201000873 九、發明說明： 【發明所屬之技術領域】 本發明係關於一種偏光膜檢驗方法，以及應用此偏光 膜檢驗方法之偏光膜檢驗裝置；具體而言，本發明係關 於種廣視角偏光膜檢驗方法，以及應用此偏光膜檢驗 方法之偏光膜檢驗裝置。 【先前技術】 偏光膜是影響液晶顯示器包含對比、可視角、色彩飽 和度、暗態、色偏等顯示效果的重要因素之一。其中， 廣視角偏細對於液晶顯示ϋ可姻之增加更具有關鍵 性的影響。 不同分類或產品型號之廣視角偏光膜具有不同之可201000873 IX. The invention relates to a polarizing film inspection method, and a polarizing film inspection device using the polarizing film inspection method; in particular, the invention relates to a wide viewing angle polarizing film inspection A method, and a polarizing film inspection apparatus using the polarizing film inspection method. [Prior Art] The polarizing film is one of the important factors affecting the display effect of the liquid crystal display including contrast, viewing angle, color saturation, dark state, and color shift. Among them, the wide viewing angle is more critical for the increase of liquid crystal display. Wide viewing angle polarizing films of different classifications or product models have different
視角增加效杲，然而其成品在外觀上分辨不^。習知廣 視角偏細之檢驗轉，是職則偏細之成品以数 水浸泡，待與三醋酸纖維（W-acetyl cellulose，TAC) 保護層分離後，再以光學儀器量測其面内延遲⑴—細e retardation，Re)以及面外延遲 Uut-〇f-plane retardation, Rth)值，以進一步分辨。 201000873 【發明内容】 本卷明之主要目的在於提供—種偏光膜檢驗方法，可 較間便地分辨偏光膜之種類。 本發明之卩—轉目的在於提供-觀光膜檢驗装 置，供較簡便地分辨偏光膜之種類。 本發明之偏細檢财法步貌含：以絲照射偏光 膜’使偏細於平行光線方向具有傾斜夾肖；使偏光膜 於垂直光線方向具有旋轉夾角；獲得通過偏光膜之光線 之橢圓率值；以及根據橢圓率值產生檢驗結果。 光線之波長係介於38Qnm至78〇nm。偏光膜包含廣視 角膜。傾斜夾角之角度係介於0至180。。旋轉夹角之角 度係介於0至360。。檢驗結果包含將偏光膜區分為第一 分類與第二分類。當光線之波長為543nm、傾斜夾角之角 度為50°以及旋轉夾角之角度為15。，而偏光膜之橢圓率 值分別為介於〇. 32至〇. 36以及介於〇· 38至0· 42時， 檢驗結果將偏光膜區分為第一分類與第二分類。 本發明之偏光膜檢驗裝置包含光源、夾具以及量測裝 置。光源可發出光線照射偏光膜。夾具以可夾持偏光膜 之方式設置，使偏光膜於平行光線方向具有傾斜夾角， 且於垂直光線方向具有旋轉夾角。量測裝置設置於失具 相對於光源之另一側，供量測通過偏光膜之光線之橢圓 率。 201000873 【實施方式】 +本發明係提供—種偏細檢驗方法，以及剌此偏光 膜才双<1^方法之偏光膜檢驗裝置。 如圖1所示之較佳實施例，本發明之偏光膜檢驗裝置 800包含光源1〇〇、夾具3〇〇以及量測裝置5〇〇。光源1〇〇 可發出光線200照射偏光膜7〇〇。在此較佳實施例中，光 源100係為雷射，且發出之光線2〇〇之波長較佳係介於 380nm至780mn。然而在不同實施例中，光源1〇〇可以為 雷射以外光源，且光線200可以為任意選定之波長之光 線。 在此較佳實施例中，偏光膜700包含廣視角膜。夾具. 300以可夾持偏光膜7QQ之方式設置，使偏光膜7卯於平 行光線200方向具有傾斜夾角r，且於垂直光線2〇〇方 向具有旋轉夹角0。其中，傾斜央角之角度係介於〇至 180°。旋轉夾角0之角度係介於0至36〇。。具體而言， 在此較佳實施例中，係以偏光膜7〇〇吸收軸45。作為旋轉 夾角0之起始點。夾具300較佳係如圖2所示由夹持部 301、傾斜控制部302、旋轉控制部303及座體3Q4構成。 偏光膜700係由夾持部301固定’傾斜控制部302可使 夾持部301沿傾斜方向401傾斜，旋轉控制部可使 夾持部301沿旋轉方向402旋轉。藉此，可控制偏光膜 700之傾斜夹角τ以及旋轉夹角β。 8 201000873 如圖1所示之較佳實施例，量測裝置500設置於失具 300相對於光源1〇〇之另一側，供量測通過偏光膜7〇〇 之光線之橢圓率。具體而言，在此較佳實施例中，量測 裝置500係為橢圓率量測儀，光源100發出之光線2〇〇 在通過偏光膜700後，由量測裝置500量測其橢圓率。 進一步說明本發明之偏光膜檢驗方法之實施步驟。如 圖3所示本發明實施例流程圖，步驟3001包含如圖1所 示以光線200照射偏光膜700。光線200之波長較佳係介 於380nm至780nm。在此較佳實施例中，進一步使用波長 為543nm之光線200。 如圖3所示，步驟3003包含如圖1所示使偏光膜700 於平行光線200方向具有傾斜爽角7。傾斜爽角之角度 係介於0至180°。步驟3005包含如圖1所示使偏光膜 700於垂直光線200方向具有旋轉夾角0。旋轉夾角0之 角度係介於0至360°。具體而言，在此較佳實施例中， 使用者係調整夾具300可自由向任一方向撓曲之撓曲部 303，使受檢驗之偏光膜700達到預定傾斜夾角γ以及旋 轉夾角(9。其中’旋轉夾角0之起始點係為偏光膜700 吸收軸45 °。另一方面’步驟3003及步驟3005之先後次 序可任意交換，不影響本發明之實施結果。 如圖3所示，步驟3007包含如圖1所示獲得通過偏 光膜700之光線200之橢圓率值。具體而言，係使用如 圖1所示之量測裝置500量測通過偏光膜7〇〇之光線2〇〇 9 201000873 之橢圓率值。 如圖3所不，步驟3009包含根據橢圓率值產生檢驗 結果。檢驗結果包含將偏光膜區分為第一分類與第二分 類。 以543nm波長之光線、5〇。之傾斜夾角並改變旋轉夾 角所传之橢圓率值圖譜如圖4所示。在此較佳實施例中， 當旋轉夾角之角度為15。，不同偏光膜700之橢圓率值有 較大差異。具體而言’在此較佳實施例中，當偏光膜7〇〇 之擴圓率值分別為介於G. 32至（U6以及介於G. 38至 〇. 42時，檢驗結果將偏光膜700區分為第一分類601與 第一分類602。其中，偏光膜7〇〇係為廣視角膜’第一分 類601及第二分類602係為EWV及SWY之類別之廣視角 膜。 以633nm波長之光線、5〇。之傾斜夾角並改變旋轉夾 角所得之橢圓率值圖譜如圖5所示。在此不同實施例中， 當旋轉夾角之角度為1〇。，不同偏光膜7〇〇之橢圓率值有 較大差異。具體而言，在此較佳實施例中，當偏光膜700 之擴圓率值分別為介於0.31至0.33以及介於0.34至 〇 37時’檢驗結果將偏光膜7〇〇區分為第一分類6〇1與 第二分類602。其中，偏光膜700係為廣視角膜，第一分 類6〇1及第二分類602係為EWV及swv之類別之廣視角 膜。 本發明已由上述相關實施例加以描述，然而上述實施 201000873 例僅為實施本發明之範例。必需指出的是，已揭露之實 施例並未限制本發明之範圍。相反地，包含於申請專利 範圍之精神及範圍之修改及均等設置均包含於本發明之 範圍内。 【圖式簡單說明】 圖1為本發明之偏光膜檢驗裝置之較佳實施例示意圖； 圖2為本發明之夾具之實施例示意圖； 圖3為本發明之偏光膜檢驗方法實施例流程圖； 圖4為本發明較佳實施例之橢圓率圖譜； 圖5為本發明不同實施例之糖圓率圖譜； 【主要元件符號說明】 100光源 200光線 300夾具 302傾斜控制部 305座體 601第一分類 700偏光膜 301夾持部 303旋轉控制部 500量測裝置 602第二分類 800偏光瞑撿驗裝置 11The viewing angle is more effective, but the finished product does not distinguish in appearance. The inspection of the wide angle of view is fine, and the finished product is soaked in several waters. After being separated from the protective layer of W-acetyl cellulose (TAC), the in-plane retardation is measured by optical instruments (1)— Fine e retardation, Re) and out-of-plane retardation Uut-〇f-plane retardation, Rth) values for further resolution. 201000873 [Description of the Invention] The main purpose of the present invention is to provide a method for detecting a polarizing film, which can distinguish the type of the polarizing film more easily. The object of the present invention is to provide a photographic film inspection device for relatively easy identification of the type of polarizing film. The method of the fine inspection method of the invention comprises: irradiating the polarizing film with silk to make the polarizing film have a tilting angle in the direction of the parallel light; the polarizing film has a rotating angle in the vertical light direction; and obtaining the ellipticity of the light passing through the polarizing film The value; and the test result is generated based on the ellipticity value. The wavelength of the light is between 38Qnm and 78〇nm. The polarizing film contains a wide-angle cornea. The angle of the angle of inclination is between 0 and 180. . The angle of the angle of rotation is between 0 and 360. . The test results include the division of the polarizing film into a first classification and a second classification. When the wavelength of the light is 543 nm, the angle of the oblique angle is 50°, and the angle of the angle of rotation is 15. When the ellipticity values of the polarizing film are between 〇. 32 and 〇. 36 and between 〇·38 and 0·42, the test results distinguish the polarizing film into the first classification and the second classification. The polarizing film inspection apparatus of the present invention comprises a light source, a jig, and a measuring device. The light source emits light to illuminate the polarizing film. The jig is disposed so as to be capable of holding the polarizing film, so that the polarizing film has a slanting angle in the direction of the parallel ray and has a rotating angle in the direction of the vertical ray. The measuring device is disposed on the other side of the lost light relative to the light source for measuring the ellipticity of the light passing through the polarizing film. 201000873 [Embodiment] The present invention provides a method for measuring the partial thickness and a polarizing film inspection device of the polarizing film. As shown in the preferred embodiment of Fig. 1, the polarizing film inspection apparatus 800 of the present invention comprises a light source 1A, a clamp 3A, and a measuring device 5A. The light source 1 〇〇 emits light 200 to illuminate the polarizing film 7〇〇. In the preferred embodiment, the source 100 is a laser and the wavelength of the emitted light is preferably between 380 nm and 780 nm. In various embodiments, however, source 1 〇〇 can be a source other than a laser, and ray 200 can be any selected wavelength of light. In the preferred embodiment, the polarizing film 700 comprises a wide viewing angle film. The jig 300 is disposed so as to be able to hold the polarizing film 7QQ so that the polarizing film 7 has a tilt angle r in the direction of the parallel light 200 and has a rotating angle 0 in the direction of the vertical light. Among them, the angle of the inclined central angle is between 〇 and 180°. The angle of rotation angle 0 is between 0 and 36 inches. . Specifically, in the preferred embodiment, the axis 45 is absorbed by the polarizing film 7〇〇. As the starting point of the rotation angle 0. The jig 300 is preferably composed of a holding portion 301, a tilt control portion 302, a rotation control portion 303, and a base 3Q4 as shown in Fig. 2 . The polarizing film 700 is fixed by the nip portion 301. The tilt control unit 302 tilts the nip portion 301 in the oblique direction 401, and the rotation control portion can rotate the nip portion 301 in the rotational direction 402. Thereby, the inclination angle τ of the polarizing film 700 and the rotation angle β can be controlled. 8 201000873 In the preferred embodiment shown in FIG. 1, the measuring device 500 is disposed on the other side of the trip 300 relative to the light source 1 for measuring the ellipticity of the light passing through the polarizing film 7〇〇. Specifically, in the preferred embodiment, the measuring device 500 is an ellipticity measuring instrument, and the light emitted by the light source 100 is measured by the measuring device 500 after passing through the polarizing film 700. The implementation steps of the polarizing film inspection method of the present invention are further explained. As shown in FIG. 3, a flow chart of an embodiment of the present invention, step 3001 includes irradiating the polarizing film 700 with light 200 as shown in FIG. The wavelength of the light 200 is preferably between 380 nm and 780 nm. In the preferred embodiment, light 200 having a wavelength of 543 nm is further used. As shown in FIG. 3, step 3003 includes causing the polarizing film 700 to have a tilt angle 7 in the direction of the parallel light 200 as shown in FIG. The angle of the tilt angle is between 0 and 180 degrees. Step 3005 includes having the polarizing film 700 have a rotational angle of 0 in the direction of the vertical ray 200 as shown in FIG. The angle of rotation angle 0 is between 0 and 360°. Specifically, in the preferred embodiment, the user adjusts the flexure 303 to be flexed in either direction, so that the examined polarizing film 700 reaches a predetermined angle of inclination γ and an angle of rotation (9). The starting point of the 'rotation angle 0 is the absorption axis 45 of the polarizing film 700. On the other hand, the order of the steps 3003 and 3005 can be exchanged arbitrarily without affecting the implementation result of the present invention. As shown in FIG. 3, the steps are as shown in FIG. 3007 includes the ellipticity value of the light 200 passing through the polarizing film 700 as shown in Fig. 1. Specifically, the light passing through the polarizing film 7 is measured using the measuring device 500 shown in Fig. 1 The ellipticity value of 201000873. As shown in Fig. 3, step 3009 includes generating a test result according to the ellipticity value. The test result includes dividing the polarizing film into the first classification and the second classification. The light with a wavelength of 543 nm, 5 〇. The ellipticity value map transmitted by the angle and changing the angle of rotation is shown in Fig. 4. In the preferred embodiment, when the angle of the rotation angle is 15, the ellipticity values of the different polarizing films 700 are greatly different.言 'here In a preferred embodiment, when the circularization rate values of the polarizing film 7 are respectively between G. 32 and (U6 and between G. 38 and 〇. 42, the test result distinguishes the polarizing film 700 into the first classification 601. And the first classification 602. The polarizing film 7 is a wide viewing angle film 'the first classification 601 and the second classification 602 is a wide viewing angle film of the EWV and SWY type. The light with a wavelength of 633 nm, 5 〇. The ellipticity value map obtained by tilting the angle and changing the angle of rotation is shown in Fig. 5. In the different embodiments, when the angle of the rotation angle is 1 〇, the ellipticity values of the different polarizing films 7 有 are largely different. Specifically, in the preferred embodiment, when the rounding rate values of the polarizing film 700 are between 0.31 and 0.33 and between 0.34 and 〇37, respectively, the test result distinguishes the polarizing film 7〇〇 into the first classification. 6〇1 and a second classification 602. The polarizing film 700 is a wide viewing angle film, and the first classification 6〇1 and the second classification 602 are wide viewing angle films of the EWV and swv categories. The present invention has been implemented by the above related The examples are described, however, the above-described implementation of 201000873 is merely an example for implementing the present invention. It is to be noted that the disclosed embodiments are not intended to limit the scope of the invention. The modifications and equivalents of the spirit and scope of the invention are included in the scope of the invention. 1 is a schematic view of a preferred embodiment of a polarizing film inspection device of the present invention; FIG. 2 is a schematic view of an embodiment of a jig of the present invention; FIG. 3 is a flow chart of an embodiment of a method for inspecting a polarizing film of the present invention; Ellipsity rate map of the embodiment; FIG. 5 is a sugar circle rate map of different embodiments of the present invention; [Description of main component symbols] 100 light source 200 light 300 jig 302 tilt control portion 305 seat body 601 first classification 700 polarizing film 301 clamping Part 303 rotation control unit 500 measuring device 602 second classification 800 polarized light detecting device 11