TWI368024B - - Google Patents

Info

Publication number
TWI368024B
TWI368024B TW096138737A TW96138737A TWI368024B TW I368024 B TWI368024 B TW I368024B TW 096138737 A TW096138737 A TW 096138737A TW 96138737 A TW96138737 A TW 96138737A TW I368024 B TWI368024 B TW I368024B
Authority
TW
Taiwan
Application number
TW096138737A
Other languages
Chinese (zh)
Other versions
TW200918875A (en
Inventor
Che Way Chang
Original Assignee
Univ Chung Hua
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Chung Hua filed Critical Univ Chung Hua
Priority to TW96138737A priority Critical patent/TW200918875A/zh
Publication of TW200918875A publication Critical patent/TW200918875A/zh
Application granted granted Critical
Publication of TWI368024B publication Critical patent/TWI368024B/zh

Links

TW96138737A 2007-10-16 2007-10-16 Photoelasticity detection method and application method thereof for detecting residual stress of components TW200918875A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96138737A TW200918875A (en) 2007-10-16 2007-10-16 Photoelasticity detection method and application method thereof for detecting residual stress of components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96138737A TW200918875A (en) 2007-10-16 2007-10-16 Photoelasticity detection method and application method thereof for detecting residual stress of components

Publications (2)

Publication Number Publication Date
TW200918875A TW200918875A (en) 2009-05-01
TWI368024B true TWI368024B (enExample) 2012-07-11

Family

ID=44726898

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96138737A TW200918875A (en) 2007-10-16 2007-10-16 Photoelasticity detection method and application method thereof for detecting residual stress of components

Country Status (1)

Country Link
TW (1) TW200918875A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI619933B (zh) * 2016-12-09 2018-04-01 國立清華大學 光學材料應力量測方法及其系統
US10036677B2 (en) 2016-07-22 2018-07-31 National Tsing Hua University Method for analyzing stress in an object

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110954253A (zh) * 2019-10-25 2020-04-03 华南理工大学 一种应力测量方法及应力测量光路装置
TWI731721B (zh) * 2020-06-16 2021-06-21 逢甲大學 用於檢測大面積薄膜殘留應力之系統
WO2024152344A1 (zh) * 2023-01-20 2024-07-25 中国矿业大学(北京) 一种复杂非连续结构应力场全场量化方法及实验系统

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10036677B2 (en) 2016-07-22 2018-07-31 National Tsing Hua University Method for analyzing stress in an object
TWI619933B (zh) * 2016-12-09 2018-04-01 國立清華大學 光學材料應力量測方法及其系統

Also Published As

Publication number Publication date
TW200918875A (en) 2009-05-01

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