TW200936003A - Surface treated copper foil and printed circuit board substrate - Google Patents

Surface treated copper foil and printed circuit board substrate Download PDF

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Publication number
TW200936003A
TW200936003A TW097147376A TW97147376A TW200936003A TW 200936003 A TW200936003 A TW 200936003A TW 097147376 A TW097147376 A TW 097147376A TW 97147376 A TW97147376 A TW 97147376A TW 200936003 A TW200936003 A TW 200936003A
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TW
Taiwan
Prior art keywords
copper foil
copper
treated
treated copper
protrusions
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TW097147376A
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Chinese (zh)
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TWI402009B (en
Inventor
Hiroto Kutsuna
Yuuji Suzuki
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Furukawa Electric Co Ltd
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Publication of TW200936003A publication Critical patent/TW200936003A/en
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Publication of TWI402009B publication Critical patent/TWI402009B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/04Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B15/00Layered products comprising a layer of metal
    • B32B15/02Layer formed of wires, e.g. mesh
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D1/00Electroforming
    • C25D1/04Wires; Strips; Foils
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B2311/00Metals, their alloys or their compounds
    • B32B2311/12Copper

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

The invention provides a surface-treated copper foil that satisfies the trends of downsizing and miniaturization of household electric appliances and portable electronic machines and also satisfies the requirement of formation of fine patternsg, especially referring to surface-treated copper foil that adheres well to an insulting substrate and has low contact resistance with conductive past containing metallic particles, and is applicable to IVH (interstitial via hole) circuit structure with low surface roughness. On the front and back surfaces of the insulting substrates in the laminated substrate, the above-mentioned surface-treated copper foils are configured to constitute the copper foil circuit. The filled metallic particles provided in the through holes of the above-mentioned surface-treated copper foils connect to the copper foil circuit. The surface treated copper foil contains surface treated layer that is arranged on at least one surface of the copper foil so that the contact area between the above-mentioned copper foil surface and the joining surface of the metallic particles in the joining portion is more than 30% of the copper foil surface area.

Description

200936003 ' 九、發明說明: 【發明所屬之技術領域】 本發明係有關於表面處理銅箔,特別是關於適用於以 導電性組成物(導電糊(paste))導通設置於正、背面的電路 (線路)的層積電路基板(多層印刷電路板)。 另外’本發明是有關於使用上述表面處理銅箔形成電 路的電路基板。 【先前技術】 習知的層積電路基板的製造方法,具有貫穿孔鍍膜 法,其在多層電路基板用基材多層層積之後,在絕緣層形 成導通孔,而藉由在上述導通孔的内周面進行鍍膜處理而 成的鑛層,來作層間導通。而藉由上述貫穿孔鐘膜法所形 成的層積電路基板的優點是可以以低且穩定的接觸電阻來 連接各層電路,但是製程複雜、步驟多、成本高則是層積 Q 電路基板的用途受限的重要因素。 另外,藉由貫穿孔鍍膜法所形成的層積電路基板中, 亦具有貫穿孔的正上方無法組裝零件而使線路佈局的自由 度較低的缺點。 ’’’、,、上述缺點,在藉由貫穿孔鍍膜法所形成的層 積電路基板中,甚至捩用伸t & π u 主抹用使貝穿孔相對於基板表面傾斜而 形成的手法,以避開組裝零件的配置位置。 另外’近年來取代貫穿孔鑛膜法的層間連接法中,是 藉由在貫穿孔充填導電糊的間隙導孔技術(interstitial 2197-10192-PF;Dwwang 5 200936003 via h〇le; IVH)所形成的層積電路基板基板已達實用化的 狀態。此-使用導電糊的層積電路基板與藉由貫穿孔鑛膜 法所形成的層積雷路 电路基板相比’可達成製造步驟的簡潔 化、低成本化。 使用IVH法來製造層積電路的代表性的方法,是為 ALIVH(請參考非專利文獻。 在ALIVH中,是使用醯胺環氧樹脂預浸布(aramid ❹epoxy prepreg)來作為絕緣基板,而以雷射明孔加工來形 成貫穿孔。接下來在已以導電糊充填貫穿孔的絕緣基板的 雙面層積銅箱,再以熱壓法黏著銅荡與絕緣基板。之後, 圖形化(制)銅ϋ而形成既定的電路。重複上述步驟而形 成層積電路基板。200936003 ' IX. OBJECTS OF THE INVENTION: TECHNICAL FIELD The present invention relates to a surface-treated copper foil, and more particularly to a circuit suitable for conducting a conductive composition (conductive paste) on the front and back sides ( A laminated circuit board (multilayer printed circuit board) of a line). Further, the present invention relates to a circuit board using the above surface-treated copper foil forming circuit. [Prior Art] A method of manufacturing a conventional laminated circuit substrate has a through-hole plating method in which a via hole is formed in an insulating layer after laminating a plurality of substrates for a multilayer circuit substrate, and by being in the via hole The mineral layer formed by coating on the circumference is used to conduct interlayer conduction. The laminated circuit substrate formed by the above-mentioned through-hole clock method has the advantage that the layers can be connected with a low and stable contact resistance, but the process is complicated, the steps are large, and the cost is high, which is the use of the laminated Q circuit substrate. An important factor of limitation. Further, in the laminated circuit board formed by the through hole plating method, there is a disadvantage that the components cannot be assembled directly above the through hole, and the degree of freedom in line layout is low. ''',, the above-mentioned disadvantages, in the laminated circuit board formed by the through-hole coating method, even using the extension t & π u main smear to make the shell perforation inclined with respect to the substrate surface, To avoid the configuration position of the assembled parts. In addition, in recent years, the interlayer bonding method which replaces the through-hole mineral film method is formed by a gap guiding technique (interstitial 2197-10192-PF; Dwwang 5 200936003 via h〇le; IVH) in which a conductive paste is filled in a through hole. The laminated circuit substrate has been put into practical use. As a result, the laminated circuit board using the conductive paste can be made simpler and lower in cost than the laminated lightning circuit board formed by the through-hole ore film method. A representative method for manufacturing a laminated circuit using the IVH method is ALIVH (please refer to the non-patent literature. In ALIVH, an aramid epoxy prepreg is used as an insulating substrate, and The laser hole is processed to form a through hole, and then a double-sided laminated copper box of the insulating substrate filled with the conductive paste with a conductive paste is adhered to the copper substrate and the insulating substrate by hot pressing. Thereafter, the pattern is formed. The copper is formed to form a predetermined circuit, and the above steps are repeated to form a laminated circuit substrate.

用於ALIVH等的IVH法的銅箱,為了與酿胺環氧樹脂 預浸布的黏著性及與導電糊的連接性,進展為使用表面粗 糙度為4 # m(含)以上的雙面粗化處理銅箔或單面粗化處理 〇 銅鈿。然而近年來更進一步發展的家電製品.可攜式電子 機器等持續進行著薄型化.小型化,而有微細圖形化的需 求,但是目前使用的表面處理銅箔並無法滿足此一需求。 【非專利文獻1】請參考CMC出版股份有限公司(CMCThe copper box used for the IVH method such as ALIVH has been developed to have a double-sided thickness of 4 # m or more in order to adhere to the amine-impregnated epoxy prepreg and to the conductive paste. Treatment of copper foil or single-sided roughening of beryllium copper crucible. However, in recent years, home appliance products and portable electronic devices have been continuously thinned, miniaturized, and have a demand for fine graphics, but the surface-treated copper foil currently used cannot meet this demand. [Non-Patent Document 1] Please refer to CMC Publishing Co., Ltd. (CMC)

Publishing Co.,Ltd.)於2005年1月31日發行的「電子 組裝用高機能性基板材料(High Perf〇rmance MateHais for Electronics Package Substrate)」第 18 頁 【發明内容】 2197-10192-PF;Dwwang 6 200936003 【發明所欲解決的問題】 本發明是提供在家電製口 „ ,, 各0口 .可攜式電子機器等的薄型 化·小型化的進行中,可读^ 滿足裰細圖形化需求的表面處理 銅泪,特別是提供適用於m 庚、日你 π lVH法的電路結構的低表面粗糙 度且與絕緣基板的黏著性自杯 ,m t r生良好、與導電糊金屬粒子的接 觸電阻低的表面處理銅箱D 另外,本發明是提供以 上述表面處理銅箔形成電路、 藉此可構成微細圖形的電路的電路基板。 【用以解決問題的手段】 本發明之表面處理銅箔,早 „ /白疋在一層積基板構成銅箔線 路的表面處理銅落’其中在上述層積基板中,是在一絕緣 基板的正面與背面設置有上述銅箱線路,而藉由設置於上 述絕緣基板的導通孔中夯畫 真的金屬粒子連接上述銅箔線 路,而上述表面處理銅箔的牲外—# — & η白的特徵在於包含:設置於一銅箔 基落的至少—表面的一表面處理層,而使上述銅箱基箱的 表面中與上述金屬粒子接合的接合部之與上述金屬粒子的 接合面的面積’為上述銅落^的表面積的道以上。Publishing Co., Ltd.) "High Perf〇rmance MateHais for Electronics Package Substrate", published on January 31, 2005, page 18 [invention] 2197-10192-PF; Dwwang 6 200936003 [Problem to be Solved by the Invention] The present invention provides for the thinning and miniaturization of a home appliance, a portable device, and the like. The surface treatment of copper tears, especially the low surface roughness of the circuit structure suitable for m g, π lVH method and the adhesion to the insulating substrate from the cup, mtr good, contact resistance with the conductive paste metal particles In addition, the present invention provides a circuit board which is a circuit for forming a circuit by the above-described surface-treated copper foil, thereby forming a fine pattern. [Means for Solving the Problem] The surface-treated copper foil of the present invention, Early „ / 疋 疋 表面 一层 一层 一层 一层 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 疋 ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' ' a circuit, wherein the copper foil line is connected by a metal particle disposed in the via hole of the insulating substrate, and the surface-treated copper foil is characterized by: At least one surface treatment layer of the surface of the copper foil base, and the area of the joint surface of the joint portion of the copper box base with the metal particles and the metal particles is the surface area of the copper drop Above the road.

較好為上述表面處理厗| A 处里層疋在上述銅箔基箔的表面附著 粗化粒子的層,| + 層上述表面處理層的表面的RZ為 U〜3.0”、明度(brightness)值為25(含)以下。 在此處’ Rz是定義於JIS B 〇6〇卜1194「表面粗輪度 的定義與表示」中’其為r十點平均粗糙度」。 另外根據Π S Z 81 0 5 ( 1 9 8 2 ),在同一條件下照明 的白色面為基準之物體表面的相對性的明暗相關顏色的屬 2197-10192-PF/Dwwang 7 200936003 關顏色的屬性尺度 性,明度值就是將此一相對性的明暗相 化的值。 車又好為上述表面處理層係在該表面處理層# 100"mx “的面積中,分佈有· 25_個高度為卜5^之 由上述粗化粒子所構成的突起物。 車父好為上述表面處理層将& p 取®処里層係在上述表面處理層的觀察截 面…,的範圍令,大致平均分佈有㈣個高度為卜5" 之由上述粗化粒子所構成的突起物。 較好為在上述表面處理層中的上述突起物之間的最大 寬度為。.〇1”以上、25,m除以存在於觀察截面25" 的範圍内的上述突起物的個數所得長度的2倍以下。 、本發明的電路基板的特徵在於係使用表面處理麵箔所 製成。 【發明效果】 *本發明可提供可因應家電•可攜式電子機器等的 ❹薄型化’小型化、滿足微細圖形化的需求的表面處理銅箔, 特別適用力IVH法的電路結構的低表面粗輪度、且與絕緣 基板的黏著性良好、與導電糊金屬粒子的接觸電阻低的表 面處理銅箔。 另外,本發明可提供以上述表面處理銅箔形成電路 藉此可構成微細圖形的電路的電路基板。 【實施方式】 【用以實施發明的最佳形態】 8 2197-10192-PF;Dwwang 200936003 本實施例之銅箔為表面處理銅箱,Preferably, the surface treatment 厗|A layer is a layer on which the roughened particles are attached to the surface of the copper foil-based foil, and the surface of the surface treatment layer of the surface layer has an RZ of U to 3.0" and a brightness value. It is 25 or less. Here, 'Rz is defined in JIS B 〇6〇b 1194 "Definition and Expression of Surface Roughness", which is r average roughness of ten points. In addition, according to Π SZ 81 0 5 (1 9 8 2 ), the white surface illuminated by the same condition is the relative brightness of the surface of the object based on the brightness of the object 2197-10192-PF/Dwwang 7 200936003 Sex, the brightness value is the value of this relative brightness and darkness. It is preferable that the surface of the surface treatment layer is the surface of the surface treatment layer #100"mx", and there are 25 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The surface treatment layer has a range in which the inner layer of the surface layer of the & p is taken in the surface of the surface treatment layer, and the surface is substantially evenly distributed with (four) protrusions composed of the coarse particles described above. Preferably, the maximum width between the protrusions in the surface treatment layer is 〇1" or more, 25, m divided by the number of the protrusions present in the range of the observation section 25" 2 times or less. The circuit board of the present invention is characterized in that it is made of a surface-treated surface foil. [Effect of the Invention] The present invention can provide a surface-treated copper foil that can meet the needs of miniaturization and miniaturization in response to the thinning of home appliances and portable electronic devices, and is particularly suitable for the low surface of the circuit structure of the IVH method. A surface-treated copper foil having a coarseness and good adhesion to an insulating substrate and a low contact resistance with conductive paste metal particles. Further, the present invention can provide a circuit board in which a surface-processed copper foil is formed into a circuit, whereby a circuit of a fine pattern can be formed. [Embodiment] [Best Mode for Carrying Out the Invention] 8 2197-10192-PF; Dwwang 200936003 The copper foil of this embodiment is a surface-treated copper box.

^ ω 白特別疋適用於以IVH 法構成電路的表面處理銅箱。 關於使用驗來製成層積電路的代表性的方法,是 以、AUVH來進行說明。第1⑷〜1⑴圖為顯示以ALIVH來 製造層積電路基板的方法的步驟的剖面圖。 首先,如第1U)圖所示,使用酿胺環氧樹脂預浸布作 ❹ 為絕緣基板1;再如第1㈤圖所示,以雷射明孔加工形成 貫穿孔2。 接下來如第1(C)圖所示,在貫穿孔2充填導電糊3。 接下來如第1(c)圖所示,在已於貫穿孔2充填導電糊 3的絕緣基板1的雙面層積銅箱4、5;再如第i⑷圖所示, 以熱壓法黏著銅落4與絕緣基板由此熱壓步驟的熱 將導電糊3溶化而經由貫穿孔2連接雙面的㈣心5而成 為導通狀態。 —接下來如第1(e)圖所示,圖形化(蝕刻)鋼箱而形成既 Ο 定的電路。如上所述而形成單層的基板10。 為了使層積基板多層化而重複進行上述步驟。例如如 第1(f)圖所示,形成與第1(a)〜1(c)圖所示步驟同樣的基 板11'12,而將其分別層積於基板1〇的上表面與下表面, 並在此層積體的雙面層積銅箔13、14,接著如第1(心圖所 不’以熱壓法黏著基板1 〇、丨ii 2及銅箔丨3、〗 # 上。顆·由 此熱壓步驟的熱將導電糊熔化而經由貫穿孔使雙面的鋼a 4、5連接成為導通狀態。之後,如第丨(h)圖所示,圖形化 (蝕刻)銅箔而形成既定的電路。如上所述而形成三 ’增積 2197-10192-PF/Dwwang 9 200936003 的層積電路基板。 Ο ❹ 另外,視需求重複上述的製程。也就是在上述層積電 路基板的上表面與下表面分別沈積上述基板15、16,並在 此層積體的雙面層積銅落17、18,再以熱壓法黏著各基板 與銅箔,並圖形化(姓刻)銅帛形成既定的電路。 藉此如第1(0圖所示’而形成五層層積的層積電路基板。 &在本實施例中,表面處理前的銅H (後文稱為「mi基 :」)疋以電解或軋延所製造的銅箔或銅合金箔(在不需 Ά 者的清況則通稱為銅 '洛)。銅羯的厚度較好為 。關於銅箱的厚度,厚度在⑷以下則非常 難以在銅羯的表面上進行粗化處理,故^以下的厚度不 佳。所使用的㈣的厚度可依據其用途作適當的選擇。 銅箱(銅荡基箱)的表面粗糙度較好為Rz 〇·〇1//ιη〜2/zm〇關於鋼结其々空上八士 、 關^、钔,白基泊的表面粗糙度,RZ 0.01^m 以下的銅泊基箔在現實上是難以製造出來,即使能夠製造 出來所耗費的製造成本也不符合現實的要求;另外雖然 :可以使用RZ 2. G # m以上的鋼落基,但是—旦考慮到 商頻特性及微細圖形化,則㈣基箱的表面粗糖度Rz較好 為2/zm(含)以下。 在·此處,所謂的農而4 Λ^ ω White is especially suitable for surface treatment copper boxes that use the IVH method to form circuits. A representative method of forming a laminated circuit by using the test is described by AUVH. Figs. 1(4) to 1(1) are cross-sectional views showing the steps of a method of manufacturing a laminated circuit substrate by ALIVH. First, as shown in Fig. 1U), a brewed amine epoxy resin prepreg is used as the insulating substrate 1; as shown in Fig. 1 (5), the through hole 2 is formed by laser drilling. Next, as shown in FIG. 1(C), the conductive paste 3 is filled in the through hole 2. Next, as shown in Fig. 1(c), the copper boxes 4 and 5 are laminated on both sides of the insulating substrate 1 in which the conductive paste 3 is filled in the through holes 2; as shown in the figure i(4), it is adhered by hot pressing. The copper foil 4 and the insulating substrate melt the conductive paste 3 by the heat of the hot pressing step, and the double-sided (four) core 5 is connected via the through hole 2 to be in an on state. - Next, as shown in Fig. 1(e), the steel box is patterned (etched) to form a predetermined circuit. The single layer substrate 10 is formed as described above. The above steps are repeated in order to multilayer the laminated substrate. For example, as shown in Fig. 1(f), the same substrate 11'12 as the one shown in Figs. 1(a) to 1(c) is formed, and is laminated on the upper surface and the lower surface of the substrate 1 respectively. Then, the copper foils 13, 14 are laminated on both sides of the laminate, and then the substrate 1 〇, 丨 ii 2 and the copper foil 丨 3, 〗 # are adhered by hot pressing as shown in the first figure. The heat of the hot pressing step melts the conductive paste and connects the double-sided steels a 4 and 5 to the conductive state via the through holes. Thereafter, as shown in the figure (h), the patterned (etched) copper foil is formed. And a predetermined circuit is formed. As described above, a laminated circuit substrate of three 'increased 2197-10192-PF/Dwwang 9 200936003 is formed. Ο ❹ In addition, the above process is repeated as needed. That is, in the above laminated circuit substrate The upper substrate and the lower surface respectively deposit the substrates 15 and 16, and the copper layers 17 and 18 are laminated on both sides of the laminate, and then the substrates and the copper foil are adhered by hot pressing, and the copper is patterned.帛 Formation of a predetermined circuit. Thus, a five-layer laminated laminated circuit substrate is formed as shown in Fig. 1 (& in this embodiment, before surface treatment) Copper H (hereinafter referred to as "mi-based:") is a copper foil or a copper alloy foil produced by electrolysis or rolling (referred to as copper 'Lo" in the case of no need for defects. The thickness of copper matte is relatively high. For the thickness of the copper box, if the thickness is less than (4), it is very difficult to roughen the surface of the copper enamel, so the thickness below is not good. The thickness of (4) used can be appropriately selected depending on the use. The surface roughness of the copper box (copper-based base box) is preferably Rz 〇·〇1//ιη~2/zm〇. The surface roughness of the steel knot on the hollow of the Ba Shi, Guan ^, 钔, and white base The copper-based base foil of RZ 0.01μm or less is difficult to manufacture in reality, and the manufacturing cost even if it can be manufactured does not meet the actual requirements; in addition, although steels of RZ 2. G # m or more can be used. Base, but considering the commercial frequency characteristics and micro-patterning, (4) the surface roughness Rz of the base box is preferably 2/zm or less. Here, the so-called agriculture and 4 Λ

衣面粗糙度Rz是規定於JIS B 060H 994「表面粗糙度的定義與表示」,為十點平均粗糙 度。 處理 在本實私例中,對上述鋼箱基箱的至少單面施以表面 2197-l〇l92-.pF;Dwwang 200936003 :广的表面粗化處理,是使粗化粒子附 Γ:二表面而成為粗化面。粗化面的表面粗糖度較好為 • u…情況,由 無法滿足以達成描并4|丨雜強_么a I低而 運成楗升剝離強度為目的的表面處理 :::。大於3.—則其高頻—成微: ❹ 在:實施例中,關於鋼箱基落的表面處理方法,較好 為使銅治基箱或銅合金附著於銅荡基羯 合今的叫工銅或銅 好為2mg/dm2〜4GGmg/dm2。附著量不滿 邮如的情況,由於剝離強度低而無法滿足 離強度為目的的表面處理銅箔。 運成心升剝 若附著量大於400mg/dm2, |彳i w 傳逵旦下隊, 則/、同頻特性下降而使資訊 傳達里下降,其原因在於若是銅或銅合金的附著量多,則 粗化粒子就較大,而使表面粗 道c没夂大。在尚頻下電流在 導體&動時’頻率愈高則電流 ❹ 倉< _、 趨向於在表面部分流動(集 铋度增加,則電流流動的表 面的長度變長而增加電阻,因 U而電流的損失增加而使資訊 得達罝不足。因此,銅或 4ηπ 2/ 次銅合金的附著量較好為 40 0mg/(in]2(含)以下,但异 途可忽略高頻特性的情況則亦 可忽略附著量的上限。 在本實施例中,銅箔基馆沾 a $ 丞/自的表面處理,是使此表面與 一導電糊接合,並使此表面. .v 中與包含於上述導電糊的金屬 粒子接合的接合部之與上述金 銅箱的表面積的議以上。粒子的接合面的面積,為 2197-10192-PF;Dwwang 200936003 金屬粒子與銅箱表面的 的面積。 ,為以下所示所測定 贫先’冽定銅箔的表面積 向及長度方向的截面疋進行銅箱的寬度方 得的寬度方向的長声 ,、疋銅為表面的截面部而 ^食度為、以相同 長度為1/ ,將1^與1/知千 去匐疋的長度方向的 部的長度測定,是使用f的結果為_0表面面積。截面 司(BioArts,Co L 析軟體(Bi〇Arts股份有限公 ’七d.)的影像解析敕俨〖m Q τ 沿著粗化粒子的外圍測定銅落表面的長度。^ 2〇〇6), 銅箱表面的賞;# τ & u _ 分的長产入^ 、、導電糊的金屬粒子接合的部 ’長度…目加的值為s、鋼荡表面的長度 電糊的金屬粒子接合的邱 '、導 c t 筏口的J分的長度全部相加的值為s,, 以S舆S’相乘的值為接合面積。 此時的接合面積較好為銅箱表面面積的30%(含)以 上。二合面積若為銅箔表面面積# 30%(含)以上,則可滿 足黏者力並降低銅H (配線電路)與金屬粒子的接觸電阻, 而可以在兩者之間得到滿足的連接部。而接觸面積在讓 以下的情㈣黏著力會不足’而會有發生接觸電阻增加而 發熱等的問題之虞,故不佳。 關於混入導電糊的金屬粒子,可在鋁、鎢、鉛、鋅、 金、銀、銅、鎳、鈷等選用適合者。 另外’在本實施例中進行表面粗化處理的粗化處理銅 肩,其明度值為3 0以下、較好為2 5以下。本實施例中的 明度值通常是用於觀測表面粗糙度的指標,其測定方法是 2197-10192-PF;Dwwang 12 200936003 ❹The surface roughness Rz is defined by JIS B 060H 994 "Definition and Expression of Surface Roughness" and is a ten-point average roughness. In the present embodiment, at least one side of the steel box base is subjected to a surface 2197-l〇l 92-.pF; Dwwang 200936003: a wide surface roughening treatment is to make the roughened particles attached: two surfaces And become a rough surface. The surface roughening degree of the roughened surface is preferably the case of • u..., which is not satisfied by the surface treatment for the purpose of achieving the drawdown of 4|noise strong _ a a low and the so-called peel strength. More than 3. - then its high frequency - into micro: ❹ In the example: the surface treatment method of the steel box base, it is better to make the copper base or copper alloy attached to the copper The copper or copper is preferably 2 mg/dm 2 to 4 GG mg/dm 2 . When the amount of adhesion is not sufficient, the surface-treated copper foil for which the strength is low cannot be satisfied due to the low peel strength. If the amount of adhesion is greater than 400mg/dm2, |彳iw will pass the team, then the same frequency characteristics will decrease and the information will be reduced. The reason is that if the copper or copper alloy has a large amount of adhesion, then The coarsened particles are larger, and the surface roughness c is not large. In the case of a constant frequency, the current is higher at the conductor & the higher the frequency, the higher the current ❹ &, _, tends to flow on the surface portion (the increase in the concentration, the length of the surface where the current flows becomes longer and increases the resistance, because U However, the loss of current increases and the information is insufficient. Therefore, the adhesion amount of copper or 4ηπ 2 / secondary copper alloy is preferably 40 0 mg / (in) 2 or less, but the high-frequency characteristics can be ignored. In this case, the upper limit of the amount of adhesion can also be ignored. In this embodiment, the surface treatment of the copper foil base is a 丞/self surface treatment, so that the surface is bonded to a conductive paste, and the surface is contained in .v. The surface of the joint portion of the conductive paste in which the metal particles are bonded is equal to or larger than the surface area of the gold-plated copper box. The area of the joint surface of the particles is 2197-10192-PF; the area of the surface of the metal particles and the copper box of Dwwang 200936003. The surface area of the poorly-predetermined copper foil measured in the following section and the lengthwise direction of the longitudinal direction of the copper foil are long sounds in the width direction of the copper box, and the beryllium copper is the cross-sectional portion of the surface, and the degree of food is The same length is 1 / , will 1 ^ and 1 / know The length of the portion of the length direction of the sputum is measured by the result of using f as the surface area of _0. The image analysis of the BioArts, Co L software (Bi〇Arts Co., Ltd. 'seven d.) 敕俨m Q τ The length of the copper drop surface is measured along the periphery of the roughened particles. ^ 2〇〇6), the surface of the copper box; # τ & u _ The long-term production of ^, and the metal paste of the conductive paste The length of the part 'the length of s, the length of the steel surface, the metal particle of the electric paste, and the length of the J point of the ct 筏 mouth are all s, and S 舆 S' The multiplied value is the joint area. The joint area at this time is preferably 30% or more of the surface area of the copper box. If the area of the joint is more than 30% (inclusive) of the surface area of the copper foil, it can satisfy the stickiness. Force and reduce the contact resistance between the copper H (wiring circuit) and the metal particles, and the connection portion can be satisfied between the two. The contact area is insufficient in the following (4), and the contact resistance increases. The problem of heat and the like is not good. About the metal particles mixed with the conductive paste, Tungsten, lead, zinc, gold, silver, copper, nickel, cobalt, etc. are suitable for use. In addition, in the present embodiment, the roughened copper shoulder for surface roughening treatment has a brightness value of 30 or less, preferably. It is 25 or less. The brightness value in this embodiment is usually an index for observing the surface roughness, and the measurement method is 2197-10192-PF; Dwwang 12 200936003 ❹

將光照射在測定樣品表面而測定光的反射量而表為明度值 的方法。在此處,根據JIS Z 81 05 ( 1982),明度值是將物 體的相對性明暗的相關顏色的屬性尺度化的值,其是以同 一條件下照明的白色面為基準。若是藉由此方法測定表面 處理銅箔的處理面的明度,表面粗糙度Rz較大或是粗化粒 子間的溝槽深度較深時,由於光的反射量少而使明度值有 偏低的傾向’而若表面平滑則光的反射量大而使明度有偏 问的傾向。為了使表面處理銅箔與絕緣基板的剝離強度提 升’使表面處理銅箔的明度值為3〇以下、較好為25以下。 另外’若明度超過30,即使粗化面的RZ值大,但是由於 其凹凸為和緩的凹凸,而使表面處理銅箔與絕緣基板的咬 合不佳’而無法提升剝離強度。 而明度的測定是在對被測定銅箔施以 Ni · 0.01~0.5mg/dm2 Zn - 0. 〇1 -〇.5mg/dm2 Cr · 0.01-0. 3mg/dm2 的範圍内的防鏽處理之後,使用明度計(SUGA試驗機股份 有限公司(SUGA TEST INSTRUMENTS C0·,LTD)的機種名: S&M Col〇ur Computer 型號 SM-4)進行測定。 兼具上述之表面粗糙度(Rz)及明度值的本實施例之表 面處理銅箱在層積.複合化之後,是具有優異的剥離強度 及微細圖形化特性,藉由此一表面處理鋼箔的使用,可製 造優異的電路基板。 在本實施例中,如上所述是進行銅箱基箔表面的粗化 2197-10192 -pp;. Dwwang 13 200936003 處理’而由為了在表面内達成平均的剝離強度的粗化粒子 所形成的突起物,較好為在100/^xmp的面積中,具 有200〜25000個突扭私 办 I物。大起物的個數若少於2 〇 〇個,則 突起物間的間、勒;宫& p i ’、見而無法切割出微細圖形;突起物若達 2 5 0 0 0個以上,則突扭札、風〜 、 之物過乍而無法提供足夠的剝離強度, 故不佳。 還有為了得刭右#工+ 在表面内具有不具變異之優異剥離強度 及微細圖形特性,較好 m 灯马以後文所述的粗化粒子所形成的 突起物是大致均勻地存左 < 八 、 子在(刀佈)。也就是突起物的高度較 好為 1.0//Π1 〜5.0//m。形 士+人 /成於銅箔基箔表面的突起物的高 度在1 · Ο β m以下的愔';w,m a m Z則因為高度低則無法得到提升剝 離強度的效果;突起物的古 阿度在5. 0 // m的情況,則突起物 無法分佈均勻,表面處々 ^ 銅v自的表面粗糙度Rz在每個範圍 的變異會變大, 古 …去保持具有穩定性的剝離強度,且其 Π»頻特1·生不佳而無法達成微細圖形化。而此處所稱高度, •為銅箱基羯表面與突起物的頂點的距離。 另外’突起物的個激· # # 右^,則無法達成剝離強度;又 右個數多,則銅箔表面盥— -、犬起物的黏著性低的數量亦多, 則其效果反而降低,因此觀 親察截面的25//m内較好為具有 6個〜35個的突起物、特 旧 寻另·ί疋取好為1 〇個~20個突起物。 在此處,針對本實施例所稱突起 形成於鄰接的突起物 硬仃4月。 的溝槽部的底部與突起物的頂點 的距離(以下稱為溝槽深 又」马不滿0 _ 3从m的情況,是將该 樣的鄰接突起物視為— 個大起物;另外,突起物的深度為 2197-1Q192-PF;Dwwang . 200936003 以上的情況’則將這樣的鄰接突起物視為二個突起 Γ 上述突起物的高度為銅箱基落的表面與突起物 的頂點的距離’此—溝样 屏槽冰度與其不同之點在於其是進行 表面處理之後的溝槽部的底部與突起物的項點的距離。 :起物的數量的計數方法,是將表面處理銅箱鑲埋在 …對於騎晦式電子顯微鏡(SEM)觀察進行研磨後的 截面所得的觀察照片中,十數在 T ^數在25 # ra的長度範圍内的A method in which light is irradiated on the surface of a measurement sample to measure the amount of reflection of light and is expressed as a brightness value. Here, according to JIS Z 81 05 (1982), the brightness value is a value which scales the attribute of the relative color of the relative brightness of the object, and is based on the white surface illuminated under the same condition. If the brightness of the treated surface of the surface-treated copper foil is measured by this method, the surface roughness Rz is large or the groove depth between the roughened particles is deep, and the lightness is low due to the small amount of light reflection. If the surface is smooth, the amount of light reflected is large, and the brightness tends to be biased. In order to increase the peeling strength of the surface-treated copper foil and the insulating substrate, the surface-treated copper foil has a lightness value of 3 Å or less, preferably 25 or less. Further, when the brightness exceeds 30, even if the RZ value of the roughened surface is large, the unevenness of the roughened surface makes the surface-treated copper foil and the insulating substrate poorly engaged, and the peel strength cannot be improved. The brightness is measured after the anti-rust treatment in the range of Ni · 0.01~0.5mg/dm2 Zn - 0. 〇1 -〇.5mg/dm2 Cr · 0.01-0. 3mg/dm2 of the copper foil to be tested. The measurement was carried out using a light meter (model name of SUGA TEST INSTRUMENTS C0·, LTD: S&M Col〇ur Computer model SM-4). The surface-treated copper box of the present embodiment having both the surface roughness (Rz) and the brightness value described above has excellent peel strength and fine pattern characteristics after lamination and compositing, whereby the surface-treated steel foil is used. The use of the circuit board can be manufactured. In the present embodiment, as described above, the surface of the copper box-based foil is roughened by 2197 to 10192 -pp; Dwwang 13 200936003, and the protrusion is formed by roughened particles for achieving an average peel strength in the surface. Preferably, it has an area of 100/^xmp and has 200 to 25,000 twisted private objects. If the number of large objects is less than 2, the inter-protrusion between the protrusions, the palace, and the pi', can not be cut into fine patterns; if the protrusions reach 2,500 or more, then It is not good for the twisting and twisting, the wind~, and the material that is too long to provide sufficient peeling strength. In addition, in order to obtain the right #工+, it has excellent peel strength and fine pattern characteristics without variation in the surface, and it is preferable that the protrusions formed by the roughened particles described later in the lamp are substantially evenly left. Eight, the child is in (knife cloth). That is, the height of the protrusions is preferably 1.0//Π1 to 5.0//m.形士+人/The height of the protrusion on the surface of the copper foil base foil is less than 1 · Ο β m ;'; w, mam Z because of the low height, the effect of improving the peel strength cannot be obtained; In the case of 5. 0 // m, the protrusions cannot be evenly distributed, and the surface roughness Rz of the surface of the copper v is increased in each range, and the peel strength of the stability is maintained. However, the Π»频特1· is not good enough to achieve micro-patterning. The height referred to here is the distance between the surface of the copper box base and the apex of the protrusion. In addition, the 'protrusion of the protrusions # # right ^, can not achieve the peel strength; and the right number is more, the surface of the copper foil 盥 - -, the dog's adhesion is also low, the effect is reduced Therefore, it is preferable to have 6 to 35 protrusions in the 25/m range of the observation section, and to select 1 to 20 protrusions. Here, the protrusions formed in the present embodiment are formed in the adjacent protrusions for a hard time of 4 months. The distance between the bottom of the groove portion and the apex of the protrusion (hereinafter referred to as the depth of the groove) is less than 0 _ 3 from m, and the adjacent protrusion is regarded as a large object; The depth of the protrusion is 2197-1Q192-PF; in the case of Dwwang. 200936003 or more, the adjacent protrusion is regarded as two protrusions. The height of the protrusion is the distance between the surface of the copper box base and the apex of the protrusion. 'This—the difference between the groove and the groove is that it is the distance between the bottom of the groove and the point of the protrusion after the surface treatment. The method of counting the number of objects is to treat the surface of the copper box. In the observation photograph obtained by observing the cross section of the grind electron microscope (SEM), the number of ten is in the range of T ^ number within the length of 25 # ra

❹ 上述疋義的突起物的個數為何的方法來進行測定。 逛有高度為1.0" m〜5.〇”的突起物的個數 的乾圍内存在6個〜35個、且在上述突起物間存在深度 〇_3"m以上的溝槽並使其大致均勻分佈,則可以避免突起 物集中於25 以内的局部,而達成銅箔的寬度方向.長 度方向的剝離強度的穩定化。 在本實施例中的「大致均勻分佈」,是指以突起物的 頂點與銅辖表面之間的高度為1· 一〜5.0…突起物的 個數為η(個),而在截面觀察突起物時的觀察寬度為 25( # m)時,在(25/n)U m)的寬度的區域中,至少有上述 突起物之一的一部分存在於此一區域中。 另外,為了謀求剥離強度的穩定化,所形成的突起物 的寬度較好為具有均一性,各突起物的最大寬度較好為 含)以上、25#m除以存在於25ym的範圍内的突 起物的個數所得長度的2倍(含)以下。而此處所稱最大寬 度疋指上述截面的SEM觀察中,與突起物的高度方向垂直 的方向的距離的最大值。 2197-10192-PP;Dwwang 15 200936003 另外,突起物間的溝槽深度中,突起物間的平均溝槽 深度更好為〇_ 5 /z m(含)以上。突起物間的平均溝槽深产是 對於溝槽深度在〇. 3 a m(含)以上的突起物n個中,測定各 突起物的二侧的溝槽深度,以此時的值為 Α1( β m)Bl( μ m)......An( # m)Bn( # m)時,以下式求得的值 即為突起物間的平均溝槽深度。 以{[(A1+B1) +......+(An + Bn)]/2/n}來求得。 ❹ ❹ 第2圖為本發明實施例中測定表面處理銅箱的觀察戴 面的圖。 —在未處理銅箱表面SU形成有突起物P。突起物p的數 量:在25㈣以内為6個(含)以上,例如為存在有㈠5個, 〇、间度疋在卜5㈣的範圍内。卩a所示的溝槽深度不滿 =的情況並未計入突起物,而是計入以b所示溝槽深 “ ’3::(含)以上的突起物。突起物P的最大寬度W為 “广含)以上、25"除以存在於25“的範圍内的突 起物P的個數所得長度的2倍(含)以下。 第圖為不佳的表面處理銅箱的觀察截面的圖。 大銅箱表面su形成有突起物p。突起物p的最 二:在”广"(含)以上、且存在有寬度為大於25“ ’、存在於25 # m的範圍内的突耙妝p从乂 士 2俨之里If # μ 大起物P的個數所得長度的 之異吊寬度的突起物P。 第4圖為不佳的表面處 在未處理銅箱夺面⑽广的觀察截面的圖。 J /曰我面SU开》虑古空1 w 物p未均勻分佈 物p’其顯示出突起 戣面在弟4圖中,具有以C所示的並 2197-10192-Pp. Dwwang 16 200936003 未存在突起物p任一部分的區域,此一情況無法視為大致 均勻分佈。 在上述構成的粗化處理面的銅箔上,形成鉻及/或鉻酸 鹽(chr⑽ate)被覆膜而進行防鏽處理,或是視需求進行石夕 烷(si 1 ane)偶合劑(coup 1 ing agent)處理或防鏽處理加上 矽烷偶合劑處理。 以下根據實施例對本發明進行更詳細地說明,但本發 明並不受限於以下的說明中。 ❹ 〈實施例〉 準備以下的銅箔基箔一至四。 銅箔基箔一测定 The method of measuring the number of the above-mentioned ambiguous projections is carried out. There are 6 to 35 dry circumferences of the number of protrusions having a height of 1.0 " m~5.〇", and a groove having a depth of 〇_3 "m or more exists between the protrusions and causes When the distribution is substantially uniform, it is possible to prevent the projections from being concentrated in a portion within 25, and to stabilize the peel strength in the width direction and the longitudinal direction of the copper foil. In the present embodiment, "substantially uniform distribution" means protrusions. The height between the apex and the copper surface is 1·1 to 5.0...the number of protrusions is η(number), and when the observation width when viewing the protrusions in section is 25 (#m), at (25/ In a region of the width of n) U m ), at least a part of one of the above-mentioned protrusions exists in this region. Further, in order to stabilize the peel strength, the width of the formed protrusions is preferably uniform, and the maximum width of each of the protrusions is preferably 5% or more, and 25#m divided by the protrusions existing in the range of 25 μm. The number of the objects is twice or less the length of the obtained number. The maximum width 此处 referred to herein means the maximum value of the distance in the direction perpendicular to the height direction of the projections in the SEM observation of the above cross section. 2197-10192-PP; Dwwang 15 200936003 In addition, in the groove depth between the protrusions, the average groove depth between the protrusions is more preferably 〇 _ 5 /z m or more. The average groove depth between the protrusions is determined by measuring the depth of the groove on both sides of each protrusion for the number of protrusions having a groove depth of 〇. 3 am or more, and the value at this time is Α1 ( When β m)Bl( μ m)...An( # m)Bn( # m), the value obtained by the following formula is the average groove depth between the protrusions. It is obtained by {[(A1+B1) +...+(An + Bn)]/2/n}. ❹ ❹ Fig. 2 is a view showing the observation surface of the surface-treated copper case in the embodiment of the present invention. - A protrusion P is formed on the surface of the untreated copper box SU. The number of the protrusions p is 6 or more in 25 (four), for example, there are (a) 5, and the 〇 and the degree 疋 are in the range of 5 (4). When the depth of the groove indicated by 卩a is not full, the projections are not counted, but the projections having a depth of '3:: or more in the groove indicated by b are included. The maximum width W of the projections P It is 2 times or less of the length obtained by dividing the number of the protrusions P which are present in the range of 25" or more. The figure is a diagram of the observation section of the surface treatment copper box which is not good. The surface of the large copper box is formed with protrusions p. The second of the protrusions p: in the range of "wide" and above, and having a width of more than 25" ', which exists in the range of 25 # m Makeup p from the gentleman 2 If If If # μ 大起物 P of the length of the different width of the protrusion P. Figure 4 is a poor surface in the untreated copper box face (10) wide Observe the cross-section of the figure. J / 曰 I face SU open" Consider the ancient space 1 w The object p is not evenly distributed p' which shows the convex surface in the brother 4, with C and 2197-10192-Pp Dwwang 16 200936003 There is no region of any part of the protrusion p, and this case cannot be regarded as a substantially uniform distribution. On the copper foil of the roughened surface of the above composition, chromium is formed. / or chromate (chr (10) ate) is coated with a film for rust-preventing treatment, or treated with a Si ane coupling agent or a rust-proof treatment plus a decane coupling agent as needed. Hereinafter, the present invention will be described in more detail based on the examples, but the present invention is not limited to the following description. 〈Examples The following copper foil base foils 1 to 4 were prepared.

Rz = 1· 26以m ;光澤面粗糙 ζ 1·52#πι;光澤面粗糖 厚度:12#m;暗面粗糙度 度:Rz= 1. 82 # m的電解銅荡。 銅箔基箔二Rz = 1·26 in m; shiny surface roughness ζ 1·52#πι; glossy surface raw sugar Thickness: 12#m; dark surface roughness Degree: Rz= 1. 82 # m electrolytic copper sway. Copper foil base foil two

厚度:12"m;暗面粗糖度 度:Rz = l · 的電解銅箔。 銅箔基箔三 光澤面粗糙 厚度:12 a m ;暗面粗糙度:rz = 1. 86 . ΙΠ > 度.Rz = l. 20/ζπι的電解銅箔。 銅箔基箔四 厚度:12/ζιη;雙面的粗糙度 箔。Thickness: 12"m; dark surface roughness: Rz = l · electrolytic copper foil. Copper foil base foil three glossy surface roughness thickness: 12 a m; dark surface roughness: rz = 1. 86 . ΙΠ > degree. Rz = l. 20 / ζ πι electrolytic copper foil. Copper foil base foil four thickness: 12/ζιη; double-sided roughness foil.

Rz=l.20 的軋延銅 將旱備的銅泊基箔一至四以下列 C施以袅而声神, 电鍍條件Λ、β、或 表面處理。在表丨顯示銅箔基箱 10192-PF;Dwwang 幻種類與電鍍條件 〇 1 - _ 200936003 的組合。而各實施例是將銅箔基箔一至四以電鍍條件A、B、 或C的鍍浴1至鍍浴2的順序進行至少一次的鍍膜所得的 表面處理銅箱。 以完成製作的表面處理銅箔的表面形狀為實施例1 ~8 示於表1中。 還有,在有些實施例的粗化處理面施以鍍鎳(0. 3mg/ dm2)、鍍鋅(0· lmg/dm2),而在其上施以鉻酸鹽處理。Rolled copper with Rz=l.20 The copper-based base foils of the dry preparations are smeared with the following C, and the plating conditions are Λ, β, or surface treatment. In the table, the copper foil base box 10192-PF; the combination of Dwwang magic type and plating condition 〇 1 - _ 200936003 is shown. Further, each of the examples is a surface-treated copper case obtained by subjecting the copper foil-based foils to at least one plating in the order of plating bath 1 to plating bath 2 of plating conditions A, B, or C. The surface shapes of the finished surface-treated copper foil were shown in Table 1 as Examples 1 to 8. Further, in the roughened surface of some of the examples, nickel plating (0.3 mg/dm2), galvanization (0.1 g/dm2) was applied, and chromate treatment was applied thereto.

電鍍條件A 锻浴1 硫酸銅(銅金屬來源) 硫酸 在目酸敍(钥金屬來源) 電流密度 通電時間 鍍浴温度 鍍浴2 硫酸銅(銅金屬來源) 硫酸 電流密度 通電時間 鍍浴溫度 電鍍條件B 鍍浴1 硫酸銅(銅金屬來源)Plating conditions A forging bath 1 copper sulfate (copper metal source) sulfuric acid in the acid (key metal source) current density energization time plating bath temperature plating bath 2 copper sulfate (copper metal source) sulfuric acid current density energization time plating bath temperature plating conditions B plating bath 1 copper sulfate (copper metal source)

5~10g/dm3 30~120g/dra3 0. 1~5. Og/dm3 10~60A/dm2 1秒~2分鐘 20~60〇C5~10g/dm3 30~120g/dra3 0. 1~5. Og/dm3 10~60A/dm2 1 second~2 minutes 20~60〇C

20~70g/dm3 30~120g/dm3 5~60A/dm2 1秒〜2分鐘 20~65〇C 1~ 5 Og/dm2 2197-10192-PF;Dwwang 18 200936003 ’ 硫酸鎳(鎳金屬來源) 2~25g/dm3 偏飢酸銨(ammonium metavanadate ;飢金屬來源) 0. l~15g/dm3 pH值 1.0-4.5 電流密度 l~60A/dm2 通電時間 1秒〜2分鐘 鍍浴溫度 鍍浴2 20 〜60°C 硫酸銅(銅金屬來源) 10~70g/dm2 A 硫酸 30~120g/dm2 電流密度 5~60A/dm2 通電時間 1秒〜2分鐘 鍍浴溫度 電鐘條件C 鍍浴1 20~65〇C 硫酸銅(銅金屬來源) l~50g/dm2 ❾ 硫酸銘(钻金屬來源) l~50g/dm3 在目酸敍(钥金屬來源) 0· 1 〜10g/dm3 pH值 0. 5~4. 0 電流密度 l~60A/dm2 通電時間 1秒〜2分鐘 鍍浴溫度 鍍浴2 20~60〇C 硫酸銅(銅金屬來源) 10~70g/dm2 硫酸 30~120g/dm2 2197-10192-PF;Dwwang 19 20093600320~70g/dm3 30~120g/dm3 5~60A/dm2 1 second~2 minutes 20~65〇C 1~ 5 Og/dm2 2197-10192-PF; Dwwang 18 200936003 ' Nickel sulfate (nickel metal source) 2~ 25g/dm3 ammonium metavanadate; source of hunger metal 0. l~15g/dm3 pH 1.0-4.5 current density l~60A/dm2 power-on time 1 second~2 minutes plating bath temperature bath 2 20 ~60 °C Copper sulfate (source of copper metal) 10~70g/dm2 A Sulfuric acid 30~120g/dm2 Current density 5~60A/dm2 Power supply time 1 second~2 minutes Plating bath temperature Electric clock condition C Plating bath 1 20~65〇C Copper sulphate (source of copper metal) l~50g/dm2 ❾ sulphuric acid syllabus (drilling metal source) l~50g/dm3 in sulphate (key metal source) 0· 1 ~10g/dm3 pH value 0. 5~4. 0 Current density l~60A/dm2 Power-on time 1 second~2 minutes Plating bath temperature plating bath 2 20~60〇C Copper sulfate (source of copper metal) 10~70g/dm2 Sulfuric acid 30~120g/dm2 2197-10192-PF; Dwwang 19 200936003

5 〜60A/dm2 1秒〜2分鐘 20-65〇C 電流密度 通電時間 鍍浴溫度 表1 銅箔 種類 處理 面 電鍍 ----- 銅箔 基箔 處理表面 粗糙度 _ (//m) 突起物間的 平均溝槽 深度(/ζπΟ 各突起物之 中的最大 寬度(卵) 25/zm寬度中的 高度l~5/zm的 突起物個數 矽烷 偶合劑 實施例1 電解 Μ A 2 5 1.05 1.81 24 益 實施例2 軋延 — B 四 2 65 0.89 2.4 18 有 實施例3 電解 Μ B 一 · 2.85 1.37 1.52 28 有 實施例4 軋延 C — 四 2. 55 1.92 1.22 34 有 夏狐例D %解 Μ B 2.8 1.18 1.14 26 有 實施例6 電解 s A— 一- _ 2.55 0.55 2. 63 13 有 實施例7 電解 Μ A Γ~2.5 1.05 1.81 24 無 實施例8 電解 S A " 3.0 0.5 2.5 6 有 比季交例1 電解 r μ A1 一 ~~2Γ5 不滿0.3 0.1以下 0 有 比較例Z 電解 s B1 三 3. 65 不滿0.3 0. 3以下 0 有 比較例3 軋延 — B’ 四 2.65 不滿0.3 0.1以下 0 有 比較例4 4# M A, — 2.5 不滿0. 3 0.1以下 0 有 比較例5 電解 S B 二 3. 65 不滿0. 3 0. 3以下 0 有 比較例b 4解 M AJ — 1.7 不滿0. 3 0.1以下 0 有 ❺5~60A/dm2 1 second~2 minutes 20-65〇C Current density energization time plating bath temperature gauge 1 copper foil type treatment surface plating----- copper foil base foil treatment surface roughness _ (//m) protrusion Average groove depth between objects (/ζπΟ maximum width among the protrusions (egg) 25/zm width of the height of l~5/zm number of protrusions decane coupling agent Example 1 Electrolysis Μ A 2 5 1.05 1.81 24 Benefit Example 2 Rolling - B 4 2 65 0.89 2.4 18 Example 3 Electrolytic Μ B 1. 2.85 1.37 1.52 28 Example 4 Rolling C — 4 2. 55 1.92 1.22 34 Summer Fox Example D % Solution B 2.8 1.18 1.14 26 Example 6 Electrolysis s A-一- _ 2.55 0.55 2. 63 13 Example 7 Electrolytic Μ A Γ~2.5 1.05 1.81 24 No Example 8 Electrolysis SA " 3.0 0.5 2.5 6 Example 1 Electrolysis r μ A1 1~~2Γ5 Less than 0.3 0.1 or less 0 There is a comparative example Z Electrolysis s B1 III 3. 65 Less than 0.3 0. 3 below 0 There is Comparative Example 3 Rolling — B' Four 2.65 Dissatisfied 0.3 0.1 The following 0 have Comparative Example 4 4# MA, — 2.5 Less than 0. 3 0.1 or less 0 There is Comparative Example 5 Electrolysis S B 2 3. 65 Less than 0. 3 0. 3 or less 0 Yes Comparative Example b 4 Solution M AJ — 1.7 Less than 0. 3 0.1 or less 0 Yes ❺

金屬粒子與 鋼箔的接合 面積的比例(%) 明度 突起物分佈: 100x100/zm2 内 的突起物個數 加熱處理 後的電阻 值增加率 (%) 耐溼試驗 後的電阻 值增加率 (%) 剝離 強度 (KN/m) 微細圖形特 性最小值L/S (Aim//zm) 賞施例1 43 22.5 9200 45 77 0. 92 25/25 實施例2 35 23 5200 53 88 0. 96 25/25 實施例3 49 21 12500 40 72 1.02 30/30 實施例4 56 16 18600 35 66 1.10 25/25 實施例5 43 22 10800 42 74 0. 93 30/30 實施例6 30 25 2700 56 94 0. 86 25/25 實施例7 43 22.5 9200 45 77 1.14 25/25 實施例8 r 37 24 6400 51 82 0.83 25/25 比較例1 21 38 0 151 186 0.47 30/30 比較例2 26 34 0 卜143 146 0. 54 55/55 比較例d 22 39 0 154 182 0.42 30/30 比較例4 21 38 0 151 186 0.63 30/30 比較例5 26 34 0 143 146 0. 71 55/55 比較例6 17 38 0 166 220 0. 57 20/20 2197-10192-PF;Dwwang 20 200936003 〈比較例〉 將準備的銅箔基箔一、三、四以下列的電鍍條件A’Ratio of joint area of metal particles to steel foil (%) Brightness projection distribution: Number of projections in 100x100/zm2 Increase in resistance value after heat treatment (%) Increase in resistance value after moisture resistance test (%) Peel strength (KN/m) Fine pattern characteristic minimum value L/S (Aim//zm) Appreciation Example 1 43 22.5 9200 45 77 0. 92 25/25 Example 2 35 23 5200 53 88 0. 96 25/25 Example 3 49 21 12500 40 72 1.02 30/30 Example 4 56 16 18600 35 66 1.10 25/25 Example 5 43 22 10800 42 74 0. 93 30/30 Example 6 30 25 2700 56 94 0. 86 25 /25 Example 7 43 22.5 9200 45 77 1.14 25/25 Example 8 r 37 24 6400 51 82 0.83 25/25 Comparative Example 1 21 38 0 151 186 0.47 30/30 Comparative Example 2 26 34 0 Bu 143 146 0. 54 55/55 Comparative Example d 22 39 0 154 182 0.42 30/30 Comparative Example 4 21 38 0 151 186 0.63 30/30 Comparative Example 5 26 34 0 143 146 0. 71 55/55 Comparative Example 6 17 38 0 166 220 0. 57 20/20 2197-10192-PF; Dwwang 20 200936003 <Comparative Example> Prepare the copper foil base foils one, three, and four with the following plating conditions A'

或B’施以表面處理。在表1 一併記錄銅領基猪的種類與 電鍍條件的組合。而各比較例是將銅箔基箔一或三以上述 電鍍條件A’或B’的鍍浴1至鍍浴2的順序進行至少一次 的鍍膜所得的表面處理銅箔。而在比較例製成的表面處理 銅箔之與絕緣基板的接合面(粗化處理面)那一側的表面, 施以锻鎳(0.3 mg/dm2)、鍍鋅(0. lmg/dm2),再於其上進行鉻 酸鹽處理,而成為比較例的試片。 以完成製作的表面處理銅箔的表面形狀為比較例1 ~6 一併記錄於表1中 電鍍條件A’ 鍍浴1 5~10g/dm3 30~120g/dm3 0.1-5. Og/dm3 10~60A/dm2 1秒〜2分鐘 20~60〇C 20~70g/dm3 30~120g/dm3 3A/dm2 2分鐘以上(依照表面粗糙度變更時間) 硫酸銅(銅金屬來源) 硫酸 鉬酸錄(鉬金屬來源) 電流密度 通電時間 鍍浴溫度 鍍浴2 硫酸銅(銅金屬來源) 硫酸 電流密度 通電時間 2197-10192-PF;Dwwang 21 200936003 鍍浴溫度 電鍍條件B’ 鍍浴1 硫酸銅(銅金屬來源) 硫酸鎳(鎳金屬來源) 偏鈒酸銨(叙金屬來源) pH值 電流密度 通電時間 鍍浴溫度 鍍浴2 硫酸銅(銅金屬來源) 硫酸 電流密度 通電時間 鍍浴溫度Or B' is subjected to a surface treatment. Table 1 also records the combination of the type of copper collar pig and the plating conditions. Each of the comparative examples is a surface-treated copper foil obtained by subjecting the copper foil-based foil to one or three plating baths 1 to B in the order of plating conditions A' or B'. On the surface of the surface of the surface-treated copper foil of the comparative example and the insulating substrate (roughened surface), wrought nickel (0.3 mg/dm2) and galvanized (0.1 mg/dm2) were applied. Then, chromate treatment was carried out thereon, and it became a test piece of a comparative example. The surface shape of the finished surface-treated copper foil was Comparative Example 1 to 6 and recorded in Table 1 for plating conditions A' plating bath 1 5~10g/dm3 30~120g/dm3 0.1-5. Og/dm3 10~ 60A/dm2 1 second~2 minutes 20~60〇C 20~70g/dm3 30~120g/dm3 3A/dm2 2 minutes or more (change time according to surface roughness) Copper sulfate (copper metal source) Molybdenum sulfate record (molybdenum Metal source) Current density energization time plating bath temperature plating bath 2 copper sulfate (copper metal source) sulfuric acid current density energization time 2197-10192-PF; Dwwang 21 200936003 plating bath temperature plating condition B' plating bath 1 copper sulfate (copper metal source Nickel sulphate (nickel metal source) ammonium bismuth citrate (synthesis metal source) pH current density energization time plating bath temperature plating bath 2 copper sulfate (copper metal source) sulfuric acid current density energization time plating bath temperature

15°C 參 l~50g/dm2 2~25g/dm3 0. l~15g/dm3 1.0-4.5 l~60A/dm2 1秒〜2分鐘15°C Reference l~50g/dm2 2~25g/dm3 0. l~15g/dm3 1.0-4.5 l~60A/dm2 1 second~2 minutes

20~60〇C 20~70g/dm2 30~120g/dm2 3A/dm2 2分鐘以上(依照表面粗糙度變更時間) 15。。 [剝離強度的測定·評判] 將實施例及比較例製成的表面處理銅箔裁切為長 250mm、寬250匪之後,將其已施以粗化處理的面置於熱壓 合後會成為1mm厚度的張數的BT樹脂(三菱瓦斯化學股份 有限公司的商標,是由雙馬來亞醯胺-三氮雜苯 (bismaleimide triazine)樹脂所構成的熱硬化樹脂)之 上,將全體夾置於二片平滑的不銹鋼板之間,進行溫度1 9 ◦ °C、壓力50kg/cm2之下90分鐘的熱壓合,而測定貼附的 2197-10192-PF;Dwwang 22 200936003 剝離強度。 剝離強度的測定’是根據JIS C6471,以ι8〇度方向 拉出、剝離。 他表1明確顯不’各實施例均滿足〇 . 9ΚΝ/ιη以上的剝 離強度,但是比較例1~6中的剝離強度為〇· 8KN/m,而未 滿足剝離強度的要求。 [微細圖形特性評判] ❹第5圖為將上述製成的表面處理銅箔F貼附於bt樹脂 等的基才反SB,再如下文所述進行加工時的截面概略圖。 如第5圖所示,將已形成決定線寬:L、間隔寬:S的 阻㈣R的銅vl F以氯化鐵浴進行银刻。以線寬的頂部寬度 與阻劑寬度相同為準則決定银刻時間,以各〇 = 1 〇的條件製 成已形成決定各線寬及各問卩3官r + U «, 谷間隔見(在一片基板形成10條線) 的阻劑R的基板,在氯化鐵洛中以上述決定的時間進行飯 刻、。在各基板中,觀察導線間無發生橋接、無殘留根部、 ©及導線的頂部寬度與阻劑相同的情況。《 n=l〇的條件製成 的各基板中未觀察到橋接及殘留根部情況中最小的L. S的 值示於表1。 一 K W n r ,可以製成 L/S--30/30(含)以下的微細圖形。比較例6以外的各比較例 雖可勉強製成30/30的圖形’但已不可能再縮小。另外, 比較例6由於表面處理粗糙度小,而適用於製成微細圖形。 [加熱後的電阻值的增加率測定] 樹脂開出核心孔並充填導電糊後進行壓合,使銅 2197-10192-PF;Dwwang 23 200936003 粒子臾 述壓合 因上 銅箔接合而測定其電阻值。將 m 將此測定結果作為 而加熱後的電阻值增加率顯示於表1。 理後的電阻值的 1 ~ 6的熱處理後 從表1明確顯示,在各實施例的熱處 增加率均在60%以下,相對於此’比較例 的電阻值的增加率均超過1 4〇%。 另外,進行对溼試驗後測定同樣地方的電阻值而計算 在耐溼試驗前後的電阻值的增加率,並確認其優劣。20~60〇C 20~70g/dm2 30~120g/dm2 3A/dm2 2 minutes or more (change time according to surface roughness) 15. . [Measurement and Evaluation of Peeling Strength] After the surface-treated copper foil prepared in the examples and the comparative examples was cut into a length of 250 mm and a width of 250 Å, the surface subjected to the roughening treatment was placed after thermocompression bonding. The number of sheets of BT resin having a thickness of 1 mm (the trademark of Mitsubishi Gas Chemical Co., Ltd., which is a thermosetting resin composed of bismaleimide triazine resin) is placed on the whole The peeling strength of the attached 2197-10192-PF; Dwwang 22 200936003 was measured between two smooth stainless steel plates at a temperature of 19 ◦ ° C and a pressure of 50 kg/cm 2 for 90 minutes. The measurement of the peel strength was carried out in accordance with JIS C6471 in the direction of ι8 twist and peeled off. It is clear from Table 1 that each of the examples satisfies the peel strength of ΚΝ. 9ΚΝ/ιη or more, but the peel strength in Comparative Examples 1 to 6 is 〇·8 KN/m, and the peel strength is not satisfied. [Micro-pattern characteristic evaluation] Fig. 5 is a schematic cross-sectional view showing the surface-treated copper foil F produced as described above attached to the base SB of bt resin or the like, and processed as described below. As shown in Fig. 5, the copper vl F which has formed the resistance (4) R which determines the line width: L and the interval width: S is silver-engraved with a ferric chloride bath. The silver engraving time is determined by the same width of the top of the line width and the width of the resist. The conditions of each 〇 = 1 已 are formed to determine the width of each line and each of the 3 r r + U «, the valley interval is seen (in one piece The substrate of the resist R of the substrate was formed into 10 lines, and the rice was immersed in the ferric chloride at the time determined above. In each of the substrates, it was observed that there was no bridging between the wires, no residual roots, and the top width of the wires and the wires were the same as the resist. The value of the smallest L.S. in which no bridging and residual roots were observed in each of the substrates made under the condition of n = 1 示 is shown in Table 1. A K W n r can be made into a fine pattern of L/S--30/30 or less. Comparative examples other than Comparative Example 6 Although it is possible to make a 30/30 pattern, it is impossible to reduce it. Further, Comparative Example 6 was suitable for forming a fine pattern because the surface treatment roughness was small. [Measurement of increase rate of resistance after heating] The resin is opened to the core hole and filled with a conductive paste, and then pressed to make copper 2197-10192-PF; Dwwang 23 200936003 Particles are pressed and tested for resistance by bonding copper foil. value. The increase rate of the resistance value after heating the measurement result as shown in Table 1 is shown in Table 1. From the heat treatment of 1 to 6 after the subsequent resistance value, it is clearly shown in Table 1 that the increase rate of the heat in each of the examples is 60% or less, and the increase rate of the resistance value of the comparative example exceeds 14%. %. Further, the resistance value in the same place was measured after the wet test, and the increase rate of the resistance value before and after the moisture resistance test was calculated, and the merits and demerits were confirmed.

從表i明確顯示,在各實施例的耐㈣驗後的電阻值 的增加率均在以下’相對於此’比較例Η的耐渔試 驗後的電阻值的增加率均超過14〇%。 [明度的測定] 關於明度的測定方法與前文所述相同。在個實施例中 的明度為25(含)以下,而比較例卜6則為3〇以上。 如上所述’在各實施例中,金屬粒子與銅笛的接合面 積為30%(含)以上,而可製成滿足剝離強度、明度、電阻 ©值、加熱試驗及耐澄試驗後的電阻值增加的比例、微细圖 形的製成的條件的銅箱。相對於此,比較例Η的金屬粒 子與銅箱的接合面積為30%以下,並無法得到滿足明度、 電阻值、加熱試驗及耐渔試驗後的電阻值增加的比例的結 果,另外亦不能滿足剝離強度、微細圖形的製成的條件, 而未得到滿足全部條件的銅箔。 斤本發明是完成使突起物形成於銅箱表面的表面處理銅 箔,而上述突起物顯示出由粗化粒子所形成的特定的形狀 與分佈,藉此即使粗糖度小,亦確保強力的黏著性及與導 2197-l〇l92-PF;Dwwang 24 200936003 電糊的金屬粒子的接合面積,而可以提供保有穩定的電傳 導性的表面處理銅箔。 【圖式簡單說明】 第Ua)~l(i)圖是說明ΙνίΙ法的步驟的步驟圖。 第2圖是本發明的一實施例的截面概略圖。 第3圖是顯不表面處理銅箔中具.有不佳的截面形狀的As is clear from Table i, the rate of increase in the resistance value after the (fourth) test in each of the examples was more than 14% by the increase rate of the resistance value after the fishery test of the comparative example 以下. [Measurement of Luminance] The measurement method of the brightness is the same as described above. In one embodiment, the brightness is 25 or less, and the comparative example 6 is 3 or more. As described above, in each of the examples, the bonding area of the metal particles and the copper flute is 30% or more, and the resistance values satisfying the peel strength, the brightness, the resistance value, the heating test, and the resistance test can be obtained. Increase the proportion of the copper box for the conditions of the micro-pattern. On the other hand, in the comparative example, the joint area of the metal particles and the copper box was 30% or less, and the result of satisfying the increase in the resistance value after the brightness test, the resistance value, the heating test, and the fish-resistant test was not obtained, and it was not satisfied. The conditions for the production of the peel strength and the fine pattern were not obtained, and the copper foil satisfying all the conditions was not obtained. The present invention is a surface-treated copper foil which is formed on the surface of a copper box, and the protrusions exhibit a specific shape and distribution formed by roughened particles, thereby ensuring strong adhesion even if the sugar content is small. And the surface area of the metal particles of the electric paste of the 2197-l〇l92-PF; Dwwang 24 200936003, and can provide a surface-treated copper foil which maintains stable electrical conductivity. [Simple description of the diagram] The Ua)~l(i) diagram is a step diagram illustrating the steps of the ΙνίΙ method. Fig. 2 is a schematic cross-sectional view showing an embodiment of the present invention. Figure 3 is a diagram showing the surface shape of a copper foil with a poor cross-sectional shape.

表面處理銅箔的截面的概略截面圖。 第4圖是顯示表面處理鋼落中具有不佳的截面形狀的 表面處理銅箔的截面的概略截面圖。 圖 第 5圖是說明微細圖形形成 中的蝕刻寬度的截面說明 【主要元件符號說明】 1〜絕緣基板; φ 2 ~貫穿孔; 3 ~導電糊; 4〜銅箔; 5〜銅箔; 10〜基板; 11〜基板; 12〜基板; 13〜銅箔; 14〜銅箔; 2197-10192-PF;Dwwang 200936003 15〜基板; 1 6〜基板; 1 7〜銅箱; 1 8 ~銅羯; a〜溝槽深度不滿0. 3 # m的情況; b〜溝槽深度在0. 3 // m (含)以上的情況; c〜未存在突起物P任一部分的區域;A schematic cross-sectional view of a cross section of a surface-treated copper foil. Fig. 4 is a schematic cross-sectional view showing a cross section of a surface-treated copper foil having a poor cross-sectional shape in a surface-treated steel. Figure 5 is a cross-sectional view showing the etching width in the formation of fine patterns [Description of main components] 1~insulating substrate; φ 2 ~through hole; 3 ~conductive paste; 4~copper foil; 5~copper foil; 11; substrate; 12~ substrate; 13~ copper foil; 14~ copper foil; 2197-10192-PF; Dwwang 200936003 15~ substrate; 1 6~ substrate; 1 7~ copper box; ~ The groove depth is less than 0.3. 3 # m; b~ groove depth is 0.3 / m (inclusive); c ~ there is no region of any part of the protrusion P;

P〜突起物; R~阻劑; S B〜基板; SU〜未處理銅箔表面; W〜最大寬度。 ❿ 2197-10192-PF;Dwwang 26P~protrusion; R~resist; S B~substrate; SU~untreated copper foil surface; W~max width. ❿ 2197-10192-PF; Dwwang 26

Claims (1)

200936003 十、申請專利範圍: 1·-種表面處理鋼箱’其為在—層 路的表―其中在該層積基板中,是在 板的正面與^設置有上述㈣線路,而藉由 緣基板的導通孔中充埴认A嵐▲ 7 且亥絕 真的金屬粒子連接上述銅箔線路, 該表面處理銅簿包含: 設置於-銅_的至少一表面的一表面 ❹ 使該銅箱基箱的表面中與上述金屬粒子接合的接合部之盥 上述金屬粒子的接人而从二过 ^ «面的面積,為該表面處理鋼 積的30%(含)以上。 2.如申請專利範圍第1項所述的表面處理銅箱,其中 該表面處理層是在該鋼羯基箱的表面附著粗化粒子的層, 該表面處理層的表面的Rz 4 U〜3.0…明曰度 (brightness)值為 25(含)以下。 如申叫專利圍第1項所述之表面處理銅箱,其中 上述表面處理層係在該表面處理層的ι〇〇&quot;χΐ。。“的面 積中,分佈有勝25_個高度為卜5/^之由上述粗化粒 子所構成的突起物。 、如申°月專利範圍第1項所述之表面處理銅箔,其中 上述表面處理層係在該表面處理層的觀察截面的範 圍中,大致平均分佈有6〜35個高度為卜5#m之由上述粗 化粒子所構成的突起物。 •士申明專利範圍第1項所述之表面處理銅箔,里中 在該表面處理層中的上述突起物之間的最大寬度為 2197-10192-pp. Dwwang 27 200936003 O.OUin以上、250^除以存在於觀察截淺 的突起物的個數所得長度的2倍以下。 6. —種電路基板,其特徵在於係使用 第1〜5項任一項所述之表面處理鋼箔所製 25/ζπι的範圍内 如申請專利範圍 成。200936003 X. Patent application scope: 1·- kinds of surface treatment steel box 'which is the table of the layer---in the laminated substrate, the front side of the board is provided with the above (4) line, and by the edge The via hole of the substrate is filled with A 岚 ▲ 7 and the metal particles are connected to the copper foil line, and the surface treated copper book comprises: a surface disposed on at least one surface of the copper ❹ to make the copper box base In the joint portion of the surface of the tank which is joined to the metal particles, the metal particles are joined to each other, and the area of the surface is 30% or more of the surface-treated steel product. 2. The surface-treated copper box according to claim 1, wherein the surface treatment layer is a layer to which roughened particles are attached to a surface of the steel base, and the surface of the surface treatment layer is Rz 4 U to 3.0. ...the brightness value is below 25 (inclusive). The surface treatment copper box of claim 1, wherein the surface treatment layer is 〇〇 〇〇 quot 该. . A surface-treated copper foil according to the above-mentioned roughened particle, wherein the surface is a surface-treated copper foil having a height of 25 Å and a height of 5 Å. In the range of the observation cross section of the surface treatment layer, the treatment layer has an average of 6 to 35 protrusions composed of the roughened particles having a height of 5#m. The surface treated copper foil, wherein the maximum width between the protrusions in the surface treatment layer is 2197-10192-pp. Dwwang 27 200936003 O.OUin or more, 250^ divided by the protrusions present in the observation truncation 6. The circuit board is characterized by the use of the surface-treated steel foil according to any one of items 1 to 5 in the range of 25/ζπι. to make. 2197-10192-PF;Dwwang 282197-10192-PF; Dwwang 28
TW097147376A 2007-12-10 2008-12-05 Surface treatment of copper foil and circuit substrate TWI402009B (en)

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WO2015012327A1 (en) * 2013-07-23 2015-01-29 Jx日鉱日石金属株式会社 Treated surface copper foil, copper foil with carrier, substrate, resin substrate, printed circuit board, copper clad laminate, and printed circuit board manufacturing method
CN104735929B (en) * 2013-12-24 2017-12-29 深南电路有限公司 Circuit board processing method and equipment
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WO2016100405A1 (en) * 2014-12-16 2016-06-23 Amphenol Corporation High-speed interconnects for printed circuit boards
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