TW201015048A - Three-dimensional shape measuring method - Google Patents

Three-dimensional shape measuring method Download PDF

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Publication number
TW201015048A
TW201015048A TW098127590A TW98127590A TW201015048A TW 201015048 A TW201015048 A TW 201015048A TW 098127590 A TW098127590 A TW 098127590A TW 98127590 A TW98127590 A TW 98127590A TW 201015048 A TW201015048 A TW 201015048A
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Taiwan
Prior art keywords
axis
design
measurement
lens
shape
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TW098127590A
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Chinese (zh)
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TWI417516B (en
Inventor
Keishi Kubo
Kouji Handa
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Panasonic Corp
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518Projection by scanning of the object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/201Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring roundness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • G01B5/213Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures for measuring radius of curvature

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

A lens 11 is set to a first setting status where the lens 1 is declined about a Y-axis of a measuring apparatus 1 (S3-1). The lens 11 is rotated about a Z-axis of a design coordinate system at 90 degrees so as to be changed from the first setting status to a second setting status (S3-8). For each of the first and second setting statuses, first pieces of measurement data are obtained by measuring X-, Y-, and Z-axis coordinates of surface points of the lens 11 on one straight line elongated along the X-axis and passing an design apex coordinate of the lens 11, and second pieces of measurement data are obtained by measuring X-, Y-, and Z-axis coordinates of surface points of the lens 11 on the other straight line elongated along the Y-axis and passing the design apex coordinate of the lens 11 (S3-4, S3-11). For each of the first and second setting statuses, differences of the first and second pieces of data with respect to a designed configuration are calculated. The calculated differences are composed (S3-15).

Description

201015048 六、發明說明: 【發明所屬技^衍領域】 發明領域 本發明係關於一種3次元形狀測定方法,該3次元形狀 測定方法係適於使用於附相機之行動電話之透鏡、使用於 BD(藍光碟片)等光碟記憶裝置之拾取透鏡等 '透鏡面對於 光軸之傾斜構成為高傾斜之透鏡的3次元形狀評估。 發明背景 以在作為測疋3平估透鏡形狀的方法,有利用藉由微空 氣滑件所構成的探針來測定高傾斜面的方法(參考例如專 利文獻1)。第26圖係表示專利文獻i所記載以往的3次元形 狀測定方法。 第26圖中,探針單元100具備於下端具有針筆1〇1之探 針102。探針1〇2上端側之微空氣滑件1〇3係由空氣轴承非接 觸地支持。半導體雷射1〇4之雷射光!^被導引至設置於針筆 7上端之鏡105。作用於針筆101與測定物1〇6之間之原子力 係由誤差彳§號發生部108,轉換為探針單元1〇〇之上下方向 的力,其中該誤差信號發生部1〇8係產生因應於由鏡1〇5所 反射並通過針孔107之雷射光价之光量強弱之誤差信號。根 據來自誤差信號發生部108之輸出,藉由伺服電路1〇9及線 性馬達no回授控制探針單元100全體的位置。藉由被鏡1〇5 所反射之來自He-Ne雷射(未圖示)的雷射光Fz,測定探針 102之Z座標。藉由該方法可高精度地測定高傾斜面,但即 201015048 便現今已加以改良’測定75。的傾斜面仍為其極限。 然而’在使用於附相機之行動電話之透鏡、使用於 BD(藍光碟片)等光碟記憶裝置之拾取透鏡等用途中為了 解像度提升、聚光光束直徑之小徑化,而日漸需要傾斜面 之傾斜角度超過80。的透鏡,要求評估更高傾斜面。 因此’已提出-種方法,其係使透鏡往3方向傾斜,於 各個設置方向進行败’並將在該3方向之測定資料中測定 區域重叠的兩處資料合成為在虹面内—致,並評估該合成 之資料與& δ丨形狀的差(參考例如專利文獻2及非專利文獻 1)。 第27圖係表不專利文獻2所記載以往的透鏡測定評估 方法。首先,使透鏡往3方向傾斜,並在各個設置方向進行 測定。接著,調整旋轉位置、左右位置,將所獲得之3方向 的測定資料200a、200b、200c合成為測定區域重疊的部分 在xz平面内一致。然後,評估合成後之資料2〇〇d與設計形 狀的差。 又,以往作為測定評估透鏡特性的方法,有使透鏡往3 方向傾斜’並在各個設置方向進行測定,將該3方向中之一 方向作定義為參考資料’並對於該參考資料,將其他2方向 之測定資料中測定區域重疊的資料合成為在XZ面内一 致,並評估該合成之資料與設計形狀的差(參考例如專利文 獻3)。 第28圖係表示專利文獻3所記載以往的透鏡測定評估 方法。首先,水平地設置透鏡(模具),測定中央部301a。然 201015048 • 後’使透鏡傾斜(令設計光軸302繞著Y轴傾斜),測定透鏡 面對於測定機之傾斜 變小的部分301b。進一步以設計光轴 302為中心,將透鏡旋轉180度,測定傾斜透鏡而測定之相 同轴上的相反側部分301a。然後,以中央部301a為基準, 刀別令部分3〇ib,301c之測定資料旋轉及平行移動,以使 得測定資料在部分301b、301c與中央部分301a之測定區域 之重叠部分會一致。總言之,以中央部301a為基準,合成 _ 從3方向測定的資料。然後,以合成後的資料評估形狀。 〔專利文獻1〕曰本特開平6-265340號公報 〔專利文獻2〕日本特開2005-201656號公報 〔專利文獻3〕國際公開第06/082368號手冊 〔非專利文獻1〕三浦勝弘,「雷射探針方式之透鏡形 狀計測系統」,O plus E,新技術通訊股份有限公司,平成 16年9月(2004),第46卷,第3號,pl〇70-l〇74 C 明内容;1 ^ 發明揭示 發明欲解決之課題 然而,以往之方法中,若透鏡繞著與使透鏡傾斜之轴 (Y軸)不同的軸(X軸)偏離設置之情況下,會構成形狀誤 差。總言之,獲得X剖面之測定形狀時,若未進行γ剖面的 測定,當透鏡繞著X轴之旋轉方向有設置偏離時,計測值中 會包含誤差。以下針對此點具體說明。 思考測定如第29圖所示’有效直徑l6mm(半徑R = 〇.8mm)、R= 0.8mm之最外周部分之剖面方向的透鏡面傾斜 5 201015048 ’距離透鏡頂點之深度即凹陷量為0.5mm之非球面 、、月’兄。第29圖中,將繞著X、γ、z軸之旋轉分別設 為A、軸。 ° 實線401a表示未有來自繞著X軸之旋轉(A)的偏差之情 兄下之透鏡剖面。另—方面,虛線4〇lb表示對於測定機之 >、、先,往繞者X轴之旋轉(A轴)傾斜1。設置之情況下之 透鏡4面。從透鏡之頂點部分開始測定時,當透鏡對測定 機之座榡系統,在A轴傾斜丨。時(虛線4〇lb),於 的位置,針筆所掃描的透鏡面上之Y軸方向之位置Y,係由凹 量 h Ηί . /201015048 VI. OBJECTS OF THE INVENTION: FIELD OF THE INVENTION The present invention relates to a three-dimensional shape measuring method suitable for use in a camera-attached mobile phone lens for use in BD ( Blu-ray discs, etc., such as pick-up lenses of optical disc memory devices, etc. The tilt of the lens surface with respect to the optical axis constitutes a three-dimensional shape evaluation of a highly tilted lens. Background of the Invention A method of measuring the shape of a lens as a test piece 3 has a method of measuring a high inclined surface by using a probe constituted by a micro air slider (refer to, for example, Patent Document 1). Fig. 26 is a view showing a conventional three-dimensional shape measuring method described in Patent Document i. In Fig. 26, the probe unit 100 is provided with a probe 102 having a stylus pen 1〇1 at the lower end. The micro air slider 1〇3 on the upper end side of the probe 1〇2 is supported by the air bearing in a non-contact manner. The laser light of the semiconductor laser 1〇4 is guided to the mirror 105 provided at the upper end of the stylus pen 7. The atomic force acting between the stylus pen 101 and the measuring object 1〇6 is converted into a force in the upper and lower directions of the probe unit 1〇〇 by the error 彳§ generating unit 108, wherein the error signal generating unit 1〇8 is generated. The error signal is determined by the amount of light of the laser light reflected by the mirror 1〇5 and passing through the pinhole 107. Based on the output from the error signal generating unit 108, the position of the entire probe unit 100 is controlled by the servo circuit 1〇9 and the linear motor no. The Z coordinate of the probe 102 is measured by the laser light Fz from the He-Ne laser (not shown) reflected by the mirror 1〇5. By this method, a high-inclined surface can be measured with high precision, but 201015048 has been improved today. The slope is still at its limit. However, in the applications such as a lens for a mobile phone with a camera and a pickup lens for an optical disk memory device such as a BD (Blu-ray Disc), it is necessary to understand the increase in the image size and the diameter of the condensed beam diameter, and the inclined surface is increasingly required. The angle of inclination is over 80. The lens is required to evaluate a higher slope. Therefore, a method has been proposed in which the lens is tilted in the three directions and defeated in each of the set directions, and the two regions in which the measurement regions are overlapped in the measurement data in the three directions are synthesized into the rainbow surface. The difference between the data of the synthesis and the shape of the < δ ( is evaluated (see, for example, Patent Document 2 and Non-Patent Document 1). Fig. 27 is a conventional lens measurement evaluation method described in Patent Document 2. First, the lens is tilted in the three directions and measured in each of the installation directions. Next, the rotational position and the left and right positions are adjusted, and the obtained three-direction measurement data 200a, 200b, and 200c are combined into a portion where the measurement regions overlap, and coincide in the xz plane. Then, the difference between the synthesized data 2〇〇d and the design shape is evaluated. Further, conventionally, as a method of measuring the characteristics of the lens, the lens is tilted in the three directions and measured in each of the installation directions, and one of the three directions is defined as a reference material, and for the reference material, the other 2 The data of the measurement area overlap in the measurement data of the direction is synthesized to be uniform in the XZ plane, and the difference between the data of the synthesis and the design shape is evaluated (refer to, for example, Patent Document 3). Fig. 28 is a view showing a conventional lens measurement evaluation method described in Patent Document 3. First, a lens (mold) is horizontally placed, and the central portion 301a is measured. However, in 20101048, the lens is tilted (the design optical axis 302 is tilted about the Y-axis), and the portion 301b where the lens surface is inclined to the measuring machine is measured. Further, the lens is rotated by 180 degrees around the design optical axis 302, and the opposite side portion 301a on the coaxial side measured by measuring the tilt lens is measured. Then, based on the central portion 301a, the measurement data of the cutter portion 3〇ib, 301c is rotated and moved in parallel so that the measurement data overlaps the overlapping portions of the measurement regions of the portions 301b and 301c and the central portion 301a. In summary, the data measured from the three directions is synthesized based on the central portion 301a. Then, the shape is evaluated with the synthesized data. [Patent Document 1] Japanese Patent Laid-Open Publication No. Hei. No. 2005-201656 (Patent Document 3) International Publication No. 06/082368 (Non-Patent Document 1) Miura Seihiro, " Lens shape measuring system for laser probe method", O plus E, New Technology Communication Co., Ltd., Heisei September, 2004 (2004), Vol. 46, No. 3, pl〇70-l〇74 C 1 ^ The invention discloses a problem to be solved by the invention. However, in the conventional method, if the lens is disposed to be offset from an axis (X axis) different from the axis (Y axis) at which the lens is tilted, a shape error is formed. In summary, when the measurement shape of the X section is obtained, if the measurement of the γ profile is not performed, when the lens is displaced about the direction of rotation of the X axis, the measurement value includes an error. The following is specific for this point. Consider measuring the lens surface tilt of the cross-sectional direction of the outermost peripheral portion of the effective diameter of 16 mm (radius R = 〇.8 mm) and R = 0.8 mm as shown in Fig. 29. 201015048 'The depth from the apex of the lens, that is, the amount of the recess is 0.5 mm. The aspherical, the moon' brother. In Fig. 29, the rotation around the X, γ, and z axes is set to A and axis, respectively. ° The solid line 401a indicates the lens profile under the circumstance that there is no deviation from the rotation (A) around the X axis. On the other hand, the broken line 4 〇 lb indicates that the rotation of the X axis (the A axis) is 1 for the measuring machine. In the case of setting, the lens 4 faces. When measuring from the apex portion of the lens, when the lens is facing the measuring system of the measuring machine, it is tilted on the A axis. At the position (dotted line 4〇lb), at the position of the Y-axis direction of the lens surface scanned by the stylus pen, is the concave amount h Ηί .

Sln(l°)而如以下式(丨)所示,成為從測定機之γ轴偏離 8·73μηι的位置。 〔數1〕 Υ,==;Η*8Ϊη(10)=8.73(μπι) ⑴ 而且,在Υ,位置之X成為以下式(2)所示的值。 〔數2〕 x = R*cos(asin(YVR)) = 0.7999524(mm) (2) 因此,起因於透鏡對測定機之座標系統在A軸傾斜1。 之Z方向之誤差,成為以下式(3)所示的值。 〔數3〕 (0.8-0.7999524)*ίαη75° = 0.178(μιη) (3) 若不修正起因於該計測誤差之透鏡的形狀誤差,BD用 等之透鏡無法較小地聚縮光束,附相機之行動電話用透鏡 發生成像模糊等問題。 而且,以往的方法係以中央部之測定資料為基準,合 201015048 成為左右部分之測定資料重疊,因此以測定資料將資料接 連起來時,對於mm等級之形狀變化,必須以μιηα下等級 之特徵性形狀來將資料合起來,因此合成並非易事。而且, 以往方法係於有關探針前端之半徑(探針R)之修正計算產 生誤差。進一步而言,以往方法係為了獲得1剖面之測定資 料,必須使透鏡往3方向傾斜來測定,因此測定耗費時間。 本發明係可解決前述以往之課題,其目的在於提供一 種忐夠以高精度測定透鏡等測定對象物之高傾斜部分之3 次元形狀測定方法。 用以欲解決課題之手段 本發明提供一種3次元形狀測定方法,係將測定物設定 為繞著Υ軸傾斜設置之第丨設置狀態,使前述測定物以前述 測疋物之设s十座標系統之ζ軸為中心,以9〇度之2以下的自 然數倍之角度增量旋轉1次以上,而從前述第〖設置狀態設 疋為1個以上之第2設置狀態,針對前述各個第丨及第2設置 狀態’於通過前述測定物之設計上的頂點座標之χ軸方向之 直線上,測定前述測定物表面之X軸、γ軸及Z轴之座標, 取得第1測定資料群,並且於通過前述測定物之設置上的頂 點座標之Y轴方向之直線上,測定前述測定物表面之χ轴、 Y軸及Z軸之座標,取得第2測定資料群,針對前述各個第i 及第2設置狀態,使用前述第1及第2測定資料群算出與前述 設計形狀的差,合成在前述第1及第2設置狀態下與前述設 計形狀的差。 本發明之3次元形狀測定方法中,不僅使用χ軸方向之 201015048 直線上之前述測定物表面之X轴、Y軸及2轴之座標,即第1 測定資料群,還使用Υ軸方向之直線上之前述測定物表面之 X軸、Υ軸及Ζ軸之座標’即第2測定資料群,來算出與設計 形狀的差。因此,即便測定物之設置位置繞著X轴產生偏 離’仍可正確算出測定資料群之X軸、γ軸及ζ軸座標,並 且可以高精度測定包含高傾斜面之測定物之剖面形狀與設 計形狀的差。又,由於係就第丨設置狀態,及從該第丨設置 狀態使測定物繞著設計座標系統之z軸旋轉之第2設置狀 態,測定測定物之表面,因此可針對包含高傾斜面之測定 物之1個剖面全體,獲得與設計形狀的差。 例如前述角度增量為18〇度,前述第2設置狀態為丨個。 此情況下,可針對測定物之設計座標系統之χ軸上之剖面, 以高精度測定與設計形狀的差。 而且,前述角度增量為90度,前述第2設置狀態亦可有 3個。此情況下,可針對測定物之設計座標系統之χ軸及γ 軸之剖面,以南精度測定與設計形狀的差。 具體而言,使用前述第〖及第2測定資料群算出與前述 設計形狀的差係執行預備座標轉換,使前述第丨及第頂定 資料群因應前述繞著Y轴之傾斜而旋轉及並進移動,予以座 標轉換為未有前述繞著Y轴之傾斜時的前述測定物之前述 設計座標祕’並執行校準,將已進行前述職座標轉換 之前述第1及第2測定資料群予以座標轉換,以使其擬合於 前述敎物之設計形狀,算出已進行前述校準之⑸測定資 料群與前述測定物之前述設計形狀的差。 201015048 或者’使用前述第1及第2測定資料群算出與前述設計 形狀的差係執行預備座標轉換使前述第丨及第2測定資料 群因應則述繞著γ轴之傾斜而旋轉及並進移動 ,予以座標轉 換為未有則述繞著Υ|^之傾斜時之前述測定物的前述設計 座標系統’針對X軸、γ轴、Ζ軸、Α軸及丑軸,算出使已進 行月il述預備座標轉換之前述第丨及第2測定資料群 ,擬合於Sln (l°) is a position deviating from the γ-axis of the measuring machine by 8.73 μm as shown by the following formula (丨). [Number 1] Υ, ==; Η *8 Ϊ η (10) = 8.73 (μπι) (1) Further, at Υ, the position X becomes a value represented by the following formula (2). [Number 2] x = R*cos(asin(YVR)) = 0.7999524(mm) (2) Therefore, the coordinate system of the lens pair measuring machine is tilted by 1 on the A axis. The error in the Z direction is a value represented by the following formula (3). [Number 3] (0.8-0.7999524)*ίαη75° = 0.178(μιη) (3) If the shape error of the lens due to the measurement error is not corrected, the lens for BD or the like cannot be smallly condensed, and the camera is attached. The mobile phone uses a lens to cause image blurring and the like. In addition, the conventional method is based on the measurement data of the central part, and the measurement data of the left and right parts are overlapped in 201015048. Therefore, when the data is connected by measurement data, the shape change of the mm level must be characterized by the level of μιηα. Shapes combine materials, so synthesis is not easy. Moreover, the conventional method is based on the correction calculation of the radius of the probe tip (probe R) to generate an error. Further, in the conventional method, in order to obtain measurement data of one profile, it is necessary to measure the lens in three directions, and therefore measurement takes time. The present invention has been made in view of the above-described conventional problems, and an object of the invention is to provide a three-dimensional shape measuring method capable of measuring a high-inclined portion of a measurement object such as a lens with high precision. Means for Solving the Problem The present invention provides a three-dimensional shape measuring method in which a measuring object is set to a second state in which a measuring object is disposed obliquely about a Υ axis, and the measuring object is set as a s ten coordinate system of the measuring object. The ζ axis is centered, and is rotated by one or more times in a natural multiple of 9 degrees or less, and the second setting state is set to one or more from the above-described setting state, and In the second installation state, the coordinates of the X-axis, the γ-axis, and the Z-axis of the surface of the measurement object are measured on a straight line passing through the y-axis direction of the apex coordinate of the design of the measurement object, and the first measurement data group is obtained, and The coordinates of the x-axis, the Y-axis, and the Z-axis of the surface of the measurement object are measured on a straight line in the Y-axis direction of the vertex coordinates of the measurement object, and the second measurement data group is obtained for each of the first and second In the installation state, the difference between the design and the shape is calculated using the first and second measurement data groups, and the difference between the first and second installation states and the design shape is combined. In the third-order shape measuring method of the present invention, not only the coordinates of the X-axis, the Y-axis, and the two axes of the surface of the measuring object on the 201015048 straight line in the x-axis direction, that is, the first measurement data group but also the straight line in the x-axis direction are used. The coordinates of the X-axis, the Υ-axis, and the Ζ axis of the surface of the measurement object, that is, the second measurement data group, were used to calculate the difference from the design shape. Therefore, even if the position at which the measurement object is placed deviates around the X axis, the X-axis, γ-axis, and ζ-axis coordinates of the measurement data group can be accurately calculated, and the cross-sectional shape and design of the measurement object including the high slant surface can be measured with high precision. The difference in shape. Further, since the second set state of the measurement object is rotated around the z-axis of the design coordinate system from the second installation state, the surface of the measurement object is measured, so that the measurement including the high inclination surface can be performed. The entire section of the object is obtained from the difference in design shape. For example, the aforementioned angle increment is 18 degrees, and the second setting state is one. In this case, the difference in the shape of the design can be measured with high precision with respect to the profile on the x-axis of the coordinate system designed for the measurement object. Further, the angle increment may be 90 degrees, and the second setting state may be three. In this case, the difference between the design axis and the y-axis of the coordinate system of the measurement object can be measured with the accuracy of the south and the design shape. Specifically, the difference between the second measurement data group and the design shape is used to perform preliminary coordinate conversion, and the third and third data sets are rotated in accordance with the tilt around the Y axis and moved in parallel. And converting the coordinates to the design coordinates of the measurement object when the inclination around the Y axis is not performed, and performing calibration, and converting the first and second measurement data groups that have been subjected to the coordinate conversion described above, The difference between the design data set of the (5) measurement data group and the measurement object described above is calculated by fitting the design shape of the object to the above-mentioned object. 201015048 or 'Using the first and second measurement data sets to calculate the difference from the design shape to perform the preliminary coordinate conversion, and the second and second measurement data groups are rotated and moved in parallel about the γ axis. When the coordinate is converted to the above-mentioned design coordinate system of the above-mentioned measurement object when the inclination of the Υ|^ is tilted, the X-axis, the γ-axis, the Ζ-axis, the Α-axis, and the ugly axis are calculated to prepare for the month. The aforementioned third and second measurement data sets of the coordinate conversion are fitted to

月〕述測疋物之„又3十形狀之第i校準量,從前述X轴、y轴、z 轴軸及B軸之第1权準量中,選擇任2個或3個作為固定 校準量’執行第1座標轉換,以前述固定校準量 ,將已進行 前述預備練轉換之前述第1測定資料群予以座標轉換,針 對前述X轴' Y轴、Z轴、A軸及叫中之前述固定校準量以 外的轴’算出第2校準量’使已進行前述第!座標轉換之前 述第1測定資 料群擬合於前述測定物之設計形狀,執行第2 校準’以《岐鱗量„述幻料量料進行前述 預備座標轉換之前述第1測定資料群予以座標轉換,算出已Month] The ith calibrated amount of the 3 又 又 , , , , , , , , , , , 述 , 述 述 , 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述 述'Performing the first coordinate conversion, coordinate-converting the first measurement data group that has been subjected to the preliminary training conversion by the fixed calibration amount, and fixing the aforementioned X-axis 'Y-axis, Z-axis, A-axis, and the above-mentioned The axis 'calculated second calibration amount' other than the calibration amount is such that the first measurement data group subjected to the first coordinate conversion is fitted to the design shape of the measurement object, and the second calibration is performed. The first measurement data group of the above-mentioned preliminary coordinate conversion is subjected to coordinate conversion, and the calculated amount is calculated.

進行前述第2校準之第1測定資料群與前述測定物之前述設 計形狀的差。 此情況下,即便在測定資料群之點數對於設計資料之 中心呈不均勻分布之情況下、測定物之非球面量少之情況 或中等程度之情況,依然能如高精度測定包含高傾斜面 之測定物之剖面形狀。 用以進行前述預備座標轉換之設計形狀亦可為已因應 實際測定物之形狀而轉換設計參數者。此情況下,能夠以 更高精度進行座標轉換或接續於其之處理,實現高傾 9 201015048 斜面之高精度測定。 在前述第1及第2設置狀態下與前述設計形狀之差的合 成,亦可包含採手動調整在前述第1及第2設置狀態下與前 述設計形狀之差的重疊。而且,在前述第1及第2設置狀態 下與前述設計形狀之差的合成亦可包含:針對在前述第1及 第2設置狀態下與前述設計形狀的差,分別藉由最小平方法 求出近似直線,將在前述第1及第2設置狀態下與前述設計 形狀的差予以座標轉換,以使得前述第1及第2設置狀態之 前述近似直線重疊。藉由該等處理,能夠以更高精度測定 包含高傾斜面之測定物之剖面形狀與設計形狀的差。 若使用面上測定資料取代前述第2測定資料群,可測定 測定物之3次元形狀。 發明效果 如上所述,本發明之3次元形狀測定方法中,係就傾斜 設置測定物之第1設置狀態,及從該第1設置狀態使測定物 繞著設計座標系統之Z軸旋轉後之第2設置狀態,不僅使用 X軸方向之直線上之測定物表面之χ軸、γ軸及z軸之座標, 即第1測定資料群,還使用Y軸方向之直線上之測定物表面 之X轴、Y軸及Z軸之座標,即第2測定資料群來算出與設計 形狀的差。因此,即便測定物之設置位置繞著χ軸產生偏 離,仍可正確算出測定資料群之χ軸、γ轴及z轴座標,能 夠以尚精度測定包含高傾斜面之測定物之某剖面全體的形 狀與設計形狀的差。 【實施方式】 10 201015048 用以實施發明之最佳形態 ' 接著,參考附圖詳細說明本發明之實施型態。於附圖 中,必須就座標軸,區別測定機本身所設定之對3次元空間 固定之正交座標軸與透鏡之設計座標軸時,於前著附i 「(UA3P)」’於後者附上「(Lens)」。 (實施型態1) 第1圖係表示可執行本發明之3次元形狀測定方法之3 魯:欠元形狀測定機(以τ僅稱為駭機)丨。測定⑽具備上部石 製固定座5,其係隔著馬達驅動之X轴台3及丫轴台*而栽置 於下部石製固定仏上。探針單Μ⑻(與參考第湖所說明 者相同)可往Ζ軸方向移動地搭載於於上部石製固定座$。來 自He-Ne雷射6之雷射光係藉由光學系統7分岔為χγζ轴方 肖之雷射光Fx、Fy、Fz。雷射光㈣射於固定在下部石製 固=座2之X轴鏡8而測定χ座標。同樣地,雷射光Fy照射於 固定在下部石製固定座2之丫轴鏡9而測定γ座標。z輛雷射 〇 光以分岔為2道,從固定在下部石製固定座2之上部的z輛鏡 及針筆101上端之鏡1〇5(參考第26圖)之反射光,測定測定 上之Z座標。 一併參考第2圖,作為測定物之透鏡11(不限定於透 鏡,亦可為例如透鏡成形用之模具)之設置用的治具12,係 隔著A軸測角台13、齒條齒輪式之χγ台14及B轴測角二 以均為手動式)而配置於下部石製固定座2上。以b耗夠: 台Μ ’將透鏡11繞著γ軸旋轉並傾斜設置,能夠以a耗測 。13調整繞著X軸之旋轉方向。而且,可藉由χγ^織調 11 201015048 =之χγ轴方向之位置。治具12具備固定於峰測角台 之錐形間隔件16,及配置於該錐形間隔件π上之上部核 rH:11可料切鉤18可拆裝地找於上雜17。錐 ==件16之上面係對於水平具_度傾斜。上部板π係 對於雖形間隔件16之上面受3點支持。對於錐形間隔件16之 上部板而由U定位銷19而將C軸對於錐形上面之角度位 置予以疋位’藉由使其從定位鎖19脫離並機械性地旋轉,The difference between the first measurement data group of the second calibration and the design shape of the measurement object is performed. In this case, even when the number of points of the measurement data group is unevenly distributed to the center of the design data, or when the aspheric amount of the measurement object is small or moderate, the high-incidence surface can be measured as high-precision. The cross-sectional shape of the measured object. The design shape for performing the aforementioned preliminary coordinate conversion may also be one in which the design parameters have been converted in accordance with the shape of the actual measurement object. In this case, coordinate conversion or subsequent processing can be performed with higher precision, and high-precision measurement of the high tilt 9 201015048 bevel can be realized. The combination of the difference between the first and second installation states and the design shape may include manual adjustment of the difference between the first and second installation states and the difference between the design shapes described above. Further, the combination of the difference between the first and second installation states and the design shape may include: determining the difference between the first and second installation states and the design shape by the least squares method; The approximate straight line is coordinate-converted between the first and second installation states and the design shape so that the approximate straight lines of the first and second installation states overlap each other. By these processes, the difference between the cross-sectional shape and the design shape of the measurement object including the high inclined surface can be measured with higher precision. When the surface measurement data is used instead of the second measurement data group, the three-dimensional shape of the measurement object can be measured. Advantageous Effects of Invention As described above, in the third-order shape measuring method of the present invention, the first installation state of the measurement object is obliquely set, and the measurement object is rotated about the Z-axis of the design coordinate system from the first installation state. 2 The setting state is not only the coordinates of the x-axis, the γ-axis, and the z-axis of the surface of the measuring object on the straight line in the X-axis direction, that is, the first measurement data group, and the X-axis of the surface of the measuring object on the straight line in the Y-axis direction. The coordinates of the Y-axis and the Z-axis, that is, the second measurement data group, are used to calculate the difference from the design shape. Therefore, even if the position at which the measurement object is placed deviates around the χ axis, the χ axis, the γ axis, and the z axis coordinate of the measurement data group can be accurately calculated, and the entire measurement of the measurement object including the high slant surface can be measured with high accuracy. The difference between shape and design shape. [Embodiment] 10 201015048 BEST MODE FOR CARRYING OUT THE INVENTION Next, an embodiment of the present invention will be described in detail with reference to the accompanying drawings. In the drawing, the coordinate axis must be distinguished from the coordinate axis set by the measuring machine itself for the orthogonal coordinate axis of the 3-dimensional space and the design of the coordinate axis of the lens. Attached to the front is attached "i(UA3P)"' )". (Embodiment 1) Fig. 1 shows a three-dimensional shape measuring method in which the present invention can be carried out: an under-element shape measuring machine (only τ is called a 骇 machine). The measurement (10) is provided with an upper stone mount 5 which is placed on the lower stone fixing cymbal via the X-axis table 3 and the cymbal stand* driven by the motor. The probe unit (8) (the same as the one described in the reference to the lake) can be mounted on the upper stone holder $ in the direction of the x-axis. The laser light from He-Ne Laser 6 is divided into optical 系统 ζ axis by the optical system 7 and the laser light Fx, Fy, Fz. The laser light (4) is measured by the X-axis mirror 8 fixed to the lower stone solid=seat 2 to measure the χ coordinate. Similarly, the laser light Fy is irradiated onto the x-axis mirror 9 fixed to the lower stone mount 2 to measure the gamma coordinates. z lasers are divided into two lanes, and the reflected light from the z-mirror fixed at the upper part of the lower stone mount 2 and the mirror 1〇5 (refer to Fig. 26) at the upper end of the stylus pen 101 are measured and measured. Z coordinate on the top. Referring to Fig. 2 together, the jig 12 for the measurement of the lens 11 (not limited to the lens, for example, a mold for lens forming) is provided by the A-axis horn table 13 and the rack gear. The χ 台 stage 14 and the B-axis angle measurement 2 are both manually mounted on the lower stone mount 2 . It is consumed by b: Μ ' The lens 11 is rotated around the γ axis and tilted, and can be consumed by a. 13 Adjust the direction of rotation around the X axis. Moreover, the position of the γ-axis direction can be adjusted by χγ^ 11 201015048. The jig 12 has a tapered spacer 16 fixed to the peak horn table, and a nucleus rH: 11 disposed on the tapered spacer π. The severable hook 18 is detachably attached to the upper ridge 17. The cone == the top of the piece 16 is inclined to the horizontal _ degree. The upper plate π is supported by three points on the upper surface of the spacer 16 . For the upper plate of the tapered spacer 16, the C-axis is clamped to the angular position above the cone by the U-positioning pin 19' by being disengaged from the positioning lock 19 and mechanically rotated,

構成為可讓上部板17對於錐形間隔件16每次機械性地旋_ 度而構成。It is configured such that the upper plate 17 can be mechanically rotated by the mechanical degree of the tapered spacer 16 each time.

由電腦及其周邊機器所構成的控制·運算裝置川系根 據預先記憶的程式’控侧定機1全體之動作而執行測定, 並且執行對於測定資料之各種運算。具體而言,控制·裝 置21係為了使得從作為測定物之透鏡11表面,對於探針103 下端之針筆101所作用的力成為一定,一面施以將探針單元 100全體往z方向進行回授控制之伺服,一面藉由χ軸台3、 Υ軸台4,往X或γ軸方向依次掃描往ζ方向移動之探針單元 100,以特定之ΧΥ方向之取入間距,取得形狀資料之點群 並記憶。於控制·運算裝置21連接有例如顯示器及其周邊 機器之輸出裝置22、及包含鍵盤、滑鼠等輸入裝置23。藉 由輸出裝置22,輪入或顯示控制.裝置21之運算結果等, 並可藉由輸入裝置23,輸入對於控制.裝置21之指令。 以下參考第3圖之流程圖,說明本實施型態之3次元形 狀測定方法。首先,對於下部石製固定座2傾斜設置透鏡 U(步驟S3-l)。具體而f,如第6圖所示,以透鏡11之標記 12 201015048 lla來到測定機1之Y軸負侧之方式設置透鏡^。標記Ua可 利用成形時之塑膠注入部分或模具加工時之刻印等而設 置。又,使透鏡11以Y軸作為旋轉中心(往B軸方向)斜向傾 斜設置。該透鏡11繞著Y軸之傾斜可藉由B軸測角台15調 整。測定機1之可測定極限角度為60度,透鏡面之最大傾斜 角度為80度的情況下,若將透鏡11設成繞著γ軸之傾斜角度 為20度,則透鏡面之X軸方向之負側之又軸上的部分可將測The control/computing device composed of the computer and its peripheral devices performs measurement based on the operation of the entire program of the program side control unit 1 stored in advance, and performs various calculations for the measurement data. Specifically, the control device 21 is configured to return the entire probe unit 100 in the z direction so that the force acting on the stylus 101 at the lower end of the probe 103 is constant from the surface of the lens 11 as the measurement object. By controlling the servo, the probe unit 100 is sequentially scanned in the X or γ axis direction by the cymbal stage 3 and the cymbal stage 4, and the shape data is obtained by taking the pitch in a specific direction. Point group and remember. An output device 22 such as a display and its peripheral devices, and an input device 23 including a keyboard and a mouse are connected to the control/computing device 21. By the output device 22, the operation result of the control device 21 or the like is entered or displayed, and the command to the control device 21 can be input by the input device 23. The third-dimensional shape measuring method of this embodiment will be described below with reference to the flowchart of Fig. 3. First, the lens U is obliquely disposed to the lower stone mount 2 (step S3-1). Specifically, as shown in Fig. 6, the lens ^ is placed in such a manner that the mark 12 201015048 lla of the lens 11 comes to the negative side of the Y axis of the measuring machine 1. The mark Ua can be set by the plastic injection portion at the time of molding or the imprinting of the mold. Further, the lens 11 is obliquely inclined with the Y-axis as the center of rotation (in the direction of the B-axis). The tilt of the lens 11 about the Y-axis can be adjusted by the B-axis goniometer 15. When the measurable limit angle of the measuring machine 1 is 60 degrees and the maximum tilt angle of the lens surface is 80 degrees, if the lens 11 is set to have an inclination angle of 20 degrees around the γ axis, the X-axis direction of the lens surface is The part of the negative side of the shaft can be measured

定面之角度,抑制在測定機1之可測定極限角度,可實現3次 元測定。 接著,設定測定用NC路徑(步驟S3-2)。參考第6圖,測 定用NC路徑有X軸方向之測定路徑(實線u丨)及丫軸方向之 測定路徑(虛線L12)。X轴方向之測定路徑Lu設為χ袖方向 之直線狀’其係沿著通過在Β軸斜向地傾斜設置之狀態下之 透鏡11之頂點位置Pt(Z軸方向之位置最高的點)的轴之剖 面:/軸方向之測定路徑L22設為γ軸方向之直線狀其係 沿著通過在Β轴斜向地傾斜設置之狀態下之透鏡u之頂點 減Pt的轴之剖面。又’X軸及γ轴方向之測定路徑mm 設定如:為在測定繞著¥軸傾斜設置之透鏡面時,容納於測 定之最大傾斜角之範圍内。 接著’持續維持繞著γ軸朝斜向之狀態,進行使針筆ι〇ι 移動至透鏡u之難位置批定中心(步驟s3_3)。該定中心 係藉由XY台3、4往灯轴方向移動,以使針筆⑻來到透鏡 頂點位置Pt而進行。 “進行4k及測定資料之保存(步驟S3.4)。具體而 13 201015048 參 言,沿著前述測定路徑Ln、L12,使針筆1〇1在乂轴方向及 Y轴方向之軸上移動H以斜向地設置之狀態下之透鏡 u之頂點位置Pt作為収開始點,在χ軸之軸上施以讎, 以使在測定機!之最大傾斜角之範_,作用於針筆1〇1及 透鏡11的力為-定’並且掃描針筆u,依次測定當時針筆 01之位置(XYZ座標),記憶或保存作為X軸方向之測定資 料群。進—步以在斜向設置之狀態下之透鏡11的頂點位置 Pt作為測定開始點’並在丫軸方向之軸上施以伺服,以使在 測定機i之最大傾斜角之範_,作料針筆1G1及透鏡U 的力為-定’並且掃描針筆1(π,依次測定當時針筆101之 位置(ΧΥΖ座標),記憶或保存作SY轴方向之測定資料群。 然後’進行校準處理,其縣出Χ轴及γ財向之測定 Ο =1、氣独之設収的_抓5)。接下來,根據 1處理之結果來判斷是否需要傾角調整(步驟S3斗具體 而吕,校準處理的結果,當測定機1在繞著X袖之旋轉方向 (A轴)之設置偏離大時(例如i。以上),操作八軸測角台η,令 透鏡11繞著X轴旋轉僅相當於藉由校準處理所獲得°; X轴之(A轴)旋轉量(為了使測定資料群擬合於透鏡此外 :式所需要之繞著X軸之旋轉量),並且進行則調整^ 吏件透㈣之繞著X轴之設置角度不會往測定機丨 (步驟S3-7)。傾角調整後,再度從定中心重複至兩… 角調整的判斷(步驟似)。另—方面,校準處理的^制 在測定機遞著X軸之旋轉方向之透鏡u之設㈣= (例如1物下左右),則結束在步抓丨所設 14 201015048 透鏡11之X軸方向及Y軸方向的測定’並轉移到步驟S3_8。 於不需要該傾角調整的時點,得到以在步驟S3-1所設定的 姿勢下測定之透鏡η之最終的X軸及y軸方向之測定資料 群。最終獲得的X軸方向之測定資料群為透鏡11之父轴負方 向之高傾斜面之資料。 於步驟S3-8,變更透鏡11之傾斜以改變透鏡面上之測 定處。具體而言,以透鏡11在設計座標系統上之ζ轴為基 準’將透鏡11旋轉180度而重新設置’以使得透鏡u之標記 # lla來到Y轴上之負側。該透鏡11之旋轉可藉由從錐形間隔 件16暫且取下設置用治具12之上部板17,將方向變更18〇度 後’再度以定位銷19對錐形間隔件16定位並安裝而實現。 變更透鏡11之傾斜後,與傾斜變更前同樣地進行測定 用NC路徑之設定(步驟S3_9),重複定中心(步驟S3]〇)、χ 軸方向及γ轴方向之測定與測定資料之保存(步驟S3_n)、 及傾角調整(步驟S3_14),直到測定機〖在繞著χ軸之旋轉方 向之透鏡11之設置偏離變得相當小。變更透鏡"之傾斜後 ® 之測定用NC路徑係與傾斜變更前同樣,Χ軸方向之測定路 担為X軸方向之直線狀,其係沿著通過在Β軸斜向地傾斜設 置之狀態下之透鏡η之頂點位置Pt之軸的剖面,且γ軸方向 之測定路徑L22設為Υ軸方向之直線狀,其係沿著通過在Β 軸斜向地傾斜設置之狀態下之透鏡u之頂點位置pt之軸的 剖面。於測定機1在繞著X轴之旋轉方向之透鏡11的設置偏 離變得相當小,且在步驟S3_13不需要傾角調整的時點,得 到在步驟S3-8變更之姿勢下之透鏡n最終的χ軸及γ軸方 15 201015048 向之測疋—貝料群。最終獲得的χ轴方向之測定資料群為透鏡 11之X轴正方向之高傾斜面之資料。 接著’對於在2個姿勢下分別測定之X軸方向及γ軸方 向之測定資料群’執行座標轉換、校準處理及資料合成(步 驟S3-15)。以下參考第4圖,具體說明座標轉換、校準及資 料合成。 ' 首先,算出斜向地傾斜設置(步驟S3“、S3 8)之透鏡u 對於透鏡設計座標系統(水平地設置透鏡11的情況下)之偏 移量(步驟S4_l)。斜向地設置透鏡丨丨時之測定資料群處於帛 麵 7A圖之虛線所示的狀態。於是,算出透鏡設計座標系統上 在設計式上之斜向設置位置之偏移,亦即算出第7B圖所示 之透鏡之頂點偏移位置(Xt〇ff、Yt〇ff、Zt〇均。 接著,以步驟S4-1所算出之偏移量,將在2個斜向地傾 斜之設置(步驟S3-1、S3-8)下所測定之X軸及γ軸之測定資 料(步驟S-1〜S3-7及步驟S3-8〜S3-14),亦即將斜向設置位 置測定資料予以座標轉換(步驟S4_2)。具體而言,根據步驟 S4-1所算出之偏移量,首先將所有斜向設置位置測定資料 參 僅旋轉移動B,接下來使其僅並進移動在透鏡設計座標系統 之頂點位置、與斜向地設置透鏡時之頂點位置扒之差量, 如第7B圖以虛線所示者,予以座標轉換。 然後,如第9圖所示,僅以測定時使透鏡u繞著z軸旋 轉設置之份量,進行繞著Z軸之座標轉換,予以座標轉換為 設計位置(步驟S4-3)。 步驟S4-2、S4-3之座標轉換後之測定資料,包含起因 16 201015048 j '十1〇2下端之針筆101具有某有限半徑之偏移(探針R份 偏移)於疋,於步驟S4_4中對於步驟S4_2、之 ^票轉換後之測定資料,執行去除探針R份量之偏移之修正 采針R後,執行將與透鏡n之設計式形狀的差予以最小化, 、求出田時的差之對設計式的校準處理。以下參考第$圖, 說明關於步驟S4_4帽設計叙校準處理。 、百先,執行採手動之移動計算(步驟S5-1)。具體而言, ® 於輸出裝置22之顯不器以圖形顯示測定資料及設計式,藉 由輸入裝置23之操作,令測定資料平行移動或旋轉移動以 儘可能擬合於設計式。 於步驟S5-2後述之RMS值之算出為初次的情況下,亦 - #最初執行步驟S5-1〜S5-8之循環(lo〇p)時,由於後述之累 _ 餘準結果未算&,因此錢行㈣μ·3而執行步驟S5_4 之探針R修正。 參考第8圖來說明探針R修正(步驟S5_4)之程序。於第8 % 圖’在對於前端形狀為球形之針筆101對焦於透鏡u之態 下,於透鏡座標系統在X轴方向以特定之取樣間距掃描所獲 得之測疋 > 料群係以虛線L31表示。透鏡面之形狀(X、γ、 Z)以Z=f(X,Y)表示之情況下,於第8圖之探針位置之探針 中心座標Xm之透鏡面之法線方向的傾斜係以箭頭vu表 示。以在Xm之探針中心位置為起點,該箭頭Vu之相反方 向之向量V12與透鏡面之交點又‘,可藉由組合向量乂12與2 ==f(X,Y)而求出。然而,該X’點位於從針筆101與透鏡面真 正的接觸點偏離之位置。為了減少該計算誤差,算出與在 17 201015048 X‘之X位置之透鏡面之法線相反方向之向量V13,求出該向 量13與以在xm之探針中心位置為起點時之透鏡面之交點 X HX’可藉由組合向量V13與z=f(X Y)而求出)。接著,重 新將X”設為X,,再度求出X”。重複此計算,直到X,與x‘,2 點間之距離差從測定機i之分解能力來看相當小為土,算出 作為接近真正接觸點的值。 探針R修正後,擷取經探針R修正後之測定資料群中預 先設定的透鏡11之有效半徑ER區域内之資料(步驟S5-5)。 也就是說,於本實施型態,與設計式校準之對象區域(校準 有效直徑)係包含於透鏡u之有效半徑ER之所有測定資料。 接著,藉由最小平方法算出XYZAB轴之校準量(步驟 S5-6)。具體而言,執行使步驟S5_5所擷取的探針r修正完 畢之測定資料群之各點、與透鏡丨丨之設計形狀(透鏡u之設 。十式之對應點)的差之平方和為最小之最小平方法,算出所 擷取的探針R修正完畢之測定資料群與設計形狀之又轴、γ 軸及Ζ軸之並進方向的偏離,即校準量dX、dY、dZ,並算 出繞著X軸及Y軸之旋轉之偏離,即校準量dA、dB。該等算 出之校準量dX、dY、dz、dA、dB係記憶作為累積校準結果。 接者’藉由步驟S5_6所算出之校準量、dY、dZ、dA、 dB’將步驟S5-4所擷取的探針R修正完畢之測定資料群予以 座標轉換(S5-7)。 接著,算出並記憶步驟S5-7中藉由校準量予以座標轉 換後之測定資料群與設計形狀的差之平方和,即RMS值(步 驟S5-8)。 18 201015048 重複從才木手動之移動計算(步驟S5-l)至RMS值之算出 (步驟S5·8)之處理,朗前次的應值之算出結果與本次之 RMS值之算出結果之變動率小於特定範圍為止(步驟 S5-9)。第2:欠錢執行步抓卜况之循環時,於採手動 之移動計算(步驟S5_D後且於探針R修正(步驟㈣前,藉 由累積权準、’、。果(則次的循環執行時,於步驟^顿算出之 校準量dX dY dZ、dA)執行座標轉換(步驟S53)。 於步驟S5 6’以最小平方法算出之校準量 dA dB並非嚴密解而為近似解,但藉由重複步驟8 的處理可實現更正確之校準處理。 Μ在步驟S5 9 ’ RMS值之算出結果之變動率小於特定 I巳圍時’對Sxst式之校準處理結束。此時,於先前的步驟 S5-7中’处準量狀^省崎以座標轉換後之 探針R修正&畢之測定資料群成為最終已對設計式校準後 之測定資料(校準資料)。 對设计式之校準(第4圖之步驟S4_3、第5圖)結束後,如 第9圖所不,僅以測定時使透鏡繞著z軸旋轉而設置之份 里,對於校準資料進行繞著z軸之座標轉換,並將校準資料 予以座標轉換為在透鏡座標系統上所測定到的位置。 針對2方向全都(透鏡丨丨之所有傾斜配置)計算步驟以^ 〜討-4的處理後(步驟S4_5),針對2方向全都求出透鏡 設計形狀與測定到之透鏡U之形狀的差,合成並記憶所求 出的資料,並因應需要而輸出至輸出裝置22(步驟S4_6)。 於第10圖表示實施型態1之計算結果的圖。該圖之橫輛 19 201015048 為x轴,單位為111111 ’縱軸係與設計形狀之z方向的差Zd(= (測定資料)-(設計值))’單位為mm。如該第1〇圖所示,藉由 . 本實施型態之3次元形狀測定方法,可實現具有8〇度傾斜面 之透鏡面之形狀評估。 實施型態1中,在測定時將透鏡旋轉180度,從2方向測 定’並測定X軸上的資料,但可使透鏡^每次旋轉9〇度,並The angle of the set surface suppresses the limit angle that can be measured at the measuring machine 1, and the three-dimensional measurement can be realized. Next, the measurement NC path is set (step S3-2). Referring to Fig. 6, the measurement path for the NC path is measured in the X-axis direction (solid line u丨) and the measurement path in the x-axis direction (dashed line L12). The measurement path Lu in the X-axis direction is a linear shape in the direction of the cuffs. The apex position Pt of the lens 11 (the point at which the position in the Z-axis direction is the highest) is in a state of being obliquely inclined in the x-axis. The cross section of the axis: the measurement path L22 in the /axis direction is a linear shape in the γ-axis direction, and is a section along the axis which is reduced by Pt by the apex of the lens u in a state where the yaw axis is obliquely inclined. Further, the measurement path mm in the X-axis and γ-axis directions is set so as to be accommodated within the range of the maximum inclination angle to be measured when measuring the lens surface which is inclined around the ¥ axis. Then, the state in which the stylus pen ι〇 is moved to the difficult position of the lens u is performed while maintaining the state of the y-axis toward the y-axis (step s3_3). The centering is performed by moving the XY stages 3, 4 in the direction of the lamp axis so that the stylus pen (8) comes to the lens vertex position Pt. "4k and measurement data storage (step S3.4). Specifically, 13 201015048. In the above-mentioned measurement paths Ln, L12, the stylus pen 1〇1 is moved in the x-axis direction and the Y-axis direction. The vertex position Pt of the lens u in the state of being disposed obliquely is used as the starting point, and 雠 is applied to the axis of the χ axis so that the maximum tilt angle of the measuring machine is applied to the stylus pen 〇 1 and the force of the lens 11 is "fixed" and the stylus pen u is scanned, and the position of the stylus pen 01 (XYZ coordinate) is sequentially measured, and the measurement data group as the X-axis direction is memorized or saved. The step is set in the oblique direction. The vertex position Pt of the lens 11 in the state is used as the measurement start point 'and the servo is applied to the axis of the x-axis direction so that the maximum inclination angle of the measuring machine i is _, and the force of the writing needle 1G1 and the lens U is - Set ' and scan the stylus 1 (π, sequentially measure the position of the stylus 101 at that time (ΧΥΖ coordinates), memorize or save the measurement data group for the SY-axis direction. Then 'calibrate the process, the county exits the axis and γ Measure Ο =1, _ _ _ _ 5). Next, according to the knot of 1 processing It is judged whether or not the tilt adjustment is required (step S3 is specific and the result of the calibration processing is performed. When the setting of the measuring machine 1 in the rotation direction (the A-axis) around the X-sleeve is large (for example, i. or more), the eight-axis operation is performed. The angle measuring table η, the rotation of the lens 11 around the X axis is only equivalent to the value obtained by the calibration process; the X axis (A axis) rotation amount (in order to fit the measurement data group to the lens: The rotation amount of the X-axis is adjusted, and the adjustment is made. (4) The setting angle around the X-axis is not measured (step S3-7). After the inclination adjustment, repeat from the centering to two... Judgment of the angle adjustment (steps). On the other hand, the calibration process is set in the direction of the lens u in the direction of rotation of the X-axis of the measuring machine (4) = (for example, under the object), then the end of the step is 14: 201015048 The measurement of the X-axis direction and the Y-axis direction of the lens 11 is performed, and the process proceeds to step S3_8. When the inclination adjustment is not required, the final lens η measured in the posture set in step S3-1 is obtained. Measurement data group in the X-axis and y-axis directions. The final measurement data group in the X-axis direction The data of the high inclined surface in the negative direction of the parent axis of the lens 11. In step S3-8, the tilt of the lens 11 is changed to change the measurement surface on the lens surface. Specifically, the axis of the lens 11 on the design coordinate system The reference 're-set the lens 11 by 180 degrees' is such that the mark #11a of the lens u comes to the negative side on the Y-axis. The rotation of the lens 11 can be temporarily removed from the tapered spacer 16 The upper portion 17 of the 12-piece upper plate 17 is changed by 18 degrees, and then the positioning pin 19 is positioned and attached to the tapered spacer 16 again. After the inclination of the lens 11 is changed, the NC path for measurement is performed in the same manner as before the tilt change. The setting (step S3_9) repeats the centering (step S3) 〇), the measurement of the y-axis direction and the γ-axis direction, the storage of the measurement data (step S3_n), and the tilt adjustment (step S3_14) until the measuring machine is around The setting deviation of the lens 11 in the rotational direction of the x-axis becomes quite small. The measurement NC path of the lens after the tilting of the lens is the same as that before the tilt change, and the measurement path in the x-axis direction is linear in the X-axis direction, and is placed obliquely obliquely in the x-axis. A cross section of the axis of the apex position Pt of the lower lens η, and a measurement path L22 in the γ-axis direction is a linear shape in the z-axis direction, and is a lens u which is placed obliquely obliquely on the Β axis. The profile of the axis of the vertex position pt. The deviation of the setting of the lens 11 in the rotation direction of the measuring machine 1 around the X-axis becomes relatively small, and when the step S3_13 does not require the inclination adjustment, the final flaw of the lens n in the posture changed in the step S3-8 is obtained. Axis and γ-axis 15 201015048 To measure the 疋-bean group. The measurement data group of the final axis direction obtained is the data of the high inclined surface of the lens 11 in the positive direction of the X-axis. Then, coordinate conversion, calibration processing, and data synthesis are performed on the measurement data group 'measured in the X-axis direction and the γ-axis direction measured in two postures (step S3-15). Refer to Figure 4 below for details on coordinate conversion, calibration, and data synthesis. First, the amount of shift of the lens u which is obliquely inclined (steps S3 to S3 8) to the lens design coordinate system (when the lens 11 is horizontally disposed) is calculated (step S4_1). The lens is disposed obliquely. The measurement data group at the time of 丨 is in the state indicated by the broken line of the 7A image of the 帛面. Therefore, the offset of the obliquely disposed position on the design of the lens design coordinate system is calculated, that is, the lens shown in Fig. 7B is calculated. The vertex offset position (Xt〇ff, Yt〇ff, Zt〇. Then, the offset calculated in step S4-1 is set to be obliquely inclined in two directions (steps S3-1, S3-8). The measured data of the X-axis and the γ-axis measured (steps S-1 to S3-7 and steps S3-8 to S3-14) are also coordinate-converted to the position measurement data (step S4_2). In other words, according to the offset calculated in step S4-1, all the obliquely set position measurement data are first rotated only by B, and then moved to the vertex position of the lens design coordinate system and obliquely. The difference between the vertex positions of the lenses when setting the lens, as shown by the dotted line in Figure 7B, Coordinate conversion is performed. Then, as shown in Fig. 9, only the amount of rotation of the lens u around the z-axis is measured, and coordinate conversion around the Z-axis is performed, and the coordinates are converted into design positions (step S4-3). The measurement data after the coordinates conversion of steps S4-2 and S4-3, including the cause 16 16150150 j j 'the lower end of the stylus 101 has a certain finite radius offset (probe R offset), In the step S4_4, after the correction of the probe R after the offset of the amount of the probe R is performed on the measurement data after the step S4_2 is converted, the difference between the design shape and the lens n is minimized. The difference between the design and the calibration process at the time of exiting the field. The following is a description of the step S4_4 cap design calibration process with reference to Fig. 1, and the first step, the manual movement calculation is performed (step S5-1). Specifically, The display of the output device 22 graphically displays the measurement data and the design. The operation of the input device 23 causes the measurement data to be moved in parallel or rotationally to fit as much as possible to the design. This is described later in step S5-2. When the RMS value is calculated as the first time, -# When the loops (lo〇p) of steps S5-1 to S5-8 are initially executed, the probe R correction of step S5_4 is performed by the money line (four) μ·3 because the result of the _ residual result described later is not calculated & The procedure of the probe R correction (step S5_4) will be described with reference to Fig. 8. In the 8th figure, in the state where the stylus 101 having the spherical shape of the front end is focused on the lens u, the lens coordinate system is in the X-axis direction. The measurement obtained by scanning at a specific sampling interval is indicated by a broken line L31. The shape of the lens surface (X, γ, Z) is represented by Z = f (X, Y), and is shown in Fig. 8. The inclination of the normal direction of the lens surface of the probe center coordinate Xm at the probe position is indicated by an arrow vu. Starting from the center position of the probe of Xm, the intersection of the vector V12 and the lens surface in the opposite direction of the arrow Vu is again determined by combining the vectors 乂12 and 2 ==f(X, Y). However, the point X' is located at a position deviated from the true contact point of the stylus pen 101 with the lens surface. In order to reduce the calculation error, the vector V13 in the opposite direction to the normal to the lens surface at the X position of 17 201015048 X' is calculated, and the intersection of the vector 13 and the lens surface at the start of the probe center position at xm is obtained. X HX ' can be obtained by combining vectors V13 and z = f(XY). Next, re-set X" to X and re-determine X". This calculation is repeated until the distance difference between X and x', 2 points is quite small from the viewpoint of the decomposition ability of the measuring machine i, and is calculated as a value close to the true contact point. After the probe R is corrected, the data in the effective radius ER region of the lens 11 set in advance in the measurement data group corrected by the probe R is extracted (step S5-5). That is to say, in the present embodiment, the target area (calibrated effective diameter) of the design calibration is included in all the measurement data of the effective radius ER of the lens u. Next, the calibration amount of the XYZAB axis is calculated by the least square method (step S5-6). Specifically, the sum of the squares of the differences between the points of the measurement data group in which the probe r obtained in step S5_5 has been corrected and the design shape of the lens ( (the corresponding point of the lens u. The minimum minimum flat method is used to calculate the deviation between the measured data group of the probe R corrected and the parallel direction of the design axis, the γ axis and the Ζ axis, that is, the calibration quantities dX, dY, dZ, and calculate the winding The deviation of the rotation of the X-axis and the Y-axis, that is, the calibration amount dA, dB. These calculated calibration quantities dX, dY, dz, dA, and dB are stored as cumulative calibration results. The receiver's coordinates of the probe R corrected in step S5-4 are coordinate-converted by the calibration amount, dY, dZ, dA, and dB' calculated in step S5_6 (S5-7). Next, the sum of the squares of the difference between the measurement data group and the design shape after the coordinate conversion by the calibration amount in step S5-7 is calculated and stored (step S5-8). 18 201015048 Repeat the process from the manual calculation of the wood (step S5-1) to the calculation of the RMS value (step S5·8), the calculation result of the previous value of the previous calculation and the change of the calculation result of the current RMS value. The rate is less than the specific range (step S5-9). No. 2: When the money is owed to execute the cycle of the step, the manual movement calculation is performed (after step S5_D and before the probe R is corrected (step (4), by accumulating the right, ', . At the time of execution, coordinate conversion is performed in the calibration amount dX dY dZ, dA) calculated in step (step S53). The calibration amount dA dB calculated by the least square method in step S5 6 is not a strict solution but is an approximate solution, but A more accurate calibration process can be achieved by repeating the processing of step 8. Μ In step S5 9 'When the rate of change of the calculated result of the RMS value is less than the specific I interval, the calibration process for the Sxst type ends. At this time, in the previous step In S5-7, the calibration of the probe is corrected. After the end of step S4_3 and FIG. 5 of FIG. 4, as shown in FIG. 9, only the coordinates of the z-axis are converted for the calibration data by setting the lens around the z-axis during measurement. Convert the calibration data to coordinates measured on the lens coordinate system The position to be determined. For the calculation of the two directions (all tilting configurations of the lens )), after the processing of the method (step S4_5), the lens design shape and the measured lens U are determined for both directions. The difference in shape is combined, and the obtained data is synthesized and memorized, and output to the output device 22 as needed (step S4_6). Fig. 10 is a view showing the calculation result of the embodiment 1. The horizontal vehicle 19 201015048 is The x-axis, the unit is 111111 'The difference between the vertical axis system and the z-direction of the design shape Zd (= (measurement data) - (design value)) 'unit is mm. As shown in the first figure, by this implementation The three-dimensional shape measurement method of the type can realize the shape evaluation of the lens surface having the inclined surface of 8 degrees. In the embodiment 1, the lens is rotated by 180 degrees during the measurement, and the measurement is performed from the two directions and measured on the X-axis. Data, but the lens ^ can be rotated 9 degrees each time, and

與X轴上的資料同樣地取得Y轴上的資料,測定透鏡11之X 轴及Y軸上之剖面資料。總言之’於實施型態1中,針對以 没s十座標系統之z軸為中心’以18〇度之角度增量使透鏡u φ 旋轉之2個設置狀態執行測定,藉此針對透鏡丨丨之設計座標 系統之X轴獲得剖面資料,但可針對以設計座標系統之Z軸 為中心’以90度之角度增量使透鏡11旋轉之4個設置狀態執 行測定’藉此針對透鏡11之設計座標系統之X轴及Y軸獲得 剖面資料。 (實施型態2) 於附相機之行動電話、DSC(數位相機)所使用的透鏡大 部分為軸對稱非球面透鏡。然而,設計形狀與實際形狀之 參 差異大時’會有校準資料不呈水平而延伸的情況。此現象 係因資料點數不以設計中心為基準而對稱分布而發生。前 述第10圖之測定結果亦因上述現象而於X轴上約±〇_4mm的 區’測定資料在中央部分未重疊而成為不自然的資料。 就此來分析第11圖所示之其他資料時,原本應該以透 鏡設計座標之〇點為基準而呈對稱之資料,由於位於χ軸負 側之資料,而如以實線L41顯示趨勢,成為X軸負方向降低 20 201015048 之貧料。在該第11圖之資料,擷取於透鏡設計座標上,資 料點數以X=G為中心呈左右對稱之資料,並於第12圖表示 以該操取諸之校準結果。以:轉賴從巾心左右對稱 之方式擷取測定資料之情況下,如以實線L42顯示趨勢,校 準資料亦左右大致呈對稱,成為符合實情之資料。 透鏡形狀之非球面量大時,藉由使用透鏡設計座標, 在中央之對稱區(對稱區CER)所擷取之測定資料群,可執行 對於设汁形狀正確的校準。然而,非球面量不足時,X軸方 向之移動與繞著Y軸之旋轉會分離而無法校準。以下,參考 第13A〜13C圖說明關於此點。 為第13A圖所示之非球面量大之透鏡面時,透鏡面之設 汁形狀(實線)成為背離球面的形狀,因此欲搬動透鏡面之測 疋資料群(虛線)以使其重疊於設計形狀之情況下,可正確求 出X軸方向之並進移動量及繞著γ軸之旋轉移動角。 然而,為第13C圖所示之非球面量小之透鏡面時,由於 透鏡面之設計形狀(實線)成為接近球面的形狀,因此欲搬動 透鏡面之狀f料群(虛線)α使其重#於設計频時,難以 個別求出X軸方向之並進移動量及繞著γ轴之旋轉移動量。 又’如第13Β®所示’依透鏡之設計形狀,亦有透鏡中 央部分的形狀接近球面,於透鏡外卿分,非球面量多的 情況(非球面量為中等的情況)。此情況下,欲搬動透鏡面之 測定資料群(虛線)以使其重疊於設計形狀(實線)時,若使用 透^整面的測定資料,可正確求出χ轴方向之並進移動量及 繞者γ轴之旋轉移動量。然而,若使用僅中央附近之非球面 21 201015048 量小的區之測定資料群,難以分開求出球方向之 量及繞著γ轴之旋轉移動角。 , 實施型態2之3次元測^方法係考慮到以上兩點,转 * 考慮到以透鏡設計座標之X = 〇或γ=〇為中心之資料點數 之對稱性、及對於各種非球面透鏡的對應。 該實施型態2之3次元測定方法係與參考第㈣所說明 之實施型態1相同,但從座標轉換至資料合成(第3圖之步驟 S3-15)之具體處理不同。 第14圖係表示從實施型態2之座標轉換至資料合成(第 鑫 3圖之步驟S3-15)的處理。該第14圖中,設計式上之設置位 罾 置之偏移量的算出及根據其之測定資料之座標轉換(步驟 S14_l、S14-2)、因應透鏡丨丨之設置方向之校準資料之c柄 方向的旋轉(步驟S14_3)、及至資料合成為止的處王里 (S14-8、S14-9)係與實施型態i之情況相同(第4圖之步驟队1 〜S4-3、S4-5、S4-6)。 設計式上之設置位置之偏移量的算出及根據其之測定 資料之資料轉換(步驟S14-1、步驟SM-2)、及校準資料之C φ 軸方向的旋轉(步驟S14-3)後,與實施型態1(第5圖)相同, 執行對設計式之校準處理的重複計算 ,令校準有效直徑為 包含於透鏡11之有效半徑ER之所有資料,使其與透鏡11之 設計式形狀的差最小化後 ,求出當時的差。於步驟S14-4, RMS之變化率收斂於特定範圍内之情況時,轉移至步驟 S14-5。 於步驟S14-5,將γ轴及A軸之校準量dY、dA固定於步 22 201015048 驟S14-3所算出的值,以dY、dA將測定資料點•列予以座 標轉換後,將校準有效餘設定在對稱區cer,執行對設 計式之校準處理之重複計算,算出dx,、dB,。於步驟si4_^ RMS之變化率收斂於特定範圍内時,由於校準完成,因此 轉移至步驟SU-8。另-方面’於步驟SM_5,RMs之變化 率未收斂於特定範圍内時,轉移至步驟Sl4_6。於步驟si4_6 中,將Y軸、A軸及X轴之對準量dY'dA、dXg]定於㈣Μ]The data on the Y-axis is obtained in the same manner as the data on the X-axis, and the profile data on the X-axis and the Y-axis of the lens 11 is measured. In the first embodiment, in the first embodiment, the measurement is performed in two setting states in which the lens u φ is rotated at an angular increment of 18 degrees from the z-axis of the s coordinate system. The X-axis of the design coordinate system of the 获得 obtains the profile data, but the measurement can be performed for the four setting states in which the lens 11 is rotated at an angular increment of 90 degrees centering on the Z-axis of the design coordinate system. The X-axis and Y-axis of the coordinate system are designed to obtain profile data. (Embodiment 2) Most of the lenses used in camera-attached mobile phones and DSCs (digital cameras) are axisymmetric aspherical lenses. However, when the difference between the design shape and the actual shape is large, there is a case where the calibration data does not extend horizontally. This phenomenon occurs because the number of data points is not symmetrically distributed based on the design center. The measurement results in the above-mentioned Fig. 10 are also unnatural in the central portion of the measurement data on the X-axis of about ± 〇 4 mm on the X-axis. In this case, when analyzing the other data shown in Figure 11, the data should be symmetrical based on the point of the lens design coordinates. Because of the data on the negative side of the χ axis, the trend is shown by the solid line L41. The negative direction of the shaft is reduced by 20 201015048. The data in Fig. 11 is taken from the lens design coordinates, and the data points are bilaterally symmetric with X=G as the center, and the calibration results obtained by the operation are shown in Fig. 12. In the case where the measurement data is taken from the left-right symmetry of the towel, if the trend is displayed by the solid line L42, the calibration data is roughly symmetrical, which becomes a factual information. When the aspherical amount of the lens shape is large, by using the lens design coordinates, the measurement data group extracted in the central symmetrical region (symmetric region CER) can perform accurate calibration for the juice shape. However, when the amount of aspheric surface is insufficient, the movement of the X-axis direction is separated from the rotation about the Y-axis and cannot be calibrated. Hereinafter, the description will be made with reference to Figs. 13A to 13C. In the case of the lens surface having a large amount of aspherical surface shown in Fig. 13A, the shape of the liquid on the lens surface (solid line) is a shape that faces away from the spherical surface. Therefore, it is necessary to move the measurement data group (dotted line) of the lens surface to overlap In the case of designing the shape, the amount of parallel movement in the X-axis direction and the rotational movement angle around the γ-axis can be accurately obtained. However, in the case of the lens surface having a small amount of aspherical surface shown in Fig. 13C, since the design shape (solid line) of the lens surface is close to the spherical surface, the f group (dotted line) α of the lens surface is required to be moved. When the weight is at the design frequency, it is difficult to individually determine the amount of movement in the X-axis direction and the amount of rotation around the γ-axis. Further, as shown in Fig. 13®, depending on the design of the lens, the shape of the central portion of the lens is close to the spherical surface, and the amount of the aspheric surface is large outside the lens (the case where the aspheric amount is medium). In this case, when the measurement data group (dotted line) of the lens surface is to be superimposed on the design shape (solid line), if the measurement data of the entire surface is used, the amount of movement in the x-axis direction can be accurately obtained. And the amount of rotational movement of the gamma axis of the wrap. However, if a measurement data group of a region having a small amount of aspheric surface 21 201015048 near the center is used, it is difficult to separately obtain the amount of the spherical direction and the rotational movement angle around the γ axis. The implementation of the type 2 3 dimensional measurement method takes into account the above two points, and considers the symmetry of the data points centered on the X = 〇 or γ = 〇 of the lens design coordinates, and for various aspherical lenses. Correspondence. The third dimension measurement method of this embodiment 2 is the same as the embodiment 1 described with reference to the fourth aspect, but the specific processing from the coordinate conversion to the data synthesis (step S3-15 of Fig. 3) is different. Fig. 14 is a view showing the processing from the conversion of the coordinate of the embodiment 2 to the data synthesis (step S3-15 of the third diagram). In the fourteenth figure, the calculation of the offset amount of the setting position on the design formula and the coordinate conversion of the measurement data according to the design (steps S14_1, S14-2), and the calibration data according to the setting direction of the lens c The rotation of the shank direction (step S14_3) and the position of the data synthesis (S14-8, S14-9) are the same as those of the implementation type i (steps of Figure 4, Team 1 to S4-3, S4- 5. S4-6). The calculation of the offset amount of the installation position on the design formula and the data conversion (step S14-1, step SM-2) based on the measurement data and the rotation of the C φ axis direction of the calibration data (step S14-3) In the same manner as the implementation type 1 (Fig. 5), the repeated calculation of the calibration process of the design is performed so that the calibration effective diameter is all the data included in the effective radius ER of the lens 11 so as to be in the design shape of the lens 11. After the difference is minimized, the difference at that time is obtained. When the rate of change of the RMS converges within a specific range in step S14-4, the process proceeds to step S14-5. In step S14-5, the calibration amounts dY and dA of the γ-axis and the A-axis are fixed to the values calculated in step 22 201015048 and S14-3, and the calibration data points and columns are coordinate-converted with dY and dA, and the calibration is valid. The rest is set in the symmetry area cer, and the repeated calculation of the design calibration process is performed to calculate dx, dB. When the rate of change of the step si4_^ RMS converges within a specific range, since the calibration is completed, the process proceeds to step SU-8. On the other hand, in step SM_5, when the rate of change of RMs does not converge within a specific range, the process proceeds to step S14_6. In step si4_6, the alignment amounts dY'dA, dXg of the Y-axis, the A-axis, and the X-axis are set to (4) Μ]

所算出的值’以dY、dA、dX將測定資料點串料以座標轉 換後’將校準有效錄設定在對髓咖,執行對設収 之校準處理之重複計算,算出dB,而使校準完成。°X° > 於步驟Si4-4,RMS之變化率未收斂於特定範圍内時, 轉移至步驟S14-7。於步驟S14-7,將Y軸及χ軸之校準量 代、dX固定於步驟S14_4所算出的值,以打、狀將測定資 料點串列予以座標轉換後,將校準有效直徑設^在對稱區 CER,執行對設計式之校準處理之重複計算,算出dB,而使 校準完成。 第14圖中,從步驟S14_4經過步驟814。而完成校準的 隋況,相當於透鏡11之非球面量大的情況(第13A圖)。又, 從步驟S14-4經過步驟S14-5及S14-6而完成校準的情況,相 當於透鏡11之非球面量為中等程度的情況(第13B圖)。進一 步而言,從步驟S14-4經過S14-7而完成校準的情況,相當 於透鏡11之非球面里小的情況(第13C圖)。以下具體說明步 驟S14-4〜S14-7之處理内容。 第圖係表示第14圖之步驟S14-4之詳情。第15圖係除 23 201015048 了 RMS值之變動率是否藉由重複計算而容納於特定範圍 (疋否收斂)以外,均與第丨實施型態中對設計式之校準(步驟 . S4-3、第5圖)相同。 首先’將重複計算次數之計數器設定於初始值0(步驟 S15_1)。接著,將計數器僅遞增1(步驟S15-2)。 接著,執行採手動之移動計算(步驟S5-1)。具體而言, 校準量dX、dY、dZ、dA、dB之重設值為0,於輸出裝置22 之顯不器,以圖形顯示測定資料及設計式,藉由輸入裝置 23之操作,令測定資料平行移動或旋轉移動以儘可能擬合 參 於設計式。 於步驟S15-4為N-1(步驟SI5-2〜S15-10之循環的最初 執行)時,不執行步驟S15-3而執行探針R修正(步驟S15_6)。 該探針R修正係與參考第8圖所說明的第丨實施型態之探針 R修正(第5圖之步驟S5-4)相同。 - 探針R修正後,擷取經探針R修正後之測定資料群中之 透鏡11之有效半徑ER區域内之資料(步驟S15_7),藉由最小 平方法算出XYZAB軸之校準量(步驟s5_8)。具體而言,執 ® 行使得步驟S15-7所擷取的探針R修正完畢之測定資料群之 各點、與透鏡11之設計形狀的差之平方和為最小之最小平 方法,算出所掏取的探針R修正完畢之測定資料群與設計形 狀之X軸、γ軸及z軸之並進方向之偏離,即校準量dX、dY、 dZ,並算出繞著X軸及Y軸之旋轉之偏離,即校準量dA, dB。該等算出之校準量dX、dY、dZ、dA、dB係記憶作為 累積校準結果。接下來,藉由步驟S15-8所算出之校準量 24 201015048 dX dY、dZ、dA、dB ’將步驟Sls_7所擷取的探針R修正 完畢之測定資料群予以座標轉換(Sl5_9)。進—步算出並記 憶藉由校準量而經座標轉換後之測定資料群與設計形狀之 差的平方和,即RMS值(步驟S15-10)。The calculated value 'by dY, dA, dX will be measured after the data point is converted into coordinates. 'Set the calibration valid record to the meditation coffee, perform the repeated calculation of the calibration process of the collection, calculate the dB, and make the calibration complete. . °X° > When the rate of change of RMS does not converge within a specific range in step Si4-4, the process proceeds to step S14-7. In step S14-7, the calibration quantity and dX of the Y-axis and the χ-axis are fixed to the values calculated in step S14_4, and the coordinate points of the measurement data are converted into coordinates, and the calibration effective diameter is set in the symmetry. The zone CER performs a double calculation of the design calibration process to calculate the dB, and the calibration is completed. In Fig. 14, step 814 is passed from step S14_4. The case where the calibration is completed corresponds to the case where the aspheric amount of the lens 11 is large (Fig. 13A). Further, the case where the calibration is completed from step S14-4 through steps S14-5 and S14-6 is equivalent to the case where the aspheric amount of the lens 11 is moderate (Fig. 13B). Further, the case where the calibration is completed from step S14-4 through S14-7 is equivalent to the case where the aspheric surface of the lens 11 is small (Fig. 13C). The processing contents of steps S14-4 to S14-7 will be specifically described below. The figure shows the details of step S14-4 of Fig. 14. Figure 15 shows the calibration of the design in the third implementation mode (step S4-3, except whether the rate of change of the RMS value is accommodated in a specific range (疋 收敛 convergence) by repeated calculations. Figure 5) is the same. First, the counter for the number of times of calculation is set to the initial value of 0 (step S15_1). Next, the counter is incremented by only 1 (step S15-2). Next, manual movement calculation is performed (step S5-1). Specifically, the reset values of the calibration quantities dX, dY, dZ, dA, and dB are 0, and the display device of the output device 22 displays the measurement data and the design formula graphically, and the measurement is performed by the operation of the input device 23. The data is moved in parallel or rotated to fit as much as possible into the design. When it is N-1 in step S15-4 (the first execution of the loop of steps S5 - 5 to S15 - 10), the probe R correction is executed without executing step S15-3 (step S15_6). This probe R correction system is the same as the probe R correction of the third embodiment described with reference to Fig. 8 (step S5-4 of Fig. 5). - After the probe R is corrected, the data in the effective radius ER region of the lens 11 in the measurement data group corrected by the probe R is extracted (step S15_7), and the calibration amount of the XYZAB axis is calculated by the least square method (step s5_8) . Specifically, the method of calculating the sum of the squares of the differences between the points of the measurement data group corrected by the probe R and the design shape of the lens 11 obtained in step S15-7 is the minimum minimum method, and the calculation is performed. The deviation between the measured data group and the X-axis, the γ-axis, and the z-axis of the design shape corrected by the probe R, that is, the calibration amounts dX, dY, and dZ, and the rotation around the X-axis and the Y-axis is calculated. Deviation, ie the amount of calibration dA, dB. The calculated calibration quantities dX, dY, dZ, dA, and dB are stored as cumulative calibration results. Next, the measurement data group corrected by the probe R extracted in step Sls_7 is coordinate-converted by the calibration amount 24 201015048 dX dY, dZ, dA, dB ' calculated in step S15-8 (S15_9). The square sum of the difference between the measured data group and the design shape converted by the coordinate by the calibration amount, i.e., the RMS value, is calculated and recorded (step S15-10).

複v驟S15-2〜S15-10的處理,直到RMs值之變動率 小於特定範圍為止(步驟仍-⑴七次以後執行步驟阳_2 S15-10之循環時,於採手動之移動計算(步驟si5_3)後且 於探針R修正(步驟S15_6)前,藉由累積校準結果(前次的循 環執行時,於步·5_6所算出之校準量dX、dY、dZ、dA、 dB)執行座標轉換(步驟S15-5)。 於v驟呂15-2〜S15-10之循環之重複次數到N次為止 刖’ RMS值之變動率小於特定範圍(rms值收斂時)時,轉 移至步·14_5(第16圖),但循環之重複次數超過N次時 (RMS值不收做時)時’則轉移至步驟si4_7㈤8圖)(步驟 S15-11 、 S15-12)。 第16圖係表示第14圖之步驟814_5之詳情。第16圖中, 在對將校準有效直徑作為魏此树半彳逍内之所有資 料之设计式之校準處理中,尺]^18值收斂時(可獲得校準量 dX’ dY’ dZ ’ dA ’ dB的解之情況),將透鏡u中央附近僅 小區(對稱區CER)之測定資料群作為對象,且新算出校準量 dY、dA以外之剩餘軸之校準量dx,、犯,' 犯,。然後以 所獲知之準里dY、dA、dX,、dZ,、dB,,將經設計式上 之。又置位置之偏移量進行座標轉換後之測定資料(步驟 S14 2)予以座標轉換。也就是說第16圖之處理係γ抽及a 25 201015048 軸之校準量ϋ定独所有資料為對象所算㈣值,並㈣ 、 對稱區CER之測定資料算出剩餘軸之校準量。藉由該㈣ ; 圖(第14圖之步驟S14-5)的處理,如參考第⑽所說明,即 便為測定資料群之點數對設計資料之中心呈不均勾分布之 情況’仍可排除透鏡11對於測定機i之設置位置偏離的影 響,並可以高精度測定透鏡u的形狀。以下具體說明第16 圖的處理。 首先,將重複計算次數之計數器設定於初始值〇(步驟 S16-1)。接著,將計數器僅遞增丨(步驟si6_2)。 參 接著,使用在步驟S14-3所求出之校準量dY、dA,將 測定資料予以座標轉換(步驟S16_3)。作為該座標轉換對象 之測定資料,係根據設計式上之設置位置之偏移量之座標 轉換(步驟S14-1、S14-2)、及因應透鏡u之設置方向之 方向的旋轉(步驟S14-3)完畢之測定資料。 〜 於步驟S10-4為N-1(步驟S10-2〜SlhlO之循環的最初 執行)之情況時,不執行步驟S16_3而執行探針R修正(步驟 S16-6)。該探針R修正係與參考第8圖所說明的第丨實施型態 參 之探針R修正(第5圖之步驟S5_4)相同。 探針R修正後,擷取經探針尺修正後之測定資料群中之 對稱區CER内之資料(步驟S16_7),藉由最小平方法算出 XZB軸之校準量(步驟S16_8)。具體而言,執行使得步驟 S16-7所擷取的探針R修正完畢之測定資料群之各點、與透 鏡11之設計形狀之差的平方和為最小之最小平方法,算出 所操取的探針R修正完畢之測定資料群與設計形狀之校準 26 201015048 量dX, dZ,、dB: 該等算出之校準量dX,、dZ,、dB,係記 憶作為累積校準結果。接下來,藉由校準量此鲁仏、 dA、dB,,將測定資料群予以座標轉換⑻㈣。與該座標 轉換成為對象的係第15圖之步所獲得之探針錄正 完畢之測定資料(有效半徑ER内之所有資料)。進一步算出 並讀在對稱區CER内藉由校準量料座標轉換後之測定 資料群與設計形狀⑽之平方和,即刪值(步獅6_ι〇)。The processing of the steps S15-2 to S15-10 is repeated until the rate of change of the RMs value is less than the specific range (the step is still - (1) after the execution of the step of the step YANG S15-10 after seven times, the manual movement calculation is performed ( After step si5_3) and before the probe R correction (step S15_6), coordinates are performed by accumulating the calibration result (the calibration amount dX, dY, dZ, dA, dB calculated in step 5_6 at the previous cycle execution) Conversion (step S15-5). When the number of repetitions of the cycle of v5-15 to S15-10 is N times, when the rate of change of the RMS value is smaller than a specific range (when the rms value converges), the process proceeds to step· 14_5 (Fig. 16), but when the number of repetitions of the cycle exceeds N times (when the RMS value is not received), the process proceeds to step si4_7(5)8 (steps S15-11, S15-12). Figure 16 shows the details of step 814_5 of Figure 14. In Fig. 16, in the calibration process for designing all the data in the radius of the calibration as the radius of the rule, when the ruler ^18 value converges (the calibration amount dX' dY' dZ ' dA ' can be obtained] In the case of the solution of the dB, the measurement data group of only the cell (symmetric area CER) near the center of the lens u is targeted, and the calibration amount dx of the remaining axis other than the calibration amounts dY and dA is newly calculated, and is committed. Then, the known dY, dA, dX, dZ, and dB will be designed. The measurement data after the coordinate conversion is performed by the offset of the position (step S14 2) is coordinate-converted. That is to say, the processing system of Fig. 16 is γ pumping and the calibration quantity of the axis of a 25 201015048 is determined by the data of (4), and (4), the measurement data of the symmetric area CER is used to calculate the calibration amount of the remaining axis. By the processing of the (4); map (step S14-5 of Fig. 14), as described with reference to the item (10), even if the number of points of the measured data group is unevenly distributed to the center of the design data, it can be excluded. The influence of the lens 11 on the positional deviation of the measuring machine i can be measured with high precision. The processing of Fig. 16 will be specifically described below. First, the counter for the number of times of calculation is set to the initial value 〇 (step S16-1). Next, the counter is incremented only 丨 (step si6_2). Next, the measurement data is coordinate-converted using the calibration amounts dY and dA obtained in step S14-3 (step S16_3). The measurement data of the object to be converted is a coordinate conversion (steps S14-1, S14-2) according to the offset of the set position on the design, and a rotation in the direction of the direction in which the lens u is disposed (step S14- 3) The measured data of the completion. When the step S10-4 is N-1 (the first execution of the loop of the steps S10-2 to S1hl0), the probe R correction is executed without executing the step S16_3 (step S16-6). This probe R correction system is the same as the probe R correction of the third embodiment of the present invention described in Fig. 8 (step S5_4 of Fig. 5). After the probe R is corrected, the data in the symmetry area CER in the measurement data group corrected by the probe is extracted (step S16_7), and the calibration amount of the XZB axis is calculated by the least square method (step S16_8). Specifically, the least square method in which the sum of the squares of the difference between the points of the measurement data group corrected by the probe R captured in step S16-7 and the design shape of the lens 11 is minimized is calculated, and the obtained Calibration of the measured data set and design shape of the probe R corrected 26 201015048 The quantity dX, dZ, dB: These calculated calibration quantities dX, dZ, and dB are the cumulative calibration results. Next, by measuring the amount of recklessness, dA, and dB, the measured data group is coordinate-converted (8) (4). The measurement data (all data within the effective radius ER) obtained by the probe obtained in the step of Fig. 15 which is the target of the coordinate conversion. Further calculating and reading the sum of the squares of the measured data group and the design shape (10) converted by the calibration material coordinates in the symmetric region CER, that is, the value (step lion 6_ι〇).

❹ 重複步驟S16-2〜S16-10的處理,直到請8值之變動率 小於特定範圍為止(步_6七)。第2次以後執行步獅6_2 16 10之循環時,於藉由校準量灯、从所進行的座標轉 換(步驟si6.3)後且於探針R修正(步驟sis_6)前,藉由累積 校準結果(前切循魏行時,於步娜.算出之校準量 X dY dZ、dA、dB’)執行座標轉換(步驟S16-5)。 ▲於步驟S16-2〜S16-10之循環之重複次數到N次為止 月J RMS值之變動值小於特定範圍卿s值收敛的情況) 時:由於収資料群對於設計職之校準完成 ,因此轉移 至第14圖之步驟S14.8 ’循環之重複次數超過N次(RMS值不 收傲的it况Μ ’轉移至步驟si4_6(第17圖)(步驟㈣七、 S16-12)。 第17圖係表不第14圖之步驟S14-6之詳情。第17圖係於 第16圖(第14圖之步_4-4)中’ RMS不收斂時,固定Y轴 對無cer作為校準有效半徑之校準 中剩餘之校準量未決定時,進-步固定X軸之校準量dX 而執行同樣處理者。藉由該第開(第Μ圖之步驟叫-^的 27 201015048 處理,即便為參考第丨_所說明之透鏡中央部分的形狀接 近求面於透鏡外侧的部分為非球面量多的情況(作球面量 為中等的情⑹’仍可排除透鏡11對於測定機i之設置位置 的”響U冋精度測定透鏡“的形狀。以下矣體說明 第17圖的處理。 首先’使用步驟S14-3所求出之校準量dY、dA、dx, 將別疋資料予以座標轉換(步驟Sm)。作為該座標轉換對 象之則疋資料,係根據攻計式上之設置位置之偏移量之座 標轉換(步驟sm、sh-2)、及因應透鏡n之設置方向之c 〇 軸方向的旋轉(步驟S14_3)完畢之測定資料。 於步驟S17_2,RMS值之算出為初次(步驟S17]〜S17_8 之循環的最初執行)時,不執行步驟S17_3而執行步驟S17_4 之探針R修正。該探針R修正係與參考第8圖所說明的第1實 把型態之探針R修正(第5圖之步驟S5_4)相同。 探針R修正後,擷取經探針R修正後之測定資料群中之 對稱區CER内之資料(步驟sn-5),藉由最小平方法算出zb 軸之校準量(步驟S17-6)。具體而言,執行使步驟S17_5所擷 ® 取的探針R修正完畢之測定資料群之各點、與透鏡11之設計 形狀的差之平方和為最小之最小平方法,算出所擷取的探 針R修正完畢之測定資料群與設計形狀之校準量(12,、dB,。 該等算出之校準量dZ’、dB’係記憶作為累積校準結果。接 下來,藉由校準量dX、dY、dZ,、dA、dB’,將測定資料群 予以座標轉換(S17-7)。與該座標轉換成為對象的是第15圖 之步驟S15-6所獲得之探針R修正完畢之測定資料(有效半 28 201015048重复 Repeat the processing of steps S16-2 to S16-10 until the rate of change of the value of 8 is less than the specific range (step _6:7). When the cycle of the lion 6_2 16 10 is executed after the second time, the cumulative calibration is performed by calibrating the lamp, converting from the coordinates performed (step si6.3) and before the probe R correction (step sis_6). As a result (the front cut is followed by Wei Xing, Yu Bu Na. The calculated calibration amount X dY dZ, dA, dB') performs coordinate conversion (step S16-5). ▲When the number of repetitions of the cycle of steps S16-2 to S16-10 reaches N times, the variation of the monthly J RMS value is smaller than the case where the specific range s s value converges): since the data collection is completed for the calibration of the design job, Transfer to step S14.8 of Figure 14 'The number of repetitions of the cycle exceeds N times (the RMS value does not arrogate the situation Μ 'transfer to step si4_6 (Fig. 17) (step (4) VII, S16-12). The figure is not detailed in step S14-6 of Fig. 14. Fig. 17 is in Fig. 16 (step _4-4 of Fig. 14). When the RMS does not converge, the fixed Y-axis is valid for calibration without cer. When the remaining calibration amount in the calibration of the radius is not determined, the same amount of processing is performed by fixing the calibration amount dX of the X-axis. By the first opening (the step of the second drawing is called -2010 2715015048, even for reference The shape of the central portion of the lens described in the third step is close to the case where the portion outside the lens is aspherical (the spherical amount is medium (6)', and the position of the lens 11 for the measuring machine i can still be excluded." The shape of the lens is measured by U冋 precision. The following description shows the processing of Figure 17. First, use The calibration quantities dY, dA, and dx obtained in step S14-3 are coordinate-converted (step Sm). The data of the coordinate conversion object is offset according to the set position on the attack type. The coordinate conversion (steps sm, sh-2) and the measurement data in the c-axis direction rotation (step S14_3) in response to the setting direction of the lens n. In step S17_2, the RMS value is calculated as the first time (step S17). In the first execution of the loop of S17_8, the probe R correction of step S17_4 is executed without executing step S17_3. The probe R correction is corrected with the probe R of the first real type described with reference to Fig. 8 ( Step S5_4) in Fig. 5 is the same. After the probe R is corrected, the data in the symmetric region CER in the measurement data group corrected by the probe R is extracted (step sn-5), and the zb axis is calculated by the least square method. The amount of calibration (step S17-6). Specifically, the sum of the squares of the differences between the points of the measurement data group corrected by the probe R taken in step S17_5 and the design shape of the lens 11 is minimized. The Xiaoping method is used to calculate the measured data group and the set of the probe R that has been corrected. The calibration amount of the shape (12, dB, . The calculated calibration amount dZ', dB' is the cumulative calibration result. Next, the calibration amount dX, dY, dZ, dA, dB' will be measured. The data group is coordinate-converted (S17-7). The target data is converted into the measurement data of the probe R obtained in step S15-6 of Fig. 15 (effective half 28 201015048)

内之所有資料)。進-步算出並記憶已藉由校準量將對 稱區CER内之資料予以座標轉換後之測定資料群、與設計 幵/狀的差之平方和,即RMS值(步驟S17_8)。重複以上處理, 直到於步驟S17-9獲得RMS值為止。第2次以後執行步驟 S17-2〜S17-8之循環時,於藉由校準量dY、dA、dx所進行 的座標轉換(步驟S17_U後且於探針R修正(步驟si7_4)前, 藉由累積校準結果(前次的循環執行時,於步驟85_6所算出 之校準量4乂、£1丫责、£1八、(18,)執行座標轉換(步驟817_3)。 第18圖係表示第14圖之步驟814_7之詳情。第18圖係於 第U圖(第14圖之步驟S14-4)中,RMS值不收斂時,亦即在 對校準有效直徑設為透鏡11之有效半徑ER内之所有資料之 設計式的校準處理中,RMS值收斂之情況(無法獲得校準量 dX、dY ' dz、dA、dB的解之情況)下之處理。藉由該第μ 圖(第14圖之步驟S14-7)的處理,即使係如參考第i3c圖所說 明之透鏡面之非球面量小的情況’仍可排除透仙對於^ 定機1之設置位置偏離的影響,以高精度測定透鏡丨丨的形 首先,於步驟S18-1,將校準量dA、 淮士 _ °又疋為〇,於校 皁有效半㈣為所有資料之校準中’求出剩餘的 :會仏省驟咖之計算程序係她圖相同。 第18圖之步驟818-2〜SltlO的處理係除了將γ 奴準量,固定於步驟S18-1中以所有資料為對 軸之 dX’、dY’,並以僅對稱區CER之測定資料群為=算出之 剩餘轴之校準量dZ”、dA”、dB”方面以外, 求出 ,勻與第17圖之 29 201015048 步驟S17-1〜S17-9的處理相同。 第19圖係表示實施型態2之計算結果之一例。該第^圖 係於第14圖之步驟814_5中,RMS值收斂的情況。該圖之橫 軸為X軸,單位為爪爪,縱轴係與設計形狀之2方向的差乙#。 (測疋Ϊ料)-(設計),單位為mm。如該第1〇圖所示,藉由本 實施型態之3次元形狀測定方法,能夠以資料在透鏡之中央 部重疊之方式,進行具有80度傾斜面之透鏡面之形狀評估。 於實施型態2中,測定時將透鏡旋轉18〇度,從2方向測 定’並測定X轴上的資料,但可每9〇度進行透鏡此旋轉, _ 與X軸上的資料同樣地取得γ轴上的資料,測定透鏡丨丨之乂 軸及Y軸上之剖面資料。第2〇圖係表示此情況下之叶算結 (實施型態3) 透鏡11為用於附相機之行動電話等之直徑約程 度,近似於球面之情況下之球半徑為1〇3醜程度之非球面 透鏡之情況時,相對於球面之透鏡面之非球面量有時僅數 μιη程度。右為此㈣鏡u ’錢設計雜製作财後,若 φ 使用塑膠等材料將透鏡n成型時,因在成型時收縮而會有 發生與非球面量相同等級,即數叫等級之變形的情況。此 種情=下’從實際形狀推測設計形狀使用該推測的設計 形狀-又置於測定機卜將所測定之測定資料予以座標轉換, 並予以校準,藉此可高精度地測定包含高傾斜部之3次元形 狀。以下利用具體例來說明。 參考第21圖,軸對稱非球面透鏡之設計式係以例如以 30 201015048 下式(4)表示。該設計式係以球面項(球面半徑R)、表示橢 圓、雙曲面特性之圓錐係數κ、及表示與球面的差之非球面 係數Ai(i = 1〜左右)所構成。 〔數4〕All the information in it). Further, the RMS value of the difference between the measured data group and the design 幵/shape after the coordinate conversion of the data in the symmetry area CER by the calibration amount is calculated and stored (step S17_8). The above process is repeated until the RMS value is obtained in step S17-9. When the loop of steps S17-2 to S17-8 is executed after the second time, the coordinate conversion by the calibration amounts dY, dA, and dx (before step S17_U and before the probe R correction (step si7_4)) is performed by Cumulative calibration result (at the previous cycle execution, the calibration amount calculated in step 85_6, 丫1, £1, (18,) performs coordinate conversion (step 817_3). Figure 18 shows the 14th The details of step 814_7 of the figure. Fig. 18 is in the U diagram (step S14-4 of Fig. 14), when the RMS value does not converge, that is, within the effective radius ER of the lens 11 for the calibration effective diameter In the design calibration process of all data, the RMS value converges (the case where the solution of the calibration amount dX, dY 'dz, dA, dB cannot be obtained). By the step μ (step of Figure 14) The processing of S14-7), even if the aspherical amount of the lens surface is small as described with reference to the i3c diagram, can eliminate the influence of the positional deviation of the setting machine 1 on the position of the fixed machine 1, and the lens is measured with high precision. First, in step S18-1, the calibration amount dA, the Huai Shi _ ° is again 〇, and the school soap is effective half (four) In the calibration of the data, the calculation procedure of the remaining data is the same. The processing of the steps 818-2 to SltlO in Fig. 18 is fixed in step S18-1 except for the gamma slave quantity. In the middle, all the data are the dX' and dY' of the axis, and the measurement data group of the CER only in the symmetry area is calculated as the remaining amount of the calibration axis dZ", dA", and dB". 17Fig. 29 201015048 The processing of steps S17-1 to S17-9 is the same. Fig. 19 is an example of the calculation result of the implementation type 2. This figure is in the step 814_5 of Fig. 14, the RMS value converges. The horizontal axis of the figure is the X-axis, the unit is the claw, and the vertical axis is the difference between the two directions of the design shape. (Measurement)-(design), the unit is mm. As shown in the figure, in the third-order shape measuring method of the present embodiment, the shape of the lens surface having the inclined surface of 80 degrees can be evaluated so that the data overlaps at the central portion of the lens. In the embodiment 2, the measurement is performed. Rotate the lens 18 degrees, measure 'from 2 directions' and measure the data on the X-axis, but the lens can be made every 9 degrees. Rotation, _ acquires the data on the γ-axis in the same way as the data on the X-axis, and measures the profile data on the 乂 axis and the Y-axis of the lens 。. The second diagram shows the leaf calculation in this case (implementation type) 3) The lens 11 is an aspherical lens for a camera-attached mobile phone or the like, which is approximately the same as a spherical lens having a spherical radius of 1 〇 3 ugly in the case of a spherical surface, and an aspherical surface with respect to the lens surface of the spherical surface The amount is sometimes only a few μηη. After the right is made for this (four) mirror u 'money design, if φ uses plastic or other materials to shape the lens n, it will be the same level as the aspherical surface due to shrinkage during molding. The case where the number is called the deformation of the level. In this case, the 'designed shape is estimated from the actual shape, and the estimated design shape is used. The measurement data is placed on the measuring machine, and the measured data is coordinate-converted and calibrated, thereby accurately measuring the high-inclined portion. The 3 dimensional shape. The following is explained using a specific example. Referring to Fig. 21, the design of the axisymmetric aspherical lens is expressed by, for example, 30 201015048 (4). This design is composed of a spherical term (spherical radius R), a conical coefficient κ representing an ellipse, a hyperboloid characteristic, and an aspherical coefficient Ai (i = 1 to about) indicating a difference from the spherical surface. [Number 4]

h=v^Y2) R:球面半徑 κ :圓錐係數h=v^Y2) R: spherical radius κ : conical coefficient

Ai : #球面係數 X : X座標方向座標值 γ : Y座標方向座標值 其中,將測定資料群校準為設計形狀時,變形形狀誤 差視為式(4)之設計式中,僅球面半徑R產生變化,使球面 半徑R的值變化。然後’對於使該球面半徑r變化後之設計 形狀,校準測定資料群,算出RMS值成為最小之最佳擬合尺 值。於第22圖表示使用所算出之最佳擬合r值之設計形狀與 測定資料點群的差之結果。第22圖為原本的設計形狀,Zd 方向之誤差較已校準之第19圖少,成為更擬合於設計形狀之 設計式。 將該求出之最佳擬合R值作為設計形狀,以實施型態i 或實施型態2之程序,算出並記憶各狀態下之座標χγζΑΒ 之轉換量。其後’將設計形狀復原為原本設計形狀,以記 憶的座標轉換量依次進行座標轉換及探針尺修正處理,作為 31 201015048 J疋資料群與原本设计形狀的差而顯示3次元形狀資料。藉 此’能夠以更高精度從斜向設置之狀態進行座標轉換及探 針R修正,進行高傾斜面之高精度測定。 又為了更南精度地算出測定資料群之座標轉換量, 進行高精度之中央部之重叠部分的連接,亦可推測測定資 料群本身之設計形狀。例如軸對稱非球面之設計式以式(4) 表示時,除了前述最佳擬合R之參數算出之外,還求出針對Ai : # spherical coefficient X : X coordinate direction coordinate value γ : Y coordinate direction coordinate value. When the measurement data group is calibrated to the design shape, the deformation shape error is regarded as the design formula of the formula (4), and only the spherical radius R is generated. Change to change the value of the spherical radius R. Then, the measurement data group is calibrated for the design shape in which the spherical radius r is changed, and the optimum fitting scale value at which the RMS value is the smallest is calculated. Fig. 22 shows the result of using the difference between the calculated shape of the calculated best fit r value and the measured data point group. Figure 22 shows the original design shape. The error in the Zd direction is less than the calibrated Figure 19, which becomes a design that fits better to the design shape. The obtained optimum fitting R value is taken as a design shape, and the conversion amount of the coordinates χγζΑΒ in each state is calculated and stored by the procedure of the implementation type i or the implementation type 2. Thereafter, the design shape is restored to the original design shape, and the coordinate conversion and the probe scale correction processing are sequentially performed in accordance with the coordinate conversion amount of the memory, and the three-dimensional shape data is displayed as the difference between the 31 201015048 J疋 data group and the original design shape. By this, the coordinate conversion and the probe R correction can be performed with higher precision from the obliquely set state, and high-precision measurement of the high-inclined surface can be performed. Further, in order to calculate the coordinate conversion amount of the measurement data group more accurately, and to connect the overlapping portions of the center portion with high precision, it is also possible to estimate the design shape of the measurement material group itself. For example, when the design formula of the axisymmetric aspherical surface is expressed by the formula (4), in addition to the parameter calculation of the aforementioned best fit R, the

非球面項之Αι項重新擬合,以使得校準測定資料群之RMS 值成為最小之推測設計形狀式。將該求出之推測設計雜 參 作為設計形狀’以實施型態】或實施型態2之程序,算出並 記憶各狀態下之座標XYZAB之轉換量。其後,將設計形狀 復原為原本設計形狀,以記憶的座標轉換量依次進行座標 轉換及探針R修正處理,作為測定㈣群與原本設計形狀的 - 差而顯示3次元形狀資料。藉此,能夠以更高精度從斜向設 . 置之狀態進行座標轉換及探似修正,進行高傾斜面之高精 度測定。 進-步為了更對齊中央部分之重疊,對稱性良好地評 Θ 估資料,以實施型態1或實施型態2之程序進行處理,採手 動調整第10圖之輸出資料亦可。具體而言’ 一面以輸出裝 置22之顯示器監視第1〇圖之輸出資料,—面針對2方向測定 資料之左區的資料,藉由輸入裝置23採手動進行繞著¥轴之 旋轉及Z軸方向之水平移動。而且,針對右區之資料,採手 動進行繞著Y軸之旋轉及z轴方向之水平移動。以該等手動 調整,於2個資料之對稱CER之中央區域,使2個資料移動 32 201015048 成重疊而合成,藉此即便於測定資料之一部分包含起因於 透鏡面上之廢物等之雜訊資料的情況下,仍可使得各中失 部分之資料重疊而進行高傾斜面之高精度測定。 進一步而言,為了更對齊中央部分之重疊’對稱性良 好地評估資料’以實施型態1或實施蜇態2之程序進行處 理,亦可以第23圖之輸出資料進行利用最小平方直線之移 動及合成。具體而言,於對於設計形狀之中央呈對稱形地 取得測定資料之對稱區CER中,對於2方向測定資料,亦即 對於左區之測定資料群DL及右區之測定資料群DR,進行以 下處理。 1) 於XZ面’藉由最小平方法,將各測定資料DL、DR 之中央部分進行直線近似(第23圖之符號L51,L52)。 2) 使得2條近似直線L51,L52分別與X轴重疊而算出繞 著γ軸之旋轉量(近似直線L51,L52對於X轴之傾斜)及Z轴 方向之移動量。 3) 以2)所算出之繞著γ軸之旋轉量及2軸方向之水平移 動量,將2個測定資料群DL、DR進行旋轉及水平移動,合 成測定資料群DL、DR。 藉由以上處理,即便是測定資料群DL、DR之一部分包 含起因於透鏡面上之廢物等之雜訊資料的情況,亦不進行 手動綱整,仍可餅各巾央部分之f料重—進行高傾斜 面之高精度測定。 (實施型態4) 於實施型態1或實施型態2,處理對於斜向設置之透鏡 33 201015048 Η,將探針Π)2往測定機以座標系統上之χ轴及γ轴方向, 亦即在ΧΥ面看來往十字方向掃描之測定結果。為了將透鏡 面作為面形狀來評估’藉由如第糊所示之—筆劃狀之面 上掃描路線,於探針102已對焦之狀態下,於透鏡^,將針 筆1〇1往ΧΥ方向連續掃描,獲得面上之測定資料群即可。 第24圖中,符號Α1表示透鏡狀有效區’符號μ表示測定 機11之探針102可追隨於表面形狀的區。 將該面上之測^資料群分離為χ軸上測m啊實線) 群、與其以外之外側資料群(虛線)之2群。然後,於實施型 參 態1或實施型態2,X軸上之測^ f料作為球上測^資料群 (實線)群,Y轴上之測定f料作為外側測定資料群(虛線)而 進行處理,藉此可作為面資料進行高傾斜面之高精度測定。 (實施型態5) - 為了執行實施型態1〜4之3次元形狀測定方法後驗證 - 測定機1之測定精度,宜使用如第25A、25B圖所示之主要 工作件31。該主要工作件31係具有於2轴呈旋轉對稱,χγ 方向之半徑為Rr,Ζ方向之半徑為Rz之橢圓形狀部31a,以 ® 超硬合金電鍍鎳之材質等所構成。 此時’橢圓形狀部31a係由以下設計式表示。首先,使 對稱軸垂直,亦即設置於Z轴方向時之設計式係如以下式 (5)。 〔數5〕The Αι item of the aspherical term is re-fitted so that the RMS value of the calibration measurement data set becomes the smallest speculative design shape. The calculated design parameters are calculated as the design shape 'in the implementation mode' or the execution type 2 program, and the conversion amount of the coordinates XYZAB in each state is calculated and stored. Thereafter, the design shape is restored to the original design shape, and the coordinate conversion and the probe R correction processing are sequentially performed in accordance with the coordinate conversion amount of the memory, and the three-dimensional shape data is displayed as the difference between the (four) group and the original design shape. As a result, coordinate conversion and detection correction can be performed with higher precision from the obliquely disposed state, and high-precision measurement of the high-inclined surface can be performed. In order to better align the overlap of the central part, the symmetry is well evaluated, and the processing of the type 1 or the implementation type 2 is performed, and the output of the 10th figure can be manually adjusted. Specifically, the output data of the first image is monitored by the display of the output device 22, and the data of the left region of the data for the two directions is manually controlled by the input device 23 to rotate around the axis and the Z axis. The horizontal movement of the direction. Moreover, for the data of the right area, the movement around the Y-axis and the horizontal movement in the z-axis direction are performed manually. With these manual adjustments, the two data movements 32 201015048 are superimposed and combined in the central region of the symmetric CER of the two data, so that even one part of the measurement data contains noise data due to waste on the lens surface. In the case of the high-inclination surface, it is possible to superimpose the data of each of the missing parts. Further, in order to more accurately align the central portion of the 'symmetric good evaluation data' to perform the process of the type 1 or the implementation of the state 2, the output of the 23rd figure can also be used to move using the least square line and synthesis. Specifically, in the symmetric region CER in which the measurement data is obtained symmetrically in the center of the design shape, the measurement data in the two directions, that is, the measurement data group DL in the left region and the measurement data group DR in the right region are performed as follows. deal with. 1) The central portion of each of the measurement data DL and DR is linearly approximated by the least square method on the XZ plane (symbols L51 and L52 in Fig. 23). 2) The two approximate straight lines L51 and L52 are superimposed on the X-axis to calculate the amount of rotation around the γ-axis (approximate straight line L51, the inclination of L52 with respect to the X-axis) and the amount of movement in the Z-axis direction. 3) The two measurement data groups DL and DR are rotated and horizontally moved by the amount of rotation around the γ-axis and the horizontal movement amount in the two-axis direction calculated by 2), and the measurement data groups DL and DR are synthesized. With the above processing, even if one of the measurement data groups DL and DR contains noise information due to waste on the lens surface, and no manual alignment is performed, the weight of the central portion of the cake can be High-precision measurement of high-inclined surfaces. (Implementation 4) In the implementation of the pattern 1 or the embodiment 2, the treatment is performed on the obliquely disposed lens 33 201015048 Η, and the probe Π) 2 is directed to the measuring machine as the χ axis and the γ axis direction on the coordinate system, That is, the measurement result of scanning in the cross direction in the face of the face. In order to evaluate the lens surface as a surface shape, the scanning path on the stroke-like surface as shown by the second paste, in the state where the probe 102 is in focus, in the lens ^, the stylus 1〇1 is turned to the ΧΥ direction Continuous scanning, the measurement data group on the surface can be obtained. In Fig. 24, the symbol Α1 indicates that the lenticular effective area' symbol μ indicates a region in which the probe 102 of the measuring machine 11 can follow the surface shape. The test data group on the surface is divided into two groups of the data group (dotted line) on the x-axis and the data group (dashed line) on the outer side. Then, in the implementation type 1 or the implementation type 2, the measurement on the X-axis is used as the data group (solid line) group on the sphere, and the measurement material on the Y-axis is used as the outer measurement data group (dashed line). By processing, it is possible to perform high-precision measurement of high-inclined surfaces as surface data. (Embodiment 5) - Verification to perform the three-dimensional shape measurement method of the embodiment 1 to 4 - The measurement accuracy of the measuring machine 1 is preferably the main working member 31 as shown in Figs. 25A and 25B. The main work piece 31 is formed of an elliptical portion 31a having a radius of χγ in the χ γ direction and a radius Rz in the Ζ direction, and is made of a material of a super hard alloy electroplated nickel. At this time, the elliptical shape portion 31a is represented by the following design formula. First, the design pattern in which the axis of symmetry is perpendicular, that is, in the Z-axis direction, is as shown in the following formula (5). [Number 5]

34 201015048 水平地設置XZ面時之設計式係如以下式(6)。 〔數6〕34 201015048 When designing the XZ plane horizontally, the design is as follows (6). [Number 6]

水平地設置YZ面時之設計式係如以下式(7) 〔數7〕The design formula when the YZ plane is horizontally set is as follows (7) [Number 7]

藉由具有橢圓形狀部31a’如第25A圖所示,可從Z軸上 方評估0度〜60度附近為止的形狀,確認形狀精度。其後’ 如第25B圖所示,繞著X軸旋轉90度,可從Z轴上方評估主 要工作件之0度〜60度附近為止的形狀,確認形狀精度。藉 由確認於各方向之主要工作件31之橢圓形狀部31a從設計 形狀之偏離容納於特定值以内’於對稱軸視作垂直方向之 情況下,可從上面以〇〜90°之角度進行測定機1之精度驗 證。 以上實施型態係以X軸作為基準之情況為例而進行說 明,但即使置換X座標與Y座標,且以Y轴作為基準,亦可 執行本發明之方法。 產業之可利用性 本發明之3次元形狀測定方法可高精度地測定超過以 往之3次元形狀測定機可測定之傾斜角之傾斜面,可適用於 對諸如使用於附相機之行動電話之透鏡、使用於BD等光碟 記憶裝置之拾取透鏡等透鏡面對於光轴之傾斜構成為高傾 35 201015048 斜透鏡形狀,高精度地進行3次元形狀測定之用途。 【圖式簡單說明3 第1圖係表示執行實施型態1之3次元形狀測定方法之3 次元形狀測定裝置之立體圖。 第2圖係表示透鏡(測定物)之治具之模式側面圖。 第3圖係表示實施型態1之3次元形狀測定方法之流程 圖。 第4圖係表示第3圖之步驟S3-15之詳細之流程圖。 第5圖係表示第4圖之步驟S4-4之詳細之流程圖。 第6圖係用以說明測定路線之模式立體圖。 第7A圖係表示座標轉換前之測定路線之模式側面圖。 第7B圖係表示座標轉換後之測定路線之模式側面圖。 第8圖係用以說明探針R修正之模式圖。 第9圖係用以說明C軸上之座標轉換之概念圖。 第10圖係表示實施型態1之測定結果之一例之圖。 第11圖係表示實施型態1之測定結果之另一例(測定資 料點數有非對稱性之情況)之圖。 第12圖係表示將測定資料點數有非對稱性時之實施型 態1之測定結果,擷取中央呈對稱之資料而予以校準之結果 之圖。 第13A圖係表示非球面量大時之測定資料群與設計形 狀之關係之模式圖。 第13B圖係表示非球面量為中等時之測定資料群與設 計形狀之關係之模式圖。 36 201015048 第13C圖係表示非球面量小之時之測定資料群與設計 形狀之關係之模式圖。 第14圖係表示實施型態2之3次元形狀測定方法之流程圖。 第15圖係表示第14圖之步驟S14-3之詳情之流程圖。 第16圖係表示第14圖之步驟S14-4之詳情之流程圖。 第17圖係表示第14圖之步驟S14-5之詳情之流程圖。 第18圖係表示第14圖之步驟S14-6之詳情之流程圖。 第19圖係表示實施型態2之測定結果之一例之圖。 第20圖係表示實施型態2之其他測定結果之圖。 第21圖係用以說明軸對稱非球面透鏡之設計式之模式 立體圖。 第22圖係表示實施型態3之使用最佳擬合R之測定結果 之一例之圖。 第23圖係用以說明實施型態3之使用最小平方法之疊 合之圖。 第24圖係表示實施型態4之面上掃描之模式俯視圖。 第25A圖係表示主要工作件(對稱軸設置於Z方向)之模 式側面圖。 第25B圖係表示主要工作件(水平地設置於XZ面)之模 式測定圖。 第26圖係用以說明3次元形狀測定裝置之探針單元之 一例之模式圖。 第27圖係用以說明以往的3次元形狀測定方法之一例 之概念圖。 37 201015048 第28圖係用以說明以往的3次元形狀測定方法之另一 例之概念圖。 第29圖係用以說明起因於繞著X軸之旋轉之測定誤差 之模式圖。 【主要元件符號說明】 1...3次元形狀測定機 19…定位銷 2...下部石製固定座 21...控制·運算裝置 3...X轴台 22…輸出裝置 4...Y轴台 23…輸入裝置 5...上部石製固定座 31...主要工作件 6...He-Ne 雷射 31a...橢圓球狀部 7...光學系統 100…探針單元 8…X軸鏡 101...針筆 9".Y軸鏡 102...探針 11…透鏡 103...微空氣滑件 12...治具 104....半導體雷射 13... Α軸測角台 105…鏡 14...XY 台 106···測定物 15...B轴測角台 107...針孑 L 16...錐形間隔件 108...誤差信號發生部 17...上部板 109…伺服電路 18...支持釣 110...線丨生馬達By having the elliptical portion 31a' as shown in Fig. 25A, the shape from 0 degrees to 60 degrees in the vicinity of the Z-axis can be evaluated, and the shape accuracy can be confirmed. Thereafter, as shown in Fig. 25B, the shape is rotated from the X-axis by 90 degrees, and the shape of the main workpiece from 0 to 60 degrees can be evaluated from above the Z-axis to confirm the shape accuracy. By confirming that the elliptical shape portion 31a of the main work piece 31 in each direction is accommodated within a specific value from the deviation of the design shape, and the symmetry axis is regarded as the vertical direction, the measurement can be performed from the above at an angle of 〇~90°. Accuracy verification of machine 1. The above embodiment is described by taking the X-axis as a reference. However, the method of the present invention can be carried out even if the X coordinate and the Y coordinate are replaced and the Y axis is used as a reference. INDUSTRIAL APPLICABILITY The three-dimensional shape measuring method of the present invention can accurately measure an inclined surface which is larger than a tilt angle which can be measured by a conventional three-dimensional shape measuring machine, and is applicable to a lens such as a mobile phone used in a camera. The lens surface used for a pickup lens such as a BD or the like has a high tilt 35 201015048 oblique lens shape for tilting the optical axis, and is used for high-precision three-dimensional shape measurement. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view showing a three-dimensional shape measuring apparatus for performing a three-dimensional shape measuring method of the first embodiment. Fig. 2 is a schematic side view showing a jig of a lens (measured object). Fig. 3 is a flow chart showing the method for measuring the shape of the third dimension of the embodiment 1. Fig. 4 is a flow chart showing the details of the step S3-15 of Fig. 3. Fig. 5 is a flow chart showing the details of the step S4-4 of Fig. 4. Figure 6 is a perspective view showing the mode of the measurement route. Fig. 7A is a schematic side view showing the measurement route before the coordinate conversion. Fig. 7B is a schematic side view showing the measurement route after the coordinate conversion. Figure 8 is a schematic diagram for explaining the correction of the probe R. Figure 9 is a conceptual diagram for explaining the coordinate conversion on the C-axis. Fig. 10 is a view showing an example of the measurement result of the embodiment 1. Fig. 11 is a view showing another example of the measurement result of the embodiment 1 (when the measurement data points have asymmetry). Fig. 12 is a view showing the results of the measurement of the embodiment 1 when the number of measured data points is asymmetrical, and the result of calibrating the data in the center with symmetry. Fig. 13A is a schematic view showing the relationship between the measured data group and the design shape when the aspheric amount is large. Fig. 13B is a schematic view showing the relationship between the measurement data group and the design shape when the aspheric amount is medium. 36 201015048 Fig. 13C is a schematic diagram showing the relationship between the measured data group and the design shape when the aspheric amount is small. Fig. 14 is a flow chart showing the method of measuring the three-dimensional shape of the embodiment 2. Fig. 15 is a flow chart showing the details of the step S14-3 of Fig. 14. Fig. 16 is a flow chart showing the details of the step S14-4 of Fig. 14. Fig. 17 is a flow chart showing the details of the step S14-5 of Fig. 14. Figure 18 is a flow chart showing the details of step S14-6 of Figure 14. Fig. 19 is a view showing an example of the measurement results of the embodiment 2. Fig. 20 is a view showing other measurement results of the embodiment 2. Fig. 21 is a perspective view showing a mode of design of an axisymmetric aspherical lens. Fig. 22 is a view showing an example of the measurement result of the best-fit R using the embodiment 3. Fig. 23 is a view for explaining the superposition of the least squares method of the embodiment 3. Fig. 24 is a plan view showing the mode of scanning on the surface of the embodiment 4. Fig. 25A is a schematic side view showing the main work piece (the symmetry axis is set in the Z direction). Fig. 25B is a view showing the pattern measurement of the main work piece (horizontally set on the XZ plane). Fig. 26 is a schematic view for explaining an example of a probe unit of a three-dimensional shape measuring device. Fig. 27 is a conceptual diagram for explaining an example of a conventional three-dimensional shape measuring method. 37 201015048 Fig. 28 is a conceptual diagram for explaining another example of the conventional three-dimensional shape measuring method. Figure 29 is a schematic view for explaining measurement errors resulting from rotation about the X-axis. [Description of main component symbols] 1...3 dimensional shape measuring machine 19... positioning pin 2... lower stone fixing seat 21... control/computing device 3...X-axis table 22...output device 4.. .Y-axis table 23...Input device 5...Upper stone mount 31...Main work piece 6...He-Ne Laser 31a...Oval spheroid 7...Optical system 100... Needle unit 8...X-axis mirror 101...needle pen 9".Y-axis mirror 102...probe 11...lens 103...micro air slider 12...judge 104....semiconductor laser 13... Α axis angle measuring table 105... mirror 14...XY stage 106···measuring object 15...B-axis horn table 107...needle 16L 16...conical spacer 108. .. error signal generating portion 17 ... upper plate 109 ... servo circuit 18 ... support fishing 110 ... line twin motor

3838

201015048 200¾ 200b, 200c...測定資料 200d…合成後之資料 301a...中央部 301b, 301c...部分 302…設計光軸 401a...實線 401b...虛線 S3-1 〜S3-15··.步驟 54- 1〜S4-6…步驟 55- 1〜S5-9…步驟 514- 1-S14-9...步驟 515- 1〜S15-12…步驟 516- 1 〜S16^12·.·步驟 517- 1 〜S17-8·.·步驟 518- 1 〜S18-10...步驟201015048 2003⁄4 200b, 200c...Measurement data 200d...Synthesized data 301a...Central portion 301b, 301c...Part 302...Design optical axis 401a...Solid line 401b...Dash line S3-1 ~S3 -15··.Steps 54-1 to S4-6...Steps 55-1 to S5-9...Steps 514- 1-S14-9...Steps 515- 1 to S15-12...Steps 516- 1 to S16^ 12···Steps 517- 1 to S17-8·.·Steps 518- 1 to S18-10...Steps

3939

Claims (1)

201015048 七、申請專利範圍: 1. 一種3次元形狀測定方法,係將測定物設定為繞著Y軸傾 斜設置之第1設置狀態, 使前述測定物以前述測定物之設計座標系統之Z軸 為中心,以90度之2以下的自然數倍之角度增量旋轉1次 以上,而從前述第1設置狀態設定為1個以上之第2設置 狀態, 針對前述各個第1及第2設置狀態,於通過前述測定 物之設計上的頂點座標之X軸方向之直線上,測定前述 測定物表面之X軸、Y軸及Z軸之座標,取得第1測定資 料群,並且於通過前述測定物之設置上的頂點座標之Y 軸方向之直線上,測定前述測定物表面之X軸、Y軸及Z 軸之座標,取得第2測定資料群, 針對前述各個第1及第2設置狀態,使用前述第1及 第2測定資料群算出與前述設計形狀的差, 合成在前述第1及第2設置狀態下與前述設計形狀 的差。 2. 如申請專利範圍第1項之3次元形狀測定方法,其中前述 角度增量為180度,前述第2設置狀態為1個。 3. 如申請專利範圍第1項之3次元形狀測定方法,其中前述 角度增量為90,前述第2設置狀態有3個。 4. 如申請專利範圍第1至3項中任一項之3次元形狀測定方 法,其中使用前述第1及第2測定資料群算出與前述設計 形狀的差 40 201015048 係執行預備座標轉換,使前述第1及第2測定資料群 因應前述繞著Y軸之傾斜而旋轉及並進移動,予以座標 轉換為未有前述繞著Y軸之傾斜時的前述測定物之前述 設計座標系統* 並執行校準,將已進行前述預備座標轉換之前述第 1及第2測定資料群予以座標轉換,以使其擬合於前述測 定物之設計形狀, 算出已進行前述校準之第1測定資料群與前述測定 物之前述設計形狀的差。 5.如申請專利範圍第1項之3次元形狀測定方法,其中使用 前述第1及第2測定資料群算出與前述設計形狀的差 係執行預備座標轉換,使前述第1及第2測定資料群 因應前述繞著Υ軸之傾斜而旋轉及並進移動,予以座標 轉換為未有前述繞著Υ韩之傾斜時之前述測定物的前述 設計座標系統* _ 針對X軸、Υ軸、Ζ軸、Α軸及Β軸,算出使已’進行 前述預備座標轉換之前述第1及第2測定資料群,擬合於 前述測定物之設計形狀之第1校準量, 從前述X軸、Y軸、Z軸、A軸及B軸之第1校準量中, 選擇任2個或3個作為固定校準量, 執行第1座標轉換,以前述固定校準量,將已進行 前述預備座標轉換之前述第1測定資料群予以座標轉 換, 針對前述X軸、Y軸、Z軸、A軸及B軸中之前述固 41 201015048 定校準量以外的軸,算出第2校準量,使已進行前述第1 座標轉換之前述第1測定資料群擬合於前述測定物之設 計形狀之, 執行第2校準,以前述固定校準量及前述第2校準 量,將已進行前述預備座標轉換之前述第1測定資料群 予以座標轉換, 算出已進行前述第2校準之第1測定資料群與前述 測定物之前述設計形狀的差。 6. 如申請專利範圍第4項之3次元形狀測定方法,其中用以 進行前述預備座標轉換之設計形狀係已因應實際測定 物之形狀而轉換設計參數者。 7. 如申請專利範圍第1項之3次元形狀測定方法,其中在前 述第1及第2設置狀態下與前述設計形狀之差的合成,係 包含採手動調整在前述第1及第2設置狀態下與前述設 計形狀之差的重疊。 8. 如申請專利範圍第1項之3次元形狀測定方法,其中在前 述第1及第2設置狀態下與前述設計形狀之差的合成係包 含: 針對在前述第1及第2設置狀態下與前述設計形狀 的差,分別藉由最小平方法求出近似直線, 將在前述第1及第2設置狀態下與前述設計形狀的 差予以座標轉換,以使得前述第1及第2設置狀態之前述 近似直線重疊。 9. 如申請專利範圍第1項之3次元形狀測定方法,其中使用 42 201015048 面上測定資料取代前述第2測定資料群。 ί201015048 VII. Patent application scope: 1. A method for measuring a three-dimensional shape, wherein the measurement object is set to a first installation state which is inclined around the Y-axis, and the Z-axis of the design object of the measurement object is The center is rotated by one or more times in a natural multiple of 90 degrees or less, and the first setting state is set to one or more second setting states, and for each of the first and second setting states, The coordinates of the X-axis, the Y-axis, and the Z-axis of the surface of the measurement object are measured on a straight line passing through the X-axis direction of the vertex coordinates of the design of the measurement object, and the first measurement data group is obtained and passed through the measurement object. The coordinates of the X-axis, the Y-axis, and the Z-axis of the surface of the measurement object are measured on a straight line in the Y-axis direction of the upper vertex coordinates, and the second measurement data group is obtained, and the first and second installation states are used. The first and second measurement data groups calculate a difference from the design shape, and the difference between the first and second installation states and the design shape is combined. 2. The method of measuring a three-dimensional shape according to the first aspect of the patent application, wherein the angle increment is 180 degrees, and the second setting state is one. 3. The third dimension shape measuring method according to the first aspect of the patent application, wherein the angle increment is 90, and the second setting state is three. 4. The method for measuring a three-dimensional shape according to any one of claims 1 to 3, wherein the first and second measurement data sets are used to calculate a difference from the design shape 40 201015048, and the preliminary coordinate conversion is performed, and the aforementioned The first and second measurement data groups are rotated and moved in parallel with the tilt around the Y-axis, and the coordinates are converted into the design coordinate system* of the measurement object when the tilt around the Y-axis is not performed, and calibration is performed. Converting the first and second measurement data groups that have been subjected to the preliminary coordinate conversion to coordinates, and fitting the shape of the measurement object to the design shape of the measurement object, and calculating the first measurement data group and the measurement object that have been subjected to the calibration. The difference in the aforementioned design shape. 5. The third dimension shape measuring method according to claim 1, wherein the first and second measurement data groups are calculated by using the first and second measurement data groups to calculate a difference from the design shape, and the first and second measurement data groups are generated. In response to the above-described rotation about the yaw axis and the parallel movement, the coordinates are converted into the aforementioned design coordinate system * _ for the X-axis, the Υ-axis, the Ζ-axis, and the 未 without the aforementioned measurement of the inclination around the Υ The first and second measurement data groups that have been subjected to the preparatory coordinate conversion, and the first calibration amount fitted to the design shape of the measurement object, from the X-axis, the Y-axis, and the Z-axis In the first calibration amount of the A-axis and the B-axis, two or three are selected as the fixed calibration amount, and the first coordinate conversion is performed, and the first measurement data on which the preliminary coordinate conversion has been performed is performed with the fixed calibration amount. The group is coordinate-converted, and the second calibration amount is calculated for the axis other than the calibration amount of the solid axis 41 201015048 among the X-axis, the Y-axis, the Z-axis, the A-axis, and the B-axis, and the first coordinate conversion is performed. First measurement When the group is fitted to the design shape of the measurement object, the second calibration is performed, and the first measurement data group subjected to the preliminary coordinate conversion is coordinate-converted by the fixed calibration amount and the second calibration amount, and the calculation is performed. The difference between the first measurement data group of the second calibration and the design shape of the measurement object. 6. The third dimension shape measuring method according to item 4 of the patent application, wherein the design shape for performing the preliminary coordinate conversion has been converted into design parameters in accordance with the shape of the actual measuring object. 7. The third dimension shape measuring method according to claim 1, wherein the combination of the difference between the first and second installation states and the design shape includes manual adjustment in the first and second setting states. The overlap with the difference between the aforementioned design shapes. 8. The method for measuring a three-dimensional shape according to the first aspect of the patent application, wherein the combination of the difference between the first and second installation states and the design shape includes: for the first and second setting states; The difference between the design shapes is obtained by the least square method, and the difference between the first and second installation states and the design shape is coordinate-converted so that the first and second installation states are the same. Approximate straight lines overlap. 9. For the method of measuring the 3 dimensional shape of the first item of the patent application, the surface measurement data is replaced by the 42 201015048 surface measurement data. ί φ 43Φ 43
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