200921113 九、發明說明： 【發明所屬之技術領域】 - 本發明涉及一種介面測試系統，尤其是一種高解析度 多媒體介面（High-Definition Multimedia Interface，HDMI) 測試系統。 【先前技術】 在個人電腦和各類消費電子領域，帶HDMI介面的設 備由於既能支援音頻傳輸又能支援視頻傳輸，因此，越來 越受到廣大用戶的青睞。 以往，對HDMI介面的測試通常採用如圖1所示的測試 系統。參閱圖1所示，該測試系統包括：待測物1，測試治 具2 ’直流電源供應器3，示波器探棒4及示波器5。所述待 測物1包括HDMI 10。 在上述測試系統中，所述示波器探棒4透過測試治具2 將 HDMI 介面 1〇 輸出的 TMDS ( Transition Minimized ' Differential Signaling，最小化傳輸差分信號）數位信號及 TMDS時鐘信號引出’並透過直流電源供應器3輸出的 +3.3V直流電源作為上拉電壓’捕獲所述tmdS數位信號及 TMDS時鐘信號’將捕獲的TMDS數位信號及TMDS時鐘信 號傳送至示波器5中進行信號分析。 按照上述的測試系統對HDMI 10進行信號測試會出現 以下問題： 一、測試設備多，測試成本高。除了被測試的帶有 200921113 HDMI 10的待測物1外，還需要測試治具2、示波器5、示波 器探棒4及外接的直流電源供應器3，而其中的一台直流電 源供應器3的價格就需要幾萬甚至幾十萬。 二、測試信號的過沖/欠沖不符合要求。由於使用外接 的直流電源供應器3提供+3.3V電源，容易引起直流電源供 應器3與示波器5之間的信號相互干擾而產生雜訊。為了消 除上述的噪音，需要進一步的配備遮罩噪音效果良好的設 備，因此’更增加了測試成本。200921113 IX. Description of the Invention: [Technical Field] The present invention relates to an interface test system, and more particularly to a high-definition multimedia interface (HDMI) test system. [Prior Art] In the personal computer and various consumer electronics fields, devices with an HDMI interface are increasingly favored by users because they support both audio transmission and video transmission. In the past, testing of the HDMI interface typically used the test system shown in Figure 1. Referring to Fig. 1, the test system includes: a test object 1, a test fixture 2' DC power supply 3, an oscilloscope probe 4, and an oscilloscope 5. The object to be tested 1 includes an HDMI 10. In the above test system, the oscilloscope probe 4 passes the TMDS (Transition Minimized 'Differential Signaling) digital signal and the TMDS clock signal of the HDMI interface 1〇 through the test fixture 2 and passes through the DC power supply. The +3.3V DC power supply output from the supplier 3 is used as a pull-up voltage 'capture the tmdS digital signal and the TMDS clock signal' to transmit the captured TMDS digital signal and the TMDS clock signal to the oscilloscope 5 for signal analysis. According to the above test system, the following problems can be solved when testing the signal of HDMI 10: 1. There are many test equipments and the test cost is high. In addition to the tested object 1 with 200921113 HDMI 10, it is also necessary to test the fixture 2, the oscilloscope 5, the oscilloscope probe 4 and the external DC power supply 3, and one of the DC power supplies 3 The price will cost tens of thousands or even hundreds of thousands. Second, the overshoot/undershoot of the test signal does not meet the requirements. Since the external DC power supply 3 is used to provide a +3.3V power supply, it is easy to cause signals between the DC power supply 3 and the oscilloscope 5 to interfere with each other to generate noise. In order to eliminate the above noise, it is necessary to further equip the device with a good noise effect, so that the test cost is increased.
【發明内容】 #於以上内容，有必要提出一種HDMI介面測試系 統，其可以減少Η麵的測試成本，並減少對HDMi測試過 程中的信號干擾。 '一種高解析度多媒體介面測試系統，該系統包括測試 治具、示波器探棒及示波器。所述測試治具與—個待測物 相連’所述高解析度多媒體介面安裝於該待測物上。所述 不波器探棒與所述示波器相連並透過測試治具連接所述高 解析度多媒體介面。該讀諸棒用於透過測試治呈捕於 所述高解析度多媒體介面的輸出信號，並將捕獲的輸^ =專送至示波||巾以進行信號分析。所述的示波器内包括SUMMARY OF THE INVENTION # In the above, it is necessary to propose an HDMI interface test system, which can reduce the test cost of the face and reduce the signal interference during the HDMi test. 'A high-resolution multimedia interface test system that includes test fixtures, oscilloscope probes, and oscilloscopes. The test fixture is connected to a test object. The high-resolution multimedia interface is mounted on the object to be tested. The non-wave detector is coupled to the oscilloscope and coupled to the high resolution multimedia interface via a test fixture. The reading stick is used to pass the test signal to capture the output signal of the high-resolution multimedia interface, and the captured input is sent to the oscilloscope | | towel for signal analysis. Included in the oscilloscope
Si二電：引出單元。所述電源裝置用於提供電源給 /的内#%路。所述電源引出單元包括兩條電路線， 刀別接於電源裝置的正負極及示波器探棒之間，用於將兩 =裝置提供的電源引出到示波器之外，並透過示波器探二 別出至^治具上，作為高解析度多媒體介面的輪出㈣ 7 200921113 的上拉電壓。 • 相較於習知技術，本發明所提供的HDMI介面測試系 . 統將示波器内部的直流電源輸出’不需要購買用於提供上 拉電壓的外部直流電源供應器’節省了成本，並且也有效 地消除了由於使用外部直流電源供應器而與示波器之間產 生的信號干擾。 【實施方式】 f 參閱圖2所示，是本發明HDMI介面測試系統較佳實施 例的系統架構圖。該HDMI介面測試系統包括：待測物i、 測試治具2、示波器探棒4及示波器5。 其中，所述待測物1可以為臺式電腦，筆記本電腦， 及有線電視機頂盒等電子產品，其提供至少一個HDMI介 面10，用於輸出待測試的輸出信號，所述輪出信號包括 TMDS數位信號及TMDS時鐘信號。 所述測試治具2包括一個11〇%1插口，用於連接所述 L HDMI介面10 ’將HDMI介面10輸出的TMDS數位信號及 TMDSB^鐘信號引入到測試治具2的線路板上。測試治具2 還包括一個SMA ( Su_niature versi〇n A , A版本迷你型） 同軸插口，用於連接示波器探棒4，將引入到測試治具2的 線路板上的TMDS數位信號及TMDS時鐘信號 到示波 器探棒4上。 、上所述不波器探棒4包括一個3河八同軸介面，其與上述 測具2的SMA同轴插口相連接，以捕獲所述的懷仍 數位k遽及TMDS時鐘信號。所述示波器探棒4還包括一個 200921113 “準的示波器介面，用於連接示波器 ™職位信號及TMDS時鐘信號叙合到示：^ 所述示波器5用於對上述丁刪數 及 信號進行分析測試。該示波器 =及丁_時知 個電源引出單元7。 括—個電源裝置6及- 所述电源裝置ό用於提供電源給示兩 置的正負極及:’分別接於電源裝 源引出到㈣於將電源裝置6提供的電 作為所述ΤΜ $之外，透過不波器探棒4輪出至測試治具2 TMDS數位信號及葡S時鐘信號的上拉電壓’以 更不“探棒4捕獲該TMDS數位信號及τΜΜ時鐘信號。 雷、2 =除電源裝置6提供的、被引出到示波器5之外的 、、源中，雜波信號，以及出於保護示波器5的目的，所 6原的 1 出極早Γ7^包括—個保險絲&其串聯接在電源裝置 的極上’所述電源裝置6的負極接地並連接到示波德 其二:=^；=：^誤操作而使待_等 一 的電源々IL入到不波益5的内部電路，引恭 短路從而損壞示波器5。所述電源引出單元7還可以勺二 個控制開關70 ’其串聯接於保險絲71及示波器探棒二 用於當需要將電源裝置6提供的電源引出到示波器5二 =供^制開關7〇處於閉合狀態，及當不需要將電源裝置6 狀態的讀、引㈣示波H5之㈣，該控侧咖處於斷開 此外，所述的電源引出單元7還可以包括並聯連接於 200921113 電源裝置6的正極和負極之間的電解電容Cl及瓷片電容 C2。其中的電解電容C1的正極與電源單元6的正極相連， 電解電容C1的負極與電源單元6的負極相連，用於過濾電 源裝置6的電路引起的低頻雜波；及所述的瓷片電容C2用 於過濾由於電路線路過長或者示波器.5内其他電路輻射過 來的高頻雜波。 進一步的，所述的電源引出單元7也可以利用圖3所示 的第二種實施電路圖來實現。如圖3所示，該電源引出單元 7包括：一個電感器72串聯連接在電源裝置6的正極與保險 絲71之間，用於過濾電源裝置6的電路引起的低頻雜波；及 瓷片電容C2，並聯連接於電源裝置6的正極和負極之間， 用於過濾由於電路線路過長或者示波器5内其他電路輻射 過來的高頻雜波，以及控制開關70，串聯接於保險絲71及 示波器探棒4之間。 進一步的，為了防止由於誤操作而使待測物1等其他 外部設備的電源流入到示波器5的内部電路，引起電源短路 從而損壞示波器5,所述圖2及圖3中的保險絲71也可以用一 個具有單嚮導通功能的二極體代替，其中，二極體的正極 與電源裝置6的正極相連接，及二極體的負極直接與示波器 探棒4相連，或者二極體的負極透過控制開關70與示波器探 棒4相連（未圖示）。 這長需要說明的是’無論在圖2所不的電源引出早元7 的實施電路圖中所包括的控制開關70、保險絲71、電解電 容C1及瓷片電容C2’還是在圖3所示的電源引出單元7的第 10 200921113 二種實現電路圖中所包括的控制開關70、保險絲71、電感 器72及瓷片電容C2，或者上述的將圖2及圖3中的保險絲71 替換成二極體，所有上述元件都不是必需地包括在電源引 出單元7的實施電路中，即圖2所示的電源引出單元7的實施 電路圖中並不必需包括控制開關70、保險絲71、電解電容 C1及瓷片電容C2四個元件，其可以根據使用者的需求而只 包括其中的某個或者某幾個元件，同理，圖3所示的電源引 出單元7的第二種實現電路圖中也並不必需包括控制開關 70、保險絲71、電感器72及瓷片電容C2四個元件，其可以 根據使用者的需求而只包括其中的某個或者某幾個元件。 本發明所提供的HDMI介面測試系統可以將示波器内 部的直流電源輸出，不需要額外購買用於提供上拉電壓的 外部直流電源供應器，節省了成本，並且也有效地消除了 由於使用外部直流電源供應器而與示波器之間產生的信號 干擾。進一步的，本發明對示波器的改進完全獨立于示波 器内現有的硬體電路，不會對示波器原有的性能產生任何 影響，且無需改變示波器現有的軟體應用環境，就可以控 制示波器的直流電源的輸出，設計起來簡單方便。 以上所述僅為本發明之較佳實施例而已，且已達廣泛 之使用功效，凡其他未脫離本發明所揭示之精神下所完成 之均等變化或修飾，均應包含在下述之申請專利範圍内。 【圖式簡單說明】 圖1係傳統的對HDMI介面進行測試的系統架構圖。 圖2係本發明HDMI介面測試系統較佳實施例的系統 11 200921113 架構圖。 ' 圖3係本發明HDMI介面測試系統中示波器内的電源 引出單元的第二種實現電路圖。 【主要元件符號說明】 待測物 1 HDMI 10 測試治具 2 直流電源供應器 3 示波器探棒 4 示波器 5 電源裝置 6 電源引出單元 7 控制開關 70 保險絲 71 電感器 72 電解電容 C1 瓷片電容 C2 12Si two electricity: lead out unit. The power supply unit is used to provide power to the internal #% way. The power take-off unit includes two circuit lines, and the cutter is connected between the positive and negative poles of the power supply device and the oscilloscope probe, and is used to lead the power supply provided by the two devices to the outside of the oscilloscope, and the oscilloscope is detected by the oscilloscope. ^ Fixture, as the pull-up voltage of the high-resolution multimedia interface (4) 7 200921113. • Compared to the prior art, the HDMI interface test system provided by the present invention saves the cost and is effective in the DC power supply output of the oscilloscope, which does not require the purchase of an external DC power supply for providing a pull-up voltage. The signal interference generated between the oscilloscope and the oscilloscope due to the use of an external DC power supply is eliminated. [Embodiment] f Referring to Fig. 2, it is a system architecture diagram of a preferred embodiment of the HDMI interface test system of the present invention. The HDMI interface test system includes: a test object i, a test fixture 2, an oscilloscope probe 4, and an oscilloscope 5. The object to be tested 1 may be an electronic product such as a desktop computer, a notebook computer, or a cable set-top box, and provides at least one HDMI interface 10 for outputting an output signal to be tested, the round-out signal including a TMDS digit. Signal and TMDS clock signal. The test fixture 2 includes an 11〇%1 jack for connecting the L HDMI interface 10' to the TMDS digital signal and the TMDSB clock signal output from the HDMI interface 10 to the circuit board of the test fixture 2. The test fixture 2 also includes an SMA (Su_niature versi〇n A, version A mini) coaxial jack for connecting the oscilloscope probe 4 to the TMDS digital signal and TMDS clock signal that will be introduced to the test fixture 2's circuit board. Go to the oscilloscope probe 4. The non-wave probe 4 includes a 3-channel eight-coaxial interface that is coupled to the SMA coaxial jack of the test tool 2 to capture the digital signal and the TMDS clock signal. The oscilloscope probe 4 further includes a 200921113 "quasi- oscilloscope interface for connecting the oscilloscope TM position signal and the TMDS clock signal to the display: ^ The oscilloscope 5 is used for analyzing and testing the above-mentioned D number and signal. The oscilloscope=and __ knows a power supply unit 7. The power supply unit 6 and the power supply unit ό are used to supply power to the two positive and negative poles and the: In addition to the electric power provided by the power supply unit 6, the unplugged probe 4 is rotated through the non-wave detector 4 to the test fixture 2 TMDS digital signal and the Portuguese S clock signal pull-up voltage 'to even less than the probe 4 The TMDS digital signal and the τΜΜ clock signal are captured. Ray, 2 = except for the power supply unit 6, which is taken out of the oscilloscope 5, the source, the clutter signal, and the purpose of protecting the oscilloscope 5, the original 1 is very early. The fuse & is connected in series to the pole of the power supply device. The negative pole of the power supply device 6 is grounded and connected to the oscillating second: =^;=:^ erroneous operation causes the power supply 々IL of the standby _IL to enter the non-wave The internal circuit of the benefit 5 is short-circuited to damage the oscilloscope 5. The power take-off unit 7 can also be scooped by two control switches 70' which are connected in series to the fuse 71 and the oscilloscope probe 2 for when the power supply provided by the power supply unit 6 needs to be taken out to the oscilloscope 5==the control switch 7〇 In the closed state, and when it is not necessary to read (4) the state of the power supply unit 6 (4), the control side coffee is disconnected. In addition, the power supply unit 7 may further include a power supply unit 6 connected in parallel to the 200921113 power supply unit 6. The electrolytic capacitor C1 and the ceramic capacitor C2 between the positive electrode and the negative electrode. The positive electrode of the electrolytic capacitor C1 is connected to the positive pole of the power supply unit 6, and the negative electrode of the electrolytic capacitor C1 is connected to the negative pole of the power supply unit 6, for filtering low frequency noise caused by the circuit of the power supply device 6; and the ceramic capacitor C2 Used to filter high frequency clutter due to long circuit lines or other circuits in the oscilloscope .5. Further, the power supply unit 7 can also be implemented by using the second implementation circuit diagram shown in FIG. As shown in FIG. 3, the power supply unit 7 includes: an inductor 72 connected in series between the positive pole of the power supply unit 6 and the fuse 71 for filtering low frequency noise caused by the circuit of the power supply unit 6; and the ceramic capacitor C2 Connected in parallel between the positive pole and the negative pole of the power supply device 6 for filtering high frequency clutter due to excessive circuit lines or other circuits in the oscilloscope 5, and controlling the switch 70, connected in series to the fuse 71 and the oscilloscope probe Between 4. Further, in order to prevent the power supply of other external devices such as the object to be tested 1 from flowing into the internal circuit of the oscilloscope 5 due to erroneous operation, causing a short circuit of the power source to damage the oscilloscope 5, the fuse 71 in FIGS. 2 and 3 may also use a A diode having a unidirectional conduction function is replaced, wherein the anode of the diode is connected to the anode of the power supply device 6, and the cathode of the diode is directly connected to the oscilloscope probe 4, or the anode of the diode is transmitted through the control switch. 70 is connected to the oscilloscope probe 4 (not shown). It should be noted that the control switch 70, the fuse 71, the electrolytic capacitor C1, and the ceramic capacitor C2' included in the circuit diagram of the power supply of the early 7th, which is not shown in FIG. 2, or the power supply shown in FIG. The control switch 70, the fuse 71, the inductor 72, and the ceramic capacitor C2 included in the circuit diagram of the 10th 200921113 of the lead-out unit 7 or the above-mentioned fuse 71 in FIG. 2 and FIG. 3 are replaced with a diode, All of the above components are not necessarily included in the implementation circuit of the power supply unit 7, that is, the implementation circuit diagram of the power supply unit 7 shown in FIG. 2 does not necessarily include the control switch 70, the fuse 71, the electrolytic capacitor C1, and the ceramic capacitor. C2 four components, which can only include one or some of the components according to the needs of the user. Similarly, the second implementation circuit diagram of the power supply unit 7 shown in FIG. 3 does not necessarily include control. The switch 70, the fuse 71, the inductor 72 and the ceramic capacitor C2 are four components, which may include only one or a few of the components according to the needs of the user. The HDMI interface test system provided by the invention can output the DC power supply inside the oscilloscope without additional purchase of an external DC power supply for providing a pull-up voltage, which saves cost and effectively eliminates the use of an external DC power supply. Signal interference generated between the supplier and the oscilloscope. Further, the improvement of the oscilloscope of the present invention is completely independent of the existing hardware circuit in the oscilloscope, does not have any influence on the original performance of the oscilloscope, and can control the DC power supply of the oscilloscope without changing the existing software application environment of the oscilloscope. The output is simple and convenient to design. The above is only the preferred embodiment of the present invention, and has been used in a wide range of applications. Any other equivalent changes or modifications which are not departing from the spirit of the present invention should be included in the following claims. Inside. [Simple description of the diagram] Figure 1 is a traditional system architecture diagram for testing the HDMI interface. 2 is a system diagram of a preferred embodiment of the HDMI interface test system of the present invention. Figure 3 is a second implementation circuit diagram of the power take-off unit in the oscilloscope in the HDMI interface test system of the present invention. [Main component symbol description] DUT 1 HDMI 10 test fixture 2 DC power supply 3 oscilloscope probe 4 oscilloscope 5 power supply unit 6 power supply unit 7 control switch 70 fuse 71 inductor 72 electrolytic capacitor C1 ceramic capacitor C2 12