TW201237436A - Test tool - Google Patents

Test tool Download PDF

Info

Publication number
TW201237436A
TW201237436A TW100107300A TW100107300A TW201237436A TW 201237436 A TW201237436 A TW 201237436A TW 100107300 A TW100107300 A TW 100107300A TW 100107300 A TW100107300 A TW 100107300A TW 201237436 A TW201237436 A TW 201237436A
Authority
TW
Taiwan
Prior art keywords
clamping member
circuit board
flexible circuit
test fixture
conductor
Prior art date
Application number
TW100107300A
Other languages
Chinese (zh)
Inventor
Tung-Ke Wu
Chen-Wei Yang
Yi-Ming Chiu
Original Assignee
Raydium Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raydium Semiconductor Corp filed Critical Raydium Semiconductor Corp
Priority to TW100107300A priority Critical patent/TW201237436A/en
Priority to CN2011100971469A priority patent/CN102654518A/en
Publication of TW201237436A publication Critical patent/TW201237436A/en

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

A test tool for testing a flexible printed circuit includes a base, a first clamping member and a second clamping member. The first clamping member includes a first conductor and a first insulator, the first clamping member is disposed on the base, and the first insulator covers the first conductor. The second clamping member includes a second conductor and a second insulator, the second clamping member is disposed over the first clamping member, and the second insulator covers the second conductor. The first clamping member can cooperate with the second clamping member to clamp the flexible printed circuit.

Description

201237436 六、發明說明: 【發明所屬之技術領域】 本發明關於一種測試治具,尤指一種用以測試軟性電路板之測 試治具。 【先前技術】 相較於一般的印刷電路板,由於軟性電路板較為輕薄且具有可 撓性,目前許多電子裝置中皆設置有軟性電路板,以因應電子裝置 逐漸朝輕薄短小的趨勢發展。對於裝設有觸控面板的電子裝置而 言,軟性電路板更是不可或缺的必要元件。一般針對觸控面板之軟 性電路板的測試技術’大多是湘—特製的硫治具,將待測的軟 性電路板與觸控面板蚊,藉以放大觸控晶片的感測訊號,以測試 軟性電路板是祕生產製造的棘中_娜,造成訊號傳遞不良 或是無法傳遞,或是因為打件;^良而造成馳⑼接腳發生空焊等 缺失。由於觸控面板與軟性電路板之間並無任何連接介質,僅^用 特製的面板治具直接固定,因此測試人員必須耗費大量時間對觸# 面板與軟性電路板的接腳進行定位。如果定位的精準度不佳,便: 影響待測產品的㈣觸’魅產良率下降。在定辦也有可能因 為測試人S多次微調軟性電路板與觸控面板的接觸位置,而使^ 面板之導電薄膜(IT〇film)產生磨耗。此外,必須針對不同的觸工 控面板之軟性電路板魏治具,將使得紐的生產成本增加。 4 201237436 【發明内容】 因此本發明的目的之一在於提供一種用以測試軟性電路板之 測試治具,以解決上述問題。 根據-實施例,本發明之測試治具包含一底座、一第一爽持件 以及-第二鱗件。第—夾持件包含—第—導體以及—第一絕緣 體’第-夹持件設置於底座上,且第—絕緣體覆蓋第—導體。第二 夾持件包含-第二導體以及—第二絕緣體,第二夾持件設置於第一 夾持件上’且第二絕緣體覆蓋第二導體。第—祕件可與第二夹持 件配合以共同夾持軟性電路板。 綜上所述,根據本發明之測試治具,測試人員僅需將軟性電路 板夾持於第—紐件與第二續件之間,即可方便地對軟性電路板 進行測試。她於傳_戦技術,在使用本發敗職治具時, 測试人貝不需_性電路_接_行定位,可有效地節省測試人 員於測試軟性電路板時所需的時間,並且可避免產品產生不必要的 磨耗。此外’由於本發明之測試治具適用於任何軟性電路板, 針對不同的紐電路婦製治具,將可大大降健體的生產成本。 所附圖式 關於本發明之優點與精神可以藉由以下的發明詳述及 得到進一步的瞭解。 【實施方式】 201237436 "月參閱第1圖’第1圖為根據本發明一實施例之測試治具i的 示意圖。如第1圖所示,測試治具i包含一底座1〇、一第一爽持件 12、一第二夾持件14、二滑軌16以及一操作件18。第一夾持件12 包含-第-導體12〇以及—第—絕緣體122 ’第一爽持件12設置於 底座ίο上,且第一絕緣體122覆蓋第一導體12〇。第二夾持件14 包含-第二導體14Q以及-第二絕緣體142,第二夾持件14設置於 第失持件12上,且第一絕緣體142覆蓋第二導體14〇。二滑軌16 設置於底座10上’且分別位於第—夾持件12的二側。第二夾持件 14可移動地没置於二滑轨16上。操作件18設置於第二爽持件μ 上。操作们8可被操作以帶動第二夾持件14沿滑軌16相對第一夾 持件12上下移動。於此實施例中,第一導體12〇與第二導體14〇 可分別為一金屬或一導電橡膠,但不以此為限。 ⑺參閱第2圖以及第3圖,第2圖為軟性電路板3放置於第一 爽持件12上的不意圖,帛3圖為第一夾持件12與第二夾持件14 配&以>、同夾持軟性電路板3的示意圖。如第2圖與第3圖所示, 第一失持件U可與第二爽持们4配合以共同爽持軟性電路板3。 於實際應用中,軟性電路板3適用於任何電子裝置(未顯示),例如 具有觸控面板之行動電話、平板電腦、顯示器等。 當測試人員欲使用測試治具i測試軟性電路板3時,測試人員 可先將操作件18向上拉,以帶動第二夾持件14沿滑軌糾目對第一 夾持件12向上移動。接著’測試人員再將軟性電路板3放置於第— 6 201237436 =持件12上’如第2圖所示。最後,測試人員再將操作件18向下 推,以帶動第二夾持件14沿滑執16相對第—趙件12向下移動, 第一夾持件12與第二夾持件14共同爽持軟性電路板3,如第3 ^斤示。藉此,戦人員僅需將軟性電路板3夾持於第-夾持件12 ^第二爽持件Μ之間,即可藉由第—導體⑽與第二導體14〇建立 ^好的訊號傳遞路徑,再將軟性電路板3與測試用的電腦系統連 接’即可方便地對軟性電路板3進行測試。 =此貫施例中,第-夹持件12與第二夾持件Μ係以面接觸的 =式共同夾持軟性電路板3,以確保良好的訊號傳遞路徑。然而, ^另-實施例中’經過適當地設計,第一夾持件12與第二夾持件 亦可赠接_对制祕軸^職3。射之,第一夹持 2與第二鱗件14以何種接觸方式制夾持軟性電路板3可視 實際應用崎,*關巾所_的為限。 =參閱第4圖’第4圖為根據本發明另—實施例之測試治具[ 不ΐϋ如第4圖所7f ’測試治具r與上述的職治具1的主要 使二:在於似’°具1之第二夾持件14之一端樞接於底座1〇, 員1Γ夾持件14之另一端可相對第—夾持件12轉動。當測試人 人使用峨治㈣槪性魏板時,測試人員可先將第二 =目對第—失持件12轉動打開。接著,測試人員再將軟性電路 對签於第一炎持件12上。最後,測試人員再將第二夾持件Η相 對第一夾持件12轉動閉合,使得第-夾持件12與第二夾持件14 201237436 共同夾持軟性電路板。藉此,測試人員僅需將軟性電路板夾持於第 夾持件12與第二夾持件14之間,即可藉由第一導體120與第二 導體140建立良好的訊號傳遞路徑,再將軟性電路板與測試用的電 腦系統連接,即可方便地對軟性電路板進行測試。需說明的是,第 4圖中與第1圖中所示相同標號的元件,其作用原理大致相同在 此不再資述。 請參閱第5圖,第5圖為根據本發明另一實施例之測試治具Γ, 的示意圖。如第5圖所示,測試治具i"與上述的測試治具i的主要 =同之處在於,測試治具!"之第—夾持件12與第二鱗件14皆固 疋於底座10上,且相互配合而形成一插槽2〇。當測試人員欲使用 測U1K軟性電路板時,測試人員可將軟性電路板夾持於插 槽20中’即可藉由第-導體12〇與第二導體14〇建立良好的訊號傳 遞路徑’再將軟性f路板與測期的電腦綠連接,即可方便地對 軟性電路板進行測試。需說明的是,第5圖中與第丨圖中所示相同 標號的元件,其_原理大致_,在此不再費述。 综上所述,根據本發明之測試治具,測試人員僅需將軟性電路 板夾持於第-夾持件與第二夾持件之間,即可方便地對軟性電路板 進行測試。相較於傳統_試技術,在制本發明之戦治且時, 測試人員不騎軟性電路板的接腳進狀位,可有效地節省測試人 員於測試軟性板時所__,並且可避免產品產生不必要的 磨耗。此外,由於本發明之測試治具適用於任何軟性電路板,不需 8 201237436 針對不同的軟性電路板特製治具,將可大大降低整體的生產成本。 以上所述僅為本發明之較佳實關,凡依本發明申請專利範圍 所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 【圖式簡單說明】 第1圖為根據本發明一實施例之測試治具的示意圖。 第2圖為軟性電路板放置於第一夾持件上的示意圖。 第3圖為第一夾持件與第二夾持件配合以共同夾持軟性電路板 的示意圖。 第4圖為根據本發明另一實施例之測試治具的示意圖。 第5圖為根據本發明另一實施例之測試治具的示意圖。 【主要元件符號說明】 1 、 Γ 、 1” 測試治具 10 底座 14 第一失持件 18 操作件 120 第一導體 140 第二導體 3 軟性電路板 12 第一失持件 16 滑執 20 插槽 122 第一絕緣體 142 第二絕緣體201237436 VI. Description of the Invention: [Technical Field] The present invention relates to a test fixture, and more particularly to a test fixture for testing a flexible circuit board. [Prior Art] Compared with a general printed circuit board, since a flexible circuit board is thin and flexible, a flexible circuit board is currently provided in many electronic devices, in response to the trend that electronic devices are gradually becoming lighter, thinner and shorter. For electronic devices equipped with touch panels, flexible circuit boards are an indispensable component. Generally, the test technology for the flexible circuit board of the touch panel is mostly a sulfur-specific sulfur fixture, which is to test the soft circuit board and the touch panel mosquito to enlarge the sensing signal of the touch wafer to test the soft circuit. The board is the spine of the secret manufacturing, _ Na, causing poor signal transmission or can not be transmitted, or because of the hit; ^ good cause Chi (9) pin missing welding and other missing. Since there is no connection medium between the touch panel and the flexible circuit board, only the special panel fixture is directly fixed, so the tester must spend a lot of time to locate the pins of the touch panel and the flexible circuit board. If the accuracy of the positioning is not good, it will affect: (4) The yield of the product to be tested is reduced. It is also possible that the tester S fine-tunes the contact position of the flexible circuit board with the touch panel a plurality of times, and causes the conductive film (IT〇film) of the panel to be worn. In addition, the flexible circuit board Weizhi, which must be used for different touch panels, will increase the production cost of the New Zealand. 4 201237436 SUMMARY OF THE INVENTION It is therefore an object of the present invention to provide a test fixture for testing a flexible circuit board to solve the above problems. According to an embodiment, the test fixture of the present invention comprises a base, a first holding member and a second scale member. The first clamping member includes a first conductor and a first insulator. The first clamping member is disposed on the base, and the first insulator covers the first conductor. The second clamping member includes a second conductor and a second insulator, the second clamping member is disposed on the first clamping member and the second insulator covers the second conductor. The first secret member can cooperate with the second clamping member to collectively hold the flexible circuit board. In summary, according to the test fixture of the present invention, the tester can conveniently test the flexible circuit board by simply clamping the flexible circuit board between the first and second continuations. She is rumored to use _ 戦 technology, in the use of this unsuccessful jig, the tester does not need _ sex circuit _ connection _ row positioning, can effectively save the time required for testers to test the flexible circuit board, and It can avoid unnecessary wear of the product. In addition, since the test fixture of the present invention is applicable to any flexible circuit board, the production cost of the body can be greatly reduced for different button-making tools. The advantages and spirit of the present invention will become more apparent from the following detailed description of the invention. [Embodiment] 201237436 "Month Referring to Fig. 1' Fig. 1 is a schematic view showing a test fixture i according to an embodiment of the present invention. As shown in Fig. 1, the test fixture i includes a base 1 〇, a first holding member 12, a second holding member 14, two slide rails 16, and an operating member 18. The first holding member 12 includes a -first conductor 12 and a first insulator 122'. The first holding member 12 is disposed on the base ίο, and the first insulator 122 covers the first conductor 12''. The second clamping member 14 includes a second conductor 14Q and a second insulator 142. The second clamping member 14 is disposed on the first holding member 12, and the first insulator 142 covers the second conductor 14A. The two slide rails 16 are disposed on the base 10 and are respectively located on two sides of the first clamping member 12. The second clamping member 14 is movably not placed on the two slide rails 16. The operating member 18 is disposed on the second holding member μ. The operators 8 are operable to drive the second gripping member 14 up and down along the slide rail 16 relative to the first gripping member 12. In this embodiment, the first conductor 12 and the second conductor 14 are respectively a metal or a conductive rubber, but are not limited thereto. (7) Referring to FIG. 2 and FIG. 3, FIG. 2 is a schematic view of the flexible circuit board 3 placed on the first holding member 12. FIG. 3 is a view of the first holding member 12 and the second holding member 14 A schematic diagram of holding the flexible circuit board 3 with >. As shown in FIGS. 2 and 3, the first holding member U can cooperate with the second holding member 4 to collectively hold the flexible circuit board 3. In practical applications, the flexible circuit board 3 is suitable for any electronic device (not shown), such as a mobile phone with a touch panel, a tablet, a display, and the like. When the tester wants to test the flexible circuit board 3 using the test fixture i, the tester can first pull up the operating member 18 to drive the second clamping member 14 to move upward toward the first clamping member 12 along the sliding rail. Then the tester placed the flexible circuit board 3 on page 6 201237436 = holder 12 as shown in Fig. 2. Finally, the tester pushes the operating member 18 downward to drive the second clamping member 14 to move downward along the sliding 16 relative to the first member 12, and the first clamping member 12 and the second clamping member 14 are cool together. Hold the flexible circuit board 3, as shown in the 3rd pin. Therefore, the 戦 person only needs to clamp the flexible circuit board 3 between the first clamping member 12 and the second holding member ,, and the signal can be established by the first conductor (10) and the second conductor 14 〇. The flexible circuit board 3 can be easily tested by transferring the path and then connecting the flexible circuit board 3 to the test computer system. In this embodiment, the first clamping member 12 and the second clamping member are in surface contact with each other to hold the flexible circuit board 3 together to ensure a good signal transmission path. However, in the other embodiment, the first holding member 12 and the second holding member are also designed to be attached to each other. The contact between the first clamping member 2 and the second scale member 14 in the manner of holding the flexible circuit board 3 is limited to the actual application of the stencil. = see Fig. 4' Fig. 4 is a test fixture according to another embodiment of the present invention [not as shown in Fig. 4, where the test fixture r and the above-mentioned service fixture 1 are mainly used in two: One end of the second clamping member 14 of the tool 1 is pivotally connected to the base 1 , and the other end of the holder 1 is rotatable relative to the first clamping member 12 . When the test person uses the 四(4) 魏 魏 wei wei, the tester can first turn the second = gait to the first holding member 12 to open. The tester then signs the soft circuit pair on the first illuminator 12. Finally, the tester turns the second clamping member 转动 relative to the first clamping member 12 so that the first clamping member 12 and the second clamping member 14 201237436 jointly hold the flexible circuit board. Therefore, the tester only needs to clamp the flexible circuit board between the first clamping member 12 and the second clamping member 14, thereby establishing a good signal transmission path by the first conductor 120 and the second conductor 140. The flexible circuit board can be easily tested by connecting the flexible circuit board to the test computer system. It should be noted that the elements of the same reference numerals as those shown in Fig. 1 in Fig. 4 have substantially the same principle of operation and will not be described again. Please refer to FIG. 5, which is a schematic diagram of a test fixture according to another embodiment of the present invention. As shown in Figure 5, the test fixture i" is the same as the above test fixture i: the test fixture! " the first - the clamping member 12 and the second scale member 14 are fixed to the base 10 and cooperate with each other to form a slot 2 . When the tester wants to use the U1K flexible circuit board, the tester can clamp the flexible circuit board into the slot 20 to establish a good signal transmission path by the first conductor 12 and the second conductor 14'. The flexible circuit board can be easily tested by connecting the soft f-board to the computer green of the measurement period. It should be noted that the elements of the same reference numerals as those shown in the fifth drawing in Fig. 5 have a principle of _, which will not be described here. In summary, according to the test fixture of the present invention, the tester can conveniently test the flexible circuit board by simply clamping the flexible circuit board between the first clamping member and the second clamping member. Compared with the conventional _ test technology, when the invention is manufactured, the tester does not ride the pin of the flexible circuit board, which can effectively save the tester when testing the soft board __, and can avoid The product produces unnecessary wear. In addition, since the test fixture of the present invention is applicable to any flexible circuit board, it is not necessary to use the special protective fixture for different flexible circuit boards, which will greatly reduce the overall production cost. The above is only the preferred embodiment of the present invention, and all changes and modifications made to the scope of the present invention should fall within the scope of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic view of a test fixture according to an embodiment of the present invention. Figure 2 is a schematic view of the flexible circuit board placed on the first clamping member. Figure 3 is a schematic view of the first clamping member and the second clamping member cooperating to sandwich the flexible circuit board. Figure 4 is a schematic illustration of a test fixture in accordance with another embodiment of the present invention. Figure 5 is a schematic illustration of a test fixture in accordance with another embodiment of the present invention. [Main component symbol description] 1 , Γ , 1 " Test fixture 10 Base 14 First missing member 18 Operating member 120 First conductor 140 Second conductor 3 Flexible circuit board 12 First holding member 16 Slip 20 slot 122 first insulator 142 second insulator

Claims (1)

201237436 七、申請專利範圍: 1· 一種測試治具,用以測試一軟性電路板,該測試治具包含: 一底座; 一第一夾持件,包含一第一導體以及一第一絕緣體,該第一 夾持件設置於該底座上,該第一絕緣體覆蓋該第一導體; 以及 ^ 一第二夾持件,包含一第二導體以及一第二絕緣體,該第二 夾持件設置於該第一夾持件上,該第二絕緣體覆蓋該第二 導體,該第-炎持件可與該第二夾持件配合以共同失持該 軟性電路板。 Μ 2·如請求項1所述之測試治具,另包含一滑軌,設置於該底座上, 該第二夾持件可移動地設置於該滑軌上。 3. 如請求項2所述之測試治具,另包含一操作件,設置於 夾持件上,該操作件可被操作㈣_第二夾持件 ^ 對該第一夾持件上下移動。 月軌相 4. 如請求項i所述之測試治具,其中料二夾持件之1 該底座,使得該第二失持件之另一端可相對該第-鱗件轉:。 5. „所述之測試治具’其中該第—失持件與 件配合而形成一插槽’該軟性電路板失持於該插槽中Γ失持 201237436 6. 如請求項1所述之測試治具,其中該第一夾持件與該第二夾持 件以線接觸的方式共同炎持該軟性電路板。 7. 如請求項1所述之測試治具,其中該第一夾持件與該第二夾持 件以面接觸的方式共同夾持該軟性電路板。 8. 如請求項1所述之測試治具,其中該第一導體與該第二導體分 別為一金屬或一導電橡膠。 八、圖式: 11201237436 VII. Patent application scope: 1. A test fixture for testing a flexible circuit board, the test fixture comprising: a base; a first clamping member comprising a first conductor and a first insulator, a first clamping member is disposed on the base, the first insulator covers the first conductor; and a second clamping member includes a second conductor and a second insulator, the second clamping member is disposed on the On the first clamping member, the second insulator covers the second conductor, and the first-expanding member can cooperate with the second clamping member to jointly lose the flexible circuit board. The test fixture of claim 1, further comprising a slide rail disposed on the base, the second clamp member being movably disposed on the slide rail. 3. The test fixture of claim 2, further comprising an operating member disposed on the clamping member, the operating member being operable (4) _ second clamping member ^ moving the first clamping member up and down. The test fixture of claim i, wherein the base of the second holding member is such that the other end of the second missing member is rotatable relative to the first scale member. 5. The test fixture described in which the first-to-be-holding member cooperates with the member to form a slot. The flexible circuit board is lost in the slot and is lost. 201237436 6. As described in claim 1. a test fixture, wherein the first clamping member and the second clamping member jointly hold the flexible circuit board in a line contact manner. 7. The test fixture of claim 1, wherein the first clamping member The test fixture of claim 1 , wherein the first conductor and the second conductor are respectively a metal or a Conductive rubber. Eight, schema: 11
TW100107300A 2011-03-04 2011-03-04 Test tool TW201237436A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW100107300A TW201237436A (en) 2011-03-04 2011-03-04 Test tool
CN2011100971469A CN102654518A (en) 2011-03-04 2011-04-18 Test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW100107300A TW201237436A (en) 2011-03-04 2011-03-04 Test tool

Publications (1)

Publication Number Publication Date
TW201237436A true TW201237436A (en) 2012-09-16

Family

ID=46730173

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100107300A TW201237436A (en) 2011-03-04 2011-03-04 Test tool

Country Status (2)

Country Link
CN (1) CN102654518A (en)
TW (1) TW201237436A (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103048575B (en) * 2013-01-15 2015-11-18 东莞市富斯乐装饰工程有限公司 A kind of testing touch screen tool
CN109164376B (en) * 2018-10-23 2021-01-08 沧州市福林印制电路板有限公司 Pcb circuit board detection device

Also Published As

Publication number Publication date
CN102654518A (en) 2012-09-05

Similar Documents

Publication Publication Date Title
CN105445971B (en) The check device and its control method of liquid crystal display panel
TW201617596A (en) Testing apparatus for testing display apparatus and method of testing the same
PH12016501753A1 (en) Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applications
WO2013006768A3 (en) Test apparatus having a probe card and connector mechanism
TW200606444A (en) Electronic test device
TW200903705A (en) Fixing device of probe card
CN103325742A (en) Semiconductor package substrate and semiconductor package structure
TW201237436A (en) Test tool
CN104144238A (en) Testing fixture for mobile telephone keyboard
CN202548165U (en) Switching device for testing flexible circuit board circuit
CN204177678U (en) The tension test device of flexible display panels
JPWO2009099122A1 (en) Semiconductor inspection apparatus and semiconductor inspection method
KR101177509B1 (en) Inspection apparatus of touch screen
KR20150138213A (en) Probe device
WO2016090843A1 (en) Test probe and test equipment
CN104676217A (en) Supporting device
CN205067627U (en) Probe testing apparatus
CN207067182U (en) A kind of IC chip reliability detects fixture
US9470749B2 (en) Test apparatus with dry environment
CN104102046B (en) Clamp module used for liquid crystal alignment
CN106378736B (en) Liquid crystal display positioning clamping device
US9846193B2 (en) Semiconductor package testing apparatus
CN104464583B (en) A kind of lighting detection device and method
CN205724293U (en) A kind of keyset for blood analyser TFT LCD screen
KR20130112239A (en) Contact-type film probe module