CN219320432U - Low-speed signal testing jig - Google Patents

Abstract

The utility model relates to the technical field of signal testing, and discloses a low-speed signal testing jig which comprises a jig main body, a jig bracket and a probe. The jig main body is arranged on the jig support, the jig support can be placed on a PCB to be tested, and a through hole is formed in the PCB to be tested at a point to be tested. One end of the probe is connected with the jig main body, the position of the probe on the jig main body is adjustable, and the other end of the probe can be inserted into the through hole. The test fixture acquires a low-speed signal through the insertion connection of the probe and the through hole, so that the probe is in surface contact with the point to be tested, the contact area is increased, the probe is in good contact with the point to be tested, and the quality of the test signal is ensured. The existence of tool support and tool main part can liberate both hands, need not alone handheld probe of tester in the testing process, and one can accomplish test work, has improved efficiency of software testing, saves the cost of labor. The position of the probe is adjusted to test signals of the points to be tested at different positions of the PCB to be tested, so that the universality is high.

Description

Low-speed signal testing jig

Technical Field

The utility model relates to the technical field of signal testing, in particular to a low-speed signal testing jig.

Background

The server is a device for providing computing service, and for the server, a plurality of signals including high-speed signals, low-speed signals and the like are supported on a PCB (printed circuit board), and the signals need to be tested before the server is put into use so as to ensure that the server can normally operate.

In the prior art, for testing low-speed signals, a point measurement method is generally adopted, namely, a probe of a handheld oscilloscope cable is contacted with a to-be-measured point to carry out measurement, poor contact is easy to occur in the test method, so that waveforms grabbed by the oscilloscope cannot be used for later analysis, and re-measurement is needed. Moreover, the testing mode is completed by two persons in a matched mode, one person contacts the to-be-tested point by using the probe, and the other person operates the oscilloscope, so that the testing steps are complicated, the testing efficiency is low, and the research and development progress is influenced.

Therefore, a low-speed signal testing fixture is needed to solve the above-mentioned problems.

Disclosure of Invention

Based on the problems, the utility model aims to provide a low-speed signal testing jig which can facilitate the testing of low-speed signals, ensure the quality of the tested signals, has high testing efficiency and saves labor.

In order to achieve the above purpose, the utility model adopts the following technical scheme:

provided is a low-speed signal test fixture, comprising:

the jig comprises a jig main body and a jig bracket, wherein the jig main body is installed on the jig bracket, the jig bracket is configured to be placed on a PCB to be tested, and a through hole is formed in the PCB to be tested at a point to be tested;

and one end of the probe is connected with the jig main body, the position of the probe on the jig main body is adjustable, the other end of the probe can be inserted into the through hole, and the probe is configured to be electrically connected with an oscilloscope.

As the preferable scheme of the low-speed signal testing jig, the jig main body is provided with the guide chute, one end, connected with the jig main body, of the probe is provided with the sliding part, and the sliding part is positioned in the guide chute and can be in sliding fit with the guide chute. The probe and the jig main body are in sliding connection, so that the position of the probe is more convenient to adjust, the probe is favorably inserted into the through hole at the point to be tested in a quick alignment manner, and the test efficiency is improved.

As the preferable scheme of the low-speed signal testing jig, the low-speed signal testing jig further comprises an outer joint, wherein the jig main body is provided with a mounting hole communicated with the guide chute, the outer joint is positioned in the mounting hole, one end of the outer joint can be electrically connected with the probe, and the other end of the outer joint is configured to be connected with the oscilloscope. The setting of external connection provides the convenience for the connection of oscilloscope and probe, can realize both quick connect and dismantlement, is favorable to further improving efficiency of software testing.

As a preferable scheme of the low-speed signal testing jig, a conductor is embedded in the guide chute along the moving direction of the probe, the outer joint is connected with the conductor, and the probe is in sliding contact with the conductor through the sliding part. Through set up the conductor in the direction spout for the probe no matter slide to which position homoenergetic is connected with the external connection through the conductor, thereby makes the probe pass through the external connection and be connected with the electricity of oscilloscope, realizes signal transmission.

As the preferred scheme of the low-speed signal testing jig, a plurality of probes are arranged, a plurality of guide sliding grooves are formed in the jig main body, the probes are in one-to-one correspondence with the guide sliding grooves, the probes comprise a first probe, a second probe and a third probe, the first probe and the second probe are used for measuring low-speed signals on the PCB to be tested, the third probe is a reference probe of the first probe and the second probe, and the first probe, the second probe and the third probe are in sliding connection with the corresponding guide sliding grooves through the sliding parts. Through the cooperation of a plurality of probes and a plurality of guide runners for this test fixture can measure a plurality of signals on the PCB board that awaits measuring simultaneously, improves efficiency of software testing. By setting the probe III as a reference of the probe I and the probe II, the stability and the measurement accuracy of signals measured by the probe I and the probe II can be improved.

As the preferable scheme of the low-speed signal testing jig, the jig bracket comprises a first support column and a second support column with adjustable lengths, and the first support column and the second support column are respectively arranged at two ends of the jig main body along the length direction. The first support column and the second support column can stably support the jig main body on the PCB to be tested, interference between the jig main body and other components on the PCB to be tested is avoided, interference between the first support column and the second support column on sliding of the probe relative to the jig main body is prevented, meanwhile, the existence of the first support column and the second support column can prevent the gravity of the jig main body from acting on the probe completely, and deformation of the probe is prevented. The first support column and the second support column are both set to be adjustable in length, the position of the probe can be conveniently adjusted in the early stage, the probe is prevented from interfering with the PCB to be tested when the probe is moved, and the probe is conveniently inserted into the through hole in the later stage.

As the preferable scheme of the low-speed signal testing jig, the first support column and the second support column comprise fixed sleeves and telescopic rods which are slidably arranged in the fixed sleeves, and one ends of the telescopic rods, which extend out of the fixed sleeves, are connected with the jig main body. The whole length of the first support column and the second support column can be adjusted by adjusting the length of the telescopic rod extending out of the fixed sleeve, and the height of the jig main body relative to the PCB to be measured is convenient to adjust.

As the preferable scheme of the low-speed signal testing jig, the first support column and the second support column are respectively provided with an adsorption piece at one end far away from the jig main body, and the adsorption pieces can be adsorbed on the PCB to be tested. The setting of absorbing the accessory can make the whole stability of tool support place on the PCB board that awaits measuring, prevents that the tool main part from rocking to guarantee the quality of probe test signal. Meanwhile, the absorption part can realize detachable connection of the jig support and the PCB to be tested, so that the whole test jig is convenient to assemble and disassemble, and the test work efficiency is improved.

As a preferable scheme of the low-speed signal testing jig, the cross-sectional area of the probe is gradually reduced along the direction of inserting the probe into the through hole. That is, the whole probe is conical, so that the smoothness of the insertion can be improved when the probe is inserted into the via hole at the position of the to-be-detected point, and the end part of the probe is prevented from interfering with the edge of the via hole.

As the preferable scheme of the low-speed signal testing jig, the jig main body and the jig bracket are both made of insulating materials, and the probe is made of carbon-iron alloy materials. The jig main body and the jig support of the insulating material can ensure that the jig main body and the jig support are in insulating contact with the PCB to be tested, so that the problem of short circuit is avoided. The probe of the carbon-iron alloy material has good conductivity, can ensure the transmission quality of test signals, and simultaneously has enough strength to prevent deformation in the use process.

The beneficial effects of the utility model are as follows:

the low-speed signal testing jig provided by the utility model has the advantages that when testing low-speed signals (such as MISO signals and CLK signals) on a server main board, the jig bracket is placed on the PCB to be tested, so that the jig main body is supported on the PCB to be tested. Then, the position of the probe on the jig main body is adjusted so that the end part of the probe can be inserted into a through hole (the through hole is the point to be tested of the low-speed signal) of the PCB to be tested. And finally, electrically connecting a cable probe of the oscilloscope with the probe, and acquiring the waveform of the low-speed signal from the oscilloscope after the cable probe is electrified so as to complete the test of the low-speed signal. Compared with the spot measurement mode in the prior art, the test fixture acquires the low-speed signal through the insertion connection of the probe and the through hole, so that the probe is in surface contact with the spot to be measured, the contact area of the probe and the spot to be measured is increased, the probe can be well contacted with the spot to be measured, and the quality of the test signal is ensured. In addition, the tool support can support the tool main part, avoids the tool main part to interfere with other parts on the PCB board that awaits measuring, can avoid the probe atress to warp simultaneously, and the existence of tool support and tool main part can liberate both hands, need not the independent handheld probe of tester in the testing process, and one can accomplish test work, has effectively improved test efficiency, saves the cost of labor. The position of the probe on the jig main body is adjusted to perform signal testing on the points to be tested at different positions of the PCB to be tested, so that the universality is stronger.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the following description will briefly explain the drawings needed in the description of the embodiments of the present utility model, and it is obvious that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to the contents of the embodiments of the present utility model and these drawings without inventive effort for those skilled in the art.

FIG. 1 is a schematic diagram of a low-speed signal testing fixture according to an embodiment of the present utility model;

FIG. 2 is an exploded view of a low-speed signal testing tool according to an embodiment of the present utility model;

FIG. 3 is a cross-sectional view of a low-speed signal testing jig according to an embodiment of the present utility model;

fig. 4 is a schematic structural diagram of a jig main body according to an embodiment of the present utility model;

fig. 5 is an exploded view of a jig main body according to an embodiment of the present utility model.

In the figure:

1-a jig main body; 2-a jig bracket; 4-an outer joint;

11-a guide chute; 12-mounting holes; 13-conductors;

21-a first leg; 22-a second leg; 23-adsorbing element;

31-probe one; 32-probe two; 33-probe three; 311-sliding part;

100-a PCB to be tested; 101-via holes; 102-pads.

Detailed Description

In order to make the technical problems solved by the present utility model, the technical solutions adopted and the technical effects achieved more clear, the technical solutions of the embodiments of the present utility model will be described in further detail below with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to fall within the scope of the utility model.

In the description of the present utility model, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. Wherein the terms "first position" and "second position" are two different positions.

In the description of the present utility model, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixed or removable, for example; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model will be understood in specific cases by those of ordinary skill in the art.

As shown in fig. 1 and 2, the present embodiment provides a low-speed signal testing fixture, which can be applied to low-speed signal testing of a server. The low-speed signal testing jig comprises a jig main body 1, a jig bracket 2 and a probe.

The jig main body 1 is mounted on the jig bracket 2, the jig bracket 2 is configured to be placed on the PCB 100 to be tested, and the PCB 100 to be tested is provided with a via hole 101 at a point to be tested. One end of the probe is connected with the jig main body 1 and the position on the jig main body 1 is adjustable, the other end of the probe can be inserted into the through hole 101, and the probe is configured to be electrically connected with an oscilloscope.

In the spot test method in the prior art, since part of the PCB 100 to be tested is not reserved with bare points to be tested, the green oil protection layer at the points to be tested on the PCB 100 to be tested needs to be removed during test, and the test steps are added. In this embodiment, by forming the via hole 101 on the PCB 100 to be tested, the condition that the green oil protection layer exists at the point to be tested is avoided, so that the green oil layer does not need to be scraped separately during the subsequent measurement of the low-speed signal, and the testing steps are further simplified. As shown in fig. 1 and 2, the outer edges of the via 101 are each provided with a pad 102, the pads 102 are connected with copper in the via 101, and the probe is inserted into the via 101 and then contacts with copper in the via 101, so as to realize electrical connection between the probe and a point to be tested.

Referring to fig. 1, when the low-speed signal testing jig provided in the present embodiment is used to test low-speed signals (such as MISO signals and CLK signals) on a server motherboard, the jig frame 2 is placed on the PCB 100 to be tested, so as to support the jig main body 1 on the PCB 100 to be tested. Then, the position of the probe on the jig main body 1 is adjusted so that the end of the probe can be inserted into the via hole 101 of the PCB 100 to be tested (the via hole 101 is the point to be tested of the low-speed signal). And finally, electrically connecting a cable probe of the oscilloscope with the probe, and acquiring the waveform of the low-speed signal from the oscilloscope after the cable probe is electrified so as to complete the test of the low-speed signal.

Compared with the spot measurement mode in the prior art, the test fixture acquires a low-speed signal through the insertion connection of the probe and the through hole 101, so that the probe is in surface contact with the point to be measured, the contact area of the probe and the point to be measured is increased, the probe can be well contacted with the point to be measured, and the quality of the test signal is ensured. In addition, the tool support 2 can support the tool main part 1, avoids tool main part 1 to interfere with other parts (such as CPU, high density connector, electric capacity etc.) on the PCB board 100 that awaits measuring, can avoid the probe atress to warp simultaneously, and the existence of tool support 2 and tool main part 1 can liberate both hands, need not the independent handheld probe of tester in the test process, and one can accomplish test work, has effectively improved test efficiency, saves the cost of labor. The position of the probe on the jig main body 1 is adjusted to perform signal testing on the points to be tested at different positions of the PCB 100 to be tested, so that the universality is stronger.

Alternatively, referring to fig. 1, 2 and 3, a guiding chute 11 is provided on the jig main body 1, and a sliding portion 311 is provided at one end of the probe connected to the jig main body 1, where the sliding portion 311 is located in the guiding chute 11 and can be slidably matched with the guiding chute 11. In this embodiment, the jig main body 1 has a rectangular parallelepiped structure, and the guide chute 11 extends along the length direction of the jig main body 1. After the jig support 2 is placed on the PCB 100 to be tested, the position of the probe is adaptively adjusted according to the position of the via hole 101 on the PCB 100 to be tested, specifically, the probe is shifted to slide in the guide chute 11 through the sliding portion 311 until the probe is aligned with the corresponding via hole 101. The probe and the jig main body 1 are in sliding connection, so that the position of the probe is more convenient to adjust, the probe and the through hole 101 at the point to be tested can be aligned and inserted quickly, and the testing efficiency is improved.

Preferably, the sliding portion 311 is a sphere disposed at the end of the probe, the sphere and the probe are integrally formed, accordingly, the inner wall of the guiding chute 11 is in a concave arc shape, and the sliding portion 311 is designed to reduce the sliding resistance of the sphere in the guiding chute 11, so as to improve the sliding smoothness.

Optionally, referring to fig. 1, 2 and 3, the low-speed signal testing fixture further includes an outer joint 4, a mounting hole 12 communicating with the guiding chute 11 is provided on the fixture body 1, and the outer joint 4 is located in the mounting hole 12, one end of which can be electrically connected with the probe, and the other end of which is configured to be connected with the oscilloscope. In this embodiment, the outer connector 4 is a cylindrical sleeve structure, which is embedded in the mounting hole 12, and the cylindrical sleeve structure is convenient for plugging with a cable probe of an oscilloscope. When the oscillograph is connected, the cable probe of the oscillograph is spliced with the corresponding external connector 4, so that the electric connection between the probe and the oscillograph can be realized, and a low-speed signal to be tested is transmitted to the oscillograph. The arrangement of the outer joint 4 provides convenience for connection of the oscilloscope and the probe, can realize quick connection and disassembly of the oscilloscope and the probe, and is beneficial to further improving the testing efficiency.

Alternatively, referring to fig. 4 and 5, a conductor 13 is embedded in the guide chute 11 along the moving direction of the probe, the outer joint 4 is connected to the conductor 13, and the probe is in sliding contact with the conductor 13 through the sliding part 311. By arranging the conductor 13 in the guide chute 11, the probe can be electrically connected with the outer connector 4 through the conductor 13 no matter which position the probe slides to, so that the probe is electrically connected with the oscilloscope through the outer connector 4, and signal transmission is realized. In this embodiment, since the sliding portion 311 is a sphere and the guiding chute 11 is an arc-shaped slot, the conductor 13 is configured to have the same arc-shaped structure as the arc-shaped slot, so as to adapt to the sliding portion 311 of the sphere, ensure that the sliding portion 311 contacts with the conductor 13 well, and improve the signal transmission quality.

Preferably, the outer joint 4 and the conductor 13 are both made of carbon-iron alloy materials, and the carbon-iron alloy materials have good conductivity and high hardness, so that the good conductivity can ensure that the probe is in good contact with a cable probe of an oscilloscope through the conductor 13 and the outer joint 4, and the transmission quality of low-speed signals to be detected is improved.

Optionally, a plurality of probes are provided, a plurality of guide sliding grooves 11 are provided on the jig main body 1, and the plurality of probes are in one-to-one correspondence with the plurality of guide sliding grooves 11. In this embodiment, referring to fig. 1, 2 and 3, the plurality of probes include a first probe 31, a second probe 32 and a third probe 33, wherein the first probe 31 and the second probe 32 are used for measuring low-speed signals (such as MISO signals and CLK signals) on the PCB 100 to be tested, the third probe 33 is a reference probe of the first probe 31 and the second probe 32, and the first probe 31, the second probe 32 and the third probe 33 are slidably connected with the corresponding guide chute 11 through the sliding portion 311. As shown in fig. 4, the guide chute 11 penetrating the jig main body 1 in the longitudinal direction on the left side is used for slidably connecting the third probe 33, and the two guide chutes 11 arranged at intervals in the longitudinal direction on the right side are respectively used for slidably connecting the first probe 31 and the second probe 32. By arranging a plurality of probes and a plurality of guide sliding grooves 11, a plurality of signals on the PCB 100 to be tested can be measured simultaneously, and the testing efficiency is improved.

By setting the probe three 33 as the reference of the probe one 31 and the probe two 32, the stability of the signals measured by the probe one 31 and the probe two 32 and the measurement accuracy can be improved. In this embodiment, the probe three 33 is a GND probe, so the signals measured by the probe one 31 and the probe two 32 are all referenced to GND, one of the low-speed signals is measured by combining the probe one 31 and the probe three 33, the other low-speed signal is measured by combining the probe two 32 and the probe three 33, and the oscillograph can display the corresponding waveform data after obtaining the two low-speed signals.

Preferably, the probe is prepared from a carbon-iron alloy material, and the carbon-iron alloy material has good conductivity, so that the transmission quality of a low-speed signal to be tested is ensured, and the test precision is improved. And moreover, the carbon-iron alloy material has high hardness, so that the probe is prevented from deforming in the use process, and can bear a certain acting force, so that the probe is well contacted with the via hole 101 at the point to be tested.

Alternatively, referring to fig. 1, 2 and 3, the cross-sectional area of the probe is gradually reduced in the direction of insertion into the via 101. That is, the entire probe is tapered, so that the smoothness of the insertion can be improved and the probe end can be prevented from interfering with the edge of the via hole 101 when the probe is inserted into the via hole 101 at the point to be measured. After the conical probe is inserted into the through hole 101 to be clamped, the probe is firmly inserted into the through hole 101, the outer peripheral surface of the probe is abutted against the inner wall surface of the through hole 101, good contact between the probe and the through hole 101 at the point to be tested is ensured, and the signal testing quality is improved.

Alternatively, referring to fig. 1 and 2, the jig frame 2 includes a first support column 21 and a second support column 22 with adjustable length, and the first support column 21 and the second support column 22 are respectively disposed at two ends of the jig main body 1 along the length direction. The first support column 21 and the second support column 22 are respectively arranged at two ends of the jig main body 1, so that the jig main body 1 can be stably supported on the PCB 100 to be tested, the first support column 21 and the second support column 22 can be prevented from interfering the sliding of the probe relative to the jig main body 1, and the smooth adjustment of the probe position is ensured. Meanwhile, the existence of the first support column 21 and the second support column 22 can prevent the gravity of the jig main body 1 from acting on the probe entirely, and prevent the probe from deforming. The first support column 21 and the second support column 22 are both set to be adjustable in length, the position of the probe can be conveniently adjusted, the probe can be inserted into the through hole 101, specifically, when the jig support 2 is placed on the PCB 100 to be tested, the lengths of the first support column 21 and the second support column 22 can enable the tip of the probe to be far away from the PCB 100 to be tested, and the probe is prevented from interfering with the PCB 100 to be tested when the probe is moved. After the probes are aligned with the vias 101, the lengths of the first and second posts 21, 22 are reduced to allow the probes to be inserted into the vias 101.

Further, the lengths of the first support column 21 and the second support column 22 are adjustable, so that the height of the jig main body 1 relative to the PCB 100 to be tested can be adjusted according to the height adaptability of other components on the PCB 100 to be tested, interference between the jig main body 1 and other components is prevented, and the universality of the test jig is improved. Correspondingly, the probe can be also set to be of a telescopic structure, so that the length of the probe can be adjusted according to the height adaptability of the jig main body 1 relative to the PCB 100 to be tested, and the probe can be well inserted into the through hole 101 on the PCB 100 to be tested.

Optionally, each of the first support column 21 and the second support column 22 includes a fixing sleeve and a telescopic rod (not shown) slidably disposed in the fixing sleeve, and an end of the telescopic rod extending out of the fixing sleeve is connected to the jig main body 1. The overall length of the first support column 21 and the second support column 22 is adjusted by adjusting the length of the telescopic rod extending out of the fixed sleeve, and then the height of the jig main body 1 relative to the PCB 100 to be tested is adjusted. The telescopic rod and the fixed sleeve are fixedly connected through pins, and after the position of the telescopic rod is adjusted, the telescopic rod and the fixed sleeve are locked and fixed through the pins. In other embodiments, the telescopic rod and the fixing sleeve can be connected through threads, and the whole length of the first support column 21 and the second support column 22 is adjusted by screwing the fixing sleeve.

Alternatively, referring to fig. 1 and 2, the ends of the first support column 21 and the second support column 22, which are far away from the jig main body 1, are respectively provided with an adsorption piece 23, and the adsorption piece 23 can be adsorbed on the PCB board 100 to be tested. The arrangement of the absorption part 23 can enable the whole jig support 2 to be stably placed on the PCB 100 to be tested, and prevent the jig main body 1 from shaking, thereby ensuring the quality of the probe test signal. Meanwhile, the absorption part 23 can realize detachable connection of the jig support 2 and the PCB 100 to be tested, so that the whole test jig is convenient to disassemble and assemble, and the test work efficiency is improved.

Preferably, the adsorbing member 23 is a suction cup, and the suction cup can be firmly adsorbed on the PCB 100 to be tested by means of atmospheric pressure, so as to prevent the jig main body 1 from shaking due to external force.

Optionally, the jig main body 1 and the jig support 2 are both made of insulating materials, so that the jig main body 1 and the jig support 2 can be ensured to be in insulating contact with the PCB 100 to be tested, and the problem of short circuit is avoided. In this embodiment, the jig main body 1 is made of a ceramic material with a relatively high density, so that the jig main body 1 has a certain weight while having an insulation effect, and after the probe is inserted into the corresponding via hole 101, the probe can be firmly inserted and limited in the via hole 101 under the action of part of gravity of the jig main body 1, so as to ensure the signal transmission quality. Further, the jig support 2 is made of porous plastic, and the porous plastic has good insulating performance and can ensure that the jig support 2 is in insulating contact with the PCB 100 to be tested.

Taking a blade type two-way server as an example, when testing SPI signals of a BMC on the server, for example, MISO signals and CLK signals are required to be tested on a PCB, through holes 101 are reserved at points to be tested of the MISO signals, the CLK signals and the reference signals of the PCB during wiring on the PCB, and the intervals between the through holes 101 of two low-speed signals and the through holes 101 of the reference signals are set according to the range of three guide sliding grooves 11 on the jig main body 1, so that the probes can be smoothly inserted into the corresponding through holes 101. During testing, the three probes are slid left and right, the positions of the probes are adjusted to be inserted into the corresponding through holes 101, then the cable probe of the oscilloscope is spliced with the external connector 4, and finally the power is applied to acquire signal waveforms from the oscilloscope.

Note that the above is only a preferred embodiment of the present utility model and the technical principle applied. It will be understood by those skilled in the art that the present utility model is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the utility model. Therefore, while the utility model has been described in connection with the above embodiments, the utility model is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the utility model, which is set forth in the following claims.

Claims (10)

1. Low-speed signal test tool, its characterized in that includes:

the jig comprises a jig main body (1) and a jig bracket (2), wherein the jig main body (1) is installed on the jig bracket (2), the jig bracket (2) is configured to be placed on a PCB (100) to be tested, and a through hole (101) is formed in the PCB (100) to be tested at a point to be tested;

and one end of the probe is connected with the jig main body (1) and the position on the jig main body (1) is adjustable, the other end of the probe can be inserted into the through hole (101), and the probe is configured to be electrically connected with an oscilloscope.

2. The low-speed signal testing jig according to claim 1, wherein the jig main body (1) is provided with a guide chute (11), one end of the probe connected with the jig main body (1) is provided with a sliding part (311), and the sliding part (311) is positioned in the guide chute (11) and can be in sliding fit with the guide chute (11).

3. The low-speed signal testing jig according to claim 2, further comprising an outer joint (4), wherein a mounting hole (12) communicated with the guide chute (11) is provided on the jig main body (1), and the outer joint (4) is located in the mounting hole (12), one end of which can be electrically connected with the probe, and the other end of which is configured to be connected with the oscilloscope.

4. A low-speed signal testing jig according to claim 3, wherein a conductor (13) is embedded in the guide chute (11) along the movement direction of the probe, the outer joint (4) is connected with the conductor (13), and the probe is in sliding contact with the conductor (13) through the sliding part (311).

5. The low-speed signal testing jig according to claim 2, wherein a plurality of probes are provided, the guide chute (11) is provided with a plurality of probes on the jig main body (1), the plurality of probes are in one-to-one correspondence with the plurality of guide chute (11), the plurality of probes comprise a first probe (31), a second probe (32) and a third probe (33), the first probe (31) and the second probe (32) are both used for measuring low-speed signals on the PCB (100) to be tested, the third probe (33) is a reference probe of the first probe (31) and the second probe (32), and the first probe (31), the second probe (32) and the third probe (33) are all in sliding connection with the corresponding guide chute (11) through the sliding part (311).

6. The low-speed signal testing jig according to claim 1, wherein the jig frame (2) comprises a first support (21) and a second support (22) with adjustable lengths, and the first support (21) and the second support (22) are respectively arranged at two ends of the jig main body (1) along the length direction.

7. The low-speed signal testing jig according to claim 6, wherein the first pillar (21) and the second pillar (22) each comprise a fixing sleeve and a telescopic rod slidably disposed in the fixing sleeve, and one end of the telescopic rod extending out of the fixing sleeve is connected with the jig main body (1).

8. The low-speed signal testing jig according to claim 6, wherein the first support column (21) and the second support column (22) are both provided with an adsorption piece (23) at one end far away from the jig main body (1), and the adsorption piece (23) can be adsorbed on the PCB board (100) to be tested.

9. The low-speed signal testing jig according to any one of claims 1-8, wherein the cross-sectional area of the probe is gradually reduced in the direction of insertion into the via hole (101).

10. The low-speed signal testing jig according to any one of claims 1 to 8, wherein the jig main body (1) and the jig support (2) are both made of an insulating material, and the probe is made of a carbon-iron alloy material.

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