201040553 /> 發明說明 【發明所屬之技術領域】 g立本發明尤指其提供一種可於低溫環境中對電子元件進行模擬 %，之測試，並達到有效降低材料成本及有效提升作業便利性之 測試分類機之冷測室冷源供應裝置。 【先前技術】 f現今，由於部份類型之電子元件，於實際使用上係處於較 氐/m環i兄中，故為準確測試電子元件，而必須將電子元件置於較 低溫的模擬環境中執行測試作業，以測試淘汰出不良品。、 Ο Ο 請參閱第1圖所示’其係為執行低溫測試之！c測試 Ϊ ^含有供料裝置1 1、移载裝置12、冷測室13、收料裝 4以及於冷測室1 3内之測試裝置15，該供料裝置1 1係 少—盛裝待測1 c之料盤’以供移載裝置1 2之取放器將 f測If取出’該移載裝置]L 2係將待測！ C移載至冷測室i 3 针之 裝置1 5處’剌試1置1 5即可對制1 C執行測 二二hict於低溫之模擬環境下進行測試’冷測室13係 於=?至機台外侧之氮氣供應器17，俾以將氮氣注入 隹’使冷測室13形成—低溫乾冷的空間，以供ic 於完成測試後，移載裝置12之取放器再將 靜…目丨τ ί收贿置1 4處’該收料裝置1 4係設有至少一 W廳應器1 7 3 1 · 利贱氣供應器17供餘氣，方可保持在 tm:、，—旦當氮氣供應器17之氣氣耗盡，即必 ^ 7，方^试，以等待操作人員更換新的氮氣供應器 費作業S3行低溫測試作業’造成冷測效能不佳及耗 摔應1f17之使用時間有限’—般於使用數小時後， 更雜氮氣供應器1 7，由於氣氣係持續 供應、，、°冷啦1 3，以致使_树的耗損相當大，進而導 201040553 致大幅耗費材料成本。 3 由，氮氣巧應器17之使用時間有限，而必須不斷更換新的 氮氣供應H 1 7，但該減供應||丨7係為—體積龐大 瓶’以致更換作業上相當不便，造成使用便繼不佳之缺失。 因此，如何提供一種可有效提升作業便利性及大幅降低 之冷源供應裝置，即為業者努力改善之方向。 【發明内容】 本發明之主要目的係提供—酬試分賴之冷啦冷源 裝置’、其係於機台之測試裝置外部固設一外罩，使外罩内开 Ο Ο 封閉式㈣之冷啦，—冷源供應裝置係具有冷空氣產生器，立 ，以抽取外界〜空氣的方式加以降溫，再以輸人管路連通於冷& t、’以^冷測至保持在低溫狀態’進而可直接利用自然界之空氣， 環境中對電子元件進行模擬環境之測試，達到 有效降低材料成本及提升作業便利性之效益。 運 本發明之另-目⑽提供—_齡麵之 裝置’其中，齡空氣產生器係利用壓縮機將冷媒物質 態’再將液，冷雜_壓轉換成缝，以吸收外It之=液 界空氣降至低溫狀態’ *於外界空氣 写、、 室之冷空氣可大幅降低水蒸氣含量，進而冷測室 冷凝的現象，*呈現低溫乾冷的環境。 避免產生水滴 本= 月之又一目的係提供一種測試分類機之 裝置’其中，該冷測室另設有一連通於冷 供應 並於該輸出管路上裝設-贼H，使得Μ 官路’ 交換時’可將熱空氣轉冷啦，^内氣於冷熱 滴冷凝的現象，而呈現低溫乾冷的環境。〜貝’至内遇冷產生水 【實施方式】 實施G配委ϋίί明作更進—步之瞭解’兹舉一較佳 請參閱第2、3、4圖所示，本發明係於機台上設有一測試 4 201040553 =將0係設有可作Η方向位移之吸嘴 件完成測試後，將完測td2進行測試作業’或於電子元 裝置2 0-侧之入料機構式座2 2，一設於測試 於測試裝置2 〇另側之屮钮毺%」1之側方设 料載台4 2，以八·機構4〇 ’則設有出料吸嘴4 1及出 ΐ測之電子元件移載出測試裝置2〇，由 右-冰富j本5狀標的’故在此0贅述。本發明主要係設 ❸ Ο 出料載台4 2 ϋΐίί5 Q之兩側板底部具有供人料載台3 2及 P ^ 道5 1，通道5 1上方並設有可啟閉之封 試裝置2 0二，内=’:外罩5 0裝設於測 生上 61連通至外罩50内之冷測室 冷測室之輸出管路6 2上則裝設有一抽風 之空氣循環流動。 w靴〜則至内 η 4圖所示，本發明冷源供應裝置之冷空氣產生器 冷媒物質壓縮成液態，再將液態冷爾釋 Jftin吸收外界之熱量’因此得以抽取外界空氣的方 ’且於外界空氣與冷空氣產生器6 ◦内之冷媒物質 ’可使空氣中之水蒸氣遇冷產生冷凝作用，以預先 ί低輸入冷啦之輕氣財航含量，接著私輸人管路6t 利之冷ΐ室保持在低溫乾冷的環境，進而可直接 瓜環产之n轉換成冷空氣，使冷啦可保持於低 行模擬環境之測試’達到有效降低空氣致 效提升作業便雛。此外，連接冷齡之輸峰路6 2，其亦 於冷測室内之冷空氣作冷熱交換時，將触氣抽離冷測室， 可再次避免於冷啦内遇冷產生水滴冷凝的現象，且可送回冷空 5 Ο201040553 /> Description of the Invention [Technical Fields According to the Invention] The present invention particularly provides a method for simulating the simulation of electronic components in a low-temperature environment, and achieving an effective reduction in material cost and an improvement in work convenience. Test the classification machine cold source cold supply device. [Prior Art] f Nowadays, since some types of electronic components are actually used in the 氐/m ring brother, in order to accurately test electronic components, the electronic components must be placed in a lower temperature simulation environment. Perform a test job to test out the defective products. Ο Ο Please refer to Figure 1 for the performance of the low temperature test! c test Ϊ ^ contains the feeding device 1 1 , the transfer device 12 , the cold measuring chamber 13 , the receiving device 4 and the testing device 15 in the cold measuring chamber 13 , the feeding device 1 1 is less - ready to be tested 1 c tray 'for the pick-up device 1 2 pick and place device f test If to 'the transfer device' L 2 system will be tested! C Transfer to the cold chamber i 3 needle device 1 5 '剌 test 1 set 1 5 can be used to test 1 C test two two hict in the low temperature simulation environment 'cold test room 13 is in =? To the nitrogen supply 17 on the outside of the machine, the nitrogen gas is injected into the crucible to make the cold chamber 13 form a low-temperature dry-cooling space for the ic after the test is completed, and the pick-and-place device of the transfer device 12 is again...丨τ ί bribery set 1 4 'The receiving device 1 4 is equipped with at least one W hall 1 7 3 1 · Li 贱 gas supply 17 for residual gas, can be kept at tm:,, - When the gas supply of the nitrogen gas supply 17 is exhausted, it must be tested, waiting for the operator to replace the new nitrogen supply device. The operation of the S3 line is low temperature test operation, resulting in poor cold test performance and loss of 1f17. The use time is limited'--usually after several hours of use, the more nitrogen gas supply unit 17 is continuously supplied, and the gas is continuously supplied, so that the consumption of the tree is quite large, and the 201040553 is greatly consumed. Material costs. 3, the use of nitrogen catalyst 17 is limited, and the new nitrogen supply H 1 7 must be constantly replaced. However, the supply of ||丨7 is a large volume bottle, which is quite inconvenient for replacement work, resulting in the use of Following the lack of good. Therefore, how to provide a cold source supply device that can effectively improve the workability and greatly reduce the number of operators is an improvement in the direction of the industry. SUMMARY OF THE INVENTION The main object of the present invention is to provide a cold-cooling source device for the test, which is attached to the outside of the test device of the machine, so that the cover is closed and the closed (4) is cold. - The cold source supply device has a cold air generator, which is cooled by means of extracting the outside air to the air, and then connected to the cold & t, 'cooling to keep the low temperature state' It can directly use the air of nature, and test the simulation environment of electronic components in the environment, which can effectively reduce the cost of materials and improve the convenience of operation. Another object of the present invention is to provide a device for aging age, wherein the air generator uses a compressor to convert the refrigerant to a liquid state, and then converts the liquid into a slit to absorb the external It solution. The boundary air is reduced to a low temperature state. * The cold air in the room is written in the outside air, and the cold air in the room can greatly reduce the water vapor content, and thus the condensation in the cold measuring chamber, * exhibits a low-temperature dry and cold environment. Avoiding the generation of water droplets. Another purpose of the month is to provide a device for testing a sorting machine. [The cold measuring chamber is additionally provided with a cold supply and is installed on the output line - a thief H, so that the official road When exchanged, the hot air can be turned cold, and the internal gas is condensed by hot and cold drops, and the environment is low-temperature dry and cold. ~贝's inside to produce cold water [Embodiment] Implementation of the G-dispatchment ϋ ί ί 更 更 — — ' ' ' 兹 兹 兹 兹 兹 兹 兹 兹 兹 兹 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳 较佳There is a test 4 201040553 = After the 0 series is equipped with a nozzle that can be used for the directional displacement, after the test is completed, the test operation will be completed td2 or the feeding mechanism seat of the electronic component 20 - side 2 2 One is set on the side of the test device 2 〇 the other side of the button 」%"1, and the material loading table 4 2 is provided, and the eight-body mechanism 4 〇' is provided with the discharge nozzle 4 1 and the detection The electronic component is transferred out of the test device 2〇, and is represented by the right-ice-rich j-shaped label. The invention is mainly provided with a ❸ Ο discharge loading platform 4 2 ϋΐ ίί5 Q at the bottom of the two sides of the board having a feeding platform 3 2 and a P ^ 5 151, above the channel 5 1 and provided with a closable sealing device 20 Second, the inner = ': the outer cover 50 is installed on the measuring unit 61 and is connected to the cold measuring chamber of the cold measuring chamber in the outer casing 50. The output line 6 2 is provided with a circulating air circulation flow. W boots ~ then to the inside η 4 figure, the cold air generator of the cold source supply device of the present invention compresses the refrigerant material into a liquid state, and then the liquid cold release Jftin absorbs the external heat 'so the side of the outside air is extracted' The refrigerant substance in the outside air and the cold air generator 6 can make the water vapor in the air cool and produce condensation, so as to input the cold gas and light gas content in advance, and then privately enter the human pipeline 6t. The cold heading room is kept in a low-temperature dry-cooling environment, and then the direct melon ring can be converted into cold air, so that the cold can be kept in the low-line simulation environment's test to achieve effective reduction of air efficiency and upgrade work. In addition, when connecting the cold age of the peak road 62, which is also used for cold and heat exchange in the cold air in the cold test room, the gas is pumped away from the cold test chamber, which can again avoid the condensation of water droplets in the cold. And can be sent back to the cold 5 Ο
201040553 氣產生器6 0再次循環利用，進而更加確保冷測室保持於低溫乾 冷的環境，以對電子元件進行模擬環境之測試。 ^而據此，本發明冷測室之冷源供應裝置冷測裝置不僅可提供低 溫環:竟對電子元件進行類環境之綱，且可纽降低材料成本 及有效提升作業便利性，實為一深具實用性及進步性之設計，然 未見有相同之產品及刊物公開，從而允符發明專利申 依法提出申請。 月謂茭 【圖式簡單說明】 第1圖·習式IC測試分類機之示意圖。 第2圖：本發明冷測室之分解示意圖。 第3圖：本發明冷測室之外觀示意圖。 第發明冷測室與冷源供應裝置之架構示意圖。 【主要7C件符號說明】 習式部份： 11:供料裝置 14:收料裝置 17:氮氣供應器 本發明部份： 2 0 :測試裝置 3◦:入料機構 4 0 :出料機構 5 0 :外罩 6 〇 :冷空氣產生器 6 3 :抽風器 12:移載裝置 15:測試裝置 2 1 :吸嘴 31:入料吸嘴 41:出料吸嘴 5 1 :通道 61:輸入管路 13:冷測室 1 6 :管路 2 2 :測試座 3 2 '·入料載台 4 2 :出料載台 5 2 .封板 6 2 .輪出管路 6The 201040553 gas generator 60 is recycled again, which further ensures that the cold chamber is kept in a low-temperature dry environment for testing the electronic components in a simulated environment. According to the present invention, the cold source device of the cold measuring chamber of the present invention can provide not only a low temperature ring but also an environment-like environment for electronic components, and can reduce the material cost and effectively improve the work convenience. The design of the practical and progressive design, but did not see the same products and publications open, so that the invention patent application is filed according to law. Month 茭 [Simple description of the diagram] Figure 1 · Schematic diagram of the IC test classifier. Figure 2: Schematic diagram of the decomposition of the cold chamber of the present invention. Figure 3: Schematic diagram of the appearance of the cold chamber of the present invention. Schematic diagram of the structure of the cold test room and the cold source supply device of the first invention. [Main 7C Symbol Description] Convention Part: 11: Feeding Device 14: Receiving Device 17: Nitrogen Supply Part of the Invention: 2 0: Test Device 3: Feeding Mechanism 4 0: Discharging Mechanism 5 0: outer cover 6 〇: cold air generator 6 3 : air extractor 12: transfer device 15: test device 2 1 : suction nozzle 31: feed nozzle 41: discharge nozzle 5 1 : channel 61: input line 13: Cold test chamber 1 6 : Pipe 2 2 : Test stand 3 2 '· Feeding station 4 2 : Discharge station 5 2 . Sealing plate 6 2 .