TW200918875A - Photoelasticity detection method and application method thereof for detecting residual stress of components - Google Patents
Photoelasticity detection method and application method thereof for detecting residual stress of components Download PDFInfo
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- TW200918875A TW200918875A TW96138737A TW96138737A TW200918875A TW 200918875 A TW200918875 A TW 200918875A TW 96138737 A TW96138737 A TW 96138737A TW 96138737 A TW96138737 A TW 96138737A TW 200918875 A TW200918875 A TW 200918875A
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- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96138737A TW200918875A (en) | 2007-10-16 | 2007-10-16 | Photoelasticity detection method and application method thereof for detecting residual stress of components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96138737A TW200918875A (en) | 2007-10-16 | 2007-10-16 | Photoelasticity detection method and application method thereof for detecting residual stress of components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200918875A true TW200918875A (en) | 2009-05-01 |
| TWI368024B TWI368024B (enExample) | 2012-07-11 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96138737A TW200918875A (en) | 2007-10-16 | 2007-10-16 | Photoelasticity detection method and application method thereof for detecting residual stress of components |
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| Country | Link |
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| TW (1) | TW200918875A (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110954253A (zh) * | 2019-10-25 | 2020-04-03 | 华南理工大学 | 一种应力测量方法及应力测量光路装置 |
| TWI731721B (zh) * | 2020-06-16 | 2021-06-21 | 逢甲大學 | 用於檢測大面積薄膜殘留應力之系統 |
| WO2024152344A1 (zh) * | 2023-01-20 | 2024-07-25 | 中国矿业大学(北京) | 一种复杂非连续结构应力场全场量化方法及实验系统 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI628422B (zh) | 2016-07-22 | 2018-07-01 | 國立清華大學 | 基於時間域相位展開之應力分析方法 |
| TWI619933B (zh) * | 2016-12-09 | 2018-04-01 | 國立清華大學 | 光學材料應力量測方法及其系統 |
-
2007
- 2007-10-16 TW TW96138737A patent/TW200918875A/zh unknown
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110954253A (zh) * | 2019-10-25 | 2020-04-03 | 华南理工大学 | 一种应力测量方法及应力测量光路装置 |
| TWI731721B (zh) * | 2020-06-16 | 2021-06-21 | 逢甲大學 | 用於檢測大面積薄膜殘留應力之系統 |
| WO2024152344A1 (zh) * | 2023-01-20 | 2024-07-25 | 中国矿业大学(北京) | 一种复杂非连续结构应力场全场量化方法及实验系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI368024B (enExample) | 2012-07-11 |
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