TW201224489A - LED light source testing device - Google Patents

LED light source testing device Download PDF

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Publication number
TW201224489A
TW201224489A TW99142449A TW99142449A TW201224489A TW 201224489 A TW201224489 A TW 201224489A TW 99142449 A TW99142449 A TW 99142449A TW 99142449 A TW99142449 A TW 99142449A TW 201224489 A TW201224489 A TW 201224489A
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Taiwan
Prior art keywords
light
light source
emitting diode
testing device
housing
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TW99142449A
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Chinese (zh)
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TWI443358B (en
Inventor
Meng-Hsien Hong
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Advanced Optoelectronic Tech
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Publication of TWI443358B publication Critical patent/TWI443358B/en

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Abstract

The present invention relates to an LED light source testing device. The testing device includes a holding board and a testing system. The holding board is configured for holding LED light sources to be tested. The testing system includes an optical sensor, an electrical connector, and a testing module. The optical sensor and the electrical connector are connected to the testing module respectively. The optical sensor is configured sensing the light emitted from the LED light source. The electrical connector is configured for connecting the LED light source to the testing module. The testing module can test the electrical characteristics of the LED light source, and can obtain the optical characteristics of the LED light source according to the information sensed by the optical sensor.

Description

201224489 六、發明說明: 【發明所屬之技術領域】 [0001] 本發明涉及一種測試裝置,尤其涉及一種發光二極體光 源測試裝置。 【先前彳支#ί】 [0002] 發光二極體(Light Emitting Diode,LED)是一種可 將電流轉換成特定波長範圍的光的半導體元件。發光二 極體以其亮度高、工作電壓低、功耗小、易與積體電路 匹配、驅動簡單、壽命長等優點,從而可作為光源而廣 泛應用於照明領域。 [0003] 在發光二極體光源生產過程中,需要對發光二極體光源 的電氣特性及光學特性進行測試,上述電氣特性及光學 特性的測試一般在不同的測試機台下進行,導致測試時 間過長,且由於電氣特性及光學特性分別在不同的測試 機台下測試,導致很難得到電氣特性及光學特性之間的 對應關係,例如,電流與發光亮度的關係等。 【發明内容】 [0004] 有鑒於此,有必要提供一種能夠同時對發光二極體光源 的電氣特性及光學特性進行測試的發光二極體光源測試 裝置。 [0005] 一種發光二極體光源測試裝置,其包括一個承載台及一 個測試系統。所述承載台用於承載待測試發光二極體光 源。所述測試系統具有一個光感測器、一個電連接頭及 一個測試模組。所述光感測器和電連接頭分別與所述測 099142449 試模組電連接。所述光感測器用於感測發光二極體光源 表單編號A0101 第4頁/共13頁 0992073678-0 201224489 發出的光線。所述電連接頭用於與待測發光二極體光源 電連接。所述測試模組用於測試發光二極體光源的電學 特性,並同時能夠跟據光感測器感測到的發光二極體光 源發出的光線,得到發光二極體光源的光學特性。 [0006] 所述發光二極體光源測試裝置中的測試系統能夠同時測 試發光二極體光源的電氣特性及光學特性,一方面能夠 縮短發光二極體光源的測試時間,另一方面,能夠得到 發光二極體光源的電氣特性和光學特性之間的對應關係 〇 ❹ 【實施方式】 [0007] 以下將結合附圖對本發明作進一步的詳細說明。 [0008] 請參閱圖1,本發明實施方式提供的一種發光二極體光源 測試裝置100包括殼體10、承載台20、測試系統30及恒 溫系統40。 [0009] 所述殼體10具有一個容置腔11,該容置腔11能夠收容所 述承載台20。本實施方式中,所述殼體10包括底壁12、 ^ 頂壁13以及連接所述底壁12和頂壁13的側壁14。所述底 壁12上具有一個開口 121,所述承載台20可通過該開口 121伸入到所述殼體10中。優選地,所述殼體10採用透明 材料製成。 [0010] 所述承載台20用於承載待測試發光二極體光源200。所述 發光二極體光源200可以為點光源、線光源或面光源等。 請進一步參閱圖2,本實施方式中,所述發光二極體光源 200為發光二極體燈條。發光二極體燈條是指一種將發光 099142449 表單編號A0101 第5頁/共13頁 0992073678-0 201224489 二極體呈線性排列的發光裝置,由於製作容易、成本低 ,目前其已被廣泛應用來作為光源。所述承載台20能夠 在殼體1 0内沿平行於頂壁1 3及垂直於頂壁1 3的方向移動 。所述承載台20上承載有多個發光二極體光源200,每個 發光二極體光源200具有兩個電極201,通過該兩個電極 201可為發光二極體光源200供電。 [0011] 所述測試系統30包括光感測器31、電連接頭32及測試模 組33。所述光感測器31和電連接頭32分別與所述測試模 組33電連接。 [0012] 所述光感測器31用於感測發光二極體光源200發出的光線 。本實施方式中,所述光感測器31固定於殼體10的頂壁 13的内表面。可以理解,在其他實施方式中,該光感測 器31也可以固定於殼體1 0的側壁14的内表面上,只要光 感測器31能夠接收到發光二極體光源200發出的光線即可 〇 [0013] 所述電連接頭32能夠與發光二極體光源200上的兩個電極 201電連接,用於實現測試模組33與發光二極體光源200 的電連接。通過移動所述承載台20,可以讓電連接頭32 分別與每個發光二極體光源200進行電連接,從而能夠對 每個發光二極體光源20 0進行測試。本實施方式中,所述 電連接頭32為探針,其固定於殼體10的側壁14的内表面 上。可以理解,在其他實施方式中,所述電連接頭32也 可以固定於殼體10的頂壁13的内表面上,只要電連接頭 32能夠與發光二極體光源200進行電連接即可。 099142449 表單編號A0101 第6頁/共13頁 0992073678-0 201224489 imu\ 所述測試模組33用於測試發光二極體光源200的電學特性 ,並同時能夠跟據光感測器31感測到的發光二極體光源 200發出的光線,得到發光二極體光源200的發光亮度、 顏色等光學特性,從而進一步得到發光二極體光源200的 電學特性與光學特性的關係,例如,發光二極體光源200 的電流與發光亮度的對應關係等。本實施方式中,所述 測試模組3 3位於殼體1 0外。 [0015] 所述恒溫系統40包括供氣裝置41及導氣管42。所述供氣 裝置41用於提供恒溫氣體,而導氣管42則用於輸送該恒 溫氣體。對應所述導氣管42,所述殼體10上開設有至少 一個通氣口 141。本實施方式中,該通氣口 141開設在殼 體10的側壁14上,且該通氣口 141開設於電連接頭32與 殼體10的底壁12之間。通過供氣裝置41向殼體10内通入 恒溫氣體,能夠保持容置腔11内的溫度穩定,從而避免 外在因素,如溫度等,影響測試結果。 [0016] 本發明實施方式提供的發光二極體光源測試裝置中的測 Q 試系統能夠同時測試發光二極體光源的電氣特性及光學 特性,一方面能夠縮短發光二極體光源的測試時間,另 一方面,能夠得到發光二極體光源的電氣特性和光學特 性之間的對應關係。 [0017] 另外,本領域技術人員還可在本發明精神内做其他變化 ,當然,這些依據本發明精神所做之變化,都應包含在 本發明所要求保護之範圍之内。 【圖式簡單說明】 [0018] 圖1是本發明實施方式提供的一種發光二極體光源測試裝 099142449 表單編號 A0101 第 7 頁/共 13 頁 0992073678-0 201224489 置示意圖。 [0019] 圖2是圖1中的發光二極體光源測試裝置中的承載台立體 示意圖。 【主要元件符號說明】 [0020] 發光二極體光源測試裝置:100 [0021] 殼體:10 [0022] 容置腔:11 [0023] 底壁:12 [0024] 頂壁:13 [0025] 側壁:14 [0026] 承載台:20 [0027] 測試系統: 30 [0028] 光感測器: 31 [0029] 電連接頭: 32 [0030] 測試模組: 33 [0031] 恒溫系統: 40 [0032] 供氣裝置: 41 [0033] 導氣管:42 [0034] 開口 : 121 [0035] 通氣口 : 141 表單編號A0101 第8頁/共13頁 099142449 0992073678-0 201224489 LTObj 發光二極體光源:200 [0037]電極:201201224489 VI. Description of the Invention: [Technical Field] [0001] The present invention relates to a test apparatus, and more particularly to a light source diode test apparatus. [Previous #支#ί] [0002] A Light Emitting Diode (LED) is a semiconductor component that converts current into light of a specific wavelength range. The light-emitting diode is widely used in the field of illumination because of its high brightness, low operating voltage, low power consumption, easy matching with integrated circuits, simple driving, and long life. [0003] In the production process of the light-emitting diode light source, it is required to test the electrical characteristics and optical characteristics of the light-emitting diode light source, and the above-mentioned electrical characteristics and optical characteristics are generally tested under different test machines, resulting in test time. It is too long, and since electrical and optical characteristics are tested under different test stands, it is difficult to obtain a correspondence between electrical characteristics and optical characteristics, for example, the relationship between current and light-emitting brightness. SUMMARY OF THE INVENTION [0004] In view of the above, it is necessary to provide a light-emitting diode light source testing device capable of simultaneously testing electrical and optical characteristics of a light-emitting diode light source. [0005] A light emitting diode light source testing device includes a carrier and a test system. The carrying platform is configured to carry a light source of the light emitting diode to be tested. The test system has a light sensor, an electrical connector and a test module. The photo sensor and the electrical connector are electrically connected to the test module 099142449, respectively. The light sensor is used to sense the light source of the light emitting diode. Form No. A0101 Page 4 of 13 0992073678-0 201224489 Light emitted. The electrical connector is for electrically connecting to the light source of the light emitting diode to be tested. The test module is used to test the electrical characteristics of the light-emitting diode light source, and at the same time, can obtain the optical characteristics of the light-emitting diode light source according to the light emitted by the light-emitting diode light source sensed by the light sensor. [0006] The test system in the light-emitting diode light source testing device can simultaneously test the electrical characteristics and optical characteristics of the light-emitting diode light source, and on the other hand, can shorten the test time of the light-emitting diode light source, on the other hand, Correspondence between electrical characteristics and optical characteristics of a light-emitting diode light source 实施 [Embodiment] The present invention will be further described in detail below with reference to the accompanying drawings. Referring to FIG. 1, a light emitting diode light source testing apparatus 100 according to an embodiment of the present invention includes a housing 10, a carrier 20, a test system 30, and a constant temperature system 40. The housing 10 has a receiving cavity 11 that can accommodate the carrier 20. In the present embodiment, the housing 10 includes a bottom wall 12, a top wall 13, and side walls 14 connecting the bottom wall 12 and the top wall 13. The bottom wall 12 has an opening 121 through which the carrier 20 can extend into the housing 10. Preferably, the housing 10 is made of a transparent material. [0010] The carrying platform 20 is configured to carry the light emitting diode light source 200 to be tested. The light emitting diode light source 200 may be a point light source, a line light source or a surface light source or the like. Referring to FIG. 2, in the embodiment, the light emitting diode light source 200 is a light emitting diode light bar. The light-emitting diode light bar refers to a light-emitting device that linearly aligns the light-emitting 099142449 form number A0101 page 5/13 page 0992073678-0 201224489 diode, which has been widely used due to its easy fabrication and low cost. As a light source. The carrier 20 is movable within the housing 10 in a direction parallel to the top wall 13 and perpendicular to the top wall 13. The plurality of light-emitting diode light sources 200 are carried on the carrying platform 20, and each of the light-emitting diode light sources 200 has two electrodes 201 through which the light-emitting diode light source 200 can be powered. [0011] The test system 30 includes a photo sensor 31, an electrical connector 32, and a test module 33. The photo sensor 31 and the electrical connector 32 are electrically connected to the test module 33, respectively. [0012] The light sensor 31 is configured to sense light emitted by the light emitting diode light source 200. In the present embodiment, the photo sensor 31 is fixed to the inner surface of the top wall 13 of the casing 10. It can be understood that in other embodiments, the photo sensor 31 can also be fixed on the inner surface of the sidewall 14 of the housing 10 as long as the photo sensor 31 can receive the light emitted by the LED source 200. The electrical connector 32 can be electrically connected to the two electrodes 201 on the LED body 200 for electrical connection between the test module 33 and the LED source 200. By moving the stage 20, the electrical connectors 32 can be electrically connected to each of the light-emitting diode light sources 200, respectively, so that each of the light-emitting diode light sources 20 can be tested. In this embodiment, the electrical connector 32 is a probe that is fixed to the inner surface of the side wall 14 of the housing 10. It can be understood that in other embodiments, the electrical connector 32 can also be fixed to the inner surface of the top wall 13 of the housing 10 as long as the electrical connector 32 can be electrically connected to the LED source 200. 099142449 Form No. A0101 Page 6 of 13 0992073678-0 201224489 imu\ The test module 33 is used to test the electrical characteristics of the light-emitting diode light source 200, and at the same time can be sensed according to the light sensor 31. The light emitted from the light-emitting diode light source 200 obtains optical characteristics such as luminance and color of the light-emitting diode light source 200, thereby further obtaining the relationship between the electrical characteristics and the optical characteristics of the light-emitting diode light source 200, for example, a light-emitting diode. The correspondence between the current of the light source 200 and the luminance of the light, and the like. In this embodiment, the test module 33 is located outside the housing 10 . [0015] The constant temperature system 40 includes an air supply device 41 and an air guiding tube 42. The gas supply means 41 is for supplying a constant temperature gas, and the air guide tube 42 is for supplying the constant temperature gas. Corresponding to the air guiding tube 42, at least one vent 141 is opened in the housing 10. In the present embodiment, the vent 141 is formed on the side wall 14 of the casing 10, and the vent 141 is formed between the electrical connector 32 and the bottom wall 12 of the casing 10. By supplying the constant temperature gas into the casing 10 through the air supply means 41, the temperature in the accommodating chamber 11 can be kept stable, thereby avoiding external factors such as temperature and the like, and affecting the test results. [0016] The Q-test system in the LED light source testing device provided by the embodiment of the present invention can simultaneously test the electrical characteristics and optical characteristics of the light-emitting diode light source, and on the other hand, can shorten the test time of the light-emitting diode light source. On the other hand, the correspondence between the electrical characteristics and the optical characteristics of the light-emitting diode light source can be obtained. In addition, those skilled in the art can make other changes within the spirit of the present invention. Of course, all changes made in accordance with the spirit of the present invention should be included in the scope of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS [0018] FIG. 1 is a schematic diagram of a light-emitting diode light source test device provided by an embodiment of the present invention. 099142449 Form No. A0101 Page 7 of 13 0992073678-0 201224489. 2 is a perspective view of a carrier in the light emitting diode light source testing device of FIG. 1. [Main component symbol description] [0020] Light-emitting diode light source testing device: 100 [0021] Housing: 10 [0022] accommodating cavity: 11 [0023] Bottom wall: 12 [0024] Top wall: 13 [0025] Side wall: 14 [0026] Carrier: 20 [0027] Test system: 30 [0028] Light sensor: 31 [0029] Electrical connector: 32 [0030] Test module: 33 [0031] Constant temperature system: 40 [ 0032] Air supply: 41 [0033] Air duct: 42 [0034] Opening: 121 [0035] Vent: 141 Form No. A0101 Page 8 of 13 099142449 0992073678-0 201224489 LTObj Light Emitter Light Source: 200 [0037] Electrode: 201

099142449 表單編號A0101 第9頁/共13頁 0992073678-0099142449 Form No. A0101 Page 9 of 13 0992073678-0

Claims (1)

201224489 七、申請專利範圍: 1 . 一種發光二極體光源測試裝置,其包括一個承載台及一個 測試系統,所述承載台用於承載待測試發光二極體光源, 其改進在於:所述測試系統具有一個光感測器、一個電連 接頭及一個測試模組,所述光感測器和電連接頭分別與所 述測試模組電連接,所述光感測器用於感測發光二極體光 源發出的光線,所述電連接頭用於與待測發光二極體光源 電連接,所述測試模組用於測試發光二極體光源的電學特 性,並同時能夠跟據光感測器感測到的發光二極體光源發 出的光線,得到發光二極體光源的光學特性。 2 .如申請專利範圍第1項所述的發光二極體光源測試裝置, 其中:所述發光二極體光源測試裝置還包括一個殼體,該 殼體具有一個容置腔,所述承載台能夠收容於該容置腔中 ,所述光感測器及電連接頭設置於所述殼體的内壁上。 3 .如申請專利範圍第2項所述的發光二極體光源測試裝置, 其中:所述殼體具有底壁、頂壁以及連接所述底壁和頂壁 的側壁,所述底壁上形成有一個能夠讓承載台通過的開口 〇 4 .如申請專利範圍第3項所述的發光二極體光源測試裝置, 其中:所述承載台能夠在殼體内沿平行於頂壁及垂直於頂 壁的方向移動。 5 .如申請專利範圍第3項所述的發光二極體光源測試裝置, 其中:所述殼體採用透明材料製成。 6 .如申請專利範圍第3項所述的發光二極體光源測試裝置, 其中:所述光感測器固定於所述殼體的頂壁的内表面。 099142449 表單編號 A0101 第〗0 頁/共 13 頁 0992073678-0 201224489 7 .如申請專利範圍第3項所述的發光二極體光源測試裝置, 其中:所述電連接頭固定於所述殼體的側壁的内表面。 8 .如申請專利範圍第3項所述的發光二極體光源測試裝置, 其中:所述殼體上開設有至少一個通氣口,所述發光二極 體光源測試裝置還包括一個恒溫系統,該恒溫系統包括一 個供氣裝置,所述供氣裝置用於通過所述通氣口向殼體内 通入恒溫氣體。 9 .如申請專利範圍第8項所述的發光二極體光源測試裝置, 其中:所述通氣口開設於所述殼體的側壁上,且該通氣口 〇 位於電連接頭與殼體的底壁之間。 10 .如申請專利範圍第9項所述的發光二極體光源測試裝置, 其中:所述電連接頭固定於所述殼體的側壁的内表面。 ❹ 099142449 表單編號A0101 第11頁/共13頁 0992073678-0201224489 VII. Patent application scope: 1. A light-emitting diode light source testing device, comprising a carrying platform and a testing system, wherein the carrying platform is used for carrying the light-emitting diode light source to be tested, and the improvement is as follows: The system has a light sensor, an electrical connector and a test module. The light sensor and the electrical connector are respectively electrically connected to the test module, and the light sensor is used for sensing the light emitting diode Light emitted by the body light source, the electrical connector is used for electrically connecting with the light source of the light emitting diode to be tested, and the test module is used for testing the electrical characteristics of the light source of the light emitting diode, and at the same time being able to follow the light sensor The sensed light emitted by the light-emitting diode source obtains the optical characteristics of the light-emitting diode source. 2. The light-emitting diode light source testing device according to claim 1, wherein: the light-emitting diode light source testing device further comprises a housing, the housing has a receiving cavity, and the carrying platform The light sensor and the electrical connector are disposed on the inner wall of the housing. 3. The light-emitting diode light source testing device according to claim 2, wherein: the housing has a bottom wall, a top wall, and a side wall connecting the bottom wall and the top wall, the bottom wall being formed An illuminating diode light source testing device according to claim 3, wherein the carrier can be parallel to the top wall and perpendicular to the top in the housing. The direction of the wall moves. 5. The light-emitting diode light source testing device according to claim 3, wherein the housing is made of a transparent material. 6. The light-emitting diode light source testing device according to claim 3, wherein the light sensor is fixed to an inner surface of a top wall of the casing. </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; The inner surface of the side wall. The illuminating diode light source testing device of claim 3, wherein: the housing is provided with at least one vent opening, and the illuminating diode light source testing device further comprises a constant temperature system, The thermostatic system includes a gas supply device for introducing a constant temperature gas into the housing through the vent. 9. The light-emitting diode light source testing device according to claim 8, wherein: the vent opening is formed on a sidewall of the housing, and the vent port is located at a bottom of the electrical connector and the housing Between the walls. 10. The light-emitting diode light source testing device according to claim 9, wherein the electrical connector is fixed to an inner surface of a side wall of the casing. ❹ 099142449 Form No. A0101 Page 11 of 13 0992073678-0
TW99142449A 2010-12-06 2010-12-06 Led light source testing device TWI443358B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI459006B (en) * 2012-12-10 2014-11-01 Genesis Photonics Inc Detection apparatus for led
CN105676099A (en) * 2016-01-18 2016-06-15 富顺光电科技股份有限公司 System and method for judging LED device reliability based on electrical properties

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI459006B (en) * 2012-12-10 2014-11-01 Genesis Photonics Inc Detection apparatus for led
CN105676099A (en) * 2016-01-18 2016-06-15 富顺光电科技股份有限公司 System and method for judging LED device reliability based on electrical properties
CN105676099B (en) * 2016-01-18 2018-10-19 富顺光电科技股份有限公司 A kind of system and method judging LED component reliability based on electrology characteristic

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