CN111060723B - Probe fixing assembly - Google Patents

Probe fixing assembly Download PDF

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Publication number
CN111060723B
CN111060723B CN201811200535.8A CN201811200535A CN111060723B CN 111060723 B CN111060723 B CN 111060723B CN 201811200535 A CN201811200535 A CN 201811200535A CN 111060723 B CN111060723 B CN 111060723B
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CN
China
Prior art keywords
probe
wall surface
button
elastic clamping
elastic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201811200535.8A
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Chinese (zh)
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CN111060723A (en
Inventor
冯莹
陈安泰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Maintek Computer Suzhou Co Ltd
Pegatron Corp
Original Assignee
Maintek Computer Suzhou Co Ltd
Pegatron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Maintek Computer Suzhou Co Ltd, Pegatron Corp filed Critical Maintek Computer Suzhou Co Ltd
Priority to CN201811200535.8A priority Critical patent/CN111060723B/en
Publication of CN111060723A publication Critical patent/CN111060723A/en
Application granted granted Critical
Publication of CN111060723B publication Critical patent/CN111060723B/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded

Abstract

A probe fixing component is used for fixing a probe. The probe fixing component comprises a supporting rod, a telescopic rod and a spring chuck. The telescopic rod is pivoted on the supporting rod. The spring chuck is positioned at one end of the telescopic rod far away from the supporting rod and used for clamping the probe rod. The spring chuck comprises a shell, at least one button and a plurality of elastic clamping pieces. The shell is provided with an inner wall surface and an outer wall surface which are opposite, and the inner wall surface surrounds an accommodating space. The button is protruded out of the outer wall surface of the shell. The elastic clamping piece protrudes from the inner wall surface of the shell to the accommodating space and is connected with the button, when the button is pressed, the elastic clamping piece synchronously shrinks towards the inner wall surface and stores elastic potential energy, so that the probe can be accommodated in the accommodating space, and when the button is released, the elastic clamping piece respectively moves towards the direction far away from the inner wall surface under the action of the elastic potential energy to clamp the probe. When the button is pressed, the elastic clamping piece is pulled to move towards the outer wall surface of the shell, and the spring in the elastic clamping piece is compressed, so that the probe is placed in the accommodating space.

Description

Probe fixing assembly
[ technical field ] A method for producing a semiconductor device
The present disclosure relates to a probe fixing assembly, and more particularly, to a probe fixing assembly capable of elastically adjusting a position of a probe.
[ background of the invention ]
Oscilloscopes and probes are often used in the process of measuring various signals of a mainboard. In order to place the probe perpendicular to the main board and avoid generating a loop, the signal wire and the gold pin point measurement need to be fixed by a manual or probe fixing device. However, in the conventional probe fixing device, the length and the angle of the probe bracket are limited, and the test requirements of all test points cannot be met. In addition, some conventional probe fixing devices have a suction cup at the clamping portion, but the bottom of the suction cup has a high requirement for the contact surface, and there is a sufficient space for placing the suction cup, and there is a requirement for the smoothness of the contact surface.
[ summary of the invention ]
Accordingly, the present disclosure provides an improved probe fixing assembly capable of fixing a probe at any angle.
According to the present disclosure, a probe fixing assembly for fixing a probe includes a support rod, a telescopic rod, and a collet. The telescopic rod is pivoted on the supporting rod. The spring chuck is positioned at one end of the telescopic rod far away from the supporting rod and used for clamping the probe rod. The spring chuck comprises a shell, at least one button and a plurality of elastic clamping pieces. The shell is provided with an inner wall surface and an outer wall surface which are opposite, and the inner wall surface surrounds an accommodating space. The button is protruded out of the outer wall surface of the shell. The elastic clamping piece protrudes from the inner wall surface of the shell to the accommodating space and is connected with the button, when the button is pressed, the elastic clamping piece contracts towards the inner wall surface synchronously and stores elastic potential energy, so that the probe can be accommodated in the accommodating space, and when the button is released, the elastic clamping piece moves towards the direction far away from the inner wall surface under the action of the elastic potential energy respectively to clamp the probe.
In one embodiment, the collet further comprises a plurality of pulleys, a connecting wire, and a connecting rod. The pulley is located in the housing. The connecting line is arranged on the pulley and penetrates out of the inner wall surface to be fixed on the top of the elastic clamping piece. The two ends of the connecting rod are respectively fixed on the connecting line between the button and the pulley.
In one embodiment, the connecting wire of the collet chuck is a steel wire.
In one embodiment, the elastic clamping pieces are symmetrically arranged in the accommodating space.
In one embodiment, the probe fixing assembly includes two buttons, and the buttons are symmetrically disposed on an outer wall surface of the housing.
In one embodiment, the collet chuck further comprises a plurality of cushions, each cushion being located on top of the resilient clamp.
In one embodiment, the telescopic rod comprises an accommodating part and an extending part. The accommodating part is pivoted to the support rod and internally provided with a first thread. The extension part extends out from the accommodating part, and the surface of the extension part is provided with a second thread coupled with the first thread.
In one embodiment, the telescopic rod further comprises a positioning member and a knob. The positioning piece is locked and attached to the accommodating part and abuts against the extending part. The knob passes through the accommodating part and is locked on the support rod.
In one embodiment, the probe fixing assembly further comprises a clamp located at an end of the support rod away from the telescopic rod.
In one embodiment, the clamp includes an elastic member, an upper plate, a lower plate, and a screw. The upper plate has screw holes. The lower plate and the upper plate are arranged oppositely. The two ends of the elastic piece are respectively connected with the upper plate and the lower plate. The screw is locked in the screw hole and protrudes toward the lower plate.
In one embodiment, the clamp further comprises a cushion pad located on the bottom surface of the screw.
In one embodiment, the clip further comprises a plurality of cushions respectively disposed on the bottom surface of the upper plate and the top surface of the lower plate.
In one embodiment, the jig further comprises a weight member located on a bottom surface of the lower plate.
In the above embodiments of the present disclosure, when the button is pressed, the elastic clamping members contract towards the inner wall surface of the housing synchronously and store elastic potential energy, and at this time, there is enough space between the elastic clamping members for the probe to be inserted. When the button is released, the elastic clamping piece can move towards the direction far away from the inner wall surface under the action of elastic potential energy, and then the probe is clamped. In addition, the bracing piece of probe fixing assembly can change the contained angle with the telescopic link, and the telescopic link can change length, but consequently the position of elastic adjustment probe.
[ description of the drawings ]
FIG. 1 is a side view of a probe fixing assembly according to one embodiment of the present disclosure;
FIG. 2 is a front view of the collet chuck of the probe fixing assembly of FIG. 1 as viewed in direction D;
FIG. 3 is a front view of the collet of FIG. 2 with the button depressed;
fig. 4 is a partially enlarged view of a clamp of the probe fixing assembly of fig. 1.
[ notation ] to show
100: probe fixing assembly
110: support rod
120: telescopic rod
122: accommodating part
123: first screw thread
124: extension part
125: second screw thread
126: locating piece
128: rotary knob
130: spring chuck
131: shell body
131 a: inner wall surface
131 b: outer wall surface
132: containing space
133: push button
133 a: push button
133 b: push button
134a, 134b, 134c, 134 d: elastic clamping piece
136: pulley wheel
136a, 136b, 136c, 136 d: pulley wheel
137: connecting wire
137a, 137 b: connecting wire
138: connecting rod
138a, 138 b: connecting rod
139: buffer cushion
139a, 139b, 139c, 139 d: buffer cushion
140: clamp apparatus
141: elastic piece
142: upper plate
143: buffer cushion
144: lower plate
145: buffer cushion
146: screw with a thread
147: buffer cushion
148: screw hole
149: weight member
D: direction of rotation
F: force of
Θ: included angle
[ detailed description ] embodiments
In the following description, for purposes of explanation, numerous implementation details are set forth in order to provide a thorough understanding of the various embodiments of the present disclosure. It should be understood, however, that the specific details of the various implementations are not to be interpreted as limiting the disclosure. That is, in some embodiments of the disclosure, details of the various implementations are not necessary. In addition, for the sake of simplicity, some conventional structures and elements are shown in the drawings in a simple schematic manner.
Fig. 1 is a side view of a probe fixing assembly 100 according to an embodiment of the present disclosure. As shown, the probe fixing assembly 100 includes a support rod 110, a telescopic rod 120, and a collet 130. The retractable rod 120 is pivotally connected to the support rod 110. The collet 130 is located at an end of the telescopic rod 120 away from the supporting rod 110 for holding the probe. The telescopic rod 120 includes an accommodating portion 122 and an extending portion 124. The accommodating portion 122 is pivotally connected to the support rod 110, the accommodating portion 122 has a first thread 123 therein, and the extending portion 124 extends from the accommodating portion 122.
Fig. 2 is a front view of the collet 130 of the probe fixing assembly 100 of fig. 1, viewed from direction D. Fig. 3 is a front view of collet 130 of fig. 2 as buttons 133a, 133b are depressed. Referring to fig. 2 and 3, the collet 130 includes a housing 131, buttons 133a and 133b, and elastic clamping members 134a, 134b, 134c, and 134 d. The housing 131 has an inner wall surface 131a and an outer wall surface 131b facing each other, and the inner wall surface 131a surrounds the accommodating space 132. For the sake of clarity of the structure of the collet 130, each element of fig. 2 and 3 is shown by a solid line, but actually, an element portion between the inner wall surface 131a and the outer wall surface 131b may be shielded by the housing 131. The buttons 133a and 133b protrude from the outer wall surface 131b of the case 131. Elastic clips 134a, 134b, 134c, 134d protrude from the inner wall surface 131a of the housing 131 into the accommodating space 132, the elastic clips 134a, 134b are connected to the button 133a, and the elastic clips 134c, 134d are connected to the button 133 b.
When the buttons 133a and 133b are pressed by the force F, the elastic clamping members 134a, 134b, 134c and 134d contract towards the inner wall surface 131a and store elastic potential energy, so that the probe can be accommodated in the accommodating space 132, as shown in fig. 3. There is sufficient space between the resilient clips 134a, 134b, 134c, 134d for the probe to be received. When the buttons 133a, 133b are released, the elastic holding pieces 134a, 134b, 134c, 134d are respectively moved in a direction away from the inner wall surface 131a by the elastic potential energy, as shown in fig. 2. At this time, the space between the elastic holding members 134a, 134b, 134c, 134d is reduced, and the probe can be held.
In this embodiment, the collet 130 further includes pulleys 136a, 136b, 136c, 136d, connection lines 137a, 137b, and connection rods 138a, 138 b. Pulleys 136a, 136b, 136c, 136d are located in the housing 131. The connection line 137a is provided on the pulleys 136a and 136b, and is passed through the inner wall surface 131a and fixed to the tops of the elastic clamps 134a and 134 b. The connection line 137b is provided on the pulleys 136c and 136d, and is fixed to the tops of the elastic clamps 134c and 134d by passing through the inner wall surface 131 a. The connecting rod 138a has both ends fixed to the connecting line 137a between the button 133a and the pulleys 136a and 136b, respectively. The connecting rod 138b has both ends fixed to the connecting line 137b between the button 133b and the pulleys 136c and 136d, respectively. In the present embodiment, the connection wire 137a and the connection wire 137b of the collet 130 are steel wires, but not limited thereto.
In the present embodiment, the buttons 133a and 133b of the collet 130 are symmetrically disposed on the outer wall surface 131b of the housing 131. The elastic clamping pieces 134a and 134c are symmetrically disposed in the accommodating space 132, and the elastic clamping pieces 134b and 134d are symmetrically disposed in the accommodating space 132. Such a configuration is beneficial for stability when holding the probe.
When the push buttons 133a and 133b are pressed by the force F, the push buttons 133a and 133b respectively drive the connecting rods 138a and 138b to move toward the accommodating space 132. At this time, the connecting rod 138a presses the connecting line 137a between the pulleys 136a and 136b, so that the connecting line 137a pulls the elastic clamping members 134a and 134b into the inner wall surface 131a (i.e., moves toward the outer wall surface 131 b), and stores elastic potential energy. Similarly, the connecting rod 138b may press the connecting wire 137b between the pulleys 136c, 136d such that the connecting wire 137b pulls the elastic clamping members 134c, 134d into the inner wall surface 131 a. In this way, there is enough space between the elastic clamping members 134a, 134b, 134c, 134d to receive the probe, as shown in fig. 3. When the push buttons 133a and 133b are released, the elastic holding pieces 134a, 134b, 134c, 134d are respectively moved in a direction away from the inner wall surface 131a by the elastic potential energy. At this time, the elastic clips 134a and 134b pull the connection line 137a, and the button 133a is moved in a direction protruding from the outer wall surface 131b by the force of the connection line 137 a. Similarly, the elastic clamping members 134c and 134d pull the connecting wire 137b, so that the button 133b is forced by the connecting wire 137b to move in the direction of protruding the outer wall surface 131 b. In this way, the probe can be clamped between the elastic clamping members 134a, 134b, 134c, 134d, as shown in fig. 2.
In this embodiment, the probe fixing assembly 100 further includes cushion pads 139a, 139b, 139c, 139 d. A cushion 139a is located on top of resilient clip 134a, a cushion 139b is located on top of resilient clip 134b, a cushion 139c is located on top of resilient clip 134c, and a cushion 139d is located on top of resilient clip 134 d. In the present embodiment, the cushion pads 139a, 139b, 139c, 139d may be made of rubber, but not limited thereto. The cushion pads 139a, 139b, 139c, 139d can increase the friction force with the probe when the elastic clamping pieces 134a, 134b, 134c, 134d clamp the probe, thereby preventing the probe from falling.
Referring to fig. 1, in the present embodiment, the accommodating portion 122 of the telescopic rod 120 has a first thread 123 therein, and the surface of the extending portion 124 of the telescopic rod 120 has a second thread 125 coupled to the first thread 123. Since the first thread 123 and the second thread 125 are coupled, the extension 124 can be rotated out of the accommodating portion 122 or the extension 124 can be rotated into the accommodating portion 122 from the outside by rotating the extension 124. By rotating the extension part 124, the total length of the telescopic rod 120 can be adjusted. Thus, when the collet 130 holds the probe, the extension 124 can be rotated to adjust the position of the probe.
In this embodiment, the telescoping rod 120 further comprises a positioning member 126. The positioning member 126 is locked to the accommodating portion 122 and abuts against the extending portion 124. When the extension part 124 is adjusted to a proper length, the positioning member 126 locked to the accommodating part 122 can be rotated, so that the positioning member 126 abuts against the extension part 124 to fix the extension part 124, thereby preventing the length of the telescopic rod 120 from being changed in the process of measurement. In addition, the telescoping rod 120 also includes a knob 128. The retractable rod 120 can pivot on the supporting rod 110. An included angle Θ is formed between the supporting rod 110 and the telescopic rod 120. After the included angle Θ is adjusted, the knob 128 passing through the accommodating portion 122 can be locked to the supporting rod 110 to fix the accommodating portion 122.
Fig. 4 is a partially enlarged view of the clamp 140 of the probe fixing assembly 100 of fig. 1. Referring to fig. 1 and 4, the probe fixing assembly 100 further includes a clamp 140, and the clamp 140 is disposed at an end of the supporting rod 110 away from the telescopic rod 120. The clamp 140 includes an elastic member 141, an upper plate 142, a lower plate 144, and a screw 146. The upper plate 142 has screw holes 148. The lower plate 144 is disposed opposite the upper plate 142. The screw 146 is locked to the screw hole 148 and protrudes toward the lower plate 144.
In the embodiment, the probe fixing assembly 100 can fix the clamp 140 to the edge of the motherboard or the operation platform, so that the probe clamped by the collet chuck 130 can be positioned at the test point of the motherboard to be tested, which not only saves labor, but also improves the accuracy of measurement. When the clamping device 140 is used, the upper plate 142 and the lower plate 144 of the clamping device 140 (e.g., the right ends of the upper plate 142 and the lower plate 144 in fig. 4) are pressed to compress the elastic member 141, and the clamping device 140 can approach the main board or the console to be located between the upper plate 142 and the lower plate 144. When the upper plate 142 and the lower plate 144 of the clamp 140 are released, the upper plate 142 and the lower plate 144 are abutted against the edge of the motherboard or the console by the elastic force of the elastic member 141. In this state, the screw 146 penetrating through the upper plate 142 can be rotated, so that the bottom of the screw 146 abuts against the edge of the main board or the operation table, thereby further improving the stability.
In this embodiment, the clamp 140 further includes cushions 143, 145. The cushion pads 143, 145 are located on the bottom surface of the upper plate 142 and the top surface of the lower plate 144, respectively. The cushion pads 143, 145 may be made of rubber, but not limited thereto. The buffer pads 143 and 145 on the upper plate 142 and the lower plate 144 can be used as the contact surfaces between the clamp 140 and the edge of the motherboard or the console, and the friction force can be increased by the buffer pads 143 and 145, so that the stability is improved, and the shock absorbing capability is provided.
In the present embodiment, the jig 140 further includes a cushion 147. A cushion 147 is located on the bottom surface of the screw 146. After the upper plate 142 and the lower plate 144 are fixed to the edge of the motherboard or the console, the screws 146 may be rotated to make the cushion 147 abut against the edge of the motherboard or the console, so as to increase the pressure and increase the friction force, thereby achieving a more complete fixing effect. The material of the cushion pad 147 may be rubber, but is not limited thereto.
In this embodiment, the clamp 140 further includes a weight 149. The weight 149 is located on the bottom surface of the lower plate 144. In this embodiment, the counterweight may be an iron block, but is not limited thereto. By adding the weight member, the weight of the probe fixing assembly 100 is more concentrated on the portion of the bottom clamp 140 (i.e., the effect of the downward movement of the center of gravity), so as to further improve the stability of the probe fixing assembly 100.
Although the present disclosure has been described with reference to particular embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present disclosure, and it is intended that the scope of the present disclosure be limited only by the terms of the appended claims.

Claims (12)

1. A probe fixing assembly for fixing a probe, the probe fixing assembly comprising:
a support bar;
the telescopic rod is pivoted to the supporting rod; and
collet chuck is located the telescopic link is kept away from the one end of bracing piece for the centre gripping the probe, collet chuck contains:
the shell is provided with an inner wall surface and an outer wall surface which are opposite, and the inner wall surface surrounds an accommodating space;
at least one button protruding from the outer wall surface of the shell;
a plurality of elastic clamping pieces which protrude from the inner wall surface of the shell to the accommodating space and are connected with the buttons,
a plurality of pulleys located in the housing;
the connecting line is arranged on the pulleys, penetrates out of the inner wall surface and is fixed on the tops of the elastic clamping pieces; and
a connecting rod, both ends of the connecting rod are respectively fixed on the connecting lines between the button and the pulleys,
when the button is pressed, the elastic clamping pieces synchronously contract towards the inner wall surface and store elastic potential energy, so that the probe can be contained in the containing space, and when the button is released, the elastic clamping pieces respectively move towards the direction far away from the inner wall surface under the action of the elastic potential energy so as to clamp the probe.
2. The probe fixing assembly of claim 1, wherein the connecting wire is a steel wire.
3. The probe fixing assembly of claim 1, wherein the plurality of elastic clamping members are symmetrically disposed in the accommodating space.
4. The probe holder assembly of claim 1, wherein the probe holder assembly comprises two buttons, the two buttons being symmetrically disposed on the outer wall of the housing.
5. The probe securing assembly of claim 1, wherein the collet further comprises:
and the buffer pads are respectively positioned at the tops of the elastic clamping pieces.
6. The probe securing assembly of claim 1, wherein the telescoping rod comprises:
the accommodating part is pivoted to the supporting rod and internally provided with a first thread; and
an extension extending from the receiving portion, wherein a surface of the extension has a second thread coupled to the first thread.
7. The probe securing assembly of claim 6, wherein the telescoping rod further comprises:
the positioning piece is locked and attached to the accommodating part and abuts against the extending part; and
and the knob penetrates through the accommodating part and is locked and attached to the supporting rod.
8. The probe securing assembly of claim 1, further comprising:
and the clamp is positioned at one end of the supporting rod, which is far away from the telescopic rod.
9. The probe securing assembly of claim 8, wherein the clamp comprises:
an upper plate having screw holes;
a lower plate disposed opposite to the upper plate;
the two ends of the elastic piece are respectively connected with the upper plate and the lower plate; and
a screw locked to the screw hole and protruding toward the lower plate.
10. The probe securing assembly of claim 9, wherein the clamp further comprises:
and the buffer cushion is positioned on the bottom surface of the screw.
11. The probe securing assembly of claim 9, wherein the clamp further comprises:
and the cushion pads are respectively positioned on the bottom surface of the upper plate and the top surface of the lower plate.
12. The probe securing assembly of claim 9, wherein the clamp further comprises:
and the counterweight is positioned on the bottom surface of the lower plate.
CN201811200535.8A 2018-10-16 2018-10-16 Probe fixing assembly Active CN111060723B (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
CN201811200535.8A CN111060723B (en) 2018-10-16 2018-10-16 Probe fixing assembly

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CN111060723B true CN111060723B (en) 2022-04-29

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Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1309160A (en) * 1969-12-22 1973-03-07 Ibm Electrical test probe assembly
CN101097230A (en) * 2006-06-30 2008-01-02 佛山市顺德区顺达电脑厂有限公司 Supporting device for measurement probe
CN201600389U (en) * 2009-12-28 2010-10-06 珠海优特电力科技股份有限公司 Sensor bracket
CN201615789U (en) * 2010-03-18 2010-10-27 杭州创惠仪器有限公司 Probe fixing bracket
CN102338812A (en) * 2010-07-21 2012-02-01 神讯电脑(昆山)有限公司 Sensitive rod testing bracket
TW201226909A (en) * 2010-12-24 2012-07-01 Hon Hai Prec Ind Co Ltd Fixing device for probe
CN206057375U (en) * 2016-08-23 2017-03-29 南京联能电力检测研究所有限公司 A kind of probe for Partial Discharge Detection fixes expansion link
CN107748278A (en) * 2017-09-22 2018-03-02 安徽皖通邮电股份有限公司 A kind of oscillograph control head auxiliary test unit

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1309160A (en) * 1969-12-22 1973-03-07 Ibm Electrical test probe assembly
CN101097230A (en) * 2006-06-30 2008-01-02 佛山市顺德区顺达电脑厂有限公司 Supporting device for measurement probe
CN201600389U (en) * 2009-12-28 2010-10-06 珠海优特电力科技股份有限公司 Sensor bracket
CN201615789U (en) * 2010-03-18 2010-10-27 杭州创惠仪器有限公司 Probe fixing bracket
CN102338812A (en) * 2010-07-21 2012-02-01 神讯电脑(昆山)有限公司 Sensitive rod testing bracket
TW201226909A (en) * 2010-12-24 2012-07-01 Hon Hai Prec Ind Co Ltd Fixing device for probe
CN206057375U (en) * 2016-08-23 2017-03-29 南京联能电力检测研究所有限公司 A kind of probe for Partial Discharge Detection fixes expansion link
CN107748278A (en) * 2017-09-22 2018-03-02 安徽皖通邮电股份有限公司 A kind of oscillograph control head auxiliary test unit

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