is placed beside the motherboard to be tested (not shown), and the oscilloscope probe is sandwiched between the two clamping pieces 36 of the clamp 30. By bending and rotating the rotating portion 20 to drive the clamp 30, the probe can be positioned on the object to be tested on the motherboard. Since the base 10 is made of a heavy-duty material, it is not easily moved when the rotating portion 20 is rotated, and the test is facilitated. [0012] Since the two clamping pieces 36 of the jig 30 are wavy, the probe is placed in a recess, which is not easy to slide, and a plurality of probes can be clamped. The probe can also be suspended from the clamp 30 without testing. [0013] In summary, the present invention has indeed met the requirements of the invention patent, and the patent application is filed according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the present invention are intended to be included within the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS [0014] FIG. 1 is a perspective view of a preferred embodiment of a probe fixing device of the present invention. [Main component symbol description] [0015] Base: 10 099145666 Form No. A0101 Page 4 of 7 Page 0992078618-0 201226909 [0016] Rotating portion, [0017] Clamp: [0018] Connecting portion [0019] Clamping portion [0020] Clamping piece: 20 30:32:34:36
099145666 表單編號A0101 第5頁/共7頁 0992078618-0099145666 Form No. A0101 Page 5 of 7 0992078618-0