CN206038837U - LED chip aging testing device - Google Patents
LED chip aging testing device Download PDFInfo
- Publication number
- CN206038837U CN206038837U CN201590000164.2U CN201590000164U CN206038837U CN 206038837 U CN206038837 U CN 206038837U CN 201590000164 U CN201590000164 U CN 201590000164U CN 206038837 U CN206038837 U CN 206038837U
- Authority
- CN
- China
- Prior art keywords
- led chip
- heat collector
- collector cavity
- ageing tester
- ageing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
Abstract
The application discloses LED chip aging testing device includes: be provided with the ageing rack of a plurality of LED chip assay stations, and be used for right detect the power supply circuit of station power supply, LED chip aging testing device still includes: the holding the closed thermal -arrest chamber of ageing rack, and install in the vacuum pumping system of thermal -arrest intracavity portion. Like this, put into vacuum environment with the LED chip, can go on keeping apart than high degree to oxygen molecule in the air to need not extravagant nitrogen gas and test with low costsly.
Description
Technical field
The application is related to light emitting diode field, more particularly to a kind of LED chip ageing tester.
Background technology
With the fast development of light emitting diode (LightEmitting Diode, LED) manufacturing process, LED is many
Field extensive application.As the energy consumption of LED is low, life-span length, and the raising of the brightness with LED chip, LED lamp takes
It is trend of the times for conventional light source into lighting field, therefore the working life to LED chip is tested, the application for LED is produced
Product meaning is very great.The working life of LED chip overlength can not possibly be predicted to the LED chip life-span by normal stress,
Need to go life-span for extrapolating under normal stress using the life characteristics under heavily stressed.At present, generally employ nitrogen as LED core
The test(ing) medium of piece life test, which has the disadvantage：The oxygen molecule of air is difficult to fully and completely isolate；Experimentation cost is high；Experiment
Thermal Stress Control precision is relatively low.
The content of the invention
The application is intended at least solve one of above-mentioned technical problem to a certain extent.
The application provides a kind of LED chip ageing tester, including：It is provided with the old of multiple LED chip detection stations
Change frame, and the power circuit for powering to the detection station, the LED chip ageing tester also includes：It is accommodating
The closed heat collector cavity of the ageing rack, and the pumped vacuum systems being installed on inside the heat collector cavity.
Further, the LED chip ageing tester also includes：The temperature sensing being arranged in the heat collector cavity
Device, ventilating system, and be connected with the temperature sensor and the ventilating system with when the temperature sensor senses respectively
Gained real time temperature opens the controller of the ventilating system when being more than preset security temperature.
Further, the ventilating system is the movable ventilation for covering or opening the air vent on the wall of the heat collector cavity side
Lid.
Further, the bracing frame with the ageing rack abutting joint is provided with the heat collector cavity.
Further, the pumped vacuum systems is air pump.
Further, the power circuit is power supply winding displacement.
The beneficial effect of the application is：
By providing a kind of LED chip ageing tester, including：It is provided with the aging of multiple LED chip detection stations
Frame, and the power circuit for powering to the detection station, the LED chip ageing tester also include：Accommodating institute
State the closed heat collector cavity of ageing rack, and the pumped vacuum systems being installed on inside the heat collector cavity.So, LED chip is put
Enter in vacuum environment, can carry out higher degree isolation to oxygen molecule in air, and nitrogen need not be wasted and experimental cost is low.
Description of the drawings
Structural representations of the Fig. 1 for the LED chip ageing tester of the embodiment of the present application.
Specific embodiment
Embodiments herein is described below in detail, the example of the embodiment is shown in the drawings, wherein from start to finish
Same or similar label represents same or similar element or the element with same or like function.Below with reference to attached
The embodiment of figure description is exemplary, it is intended to for explaining the application, and it is not intended that restriction to the application.
In the description of the present application, it is to be understood that term " " center ", " longitudinal direction ", " horizontal ", " length ", " width ",
" thickness ", " on ", D score, "front", "rear", "left", "right", " vertical ", " level ", " top ", " bottom " " interior ", " outward ", " up time
The orientation of the instruction such as pin ", " counterclockwise " or position relationship are, based on orientation shown in the drawings or position relationship, to be for only for ease of
Description the application and simplified description, rather than indicate or imply that the device or element of indication must have specific orientation, Yi Te
Fixed azimuth configuration and operation, therefore it is not intended that restriction to the application.
Additionally, term " first ", " second " are only used for describing purpose, and it is not intended that indicating or implying relative importance
Or the implicit quantity for indicating indicated technical characteristic.Thus, define " first ", the feature of " second " can express or
Implicitly include one or more this feature.In the description of the present application, " multiple " are meant that two or more,
Unless otherwise expressly limited specifically.
In this application, unless otherwise clearly defined and limited, term " installation ", " being connected ", " connection ", " fixation " etc.
Term should be interpreted broadly, for example, it may be being fixedly connected, or being detachably connected, or be integrally connected；It can be machine
Tool connects, or electrically connects；Can be joined directly together, it is also possible to be indirectly connected to by intermediary, can be two units
Connection inside part.For the ordinary skill in the art, above-mentioned term can be understood in this Shen as the case may be
Please in concrete meaning.
In this application, unless otherwise clearly defined and limited, fisrt feature second feature it " on " or D score
The first and second feature directly contacts can be included, it is also possible to be not directly contact including the first and second features but by it
Between other characterisation contact.And, fisrt feature second feature " on ", " top " and " above " it is special including first
Levy directly over second feature and oblique upper, or fisrt feature level height is merely representative of higher than second feature.Fisrt feature exists
Second feature " under ", " lower section " and " below " include fisrt feature directly over second feature and oblique upper, or be merely representative of
Fisrt feature level height is less than second feature.
Accompanying drawing is combined below by specific embodiment to be described in further detail the application.
Fig. 1 is refer to, a kind of LED chip ageing tester is present embodiments provided, can be used to carry out LED chip always
Change test, that is, being used for the life-span is tested.
Above-mentioned LED chip ageing tester mainly includes：The ageing rack 1 that multiple LED chips detect station 11 is provided with,
And for the power circuit 2 to detecting the power supply of station 11, detection station 11 can install corresponding LED chip to be detected, separately
Outward, LED chip ageing tester also includes：The closed heat collector cavity 3 of accommodating ageing rack 1, and be installed on inside heat collector cavity 3
Pumped vacuum systems 4, in the present embodiment, pumped vacuum systems 4 generally in requisition for heat collector cavity opening, so as to by heat collector cavity 3
Interior air is extracted out and in the 3 interior environment for forming vacuum or near vacuum of heat collector cavity, 3 periphery of heat collector cavity generally can use sealing closing,
So as to create good vacuum environment.
So, LED chip is put in vacuum environment, higher degree isolation, and nothing can be carried out to oxygen molecule in air
Nitrogen need to be wasted and experimental cost is low.Also, heat collector cavity can accelerate the aging of LED chip, and avoid detection time long.
For carrying out the security control of thermal-arrest cavity temperature, used as a kind of preferred embodiment, LED chip ageing tester is also
Including：Temperature sensor 6 in heat collector cavity, ventilating system 7 is arranged at, and is connected with temperature sensor and ventilating system respectively
With the controller 8 for opening ventilating system when real time temperature obtained by temperature sensor senses is more than preset security temperature.General,
Controller can be PLC or FPGA controller.Specifically, ventilating system is covered or opens heat collector cavity side wall for movable
On air vent cowling, or be installed on the exhaust fan of heat collector cavity side wall etc..
For fixed ageing rack, the bracing frame 5 with ageing rack abutting joint in heat collector cavity, is provided with, ageing rack is usually removable
Dynamic formula is designed, and so that the ageing rack for being provided with LED chip are put into heat collector cavity, or the ageing rack that detection is completed takes out.
Correspondingly, heat collector cavity has opening, and open circumferential should also be as doing closed design.
Generally, pumped vacuum systems is air pump.And power circuit adopts power supply winding displacement.
In the description of this specification, reference term " embodiment ", " some embodiments ", " an enforcement
Example ", " some embodiments ", " example ", " specific example ", or the description of " some examples " etc. mean with reference to the embodiment or example
The specific features of description, structure, material or feature are contained at least one embodiment or example of the application.In this explanation
In book, identical embodiment or example are not necessarily referring to the schematic representation of above-mentioned term.And, the concrete spy of description
Levy, structure, material or feature can be combined in one or more any embodiment or example in an appropriate manner.
Above content is the further description made to the application with reference to specific embodiment, it is impossible to assert this Shen
Being embodied as please is confined to these explanations.For the application person of an ordinary skill in the technical field, do not taking off
On the premise of conceiving from the application, some simple deduction or replace can also be made.
Claims (6)
1. a kind of LED chip ageing tester, including：The ageing rack that multiple LED chips detect station is provided with, and is used for
The power circuit powered by the detection station, it is characterised in that the LED chip ageing tester also includes：Accommodating institute
State the closed heat collector cavity of ageing rack, and the pumped vacuum systems being installed on inside the heat collector cavity.
2. LED chip ageing tester as claimed in claim 1, it is characterised in that the LED chip ageing tester
Also include：Be arranged at temperature sensor in the heat collector cavity, ventilating system, and respectively with the temperature sensor and described
Ventilating system is connected to open the ventilation when real time temperature obtained by the temperature sensor senses is more than preset security temperature
The controller of system.
3. LED chip ageing tester as claimed in claim 2, it is characterised in that the ventilating system is movable lid
Close or open the cowling of the air vent on the wall of the heat collector cavity side.
4. LED chip ageing tester as claimed in claim 1, it is characterised in that be provided with the heat collector cavity and institute
State the bracing frame of ageing rack abutting joint.
5. LED chip ageing tester as claimed in claim 1, it is characterised in that the pumped vacuum systems is air pump.
6. LED chip ageing tester as claimed in claim 1, it is characterised in that the power circuit is power supply winding displacement.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2015/091410 WO2017054241A1 (en) | 2015-10-02 | 2015-10-02 | Led chip aging test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN206038837U true CN206038837U (en) | 2017-03-22 |
Family
ID=58313289
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201590000164.2U Expired - Fee Related CN206038837U (en) | 2015-10-02 | 2015-10-02 | LED chip aging testing device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN206038837U (en) |
| WO (1) | WO2017054241A1 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858864A (en) * | 2021-01-18 | 2021-05-28 | 厦门大学 | Device and method for carrying out non-contact photoelectric detection on LED chip |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108254704A (en) * | 2018-03-09 | 2018-07-06 | 厦门强力巨彩光电科技有限公司 | A kind of magnetic-type fast signal test restocking tooling of integration |
| CN109542068B (en) * | 2018-12-10 | 2022-04-19 | 武汉中原电子集团有限公司 | High-temperature electrified aging and control system |
| CN114308174B (en) * | 2020-12-01 | 2023-07-25 | 苏州联讯仪器股份有限公司 | Air shower type optical module aging system |
| CN112557710A (en) * | 2020-12-28 | 2021-03-26 | 武汉光迅科技股份有限公司 | Test fixture and test device for optical device |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7053644B1 (en) * | 2004-12-15 | 2006-05-30 | Aehr Test Systems | System for testing and burning in of integrated circuits |
| US20060132167A1 (en) * | 2004-12-22 | 2006-06-22 | Jian Chen | Contactless wafer level burn-in |
| US7015712B1 (en) * | 2005-04-18 | 2006-03-21 | Hong-Sun Liu | Production line environmental stress screening system |
| CN101859718B (en) * | 2009-04-08 | 2012-01-18 | 京元电子股份有限公司 | Chip burn-in machine capable of realizing grouping test |
| CN201489100U (en) * | 2009-06-05 | 2010-05-26 | 贝莱胜电子(厦门)有限公司 | Aging-testing trolley |
| CN104482433B (en) * | 2014-12-11 | 2017-02-22 | 广州代诺可光电科技有限公司 | Production process and production line of LED (light emitting diode) lamp |
-
2015
- 2015-10-02 CN CN201590000164.2U patent/CN206038837U/en not_active Expired - Fee Related
- 2015-10-02 WO PCT/CN2015/091410 patent/WO2017054241A1/en active Application Filing
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112858864A (en) * | 2021-01-18 | 2021-05-28 | 厦门大学 | Device and method for carrying out non-contact photoelectric detection on LED chip |
| CN112858864B (en) * | 2021-01-18 | 2022-02-18 | 厦门大学 | Device and method for carrying out non-contact photoelectric detection on LED chip |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017054241A1 (en) | 2017-04-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170322 Termination date: 20181002 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |