TW201109458A - Sintered cu-ga alloy sputtering target, method for producing the target, light-absorbing layer formed from sintered cu-ga alloy sputtering target, and cigs solar cell using the light-absorbing layer - Google Patents

Sintered cu-ga alloy sputtering target, method for producing the target, light-absorbing layer formed from sintered cu-ga alloy sputtering target, and cigs solar cell using the light-absorbing layer Download PDF

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TW201109458A
TW201109458A TW099124242A TW99124242A TW201109458A TW 201109458 A TW201109458 A TW 201109458A TW 099124242 A TW099124242 A TW 099124242A TW 99124242 A TW99124242 A TW 99124242A TW 201109458 A TW201109458 A TW 201109458A
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alloy
sintered body
sputtering target
target
raw material
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TWI458847B (en
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Masakatsu Ikisawa
Hideo Takami
Tomoya Tamura
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Nippon Mining Co
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
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    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/0623Sulfides, selenides or tellurides
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F3/00Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
    • B22F3/12Both compacting and sintering
    • B22F3/14Both compacting and sintering simultaneously
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C1/00Making non-ferrous alloys
    • C22C1/04Making non-ferrous alloys by powder metallurgy
    • C22C1/0425Copper-based alloys
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C28/00Alloys based on a metal not provided for in groups C22C5/00 - C22C27/00
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C30/00Alloys containing less than 50% by weight of each constituent
    • C22C30/02Alloys containing less than 50% by weight of each constituent containing copper
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22CALLOYS
    • C22C9/00Alloys based on copper
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264Inorganic materials
    • H01L31/032Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312
    • H01L31/0322Inorganic materials including, apart from doping materials or other impurities, only compounds not provided for in groups H01L31/0272 - H01L31/0312 comprising only AIBIIICVI chalcopyrite compounds, e.g. Cu In Se2, Cu Ga Se2, Cu In Ga Se2
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/541CuInSe2 material PV cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02PCLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50Manufacturing or production processes characterised by the final manufactured product

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Abstract

Disclosed is a sintered Cu-Ga alloy sputtering target which is characterized by being composed of a sintered body of a Cu-Ga alloy powder that has a Ga concentration of 20-60 at% with the balance made up of Cu and unavoidable impurities. The sintered Cu-Ga alloy sputtering target is also characterized in that the sintered body has a relative density of not less than 97%, an average crystal grain size of 5-30 μ m and an oxygen content of not more than 400 ppm. It is also effective for the sintered Cu-Ga alloy sputtering target to have an oxygen concentration of not more than 400 ppm and a uniform composition. The target may be produced by a powder production method and hot pressing method of a starting material powder. The Cu-Ga target is free from compositional segregation and no particle adheres to a film that is obtained by sputtering after long-time sputtering. Also disclosed is a method for producing the sintered Cu-Ga alloy sputtering target.

Description

201109458 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種形成Cu-In-Ga-Se(以下記為CIGS) 四元系合金薄膜(即薄獏太陽電池層之光吸收層)時所使用 之Cu-Ga合金燒結體濺鍍靶、該靶之製造方法、由Cu-Ga201109458 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to a method of forming a Cu-In-Ga-Se (hereinafter referred to as CIGS) quaternary alloy thin film (i.e., a light absorbing layer of a thin tantalum solar cell layer). Cu-Ga alloy sintered body sputtering target used, a method for producing the same, and Cu-Ga

合金燒結體耙所製作之光吸收層及使用該光吸收層之CIGS 糸太電池。 【先前技術】 近年來’作為薄膜系太陽電池具有高效率之CIGS系太 陽電池的量產正在進展中,其光吸收層製造方法,已知有 洛鍍法與硒化法(selenizati〇n)。以蒸鍍法所製造之太陽電池 雖然有高轉換效率之優點,但有低成膜速度、高成本、低 生產性之缺點,硒化法較適於產業上大量生產。 砸化法的大致的程序如下。首先,於鈉鈣玻璃基板上 形成鉬電極層,再於其上濺鍍成膜出Cu-Ga層與ιη層後, 利用氫化硒氣體中之高溫處理來形成CIGS層。在利用此硒 化法之CIGS層形成程序中之Cu_Ga層之濺鍍成膜時係使用 有Cu-Ga乾。A light absorbing layer made of an alloy sintered body and a CIGS 糸 battery using the light absorbing layer. [Prior Art] In recent years, mass production of CIGS-based solar cells having high efficiency as thin-film solar cells is progressing, and a method of producing a light-absorbing layer is known as a method of selenium plating and selenization. Although the solar cell manufactured by the vapor deposition method has the advantages of high conversion efficiency, it has the disadvantages of low film formation speed, high cost, and low productivity, and the selenization method is more suitable for mass production in the industry. The general procedure of the deuteration method is as follows. First, a molybdenum electrode layer is formed on a soda lime glass substrate, and a Cu-Ga layer and an iι layer are formed by sputtering thereon, and then a CIGS layer is formed by high temperature treatment in a hydrogenated selenium gas. Cu-Ga dry is used in the sputtering film formation of the Cu_Ga layer in the CIGS layer forming process by this selenization method.

Cu-Ga靶之製造方法有熔解法與粉末法。一般而言,以 熔解法所製造之Cu-Ga靶雖然雜質污染較少,但有組成偏 析大、縮孔(shrinkage cavity)所致產率降低等問題,以粉末 法所製造之靶有燒結密度低、氧濃度高等問題。 各種要素皆會對CIGS系太陽電池的轉換效率帶來影 響’而cms膜特性亦會帶來很大的影響,形成cigs“ 201109458 前階段的Cu-Ga膜的特性亦會對太陽電池的轉換效率帶來 很大的影響。將粉末加以燒結所得之靶與熔解品相比,具 有成分偏析少 '製造容易、A易於視需要進行成分調整: 特徵’與炼解品相比有較大的優點。 “然而,燒結所得之乾有粒子易於產生之問題。尤其是 若於膜表面有粒子等異物,則會對其後之⑽膜特性帶= 不良影響’最終招致CIGS太陽電池轉換效率大幅降低。粒 子的產生原因有濺鍍時之異常放電,其原因和靶的密度有 關。又,因為使用粉末,故有吸附氧或氧混入至粉末 成氧濃度變高之傾向。 k 王a則马止記載有關 1—^ ” 艰崎之異常 放電、於膜上產生粒子之文獻(專利文獻1)中,僅止於記葡 無異常放電等,僅舉出相對密度A 95%以上作為其理由。 該文獻中,Cu-Ga靶係以熔解法所製作。 然密度較高,通 1之段落[0010J ’確有實現此種 身又而。’熔解品相較於燒結品,當 常未滿100%之密度者少。然而,專利文獻 記載著「相對密度為95%以上之高密度」 程度的密度之記載。 然而’相對密《95%左右絕對無法稱為高密度。實際 上吾人認為此專利文獻丨中, 不 π 蝽解°口中產生了會使密度 降低之孔洞、不佳之空孔(空隙)。 但完全未揭 ’僅敘述已 又,雖然已有未觀察到組成偏析之記載, 示分析結果等。從上述程度之相對密度的記載 認知水準程度之偏析的提升。 201109458 , 又°熔解法通常組成偏析大,因為未經過用以 消除偏析之特別的步驟, 鄉故^為其會殘存有一般程度之偏 析。 此種炫解品特右夕# > ,有之偏析有於濺鍍中發生膜組成變化之 不良情況。且賤鍍條件亦不明。 _在賤鍍成膜開始之初,即使沒有異常放電等,亦會因 :時變化產生濺鍍表面粗糙等’而造成易於引起異常放 電’此乃眾所週知之事實 爭頁而關於在長時間濺鍍後是否無 異吊放電、粒子產吐 卞度生方面則完全未有記載。 又’關於Cu-Ga乾之# AU -V ^1 / ^ 处 /、他文獻(專利文獻2)中記載了燒 …體乾,其有切削靶時易 了勿赞生破裂、缺損之脆性之相關習 知技術的說明,為了解決 Λ 解决此凊況,製造了二種粉末並將其 加以混合進行燒結。 而一種粉末之一為摇古γ r 人日 小7广 呙钕同了仏含®之粉末,另一者為減 •^了 Ga含量之粉末,為 曰 马以日日界相包圍之二相共存組織》 此步驟因為是製造二插φ 種粉末’故步驟複雜’且各粉末 之硬度等物性值、組織不同, _ .,^ 3个U故僅進仃混合燒結難以作成 句句的燒結體’無法期待相對密度的提升。 密度變低之靶當然會有里當 抵μ s$放電、粒子產生,而若於 =膜表面有粒子等異物,則對於其後之⑽膜特性亦會 影響,多有最終招以咖太陽電池轉換效率大幅 此專利文獻2中,雖麸未 …、禾進仃使用有靶之濺鍍成膜, 且關於異常放電、粒子等 全未有s己载,但可以說已隱含 1 201109458 了该問題。 專利文獻3中’除了例示有c 之記錄層的材料之—以冰^ 作為先目己錄媒體 之記載。然而,並無機…7之=積層Auzn記錄層 之濺锻。 ’…載,只不過暗示了 CuGa2 專利文獻4中’降了如-女 之吃饪届列不有CUGa2以作為光記錄媒體 之δ己錄層的材料之— Μ截Μ 乂夕卜,還有以濺鍍法積層AuSn記錄層 之5己載。並無濺錢CuGn ·>七沿 賤鑛。 _山己載,只不過暗示了 CuGa2之 專利文獻5中於請求項29記載了 -種鋼合金靶,其含 以上且未滿10重量%之以,具有之 ^結晶粒度,絲整體之結晶粒度均勾性具有未滿15% 之標準偏差。其目的係使之Ga濃度低’且使經鍛造、壓延 所作成之把具有特定的織構。 專利文獻6中主張了 —種在Q1〜㈣㈣之固溶限範 圍内添加有3 Ga之添加兀素的銅合金。然而,實施例所示 者僅為Cu_Mn合金,且關於絶之製法並未具體記載,認為 疋以熔解法所製得者。用途為顯示裝置用。 專利文獻7中,為―種將粉末之原料成分進行冷靜水 壓壓縮所製得之銅合金靶’實施们中記載了以銦粉末與 Cu-Ga合金粉末所構成之混合物為原料之靶的製法。與本申 请發明相比,並未進行燒結,組成亦不同,無相關之要素。 專利文獻8中雖有含有1〜2〇at%Gai Cu合金記錄層 用濺鑛乾之記載,但實施例所記載的是,以電弧溶解爐熔 6 201109458 製於Cu添加有〜或Mn之材料而得以作為鑄錠 任何有關添加有Ga之銅合金乾之具體記載。 ‘、、、 專利文獻9中,雖'然實施例記載了用以用於CIGS型薄 膜太陽電池製造之10、2〇、3〇番县〇/广 得 30重量%之Ga的CuGa合 的使用例,但關於CuGa合今釦士 & 金靶本身之製法並無任何記載。 又,同樣地關於靶的諸特性亦無記載。 專利文獻1G巾’記載了以锻造急冷法製造含有25〜 的CUGa合金起之方法。雖與本中請發明-樣是薄 膜太陽電池用途,但右你^ , '、有鍛造特有的缺點,由本申請發明 所解決之課題依然存在。 專利文獻11中界定了含有2G〜96重量%之⑪的c他 合金靶’且在實施例中記載了 Ga25重量%、Cu75重量%特 別有效。然而’關⑨cu_Ga合錄本身之製法並未有任何 記載’關於把的諸特性亦同樣未有記載。上述任—之專利The manufacturing method of the Cu-Ga target includes a melting method and a powder method. In general, the Cu-Ga target produced by the melting method has less impurity contamination, but has problems such as large composition segregation and a decrease in yield due to a shrinkage cavity. The target produced by the powder method has a sintered density. Low, high oxygen concentration and other issues. Various factors will affect the conversion efficiency of CIGS solar cells, and the characteristics of cms film will also have a great impact, forming the characteristics of the cigs "Cu-Ga film in the pre-201109458 phase will also affect the conversion efficiency of solar cells. The target obtained by sintering the powder has less component segregation than the melted product, and is easy to manufacture, and A is easy to adjust the composition as needed. The feature 'has a greater advantage than the refined product. "However, the dryness obtained by sintering has problems in that particles are easily generated. In particular, if there is foreign matter such as particles on the surface of the film, the subsequent (10) film characteristic band = adverse effect will eventually lead to a significant decrease in the conversion efficiency of the CIGS solar cell. The cause of the particles is abnormal discharge during sputtering, which is related to the density of the target. Further, since the powder is used, there is a tendency that oxygen or oxygen is mixed into the powder to form a high oxygen concentration. k 王 a 马 记载 记载 记载 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰 艰The reason for this is as follows. In this document, the Cu-Ga target system is produced by a melting method. However, the density is high, and the passage of the passage [0010J ' does have such a body. The melted product is compared with the sintered product. The density is often less than 100%. However, the patent document describes the density of the "high density of 95% or more relative density". However, 'relatively dense' is about 95% and cannot be called high density. In fact, in our patent document, in the patent document, pores and poor pores (voids) which reduce the density are generated in the mouth. However, it has not been disclosed at all. Only the description has been made. Although the description of the composition segregation has not been observed, the analysis results and the like are shown. From the above-mentioned degree of relative density, the increase in seizure of the level of cognition is described. 201109458, and the ° melting method usually constitutes a large segregation, because it has not undergone a special step to eliminate segregation, and the township will have a general degree of segregation. This kind of dazzling product special right eve # >, there is a segregation of the film composition changes in the sputtering process. The conditions of enamel plating are also unknown. _In the beginning of enamel plating, even if there is no abnormal discharge, etc., it may cause abnormal discharge due to the occurrence of sputtered surface roughness, etc. 'This is a well-known fact that is about the long-term sputtering. There is no record of whether there is no different suspension discharge or particle spawning. Further, in the case of #AU-V ^1 / ^ in Cu-Ga dry, and in his literature (Patent Document 2), it is described that the body is burnt, and when it is a cutting target, it is easy to be broken and the brittleness of the defect. In order to solve this problem, two types of powders were produced and mixed for sintering. One of the powders is a powder of γ r 人 日 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 7 Coexisting organization: This step is because the manufacturing process is two-injection of φ powders, so the steps are complicated, and the hardness and other physical properties of the powders are different, and the microstructure is different, _., ^3, so only the sintered body is difficult to form a sintered body. 'Can't expect an increase in relative density. The target with a lower density will of course have a discharge to the μ s$ and a particle, and if there is a foreign matter such as particles on the surface of the film, the film properties will also be affected by the subsequent (10) film characteristics. The conversion efficiency is large. In Patent Document 2, although the bran is not used, the Wojin is coated with a target, and the abnormal discharge and the particles are not contained, but it can be said that 1 201109458 is implied. problem. In Patent Document 3, 'the material of the recording layer of c is exemplified, and the ice is used as the recording medium of the prior art. However, it is also inorganic...7 = the layered Auzn recording layer is sputtered. '..., but it implies that in the patent document 4 of the CuGa2 patent, there is no CUGa2 as the material of the δ recording layer of the optical recording medium. 5 layers of the AuSn recording layer were deposited by sputtering. There is no splash of CuGn ·> Seven along the Yankuang Mine. _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The homogenous property has a standard deviation of less than 15%. The purpose is to make the Ga concentration low and to make a specific texture by forging and calendering. Patent Document 6 proposes a copper alloy in which 3 Ga of added halogen is added to the solid solution limit of Q1 to (4) (4). However, the examples shown in the examples are only Cu_Mn alloys, and the method for the production of the crucible is not specifically described, and it is considered that the crucible is obtained by the melting method. The purpose is for display devices. Patent Document 7 describes a method for producing a target using a mixture of indium powder and Cu-Ga alloy powder as a raw material for a copper alloy target obtained by subjecting a raw material component of a powder to a water pressure compression. . Compared with the present invention, sintering is not performed, and the composition is different, and there is no relevant element. Patent Document 8 describes a sputtering sputter containing a 1 to 2 〇 at% Gai Cu alloy recording layer. However, in the examples, an arc dissolving furnace melting 6 201109458 is used to prepare a material in which Cu is added with Mn or Mn. It can be used as an ingot for any specific description of the dry copper alloy to which Ga is added. In the patent document 9, the use of CuGa for the use of Ga, which is used for the production of CIGS-type thin film solar cells, 10, 2, 3, 3, and 3, and 30% by weight of Ga is described. For example, there is no record of the method of making the CuGa Hejinshi & Gold target itself. Further, the characteristics of the target are also not described in the same manner. Patent Document 1G towel describes a method of producing a CUGa alloy containing 25 Å by a forging quenching method. Although it is invented in the present invention, it is a thin-film solar cell application, but it is a problem that is unique to forging, and the problem solved by the invention of the present application still exists. Patent Document 11 defines a c-alloy target of 2G to 96% by weight of 11 and it is described that Ga25 wt% and Cu75 wt% are particularly effective in the examples. However, there is no record in the production method of the "9cu_Ga" book itself. The characteristics of the book are also not recorded. The above-mentioned patent

文獻中’纟能發現對於本申請發明之課題及其之解決手段 能作為參考之技術的揭示。 X 專利文獻1 專利文獻2 專利文獻3 專利文獻4 專利文獻5 專利文獻6 專利文獻7 專利文獻8 曰本特開2000-73 163號公報 曰本特開2008-138232號公報 曰本特開昭63-37834號公報 θ本特開昭62-379533號公報 9本特表2005-5 33 187號公報 國際公開W02006-025347號公報 國際公開WO2007-137824號公報 國際公開W02007-004344號公報 201109458 專利文獻9:日本特開平10]35498號公報 專利文獻ίο巾華人民共和國特開)號公報 專利文獻11 :日本特開平1 1-260724號公報 【發明内容】 有鑑於上述狀況,本發明之課題在於提供一種於Cu_Ga 燒結體乾之中,密度高,且長時間賤鑛後亦幾乎沒有滅鐘 時的異常放電、粒子產生於膜之Cu_Ga合金燒結體把及其 之製造方法,以及由Cu-Ga合金燒結體乾所製作之光吸收 層’及使用有該光吸收層之CIGS系太陽電池。 為了解決上述課題,本發明人等努力研究之結果,了 解到異常放電、粒子產生與把密度密切相關,也:道會發 生低密度之輕使異常放電、粒子增加之問題,進而獲得「藉 7改善乾的平均粒徑、氧濃度、組成均句性等而可進一步 •^升CIGS層形成程库φ夕p 於姐一 屬序中之㈣層的濺鍍成膜特性,有助 系太陽電池的轉換效率」之見解而完成本發明。 亦即’本發明係提供 1為20〜60at%、剩餘部份為〜及無法避免的雜 产為^ 末之燒結體所構成,該燒結體之相對密 义為97/。以上、平均結晶粒徑 400Ppm以下; 3〇Am、氧含量為 2) 如4 υ之Cu-仏合金燒結體⑽乾,其令,c 〇金係由單—組成所構成; a 3) 如上述υ〜2)中任一項之Cu_Ga合金燒結體錢錄 201109458 二二二&合金之X射線繞射之…外的峰強度 相對於主峰強度為5%以下; 如上4丨)〜3)中任—項之CU'Ga纟金燒結體滅鍍 ’/、中,Cu-Ga合金組成實質上為7相或者主要相為r相。 又’本發明提供 5) 種Cu_Ga合金燒結體濺鍍靶之製造方法,其係將 ^及Ga原料加以熔解、冷卻後,再以熱壓法將經粉碎之 此σ原料粉製作成Cu_Ga合金濺鍍靶之方法,其特徵在於: 。將熱壓時之保持溫度定為較混合原料粉熔點低5〇〜 2〇〇°C,將保持時間定為卜3小時,冷卻速度定為代/論 =上’對混合原料粉之加壓壓力定為30〜40MPa來進行熱 6) —種Cu-Ga合金燒結體濺鍍靶之製造方法,其係將 Cu及Ga原料加以炫解、冷卻後,再以熱壓法將經粉碎之 昆合原料粉製作成上述丨)〜4)之任—項之Cu_Ga合金燒结 體濺鍍靶之方法,其特徵在於: 疋… 。將熱壓時之保持溫度定為較混合原料粉熔點低〜 2〇〇°C,將保持時間定為卜3小時,冷卻速度定為代“ 以上,對混合原料粉之加壓壓力定為3〇〜4〇Μρ&來進行熱 壓; ,、'、 7)如上述5)或6)之Cu_Ga合金燒結體濺鍍靶之製造方 法’其係以氣體霧化法或水霧化法來進行Cu及〜 熔解、冷卻後之粉碎。 ^ 再者,本發明提供 201109458 8) —種光吸收層,其係由上述1)〜4)中任—項之Cu_Ga 合金燒結體濺鍍靶所製作之Cu-Ga系合金膜所構成; 9) 一種CIGS系太陽電池’其係使用有上述8)之光吸 收層。 依據本發明,可提供一種於Cu-Ga燒結體減鑛乾之中, 無組成偏析,且長時間濺鍍後亦無異常放電,於濺錢所得 之膜上幾乎不產生粒子之Cu_Ga合金燒結體靶及其之製造 方法,故具有提升Cii-Ga膜之製造產率同時可抑制由該 Cu-Ga膜所製作之cms太陽電池之轉換效率降低的優異效 【實施方式】 接著,記載用以實施發明之形態,亦即本發明之構成 要件的定義、範圍規定之理由、意義、調整方法、測定方 。y餘部伤為Cu及無法避免的雜質。因 成。 技術心想本身亦可適用於此範圍以外之組 之相對密声定盔Ω 、女仟,係將燒 絕計由4 以上。相對密度係燒結體靶之實The disclosure of the subject matter of the present invention and its solutions can be found in the literature. X Patent Document 1 Patent Document 2 Patent Document 3 Patent Document 4 Patent Document 5 Patent Document 6 Patent Document 7 Patent Document 8 曰本特开 2000-73 No. 163 曰本特开 2008-138232号曰本特开昭63 Japanese Patent Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. Japanese Patent Application Laid-Open No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. Among the Cu_Ga sintered body, the density is high, and there is almost no abnormal discharge at the time of quenching after a long period of time, the Cu_Ga alloy sintered body in which the particles are generated from the film, the manufacturing method thereof, and the sintering by the Cu-Ga alloy. The light absorbing layer produced by the body cavity and the CIGS solar cell using the light absorbing layer. In order to solve the above problem, the inventors of the present invention have worked hard to find out that abnormal discharge, particle generation, and density are closely related, and that the problem of low density and abnormal discharge and particle increase occurs, and the problem is obtained. Improve the average particle size of the dry, oxygen concentration, composition of the sentence, etc., and further increase the CIGS layer formation process library 夕 p p in the sister (1) layer of the sputtering film formation characteristics, help the solar cell The present invention has been completed by the insight of the conversion efficiency. That is, the present invention is composed of a sintered body in which 1 is 20 to 60 at%, the remainder is - and an unavoidable impurity is obtained, and the relative density of the sintered body is 97 /. The above, the average crystal grain size is 400 Ppm or less; 3〇Am, and the oxygen content is 2), such as 4 υ of the Cu-仏 alloy sintered body (10), which is such that the c sheet metal is composed of a single composition; a 3) Cu~2) The Cu_Ga alloy sintered body of any one of the υ~2) 201109458 2222 & alloy X-ray diffraction of the external peak intensity relative to the main peak intensity of 5% or less; as above 4 丨) ~ 3) In the CU'Ga bismuth sintered body of any of the items, the composition of the Cu-Ga alloy is substantially 7 phases or the main phase is the r phase. Further, the present invention provides a method for producing a Cu_Ga alloy sintered body sputtering target, which is obtained by melting and cooling a raw material of Ga and Ga, and then grinding the σ raw material powder into a Cu_Ga alloy by hot pressing. A method of plating a target, which is characterized by: The holding temperature during hot pressing is set to be lower than the melting point of the mixed raw material powder by 5 〇 2 2 ° C, and the holding time is set to be 3 hours, and the cooling rate is set as the generation/thesis = the upper part is pressed against the mixed raw material powder. The pressure is set to 30 to 40 MPa to carry out heat 6) a method for producing a Cu-Ga alloy sintered body sputtering target, which is to smash and cool the Cu and Ga raw materials, and then pulverize the kiln by hot pressing A method for producing a Cu_Ga alloy sintered body sputtering target according to any one of the above-mentioned 丨) to 4), which is characterized in that: 疋... The holding temperature during hot pressing is set to be lower than the melting point of the mixed raw material powder by ~2 〇〇 ° C, and the holding time is set to be 3 hours, and the cooling rate is set as "above, the pressing pressure of the mixed raw material powder is set to 3" 〇〜4〇Μρ& to perform hot pressing; ,, ', 7) The method for producing a Cu_Ga alloy sintered body sputtering target according to the above 5) or 6) is carried out by gas atomization or water atomization Cu and ~ are pulverized after melting and cooling. Further, the present invention provides 201109458 8) a light absorbing layer which is produced by the Cu_Ga alloy sintered body sputtering target of any of the above 1) to 4) A Cu-Ga-based alloy film is formed; 9) A CIGS-based solar cell using the light-absorbing layer of the above 8). According to the present invention, a Cu-Ga sintered body can be provided in the ore-reducing dry, without composition Segregation, and no abnormal discharge after long-time sputtering, Cu_Ga alloy sintered body target which produces almost no particles on the film obtained by splashing, and a manufacturing method thereof, thereby improving the manufacturing yield of the Cii-Ga film while suppressing The conversion efficiency of the cms solar cell made of the Cu-Ga film is excellent. EMBODIMENT Next, the reason for the definition and scope of the constituent elements of the present invention, the meaning, the adjustment method, and the measurement method for describing the form of the invention are described. The remaining part of the invention is Cu and an unavoidable impurity. The thought itself can also be applied to the group of relatively dense Helmets and lionesses outside the range, which will be burned to more than 4. The relative density is the target of the sintered body.

Hu組成之#的理論密度所得 :的相野密度低意指乾中存在大量内部空孔故 鎮中出現内邹空孔時,”得容易產生以空孔周邊: 10 201109458 之飛機、異常放電。 因此造成粒子產生於膜的情況增加,且表面的凹凸化 早進行I得谷易引起以表面突起(結球(n〇(juie))為起點 ’、吊放電等。此為CIGS太陽電池轉換效率降低的原因之 一。因此,燒結體靶相對密度必須至少為97%以上,較佳 為98%以上,更佳為99%以上。 再者,本發明之Cu_Ga合金燒結體濺鍍靶係將平均結 晶粒徑定為5〜3〇//m。平均粒徑可視需要將靶表面輕微蝕 刻使日日界明確後再以平面(planimetric)法求出。 若燒結體靶的平均粒徑小,則具有可更加高密度化之 優點。又,若平均粒徑大,貝,丨各結晶粒會隨機配向,因此 會依結晶面方位而濺鍍速度不同,故容易於表面產生大的 凹凸,並容易增加以此為起點之粒子產生。因此,藉由使 平均粒徑較小,而可提升靶的密度,同時可進一步減少粒 子產生數。 由上述之機制來看,使靶的平均結晶粒徑小至5〜3〇 以m左右會具有較大之優點。但使平均粒徑未滿5以爪的情 況,因為製造上必須再增加步驟故不利於實用。因此,將 平均結晶粒徑的下限值定為5以m。 又,若平均粒徑超過30 A m,則密度提升之效果會減 少,粒子產生數會增加,故定為3〇 # m以下為佳。 平均粒徑可依熱壓時之保持溫度來調整,越高溫則粒 徑越大。X ’雖然亦可進而超㉟3—,甚至定為較大的 50 以上,但整體而言因為密度降低故並不佳。 201109458 將氧,量定為4〜以下以作 燒結體義乾的條件。氧濃度若高則會易…… 之金屬成分結合而形成氧化物。又,… 以合金 屬高,故會超過單-组成之電阻不二?;化物電阻較金 内會產生電阻差,而易於發生以高電阻::為:而於乾: 放電、減料度不同所致之表面 ^點之異常 粒子產生之原因。 谷易成為異常放電、 向。境:進行機械粉碎則氧濃度會有變高的傾 :。……時則必須要將粉碎後之粉末加以還原處 相反地,若制在*含氧之環境巾進行 =霧化法、氣體霧化法則可減低氧濃度。因此了刀 進行還原處理。…體霧化法為佳’最好是視需要 俾提Cu-Ga合金燒結體減鑛乾之較佳條件之-, ==一金…组成所構一合金燒Hu's theoretical density obtained by #: the low density of the phase field means that there are a large number of internal voids in the dryness, so when the inner Zoukong hole appears in the town, "it is easy to produce a hole around the hole: 10 201109458 aircraft, abnormal discharge. The occurrence of particles in the film is increased, and the surface roughness is prematurely caused by surface protrusions (n〇 (juie) as a starting point', lifting discharge, etc. This is a reduction in conversion efficiency of CIGS solar cells. One of the reasons. Therefore, the relative density of the sintered body target must be at least 97%, preferably 98% or more, more preferably 99% or more. Furthermore, the Cu_Ga alloy sintered body sputtering target of the present invention will have an average crystal grain. The diameter is set to 5 to 3 〇//m. The average particle size can be slightly etched as needed to make the sunday boundary clear and then determined by the planimetric method. If the average particle size of the sintered body target is small, it has Further, if the average particle size is large, the crystal grains of the shell and the bismuth will be randomly aligned, and therefore the sputtering speed will be different depending on the orientation of the crystal plane, so that it is easy to generate large irregularities on the surface, and it is easy to increase This is the starting point Therefore, by making the average particle diameter smaller, the density of the target can be increased, and the number of particles generated can be further reduced. From the above mechanism, the average crystal grain size of the target is as small as 5 to 3 〇 The m or so will have a large advantage. However, if the average particle diameter is less than 5 claws, it is disadvantageous to be practical because the steps must be further increased in manufacturing. Therefore, the lower limit of the average crystal grain size is set to 5 m. Moreover, if the average particle size exceeds 30 A m, the effect of density increase is reduced, and the number of particles is increased, so it is preferable to set it to 3 〇# m or less. The average particle diameter can be adjusted according to the temperature at which the heat is maintained. The higher the temperature, the larger the particle size. Although X' can be further 353-, or even larger than 50, it is not good because of the density reduction. 201109458 The amount of oxygen is 4~ As a condition for the sintered body to be dry, if the oxygen concentration is high, the metal components are combined to form an oxide. Moreover, the metal is higher than the single-component resistance. There is a difference in resistance in the gold, which is easy to occur. High resistance:: is: and dry: Causes of abnormal particles on the surface of the surface due to different discharge and reduction. Gu Yi becomes abnormal discharge, and the environment: the mechanical concentration will increase the oxygen concentration. When pouring: ..., it is necessary to reduce the pulverized powder to the opposite side. If it is made in an *oxygenated environmental towel, the atomization method and the gas atomization method can reduce the oxygen concentration. Treatment....The body atomization method is better. It is better to extract the Cu-Ga alloy sintered body as the best condition for the ore-reducing dry--, == one gold...the composition of the alloy is burnt.

本發明中單—組成一詞,係以「僅以 A 段等無法檢測出其他組成存在之組成所構成之: 義來使用。又,微觀而言,當即使微量含有会」思 被切氧合刺*々 /、他、,且成亦不 —s對各種特性造成不良影響 單一乡且成相同之效果。 貫質上仍會展現與 係提之Cu-Ga合金燒結體濺㈣之較佳條件之-, ’、Cu'Ga合金燒結體濺鍍靶,其Cu-Ga合金之χ 12 201109458 射線繞射之主峰以外的峰強度相對於主峰強度為5%以下。 可以X射線峰強度比來界定上述單一性之基準。與主 •,且成之峰相比,其他組成之峰強度只要為以下即可實質 上展現與單一組成相同之效果。 以氣體霧化或水霧化法所製作之混合原料粉的組成大 致均勻’將職合原料加以熱壓所得之㈣成亦可接近均 句。又,於熱屋冷卻中冷卻速度若小,則有時冷卻中會析 出異相。此種異相若量多則可以χ射線繞射峰檢測出。 cu-Ga合金當仏組成約為3〇〜伽%時,會具有加瑪 ⑴相。此相具有脆性,具有易於破裂之特徵。CIGS系太 陽電池中所使用之 ,.成大夕特別疋在此Ga濃度範 ° ^避免此種Cu-Ga合金的跪性,提升密度特別有效。 之!…立 乃之靶的製造方法’記載其範圍界定 之理由和忍義、對於該乾諸特性所造成之影響等。 以既定之組成比例秤量Γ 鋼 原枓後,置於碳製坩 45() 口至約Ο·5^大氣壓之加熱爐内, 使混合原料炼解。保持約 = 分將熔解原料加以混合 '、充 出初級合成原料。 τ止加熱,進行冷卻之後,取 法有級合成原料加以粉碎以獲得微㈣料。粉碎方 有機械粉碎、氣體霧化法、水霧化法 一 但較低& 士 任一方法皆可, 較:成本且可大量處理者為水霧化法。 當為水霧化的情況時,方法 度在坩鍋内炫:^ 便仞級合成原料再 解,使成為液狀之原料液滴下,對該滴下液In the present invention, the term "composition" is composed of "only a component such as A segment which cannot detect the presence of other components: use is used. Also, microscopically, even if a trace is contained, it is considered to be oxygenated. The thorns *々/, he, and the same or not - s have a bad effect on various characteristics of a single township and the same effect. The permeation will still show the best conditions for the sputtering of the Cu-Ga alloy sintered body (4), ', Cu'Ga alloy sintered body sputtering target, the Cu-Ga alloy χ 12 201109458 ray diffraction The peak intensity other than the main peak is 5% or less with respect to the main peak intensity. The basis of the singularity can be defined by the X-ray peak intensity ratio. Compared with the main and the peaks, the intensity of the peaks of other components can be substantially the same as the single composition. The composition of the mixed raw material powder produced by the gas atomization or water atomization method is substantially uniform. The (four) composition obtained by hot pressing the raw material for the occupation may also be close to the uniform sentence. Further, if the cooling rate in the cooling of the hot house is small, a hetero phase may be precipitated during cooling. If the amount of such out-of-phase is large, it can be detected by the ray diffraction peak. The cu-Ga alloy has a Gamma (1) phase when its composition is about 3 〇 to gamma. This phase is brittle and has the characteristics of being easily broken. CIGS is used in solar cells. It is especially suitable for this Ga concentration. It is particularly effective to avoid the enthalpy of this Cu-Ga alloy. The method of manufacturing the target of 'Nei Nai' describes the reasons and tolerances of the scope, the effects on the characteristics of the stem. After weighing the original steel crucible with a predetermined composition ratio, it is placed in a heating furnace of carbon 坩 45 () to about Ο · 5 ^ atmospheric pressure to refine the mixed raw materials. Keep about = the minutes to mix the molten raw materials', and fill the primary synthetic raw materials. After the τ was heated, after cooling, the synthetic raw material was taken and pulverized to obtain a micro (four) material. The pulverizing side has mechanical pulverization, gas atomization method, and water atomization method. However, any method can be used, which is comparable to the cost and can be handled by a large amount of water atomization method. In the case of water atomization, the method is dazzled in the crucible: ^ The crucible-grade synthetic raw material is re-dissolved, so that it becomes a liquid-like raw material droplet, and the dropping liquid

13 & 201109458 喷射約lOMpa左右之古厭^ 之同壓水,以獲得微粉。所得之微粉係 於其後經壓渡、乾燥等再作蛊、θ 寻丹1乍為 合微粉原料來使用。 使混合微粉原料經過特定開口的篩,調整粒度分布後 進行熱壓。熱壓條件依Ga濃度而適當條件會不同,例如當13 & 201109458 Spray about 1 mppa of the same ancient pressure to the same pressure water to obtain fine powder. The obtained fine powder is used as a raw material of the micropowder after being subjected to pressure rolling, drying, etc., and θ. The mixed fine powder material is passed through a sieve of a specific opening, and the particle size distribution is adjusted, followed by hot pressing. The hot pressing conditions vary depending on the Ga concentration, for example, when

Ga濃度為30at%的情況時,為溫度_〜贿、壓力3〇〜 40MPa左右。 亦即,就此熱壓之較佳條件而言,有效者如下:使敎 ㈣之保持溫度低於混合原料粉溶點5〇〜载、保持時間 疋為3丨時冷卻速度定為51 /min以上 ' 對混合原料 粉之加壓壓力定為3G〜侧Pa。適當選擇此錢條件,則 可謀求Cu-Ga合金乾之密度提升。 在溫度上昇速度、保持時間等溫度刳面(profile)與壓力 施加剖面的關係方面,㈣交於使溫度成為設定最高溫度後 再施加壓力之後壓方《’先施加壓力之先壓方式因為於繞 結前原料粉會粉粹成較細微故對於提高燒結密度是有效 的〇 又,熱壓之冷郃速度若為緩慢的,則於其之間會產生 異相’故冷卻速度u 5t/mln以上之快速溫度是有效的。 以上述方法所製作之cu_Ga燒結體之密度可以阿基米 德法、平均粒徑可於表面蝕刻後以平面法、氧濃度可以ICP 勺析法、組成可以X射線繞射法分別求出。 可將上述Cu-Ga燒結體加工成例如直徑6吋、厚度 6mm,再於底板(backing plate)貼附銦作為硬焊填充金屬 (brazing filler metal),做為濺鍍靶,再進行成膜,調查對膜 201109458 之粒子產生狀况、結球、異常放電等狀況。 實施例 接著兒月本發明之實施例及比較例。又,因為以下 之實施例頂多表不代表的例子故本發明並不需要被限制 於5亥等實施例’應以說明書所記載之技術思想範圍來解釋。 (實施例1) 秤$ Cu原料與Ga原料以使組成之Ga濃度為3〇at%, 置於碳製堆鋼,在施加有〇5Mpa之氮的加熱爐内以 c溶解後’再以冷卻速纟5〜1(rc/min冷卻後取出合成原 料。 、 接著,將此合成原料置於水霧化裝置之碳坩鍋,以 °c熔解後,滴下熔解液同時對於滴下液喷射1〇Mpa的高壓 水,而獲得Cu-Ga混合微粉。將混合微粉壓濾後以1 2〇。匸乾 燥之,獲得混合微粉原料。 以5 C /min之升溫速度將此混合微粉從室溫升溫至65〇 °C之後,保持在650°C 2小時同時施加35Mpa之壓力。其後, 以5 C /min之降溫速度進行冷卻之後取出燒纟士體。 所得之Cu-Ga燒結體的相對密度為99 9%,平均粒徑為 5 V m、氧含量為350PPm、主相與異相之χ射線繞射峰強度 比為0.2%。將此燒結體加工成直徑6 n寸、厚度6mm之圓板 狀,做成濺鍍靶,進行濺鍍。濺鍍功率使用直流電 (DC)IOOOW、環境氣體使用氬而氣體流量使用50sccm、濺 鍍時壓力使用〇.5Pa、基板使用直徑4吋且厚度〇 7mm的 Corning 1737之玻璃基板。When the Ga concentration is 30 at%, the temperature is _~ bribe, and the pressure is about 3 〇 to 40 MPa. That is to say, in terms of the preferable conditions of the hot pressing, the effective ones are as follows: the holding temperature of the crucible (4) is lower than the melting point of the mixed raw material powder, and the cooling rate is set to 51/min or more when the holding time is 3丨. ' The pressure of the mixed raw material powder is set to 3G to side Pa. When this money condition is properly selected, the density of the Cu-Ga alloy can be increased. In terms of the relationship between the temperature rise rate and the holding time, such as the temperature profile and the pressure application profile, (4) after the temperature is set to the highest temperature and then the pressure is applied, the pressure is applied first. Before the knot, the raw material powder will be finer and finer, so it is effective for increasing the sintered density. If the cold rolling speed of hot pressing is slow, there will be a heterogeneous phase between them, so the cooling rate is more than 5 t/mln. Fast temperatures are effective. The density of the cu_Ga sintered body produced by the above method can be determined by the Archimedes method, the average particle diameter can be obtained by surface etching, the plane method, the oxygen concentration can be ICP scooping, and the composition can be obtained by X-ray diffraction. The Cu-Ga sintered body can be processed into, for example, a diameter of 6 吋 and a thickness of 6 mm, and then indium is attached to a backing plate as a brazing filler metal as a sputtering target, and then a film is formed. Investigate the state of particle generation, ball formation, and abnormal discharge of film 201109458. EXAMPLES Next, examples and comparative examples of the present invention will be given. Further, since the following examples are not representative of the examples, the present invention is not necessarily limited to the embodiment of the invention, which should be explained in the scope of the technical idea described in the specification. (Example 1) A scale of $Cu raw material and Ga raw material so that the composition has a Ga concentration of 3 〇 at%, placed in a carbon steel pile, dissolved in c in a heating furnace to which 5 Mpa of nitrogen is applied, and then cooled. Quickly smash 5~1 (after rc/min cooling, take out the synthetic raw material. Then, put the synthetic raw material in the carbon crucible of the water atomizing device, melt it at °c, drop the molten solution and spray 1〇Mpa for the dripping liquid. The high-pressure water is obtained, and the Cu-Ga mixed fine powder is obtained. The mixed fine powder is subjected to pressure filtration and dried at 12 ° C. The mixed fine powder raw material is obtained, and the mixed fine powder is heated from room temperature to 65 at a heating rate of 5 C /min. After 〇 ° C, a pressure of 35 MPa was applied while maintaining at 650 ° C for 2 hours. Thereafter, after cooling at a cooling rate of 5 C /min, the burned scorpion was taken out. The relative density of the obtained Cu-Ga sintered body was 99. 9%, the average particle size is 5 V m, the oxygen content is 350 ppm, and the intensity ratio of the main phase and the heterogeneous X-ray diffraction peak is 0.2%. The sintered body is processed into a disk shape of 6 n in diameter and 6 mm in thickness. Sputtering target is used for sputtering. The sputtering power is DC (1000), and the ambient gas is argon. Amount 50 sccm, a pressure 〇.5Pa when using sputtering, the substrate having a diameter of 4 inches and a thickness of the square Corning 1737 glass substrate of 7mm.

B 201109458 濺鍍時間20小時後,總濺鍍量20kWhr後,以顯微鏡 計數成膜Cu-Ga膜厚30分鐘時產生於膜之0.2// m以上的 粒子數,結果為0個。又,成膜時並未確認到異常放電。 將以上之結果示於表1。 表1 實施例 Ga濃度 (at%) 相對密 度 (%) 平均粒 徑 (轉) 氧含量 (ppm) X射線強 度比 (%) 粒子數 (個) 異常放 電 實施例1 30.0 99.9 5 350 0.2 0 無 實施例2 30.0 99.8 12 360 0.3 0 無 實施例3 35.0 98.8 19 390 0.5 2 無 實施例4 35.0 98.6 20 390 0.8 1 無 實施例5 42.6 97.8 25 400 1.0 5 無 實施例6 42.6 97.5 26 400 1.2 8 無 比較例1 30.0 97.2 24 420 0.9 11 少 比較例2 30.0 97.0 25 420 1.0 12 少 比較例3 30.0 98.0 20 450 0.8 13 少 比較例4 30.0 98.6 15 450 0.4 16 多 比較例5 30.0 97.5 25 450 1.0 17 多 比較例6 30.0 97.8 24 470 0.9 18 多 比較例7 30.0 98.5 18 470 0.5 17 多 比較例8 30.0 98.1 14 480 0.4 19 多 比車交例9 30.0 97.8 25 600 1.0 20 多 比較例10 30.0 97.6 28 1300 1.5 25 多 比較例11 30.0 98.6 50 350 4.6 15 少 比較例12 30.0 98.6 28 350 7.0 19 少 比較例13 30.0 98.2 97 350 11.0 21 多 比較例14 30.0 99.9 1100 40 18.8 28 多 比較例15 35.0 98.0 960 50 17.5 24 多 比較例16 42.6 95.8 830 50 15.0 22 多 比較例17 30.0 95.0 13 360 0.2 22 多 比較例18 30.0 90.0 15 360 0.2 50 多 (實施例2〜實施例6) 以與實施例1相同之方法,分別製作將Ga組成與平均 粒徑加以變化之靶,將進行濺鍍評價之結果統整示於表1。B 201109458 After the sputtering time of 20 hours, the total sputtering amount was 20 kWhr, and the number of particles generated at a thickness of 0.2/m or more of the film when the Cu-Ga film thickness was formed by a microscope for 30 minutes was counted by a microscope. Further, no abnormal discharge was observed at the time of film formation. The above results are shown in Table 1. Table 1 Example Ga concentration (at%) Relative density (%) Average particle diameter (rotation) Oxygen content (ppm) X-ray intensity ratio (%) Number of particles (number) Abnormal discharge Example 1 30.0 99.9 5 350 0.2 0 None Example 2 30.0 99.8 12 360 0.3 0 No Example 3 35.0 98.8 19 390 0.5 2 No Example 4 35.0 98.6 20 390 0.8 1 No Example 5 42.6 97.8 25 400 1.0 5 No Example 6 42.6 97.5 26 400 1.2 8 None Comparative Example 1 30.0 97.2 24 420 0.9 11 Less Comparative Example 2 30.0 97.0 25 420 1.0 12 Less Comparative Example 3 30.0 98.0 20 450 0.8 13 Less Comparative Example 4 30.0 98.6 15 450 0.4 16 Comparative Example 5 30.0 97.5 25 450 1.0 17 Comparative Example 6 30.0 97.8 24 470 0.9 18 Comparative Example 7 30.0 98.5 18 470 0.5 17 Comparative Example 8 30.0 98.1 14 480 0.4 19 Multi-Car Example 9 30.0 97.8 25 600 1.0 20 Comparative Example 10 30.0 97.6 28 1300 1.5 25 Comparative Example 11 30.0 98.6 50 350 4.6 15 Less Comparative Example 12 30.0 98.6 28 350 7.0 19 Less Comparative Example 13 30.0 98.2 97 350 11.0 21 Multiple Comparative Example 14 30.0 99.9 1100 40 18.8 28 Multiple Comparative Example 15 35.0 98.0 960 50 17.5 24 more comparative examples 16 42.6 95.8 830 50 15.0 22 Comparative Example 17 30.0 95.0 13 360 0.2 22 Comparative Example 18 30.0 90.0 15 360 0.2 50 (Example 2 to Example 6) In the same manner as in Example 1, the composition of Ga was separately prepared. The results of the sputtering evaluations of the targets which were changed with the average particle diameter are shown in Table 1.

16 201109458 如表1所示’實施例2 42at%之範圍、平均粒徑為 400ppm之範圍。 、實施例6之Ga濃度為3〇 12〜26/z m、氧含量為36〇 又,平均結晶粒徑可藉由調整燒結溫度、壓力、冷卻 速又而I田地調整。又’氧含量可藉由原料之熔解環境氣 汛之調整而控制。燒結體之結晶粒徑只要是微細的,則密 度有較高之傾向。 女表1所示,實施例2〜實施例6的相對密度為99 8 97 5 之範圍、X射線強度比為0.3〜1.2%之範圍、粒子 數為0〜8個之範圍,無異常放電…表!中,益里常放 電的情況記載為「無」,卜1〇次的情況記载為「少:,超 過10次的情況記載為「多 由此表1可明瞭’賤鍍Ga組成與平均粒徑為特定範圍 内之乾/亦不會發生異常放電,亦幾乎沒有對膜之粒子產 生,為良好之結果。該等之主要原因,雖然受到氧濃度大 中田〜響,但亦雙到燒結體之平均結晶粒徑及密度之影響。 此傾向從與以下所示之比較例之對比可明瞭。 (比較例1〜比較例2) ”雖以以與實把{列1 A致相同之條件製作&,但將原料 之熔解環境氣氛’改成氧多於實施例之條件。因此燒結體 之氧s比本發明之條件更多。又,藉由使熱壓時之溫度 低於實施例之溫度’來製作密度稍低於實施例之靶。靶的 諸特性與濺鍍之結果係如表丨所述。 較例1及比較例2之粒子的量與實施例相比皆稍微16 201109458 As shown in Table 1, the range of 42 at% in Example 2 and the average particle diameter were in the range of 400 ppm. The Ga concentration in Example 6 was 3 〇 12 to 26 / z m, and the oxygen content was 36 Å. Further, the average crystal grain size was adjusted by adjusting the sintering temperature, pressure, and cooling rate. Further, the oxygen content can be controlled by the adjustment of the melting environment of the raw material. When the crystal grain size of the sintered body is fine, the density tends to be high. In Tables 1 to 2, the relative densities of Examples 2 to 6 are in the range of 99 8 97 5 , the X-ray intensity ratio is in the range of 0.3 to 1.2%, and the number of particles is in the range of 0 to 8 without abnormal discharge. table! In the case of the case where the Iri is often discharged, it is described as "None", and the case of the case of the first time is described as "Less: If the number is more than 10 times, it is described as "More than this Table 1 is clear". The diameter is dry within a certain range, and no abnormal discharge occurs, and there is almost no generation of particles on the film, which is a good result. Although the main reason for this is that the oxygen concentration is large in the middle field, it is also double to the sintered body. The influence of the average crystal grain size and density. This tendency is clear from the comparison with the comparative examples shown below. (Comparative Example 1 to Comparative Example 2) "Established under the same conditions as the actual column {A1" & However, changing the melting atmosphere of the raw material to oxygen is more than the conditions of the examples. Therefore, the oxygen s of the sintered body is more than the conditions of the present invention. Further, the density was slightly lower than that of the example by making the temperature at the time of hot pressing lower than the temperature of the example. The characteristics of the target and the results of the sputtering are as described in the table. The amounts of the particles of Comparative Example 1 and Comparative Example 2 were slightly smaller than those of the examples.

S· 17 201109458 增加了,而雖然些微但於成膜中仍產生了異常放電。 由此結果可了解到氧含量若增加至超出本發明之範 圍,則粒子、放電狀態會惡化。 (比較例3〜比較例5 ) 雖然以與比較例1〜2大致相同之條件來製作靶,但與 比較例1〜2相比,進而使氧量增加成45〇ppm。又,比較例 3為熱壓溫度700°C、熱壓後之冷卻速度2<t /min,比較例4 為熱壓溫度65(TC、熱壓後之冷卻速度4t:/min,進而比較 例5為熱壓溫度750。(:、熱壓後之冷卻速度rc/min,以製 作平均粒徑稍大及X射線強度比大、確認到些微異相之鞑。 靶的諸特性與濺鍍之結果係如表丨所示。比較例3異 常放電雖少,但粒子量稍多。 、 …比較例4與比較例5粒子量進而變多,異常放電亦多。 §忍為此是氧量增加帶來的影響。 (比較例6〜比較例8) 雖然以與比較例3〜5大致相同之條件來製作乾,但歲 二較例二5相比,係進一步增加了氣量。比較例6與比較 歹1 7的乳!為47〇ppm、比較例8的氧量為彻ppm。 把的諸特性與⑽結果係如表i所示。比較心〜比較 例8粒子的量皆增加,異常放電 帶來的影響。 <為疋軋量增加所 (比較例9〜比較例10) 以與比較例 比氧ϊ進而增加 3〜5大致相同的條件 。比較例9的氧量為 ’與比較例3〜5相 600ppm、比較例1〇 18 201109458 的氧量為1 300ppm。 靶的諸特性與濺鍍結果如表丨所示。比較例9〜比較例 10粒子的量皆進而增加,異常放電亦多。認為此是氧量增 加所帶來之影響。 (比較例11〜比較例1 3) 與比較例3〜5相比,氧量減低,但平均結晶粒徑大、 進而X射線強度比高達4.6〜110。比較例u與比較例12 異常放電少,但比較例丨丨〜比較例丨3皆為粒子數多達ι 5 〜21個。由以上可確認到平均結晶粒徑之粗大化及X射線 強度比的增加亦會對異常放電的增加造成影響。 (比較例14〜比較例16) 以炫解法製作Cu_Ga乾。秤量Cu與⑸原料以使^ 組成為既定之濃度並置於碳製賴,於氩環境氣氛供給有 氧之加熱爐内’比較例14 α 1〇〇〇t、比較例12及比較例 13以高於分別之材料的炼點約·。c使之料後,以約$ ^111之冷卻速度冷卻再取出,評價此取出物之特性後’ 進灯加工做成濺鍍靶再進行成膜評價。 旦將結果示於表卜由此結果可知,雖然可大幅減低氧 ^但平均結晶粒徑高達11〇〇〜83〇㈣。又X射線強度 :广員著增加。又’比較例16相對密度亦低於本發明之條 件0 其結果’粒子數變客 S pu. 数燹多異吊放電亦變多。因此,若 均粒徑變大,X射線強度比 ^ 跫大則粒子、放電狀態會進 思化。 201109458 (比較例17〜比較例18) 雖為與比較例3〜5大致相同之條件,但只有相斜密度 低於本發明,未滿足本發明之條件。比較例17見到空孔產 生多。又,比較例18見到縮孔。該等皆對密度降低造成影 響。 ’ 其結果,比較例1 7〜比較例1 8粒子的量皆進而增加, 異常放電亦變多。由以上可了解到相對密度的降低會對粒 子的量與異常放電造成不良影響。 上述實施例中,以Ga濃度在30.〇〜42.6at%之範圍實 施,確認到相對密度、平均結晶粒徑、氧含量的影響在S· 17 201109458 was added, and although it was slightly, abnormal discharge occurred in the film formation. From this result, it is understood that if the oxygen content is increased beyond the range of the present invention, the particle and discharge state are deteriorated. (Comparative Example 3 to Comparative Example 5) Although the target was produced under substantially the same conditions as in Comparative Examples 1 and 2, the amount of oxygen was further increased to 45 〇 ppm as compared with Comparative Examples 1 to 2. Further, Comparative Example 3 is a hot pressing temperature of 700 ° C, a cooling rate 2 after hot pressing, < t /min, and Comparative Example 4 is a hot pressing temperature of 65 (TC, cooling rate after hot pressing 4 t: /min, and further Comparative Example) 5 is a hot pressing temperature of 750. (:, cooling rate rc/min after hot pressing, to make the average particle size slightly larger and the X-ray intensity ratio is large, and the micro phase is confirmed. The characteristics of the target and the result of sputtering In Comparative Example 3, although the abnormal discharge was small, the amount of particles was slightly larger. In Comparative Example 4 and Comparative Example 5, the amount of particles was further increased, and the abnormal discharge was also increased. (Comparative Example 6 to Comparative Example 8) Although the dryness was produced under substantially the same conditions as in Comparative Examples 3 to 5, the second year was further increased in gas volume compared with the second comparative example 5. Comparative Example 6 and comparison The amount of oxygen of 歹1 7 is 47〇ppm, and the amount of oxygen of Comparative Example 8 is ppm. The characteristics of (10) are shown in Table i. The amount of particles in Comparative Heart to Comparative Example 8 increases, and the abnormal discharge zone The influence of the above was increased by the increase of the amount of rolling (Comparative Example 9 to Comparative Example 10) in comparison with the comparative example, which was further increased by 3 to 5 The oxygen content of Comparative Example 9 was '600 ppm with respect to Comparative Examples 3 to 5, and the oxygen amount of Comparative Example 1〇18 201109458 was 1 300 ppm. The characteristics of the target and the sputtering results are shown in Table 比较. Comparative Example 9 The amount of the particles in the comparative example 10 was further increased, and the abnormal discharge was also large. This is considered to be an effect of an increase in the amount of oxygen. (Comparative Example 11 to Comparative Example 1 3) The amount of oxygen was reduced as compared with Comparative Examples 3 to 5. However, the average crystal grain size is large, and the X-ray intensity ratio is as high as 4.6 to 110. Comparative Example u and Comparative Example 12 have less abnormal discharge, but Comparative Example 比较~Comparative Example 皆3 are all particles up to ι 5 to 21 From the above, it was confirmed that the increase in the average crystal grain size and the increase in the X-ray intensity ratio also affected the increase in the abnormal discharge. (Comparative Example 14 to Comparative Example 16) Cu_Ga dry was produced by the dazzle method. Cu was weighed and (5) The raw materials were placed at a predetermined concentration and placed in a carbon-based atmosphere, and supplied to an aerobic furnace in an argon atmosphere. Comparative Example 14 α 1〇〇〇t, Comparative Example 12, and Comparative Example 13 were higher than the respective materials. The refining point is about .c. After the material is made, it is cooled and cooled at a cooling rate of about $^111. After evaluating the characteristics of the taken product, the film was subjected to a sputtering target to perform a film formation evaluation. The results are shown in the table. As a result, it can be seen that although the oxygen content can be greatly reduced, the average crystal grain size is as high as 11 〇. 〇~83〇(4). The X-ray intensity is increased by the staff. The relative density of the comparative example 16 is also lower than the condition of the present invention. The result is 'the number of particles is changed. The number of particles is increased. Therefore, when the average particle diameter is large, the X-ray intensity ratio is larger than that of the particles, and the discharge state is improved. 201109458 (Comparative Example 17 to Comparative Example 18) The conditions are substantially the same as those of Comparative Examples 3 to 5, However, only the phase shift density is lower than the present invention, and the conditions of the present invention are not satisfied. Comparative Example 17 saw that more holes were produced. Further, in Comparative Example 18, shrinkage cavities were observed. These all have an impact on density reduction. As a result, the amounts of the particles of Comparative Example 17 to Comparative Example 1 were further increased, and the abnormal discharge was also increased. From the above, it can be understood that the decrease in relative density adversely affects the amount of particles and abnormal discharge. In the above examples, the Ga concentration was in the range of 30. 〇 to 42.6 at%, and the effects of relative density, average crystal grain size, and oxygen content were confirmed.

Ga濃度為20〜60at%、剩餘部份為Cu及無法避免的雜質之 Cu-Ga合金粉末之燒結體中,亦展現同樣的傾向。 因此,本發明全部可適用於^濃度為2〇〜6〇at%、剩 餘部份為Cu及無法避免的雜質之Cu_Ga合金粉末之燒处體 賤鍍起’對此只要是本發明所屬技術領域中具有通常知識 者皆易於理解。 (座系上之可利用性) 依照本發明,可接供—接广 、 杈供種Cu-Ga燒結體濺鍍靶中, 組成偏析且長時間的減蘇抬 又後亦無異㊉放電,於濺鍍所得 膜幾乎不會產生叙; 生粒子之Cii-〇a燒結體靶及其之製造 故使用此靶可製作p^ 念 (之Cu_Ga膜,尤其有用於作為利 硒化法之CIGS系去阻;, 系太%電池的製造用材料。 【圖式簡單說明】 無 20 201109458 【主要元件符號說明 益The same tendency is exhibited in the sintered body of the Cu-Ga alloy powder having a Ga concentration of 20 to 60 at% and a balance of Cu and unavoidable impurities. Therefore, the present invention is all applicable to a sintered body of a Cu_Ga alloy powder having a concentration of 2 〇 to 6 〇 at% and a residual portion of Cu and an unavoidable impurity, as long as it is a technical field to which the present invention pertains. Those with ordinary knowledge are easy to understand. (Availability of the pedestal) According to the present invention, it is possible to supply a Cu-Ga sintered body sputtering target in a wide-area, bismuth-supplied seed, and to form a segregation and a long time of reducing the Su and then discharging. The film obtained by sputtering is hardly produced; the Cii-〇a sintered body target of the raw particles and the manufacture thereof, so that the Cu_Ga film can be produced by using the target, especially for the CIGS system used as the selenization method. Destruction;, is the material for the manufacture of too much battery. [Simple description of the diagram] No 20 201109458 [Main component symbol description benefits

Claims (1)

201109458 七、申請專利範圍: 1. 一種Cu-Ga合金燒結體濺鍍靶,其特徵在於. 其係由Ga濃度為2〇〜6〇at%、剩餘部份為a 避免的雜質之Cu_Ga合金粉末之燒結體所構成,該燒結^ 之相對密度為97%以上,平均結晶粒徑為5〜3() “爪,好人 1為4〇〇ppm以下。 氣芑 2. 如申。月專利範圍第i項之Cu_Ga合金燒結體職錢乾, 其中,Cu-Ga合金係由單一組成所構成。 ,3直如申請專利範圍第1或2項之以也合金燒結體賤錢 乾’其中’ Cu-Ga合金4 X射線繞射之主峰以外的峰強产 相對於主峰強度為5%以下。 又 4. 如申睛專利範圍第1至3項中任一項之Cu-Ga合金燒 、’、α體濺鍍靶,其中,Cu-Ga合金組成實質上為γ相或者主要 相為7*相。 5. —種Cu-Ga合金燒結體濺鍍靶之製造方法,其係將 Cii及Ga原料加以熔解、冷卻後,再以熱壓法將經粉碎之 /tD S原料粉製作成Cu-Ga合金濺鍍靶之方法,其特徵在於: 將熱壓時之保持溫度定為較混合原料粉熔點低50〜 200 C ’將保持時間定為1〜3小時,冷卻速度定為5t /min 以上’對混合原料粉之加壓壓力定為3〇〜4〇MPa來進行熱 壓。 6. —種Cu-Ga合金燒結體濺鍍靶之製造方法,其係將 Cu及Ga原料加以熔解、冷卻後,再以熱壓法將經粉碎之 混合原料粉製作成申請專利範圍第1至4項中任一項之 22 201109458 Cu-Ga合金燒結體濺鍍靶之方法,其特徵在於: 將熱壓時之保持溫度定為較混合原料粉熔點低別〜 200 C,將保持時間定為1〜3 j、拉,'人,、土 Λ 了门疋馮丄 小時冷部速度定為5。(:/min 以上’對混合原料粉之加壓壓力定為3〇〜4〇Mpa來進行熱 壓。 ’’、、 7. 如申請專利範圍第5或6項之Cu_G#金燒結體濺鑛 粗之製造方法’其㈣氣體霧化法或水霧化法來進行^及 Ga原料的熔解、冷卻後之粉碎。 8. -種光吸收層,其係由申請專利範圍第項中任 一項之C u - G a合金燒結體機鍍乾所製得。 9. 一種CIGS系太陽電池,盆伤你田士占 其係使用有申請專利範圍第 8項之光吸收層。 八、圖式: (無)201109458 VII. Patent application scope: 1. A Cu-Ga alloy sintered body sputtering target, characterized in that it is a Cu_Ga alloy powder with a Ga concentration of 2〇~6〇at% and the remainder being a avoided impurity. The sintered body is composed of a sintered body having a relative density of 97% or more, an average crystal grain size of 5 to 3 () "claw, and a good person 1 of 4 〇〇 ppm or less. Gas 芑 2. Such as Shen. The Cu-Ga alloy sintered body of the i-item is composed of a single composition. The Cu-Ga alloy is composed of a single composition. 3 is as in the first or second patent application scope, and the alloy sintered body is also dry. The intensity of the peak other than the main peak of the X-ray diffraction of the Ga alloy is 5% or less with respect to the intensity of the main peak. Further, the Cu-Ga alloy is fired, ', α as in any one of the items 1 to 3 of the patent application. a body sputtering target, wherein the Cu-Ga alloy composition is substantially a γ phase or a main phase is a 7* phase. 5. A method for manufacturing a Cu-Ga alloy sintered body sputtering target, which is to use a Cii and Ga raw material. After melting and cooling, the pulverized /tD S raw material powder is formed into a Cu-Ga alloy sputtering target by a hot pressing method. Depending on: The temperature at which the hot pressing is maintained is set to be 50 to 200 C lower than the melting point of the mixed raw material powder. The holding time is set to 1 to 3 hours, and the cooling rate is set to 5 t / min or more. Hot pressing is performed for 3 〇 to 4 〇 MPa. 6. A method for producing a Cu-Ga alloy sintered body sputtering target, which is obtained by melting and cooling Cu and Ga raw materials, and then pulverizing by hot pressing. The mixed raw material powder is produced as a method of the 201109458 Cu-Ga alloy sintered body sputtering target according to any one of claims 1 to 4, characterized in that: the holding temperature during hot pressing is determined as a mixed raw material powder. The melting point is low ~ 200 C, the holding time is set to 1~3 j, pull, 'people, and soil. The threshold of Feng Wei's cold part is set to 5. (: / min or more 'addition of mixed raw material powder The pressing pressure is set to 3〇~4〇Mpa for hot pressing. '',, 7. For the manufacturing method of Cu_G# gold sintered body splashing coarse according to the 5th or 6th patent of the patent application' (4) gas atomization method or The water atomization method is used to carry out the melting of the Ga raw material and the pulverization after cooling. 8. A light absorbing layer, It is prepared by plating a Cu-G a alloy sintered body machine according to any one of the scopes of the patent application. 9. A CIGS-based solar cell, a basin injury, you have a patent application scope 8 Light absorbing layer. 8. Pattern: (none)
TW099124242A 2009-07-23 2010-07-23 Cu-Ga alloy sintered body sputtering target, a method for manufacturing the target, a light absorbing layer made of a Cu-Ga alloy sintered body target, and a CIGS solar cell using the light absorbing layer TWI458847B (en)

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