TW202348954A - Optical detecting system and operating method thereof - Google Patents

Abstract

An optical detecting system is configured to detect a to-be tested device having a first linear polarizer and a quarter-wave plate. The optical detecting system includes a light source, a polarization adjustment assembly, and a detecting unit. The light source has a light emitting surface and is configured to emit light. The polarization adjustment assembly faces the light emitting surface of the light source. The polarization adjustment assembly is configured to convert the light to linearly polarized light. The first linear polarizer is located between the polarization adjustment assembly and the quarter-wave plate. The to-be tested device is configured to convert the linearly polarized light to circularly polarized light. The detecting unit is located on a side of the to-be tested device facing away from the polarization adjustment assembly. The detecting unit is configured to calculate an including angle between an absorption axis of the first linear polarizer and a fast axis of the quarter-wave plate of the to-be tested device based on the circularly polarized light.

Description

Optical detection system and method of operation thereof

The present disclosure relates to an optical detection system and an operating method of the optical detection system.

Generally speaking, the optical components in virtual reality (VR) products are mainly composed of linear polarizers and quarter-wave plates. The linear polarization directionality and quarter-wave plate of the linear polarizers are judged by testing equipment. Whether the circular polarization directivity of a wave plate is shifted. However, the inspection process of existing inspection equipment requires the input of material-related parameters of quarter-wave plates and linear polarizers, such as thickness, refractive index, and extinction coefficient, which increases the overall operation time and operational complexity.

One technical aspect of the present disclosure is an optical detection system.

According to an embodiment of the present disclosure, an optical detection system is configured to detect a device under test having a first linear polarizer and a quarter-wave plate. The optical detection system includes: light source, polarization adjustment component and detection unit. The light source has a light exit surface and is configured to emit light. The polarization adjustment component faces the light exit surface of the light source. The polarization adjustment component is configured to convert light into linearly polarized light. The first linear polarizer is located between the polarization adjustment component and the quarter wave plate. The element under test is configured to convert linearly polarized light into circularly polarized light. The detection unit is located on the side of the component under test facing away from the polarization adjustment component. The detection unit is configured to calculate a phase difference angle between the absorption axis of the first linear polarizer of the component under test and the fast axis of the quarter-wave plate of the component under test based on the circularly polarized light.

In an embodiment of the present disclosure, the above-mentioned polarization adjustment component includes a depolarizer. The depolarizer is located between the light source and the first linear polarizer of the component under test. Depolarizers are configured to convert light into unpolarized light.

In an embodiment of the present disclosure, the above-mentioned polarization adjustment component further includes a second linear polarizing plate. The second linear polarizer is located between the depolarizer and the first linear polarizer of the device under test. The second linear polarizer is configured to convert unpolarized light into linearly polarized light.

In an embodiment of the present disclosure, the above-mentioned optical detection system further includes a condenser. The condenser is located between the component under test and the detection unit.

In an embodiment of the present disclosure, the center wavelength of the quarter-wave plate is the same as the wavelength of the light.

In an embodiment of the present disclosure, the above-mentioned light source is a laser light source.

One technical aspect of the present disclosure is an operating method of an optical detection system.

According to an embodiment of the present disclosure, an operating method of an optical detection system includes: emitting light to a polarization adjustment component through a light source; converting the light into linearly polarized light through the polarization adjustment component and transmitting it to a component under test, wherein the component under test has The first linear polarizer and the quarter-wave plate. The first linear polarizer is located between the polarization adjustment component and the quarter-wave plate; the component under test converts linearly polarized light into circularly polarized light and transmits it to the detection unit; and calculate the phase difference angle between the absorption axis of the first linear polarizer of the component under test and the fast axis of the quarter-wave plate of the component under test based on the circularly polarized light.

In an embodiment of the present disclosure, the above-mentioned calculation of the phase difference angle based on circularly polarized light further includes: rotating the component under test to obtain the light intensity and optical rotation intensity of the component under test; and calculating the maximum elliptical polarization of the component under test based on the light intensity and optical rotation intensity. Rate.

In an embodiment of the present disclosure, the above-mentioned conversion of light into linearly polarized light through the polarization adjustment component and emitting it to the device under test further includes: converting the light into unpolarized light through the depolarizer of the polarization adjustment component and emitting it to the polarized light. The second linear polarizer of the adjustment component; and the second linear polarizer of the polarization adjustment component converts the polarized light into linearly polarized light and transmits it to the device under test.

In an embodiment of the present disclosure, the above-mentioned calculation of the phase difference angle based on circularly polarized light further includes: rotating the second linear polarizer to obtain the light intensity and optical rotation intensity of the component under test; and calculating the maximum maximum value of the component under test based on the light intensity and optical rotation intensity. Elliptical polarization ratio.

In an embodiment of the present disclosure, the above step of converting linearly polarized light into circularly polarized light through the device under test and transmitting it to the detection unit further includes: using a condenser to reduce the spot diameter of the circularly polarized light passing through the device under test to Between 0.1mm and 5mm and launched to the detection unit.

In the above-mentioned embodiments of the present disclosure, the detection unit of the optical detection system can calculate the absorption axis of the first linear polarizer of the component under test and the fast speed of the quarter-wave plate of the component under test based on the circularly polarized light passing through the component under test. The angle of difference between the axes. When the phase difference angle approaches 0, the optical detection system can determine the absorption axis (i.e., linear polarization direction) of the first linear polarizer of the component under test and the fast axis (i.e., circular polarization direction) of the quarter-wave plate. There is no offset, ensuring that every component under test inspected by the optical inspection system has the same quality performance. In addition, when the detection unit of the optical detection system detects the component to be tested, it does not need to input the material-related parameters of the component to be tested (such as thickness, refractive index, and extinction coefficient), which can save the inspection time of the optical detection system and reduce the overall operation. complexity.

The following disclosure of embodiments provides many different implementations, or examples, for implementing various features of the provided subject matter. Specific examples of components and arrangements are described below to simplify the present application. Of course, these examples are examples only and are not intended to be limiting. Additionally, reference symbols and/or letters may be repeated in each instance. This repetition is for simplicity and clarity and does not by itself specify a relationship between the various embodiments and/or configurations discussed.

Spatially relative terms such as “below,” “below,” “lower,” “above,” “upper,” and the like may be used herein for convenience of description, to describe The relationship of one element or feature to another element or feature is illustrated in the drawings. Spatially relative terms are intended to encompass different orientations of the device in use or methods of operation in addition to the orientation illustrated in the figures. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

Figure 1 is a schematic diagram of the operation of the optical detection system 100 according to an embodiment of the present disclosure. The optical detection system 100 is configured to detect the component under test 200 having the first linear polarizer 210 and the quarter-wave plate 220 . For example, the device under test 200 can be a lens of virtual reality (VR) glasses, but is not limited thereto. The optical detection system 100 includes a light source 110, a polarization adjustment component 120 and a detection unit 130. The light source 110 of the optical detection system 100 has a light exit surface 112 and is configured to emit light L. In some embodiments, the light source 110 may be a laser light source 110, and the laser light source 110 may emit green laser light with a wavelength of 532 nm and a power of 20 mW. In addition, the center wavelength of the quarter-wave plate 220 of the device under test 200 is the same as the wavelength of the light L. For example, when the surface of the device under test 200 is a plane, the central wavelength of the quarter-wave plate 220 of the device under test 200 and the wavelength of the light L can be 532 nm, but this is not a limitation.

In addition, the polarization adjustment component 120 of the optical detection system 100 faces the light exit surface 112 of the light source 110 . The polarization adjustment component 120 includes a depolarizer 122 and a second linear polarizer 124 . The depolarizer 122 of the polarization adjustment component 120 is located between the light source 110 and the second linear polarizer 124 . The second linear polarizer 124 of the polarization adjustment component 120 is located between the depolarizer 122 and the first linear polarizer 210 of the device under test 200 . The first linear polarizing plate 210 of the device under test 200 is located between the second linear polarizing plate 124 of the polarization adjustment assembly 120 and the quarter-wave plate 220 of the device under test 200 . Both the second linear polarizing plate 124 and the device under test 200 can be located on the rotating system and can rotate. In some embodiments, the detection unit 130 is located on a side of the component under test 200 facing away from the polarization adjustment component 120 . That is to say, the detection unit 130 and the polarization adjustment component 120 are located on opposite sides of the component under test 200, and the first linear polarizing plate 210 of the component under test 200 is closer to the polarization adjustment component 120 than the quarter wave plate 220. The quarter wave plate 220 of the element 200 is closer to the detection unit 130 than the first linear polarizing plate 210 .

In some embodiments, the device under test 200 may include a substrate 230 . The first linear polarizing plate 210 and the quarter-wave plate 220 of the device under test 200 are attached to opposite sides of the substrate 230, and the material of the substrate 230 may include glass and polymer materials. The detection unit 130 of the optical detection system 100 may include a processor or chip with a preset circuit layout or built-in application program. The detection unit 130 can calculate the light intensity, circular polarization direction and light rotation intensity received by the component under test 200 to achieve the effect of optical alignment detection of the component under test 200 . For example, the optical detection system 100 can detect whether the component under test 200 has a suitable polarization direction and angle. When users wear virtual reality glasses to view stereoscopic images, phenomena such as penetration axis tilt or cross talk can be reduced.

It should be understood that the connection relationships and functions of the components that have been described will not be repeated and will be explained first. In the following description, the operation method of the optical detection system will be explained.

FIG. 2 illustrates a flowchart of an operating method of an optical detection system according to an embodiment of the present disclosure. The operating method of the optical detection system includes the following steps. First, in step S1, the light source is used to emit light to the polarization adjustment component. Then in step S2, the light is converted into linearly polarized light by the polarization adjustment component and emitted to the device under test, where the device under test has a first linear polarizer and a quarter-wave plate, and the first linear polarizer is located at the polarization between the adjustment component and the quarter-wave plate. Then, in step S3, the linearly polarized light is converted into circularly polarized light by the element under test and emitted to the detection unit. Next, in step S4, the phase difference angle between the absorption axis of the first linear polarizer of the component under test and the fast axis of the quarter-wave plate of the component under test is calculated based on the circularly polarized light. In the following description, each of the above steps will be explained in detail.

Referring to FIGS. 1 and 3 simultaneously, first, the light source 110 can emit light L to the polarization adjustment component 120 . For example, the light source 110 may be a laser light source 110, and the light source 110 may emit green laser light with a wavelength of 532 nm to the depolarizer 122 of the polarization adjustment component 120. In some embodiments, the depolarizer 122 of the polarization adjustment component 120 may convert the received light L into unpolarized light P1 and emit the non-polarized light P1 to the second linear polarizer 124 of the polarization adjustment component 120 . The second linear polarizer 124 of the polarization adjustment component 120 can convert the received unpolarized light P1 into linearly polarized light P2, and emit the linearly polarized light P2 to the device under test 200.

In some embodiments, the device under test 200 has a first linear polarizer 210 , a quarter-wave plate 220 , and a substrate 230 located between the first linear polarizer 210 and the quarter-wave plate 220 . For example, the device under test 200 can be a lens of virtual reality (VR) glasses, but is not limited thereto. In some embodiments, the center wavelength of the quarter-wave plate 220 of the device under test 200 is the same as the wavelength of the light L. For example, the center wavelength of the quarter-wave plate 220 of the device under test 200 and the wavelength of the light L can be 532 nm, but this is not a limitation. The device under test 200 can convert the received linearly polarized light P2 into circularly polarized light P3, and emit the circularly polarized light P3 to the light-collecting surface 132 of the detection unit 130.

In some embodiments, the detection unit 130 may include a processor or chip with a preset circuit layout or built-in application program. The detection unit 130 can calculate the elliptical polarization rate (Ellipticity) of the component under test 200 based on the circularly polarized light P3. Specifically, the second linear polarizing plate 124 of the polarization adjustment component 120 can be rotated by the rotation system or the stage (not shown) carrying the device under test 200 can be rotated by the rotation system to obtain the light everywhere on the device under test 200 intensity and optical rotation intensity, and the detection unit 130 can calculate the maximum elliptical polarization rate of the component under test 200 based on the light intensity and optical rotation intensity of the component under test 200 . For example, the detection unit 130 can measure the light intensity and optical rotation intensity every time the second linear polarizing plate 124 or the stage carrying the component under test 200 rotates 10 degrees, and the detection unit 130 can use Stork's The Stokes vector is used to calculate the elliptical polarization rate of the component under test 200 . The mathematical formula of elliptical polarization rate can be , where I, Q, U and V are the four parameters of the Stokes vector.

After calculating the maximum elliptical polarization rate of the component under test 200, the detection unit 130 can convert the value of the maximum elliptical polarization ratio into the absorption axis (see Figure 3) of the first linear polarizing plate 210 of the component under test 200 and the value of the component under test. The phase difference angle between the fast axes (see Figure 3) of the quarter wave plate 220 of the element 200. For example, the angle a between the azimuth angle and the fast axis of the quarter-wave plate 220 is subtracted from the angle b (a negative number) between the azimuth angle and the absorption axis of the first linear polarizing plate 210 , and then the theoretical angle b is subtracted. value (i.e. 135 degrees), you can get the phase difference angle.

Specifically, when the phase difference angle approaches 0, the optical detection system 100 can determine the absorption axis (that is, the linear polarization direction) of the first linear polarizer 210 of the component under test 200 and the velocity of the quarter-wave plate 220 . There is no offset in the axis (that is, the direction of circular polarization), which ensures that each component under test 200 inspected by the optical inspection system 100 has the same quality performance. In addition, when the detection unit 130 of the optical detection system 100 detects the component to be tested 200, it does not need to input the material-related parameters (such as thickness, refractive index and extinction coefficient) of the component to be tested 200, which can save the time of the optical detection system 100 for detection. time and reduce overall operational complexity.

Figures 4A to 7 illustrate the relationship between phase difference angle and elliptical polarization rate according to different embodiments of the present disclosure. Please refer to Figure 1, Figure 4A and Figure 4B. When the surface of the component under test 200 is flat, the reference wavelength of the light L and the central wavelength of the quarter-wave plate 220 can be 532nm. In Figures 4A and 4B, the horizontal axis is the value of the phase difference angle (degrees), and the vertical axis is the value of the elliptical polarization rate (maximum is 1). The diamond symbol is the experimental value at the reference wavelength of 532nm. It can be seen from the measurement line segment 410 and the experimental line segment 420 composed of diamond symbols that the larger the elliptical polarization rate (Ellipticity), the smaller the phase difference angle, which represents the absorption axis ( That is, the linear polarization direction) and the fast axis of the quarter-wave plate 220 (that is, the circular polarization direction) are aligned more accurately. For example, the experimental line segment 420 can be obtained through mathematical simulation software (such as LightTools). In the real measurement line segment 410 and the experimental line segment 420 of the experimental data model, the elliptical polarization rate exhibits a negative correlation with the phase difference angle. That is, the greater the elliptical polarization rate, the smaller the absolute value of the phase difference angle. In addition, R squared can be calculated by measuring the line segment 410 . R-squared can also be called the coefficient of determination. When R square approaches 1, the explanatory power of the model is higher, and as long as R square is greater than 0.75, it has model explanatory power. In this embodiment, the R-squared of the real measurement line segment 410 may be 0.78.

Please refer to Figure 1, Figure 5A, Figure 5B and Figure 5C. When the surface of the component under test 200 is a curved surface, the reference wavelength of the light L and the central wavelength of the quarter-wave plate 220 can be 589nm. In Figure 5, the horizontal axis represents the value of the phase difference angle, and the vertical axis represents the value of the elliptical polarization rate. According to the measurement line segment 510 and the experimental line segment 520, it can be known that when the elliptical polarization rate (Ellipticity) is larger, the phase difference angle is smaller, which represents the absorption axis (that is, the linear polarization direction) of the first linear polarizing plate 210 of the device under test 200. ) and the fast axis (that is, the circular polarization direction) of the quarter-wave plate 220 does not shift. For example, the experimental line segment 520 can be obtained through mathematical simulation software (such as Zemax). In the real measurement line segment 510 and the experimental line segment 520 of the experimental data model, the elliptical polarization rate exhibits a negative correlation with the phase difference angle. That is, the greater the elliptical polarization rate, the smaller the absolute value of the phase difference angle. In addition, in this embodiment, the R-squared of the real measurement line segment 410 may be 0.94. Figure 5C shows that even if there are slight data differences between the measured line segment 510 and the experimental line segment 520, the elliptical polarization rate and phase difference angle of the measured line segment 510 and the experimental line segment 520 still exhibit a negative correlation characteristic.

The experimental line segment 610 in Figure 6A shows the numerical change of the phase difference angle between 1 degree and 1.5 degrees and the elliptical polarization rate. The experimental line segment 620 in Figure 6B shows the numerical change of the phase difference angle between 1.6 degrees and 5 degrees and the elliptical polarization rate. Please refer to Figure 1, Figure 6A and Figure 6B. When the surface of the component under test 200 is a curved surface, the reference wavelength of the light L and the central wavelength of the quarter wave plate 220 can be approximately 587.6 nm. For example, the experimental line segment 610 and the experimental line segment 620 can be obtained through mathematical simulation software (such as Zemax). In Figures 6A and 6B, the horizontal axis represents the value of the phase difference angle, and the vertical axis represents the value of the elliptical polarization rate. When the phase difference angle is about 1 degree, it has the maximum elliptical polarization rate (Ellipticity), that is, the elliptical polarization rate is about 0.966. When the phase difference angle is about 5 degrees, it has a smaller elliptical polarization rate (Ellipticity), that is, the elliptical polarization rate is about 0.84. The elliptical polarization ratio in Figure 6A and Figure 6B both exhibits a negative correlation with the phase difference angle. That is, the greater the elliptical polarization ratio, the smaller the absolute value of the phase difference angle. In addition, in this embodiment, the R-squared of the experimental line segment 610 and the experimental line segment 620 may be 0.999.

The ideal line segment 710 in Figure 7 illustrates the numerical changes in the elliptical polarization rate and phase difference angle of the device under test 200 when the light source 110 has no laser spot. The measurement line segment 720 in Figure 7 illustrates the numerical changes in the elliptical polarization rate and phase difference angle of the device under test 200 when the laser spot of the light source 110 is 3 millimeters (mm). The measurement line segment 730 in Figure 7 illustrates the numerical changes in the elliptical polarization rate and phase difference angle of the device under test 200 when the laser spot of the light source 110 is 5 millimeters (mm). Please refer to Figure 1 and Figure 7. The horizontal axis is the value of the phase difference angle, and the vertical axis is the value of the elliptical polarization rate. The laser spot of the light source 110 is 3 millimeters (mm), which can correspond to the light L being shifted by 1.5 mm from the optical axis. The laser spot of the light source 110 is 5 mm, which can be represented by the light L being shifted by 2.5 mm from the optical axis. For the device under test 200 with a curved surface, the values of the ideal line segment 710 and the measurement line segment 720 and 730 with the laser spot are slightly different, but the elliptical polarization rate and the phase difference angle still show a negative correlation characteristic, that is, The larger the elliptical polarization rate is, the smaller the absolute value of the phase difference angle is.

Figure 8A is a diagram illustrating the relationship between angle and light intensity according to an embodiment of the present disclosure. Figure 8B is a diagram illustrating the relationship between angle and elliptical polarization rate according to an embodiment of the present disclosure. The horizontal axis of Figure 8A is the value of the phase difference angle, and the vertical axis is the value of the light intensity. The horizontal axis of Figure 8B is the value of the phase difference angle, and the vertical axis is the value of the elliptical polarization rate. In some embodiments, the mathematical formula for the elliptical polarization rate can be , where I, Q, U and V are the four parameters of the Stokes vector. For example, when the angle of the measurement line segment 810 is between 130 degrees and 140 degrees, the component under test 200 has the maximum light intensity, that is, it has the maximum I parameter and V parameter. When the component under test 200 has the maximum light intensity (that is, has the largest I parameter and V parameter), the measurement line segment 820 has the maximum elliptical polarization rate of the component under test 200 , that is, the elliptical polarization rate is approximately 0.99. That is to say, the I parameters and V parameters of the device under test 200 will affect the value of the elliptical polarization rate of the device under test 200 .

In the following description, other forms of optical detection systems will be described.

Figure 9 is a schematic diagram illustrating the operation of the optical detection system 100a according to another embodiment of the present disclosure. The difference from the embodiment shown in Figure 1 is that the optical detection system 100a further includes a condenser 140. The condenser mirror 140 is located between the component under test 200 and the detection unit 130 . When the circularly polarized light P3 passes through the device under test 200 with a curved surface, the spot diameter may be enlarged. The beam reducer 140 can be used to reduce the spot diameter of the circularly polarized light P3 passing through the device under test 200 to between 0.1mm and 5mm. , so that the reduced laser spot of circularly polarized light P3 can be completely received by the detection unit 130 .

To sum up, the detection unit of the optical detection system can calculate the relationship between the absorption axis of the first linear polarizer of the component under test and the fast axis of the quarter-wave plate of the component under test based on the circularly polarized light passing through the component under test. phase difference angle. When the phase difference angle approaches 0, the optical detection system can determine the absorption axis (i.e., linear polarization direction) of the first linear polarizer of the component under test and the fast axis (i.e., circular polarization direction) of the quarter-wave plate. There is no offset, ensuring that every component under test inspected by the optical inspection system has the same quality performance. In addition, when the detection unit of the optical detection system detects the component to be tested, it does not need to input the material-related parameters of the component to be tested (such as thickness, refractive index, and extinction coefficient), which can save the inspection time of the optical detection system and reduce the overall operation. complexity.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also recognize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they can be variously changed, substituted, and altered herein without departing from the spirit and scope of the present disclosure.

100: Optical detection system 100a: Optical detection system 110:Light source 112: Shiny surface 120:Polarization adjustment component 122:Depolarizer 124: Second linear polarizer 130:Detection unit 132: Glossy surface 140: Beam reducer 200: component under test 210: The first linear polarizer 220: Quarter wave plate 230:Substrate 410: Measure line segments 420: Experimental line segment 510: Measure line segments 520: Experimental line segment 610: Experimental line segment 620: Experimental line segment 710:Ideal line segment 720: Measure line segments 730: Measure line segments 810: Measure line segments 820: Measure line segments a: angle b: angle L:Light P1: unpolarized light P2: Linearly polarized light P3: Circularly polarized light S1: Steps S2: Step S3: Steps S4: Steps

One embodiment of the present disclosure is best understood from the following detailed description when read in conjunction with the accompanying drawings. It is emphasized that, in accordance with standard industry practice, various features are not drawn to scale and are for illustrative purposes only. In fact, the dimensions of the various features may be arbitrarily increased or reduced for clarity of discussion. Figure 1 is a schematic diagram illustrating the operation of an optical detection system according to an embodiment of the present disclosure. FIG. 2 illustrates a flowchart of an operating method of an optical detection system according to an embodiment of the present disclosure. Figure 3 is a diagram illustrating the relationship between the fast axis and the absorption axis according to an embodiment of the present disclosure. Figures 4A to 7 illustrate the relationship between phase difference angle and elliptical polarization rate according to different embodiments of the present disclosure. Figure 8A is a diagram illustrating the relationship between angle and light intensity according to an embodiment of the present disclosure. Figure 8B is a diagram illustrating the relationship between angle and elliptical polarization rate according to an embodiment of the present disclosure. Figure 9 is a schematic diagram illustrating the operation of an optical detection system according to another embodiment of the present disclosure.

Domestic storage information (please note in order of storage institution, date and number) without Overseas storage information (please note in order of storage country, institution, date, and number) without

100: Optical detection system

110:Light source

112: Shiny surface

120:Polarization adjustment component

122:Depolarizer

124: Second linear polarizer

130:Detection unit

132: Glossy surface

200: component under test

210: The first linear polarizer

220: Quarter wave plate

230:Substrate

L:Light

P1: unpolarized light

P2: Linearly polarized light

P3: Circularly polarized light

Claims (11)

An optical detection system configured to detect a component under test having a first linear polarizer and a quarter-wave plate, the optical detection system includes: a light source having a light emitting surface and configured to emit a light ray; A polarization adjustment component faces the light exit surface of the light source and is configured to convert the light into a linearly polarized light, wherein the first linear polarizer is located between the polarization adjustment component and the quarter wave plate, the The device under test is configured to convert the linearly polarized light into a circularly polarized light; and A detection unit is located on the side of the component under test facing away from the polarization adjustment component, and is configured to calculate an absorption axis of the first linear polarizer of the component under test and the absorption axis of the component under test based on the circularly polarized light. A phase difference angle between a fast axis of a quarter wave plate. The optical detection system as described in claim 1, wherein the polarization adjustment component includes: A depolarizer is located between the light source and the first linear polarizer of the component under test, and is configured to convert the light into unpolarized light. The optical detection system as described in claim 2, wherein the polarization adjustment component further includes: A second linear polarizer is located between the depolarizer and the first linear polarizer of the device under test, and is configured to convert the unpolarized light into the linearly polarized light. The optical detection system as described in claim 1 further includes: A condenser is located between the component to be tested and the detection unit. The optical detection system as claimed in claim 1, wherein the center wavelength of the quarter wave plate is the same as the wavelength of the light. The optical detection system as claimed in claim 1, wherein the light source is a laser light source. An operating method of an optical detection system, including: Emitting a light beam to a polarization adjustment component through a light source; The light is converted into linearly polarized light by the polarization adjustment component and is emitted to a device under test, wherein the device under test has a first linear polarizer and a quarter-wave plate. The first linear polarizer Located between the polarization adjustment component and the quarter-wave plate; Converting the linearly polarized light into circularly polarized light by the device under test and transmitting it to a detection unit; and A phase difference angle between an absorption axis of the first linear polarizer of the device under test and a fast axis of the quarter-wave plate of the device under test is calculated based on the circularly polarized light. The method as described in claim 7, wherein calculating the phase difference angle based on the circularly polarized light further includes: Rotate the device under test to obtain a light intensity and an optical rotation intensity of the device under test; and The maximum elliptical polarization rate of the component under test is calculated based on the light intensity and the optical rotation intensity. The method as described in claim 7, wherein converting the light into the linearly polarized light by the polarization adjustment component and transmitting it to the device under test further includes: The light is converted into unpolarized light by a depolarizer of the polarization adjustment component and emitted to a second linear polarizer of the polarization adjustment component; and The polarized light is converted into linearly polarized light by the second linear polarizing plate of the polarization adjustment component and is emitted to the device under test. The method of claim 9, wherein calculating the phase difference angle based on the circularly polarized light further includes: Rotate the second linear polarizer to obtain a light intensity and an optical rotation intensity of the component under test; and The maximum elliptical polarization rate of the component under test is calculated based on the light intensity and the optical rotation intensity. The method of claim 7, wherein converting the linearly polarized light into the circularly polarized light by the component to be tested and transmitting it to the detection unit further includes: A spot diameter of the circularly polarized light passing through the component under test is reduced to between 0.1 mm and 5 mm through a condenser and is emitted to the detection unit.

Images