JP2020160421A - Inspection method and inspection apparatus - Google Patents

Inspection method and inspection apparatus Download PDF

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JP2020160421A
JP2020160421A JP2019132175A JP2019132175A JP2020160421A JP 2020160421 A JP2020160421 A JP 2020160421A JP 2019132175 A JP2019132175 A JP 2019132175A JP 2019132175 A JP2019132175 A JP 2019132175A JP 2020160421 A JP2020160421 A JP 2020160421A
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retardation
plate
release film
inspected
film
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JP7455527B2 (en
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信次 小林
Shinji Kobayashi
信次 小林
隆昭 宮路
Takaaki Miyaji
隆昭 宮路
松田 俊介
Shunsuke Matsuda
俊介 松田
弘也 中川
Hiroya Nakagawa
弘也 中川
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Sumitomo Chemical Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278Detecting defects of the object to be tested, e.g. scratches or dust
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08JWORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
    • C08J5/00Manufacture of articles or shaped materials containing macromolecular substances
    • C08J5/18Manufacture of films or sheets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0271Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3025Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00Optical elements other than lenses
    • G02B5/30Polarising elements
    • G02B5/3083Birefringent or phase retarding elements

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Abstract

To provide: an inspection method capable of easily determining the presence or absence of a defect in a circular polarizing plate; and an inspection apparatus.SOLUTION: In an inspection method, a film-like inspection object 10 comprising a circular polarizing plate 1 and a release film 16a made of a polyethylene terephthalate-based resin, a phase difference plate 4, and a phase difference filter 3 composing a cross Nicol with the circular polarizing plate 1 are disposed so as to be arranged in this order, light is made incident from one of the inspection object 10 side and the phase difference filter 3 side, and the presence or absence of a defect in the circular polarizing plate 1 is determined when observed from the other side. In the inspection, a first phase difference plate and a second phase difference plate with an in-plane phase difference different from that of the first phase difference plate are used in this order as the phase difference plate 4.SELECTED DRAWING: Figure 1

Description

本発明は、検査方法及び検査装置に関する。 The present invention relates to an inspection method and an inspection apparatus.

液晶表示装置や有機EL表示装置等に用いられる偏光板は、一般的に偏光子が2枚の保護フィルムに挟まれて構成されている。偏光板を表示装置に貼り付けるため、片方の保護フィルムには粘着剤層が積層され、更に粘着剤層に剥離フィルムが積層される。また、他方の保護フィルムにもその表面を保護する剥離フィルムが貼合される場合が多い。偏光板はこのように剥離フィルムが積層された状態で流通搬送され、表示装置の製造工程で表示装置に貼合する際に剥離フィルムが剥離される。 A polarizing plate used in a liquid crystal display device, an organic EL display device, or the like is generally composed of a polarizing element sandwiched between two protective films. In order to attach the polarizing plate to the display device, an adhesive layer is laminated on one of the protective films, and a release film is further laminated on the adhesive layer. In addition, a release film that protects the surface of the other protective film is often attached. The polarizing plate is distributed and transported in a state where the release films are laminated in this way, and the release film is peeled off when the polarizing plate is attached to the display device in the manufacturing process of the display device.

ところで、偏光板はその製造段階において、偏光子と保護フィルムとの間に異物が混入したり、気泡が残ったり、あるいは、保護フィルムが位相差フィルムの機能を持つ場合には配向欠陥が内在していることがある(以下、これらの異物、気泡及び配向欠陥をまとめて、「欠陥」ということがある)。欠陥が存在する偏光板を表示装置に貼合した場合、その欠陥の箇所が輝点として視認されたり、欠陥の箇所で画像がゆがんで見えたりすることがある。特に、輝点として視認される欠陥は、当該表示装置の黒表示時に視認されやすい。 By the way, in the manufacturing stage of the polarizing plate, if foreign matter is mixed between the polarizing element and the protective film, bubbles remain, or if the protective film has the function of a retardation film, an orientation defect is inherent. (Hereinafter, these foreign substances, bubbles and orientation defects are collectively referred to as "defects"). When a polarizing plate having a defect is attached to a display device, the defective portion may be visually recognized as a bright spot, or the image may appear distorted at the defective portion. In particular, defects that are visually recognized as bright spots are easily visible when the display device displays black.

そこで、偏光板を表示装置に貼合する前段階(剥離フィルムを備えた状態の偏光板)で、この偏光板の欠陥を検出するための検査が行われる。この欠陥の検査は、一般的には偏光板の偏光軸を利用した光検査である。具体的には、特許文献1に示されているように、被検査物である偏光板と光源との間に偏光フィルタを設けたうえで、この偏光板又は偏光フィルタを平面方向に回転させ、これらのそれぞれの偏光軸方向を特定の関係とする。偏光軸方向同士が互いに直交する場合(すなわちクロスニコルを構成する配置の場合)、偏光フィルタを通過した直線偏光は、偏光板を通過しない。しかしながら、偏光板に欠陥が存在すると、当該箇所では直線偏光が透過してしまうので、その光が検出されることで欠陥の存在が判明する。一方、偏光板と偏光フィルタとの偏光軸方向同士が平行である場合、偏光フィルタを通過した直線偏光は偏光板を透過する。しかしながら、偏光板に欠陥が存在すると、当該箇所では直線偏光が遮断されるので、その光が検出されないことで欠陥の存在が判明する。偏光板を透過してきた光を検査者が目視により検出するか、あるいはCCDカメラと画像処理装置とを組み合わせた画像解析処理値により自動的に検出することで、偏光板の欠陥の有無の検査を行うことができる。 Therefore, an inspection for detecting defects in the polarizing plate is performed before the polarizing plate is attached to the display device (the polarizing plate with the release film provided). The inspection of this defect is generally an optical inspection using the polarization axis of the polarizing plate. Specifically, as shown in Patent Document 1, a polarizing filter is provided between the polarizing plate to be inspected and the light source, and then the polarizing plate or the polarizing filter is rotated in the plane direction. Each of these polarization axis directions has a specific relationship. When the polarization axis directions are orthogonal to each other (that is, in the case of the arrangement forming the cross Nicol), the linearly polarized light that has passed through the polarizing filter does not pass through the polarizing plate. However, if a defect is present in the polarizing plate, linearly polarized light is transmitted at the portion, and the presence of the defect can be determined by detecting the light. On the other hand, when the polarizing plate and the polarizing filter are parallel to each other in the polarization axis direction, the linearly polarized light that has passed through the polarizing filter passes through the polarizing plate. However, if a defect is present in the polarizing plate, linearly polarized light is blocked at that portion, and the presence of the defect can be determined by not detecting the light. The inspector visually detects the light transmitted through the polarizing plate, or automatically detects it by the image analysis processing value obtained by combining the CCD camera and the image processing device to inspect the polarizing plate for defects. It can be carried out.

特開平9−229817号公報Japanese Unexamined Patent Publication No. 9-229817

しかしながら、上述したように偏光板に剥離フィルムを備える場合は、この剥離フィルムが有する複屈折により偏光板の偏光特性が阻害されるため、従来の検査装置では偏光板に存在する輝点等の欠陥を精度よく検出することができなかった。 However, when the polarizing plate is provided with a release film as described above, the polarization characteristics of the polarizing plate are impaired by the birefringence of the release film, so that defects such as bright spots existing in the polarizing plate in the conventional inspection apparatus are present. Could not be detected accurately.

偏光板が円偏光板であり、且つ、剥離フィルムがポリエチレンテレフタレート系樹脂(PET系樹脂)からなる場合は、当該PET系樹脂の波長分散にある程度合わせた位相差フィルタ(上記偏光フィルタに相当)を用いる。ここで、円偏光板と位相差フィルタとをクロスニコルを構成するように配置した場合、上記原理によれば欠陥は輝点として視認されることになるが、円偏光板が有する位相差膜の配向欠陥やピンホール等の位相差値が低い領域では輝点欠陥が黒点として視認されてしまうことがあり、その場合、輝点として検出するよりも検出判断が難しかった。特に、円偏光板が重合性液晶化合物の硬化物からなる位相差膜を含む場合にはその傾向が顕著である。 When the polarizing plate is a circular polarizing plate and the release film is made of polyethylene terephthalate resin (PET resin), a retardation filter (corresponding to the above polarizing filter) suitable for the wavelength dispersion of the PET resin to some extent is used. Use. Here, when the circular polarizing plate and the retardation filter are arranged so as to form a cross Nicol, the defect is visually recognized as a bright spot according to the above principle, but the retardation film of the circular polarizing plate has. In a region where the phase difference value is low, such as an orientation defect or a pinhole, the bright spot defect may be visually recognized as a black spot, and in that case, it is more difficult to determine the detection than to detect it as a bright spot. In particular, this tendency is remarkable when the circularly polarizing plate contains a retardation film made of a cured product of a polymerizable liquid crystal compound.

本発明は、円偏光板の欠陥の有無を容易に判断することができる検査方法、及び、検査装置を提供することを目的とする。 An object of the present invention is to provide an inspection method and an inspection apparatus capable of easily determining the presence or absence of defects in a circularly polarizing plate.

本発明は、円偏光板、及び、PET系樹脂からなる剥離フィルムを備えるフィルム状の被検査物の欠陥の有無を判断する検査方法であって、被検査物と、波長550nmにおける面内位相差値が剥離フィルムの波長550nmにおける面内位相差値と略同一であり、且つ、剥離フィルムが有する複屈折を補償するものである第1の位相差板と、円偏光板とクロスニコルを構成する位相差フィルタと、をこの順に並ぶように配置し、被検査物側又は位相差フィルタ側のいずれか一方側から光を入射し、その他方側から位相差フィルタ又は被検査物を観察して円偏光板の欠陥の有無を判断し、第1の位相差板を、波長550nmにおける面内位相差値(以下、この波長550nmにおける面内位相差値を「Re(550)」ということがある。)が、剥離フィルムのRe(550)よりも50〜100nm大きく、且つ、剥離フィルムが有する複屈折を補償するものである第2の位相差板に置き換え、被検査物側又は位相差フィルタ側のいずれか一方側から光を入射し、その他方側から位相差フィルタ又は被検査物を観察して円偏光板の欠陥の有無を判断する、検査方法を提供する。 The present invention is an inspection method for determining the presence or absence of defects in a film-shaped inspected object including a circular polarizing plate and a release film made of PET-based resin, and has an in-plane phase difference between the inspected object and the in-plane phase difference at a wavelength of 550 nm. It comprises a first retardation plate whose value is substantially the same as the in-plane retardation value of the release film at a wavelength of 550 nm and which compensates for the birefringence of the release film, a circular polarizing plate, and a cross Nicol. The retardation filters are arranged so as to be arranged in this order, light is incident from either the inspected object side or the retardation filter side, and the retardation filter or the inspected object is observed from the other side to form a circle. The presence or absence of defects in the polarizing plate is determined, and the first retardation plate may be referred to as an in-plane retardation value at a wavelength of 550 nm (hereinafter, the in-plane retardation value at this wavelength of 550 nm is referred to as “Re (550)”. ) Is 50 to 100 nm larger than Re (550) of the release film and is replaced with a second retardation plate that compensates for the birefringence of the release film, and is on the side to be inspected or the retardation filter side. Provided is an inspection method in which light is incident from either one side and the retardation filter or the object to be inspected is observed from the other side to determine the presence or absence of defects in the circular polarizing plate.

この検査方法では、第1の位相差板を用いた検査で黒色欠陥が観察された部位を第2の位相差板を用いて検査することによって、これを輝点欠陥として観察することが可能となる。これによれば、円偏光板の欠陥の有無を容易に判断することができる。 In this inspection method, by inspecting a portion where a black defect is observed in the inspection using the first retardation plate using the second retardation plate, it is possible to observe this as a bright spot defect. Become. According to this, it is possible to easily determine the presence or absence of defects in the circularly polarizing plate.

円偏光板は、重合性液晶化合物の硬化物からなる位相差膜を有するものであってもよい。位相差膜が重合性液晶化合物の硬化物からなる場合、その一般的な薄さから、黒点欠陥として観察される可能性が高まる。従って、本発明を適用する対象として好適である。 The circularly polarizing plate may have a retardation film made of a cured product of a polymerizable liquid crystal compound. When the retardation film is made of a cured product of a polymerizable liquid crystal compound, its general thinness increases the possibility of being observed as a black spot defect. Therefore, it is suitable as an object to which the present invention is applied.

本発明の検査方法において、被検査物、第1の位相差板、第2の位相差板、及び、位相差フィルタの少なくとも一つを、互いに対面する角度が異なるように傾けてもよく、又は、光の光軸に垂直な方向に回転させてもよい。これらを傾けることで、剥離フィルムや位相差板の位相差を微調整できることから、より広範囲の検査が可能となる。また、これらを回転させることで剥離フィルムと位相差板との軸合わせが容易となる。 In the inspection method of the present invention, at least one of the object to be inspected, the first retardation plate, the second retardation plate, and the retardation filter may be tilted so as to face each other at different angles, or , May be rotated in a direction perpendicular to the optical axis of light. By tilting these, the phase difference of the release film or the retardation plate can be finely adjusted, so that a wider range of inspection becomes possible. Further, by rotating these, the release film and the retardation plate can be easily aligned with each other.

第1の位相差板及び第2の位相差板は、互いに同一の部材内に配置されて構成されたものであってもよい。 The first retardation plate and the second retardation plate may be configured by being arranged in the same member as each other.

本発明は、円偏光板と、PET系樹脂からなる剥離フィルムとを備えるフィルム状の被検査物に光を入射して円偏光板の欠陥の有無を判断する検査装置であって、光源と、光源から発せられ被検査物により円偏光に変換された光を入射させる位相差フィルタと、被検査物が配置される場所よりも光源から遠い側、且つ、位相差フィルタが配置される場所よりも光源に近い側に配置され、円偏光を通過させる位相差板と、を備え、位相差板は、そのRe(550)が剥離フィルムのRe(550)と略同一である第1の位相差板と、Re(550)が剥離フィルムのRe(550)よりも50〜100nm大きい第2の位相差板とを含み、第1の位相差板及び第2の位相差板は、剥離フィルムが有する複屈折を補償するものである、検査装置を提供する。 The present invention is an inspection apparatus for determining the presence or absence of defects in a circularly polarizing plate by injecting light onto a film-shaped object to be inspected including a circularly polarizing plate and a release film made of a PET-based resin. A retardation filter that emits light emitted from a light source and converted into circularly polarized light by an object to be inspected, and a side farther from the light source than the place where the object to be inspected is placed and a place where the retardation filter is placed. The first retardation plate is provided with a retardation plate which is arranged on the side close to the light source and allows circularly polarized light to pass through, and the Re (550) of the retardation plate is substantially the same as the Re (550) of the release film. And a second retardation plate in which Re (550) is 50 to 100 nm larger than Re (550) of the release film, and the first retardation plate and the second retardation plate are duplicates of the release film. Provided is an inspection device that compensates for polarization.

また、本発明は、円偏光板と、PET系樹脂からなる剥離フィルムとを備えるフィルム状の被検査物に円偏光を入射して円偏光板の欠陥の有無を判断する検査装置であって、光源と、光源が発する光を円偏光に変換する位相差フィルタと、被検査物が配置される場所よりも光源に近い側、且つ、位相差フィルタが配置される場所よりも光源から遠い側に配置され、円偏光を通過させる位相差板と、を備え、位相差板は、Re(550)が剥離フィルムのRe(550)と略同一である第1の位相差板と、Re(550)が剥離フィルムのRe(550)よりも50〜100nm大きい第2の位相差板とを含み、第1の位相差板及び第2の位相差板は、剥離フィルムが有する複屈折を補償するものである、検査装置を提供する。 Further, the present invention is an inspection device for determining the presence or absence of defects in a circularly polarizing plate by injecting circularly polarized light into a film-shaped object to be inspected including a circularly polarizing plate and a release film made of a PET-based resin. A light source, a retardation filter that converts the light emitted by the light source into circularly polarized light, and a side closer to the light source than the place where the object to be inspected is placed, and a side farther from the light source than the place where the retardation filter is placed. The retardation plate comprises a retardation plate which is arranged and allows circularly polarized light to pass through, and the retardation plate includes a first retardation plate in which Re (550) is substantially the same as Re (550) of the release film, and Re (550). Includes a second retardation plate that is 50 to 100 nm larger than the Re (550) of the release film, and the first retardation plate and the second retardation plate compensate for the double polarization of the release film. Provide an inspection device.

これらの検査装置における位相差板は、第1の位相差板及び第2の位相差板が同一の部材内に配置されて構成されたものであってもよい。 The retardation plate in these inspection devices may be configured by arranging the first retardation plate and the second retardation plate in the same member.

本発明によれば、円偏光板の欠陥の有無を容易に判断することができる検査方法、及び、検査装置を提供することができる。 According to the present invention, it is possible to provide an inspection method and an inspection apparatus capable of easily determining the presence or absence of defects in a circularly polarizing plate.

第1の実施形態の検査装置を示す図である。It is a figure which shows the inspection apparatus of 1st Embodiment. 被検査物の断面図である。It is sectional drawing of the object to be inspected. 位相差板の一例を示す図である。It is a figure which shows an example of a retardation plate. 位相差板の他の一例を示す図である。It is a figure which shows another example of the retardation plate. 第2の実施形態の検査装置を示す図である。It is a figure which shows the inspection apparatus of the 2nd Embodiment.

以下、本発明の好適な実施形態について、図面を参照しながら詳細に説明する。なお、各図において同一部分又は相当部分には同一符号を付し、重複する説明は省略する。 Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In each figure, the same parts or corresponding parts are designated by the same reference numerals, and duplicate description will be omitted.

<第1の実施形態>
第1の実施形態の検査装置及び検査方法ついて説明する。
<First Embodiment>
The inspection device and the inspection method of the first embodiment will be described.

(検査装置と被検査物)
本実施形態の検査装置は、円偏光板の表面欠陥の有無を検査するものである。図1に示されているとおり、検査装置100Aは、光源2、位相差板4、及び、位相差フィルタ3がこの順に配置されてなるものである。
(Inspection device and object to be inspected)
The inspection device of the present embodiment inspects the presence or absence of surface defects of the circularly polarizing plate. As shown in FIG. 1, in the inspection device 100A, the light source 2, the retardation plate 4, and the retardation filter 3 are arranged in this order.

図2に示されているとおり、検査対象であるフィルム状の被検査物10は、検査対象の本体である円偏光板1と、円偏光板1に対して粘着剤層15を介して積層された剥離フィルム16aとを備えている。円偏光板1は、偏光フィルム11の両面に保護フィルム12a,12bが貼合されており、更に、剥離フィルム16aを備える側の保護フィルム12a上に粘着剤層13を介して位相差膜14が形成されてなるものである。そして、円偏光板1のうち剥離フィルム16aを備えていない側の面には別の剥離フィルム16bが積層されている。円偏光板1は、一般的に表示装置、例えば液晶表示装置や有機EL表示装置に用いられるものであり、使用時には剥離フィルム16aを剥がして、粘着剤層15を介して表示装置に貼り付けられる。 As shown in FIG. 2, the film-shaped object 10 to be inspected is laminated on the circularly polarizing plate 1 which is the main body of the inspection target and the circularly polarizing plate 1 via the adhesive layer 15. It also includes a release film 16a. In the circular polarizing plate 1, protective films 12a and 12b are bonded to both sides of the polarizing film 11, and a retardation film 14 is further formed on the protective film 12a on the side provided with the release film 16a via an adhesive layer 13. It is formed. Then, another release film 16b is laminated on the surface of the circularly polarizing plate 1 on the side not provided with the release film 16a. The circularly polarizing plate 1 is generally used in a display device, for example, a liquid crystal display device or an organic EL display device. At the time of use, the release film 16a is peeled off and attached to the display device via the adhesive layer 15. ..

なお、本明細書において「円偏光板」とは、円偏光板及び楕円偏光板を含むものとする。また、「円偏光」は、円偏光と楕円偏光を含むものとする。 In the present specification, the term "circularly polarized light" includes a circularly polarizing plate and an elliptical polarizing plate. Further, "circularly polarized light" includes circularly polarized light and elliptically polarized light.

偏光フィルム11は、検査装置100Aにおいては、光源2から入射した光を直線偏光に変換するフィルムである。偏光フィルム11としては、例えば、ポリビニルアルコールフィルムにヨウ素や二色性色素が吸着・配向されたものや、重合性液晶化合物を配向・重合したものに、二色性色素が吸着・配向したものが挙げられる。 The polarizing film 11 is a film that converts the light incident from the light source 2 into linearly polarized light in the inspection device 100A. Examples of the polarizing film 11 include a polyvinyl alcohol film in which iodine and a dichroic dye are adsorbed and oriented, and a film in which a polymerizable liquid crystal compound is oriented and polymerized, and a dichroic dye is adsorbed and oriented. Can be mentioned.

保護フィルム12a,12bは、偏光フィルム11を保護するためのものである。保護フィルム12a,12bとしては、適度な機械的強度を有する偏光板を得る目的で、偏光板の技術分野で汎用されているものが用いられる。典型的には、トリアセチルセルロース(TAC)フィルム等のセルロースエステル系フィルム;環状オレフィン系フィルム;ポリエチレンテレフタレート(PET)フィルム等のポリエステル系フィルム:ポリメチルメタクリレート(PMMA)フィルム等の(メタ)アクリル系フィルム等である。また、偏光板の技術分野で汎用されている添加剤が、保護フィルムに含まれていてもよい。 The protective films 12a and 12b are for protecting the polarizing film 11. As the protective films 12a and 12b, those widely used in the technical field of polarizing plates are used for the purpose of obtaining a polarizing plate having an appropriate mechanical strength. Typically, cellulose ester films such as triacetyl cellulose (TAC) films; cyclic olefin films; polyester films such as polyethylene terephthalate (PET) films: (meth) acrylic films such as polymethyl methacrylate (PMMA) films. It is a film or the like. Further, an additive widely used in the technical field of the polarizing plate may be contained in the protective film.

保護フィルム12a,12bは、円偏光板1の構成要素として偏光フィルム11とともに表示装置に貼合されるものであるので、位相差値の厳密な管理等が要求される。保護フィルム12a,12bとしては、典型的には、位相差値が極めて小さいものが好ましく用いられる。保護フィルム12a,12bは、接着剤を介して偏光フィルム11に貼合される。 Since the protective films 12a and 12b are attached to the display device together with the polarizing film 11 as a component of the circularly polarizing plate 1, strict control of the retardation value and the like are required. As the protective films 12a and 12b, those having an extremely small retardation value are typically preferably used. The protective films 12a and 12b are attached to the polarizing film 11 via an adhesive.

位相差膜14は、検査装置100Aにおいては、偏光フィルム11によって直線偏光とされた光を円偏光に変換する膜である。位相差膜14は、位相差を有する膜であれば特に制限はないが、重合性液晶化合物の硬化物からなるものであることが好ましい。重合性液晶化合物の硬化物からなる位相差膜14は、通常厚さが0.2μm〜10μm程度と薄く、異物等を含む場合にその部分で位相差値が低下しやすい。このような部位では、後述するとおり、位相差板4で剥離フィルム16aの複屈折を補償したときに本来は輝点欠陥として観察されるべきものであるにも関わらず、黒点となって観察される場合がある。 In the inspection device 100A, the retardation film 14 is a film that converts light linearly polarized by the polarizing film 11 into circularly polarized light. The retardation film 14 is not particularly limited as long as it is a film having a retardation, but it is preferably made of a cured product of a polymerizable liquid crystal compound. The retardation film 14 made of a cured product of a polymerizable liquid crystal compound usually has a thin thickness of about 0.2 μm to 10 μm, and when foreign matter or the like is contained, the retardation value tends to decrease at that portion. In such a portion, as will be described later, when the birefringence of the release film 16a is compensated by the retardation plate 4, it is observed as a black spot even though it should be observed as a bright spot defect. May occur.

位相差膜14を形成し得る重合性液晶化合物は、例えば、特開2009−173893号公報、特開2010−31223号公報、WO2012/147904号公報、WO2014/10325号公報及びWO2017−43438号公報に開示されたものを挙げることができる。これらの公報に記載の重合性液晶化合物は、広い波長域において一様の偏光変換が可能な、いわゆる逆波長分散性を有する位相差膜を形成可能である。例えば、当該重合性液晶化合物を含む溶液(重合性液晶化合物溶液)を適当な基材上に塗布して光重合させることで、上述のように極めて薄い位相差膜を形成することができるので、かかる位相差膜を有する円偏光板は、厚みが極めて薄い円偏光板を形成することができる。このように厚みが極めて薄い円偏光板は、近年着目されているフレキシブル表示材料用の円偏光板として有利である。 The polymerizable liquid crystal compounds capable of forming the retardation film 14 are described in, for example, JP-A-2009-173893, JP-A-2010-31223, WO2012 / 147904, WO2014 / 10325 and WO2017-43438. The disclosed ones can be mentioned. The polymerizable liquid crystal compounds described in these publications can form a retardation film having so-called inverse wavelength dispersibility, which enables uniform polarization conversion in a wide wavelength range. For example, by applying a solution containing the polymerizable liquid crystal compound (polymerizable liquid crystal compound solution) on an appropriate substrate and photopolymerizing it, an extremely thin retardation film can be formed as described above. A circularly polarizing plate having such a retardation film can form a circularly polarizing plate having an extremely thin thickness. Such a circularly polarizing plate having an extremely thin thickness is advantageous as a circularly polarizing plate for flexible display materials, which has been attracting attention in recent years.

重合性液晶化合物溶液を塗布する基材としては、上述の公報に記載されたものを挙げることができる。かかる基材には、重合性液晶化合物を配向させるために配向膜が設けられていてもよい。配向膜は偏光照射により光配向させるものや、ラビング処理により機械的に配向させたもののいずれでもよい。なお、かかる配向膜に関しても、上記公報に記載されている。 Examples of the base material on which the polymerizable liquid crystal compound solution is applied include those described in the above-mentioned publications. Such a base material may be provided with an alignment film for orienting the polymerizable liquid crystal compound. The alignment film may be either photo-aligned by polarization irradiation or mechanically oriented by rubbing treatment. The alignment film is also described in the above publication.

しかしながら、重合性液晶化合物溶液を塗布する基材に異物等が存在していたり、基材自体に傷等があったり、する場合に、重合性液晶化合物溶液を塗布して得られる塗布膜自体に欠陥が生じることがある。また、配向膜をラビング処理した場合には、ラビング布の屑が配向膜上に残り、これが重合性液晶化合物溶液(液晶硬化膜形成用組成物)の塗布膜に欠陥を生じさせることもある。このように、重合性液晶化合物から形成される位相差膜は、厚みが極めて薄い位相差膜を形成可能であるが、欠陥を生じる要因がある。そして、位相差膜の欠陥は上述のとおり、黒点となって観察される欠陥が生じることがある。このような欠陥を有する位相差膜を備えた円偏光板及び剥離フィルムを有する被検査物の欠陥の有無を判定する検出において、本実施形態の検査装置、検査方法は特に有用である。 However, when foreign matter or the like is present on the base material on which the polymerizable liquid crystal compound solution is applied, or the base material itself is scratched, the coating film itself obtained by applying the polymerizable liquid crystal compound solution is coated. Defects may occur. Further, when the alignment film is rubbed, debris of the rubbing cloth remains on the alignment film, which may cause a defect in the coating film of the polymerizable liquid crystal compound solution (composition for forming a liquid crystal cured film). As described above, the retardation film formed from the polymerizable liquid crystal compound can form a retardation film having an extremely thin thickness, but there is a factor that causes defects. Then, as described above, the defect of the retardation film may cause a defect observed as a black spot. The inspection device and inspection method of the present embodiment are particularly useful in detecting the presence or absence of defects in an object to be inspected having a circularly polarizing plate having a retardation film having such defects and a release film.

位相差膜14は、基材上に配向膜形成用組成物を塗布し、更にその上に重合性液晶化合物を含んだ液晶硬化膜形成用組成物を塗布することによって作製することができる。そうして作成した位相差膜14を、保護フィルム12a上に形成された粘着剤層13に対して基材ごと貼合し、その後、基材を剥がすことで、位相差膜14を保護フィルム12a上に転写することができる。 The retardation film 14 can be produced by applying a composition for forming an alignment film on a base material, and further applying a composition for forming a liquid crystal cured film containing a polymerizable liquid crystal compound on the composition. The retardation film 14 thus produced is attached to the pressure-sensitive adhesive layer 13 formed on the protective film 12a together with the base material, and then the base material is peeled off to attach the retardation film 14 to the protective film 12a. Can be transferred onto.

剥離フィルム16aは、表示装置に貼合するときに円偏光板1から剥がされるものであり、通常は、剥がされた剥離フィルム16aは廃棄される。したがって、保護フィルム12a,12bとは異なり、位相差値の厳密な管理が要求されることはない。そのため、市販されているフィルムを剥離フィルム16aとして採用する場合に、その位相差値を補償しないと、位相差フィルタ3を用いる欠陥の検査において、誤動作を招きかねない。すなわち、このように位相差値が厳密に管理されていない剥離フィルム16a,16bが貼合された円偏光板1の欠陥検査では、当該剥離フィルム16aの位相差が検査装置100Aの検査精度を低下させる原因になり得る。 The release film 16a is peeled off from the circularly polarizing plate 1 when it is attached to the display device, and the peeled release film 16a is usually discarded. Therefore, unlike the protective films 12a and 12b, strict control of the phase difference value is not required. Therefore, when a commercially available film is used as the release film 16a, if the retardation value is not compensated, a malfunction may occur in the defect inspection using the retardation filter 3. That is, in the defect inspection of the circularly polarizing plate 1 to which the release films 16a and 16b whose retardation values are not strictly controlled are adhered, the phase difference of the release film 16a lowers the inspection accuracy of the inspection device 100A. It can be a cause of causing.

なお、上記背景技術に記したように、円偏光板1において、剥離フィルム16aの反対面には別の剥離フィルム16bが設けられることが多い。図2に示されている円偏光板1では保護フィルム12b側に剥離フィルム16bが貼合されている。この剥離フィルム16bも通常、表示装置に貼合するときに円偏光板1から剥がされるものであり、保護フィルム12a,12bとは異なり、位相差値の厳密な管理が要求されることはない。剥離フィルム16bの位相差値を補償する場合には、検査装置100Aにおいて、剥離フィルム16aを剥離フィルム16bに置き換えて(すなわち、剥離フィルム16bのRe(550)を予め求めておいてから、被検査物10の向きを反対にし(剥離フィルム16bが位相差板4に対向する形に設置して)、検査装置100Aを用いて、本実施形態の検査方法を実施すればよい。なお、図2において、保護フィルム12bと剥離フィルム16bとは、適当な接着剤層又は粘着剤層を介して貼合されていてもよい(図2においては、この接着剤層又は粘着剤層は、図示はしていない)。 As described in the background technique, in the circularly polarizing plate 1, another release film 16b is often provided on the opposite surface of the release film 16a. In the circularly polarizing plate 1 shown in FIG. 2, a release film 16b is bonded to the protective film 12b side. This release film 16b is also usually peeled off from the circularly polarizing plate 1 when it is attached to a display device, and unlike the protective films 12a and 12b, strict control of the retardation value is not required. When compensating for the phase difference value of the release film 16b, the release film 16a is replaced with the release film 16b in the inspection device 100A (that is, Re (550) of the release film 16b is obtained in advance, and then the inspection is performed. The inspection method of the present embodiment may be carried out by using the inspection device 100A with the direction of the object 10 reversed (the release film 16b is installed so as to face the retardation plate 4). , The protective film 12b and the release film 16b may be bonded to each other via an appropriate adhesive layer or adhesive layer (in FIG. 2, the adhesive layer or adhesive layer is not shown). Absent).

本実施形態において、剥離フィルム16aはPET系樹脂からなるものである。剥離フィルム16bの位相差値を補償して本実施形態の検査方法を実施する場合には、剥離フィルム16bもPET系樹脂からなるものを用いる。PET系樹脂からなるフィルム(PET系樹脂フィルム)は、剥離フィルムとして汎用であり、且つ安価であるという利点がある。一方、安価なPET系樹脂フィルムは上記のとおり、位相差値の厳密な管理が要求されることはない。そのため、例えば、製品ロットごとに位相差値にバラツキがあることがある。また、同一のPET樹脂系フィルムであっても、面内に位相差値のバラツキがあることもある。このような安価なPET樹脂系フィルムを剥離フィルムとして貼合した円偏光板であっても、本実施形態の検査方法により、その欠陥の有無を精度よく検出することができる。 In the present embodiment, the release film 16a is made of a PET-based resin. When the inspection method of the present embodiment is carried out by compensating for the phase difference value of the release film 16b, the release film 16b is also made of PET resin. A film made of a PET-based resin (PET-based resin film) has an advantage that it is versatile as a release film and is inexpensive. On the other hand, as described above, the inexpensive PET-based resin film does not require strict control of the phase difference value. Therefore, for example, the phase difference value may vary from product lot to product lot. Further, even if the same PET resin film is used, there may be variations in the phase difference value in the plane. Even with a circularly polarizing plate in which such an inexpensive PET resin-based film is bonded as a release film, the presence or absence of defects can be accurately detected by the inspection method of the present embodiment.

ここで、剥離フィルム16aのRe(550)の求め方を示しておく。上記のとおり、これら剥離フィルムはPET系樹脂からなるフィルムであり、このようなフィルムは市場から容易に入手できる。このフィルムから例えば、40mm×40mm程度の大きさの片を分取(長尺フィルムから、適当な切断具を用いて分取する等)する。この片のRe(550)を3回測定し、Re(550)の平均値を求める。片のRe(550)は、位相差測定装置KOBRA−WPR(王子計測機器株式会社製)を用い、測定温度室温(25℃程度)で測定することができる。なお、剥離フィルム16bのRe(550)を求める場合にも、同様の試験を行えばよい。 Here, a method of obtaining Re (550) of the release film 16a will be shown. As described above, these release films are films made of PET-based resin, and such films are easily available on the market. For example, a piece having a size of about 40 mm × 40 mm is separated from this film (from a long film, separated by using an appropriate cutting tool, etc.). Re (550) of this piece is measured three times, and the average value of Re (550) is obtained. One piece of Re (550) can be measured at a measurement temperature of room temperature (about 25 ° C.) using a phase difference measuring device KOBRA-WPR (manufactured by Oji Measuring Instruments Co., Ltd.). The same test may be performed when Re (550) of the release film 16b is obtained.

光源2は、種々の市販品を用いることができるが、例えばレーザ光等の直線光(直線光に近似するものも含む)であることが有利である。光源2が発する光は無偏光であり、偏光フィルム11を通過し所定方向の偏光となり、更に位相差膜14を通過して円偏光となる。すなわち、無偏光の光が円偏光板1通過することで、円偏光となる。 As the light source 2, various commercially available products can be used, but it is advantageous that the light source 2 is, for example, linear light such as laser light (including one that approximates linear light). The light emitted by the light source 2 is unpolarized, passes through the polarizing film 11 to be polarized in a predetermined direction, and further passes through the retardation film 14 to be circularly polarized. That is, when unpolarized light passes through the circular polarizing plate 1, it becomes circularly polarized light.

位相差フィルタ3は、円偏光板であり、位相差を有する層を光源2側へ向けて配置されている。位相差フィルタ3は、被検査物10を検査する場面では、常に被検査物10中の円偏光板1とクロスニコルを構成するように、その向きが調整される。そして、この位相差フィルタ3を構成する偏光板及び位相差板(位相差を有する層を構成する)は、いわゆる無欠陥のものが採用される。 The retardation filter 3 is a circular polarizing plate, and a layer having a retardation is arranged toward the light source 2. When the inspected object 10 is inspected, the orientation of the retardation filter 3 is adjusted so as to always form the circular polarizing plate 1 and the cross Nicol in the inspected object 10. Then, as the polarizing plate and the retardation plate (which form the layer having the retardation) constituting the retardation filter 3, so-called defect-free ones are adopted.

位相差板4は、被検査物10が備える剥離フィルム16aによる光の複屈折を補償するものである。位相差板4を構成する材料としては、PET系樹脂からなる剥離フィルム16aによる光の複屈折を補償するものであれば特に限定されない。市販の100〜200nmを有する位相差板を準備し、これらを複数枚積層して所望の位相差値となるようにして位相差板4を形成することもできる。Re(550)は通常、加成性を有するため、積層した位相差板のRe(550)から所望のRe(550)の位相差板4を得ることができる。PET系樹脂からなる剥離フィルム16aは、通常、面内方向の位相差値や遅相軸のばらつきが大きいため、検査時に位相差値を複数選択できるように複数種の位相差板を準備しておくことが好ましい。本実施形態では、剥離フィルム16aのRe(550)と略同一の位相差値をもつ第1の位相差板と、剥離フィルム16aのRe(550)よりも50〜100nm大きなRe(550)の第2の位相差板との少なくとも二種類の位相差板を用いる。なお、剥離フィルム16aのRe(550)と略同一の位相差値とは、剥離フィルム16aのRe(550)と、位相差板のRe(550)との差分の絶対値が20nm以下であることをいう。 The retardation plate 4 compensates for the birefringence of light due to the release film 16a included in the object 10 to be inspected. The material constituting the retardation plate 4 is not particularly limited as long as it compensates for the birefringence of light due to the release film 16a made of PET-based resin. A commercially available retardation plate having a diameter of 100 to 200 nm can be prepared, and a plurality of these retardation plates can be laminated to form a retardation plate 4 so as to obtain a desired retardation value. Since Re (550) is usually additive, a desired Re (550) retardation plate 4 can be obtained from the laminated retardation plates Re (550). Since the release film 16a made of PET resin usually has a large variation in the in-plane retardation value and the slow axis, a plurality of types of retardation plates are prepared so that a plurality of retardation values can be selected at the time of inspection. It is preferable to keep it. In the present embodiment, the first retardation plate having substantially the same retardation value as the Re (550) of the release film 16a and the Re (550) having a phase difference value 50 to 100 nm larger than the Re (550) of the release film 16a. At least two types of retardation plates with the two retardation plates are used. The retardation value substantially the same as Re (550) of the release film 16a means that the absolute value of the difference between Re (550) of the release film 16a and Re (550) of the retardation plate is 20 nm or less. To say.

更に、剥離フィルムの位相差値のばらつきを考慮すると、上記位相差板は、剥離フィルムのRe(550)に対して、±300nm程度の範囲の位相差を示すものとすることが好ましい。この位相差の範囲内では更に、剥離フィルムの面内方向において50nm〜100nm刻みで変化させることが好ましい。これらの位相差を示す位相差板を種々準備しておくことが好ましい。すなわち、第1の位相差板、第2の位相差板に加え、更に位相差の異なる第3の位相差板、第4の位相差板を準備しておくことが好ましい。 Further, considering the variation in the phase difference value of the release film, it is preferable that the retardation plate exhibits a phase difference in the range of about ± 300 nm with respect to Re (550) of the release film. Within the range of this phase difference, it is preferable to further change the release film in the in-plane direction in increments of 50 nm to 100 nm. It is preferable to prepare various retardation plates showing these retardation. That is, in addition to the first retardation plate and the second retardation plate, it is preferable to prepare a third retardation plate and a fourth retardation plate having different retardations.

位相差板4の典型例の概略を図3及び図4に示す。図3及び図4に示されているとおり、一枚の位相差板部材の中に位相差値が異なる領域が連続して配置されて構成されたものであってもよい。すなわち、少なくとも第1の位相差板及び第2の位相差板が同一の部材中に構成されていてもよい。 The outline of a typical example of the retardation plate 4 is shown in FIGS. 3 and 4. As shown in FIGS. 3 and 4, regions having different retardation values may be continuously arranged in one retardation plate member. That is, at least the first retardation plate and the second retardation plate may be configured in the same member.

図3に示されているとおり、位相差板4Aは、面内方向の位相差値が異なる領域が一方向に連なって構成されたものであってもよい。すなわち、端に位置する領域(第1の領域a;第1の位相差板に相当)は、Re(550)が例えば1720nmである領域であり、その隣に接している領域(第2の領域a;第2の位相差板に相当)は、Re(550)が1790nmである領域であり、更にその隣に接している領域(第3の領域a;第3の位相差板に相当)は、Re(550)が1860nmである領域である。位相差板4Aにおいて、当該領域の数は任意であり、図3ではn番目の領域aまでを示している。なお、それぞれの領域において、厚さ方向の位相差値は、一領域で観察しようとする視野領域の広さにより調節することができる。 As shown in FIG. 3, the retardation plate 4A may be formed by connecting regions having different in-plane retardation values in one direction. That is, the region located at the end (first region a 1 ; corresponding to the first retardation plate) is a region where Re (550) is, for example, 1720 nm, and a region adjacent to the region (second region). region a 2; corresponding to the second retardation plate) is a region Re (550) is 1790Nm, further areas in contact with the next (third region a 3; the third retardation plate Correspondingly) is a region where Re (550) is 1860 nm. In the retardation plate 4A, the number of the regions is arbitrary, and FIG. 3 shows up to the nth region an. In each region, the phase difference value in the thickness direction can be adjusted by the width of the visual field region to be observed in one region.

また、図4に示されているとおり、位相差板4Bは、Re(550)が異なる領域が環状に並んだ構成とされていてもよい。すなわち、円盤状の位相差板4Bは、中心部から放射状に延びる仮想線を境界として位相差値が異なる複数の領域に区分されており、ある領域(第1の領域b;第1の位相差板に相当)は、Re(550)が例えば1720nmである領域であり、その隣に接している領域(第2の領域b;第2の位相差板に相当)は、Re(550)が1790nmである領域であり、更にその隣に接している領域(第3の領域b;第3の位相差板に相当)は、Re(550)が1860nmである領域である。位相差板4Bにおいて、当該領域の数は任意であり、図4では第6の領域bまで存在する円盤状の位相差板を示している。 Further, as shown in FIG. 4, the retardation plate 4B may have a configuration in which regions having different Re (550) are arranged in an annular shape. That is, the disk-shaped retardation plate 4B is divided into a plurality of regions having different retardation values with a virtual line extending radially from the center as a boundary, and a certain region (first region b 1 ; first position). corresponding to phase difference plate) is, Re (550) is a region that is 1720nm example, areas in contact with the next (second region b 2; corresponding to the second retardation plate) is, Re (550) There is an area which is 1790Nm, regions, further contact with its neighbors (third region b 3; corresponding to the third phase difference plate) is, Re (550) is a region that is 1860Nm. In the phase difference plate 4B, the number of the area is optional, shows a disc-shaped phase plate present to the region b 6 of 6 in FIG.

被検査物10、位相差板4及び位相差フィルタ3を通過した光を観察するために、光軸9上、且つ、位相差フィルタ3の両側のうち光源2がある側とは反対側の位置に、CCDカメラ等を含む検出手段5を配置してもよい。例えば、CCDカメラと画像処理装置を組み合わせた画像処理解析により自動的に検出し、これによって被検査物の検査を行うことができる。或いは、検出手段5は部材ではなく、人間が位相差フィルタ3を目視観察することであってもよい。 In order to observe the light that has passed through the object 10 to be inspected, the retardation plate 4, and the retardation filter 3, the position on the optical axis 9 and on both sides of the retardation filter 3 opposite to the side where the light source 2 is located. The detection means 5 including a CCD camera or the like may be arranged therein. For example, it can be automatically detected by image processing analysis in which a CCD camera and an image processing device are combined, thereby inspecting the object to be inspected. Alternatively, the detecting means 5 may be a human being visually observing the phase difference filter 3 instead of the member.

また、検査装置100Aは、被検査物10、位相差板4及び位相差フィルタ3の少なくとも一つを、互いに対面する角度が異なるように傾ける、又は、光の光軸9に垂直な方向に回転させることを可能とする可動装置(図示していない。)を備えていることが好ましい。これらを傾けることで、PET系樹脂からなる剥離フィルム16aや位相差板4の位相差を微調整できることから、より広範囲の検査が可能となる。また、これらを回転させることでPET系樹脂からなる剥離フィルム16aと位相差板4との軸合わせが容易となる。 Further, the inspection device 100A tilts at least one of the object to be inspected 10, the retardation plate 4, and the retardation filter 3 so that they face each other at different angles, or rotates in a direction perpendicular to the optical axis 9 of light. It is preferable to have a movable device (not shown) that enables the operation. By tilting these, the phase difference of the release film 16a made of PET resin and the retardation plate 4 can be finely adjusted, so that a wider range of inspections can be performed. Further, by rotating these, the release film 16a made of PET-based resin and the retardation plate 4 can be easily aligned with each other.

(検査方法)
検査装置100Aを用いた検査方法は、以下のとおりである。はじめに、検査装置100Aの内部のうち、光源2と位相差板4との間に被検査物10を挿入する。このとき、被検査物10と位相差板4と位相差フィルタ3とが、その面がいずれも平行となるように、且つ、被検査物10中の剥離フィルム16aを備える側が光源2とは反対側を向くとともに円偏光板1と位相差フィルタ3とがクロスニコルを構成するように配置する。検査装置100Aが上記可動装置を備えている場合は、被検査物10を任意の向きに挿入した後に、被検査物10と位相差フィルタ3との相対的な位置関係を可動装置によって変化させてクロスニコルとしてもよい。
(Inspection method)
The inspection method using the inspection device 100A is as follows. First, the object 10 to be inspected is inserted between the light source 2 and the retardation plate 4 inside the inspection device 100A. At this time, the surface of the object 10 to be inspected, the retardation plate 4, and the retardation filter 3 are all parallel to each other, and the side of the object 10 to be provided with the release film 16a is opposite to the light source 2. The circularly polarizing plate 1 and the retardation filter 3 are arranged so as to form a cross Nicol while facing the side. When the inspection device 100A is provided with the movable device, after inserting the inspected object 10 in an arbitrary direction, the relative positional relationship between the inspected object 10 and the phase difference filter 3 is changed by the movable device. It may be cross Nicol.

光源2が発した光は被検査物10に入射し、被検査物10を通過して円偏光となる。被検査物10と位相差フィルタ3とがクロスニコルの配置となることによって、被検査物10を通過することで生じた円偏光が位相差フィルタ3によって遮断される。このとき、被検査物10中の円偏光板1に欠陥が存在すると、この欠陥部分は正規の遮断が行えず、検出手段5における検査作業者の目又はCCDカメラ等には欠陥部分が輝点として観察される。 The light emitted by the light source 2 enters the object to be inspected 10 and passes through the object to be inspected 10 to become circularly polarized light. By arranging the cross Nicol between the object 10 to be inspected and the retardation filter 3, the circular polarization generated by passing through the object 10 to be inspected is blocked by the retardation filter 3. At this time, if a defect exists in the circularly polarizing plate 1 in the object to be inspected 10, the defective portion cannot be normally blocked, and the defective portion is a bright spot in the eyes of the inspection worker in the detection means 5, the CCD camera, or the like. Observed as.

しかしながら、剥離フィルム16aが位相差を有する場合、被検査物10を通過することで生じた円偏光が影響を受け、位相差フィルタ3を透過する光量が多くなり(例えば光源の光量の10%又は15%を超えるようになり)、円偏光板1に存在する輝点などの欠陥の検出精度が低下する。ここで、被検査物10と位相差フィルタ3との間に位相差板4が配置されていることによって、被検査物10中の剥離フィルム16aの位相差値がキャンセルされ、剥離フィルム16aによる光の複屈折を補償する。 However, when the release film 16a has a phase difference, the circularly polarized light generated by passing through the object 10 to be inspected is affected, and the amount of light transmitted through the retardation filter 3 increases (for example, 10% of the light amount of the light source or It will exceed 15%), and the detection accuracy of defects such as bright spots existing in the circular polarizing plate 1 will decrease. Here, by arranging the retardation plate 4 between the object 10 to be inspected and the retardation filter 3, the retardation value of the release film 16a in the object 10 to be inspected is canceled, and the light from the release film 16a is canceled. Compensates for birefringence.

また、位相差板4は、剥離フィルム16aによる光の複屈折を効果的に補償するために剥離フィルム16aが有する位相差値と波長分散特性とにできる限り一致するように設計するが、剥離フィルム16aの位相差値の面内ばらつきにより検査視野全体で光を十分に遮断して検査することは困難である。このような場合には、円偏光板1のうち、位相差膜14の位相差値が低下している部分で光学補償がマッチングし、本来輝点として観察されるべき欠陥が黒点として観察されてしまうことが起こりうる。通常、黒点欠陥は輝点欠陥と比較して、視認性に与える影響が小さいため欠陥サイズについても輝点欠陥より大きくても許容されることが多いことから、結果的に問題なしと判断されてしまうことがある。しかし、その黒点欠陥が本来位相差膜14の位相差値低下部位に起因する輝点欠陥として観察されるべきものであった場合には、視認性に与える影響が大きく、問題となってしまう。 Further, the retardation plate 4 is designed so that the retardation value and the wavelength dispersion characteristics of the release film 16a match as much as possible in order to effectively compensate for the birefringence of light due to the release film 16a. Due to the in-plane variation of the phase difference value of 16a, it is difficult to sufficiently block light in the entire inspection field for inspection. In such a case, the optical compensation is matched at the portion of the circular polarizing plate 1 where the retardation value of the retardation film 14 is lowered, and defects that should be originally observed as bright spots are observed as black spots. It can happen. Normally, sunspot defects have a smaller effect on visibility than bright spot defects, so even if the defect size is larger than the bright spot defects, it is often acceptable. Therefore, it is judged that there is no problem as a result. It may end up. However, if the black spot defect should originally be observed as a bright spot defect caused by a portion where the retardation value of the retardation film 14 is lowered, it has a great influence on visibility and becomes a problem.

このため、本実施形態では、黒点と視認された欠陥部位に対して、第2の位相差板を用いる(例えば図3及び図4に例示した位相差板4A,4Bのうち、第2の領域a,b)を用いる。例えば、位相差板4Aの第1の領域a(第1の位相差板)を用いて行った初回の検査において黒点と視認された欠陥部位に対して、第2の領域a(第2の位相差板)を用いて二回目の検査を行う。このように、面内方向の位相差値が異なる位相差板を用いて複数回にわたって検査することで該当欠陥が輝点欠陥として観察された場合には、欠陥を正しく認識しやすい。なお、第2の領域a(第2の位相差板)を用いた検査でも黒点と視認された場合は、第3の領域a(第3の位相差板)へ続けて検査を行う。 Therefore, in the present embodiment, a second retardation plate is used for the defect portion visually recognized as a black spot (for example, the second region of the retardation plates 4A and 4B illustrated in FIGS. 3 and 4). a 2, b 2) is used. For example, in the initial inspection performed using the first region a 1 (first retardation plate) of the retardation plate 4A, the second region a 2 (second) with respect to the defect portion visually recognized as a black spot. The second inspection is performed using the retardation plate). In this way, when the defect is observed as a bright spot defect by inspecting it a plurality of times using retardation plates having different in-plane retardation values, it is easy to correctly recognize the defect. Incidentally, when it is visually recognized as black spots in the inspection using the second region a 2 (second retardation plate), the inspection is continuously performed to the third region a 3 (third retardation plate).

検査中、被検査物10、位相差板4及び位相差フィルタ3の少なくとも一つを、互いに対面する角度が異なるように傾けてもよいし、光の光軸9に垂直な方向に回転させてもよい。傾けることによって、剥離フィルム16aや位相差板4の位相差を微調整できることから、より広範囲の検査が可能となる。また、これらを回転させることでPET系樹脂からなる剥離フィルム16aと位相差板4との軸合わせが容易となる。これらの操作は、検査装置100Aが可動装置を備えている場合に特に容易に行うことができる。 During the inspection, at least one of the object 10 to be inspected, the retardation plate 4 and the retardation filter 3 may be tilted so as to face each other at different angles, or may be rotated in a direction perpendicular to the optical axis 9 of light. May be good. By tilting, the phase difference between the release film 16a and the retardation plate 4 can be finely adjusted, so that a wider range of inspections can be performed. Further, by rotating these, the release film 16a made of PET-based resin and the retardation plate 4 can be easily aligned with each other. These operations can be performed particularly easily when the inspection device 100A includes a movable device.

<第2の実施形態>
第2の実施形態の検査装置及び検査方法について説明する。図5に示されているとおり、第2の実施形態の検査装置100Bが第1の実施形態の検査装置100Bと異なる点は、被検査物10を配置する場所と位相差フィルタ3を配置する場所とが逆になっている点である。すなわち、検査装置100Bは、光源2、位相差フィルタ3、及び、位相差板4がこの順に配置されてなるものであり、被検査物10は、検査時には剥離フィルム16aが光源2側を向くようにして、位相差板4よりも光源から遠い位置に配置される。なお、上記第1の実施形態と同様に、円偏光板1に剥離フィルム16bを貼合しこの剥離フィルム16bの位相差値を補償する場合には、検査装置100Bにおいて剥離フィルム16bが位相差板4に対向するように被検査物10を設置すればよい。
<Second embodiment>
The inspection device and the inspection method of the second embodiment will be described. As shown in FIG. 5, the inspection device 100B of the second embodiment differs from the inspection device 100B of the first embodiment in that the place where the object to be inspected 10 is placed and the place where the phase difference filter 3 is placed. Is the opposite. That is, in the inspection device 100B, the light source 2, the retardation filter 3, and the retardation plate 4 are arranged in this order, and the inspected object 10 has the release film 16a facing the light source 2 side at the time of inspection. Therefore, it is arranged at a position farther from the light source than the retardation plate 4. In the same manner as in the first embodiment, when the release film 16b is attached to the circularly polarizing plate 1 to compensate for the retardation value of the release film 16b, the release film 16b is used as a retardation plate in the inspection device 100B. The object to be inspected 10 may be installed so as to face 4.

検査装置100Bを用いた被検査物10の検査においても、第1の実施形態と同様の原理によって円偏光板1の欠陥の有無を容易に検査することができる。 In the inspection of the object to be inspected 10 using the inspection device 100B, the presence or absence of defects in the circularly polarizing plate 1 can be easily inspected by the same principle as in the first embodiment.

以上、本発明の好適な実施形態について説明したが、本発明は上記実施形態に何ら限定されるものではない。 Although the preferred embodiment of the present invention has been described above, the present invention is not limited to the above embodiment.

以下、実験例を挙げて本発明の内容をより具体的に説明する。なお、本発明は下記実験例に限定されるものではない。以下の記載中、含有量ないし使用量を表す「部」及び「%」は、特記ない限り重量基準である。 Hereinafter, the content of the present invention will be described in more detail with reference to experimental examples. The present invention is not limited to the following experimental examples. In the following description, "part" and "%" indicating the content or the amount used are based on weight unless otherwise specified.

各物性の測定は、次の方法で行った。
(1)フィルム厚さの測定方法
株式会社ニコン製のデジタルマイクロメーターであるMH−15Mを用いて測定した。
(2)位相差値の測定方法
位相差測定装置KOBRA−WPR(王子計測機器株式会社製)を用いて測定した。なお、以下の表記において、前記のRe(550)と同様に、波長450nm及び波長650nmの光に対する面内位相差をそれぞれ、「Re(450)」、「Re(650)」という。
(3)位相差フィルタ透過した光の透過率の測定
分光放射計((株)トプコンテクノハウス製、SR−UL1)を、測定面から1m離して設置し、測定角2°視野とした状態で輝度を測定した。光源の輝度に対して何%の光が位相差フィルタを透過しているかを計算した。
(4)円偏光板の偏光度及び単体透過率の測定:
積分球付き分光光度計〔日本分光株式会社製の「V7100」、2度視野;C光源〕を用いて測定した。
Each physical property was measured by the following method.
(1) Method for measuring film thickness The film thickness was measured using a digital micrometer MH-15M manufactured by Nikon Corporation.
(2) Method for measuring the phase difference value The measurement was performed using the phase difference measuring device KOBRA-WPR (manufactured by Oji Measuring Instruments Co., Ltd.). In the following notation, similarly to the above-mentioned Re (550), the in-plane phase difference with respect to light having a wavelength of 450 nm and a wavelength of 650 nm is referred to as “Re (450)” and “Re (650)”, respectively.
(3) Measurement of transmittance of light transmitted through a phase difference filter A spectroradiometer (SR-UL1 manufactured by Topcon Techno House Co., Ltd.) is installed 1 m away from the measurement surface and has a measurement angle of 2 °. The brightness was measured. It was calculated what percentage of the light was passing through the phase difference filter with respect to the brightness of the light source.
(4) Measurement of polarization degree and simple substance transmittance of circular polarizing plate:
The measurement was performed using a spectrophotometer with an integrating sphere [“V7100” manufactured by JASCO Corporation; 2 degree field of view; C light source].

[直線偏光板の作製]
厚さ30μmのポリビニルアルコールフィルム(平均重合度約2400、ケン化度99.9モル%以上)を、乾式延伸により約4倍に一軸延伸し、さらに緊張状態を保ったまま、40℃の純水に40秒間浸漬した後、ヨウ素/ヨウ化カリウム/水の重量比が0.052/5.7/100の水溶液に28℃で30秒間浸漬して染色処理を行った。その後、ヨウ化カリウム/ホウ酸/水の重量比が11.0/6.2/100の水溶液に70℃で120秒間浸漬した。引き続き、8℃の純水で15秒間洗浄した後、300Nの張力で保持した状態で、60℃で50秒間、次いで75℃で20秒間乾燥して、ポリビニルアルコールフィルムにヨウ素が吸着配向している厚み12μmの吸収型偏光子を得た。
[Preparation of linear polarizing plate]
A 30 μm-thick polyvinyl alcohol film (average degree of polymerization of about 2400, saponification degree of 99.9 mol% or more) was uniaxially stretched about 4 times by dry stretching, and pure water at 40 ° C. was further maintained in a tense state. Was immersed in an aqueous solution having a weight ratio of iodine / potassium iodide / water of 0.052 / 5.7 / 100 for 40 seconds, and then immersed in an aqueous solution at 28 ° C. for 30 seconds for dyeing. Then, it was immersed in an aqueous solution having a weight ratio of potassium iodide / boric acid / water of 11.0 / 6.2 / 100 at 70 ° C. for 120 seconds. Subsequently, after washing with pure water at 8 ° C. for 15 seconds, while holding at a tension of 300 N, the iodine was adsorbed and oriented on the polyvinyl alcohol film by drying at 60 ° C. for 50 seconds and then at 75 ° C. for 20 seconds. An absorption type polarizer having a thickness of 12 μm was obtained.

得られた偏光フィルムの両面に、接着剤層の厚さが0.1μmになるようにポリビニルアルコール系接着剤を塗布しながら、保護フィルム(トリアセチルセルロース(TAC)フィルム(商品名:KC2UAW、厚み:25μm、コニカミノルタ社製)を貼合したのち、80℃で2分間の乾燥を行い、直線偏光板を作製した。得られた直線偏光板の偏光度は、99.995%、単体透過率42.5%であった。 A protective film (triacetyl cellulose (TAC) film (trade name: KC2UAW, thickness) is applied to both sides of the obtained polarizing film while applying a polyvinyl alcohol-based adhesive so that the thickness of the adhesive layer is 0.1 μm. : 25 μm, manufactured by Konica Minolta Co., Ltd.) and then dried at 80 ° C. for 2 minutes to prepare a linear polarizing plate. The obtained linear polarizing plate had a degree of polarization of 99.995% and a single transmission rate. It was 42.5%.

[重層性液晶化合物の硬化物からなる位相差膜の作製]
下記化学構造を有する光配向性材料5部(重量平均分子量:30000)とシクロペンタノン(溶媒)95部とを成分として混合し、得られた混合物を80℃で1時間攪拌することにより、配向膜形成用組成物を得た。

Figure 2020160421
[Preparation of retardation film made of cured product of multi-layer liquid crystal compound]
Five parts of a photo-oriented material having the following chemical structure (weight average molecular weight: 30,000) and 95 parts of cyclopentanone (solvent) are mixed as components, and the obtained mixture is stirred at 80 ° C. for 1 hour for orientation. A film-forming composition was obtained.
Figure 2020160421

以下に示す重合性液晶化合物A、及び、重合性液晶化合物Bを90:10の質量比で混合した混合物に対して、レベリング剤(F−556;DIC社製)を1.0部、及び重合開始剤である2−ジメチルアミノ−2−ベンジル−1−(4−モルホリノフェニル)ブタン−1−オン(「イルガキュア369(Irg369)」、BASFジャパン株式会社製)を6部添加した。さらに、固形分濃度が13%となるようにN−メチル−2−ピロリドン(NMP)を添加し、80℃で1時間攪拌することにより、液晶硬化膜形成用組成物を得た。ここで、重合性液晶化合物Aは特開2010−31223号公報に記載の方法で製造した。また、重合性液晶化合物Bは、特開2009−173893号公報に記載の方法に準じて製造した。以下にそれぞれの分子構造を示す。
(重合性液晶化合物A)

Figure 2020160421

(重合性液晶化合物B)
Figure 2020160421
1.0 part of a leveling agent (F-556; manufactured by DIC) and polymerization of a mixture of the polymerizable liquid crystal compound A and the polymerizable liquid crystal compound B shown below at a mass ratio of 90:10. Six parts of 2-dimethylamino-2-benzyl-1- (4-morpholinophenyl) butane-1-one (“Irgacure 369 (Irg369)”, manufactured by BASF Japan Ltd.) as an initiator was added. Further, N-methyl-2-pyrrolidone (NMP) was added so that the solid content concentration was 13%, and the mixture was stirred at 80 ° C. for 1 hour to obtain a composition for forming a liquid crystal cured film. Here, the polymerizable liquid crystal compound A was produced by the method described in JP-A-2010-31223. Further, the polymerizable liquid crystal compound B was produced according to the method described in JP-A-2009-173893. The molecular structure of each is shown below.
(Polymerizable liquid crystal compound A)
Figure 2020160421

(Polymerizable liquid crystal compound B)
Figure 2020160421

[基材、配向膜、重合性液晶化合物が硬化した層からなる積層体の製造]
基材として厚さ50μmのシクロオレフィン系フィルム〔日本ゼオン(株)製の商品名「ZF−14−50」〕上にコロナ処理を実施した後、上記の配向膜形成用組成物をバーコーターで塗布し、80℃で1分間乾燥し、偏光UV照射装置〔ウシオ電機(株)の商品名「SPOT CURE SP−9」〕を用いて、波長313nmにおける積算光量:100mJ/cm2で軸角度45°にて偏光UV露光を実施した。続いて、配向膜に、上記の液晶硬化膜形成用組成物を、バーコーターを用いて塗布し、120℃で1分間乾燥した後、高圧水銀ランプ〔ウシオ電機(株) の商品名:「ユニキュアVB−15201BY−A」〕を用いて、紫外線を照射(窒素雰囲気下、波長365nmにおける積算光量:500mJ/cm2)することにより、重合性液晶化合物が硬化した層を形成した。これにより、基材、配向膜及び重合性液晶化合物が硬化した層からなる積層体を得た。
[Manufacture of a laminate consisting of a base material, an alignment film, and a layer obtained by curing a polymerizable liquid crystal compound]
After corona treatment is performed on a cycloolefin film having a thickness of 50 μm as a base material [trade name “ZF-14-50” manufactured by Nippon Zeon Co., Ltd.], the above composition for forming an alignment film is applied with a bar coater. It is applied, dried at 80 ° C. for 1 minute, and using a polarized UV irradiation device [trade name "SPOT CURE SP-9" of Ushio Denki Co., Ltd.], the integrated light intensity at a wavelength of 313 nm: 100 mJ / cm2 and an axial angle of 45 °. Polarized UV exposure was carried out at. Subsequently, the above composition for forming a liquid crystal cured film is applied to the alignment film using a bar coater, dried at 120 ° C. for 1 minute, and then a high-pressure mercury lamp [Ushio Denki Co., Ltd. trade name: "Unicure". By irradiating with ultraviolet rays (integrated light amount at a wavelength of 365 nm under a nitrogen atmosphere: 500 mJ / cm2) using VB-15201BY-A], a layer in which the polymerizable liquid crystal compound was cured was formed. As a result, a laminate composed of a base material, an alignment film, and a layer in which the polymerizable liquid crystal compound was cured was obtained.

上記方法にて製造した重合性液晶化合物が硬化した層の面内の位相差値Re(λ)は、粘着剤を介してガラスに貼合した後、基材であるシクロオレフィン系フィルムを剥離した後に測定した。各波長における位相差値Re(λ)を測定結果は、Re(450)=121nm、Re(550)=142nm、Re(650)=146nm、Re(450)/Re(550)=0.85、Re(650)/Re(550)=1.03であった。 The in-plane retardation value Re (λ) of the layer on which the polymerizable liquid crystal compound produced by the above method was cured was bonded to glass via an adhesive, and then the cycloolefin-based film as a base material was peeled off. It was measured later. The measurement results of the phase difference value Re (λ) at each wavelength are Re (450) = 121 nm, Re (550) = 142 nm, Re (650) = 146 nm, Re (450) / Re (550) = 0.85, Re (650) / Re (550) = 1.03.

[円偏光板、及び、被検査物の作製]
上記の直線偏光板の片面に粘着剤層を形成し、重合性液晶化合物の硬化物からなる層、すなわち位相差膜を貼合した。このとき、位相差膜の遅相軸と直線偏光板の吸収軸とのなす角が45°(直線偏光板側から見たとき時計回りに45°)となるように貼合した。そして、位相差膜に更に粘着剤像を形成し、位相差値が2000nmであるPETフィルムを剥離フィルムとして貼合し、被検査物を作製した。
[Preparation of circularly polarizing plate and object to be inspected]
An adhesive layer was formed on one side of the above-mentioned linear polarizing plate, and a layer made of a cured product of a polymerizable liquid crystal compound, that is, a retardation film was bonded. At this time, they were bonded so that the angle formed by the slow axis of the retardation film and the absorption axis of the linear polarizing plate was 45 ° (45 ° clockwise when viewed from the linear polarizing plate side). Then, an adhesive image was further formed on the retardation film, and a PET film having a retardation value of 2000 nm was bonded as a release film to prepare an object to be inspected.

[位相差フィルタの作製]
上記の直線偏光板を別途用意し、その片面に粘着剤層を形成し、上記位相差膜の遅相軸と直線偏光板の吸収軸とのなす角が−45°(直線偏光板側から見たときに反時計回りに45°)となるように位相差膜を貼合し、位相差フィルタを作製した。
[Making a phase difference filter]
The above linear polarizing plate is prepared separately, an adhesive layer is formed on one side thereof, and the angle between the slow axis of the retardation film and the absorption axis of the linear polarizing plate is −45 ° (viewed from the linear polarizing plate side). A retarding film was attached so that the temperature would be 45 ° counterclockwise) to prepare a retardation filter.

[位相差板の作製]
位相差板として、4Z−Y004(東レ株式会社製、Re(550)が150nm〜180nm)を用いた。作製した位相差値は、1720nm〜2350nmまで70nm刻みとした。作製した位相差板の一覧を表1に示す。この表の見方は、最も左のカラムは、各位相差領域における位相差値(面内位相差値)を示す。例えば、位相差値1720nmの領域は、位相差値155nmの位相差板10枚と、位相差値170nmの位相差板1枚とを積層することで調製したことを示す(155nm×10+170nm=1720nm)。なお、各領域の厚さ方向の位相差値は、面内位相差値の4.8倍程度であった。
[Making a retardation plate]
As the retardation plate, 4Z-Y004 (manufactured by Toray Industries, Inc., Re (550) of 150 nm to 180 nm) was used. The produced retardation value was set in 70 nm increments from 1720 nm to 2350 nm. Table 1 shows a list of the produced retardation plates. In the view of this table, the leftmost column shows the phase difference value (in-plane phase difference value) in each phase difference region. For example, it is shown that the region having a retardation value of 1720 nm was prepared by laminating 10 retardation plates having a retardation value of 155 nm and one retardation plate having a retardation value of 170 nm (155 nm × 10 + 170 nm = 1720 nm). .. The phase difference value in the thickness direction of each region was about 4.8 times the in-plane retardation value.

Figure 2020160421
Figure 2020160421

[被検査物の検査]
上記で作製した検査装置により、被検査物の欠陥の有無を検査した。バックライト(光源)/被検査物(剥離フィルム側が光源と反対側を向くように配置した)/位相差板/位相差フィルタの順に光学系を構成した。位相差板は面内位相差値が2000nm及び2070nmの位相差領域を使用した。こうして最も暗い状態での輝度を測定したところ、問題なく輝点欠陥を検出できたが、輝度が入射光量の11.5%程度である黒点として観察される欠陥も確認された。
[Inspection of the object to be inspected]
The inspection device manufactured above was used to inspect the object to be inspected for defects. The optical system was configured in the order of backlight (light source) / object to be inspected (arranged so that the release film side faces the opposite side of the light source) / retardation plate / retardation filter. For the retardation plate, a retardation region having in-plane retardation values of 2000 nm and 2070 nm was used. When the brightness in the darkest state was measured in this way, the bright spot defect could be detected without any problem, but the defect observed as a black spot whose brightness was about 11.5% of the incident light amount was also confirmed.

次いで、位相差板の面内方向の位相差値を2070nmに変更してその黒点部分を検査したところ、上記の黒点として観察された欠陥が、輝点欠陥として正しく検出することができた。 Next, when the in-plane retardation value of the retardation plate was changed to 2070 nm and the black spot portion was inspected, the defect observed as the above black spot could be correctly detected as a bright spot defect.

この例では、図1に示されているように、バックライトからの光が被検査物10、位相差板4及び位相差フィルタ3の順に透過するように組み立てた検査装置100Aの実験例を示したが、図5に示されているように、バックライトからの光が位相差フィルタ3、位相差板4及び被検査物10の順に透過するように組み立てた検査装置100Bでも同様に、黒点として観察された欠陥を輝点欠陥として正しく検出することができる。 In this example, as shown in FIG. 1, an experimental example of an inspection device 100A assembled so that the light from the backlight is transmitted in the order of the object to be inspected 10, the retardation plate 4, and the retardation filter 3 is shown. However, as shown in FIG. 5, the inspection device 100B assembled so that the light from the backlight is transmitted in the order of the retardation filter 3, the retardation plate 4, and the object to be inspected 10 also has black spots. Observed defects can be correctly detected as bright spot defects.

本発明は、円偏光板の品質検査に利用することができる。 The present invention can be used for quality inspection of circularly polarizing plates.

1…円偏光板、2…光源、3…位相差フィルタ、4(4A,4B)…位相差板、5…検出手段、9…光軸、10…被検査物、11…偏光フィルム、12a,12b…保護フィルム、13…粘着剤層、14…位相差膜、15…粘着剤層、16a,16b…剥離フィルム、100A,100B…検査装置、a,b…第1の領域(第1の位相差板)、a,b…第2の領域(第2の位相差板)、a…第nの領域(第nの位相差板)。

1 ... circular polarizing plate, 2 ... light source, 3 ... retardation filter, 4 (4A, 4B) ... retardation plate, 5 ... detection means, 9 ... optical axis, 10 ... inspected object, 11 ... polarizing film, 12a, 12b ... protective film, 13 ... adhesive layer, 14 ... retardation film, 15 ... adhesive layer, 16a, 16b ... release film, 100A, 100B ... inspection device, a 1 , b 1 ... first region (first region) retardation plate), a 2, b 2 ... second region (second retardation plate), a n ... n-th area (retardation film of the n).

Claims (7)

円偏光板、及び、ポリエチレンテレフタレート系樹脂からなる剥離フィルムを備えるフィルム状の被検査物の欠陥の有無を判断する検査方法であって、
前記被検査物と、
波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値と略同一であり、且つ、前記剥離フィルムが有する複屈折を補償するものである第1の位相差板と、
前記円偏光板とクロスニコルを構成する位相差フィルタと、をこの順に並ぶように配置し、
前記被検査物側又は前記位相差フィルタ側のいずれか一方側から光を入射し、その他方側から前記位相差フィルタ又は前記被検査物を観察して前記円偏光板の欠陥の有無を判断し、
前記第1の位相差板を、波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値よりも50〜100nm大きく、且つ、前記剥離フィルムが有する複屈折を補償するものである第2の位相差板に置き換え、
前記被検査物側又は前記位相差フィルタ側のいずれか一方側から光を入射し、その他方側から前記位相差フィルタ又は前記被検査物を観察する、検査方法。
This is an inspection method for determining the presence or absence of defects in a film-shaped object to be inspected, which includes a circularly polarizing plate and a release film made of polyethylene terephthalate resin.
With the object to be inspected
A first retardation plate having an in-plane retardation value at a wavelength of 550 nm substantially the same as the in-plane retardation value of the release film at a wavelength of 550 nm and compensating for birefringence of the release film.
The circularly polarizing plate and the phase difference filter constituting the cross Nicol are arranged in this order.
Light is incident from either the inspected object side or the retardation filter side, and the retardation filter or the inspected object is observed from the other side to determine the presence or absence of defects in the circular polarizing plate. ,
The first retardation plate has an in-plane retardation value at a wavelength of 550 nm larger than the in-plane retardation value at a wavelength of 550 nm of the release film by 50 to 100 nm, and compensates for the birefringence of the release film. Replaced with the second retardation plate,
An inspection method in which light is incident from either one of the inspected object side or the retardation filter side, and the retardation filter or the inspected object is observed from the other side.
前記円偏光板は、重合性液晶化合物の硬化物からなる位相差膜を有するものである、請求項1記載の検査方法。 The inspection method according to claim 1, wherein the circularly polarizing plate has a retardation film made of a cured product of a polymerizable liquid crystal compound. 前記被検査物、前記第1の位相差板、前記第2の位相差板、及び、前記位相差フィルタの少なくとも一つを、互いに対面する角度が異なるように傾ける、又は、前記光の光軸に垂直な方向に回転させる、請求項1又は2記載の検査方法。 At least one of the object to be inspected, the first retardation plate, the second retardation plate, and the retardation filter is tilted so as to face each other at different angles, or the optical axis of the light. The inspection method according to claim 1 or 2, wherein the inspection method is rotated in a direction perpendicular to the optic axis. 前記第1の位相差板及び前記第2の位相差板は、互いに同一の部材内に配置されて構成されたものである、請求項1〜3のいずれか一項記載の検査方法。 The inspection method according to any one of claims 1 to 3, wherein the first retardation plate and the second retardation plate are arranged and configured in the same member. 円偏光板と、ポリエチレンテレフタレート系樹脂からなる剥離フィルムとを備えるフィルム状の被検査物に光を入射して前記円偏光板の欠陥の有無を判断する検査装置であって、
光源と、
前記光源から発せられ前記被検査物により円偏光に変換された光を入射させる位相差フィルタと、
前記被検査物が配置される場所よりも前記光源から遠い側、且つ、前記位相差フィルタが配置される場所よりも前記光源に近い側に配置され、前記円偏光を通過させる位相差板と、を備え、
前記位相差板は、波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値と略同一である第1の位相差板と、波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値よりも50〜100nm大きい第2の位相差板とを含み、前記第1の位相差板及び前記第2の位相差板は、前記剥離フィルムが有する複屈折を補償するものである、検査装置。
An inspection device for determining the presence or absence of defects in the circularly polarizing plate by injecting light onto a film-shaped object to be inspected including a circularly polarizing plate and a release film made of a polyethylene terephthalate resin.
Light source and
A phase difference filter that incidents light emitted from the light source and converted into circularly polarized light by the object to be inspected.
A retardation plate arranged on the side farther from the light source than the place where the object to be inspected is placed and on the side closer to the light source than the place where the retardation filter is placed and to pass the circularly polarized light. With
The retardation plate has a first retardation plate in which the in-plane retardation value at a wavelength of 550 nm is substantially the same as the in-plane retardation value at a wavelength of 550 nm of the release film, and the in-plane retardation value at a wavelength of 550 nm. The first retardation plate and the second retardation plate include a second retardation plate that is 50 to 100 nm larger than the in-plane retardation value at a wavelength of 550 nm of the release film. An inspection device that compensates for refraction.
円偏光板と、ポリエチレンテレフタレート系樹脂からなる剥離フィルムとを備えるフィルム状の被検査物に円偏光を入射して前記円偏光板の欠陥の有無を判断する検査装置であって、
光源と、
前記光源が発する光を前記円偏光に変換する位相差フィルタと、
前記被検査物が配置される場所よりも前記光源に近い側、且つ、前記位相差フィルタが配置される場所よりも前記光源から遠い側に配置され、前記円偏光を通過させる位相差板と、を備え、
前記位相差板は、波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値と略同一である第1の位相差板と、波長550nmにおける面内位相差値が前記剥離フィルムの波長550nmにおける面内位相差値よりも50〜100nm大きい第2の位相差板とを含み、前記第1の位相差板及び前記第2の位相差板は、前記剥離フィルムが有する複屈折を補償するものである、検査装置。
An inspection device for determining the presence or absence of defects in the circularly polarizing plate by injecting circularly polarized light into a film-shaped object to be inspected including a circularly polarizing plate and a release film made of a polyethylene terephthalate resin.
Light source and
A phase difference filter that converts the light emitted by the light source into the circularly polarized light,
A retardation plate arranged on the side closer to the light source than the place where the object to be inspected is placed and on the side farther from the light source than the place where the retardation filter is placed and to pass the circularly polarized light. With
The retardation plate has a first retardation plate in which the in-plane retardation value at a wavelength of 550 nm is substantially the same as the in-plane retardation value at a wavelength of 550 nm of the release film, and the in-plane retardation value at a wavelength of 550 nm. The first retardation plate and the second retardation plate include a second retardation plate that is 50 to 100 nm larger than the in-plane retardation value at a wavelength of 550 nm of the release film. An inspection device that compensates for refraction.
前記位相差板は、前記第1の位相差板及び前記第2の位相差板が同一の部材内に配置されて構成されたものである、請求項5又は6記載の検査装置。

The inspection device according to claim 5 or 6, wherein the retardation plate is configured by arranging the first retardation plate and the second retardation plate in the same member.

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