CN101097230A - Supporting device for measurement probe - Google Patents
Supporting device for measurement probe Download PDFInfo
- Publication number
- CN101097230A CN101097230A CNA2006100363049A CN200610036304A CN101097230A CN 101097230 A CN101097230 A CN 101097230A CN A2006100363049 A CNA2006100363049 A CN A2006100363049A CN 200610036304 A CN200610036304 A CN 200610036304A CN 101097230 A CN101097230 A CN 101097230A
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- Prior art keywords
- supporting device
- probe
- measurement probe
- block
- joint portion
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Abstract
A kind of supporting device of measuring probe is used to clamp probe and fix to the circuit board to be measured, the supporting device includes base and several flex arms, the base possesses several first joining parts, the flex arm possesses the second joining part corresponding with the first joining part, and clamping part which is used to clamp the probe, so when the probe clamped by the clamping part of flex arm resists to the measuring point, the base can be set above the circuit board relatively, so the supporting device can resolve defects of current fixing probe.
Description
[technical field]
The relevant a kind of supporting device for measurement probe of the present invention is meant especially and a kind of probe is fixed in the supporting device for measurement probe of circuit board with measurement signal.
[background technology]
Oscillograph has been widely used in the electrical measurement of circuit board, with one or many probes be electrically connected at oscillograph, to be contacted with on the circuit board and measurement signal, in early days with an anchor clamps clamping probe, and the insulation position of hand-held these anchor clamps of user is temporarily to be fixed in probe the point of institute's desire measurement.
Yet, if circuit board is the mainframe plate, often must carry out multiple point measuring simultaneously, if with manual support, when measuring more than 3, certainly will increase staff, thereby cause the waste of manpower, and support probe with hand, the risk of easy slip is also arranged, also accuracy of measurement is caused negative effect.
See also Fig. 1, Taiwan discloses No. 200528721 patent of invention and discloses a kind of auxiliary fixer, auxiliary fixer 1 is provided with the support of foot rest 10 for integral body in the bottom, on foot rest 10 and be articulated with rod member 11, this rod member 11 also is articulated with adjustment plate 12, then be provided with anchor clamps 13 on this adjustment plate 12, borrow these anchor clamps 13 clamping probes (not graphic), and by rod member 11, adjust plate 12 and adjust angles and on circuit board (not icon), measure.
Though utilize this auxiliary fixer 1 firmly the clamping probe rock avoiding, auxiliary fixer 1 must be arranged at outside the circuit board, if carry out multiple point measuring, will occupy too much space.
Moreover, when the user carries out the multiple point measuring of circuit board, must consider the position that is provided with of each auxiliary fixer 1 in advance, when avoiding desiring carrying out measurement wherein, force the situation of the necessary removal of probe that has fixed to take place, yet no matter be to reach the phase mutually noninterfere through concrete plan, or the situation must removal reset again takes place, all can cause the tediously long of measurement time, and make efficient clear, and in Electronics Factory, all obtain every day and transmit and next faulty circuit plate from client in a large number, if the measurement of signal must be spent the plenty of time, will delay finishing of maintenance.
Therefore, how to improve above various shortcoming, be the problem of demanding urgently now thinking deeply.
[summary of the invention]
The shortcoming of prior art in view of the above, a purpose of the present invention are to provide many probes of a kind of clamping simultaneously to carry out the supporting device for measurement probe of multiple point measuring.
Another purpose of the present invention is provided with the space for a kind of supporting device for measurement probe is provided with saving.
Another object of the present invention makes to measure accurately for a kind of supporting device for measurement probe is provided.
For reaching above-mentioned purpose, the invention provides a kind of supporting device for measurement probe, be used for the clamping probe and supply being arranged on circuit board under test, this supporting device for measurement probe comprises: pedestal has several first joint portions; And several telescopic arms, have in order to correspondence and be incorporated into second joint portion of this first joint portion and in order to the clamping part of this probe of clamping, when supporting to arrive in the gauge point at this circuit board at the probe of the clamping part clamping of these several telescopic arms respectively, this pedestal can be soared relatively is arranged on this circuit board top.
Respectively this probe is electrically connected at an oscillograph, with measure signal, and this circuit board is the motherboard of personal computer, server and mobile computer etc.The support stick that comprises at least one insulation again is for this clamping part clamping, and this probe and this support stick are held on the sum of this clamping part and have the three at least, to support this pedestal.
Preferably, respectively this telescopic arm has several steering connections or flexible to reach by several snake belly tubes composition.This pedestal is an insulating base, comprise mutual rotation combination first, second, and the 3rd block, respectively this block is cuboid, and this second and third block is provided with this first joint portion at least.
Implement in the aspect one, this first joint portion is the externally threaded bulge loop of tool, but and this second joint portion for independent rotation and corresponding to the externally threaded ring that screws togather.
Implement in the aspect at another, this first joint portion is the slide rail that is formed at these pedestal both sides, more detailed it, this first joint portion is the slide rail that is formed in this second, third block, and the section that makes second, third this block is formed with and is communicated in outside T v notch v, and this second joint portion is the corresponding slide block that is slidedly arranged on this slide rail, adjusts the measurement position of this probe to slide along this slide rail.
Desire to measure, then this pedestal is placed the rough middle position of circuit board, then can be easily by the utilization of corresponding first joint portion of the determining positions of desire gauge point, after connecting telescopic arm, if the point that the institute desire measures is greater than the three, then three probes support several block thus, and if the point that the institute desire measures less than the three, then can consider extra draw-tube is set, and the clamping support stick supports this pedestal to be connected to circuit board to cooperate with probe on the clamping part of this draw-tube end.
Support probe built on the sand compared to existing with staff, supporting device for measurement probe of the present invention can stably be fixed on probe the point that desire measures on the circuit board, and phenomenons such as unlikely generation is rocked, skew.
Though but device clamping probes such as auxiliary fixed mount are arranged, but but a tool is assisted only clamping one probe of fixed mount, and should be arranged on the circuit board outside by auxiliary fixed mount, and take big quantity space, and supporting device for measurement probe of the present invention position is above circuit board, do not take additional space, and can many probes of a clamping, no matter all be far more than existing auxiliary fixed mount in the convenience of saving aspect, space or use.
In addition, the probe that is provided with before and after having during existing auxiliary fixed mount produces on the line and interferes with each other, the probe elder generation removal that causes will having fixed is reset again, and cause tediously long situation of measurement time, supporting device for measurement probe of the present invention then can be by the utilization of corresponding first joint portion of the position judgment of desire gauge point, takes place and reduce the puzzlement that circuit interferes mutually.
Moreover the telescopic arm of supporting device for measurement probe of the present invention is borrowed its scalability, makes that any point all can be touched by probe easily by above adjustment on the circuit board.
As from the foregoing, supporting device for measurement probe of the present invention can improve existing shortcoming, has high industrial utilization in fact.
[description of drawings]
But Fig. 1 discloses the synoptic diagram of the auxiliary fixer of clamping probe for No. 200528721 patent of invention in Taiwan.
Fig. 2 is supporting device for measurement probe one a preferred embodiment vertical view of the present invention.
Fig. 3 is the synoptic diagram that supporting device for measurement probe of the present invention is used.
Fig. 4 is partly oblique angle and a cut-open view of another specific embodiment of supporting device for measurement probe of the present invention.
[embodiment]
Below by particular specific embodiment explanation embodiments of the present invention, the personage who has the knack of this skill can understand other advantage of the present invention and effect easily by the content that this instructions disclosed.The present invention also can be implemented or be used by other different specific embodiment, and the every details in this instructions also can be carried out various modifications and change based on different viewpoints and application under not departing from spirit of the present invention.Other it should be noted that, below the graphic signal that is simplification graphic, and basic conception of the present invention only is described in a schematic way, satisfy and only show the assembly relevant in graphic but not component count, shape and size drafting when implementing according to reality with the present invention, kenel, quantity and the ratio of each assembly can be a kind of random change during its actual enforcement, and its assembly layout kenel may be more complicated.
See also Fig. 2, Fig. 2 is supporting device for measurement probe one a preferred embodiment vertical view of the present invention.Supporting device for measurement probe 2 of the present invention comprises pedestal 20 and several telescopic arms 21, wherein this pedestal 20 has several first joint portions 201, and respectively this telescopic arm 21 has second joint portion 211 and the clamping part 218 that is incorporated into this first joint portion 201 in order to correspondence.
This pedestal 20 is an insulating base, comprises first block 202, second block 203, and the 3rd block 204 of mutual rotation combination, and this second block 203 and the 3rd block 204 are provided with this first joint portion 201 at least.Respectively this block is cuboid, and this second block 203 and the 3rd block 204 are coupling respectively in these first block, 202 both sides to reach the rotation marriage relation.
This first joint portion 201 is a tool external thread bulge loop, but and this second joint portion 211 for independent rotation and corresponding to this externally threaded ring that screws togather, so that this telescopic arm 21 is incorporated into this pedestal 20.It is flexible to reach that respectively this telescopic arm 21 has several steering connections 212, and certainly, respectively this telescopic arm 21 also can be for example flexible to reach by several snake belly tubes composition.
Please cooperate simultaneously and consult Fig. 3, Fig. 3 is used for clamping probe 4 and supplies to be arranged on circuit board under test 3 for supporting device for measurement probe 2 of the present invention, and respectively this clamping part 218 supplies clamping probe 4, with order respectively the probe 4 of clamping part 218 clampings of these several telescopic arms 21 support to arrive in gauge point at this circuit board 3, be arranged on this circuit board 3 tops and this pedestal 20 soared relatively.The motherboard of these circuit board 3 personal computers, server and mobile computer wherein one.Respectively this probe 4 is electrically connected at oscillograph 6, and recording signal, and the support stick 5 that comprises at least one insulation again is for clamping parts 218 clampings, and this probe 4 and this support stick 5 are held on the sum of this clamping part 218 and have the three at least, to support this pedestal 20.
Please cooperate and consult Fig. 4, Fig. 4 is a partly synoptic diagram of another specific embodiment of supporting device for measurement probe of the present invention, first joint portion 201 is for being formed at the slide rail of these pedestal 20 relative both sides, more detailed it, for being formed at the slide rail in this second block 203 and the 3rd block 204, and the section that makes this second block 203 and the 3rd block 204 is formed with and is communicated in outside T v notch v, and second joint portion 211 of this telescopic arm 21 is for for example be the slide block that the solid mode of spiral shell is incorporated into this telescopic arm 21, and and can be for being slidedly arranged on the measurement position of this slide rail with the adjustment probe 4 that slides along this passage.
It should be noted, pedestal 20 that is slidingly connected and telescopic arm 21, also can arrange in pairs or groups some location structures with the positioning combination position, for example on this telescopic arm, be provided with and fit in the lamellar body that these pedestal 20 surfaces and tool run through perforate, and bore the system screw along the path that this perforate is passed through on this pedestal 20, can establish a tap bolt by bolt or in this perforate and locate this telescopic arm 21.Many locator meamss are arranged certainly in addition, and the thought location structure is various and be prior art, Gu enumerate no longer one by one.
In sum, desire to measure, then pedestal 20 is placed the rough middle position of circuit board, then can be easily by the utilization of corresponding first joint portion 201 of the determining positions of desire gauge point, after connecting telescopic arm 21, if the point that institute's desire measures is greater than the three, three probes, 4 supporting bases 20 thus then, and if the point that the institute desire measures less than the three, then can consider extra draw-tube 21 is set, and clamping support stick 5 supports this pedestal 20 to be connected to circuit board 3 to cooperate with probe 4 on the clamping part 218 of these draw-tube 21 ends.
Support probe built on the sand compared to existing with staff, supporting device for measurement probe of the present invention can stably be fixed in probe the point that desire measures on the circuit board, and phenomenons such as unlikely generation is rocked, skew.
Though but device clamping probes such as auxiliary fixed mount are arranged, but but a tool is assisted only clamping one probe of fixed mount, and should be arranged on the circuit board outside by auxiliary fixed mount, and take big quantity space, and supporting device for measurement probe of the present invention position is above circuit board, do not take additional space, and can many probes of a clamping, no matter all be far more than existing auxiliary fixed mount in the convenience of saving aspect, space or use.
In addition, the probe that is provided with before and after having during existing auxiliary fixed mount produces on circuit and interferes with each other, the probe elder generation removal that causes will having fixed is reset again, and cause tediously long situation of measurement time, supporting device for measurement probe of the present invention then can be provided with the utilization of portion by the position judgment correspondence of desire gauge point, and reduces the puzzlement generation that circuit is interfered mutually.
Moreover the telescopic arm of supporting device for measurement probe of the present invention is borrowed its scalability, makes that any point all can be touched by probe easily on the circuit board.
As from the foregoing, supporting device for measurement probe of the present invention can improve existing shortcoming, has high industrial utilization in fact.
Claims (13)
1, a kind of supporting device for measurement probe, it is used for the clamping probe and for being arranged at circuit board under test, it is characterized in that this supporting device for measurement probe comprises:
Pedestal, it has several first joint portions;
Several telescopic arms, it has in order to correspondence and is incorporated into second joint portion of this first joint portion and in order to the clamping part of this probe of clamping, when the probe of the clamping part clamping of these several telescopic arms respectively supports to arrive in gauge point in this circuit board, this pedestal is arranged on this circuit board top.
2, according to the supporting device for measurement probe of claim 1, it is characterized in that: its support stick that also comprises at least one insulation is for this clamping part clamping, and this probe and this support stick are held on the sum of this clamping part and have the three at least, to support this pedestal.
3, according to the supporting device for measurement probe of claim 1, it is characterized in that: this pedestal comprises first and second and the 3rd block of mutual rotation combination, and this second and third block is provided with this first joint portion at least.
4, according to the supporting device for measurement probe of claim 3, it is characterized in that: this second and third block is coupling respectively in these first block both sides to reach the rotation marriage relation.
5, according to the supporting device for measurement probe of claim 4, it is characterized in that: this first, second, and the 3rd block be cuboid.
6, according to the supporting device for measurement probe of claim 3, it is characterized in that: this first joint portion is the slide rail that is formed in this second, third block, and the section that makes this second, third block is formed with and is communicated in outside T v notch v, and this second joint portion is the corresponding slide block that is slidedly arranged on this slide rail, adjusts the measurement position of this probe for sliding along this slide rail.
7, according to the supporting device for measurement probe of claim 6, it is characterized in that: this slide block is fixed at this telescopic arm.
8, according to the supporting device for measurement probe of claim 1, it is characterized in that: this first joint portion is the externally threaded bulge loop of tool, but and this second joint portion is independent rotation and corresponding to this externally threaded ring that screws togather.
9, according to the supporting device for measurement probe of claim 1, it is characterized in that: respectively this telescopic arm has several steering connections.
10, according to the supporting device for measurement probe of claim 1, it is characterized in that: respectively this telescopic arm is made up of several snake belly tubes.
11, according to the supporting device for measurement probe of claim 1, it is characterized in that: respectively this probe is electrically connected at an oscillograph, with measure signal.
12, according to the supporting device for measurement probe of claim 1, it is characterized in that: this pedestal is an insulating base.
13, according to the supporting device for measurement probe of claim 1, it is characterized in that: this first joint portion is the slide rail that is formed at these pedestal both sides, and this second joint portion is the corresponding slide block that is slidedly arranged on this slide rail.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100363049A CN100552455C (en) | 2006-06-30 | 2006-06-30 | Supporting device for measurement probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2006100363049A CN100552455C (en) | 2006-06-30 | 2006-06-30 | Supporting device for measurement probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101097230A true CN101097230A (en) | 2008-01-02 |
| CN100552455C CN100552455C (en) | 2009-10-21 |
Family
ID=39011216
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2006100363049A Expired - Fee Related CN100552455C (en) | 2006-06-30 | 2006-06-30 | Supporting device for measurement probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100552455C (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101988929A (en) * | 2009-08-03 | 2011-03-23 | 鸿富锦精密工业（深圳）有限公司 | Fine adjustment device |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN111060723A (en) * | 2018-10-16 | 2020-04-24 | 名硕电脑(苏州)有限公司 | Probe fixing assembly |
-
2006
- 2006-06-30 CN CNB2006100363049A patent/CN100552455C/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101988929A (en) * | 2009-08-03 | 2011-03-23 | 鸿富锦精密工业（深圳）有限公司 | Fine adjustment device |
| CN101988929B (en) * | 2009-08-03 | 2014-03-26 | 鸿富锦精密工业（深圳）有限公司 | Fine adjustment device |
| CN102338812A (en) * | 2010-07-21 | 2012-02-01 | 神讯电脑(昆山)有限公司 | Sensitive rod testing bracket |
| CN111060723A (en) * | 2018-10-16 | 2020-04-24 | 名硕电脑(苏州)有限公司 | Probe fixing assembly |
| CN111060723B (en) * | 2018-10-16 | 2022-04-29 | 名硕电脑(苏州)有限公司 | Probe fixing assembly |
Also Published As
| Publication number | Publication date |
|---|---|
| CN100552455C (en) | 2009-10-21 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20091021 Termination date: 20120630 |