TW200906836A - Raw material for forming a strontium-containing thinfilm and process for preparing the raw material - Google Patents

Raw material for forming a strontium-containing thinfilm and process for preparing the raw material Download PDF

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TW200906836A
TW200906836A TW97123706A TW97123706A TW200906836A TW 200906836 A TW200906836 A TW 200906836A TW 97123706 A TW97123706 A TW 97123706A TW 97123706 A TW97123706 A TW 97123706A TW 200906836 A TW200906836 A TW 200906836A
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raw material
film
pulsation
flush
gas
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TW97123706A
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TWI398445B (en
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Hidekimi Kadokura
Shintaro Higashi
Yoshinori Kuboshima
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Kabushikikaisha Kojundokagaku Kenkyusho
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Abstract

The present invention provides a raw material for forming a strontium-containing thin film of a cyclopentadienyl-based strontium compound, which is in the liquid state at room temperature to 50 DEG C., can be purified by distillation, present as a monomer, has high vapor pressure, and suitable for mass production, and a process for preparing the same. Sr[C5(CH3)4(C3H7)]2 is prepared by reacting Na[C5(CH3)4(C3H7)]2 or K[C5(CH3)4(C3H7)]2 with SrI2 in THF to produce a THF adduct of Sr[C5(CH3)4(C3H7)]2; evaporating THF and extracting the residue with toluene to give a toluene solution; evaporating toluene and drying the residue under reduced pressure; and heating to 100 to 160 DEG C. in vacuo to dissociate and remove THF and distilling.

Description

200906836 九、發明說明: 【發明所屬之技術領域】 em i c 有:於一種適合藉由化學氣相成長法(Ch 以下以二0 Γ "…法;200906836 IX. Description of the invention: [Technical field to which the invention pertains] em i c has: a method suitable for chemical vapor growth (Ch below 二 Γ "

Laye/ ^不)或原子層堆積法(AtomlcLaye / ^ no) or atomic layer stacking method (Atomlc

*來表示)形成含二二法料以下以ALD 含有原料化合物*To indicate) the formation of a raw material compound containing ALD and the following

法之高介電常數之SmO 待作為高積體半導體裝置之;B電體T: 二等,f期 研討作為強介電體膜之電極。 1 u〇3膜被 料時之原料= 形成該等含有錄的膜The SmO of the high dielectric constant of the method is to be used as a high-product semiconductor device; B-electrode T: second-class, f-phase is discussed as an electrode of a ferroelectric film. 1 u〇3 film raw material = forming the film containing the film

nH19〇山;以下以s^(—/斤戊酿以)錄(Sr(C 然而,由於h (dPm) 來表示)° 蒸氣壓係0 . 1T〇 r r/2 2;、,帝"成三聚物,因此 給上之問題。 d 1 C而非常低,且具有供 在藉由A LdH^3 0 C以上時會開始熱分解,因此, 曰田法成艇,不僅是所 晉具有同時產生難以控制之熱分解之問題。“且 故’必須要有一種蒸氣壓更 而熱安紐高之錢贱合物。。,、德歡反應性高 舉例言之,其候補化合物可列舉如:為公知化合物之 200906836 又(五曱%*戍链(Sr〔c5(CH3)5〕2;以下 以Sr Cp 2來表示)。在此,Sr Cp%並非二乙醚“ c 2H5) 2〇 ;以下以E t 2〇來表示)或四氫呋喃(cm Ο ;以下以THF來表示)等業已配位之加成體。 前述加成體由於熱安定性低,且與加熱同時放出加成 物並熱變質,因此無法構成安定之蒸氣屡,又,由於 體中含有氧原子,因此可能會因自分解而供氧,不 ALD法之原料。 相對於此,由於非加成體之s r c p %為單體,因此 在有機魏合物中為蒸氣壓最高者之„,且具有 之水瞬間反應之適合作為ALD法之原料的性質,又,二 =可利用五個甲基之影響而輕易地溶解於有機溶劑中的 中揭 故,發明人於曰本特願2 〇〇6 — 示SrCp%之製造方法。 U35 然而,由於SrCp%係熔點2〇7t,且於 行精=’於=製ΐ方法中’必須藉由昇華操;進 "月衣,又,由於乃藉由極微量之氧、水分變質之同 月豆,因此處理時必須有高價之設備與細心之操作。、 於惰^氣2 = 率高之蒸㈣製並輕易地進行 ’、且衣兄下之處理,必須要有一種於室溫〜nH19〇山; The following is recorded as s^(-/金斤戊) (Sr(C However, expressed by h (dPm)) ° Vapor pressure system 0. 1T〇rr/2 2;,, Emperor " The trimer is therefore a problem. The d 1 C is very low and has a thermal decomposition that will start when it is above A LdH^3 0 C. Therefore, the method of the Putian method is not only difficult to produce at the same time. The problem of thermal decomposition of control. "And therefore, there must be a kind of vapor pressure compound which is more vaporous and hot.", Dehua is highly reactive. For example, the candidate compounds can be enumerated as follows: 200906836 of the compound (5曱%*戍 chain (Sr[c5(CH3)5]2; the following is represented by Sr Cp 2). Here, Sr Cp% is not diethyl ether "c 2H5) 2〇; An adduct which has been coordinated, such as t 2 )) or tetrahydrofuran (cm Ο; hereinafter referred to as THF). Since the above-mentioned adduct has low heat stability and emits an adduct at the same time as heating and is thermally degraded, it is not possible to form a stable vapor, and since the body contains oxygen atoms, oxygen may be supplied by self-decomposition. Raw materials for ALD. On the other hand, since the srcp % of the non-additive is a monomer, the vapor pressure is the highest among the organic Wei compounds, and the water has a transient reaction suitable as a raw material of the ALD method, and = It can be easily dissolved in an organic solvent by the influence of five methyl groups. The inventor of the present invention has a manufacturing method of SrCp%. U35 However, since SrCp% is a melting point 2 〇7t, and in the line of fine = 'in the = method of making ' ' must be by sublimation operation; into the " yue, and, because it is a very small amount of oxygen, water metamorphism of the same moon beans, so must be processed High-priced equipment and careful operation., Inflation 2 gas = high steaming (four) system and easy to carry out, and the handling of the clothes under the brother, must have a kind of room temperature ~

之溫度下為液體狀態之化合物。 C 對气Γ:必須要有—種液體化合物,該液體化合物係具有 類^為生,戊二烯基的魏合物,且未加成®迷 、、、紅且瘵氣壓咼,並具有容易量產之基圑。 200906836A compound in a liquid state at a temperature. C For gas enthalpy: There must be a liquid compound which has a bismuth-like, pentadienyl-based sulphide, and which is not added to the fascinating, red, and sputum pressures, and has an easy The basis of mass production. 200906836

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係於原料中使福二二了 —二酮系鳃錯合物 吏用屬S ^s成,然而,於金屬S r中含 有數PPm之Na或K,且於粗製合成物中 m之Na&K。 力3有數PP 入’由於S r C p %㈣紅料^化合 用;以下高來表示;、= 1(/Η〇 5 (以下以KCP*來表示)等驗金屬化合物來 曰成,因此粗製合成物中含有大量的N a或尺。 在接近 且難以 要取得 且並無可 由於该等β —二酮系錄錯合物及s j·〇p : 室溫時之性狀為固體,因此利用蒸餾之精製困難 有效地除去來自原料之N a或尺。 、 故,以往在用以形成含有勰的薄膜之原料中 N a及K之各含量在5 〇 p p b以下是困難的 適用在CVD或ALD之Na及K的各含量為 以下之用以形成含有锶的薄膜之原料。 故,發明人認為,於市售環戊二烯化合物中,可使用 結構與五曱環戊二烯類似之四甲(n_丙基)環戊二烯(C 5 (CH3) 4 (CsHt) H)來合成的化合物之雙(丙四 曱環戊二烯)锶(s r〔 C5 ( CH3) 4 ( C3H7)〕9s r〔 C 5 ( C H 3) 4 ( C 3 H 7 )〕2 ;以下以 s r ( p r M e 4 C p) 2來表示)是較為理想的。 S r ( P r M e 4 C p ) 2係揭示於歐洲專利第工6 4 5 6 5 6號說明書,且註冊為CAS No . 8 8 2 9 〇 6-98-2之化合物。 29 又,於 “MOC VD & C VD P r e c u r s 〇 r s ” ,S t r e m 公司,;[9 9 g 年,c ν D 工工 / 200906836 99,p . 22 中’揭示有一種於 Sr (PrMeaCp) 2中加成1,2 —二甲氧乙烷(CH3〇c2H4〇CH3; 以下以DME來表示)之化合物。 然而’於前述歐洲專利第1 6 4 5 6 5 6號說明書 中,只不過是在第七貫施例之表中揭示,藉由將三甲銦與 單乙胂作為原料之Μ〇C V D使I n a s膜於6 0 0 〇C下 成長時’以觸媒量(< 〇 · 2 5莫耳%)使s r (P r μ e 4C p ) 2共存,且Sr (PrMe4CP) 2係添加作為 微i觸媒,實質上在膜中並未含有S r,且完全未揭示有 關S r ( P r M e 4 C p ) 2之製法或物性。 又,於前述 “MOCVD & C V D p r e c u 1 sors ,Strem公司,1999年,CVD1 1/9 9,p · 2 2中,亦未揭示有未加成_類之s r (p rMeeCp) 2。 環戊二烯系鏍化合物係於合成為加成有醚類之化合物 後除去賴所取得之化合物,且未經由域體來合成是困 難的,又,要除去加成之醚類並不容易。 因此,迄今並不清gs r (P r M e 4 C p ) 2之製造 方法,物性,且並未形成以此為原料而含有s r作為主成 分之薄膜,又’於S r (P rMe4Cp)2之製造方法中, 所使用之醚化合物種與除去醚類之方法變得重要。 又,於形成半導體薄膜之材料中,即便只有摻入些許 笙:產生半導體界面之電場不均或導體薄膜之腐蝕 田知t半1^體特性之情形,因此必須使有機錯錯合物 中的N a濃度接近〇 ’且^必須相同。 【發明内容】 200906836 用二而f成者:目的係提供一種 之原料係於室溫〜5: 〇c ‘ u用以形成含有鳃的薄膜 且蒸氣壓高,容易量產精製,為單體 肖里產且利料戊二_魏合物來達成。 二,明之目的係亦提供一種可減 夏之含有鳃的薄膜。 次凡之3 法。又纟發明之目的係亦提供一種前述化合物之製造方 (Ρΐ:==以形成含有賴膜之原料係S r 是κ = :的薄f之原料中’較為理想的 合3里為5〇ppb以下。 造方:係膜之原料之製 序取侍 S r ( p r M e 4 c Ρ ) 2者, :P.使丙四曱環戊二稀納(以下以Na (PrMe4C、 來表不)或丙四甲環戊二烯鉀(以下 P) 與蝴(W⑽Hd 顧:1; ; r M : 4 C P ) 2之T H F加成體之程序;蒸 .. +且猎由甲苯萃取而作成甲笨溶液之程序; 祭I田IV、去甲苯並進行減壓乾燥 广〜16。。。並於_除去而後進;;:: 屬本發明用以形成含有銷的薄膜之原料之Sr (pr = 4C P ) 2係適合量產之液體化合物,且可適當地藉二 有關本發明之製造方法來取得。 200906836 &月升y成含有锶的薄膜 Me 4 C p) 2係由於一々广J得聘之材料之S r ( p r 2饰由於崧氣壓高且 「進行基餾拮制一.、、至/皿下之性狀為液. 因此可進行墓餾4生制Q t a主〉亚卜之性狀為液體, 材料,可大幅對=:知形成含有賴膜之 及K之含量。低對方;+導體特性造成大幅影響之N a 因此’右使用藉由本發明所取得之Sr (prMe 1〕2 ’則可藉由c v D法或^ ^且Tnb減低Na&K含量之含有 【實施方式】 暇 以下更詳細地說明本發明。 有關本發明之用以形成含有㈣_ (p r M e 4 c p ) 2 〇 ”十你 S r 為該原料化合物之S r ( P r μ e 4 Γ η Ί 了丄 + M e 4 υ Ρ ) 2可適當地 错由有關本發明之製造方法來取得。 具體而言,經由以下程序,可取得§1_ (PrMe C P ) 2 ’ 即:使 N a ( P r M e 4 C p )或 κ ( p r Μ\4 aCp)與S r I 2於THF中反應,並生成s r (p e^iCp) 2之THF加成體之程序;蒸館除去丁 Ηρ ,且 藉由甲苯萃取而作成甲苯溶液之程序;蒸|留除去甲苯並進 行減壓乾燥之程序;及於真空下加熱至1 〇 〇〜丄6 〇 °C ’並於解離除去T H F後進行蒸餾之程序。 以下依序地說明該製造程序。 首先,Na (PrMe4Cp)可藉由下述方法等公 知方法來取得,即:使市售之丙四甲環戊二烯(c 5( c H3) 4 ( C3H7) Η ;別名:四甲(正丙基)環戊二稀) 10 200906836 (S t r em公司製造,a i f a “ s a r公司製造 等)於液體N Η 3中與N a N H2反應之方法;或於TH 或DME中與Na Η反應之方法。 一、 K (P rMe4Cp)亦可藉由相同之方法取得。 其次,將藉由前述所取得之Na (prMe4Cp) 或K (P rMe4Cp)及無水S r j 2溶解於s r (p『It is made in the raw material to make the succinyl-diketone ruthenium complex SS Ss, however, it contains Na or K of several PPm in the metal S r , and Na & K. Force 3 has a number of PP into 'since S r C p % (four) red material ^ combination; the following high to indicate;, = 1 (/ Η〇 5 (hereinafter referred to as KCP *) and other metal compounds to form, so crude The composition contains a large amount of Na or a smear. It is close to and difficult to obtain and there is no trait due to the β-diketone-based complex and sj·〇p: at room temperature, so the distillation is utilized. It is difficult to refine the N or the size of the raw material from the raw material. Therefore, in the raw material for forming a film containing ruthenium, it is difficult to apply the content of Na and K at 5 〇 ppb or less to CVD or ALD. The respective contents of Na and K are the following raw materials for forming a film containing ruthenium. Therefore, the inventors believe that among the commercially available cyclopentadiene compounds, a tetramethyl group having a structure similar to pentacyclopentadiene can be used. N-propyl) cyclopentadiene (C 5 (CH3) 4 (CsHt) H) to synthesize a compound of bis(propenylcyclopentadienyl) fluorene (sr[ C5 ( CH3 ) 4 ( C3H7) ] 9s r[ C 5 (CH 3) 4 ( C 3 H 7 )] 2 ; the following is preferably represented by sr ( pr M e 4 C p) 2 ) S r ( P r M e 4 C p ) 2 It is disclosed in the European Patent No. 6 4 5 6 5 6 and is registered as a compound of CAS No. 8 8 2 9 〇6-98-2. 29 Also, in "MOC VD & C VD P recurs 〇rs ” , S trem Company, [9 9 g year, c ν D workers / 200906836 99, p. 22 ' reveals an addition of 1,2-dimethoxyethane (CH3〇) to Sr (PrMeaCp) 2 c2H4〇CH3; the following compound represented by DME. However, in the above-mentioned European Patent No. 1 6 4 5 6 5 6 , it is only disclosed in the table of the seventh embodiment, by indium triamide When I CVD with monoethyl hydrazine as a raw material, the I nas film is grown at 600 ° C. 'Sr (P r μ e 4C p ) 2 with a catalytic amount (< 2 5 mol%) Coexisting, and Sr (PrMe4CP) 2 is added as a micro-catalyst, and substantially does not contain S r in the film, and the method or physical property of S r ( P r M e 4 C p ) 2 is not disclosed at all. In the aforementioned "MOCVD & CVD precu 1 sors, Strem, 1999, CVD 1 1/9 9, p · 2 2, no unadded sr (p rMeeCp) 2 was also disclosed. The cyclopentadienyl ruthenium compound is a compound obtained by adding a compound obtained by adding an ether, and is not difficult to synthesize by a domain, and it is not easy to remove the added ether. Therefore, the manufacturing method, physical properties of gs r (P r M e 4 C p ) 2 have not been clarified so far, and a film containing sr as a main component as a raw material has not been formed, and 'S r (P rMe4Cp) In the production method of 2, the ether compound used and the method of removing the ether become important. Further, in the material for forming the semiconductor thin film, even if only a slight amount of enthalpy is formed: the electric field unevenness at the semiconductor interface is generated or the conductive film is etched, it is necessary to make the organic error compound The concentration of N a is close to 〇' and ^ must be the same. [Description of the Invention] 200906836 The use of two and the same: the purpose is to provide a raw material at room temperature ~ 5: 〇c 'u used to form a film containing bismuth and high vapor pressure, easy mass production and refinement, as the monomer Xiao It is produced in the middle of the product and the material is obtained. Second, the purpose of Ming also provides a film that can reduce the yttrium contained in summer. The third method. Further, the object of the invention is to provide a method for producing the above-mentioned compound (Ρΐ:==in the raw material of the raw material system S r containing κ = κ = :), the preferred one is 5 〇 ppb. The following: 造方: The preparation of the raw material of the film is taken from S r ( pr M e 4 c Ρ ) 2 , : P. The propylene tetrahydrocyclopentene (hereinafter referred to as Na (PrMe4C, to the table) Or a procedure for the THF adduct of potassium tetrapropylcyclopentadienide (hereinafter P) and butterfly (W(10)Hd Gu:1; ; r M : 4 CP ) 2; steaming.. + and hunting is extracted from toluene to make a stupid Procedure for solution; Sacrifice I field IV, detoluene and dry under reduced pressure ~16... and removed after _;;:: Sr (pr = 4C) used to form the raw material of the film containing the pin of the present invention P) 2 is a liquid compound suitable for mass production, and can be obtained by appropriately the manufacturing method of the present invention. 200906836 & 升 y y film containing yttrium Me 4 C p) 2 S r of the material (pr 2 is due to the high gas pressure of the crucible and "the liquefaction of the base distillation is one, and the properties under the dish are liquid. Therefore, the trait of the tomb distillation 4 Q ta main > Yab is Body, material, can be greatly corrected =: know the content of the film containing K and the content of K. Low side; + conductor characteristics have a large impact on the N a so the right to use the Sr (prMe 1] 2 ' obtained by the present invention The content of the Na&K content can be reduced by the cv D method or T^b. [Embodiment] The present invention will be described in more detail below. The present invention relates to the formation of (4)_(pr M e 4 cp ) 2 〇" S r (P r μ e 4 Γ η Ί M + M e 4 υ Ρ ) 2 which is S er is the starting compound, which can be obtained by the manufacturing method of the present invention as appropriate. Specifically, via the following Procedure, obtain §1_(PrMe CP ) 2 ' ie: react N a ( P r M e 4 C p ) or κ ( pr Μ\4 aCp) with S r I 2 in THF and generate sr (pe ^iCp) 2 THF adduct procedure; steaming hall to remove Ding ρ, and by toluene extraction to prepare a toluene solution; steam | leaving to remove toluene and drying under reduced pressure; and heated to 1 under vacuum 〇〇~丄6 〇°C ' and the procedure of distillation after dissociation to remove THF. The manufacturing procedure is described in order below. Na (PrMe4Cp) can be obtained by a known method such as the following method, that is, commercially available propenylcyclopentadiene (c 5( c H3) 4 ( C3H7) Η; alias: tetramethyl (positive C) Base) cyclopentadienyl) 10 200906836 (manufactured by Stra em, aifa "manufactured by sar, etc.) in a method of reacting with N a N H 2 in liquid N Η 3; or a method of reacting with Na Η in TH or DME . 1. K (P rMe4Cp) can also be obtained by the same method. Next, Na (prMe4Cp) or K (P rMe4Cp) and anhydrous S r j 2 obtained by the above are dissolved in s r (p『

Me4Cp) 2之合成反應溶劑的THF中,合成反應會輕 易地進行,並生成S r (P rMe4Cp) 2 (丁HF)加 成體。 另,合成反應溶劑使用DME時,雖然可輕易地生成 (P rMe4C p ) 2 (DME)加成體,然而,如下 述第-比較例所示’由於之後無法輕易地除去DME,因 此DME並不適合。 又,溶劑使用二乙醚時,由於反應原料之溶解度小且 反應速度低而容積效率差,因此二乙醚亦不適合。 在結束合成反應後,蒸餾除去丁 H F溶劑,並藉由甲 苯萃取S r (PrMe4CP)2 (丁HF)加成體,由於 甲苯可充分地溶解該加成體,然而副生成物之视納或石典 化鉀卻完全不會溶解’因此萃取容易。 自卒取後之曱苯溶液蒸鶴除去曱苯並進行減壓乾燥, 藉此,可取得3 r (P ^64^)2(丁1^)加成體, 該T H F加成體之熔點約1 3 〇 。 若將該加成體於〇 . 〇〇丄〜〇 ·丄丁◦ r r之真空 下加熱至1〇〇〜16〇。〇,則釜内會構成熔液狀態,且 業已解離之THF會積存於深冷之分離器,若分離器内之 200906836 增加:則藉由在160〜18町0.01〜 Γ、◦ 1 1下的线操作,蒸I留出S r ( P r M e 4 L P ) 2 0In the THF of the synthesis reaction solvent of Me4Cp) 2, the synthesis reaction proceeds easily, and an S r (P rMe4Cp) 2 (butyl HF) addition product is formed. Further, when DME is used as the synthesis reaction solvent, the (P rMe4C p ) 2 (DME) addition product can be easily produced. However, as shown in the following Comparative Example, DME is not suitable because the DME cannot be easily removed afterwards. . Further, when diethyl ether is used as the solvent, the solubility of the reaction raw material is small, the reaction rate is low, and the volume efficiency is poor, so diethyl ether is also unsuitable. After the completion of the synthesis reaction, the butane HF solvent is distilled off, and the S r (PrMe4CP) 2 (butyl HF) adduct is extracted by toluene, and the adduct is sufficiently dissolved by toluene, but the by-products are either Potassium sulphate does not dissolve at all - so extraction is easy. The benzene solution is distilled from the benzene solution to remove the benzene and dried under reduced pressure. Thus, a 3 r (P ^ 64 ^ ) 2 ( butyl 1 ) adduct is obtained, and the melting point of the THF adduct is about 1 3 〇. If the adduct is heated to 1〇〇~16〇 under vacuum of 〇.〇〇丄~〇·丄丁◦ r r. 〇, the inside of the kettle will form a molten state, and the THF that has been dissociated will accumulate in the cryogenic separator. If the 200906836 in the separator increases: by 0.01~ Γ, ◦ 1 1 in 160~18 Line operation, steaming I leave S r ( P r M e 4 LP ) 2 0

依此所取得之Sr (PrM 固化之黏性液體。 ) 2¼至,皿卜小曰 若^用藉由前述方法所取得之31,(prMncp) 有錄的氧化物膜、硫化物膜D等法或ALD法安定地形成含According to the Sr (PrM-cured viscous liquid) obtained in this way, the film obtained by the above method 31, (prMncp) recorded oxide film, sulfide film D, etc. Or ALD method to form a stable

之則可權 p)2。 以下之 Sr (PrMe4C 含旦若使用藉由本發明製造方法所取得之K及N a ;::二(P…心)“乍為原料,並形成Sr 含有鈣的;崖a,Sr)Ti〇3膜、SrRu〇3膜等 ^有d钱,則可_往更減低_tI^Na之各含 時之Sr (PrMe4Cp)2之供給方法可 = 將 Sr (PrMe4Cp)2 加熱至丄 氣體起泡而使其將載體 二於情性之碳氫化合物溶劑並藉由液“量:量?進 =等且利用13。〜35。。。之氣化器使其全。化It can be p)2. The following Sr (PrMe4C contains the K and Na obtained by the manufacturing method of the present invention;:: two (P... core) "乍 as a raw material, and forms Sr containing calcium; cliff a, Sr) Ti〇3 When the film, the SrRu〇3 film, etc. have a d-money, the supply method of Sr(PrMe4Cp)2 which can reduce the content of _tI^Na can be reduced = Sr (PrMe4Cp)2 is heated to the helium gas foaming Make it the carrier of the hydrocarbon solvent and use the liquid "quantity: amount? Enter = and use 13. ~35. . . The gasifier makes it full. Chemical

溫戶2起泡法供糾r (PrMeiCp)4,其汽缸 、限於下述貫施例之溫度,可於1 3 〇〜3 5 CTC B °又疋’此時之載體氣體只要是惰性氣體即可,且除了 A 200906836 :二外可使用N2、He。x,其流量過少時亦血 瘵軋,而若過多,則由於汽缸内 ^ 發,因此宜為3〇〜5〇〇以=讀亚妨礙原料之蒸 斑上將Sl' (PrMe4Cp) 2溶解於溶劑中而降低 4又邮軋化器進行液體運送而氣 於 I,之溫度,只要是5 0c心;=: 靶圍之黏度,則可降侦於 」右為此種 又;配S及氣化器内阻塞之危險性。 又,洛劑宜使用溶解度最高之甲狹 濃度溶液即可時,則不限於 ',、、、在錯由低 之己烷或辛烷。 、 ,亦可使用溶解性較優異 叫山、”(;=)(,〇;=、” 4寺鈦化合物之蒸氣及氧、臭氧 ^(NE t2) 繼VD法或ALD法製造SrT =為糊’則可 又,若於Sr(PrM 」:。 rMe4CP) ?基氣,她TP)2热氣中加入B“P (〇tBu)、'、T r 亚使用 Tl (〇ιΡ〇4、Τΐ 4、T i (N』t / NMe2) 4、T i (NE tMe ) 匕t 2 ) 4荨銳化合物 * & 寻作為氧化劑,則可利用 ^讀氣、臭氧、水 so T1〇3膜。CVD去或ALD法製造(Ba, 再者,若使用S r ( p ^ M e p 了化合物之基氣及氧C^2蒸氣與Ru(E 劑,則可利用CVD法或A 、水等作為氧化 實施例 ^ALD去製造SrRu〇3膜。 200906836 以據貝广例更具體說明本發明發明 限於下述實施例。 〔第一實施例〕S r f p Ayr 1 ( P r M e 4 C p ) 2之製造 口 於具有溫度計、_子、投人口 m 燒瓶中,在真空氬取代後、、i Λ t °° — 八设左入脫水脫氧之ΤΗF600 與 a (P rMe4Cp) 75g (〇 · 4〇莫耳)並 =二將U瓦進行水冷並加入s r “粉末7 2 g ( 〇 . 2 1旲耳)’且以4 〇 c攪拌八小時。 〇其"'人’ &減壓下進行去溶劑’乾燥後加人脫水脫氧之 曱笨6 Q Q m 1 ’並進行利用加熱檀拌之萃取操作,靜置 後進行過濾並取得透_、液4自濾、液將曱苯進行減壓蒸 知除去並以1 0 〇 <3進行減壓乾燥,取得炼點約1 3 〇 C之淡更色固體(減壓乾燥品)8 g g。The thermostat 2 foaming method is used to correct the r (PrMeiCp) 4, and the cylinder thereof is limited to the temperature of the following examples, and can be at 1 3 〇~3 5 CTC B ° and then the carrier gas at this time is an inert gas. Yes, and in addition to A 200906836: two can use N2, He. x, when the flow rate is too small, it is also blood-rolled, and if it is too much, it is dissolved in the cylinder, so it is preferable to dissolve S1' (PrMe4Cp) 2 on the steamed spot of the raw material, which is 3〇~5〇〇 In the solvent, the pressure is reduced by 4, and the mail is transported by the mailer, and the temperature of the gas is at the temperature of I, as long as it is 5 0c heart; =: the viscosity of the target circumference can be detected by "right"; The danger of blockage inside the device. Further, when the agent is preferably used, the solution having the highest solubility can be used, and it is not limited to ',, and is low in hexane or octane. Or, it is also possible to use a vapor of titanium compound of the mountain, "(;=) (, 〇; =," 4 temple titanium vapor and oxygen, ozone ^ (NE t2) followed by VD method or ALD method to make SrT = paste 'Yes, if, in Sr(PrM ":. rMe4CP) ? base gas, she TP) 2 hot gas added B "P (〇tBu), ', T r sub-use Tl (〇ιΡ〇4, Τΐ 4 , T i (N』t / NMe2) 4, T i (NE tMe ) 匕t 2 ) 4 荨 sharp compound * & For oxidant, you can use ^ read gas, ozone, water so T1 〇 3 film. CVD It is produced by ALD or ALD (Ba, in addition, if S r ( p ^ M ep base gas and oxygen C 2 vapor and Ru (E agent), CVD method, A, water, etc. can be used as oxidation. Example ALD to produce SrRu〇3 film. 200906836 The invention of the present invention is more specifically described by the following examples. [First Embodiment] Manufacture of S rfp Ayr 1 ( P r M e 4 C p ) 2 In a flask with a thermometer, _ sub, and a population of m, after vacuum argon substitution, i Λ t ° ° - eight set left into dehydration and deoxidation ΤΗF600 and a (P rMe4Cp) 75g (〇·4〇莫耳) And = two will U-Wall water-cooled and added sr" Powder 7 2 g (〇. 2 1 旲 ear)' and stir for 4 hours at 4 〇c. 〇其"'人' & desolvent under reduced pressure 'drying and adding dehydration and deoxidation 曱 stupid 6 QQ m 1 'and the extraction operation by heating the sandalwood mixture, after standing, filtering and obtaining the permeation, the liquid 4 is self-filtered, the liquid is decomposed and evaporated under reduced pressure, and dried under reduced pressure at 10 〇 <3, A lighter color solid (decompression dried product) of 8 gg.

將該固體庄入尚真空蒸顧裝置中,並於1 1 〇〜1 6 〇<3/〇.1〜〇.〇1丁〇11^下保持—小時之際,丁 HF加成體之τHF會慢慢地脫離,並積存於深冷分離器 中8 . 1 g。在慢慢地升溫並除去微量之初餾結晶後,於 170 180C/0.1〜〇.〇iT〇rr下取得主 餾之淡黃色黏性液體6 1 g。 0 0 將該黏性液體再度地注入高真空蒸餾裝置中,並於工 l6〇C/〇 . 1〜〇 . 〇lT〇r r下保持約一 小時,且除去微量之殘留THF,並於1 7 〇〜;[8〇°c /0.01〜Q.lTorr下取得主餾之淡黃色黏性液 體(一次蒸德品)5 6 g。The solid is placed in a vacuum distillation device and maintained at 1 1 〇~1 6 〇<3/〇.1~〇.〇1丁〇11^, hourly, HF HF adduct τHF will slowly detach and accumulate in the cryo separator 8.1 g. After slowly raising the temperature and removing a trace of the preliminary distillation crystal, a pale yellow viscous liquid of 6 1 g of the main fraction was obtained at 170 180 C/0.1 to 〇.〇iT〇rr. 0 0 The viscous liquid is again injected into the high-vacuum distillation apparatus, and is kept for about one hour under the work of 〇1T〇rr, and a trace amount of residual THF is removed, and at 1 7 〇~; [8〇 °c /0.01~Q.lTorr to obtain 51-6 g of light yellow viscous liquid (one steamed product).

5亥—次蒸餾品在下述分析之結果中鑑定為S r (P r Me4Cp)2(〇· 136莫耳),其收率相對於Na (P 14 200906836 rMe4Cp)為68%。 以下°兒明一次蒸館品之鑑定分析及物性評價之方法及 結果。 、 (一) 組成分析 進行濕式分解所取得之液體之ICP發光分光分析之 結果,S Γ含量為2 〇 . 7% (理論值2丄.丄5%)。 又,雜質方面,Ca = 190〇,Mg&lt;50,Ba =1〇〇〇〇,Na&lt;50 ,K〈50,Cr&lt;50 , K e&lt;50,Cu&lt;50,Ni&lt;50(單位:ppb)’確 認為南純度。 (二) iH — NMR 〇Η— 核磁共振) 測定條件(裝置:J N Μ — E C A 4 0 0 ( 4 0 0 Μ Η ζ ),溶劑:c 6 D 6,方法:1 D ) 第一圖係顯示二次蒸餾品之測定結果,為了加以比 較’第二圖係顯示減壓乾燥品之結果。 考慮第一圖、第二圖之測定光譜中各信號之位置與Η 之個數、S r (P r M e 4 C ρ ) 2與丁H F之Η個數之比 率,針對6 H ( p p m)如下述般進行歸屬。 2.01 (s), 1.97(s) 12H:離開 c5 (C旦3) 4之一 C3H7之CH3兩個與接近之CH3兩個 2 . 3 9 ( t ) 2 H : C 旦2 C Η 2 C Η 3 1 . 3 6 ( m ) 2 Η : ΟΗ2〇ϋ2〇Η3 0.92 (t) 3 Η : C Η 2 C Η 2 C H3 3.14(t),1.21(m):THF 之一〇c旦 2 C Η 2 C Η 2 C Η 2 - — 15 200906836 依據第一圖所示之測定光譜,二次蒸餾品係加成於s r 1莫耳之T H F之莫耳數為(0.348 + 0.437) /(23 . 562 + 4. 131+4 · 136 + 6” 3 8/8 = 〇 . 〇 9,平均化學式構成s r (ρ r M e 4 C P ) 2 ( T H F)。. Q 9,雖然T H F稍微配位,然而,實 貝上可視為s r ( P r M e 4 C ρ ) 2。 另,依據第二圖所示之測定光讀,減壓乾燥品係加成 於S r 1莫耳之τ H F莫耳數為(2.076 + 2.04 6)/(11·296+1.981+1.890+3) X 38/8 = 1.〇8,平均化學式構成s r (p r M e 4 Cp)2(THF)n 又二相對於S r (P rMe4Cp) 2 (THF)丄之 s r含置理論值為1 8 . 〇 2 %,減壓乾燥品之S r含量 分析值為1 8 . 1 %。 依此’推定減壓乾燥品係加成約一個T H F之S r( P iMe4Cp)2〇 (三) 性狀與熔點 一次畓餾品係微淡黃色,且為室溫下黏性非常強之液 體,黏度約1 0 〇 〇 P。 (四) 熱重/熱差分析(τ G — D T A ) 測疋條件(試料重量:2 4 . 4 〇 m g ,氣體環境: r大氣壓,升溫速度· 1〇 . 〇deg/mi n) 二=三圖係顯示二次蒸餾品之測定結果,為了加以比 較,第四圖係顯示減壓乾燥品之結果。 依據第三圖、第四圖所示之TG —DTA曲線,二次 200906836 蒸餾品至1 6 0°C附近無減量 在。 推定除去之THF並不存 又,由於到3 0 0°C為止會蒸發9 7%,因此 級之短時助於3Q 0W不會熱劣化,可確認具有^ L D法或C V D法之原料所要求之熱安定性。 (五) 蒸氣壓 氣體飽和法測定之結果為〇 .丄τ 〇 r 7 〇它。 (六) 密度 密度係 1 . 2 g / c nr3 ( 3 〇。〇)。 (七) 溶解度 相對於1 L之各溶劑於室溫下之溶解度係相對於甲苯 為35〇g ’相對於THF為2 8〇g,相對於己炫為7 0 g,相對於辛烷為7 0 g。 依此,確認可非常充分地溶解於曱笨中,且在辛烷等 中亦可較充分地溶解。 ①、 〔第一比較例〕溶劑使用DME之Sr (prMe4 c P ) 2之製造 4 於具有溫度計、攪拌子、投入口、回流器之3 〇 〇 m 1二口燒瓶中,在真空氬取代後注入脫水脫氧之TH F工 ”ml 與Na (PrMe4Cp) 16g (〇 . 〇86 莫耳)並溶解,且將燒瓶進行水冷並加入S r I 2粉末1 5 . 5 g ( 〇 . 〇 4 5莫耳),且於回流下攪拌八小時。 其次’於減壓下進行去溶劑’乾燥後加入脫水脫氧之 甲苯2 0 〇m 1 ’並進行利用加熱攪拌之萃取操作,靜置 後進行過濾並取得透明濾液,且自濾液將甲苯進行減壓蒸 17 200906836 撥除去’並以1 0 (Tc進行減壓乾燥時,起初雖為淡黃色 之黏液’但-日後可取得魅約丄Q之固體丄8 . 5 g。 。將該固體注入高真空蒸餾裝置中,並於丄工〇〜工6 0 C/0 . 1〜〇 . 〇 X τ 〇 r r下保持一小時,此時D Μ E加成體之D Μ E會慢慢地脫離,並積存於深冷分離器 中1 . 2 g。在慢慢地升溫並除去極微量之初, 70〜175以0.1〜0.01T…下,主鶴係 =以液體③鶴出且於室溫下固化之淡黃色固體(溶點約 50〜80C)(—次蒸顧品)14 . 了尽。 將該固體再度地注入高真空蒸鶴裝置中,並 160。/〇.1〜〇.〇1丁〇1”下保持一小時後 升溫,又’於丄7◦〜175Ϊ/0·〇1〜〇.1T〇 r『下,主㈣取得以液體蒸傲出且於室溫下固化之淡普 色固體(溶點約5 〇〜8 〇。〇(二次蒸館品M 2 . 8 p 忒一-人洛餾品係與第一實施例相同地進行i Η 一 R及TG—DTA之測定。The 5H-sub-distillate was identified as S r (P r Me4Cp) 2 (〇·136 mol) in the results of the analysis described below, and the yield thereof was 68% with respect to Na (P 14 200906836 rMe4Cp). The following methods and results of the identification analysis and physical property evaluation of the steaming products are shown below. (I) Composition analysis The results of ICP emission spectroscopic analysis of the liquid obtained by wet decomposition, the S Γ content is 2 〇 . 7% (theoretical value 2 丄. 丄 5%). Further, in terms of impurities, Ca = 190 Å, Mg &lt; 50, Ba = 1 Å, Na &lt; 50, K < 50, Cr &lt; 50, K e &lt; 50, Cu &lt; 50, Ni &lt; 50 (unit: ppb ) 'Confirmed as southern purity. (b) iH - NMR 〇Η - NMR) Determination conditions (device: JN Μ - ECA 4 0 0 (400 Μ Η ζ), solvent: c 6 D 6, method: 1 D) The results of the measurement of the secondary distillate were compared for the purpose of comparison. The second graph shows the results of the reduced-pressure dried product. Consider the ratio of the position of each signal in the measured spectrum of the first and second graphs to the number of Η, S r (P r M e 4 C ρ ) 2 and the number of HF HF, for 6 H (ppm) The attribution is as follows. 2.01 (s), 1.97(s) 12H: leave c5 (C Dan 3) 4 one of C3H7 CH3 two and close CH3 two 2. 3 9 ( t ) 2 H : C den 2 C Η 2 C Η 3 1 . 3 6 ( m ) 2 Η : ΟΗ2〇ϋ2〇Η3 0.92 (t) 3 Η : C Η 2 C Η 2 C H3 3.14(t), 1.21(m): one of THF 〇 c dan 2 C Η 2 C Η 2 C Η 2 - — 15 200906836 According to the measured spectrum shown in the first figure, the number of moles of the THF added to the sr 1 molar is (0.348 + 0.437) / (23 . 562 + 4. 131+4 · 136 + 6" 3 8/8 = 〇. 〇9, the average chemical formula constitutes sr (ρ r M e 4 CP ) 2 (THF). Q 9, although THF is slightly coordinated, however, It can be regarded as sr ( P r M e 4 C ρ ) 2 on the solid shell. In addition, according to the measurement optical reading shown in the second figure, the vacuum drying system is added to the S r 1 molar τ HF molar number. (2.076 + 2.04 6)/(11·296+1.981+1.890+3) X 38/8 = 1.〇8, the average chemical formula constitutes sr (pr M e 4 Cp) 2 (THF) n and two relative to S r (P rMe4Cp) 2 (THF) s s sr contains a theoretical value of 18. 〇 2 %, the S r content of the reduced-pressure dried product is 18.1%. According to this 'presumed decompression dry line plus About one T HF S r( P iMe4Cp) 2 〇 (3) Properties and melting point The primary retort is slightly yellowish and is a very viscous liquid at room temperature with a viscosity of about 10 〇〇P. (4) Thermogravimetry /thermal difference analysis (τ G - DTA) 疋 measurement conditions (sample weight: 2 4 . 4 〇mg, gas environment: r atmospheric pressure, heating rate · 1 〇. 〇 deg / mi n) two = three pictures show twice For the comparison of the results of the distillation, the fourth graph shows the results of the vacuum drying product. According to the TG-DTA curve shown in the third and fourth figures, the second 200906836 distillation product is near 160 °C. There is no reduction in THF. It is estimated that THF does not exist, and it will evaporate by 9 7% until it reaches 300 °C. Therefore, the short-term help of 3Q 0W does not thermally degrade, and it can be confirmed that there is LD method or CVD method. The thermal stability required for the raw materials. (5) The result of the vapor pressure gas saturation method is 〇.丄τ 〇r 7 〇 it. (vi) Density Density is 1.2 g / c nr3 (3 〇.〇). (7) The solubility of each solvent with respect to 1 L at room temperature is 35 〇g with respect to toluene, 2 8 〇g relative to THF, 70 g relative to hexaxane, 7 octane relative to octane 0 g. Accordingly, it was confirmed that it was sufficiently dissolved in the sputum, and it was also sufficiently dissolved in octane or the like. 1. [First Comparative Example] The solvent was prepared using DME Sr (prMe4 c P ) 2 in a 3 〇〇m 1 two-necked flask equipped with a thermometer, a stir bar, an inlet, and a reflux, after vacuum argon replacement. Inject the dehydrated and deoxygenated TH F "ml" with Na (PrMe4Cp) 16g (〇. 〇86 Moule) and dissolve, and the flask was water-cooled and added S r I 2 powder 1 5 . 5 g ( 〇. 〇 4 5 Mo The ear is stirred under reflux for eight hours. Next, 'desolvation under reduced pressure' is followed by addition of dehydrated deoxygenated toluene 2 0 〇m 1 ' and subjected to extraction with heating and stirring. After standing, it is filtered and obtained. The filtrate is transparent, and the toluene is evaporated from the filtrate under reduced pressure. 17 200906836 Removed and used as 1 0 (Tc is dried under reduced pressure, although it is a pale yellow mucus at first) - but it can be obtained in the future. 5 g. Inject the solid into a high vacuum distillation unit and keep it for one hour at the time of 丄X τ 〇rr, at the time of 丄X τ 〇rr, at this time D Μ E addition D Μ E will slowly detach and accumulate in the cryo-cool separator 1.2 g. Slowly warm up and remove At the beginning of a very small amount, 70~175 to 0.1~0.01T..., the main crane system = light yellow solid which is solidified with liquid 3 and solidified at room temperature (melting point about 50~80C) (-- steaming product) 14 . The solid is poured into the high-vacuum steaming device again, and heated for 160 hours after 160 ° /〇.1~〇.〇1丁〇1", and then 'Yi丄7◦~175Ϊ/ 0·〇1~〇.1T〇r“Under, the main (four) obtains a pale color solid which is solidified by liquid evaporation and solidified at room temperature (the melting point is about 5 〇~8 〇. 〇(second steaming product M The measurement of i Η R and TG-DTA was carried out in the same manner as in the first example.

(一)1 Η — N M R 第五圖係顯示二次蒸餾品之測定結果。 針對 考慮第五圖之測定光譜中各信號之位置與Η之 s r (P rMe4Cp) 2與DME之Η個數之比率, 6 H ( p p m)如下述般進行歸屬。 2 . 1 5 ( s ),2 · 1 2 ( s ) ]; 2H :離開Cs 2.47(1) 1 Η — N M R The fifth graph shows the measurement results of the secondary distillate. For the ratio of the position of each signal in the measurement spectrum of the fifth graph to the number of s r (P rMe4Cp) 2 and DME of Η, 6 H ( p p m) is assigned as follows. 2 . 1 5 ( s ), 2 · 1 2 ( s ) ]; 2H : leaving Cs 2.47

Cii山之—C3HaCH3兩個與接近之CH3兩個 t ) 2 Η : C H_ 2 c Η 2 C Η 3 18 200906836 1.63(m) 2H:CH2CJi2CH3 1 . 0 8 ( t ) 3 H : C H 2 C H 2 C Us 2 . 6 9 ( t ), 2 . 5 9 ( m ) : D Μ E 之 C ϋ3 0Cii Mountain - C3HaCH3 two and close CH3 two t) 2 Η : C H_ 2 c Η 2 C Η 3 18 200906836 1.63(m) 2H:CH2CJi2CH3 1 . 0 8 ( t ) 3 H : CH 2 CH 2 C Us 2 . 6 9 ( t ), 2 . 5 9 ( m ) : D Μ E of C ϋ 3 0

Cii2 Cϋ2〇 Clia 依據第五圖所示之測定光譜,二次蒸餾品係加成於S r 1莫耳之DME之莫耳數為(2 . 9 2 1 + 1 . 9 6 1 ) /(11 .726 + 1 .945 + 1 . 901 + 3)x 3 8/10 = 1 .〇〇,平均化學式構成s r ( p r μ e 4 ί. Cp)2(DME)i,〇〇。 又’可看見因許多雜質所造成之信號,並推測於加熱 蒸餾中產生加成體之熱分解等。 又,相對於Sr (PrMe4Cp)2(DME)12 S r含量理論值為ί 7 . 3 7 %,二次蒸餾品之s r含量 分析值為1 8 . 2 %。 依此’於真空加熱蒸餾操作中,確認DmE難以脫離 D Μ E加成體。Cii2 Cϋ2〇Clia According to the measured spectrum shown in the fifth figure, the number of moles of the DME of the secondary distillation product added to S r 1 Mo is (2.92 1 + 1. 9 6 1 ) / (11 .726 + 1 .945 + 1 . 901 + 3)x 3 8/10 = 1 .〇〇, the average chemical formula constitutes sr ( pr μ e 4 ί. Cp) 2 (DME)i, 〇〇. Further, a signal due to a large amount of impurities can be seen, and it is presumed that thermal decomposition of the adduct is generated in the heating distillation. Further, the theoretical value of Sr (PrMe4Cp) 2 (DME) 12 S r content is ί 7.3.7%, and the analysis value of s r content of the secondary distillation product is 18.2%. According to this, in the vacuum heating distillation operation, it was confirmed that DmE was difficult to separate from the D Μ E addition body.

1: (二)TG — DTA 第六圖係顯示二次蒸餾品之測定結果。 依據第六圖所示之TG — DTA曲線,並未發現D Μ Ε脫離之舉動,推定大部分是以DME加成體之狀態直接 蒸發。 ^由,,lfI — NMR及丁 G —DT A之測定結果可確 涊,一次洛餾品係即使進行加熱,DME亦不會脫離,大 部分是作成DME加成體而氣化。 即,若為溶劑使用D M E且經由D M E加成體之方 19 200906836 法,則無法取得純S r ( p r μ e 4 C p ) 2。 I依此,要自市售之Sr (PrMe4Cp)2(D]VIE) 製造純S r (p rMe4Cp) 2是困難的。 〔第二比較例〕原料使用Na Cp*之S r Cp%之 製造 於具有溫度計、攪拌子、投入口、氣體出口之1 L三 口燒瓶中,在真空氬取代後注入脫水脫氧之T H F 7 5 〇 m 1與N a c p*7 9 g ( Q . 5 Q莫耳)並溶解,且將 燒瓶進行水冷並加人s r 12粉末9“(Q . 2 4 6莫 耳)’且以2 5〜4 CTC攪拌二十四小時。 ' Q、人,方;減壓下進行去溶劑,乾燥後加入脫水脫氧之 本—〇 〇 m 1,並進行利用加熱攪拌之萃取操作,靜置 顧^取*透明濾液,且自濾、液將甲苯進行減壓基 3去,並以1Q進行減壓乾燥,若於套手工作箱ί 粉末98g。二工進仃籾坪,則可取得淡黃色之鬆散 將該粉末注^華器,並於14〇〜i8〇V〇. 〇 Γ Γ下進仃第—次之昇華,並取得-次昇華品6 5 〇 8 〇:二0將。亥次幵華品注入昇華器,並於1 4 0〜1 白之二次昇華品下進行第二次之昇華,並取得純 §亥二次昇華品之社曰 CP% (0 . 162=下述刀析之結果中鑑定為Sr 9%。 、耳)’其收率相對於N a C p *為6 20 200906836 行利得之固體,第-實施例相同地進 ^定 先为光分析之組成分析及NMR之 其結果,依據§ 含量分析值於 —NMR之全S r CP%信號之Η個數及THf^) 號之H個數之比率,平均化學式可推定如下。 -1: (2) TG — DTA The sixth figure shows the measurement results of the secondary distillate. According to the TG-DTA curve shown in the sixth figure, the behavior of D Μ Ε detachment was not found, and it was presumed that most of the evaporation was directly in the state of the DME adduct. ^,, lfI - NMR and D - G - DT A measurement results can be confirmed, even if the heating system is heated, DME will not be detached, and most of them are made into DME adduct and vaporized. That is, if DM E is used as the solvent and the method of the D M E addition is used, the pure S r ( p r μ e 4 C p ) 2 cannot be obtained. Therefore, it is difficult to produce pure S r (p rMe4Cp) 2 from commercially available Sr (PrMe4Cp) 2 (D] VIE). [Second Comparative Example] The raw material was produced in a 1 L three-necked flask equipped with a thermometer, a stir bar, an inlet, and a gas outlet using S c Cp% of Na Cp*, and then dehydrated and deoxidized THF 7 5 取代 after vacuum argon substitution. m 1 and N acp*7 9 g (Q. 5 Q mole) and dissolved, and the flask was water-cooled and added with sr 12 powder 9" (Q. 2 4 6 mol) and at 2 5 to 4 CTC Stir for twenty-four hours. 'Q, person, square; desolvate under reduced pressure, add dehydration and deoxidation - 〇〇m 1, and carry out extraction operation by heating and stirring, let stand and take *clear filtrate And the toluene is subjected to decompression base 3 from the filtration and liquid, and dried under reduced pressure at 1Q, if it is in the handle box ί powder 98g. If the second work enters the 仃籾ping, the yellowish loose powder can be obtained. ^华器, and at 14〇~i8〇V〇. 〇Γ Γ下仃 — — 次 次 次 次 次 次 次 次 次 次 次 次 次 升 升 升 升 升 升 升 升 升 升 升 升 6 6 6 6 6 6 6 6 亥 亥 亥 亥 亥 亥 亥 亥 亥 亥 亥And in the 1 4 0~1 white sublimation product for the second sublimation, and obtained the pure § hai second sublimation product of the community 曰CP% (0. 162 = the following knife As a result of the analysis, it was identified as Sr 9%. The ear was 'yield relative to N a C p * was 6 20 200906836 to obtain the solid of the benefit, and the first embodiment was the same as the composition analysis of the optical analysis. As a result of NMR, the average chemical formula can be estimated as follows based on the ratio of the § content analysis value to the total number of S r CP% signals of the -NMR and the number of H numbers of the THf^) number.

HF_乾燥品:Sr 含量 19,7% SrCp%(THF_Dry product: Sr content 19,7% SrCp% (T

H F 次昇華品:s Γ含量2 2 · 1 % s r cH F sublimation: s Γ content 2 2 · 1 % s r c

PP

T 二次昇華品:Sr含量25.3% SrCp% 質係昇,1 C P發光分光分析之結果,雜 r1°.,K&lt;5°,Cr&lt;5〇,F J50 (; &lt; Q ’ N 1〈 5 0 (單位:p p b ),相較於第命 例’ Na含量大幅地變多。 嶋乐-貫施 造〔第三比較例〕原料使用KCP\S r Cp%之製 11吏用K C P *以取代N a C P *,除此以_ Μ Μ -比=同,方法’使用相同莫耳量之原料進= 2之收率相對於仄〇0*為65%。T secondary sublimation product: Sr content 25.3% SrCp% mass system liter, 1 CP luminescence spectroscopic analysis result, hetero-r1°., K&lt;5°, Cr&lt;5〇, F J50 (; &lt; Q ' N 1 5 0 (unit: ppb), compared with the first case, the 'Na content is greatly increased. 嶋乐-贯施造[The third comparative example] raw materials use KCP\S r Cp% of the system 11吏 with KCP * Instead of N a CP *, except that _ Μ Μ - ratio = the same method, the yield of the raw material using the same molar amount of = 2 is 65% with respect to 仄〇0*.

與第一實施例相同,針對二次昇華 發光=分析之組成及雜質分析/^進仃利用1 CP a 1 7 量分析值為2 5 . 〇 % (理論值2 4 . 0 ^ _ 貝係 C a = 3 0 0 〇,M g〈 5 〇,b 200906836 100 0 ’Na&lt;50,K=li〇〇,Cr&lt;5〇, e&lt;5〇’Cu&lt;50’Ni&lt;5〇(單位:ρ ρ b ),f 較於第一實施例,Κ含量大幅地變多。 目 〔第四比較例〕S r ( d p m) 2之製造 於具有溫度计、授拌葉輪、回流器之5 〇 〇彳 u Ui丄四口 燒瓶中,在真空氬取代後注入曱苯3 5 〇m丨,其文 入二新戊醯曱烷(dpmH) 65 . 6g (35 6人 耳)、金屬S r 7 · 8 g ( 8 9 m毫莫耳)並進行加敎 於回流下使其反應二十四小時此時金屬片會消失:、、見讦, P m Η 餾除去溶存之 其次,於減壓下蒸餾除去溶劑及未反應之^ 類,再於 1 3 0 °C、〇 · 〇 5 T 〇 r r 下 微量d p m Η。 於殘留物中將34g注入高真空蒸條裝置,且於23 :)C7〇 〇2Τ〇1]下進行蒸鶴,並取得(dp m ) 2 3 ◦ g。 p 與第一實施例相同, 分析之雜質分析的結果, 位:p p b ),相較於第一 多0 針對其進行利用ICP發光分光 :a,92〇,κ=89〇 (單 λ施例’ M a及K含量大幅地變 e 4 C p ) 2且利用 〔第二實施例〕使用S r ( p r μ A L D法之S r T i 〇 3膜之形成(、 於1 7 0 °C下以氬(a r 有藉由第一實施例所取得之s 缸(A )起泡,且於4 〇 下 c m將填充有τ i (〇 i p r 氣1 0 〇 s c c m將填充 r (Pr]VIe4Cp)2 的汽 以氬(Ar)氣lOOsc )4的汽缸(B )起泡,並 22 200906836 方;C下以氬(Ar)氣5〇scc m將填充有水的汽 缸(C)起泡,沖洗氣係使a Γ 2 〇 〇 s ◦ cm流動,並 以各脈動一秒、沖洗三秒進行A L D操作。 將基板溫度3 〇 〇〇C2S χ基板放置於壓力約5 τ〇 r 1之A L D室,且將利用(A脈動—沖洗—c脈動—沖 洗)之S r周期及利用(B脈動一沖洗—c脈動—沖洗) 之T i周期交互地進行各丄〇〇周期,並取得厚度 m之S r T i 〇3膜。 〔第三實施例〕使用s r (p rMe4 ald法之SrTl〇3膜之形成(2) 藉由具有包含氣體導入口之腔室壁、晶圓加熱用電阻 加熱載物加熱器、晶圓設置用升降機構之成膜室進行成 Μ,且該成膜錢透_力調整_職泵連接, 被ι入L至壁之插裝加熱器將室内保持於1 6 〇。匸,又, 載物加熱器係設定為3 2CTC,以於約〇 . 3Τ〇 ^ 使晶圓溫度構成2 9 〇 。The same as the first embodiment, the composition of the secondary sublimation luminescence = analysis of the impurity and the analysis of the impurity using the value of 1 CP a 1 7 is 2 5 . 〇% (theoretical value 2 4 . 0 ^ _ shell system C a = 3 0 0 〇,M g< 5 〇,b 200906836 100 0 'Na&lt;50,K=li〇〇,Cr&lt;5〇, e&lt;5〇'Cu&lt;50'Ni&lt;5〇 (unit: ρ ρ b ), f is much larger than the first embodiment. The fourth comparative example S r (dpm) 2 is manufactured by a thermometer, a mixing impeller, and a reflux device. In a Ui丄 four-necked flask, injecting toluene benzene 3 5 〇m丨 after vacuum argon substitution, which is incorporated into dipentane pentane (dpmH) 65. 6g (35 6 human ears), metal S r 7 · 8 g (8 9 m millimolar) and reacted under reflux for 24 hours, at which time the metal piece disappears: , see 讦, P m Η distillation removes the second, and the solvent is distilled off under reduced pressure. And unreacted ^, then at a temperature of 130 ° C, 〇 · 〇 5 T 〇rr a small amount of dpm Η. In the residue, 34g was injected into the high vacuum steaming device, and at 23 :) C7 〇〇 2 Τ〇 1] under the steaming crane, and take (Dp m) 2 3 ◦ g. p is the same as the first embodiment, and the result of the impurity analysis of the analysis, bit: ppb), is compared with the first multi-zero for ICP luminescence: a, 92 〇, κ = 89 〇 (single λ embodiment) The contents of M a and K are greatly changed to e 4 C p ) 2 and the formation of S r T i 〇 3 film by pr μ ALD method is used by [second embodiment] (at 170 ° C) Argon (ar has s cylinder (A) obtained by the first embodiment foaming, and at 4 〇 cm will be filled with τ i (〇ipr gas 10 〇sccm will fill r (Pr) VIe4Cp) 2 The steam is bubbled with the cylinder (B) of argon (Ar) gas 100sc)4, and 22 200906836 square; the cylinder (C) filled with water is bubbled with argon (Ar) gas 5〇scc m, and the gas system is flushed. Let a Γ 2 〇〇s ◦ cm flow, and pulsate for one second and rinse for three seconds for ALD operation. Place the substrate temperature 3 〇〇〇C2S χ substrate in the ALD chamber with a pressure of about 5 τ〇r 1 and The S r period of (A pulsation-flush-c pulsation-flush) and the T i period of (B-pulse-flush-c-pulse-flush) are alternately performed for each cycle, and the thickness r of S r T is obtained. i 〇3 film. [Third embodiment] sr (formation of SrTl〇3 film of p rMe4 ald method) (2) Heating heater heater for heating by wafer having a gas introduction port The wafer is set up by the film forming chamber of the lifting mechanism, and the film is formed by the pumping heater, and the chamber is held at 16 〇. Further, the load heater is set to 3 2 CTC to form a wafer temperature of about 2 〇.

便用運送臂,將直徑3〇〇職之31晶圓自運送系 二v入成版室亚移載至載物加熱器,然後,使氬(a『) =” S c cm流通’並藉由壓力調整閥將室内壓力保 符在1 丁◦ r r而使晶圓溫度升溫。Using the transport arm, the 31 wafers of the diameter 3 are transferred from the transport system to the plate heater, and then the argon (a『) = "S c cm is circulated" and borrowed. The temperature of the wafer is raised by the pressure regulating valve to keep the indoor pressure at 1 ◦ rr.

將藉由第一實施例所取得之S Γ ( p M i〇〇g填充於起泡用汽缸⑷並保持於16;广)2 ,體乳體係使氬(A r )氣5 0 s C c 日=心)2蒸氣。又,將填以The S Γ obtained by the first embodiment (p M i〇〇g is filled in the foaming cylinder (4) and held at 16; wide) 2, and the body milk system makes argon (A r ) gas 5 0 s C c Day = heart) 2 steam. Again, will be filled in

(1 P r ) 4的汽缸(B )保持於4 ,且使氬(A 1)軋2〇〇3〇0:]11流通並起泡,同時取得丁^(〇土 23 200906836 二以水作為氧化劑·保持於 s c c m ( c 流動2Πη。出側5又置-溫質量流量計並使ϋ2〇氣體 seem 再者,沖洗氣係使用A r 2 〇 以各=:料供給(以下稱作脈動)及沖洗 動或沖洗時腔室行下述ALD操作’由於纽 驗據至内之氣體流量土力 動B : 0 /1 τ 傅战脈動A . 〇 · 3 T 〇 r r,脈 n . ?τ· 4Τ〇 Γ Γ ’脈動C : 0 . 5To r r,沖洗: 2 9『c f ^ F。於該等A L D操作期間晶®係保持在約 ㈣Π用(纽動—沖洗—C脈動一沖洗)0形 幵^成月期L用(B脈動—沖洗—C脈動—沖洗)之T 1〇 划期合計進行7 7周期,且構成S r O/T i 〇2周 m。· 3 ’具體而言’將(A脈動-沖洗-C脈動-1:周期、(B脈動—沖洗-C脈動-沖洗)2周期、 脈動—沖洗-C脈動-沖洗)2周期、(B脈動一沖洗 脈動1中洗)丄周期之—連串程序設為—次,並將其 反伋十一次而形成厚度5 nm之s r T i〇3膜。 藉由XRF (螢光X射線分析)法調查所形成之膜料 組成時 ’ S r/T i = 1 · 4。 又在S r ( P r M e 4 C p ) 2之開始使用及使用9 〇 g之㈣點進行二十五丨之運轉成膜時,其平均膜厚為 5。3 . 5A與50 . 3人,面内膜厚分布之標準偏差為丄. 6%與1 . 3%,二十五片之面間膜厚分布之標準偏差為 2 . 8%與3 . 3%,在S r ( p rMe4C p ) 2之開始 24 200906836 g之時間點幾乎沒有成膜 使用及大致結束使用之使用9 特性之差異。 〔弟五比較例〕使用S r Γ *The cylinder (B) of (1 P r ) 4 is maintained at 4, and argon (A 1) is rolled 2 〇〇 3 〇 0:] 11 to circulate and foam, and at the same time, butyl ^ (〇土 23 200906836) is used as water The oxidant is kept at sccm (c flow 2Πη. The outlet side 5 is again set-temperature mass flow meter and the ϋ2〇 gas seek is used again, and the flushing gas system uses A r 2 〇 to each = material supply (hereinafter referred to as pulsation) and During the flushing or rinsing, the chamber performs the following ALD operation. 'Because of the gas flow in the new test, the earth force B: 0 /1 τ 战 脉 A A. 〇· 3 T 〇rr, pulse n. ?τ· 4Τ〇 Γ Γ 'Pulsating C: 0. 5To rr, Flush: 2 9『cf ^ F. During the ALD operation, the crystal system is kept at about (4) ( (New-flushing-C pulsation-flushing) 0-shaped 幵^ For the monthly period L (B pulsation-flushing-C pulsation-flushing), the total period of T1〇 is 7 7 cycles, and constitutes S r O/T i 〇 2 weeks m.· 3 'Specifically' will (A Pulsation-flush-C pulsation-1: cycle, (B pulsation-flush-C pulsation-flush) 2 cycles, pulsation-flush-C pulsation-flush) 2 cycles, (B pulsation-flush pulsation 1 wash) cycle - a series of programming For the time, it is reversed ten times to form a sr T i〇3 film with a thickness of 5 nm. When the composition of the formed film is investigated by XRF (fluorescence X-ray analysis) method, 'S r/T i = 1 · 4. When the film is formed at the beginning of S r ( P r M e 4 C p ) 2 and the film is operated at 25 丨g (4), the average film thickness is 5.3. 5A and 50.3, the standard deviation of the intima thickness distribution is 6%. 6% and 1.3%, the standard deviation of the film thickness distribution between the two sheets is 2.8% and 3.3%. At the time point of S r ( p rMe4C p ) 2 24 200906836 g, there is almost no difference between the use of the film formation and the use of the characteristics of the end use. [Comparative Example 5] Using S r Γ *

膜之形成(1 lCp 2且利用ALD法之S 使用S r C P %以取代 此以外則與第三實施例相同地進行成:广CP)2’除 2“43.= = = 丁其細厚為… 用為1.4而使用90g之時間=了『於_使 之供給量賴降低。 ’〜〇 · 8 5 S Γ C P% 依擄第三實施例與第五比較例,由於 fp) 2於起泡溫度下為液體,因此自埴充⑽e 開始使用至結束可安定地供給蒸氣。、 〇 S之 體:二ίΤ=:;=起泡之溫度, 凝結所造成之蒸發表面積之減^粉體 :::所?键不足等,而有成膜原 使用 Sr (PrMe4Cp ALD法之s r 丁 i〇3臈之形成(3 ) j用 成版室係作成與第三實施例相同之條件設定。 將藉由第一實施例所取得之sr 填充於起泡用汽缸(A)並保持於155^^^^ 200906836 係使氬(A r )氣5 0 s c c m流通並起泡,同時取得s r ( P r M e 4 C p ) 2蒸氣。又,將填充有τ i ( 〇 i p r ) 4的汽缸(B )保持於5 5χ:,且使氬(A r )氣2 〇〇S c C m流通並起泡,同時取得T i (〇i p r ) 洛=。又,氧化劑係使〇2/N2 = 5 0 0/0 . 5 S c c 合氣通往臭氧發生器而取得1 8 0 g/m3濃度之〇 3亂體(C ) ’再者,沖洗氣係使用A ^ 2 〇 ◦ s ◦ c ΙΏ。 、將該等脈動及沖洗以A、B脈動十秒、C脈動兩秒、 沖洗十秒進行下述A L D操作。 、將利用(A脈動-沖洗一 c脈動一沖洗)之s :〇形 成周期及利用(B脈動-沖洗—c脈動—沖洗)之τ 土 ^ 二形成周期合計進行口周期,且構成S r 0/T i〇2周 期比=1 . 2,具體而言1 ( A脈動一沖洗—C脈動— =洗)2周期、(B脈動-沖洗—c脈動—沖洗)2周期、 」A脈動—沖洗—c脈動一沖洗)2周期、(b脈動—沖洗 :c脈動—沖洗)2周期、(八脈動—沖洗—c脈動— (B脈動-沖洗—c脈動—沖洗)上周期之一連串 二序设為—次,並將其反覆七次而形成厚度5㈣之 丁 1〇3膜。 藉由XRF法調查所形成之膜料組成時,&amp; =1 · 2 5。 〔第五實施例〕使用Sr (Pr]Vip η 、 Α τ η、+ 0 r r μ e 4 C Ρ ) 2且利用 A L D法之s r Τ ι〇3膜之形成(4 ) 成膜至係作成與第三實施例相同之條件設定。 將藉由第一實施例所取得之s r ( ρ 溶解於甲笨中,並作成〇 . 4莫耳/ 24 P } 2 、斗/ 1 /奋液,其黏度為4 26 200906836Formation of a film (1 lCp 2 and S by ALD method using S r CP % instead of the same as in the third embodiment: wide CP) 2' divided by 2" 43. = = = It is used for 1.4 and the time of using 90g = "The amount of supply is reduced by _. 〇 〇 8 5 S Γ CP% Depends on the third embodiment and the fifth comparative example, since fp) 2 It is a liquid at the bubble temperature, so it can supply the vapor stably from the beginning to the end of the charge (10)e. The body of the 〇S: Τ Τ =:; = the temperature of the foaming, the evaporation surface area caused by the condensation; :: The key is insufficient, and the film formation original is Sr (the formation of the sr of the PrMe4Cp ALD method (3) j is set by the stencil system to the same conditions as the third embodiment. The sr obtained in the first embodiment is filled in the foaming cylinder (A) and held at 155^^^^200906836 to circulate and foam the argon (A r ) gas 50 sccm while obtaining sr (P r M e 4 C p ) 2 vapor. Further, the cylinder (B) filled with τ i ( 〇ipr ) 4 is maintained at 5 5 χ:, and argon (A r ) gas 2 〇〇S c C m is circulated and foamed At the same time T i (〇ipr ) 洛 =. In addition, the oxidant system makes 〇 2 / N2 = 5 0 0 / 0 . 5 S cc gas into the ozone generator to obtain a density of 1 800 g / m3 C) 'Further, the flushing gas system uses A ^ 2 〇◦ s ◦ c ΙΏ. The pulsation and flushing are performed by pulsing A and B for ten seconds, C pulsing for two seconds, and rinsing for ten seconds to perform the following ALD operation. The s: 〇 formation cycle and the (B pulsation-flush-c pulsation-flush) τ soil ^ 2 formation cycle are used to perform the mouth cycle, and constitute S r 0 / T i〇2 cycle ratio = 1.2, specifically 1 (A pulsation-flush-C pulsation-=washing) 2 cycles, (B pulsation-flushing-c pulsation-flushing) 2 cycles, "A pulsation-flushing- c pulsation-flushing) 2 cycles, (b pulsation-flushing: c pulsation-flushing) 2 cycles, (8 pulsation-flushing-c pulsation-(B-pulse-flush-c-pulse-flush) one of the upper cycles of the sequence is set to - times, and repeating it seven times to form a film of thickness 5 (four) of 丁1〇3. When investigating the formed film composition by XRF method, &amp; =1 · 2 5 [Fifth Embodiment Using Sr (Pr]Vip η , Α τ η, + 0 rr μ e 4 C Ρ ) 2 and forming sr Τ ι 〇 3 film by ALD method (4) film formation to system is the same as that of the third embodiment Condition setting. The s r ( ρ dissolved by the first embodiment is dissolved in a stupid, and is made into 〇 4 mol / 24 P } 2 , 斗 / 1 / 奋 liquid, the viscosity is 4 26 200906836

0 c P ^ =體供給系統職溶液引導至業已加熱 C之龜,且將氬(Ar)氣 =0〇 氣體,並以〇 〇 〇, /n^ . 、 cm作為栽體 ifc ^ # 1 η之流量藉由液體流量計〜 抆制面使其氣化,同時取得Sr 卞面 ,(A)。又,使用液體供給系統將以(〇ι4ρ ^氣 加熱至1〇〇。。之氣化器,且將氬Ur)心丨 量,”體流量計—面㈣—面使其氣化乂時取二流 1 1 ) 4瘵氣。又,氧化劑係使〇2//N2=5 “ / 3. 5 s c㈣混合氣通往臭氧發生器而取得]8 =濃度之〇3氣體(C),再者,沖洗氣係使用【 ◦ 0 s c c m。 ζ 將該等脈動及沖洗以A、B脈動兩秒、c脈動兩秒、 沖洗五秒進行下述A L D操作。0 c P ^ = body supply system solution is directed to the turtle that has heated C, and argon (Ar) gas = 〇 gas, and 〇〇〇, /n^., cm as the carrier ifc ^ # 1 η The flow rate is vaporized by the liquid flow meter ~ 抆 surface, and the Sr surface is obtained, (A). Moreover, using a liquid supply system, the amount of enthalpy is increased by (〇ι4ρ^ gas to a gasifier and argon Ur), and the volume flowmeter-surface (four)-surface is vaporized. Second-rate 1 1 ) 4 helium. In addition, the oxidant is obtained by 〇2//N2=5" / 3. 5 s c (four) mixed gas to the ozone generator] 8 = concentration of 〇 3 gas (C), and , flushing gas system using [ ◦ 0 sccm.将该 The pulsation and rinsing are performed by pulsing A and B for two seconds, c pulsing for two seconds, and rinsing for five seconds to perform the following A L D operation.

、將利用(A脈動-沖洗一c脈動〜沖洗)之Sr〇形 成周期及利用(B脈動-沖洗一 c脈動—沖洗)之丁 土 ^ 2形成周期合計進行9 9周期,且構成S r〇/T丨〇2周 /月比1 . 2,具體而5,將(A脈動一沖洗一 c脈動一 沖洗)2周期、(B脈動一沖洗一 c脈動—沖洗)2周期、 (A脈動一沖洗一 C脈動一沖洗)2周期、(B脈動一沖洗 一 C脈動一沖洗)2周期、(A脈動—沖洗一 c脈動—沖洗) 2周期、(B脈動一沖洗一c脈動一沖洗)1周期之一連串 程序没為一次,並將其反覆九次而形成厚度6 . 4 η ηι之 S r T i 0 3 膜。 使用該S r 丁 i 〇 3膜,並將上•下部電極同時作成 27 200906836 心而製作滅^“金屬—絕緣體—金屬憂…The Sr〇 formation period using (A pulsation-flushing-c pulsation-flushing) and the formation period of the B-pulse formation using (B-pulse-flush-c-pulse-flush) are performed for a total of 9 9 cycles, and constitute S r〇 /T丨〇2 weeks/month is 1.2. Specifically, 5, (A pulse-flush-c-pulse-flush) 2 cycles, (B-pulse-flush-c-pulse-flush) 2 cycles, (A pulse one Flush a C pulse-flush) 2 cycles, (B pulse-flush-C-pulse-flush) 2 cycles, (A pulse-flush-c pulse-flush) 2 cycles, (B pulse-flush-c-pulse-flush)1 One of the cycles is not repeated once, and it is repeated nine times to form a S r T i 0 3 film having a thickness of 6.4 η ηι. Use the S r i i 〇 3 film, and make the upper and lower electrodes simultaneously into a 27 200906836 heart to make a fire ^ "metal - insulator - metal worry...

Insulator M e t a 1 ) , ^ ^ g 〇 〇 〇〇 之熱處理使S r T 1〇3結晶化時,氧化膜換算膜厚為 〇 . 7nm,且施加電壓i v時之漏電流為Insulator M e t a 1 ) , ^ ^ g 〇 〇 〇〇 When the heat treatment is performed to crystallize S r T 1〇3, the film thickness of the oxide film is 〇 7 nm, and the leakage current when the voltage i v is applied is

,A/Cm2。 U 〔第六比較例〕使用s r Cp%且利用ald法之s r 丁 i 〇3膜之形成(2 ) 使用SrCp%0.2莫耳/1甲苯溶液以取代。 目(J:MrCp)2〇.4莫耳/1甲苯溶液,除此以外 則14弟五貫施例相同地進行成膜。 、將利用(A脈動-沖洗—c脈動—沖洗)之s i 〇形 成周期及利用(B脈動—沖洗一 c脈動一沖洗)之丁 土 ^ 2形成周期合計進行9 9周期,且構成s r〇/τ 土〇2 1.2 ’具體而言,將(A脈動—沖洗—c脈動二 :冼)2周期、(B脈動一沖洗—c脈動〜沖洗)2周期、 (A脈動-沖洗—c脈動—沖洗)2周期、(㈣動—沖、先 /脈動-沖洗)2周期、(六脈動—沖洗1脈動—沖洗 〒周期:(B脈動—沖洗一 C脈動—沖洗)工周期之— 転序设為-次’並將其反覆九次而形成厚, A/Cm2. U [sixth comparative example] s r Cp% was used and the formation of the s r i i 〇 3 film by the ald method (2) was replaced with a SrCp% 0.2 mol/1 toluene solution. The film was formed in the same manner as in the above-mentioned four-part method except for the (J:MrCp) 2 〇.4 mol/1 toluene solution. The use of (A pulsation-rinsing-c pulsation-flushing) si 〇 formation cycle and the use of (B pulsation-flushing-c pulsation-flushing) of the butyl soil formation cycle for a total of 9 9 cycles, and constitutes sr〇 / τ 〇 2 1.2 ' Specifically, (A pulsation - flush - c pulsation 2: 冼) 2 cycles, (B pulsation - flush - c pulsation ~ flush) 2 cycles, (A pulsation - flush - c pulsation - flush 2 cycles, ((4) dynamic-rush, first/pulsation-flush) 2 cycles, (six-pulse-flush 1 pulsation-flushing cycle: (B-pulse-flush-C pulsation-flush) cycle] - times' and repeats it nine times to form a thick

SrTi〇3膜。 …m之 使用該S r T i〇3膜,並將上·下部電極同時 R u而製作μ ί M結構,並以6 ◦ 之熱處理使$『丁 1〇3結晶化時,氧化膜換算膜厚為〇 . g n爪, 電壓IV時之漏電流為2 · 4χ 1〇-3A/cm2。知加 •相較於第五實施例之S rTi 〇3膜,雖然該s rT 1 〇3膜之物理膜厚、氧化膜換算膜厚皆厚,但漏電流卻 28 200906836 大0 將第五實施例及第六比較例之s r T i〇3膜分別以 膜厚5 nm成膜於s i基板上,並藉由TXR F (全反射 螢光X射線)分析比較N a含量時,第六比較例為第五實 施例之2倍。 ' 由此可知,相較於S r ( P r M e 4 C p ) 2,由於S 1 C p 2之N a等雜質多,因此會使電特性惡化。 〔第六實施例〕使用S r ( P r M e 4 c p ) 2且利用 A L D法之S r R u〇3膜之形成 成膜室係將載物加熱器之設定作成3 5 0 t,以於 〇 .、3丁〇 r r下使晶圓溫度構成3 3 ,除此以外則 作成與第三實施例相同之條件設定。 將藉由第 :容解於甲苯中’並作成〇 . 4莫耳力溶液。使用液體供2 =統將該溶液引導至業已加熱至2〇之氣化器,且SrTi〇3 film. ...m uses the S r T i〇3 film, and the upper and lower electrodes are simultaneously R u to form a μ ί M structure, and the heat treatment of 6 ◦ 3 〇 3 is crystallized by the heat treatment of 6 ◦ The thickness is 〇. gn claw, the leakage current at voltage IV is 2 · 4χ 1〇-3A/cm2. Compared with the S rTi 〇3 film of the fifth embodiment, although the physical thickness of the s rT 1 〇3 film and the thickness of the oxide film are thick, the leakage current is 28 200906836, which is the fifth implementation. The sr T i〇3 film of the sixth comparative example and the film were formed on the Si substrate at a film thickness of 5 nm, respectively, and the N a content was compared by TXR F (total reflection fluorescent X-ray) analysis, the sixth comparative example. It is twice as large as the fifth embodiment. From this, it can be seen that compared with S r ( P r M e 4 C p ) 2, since there are many impurities such as N a of S 1 C p 2 , electrical characteristics are deteriorated. [Sixth embodiment] The formation of the film forming chamber using S r ( P r M e 4 cp ) 2 and the S r R u 〇 3 film by the ALD method is set to 350 volts to The wafer temperature was set to 3 3 under the conditions of 3 〇 rr, and the same conditions as those in the third embodiment were set. It will be prepared by dissolving in toluene in the 'th. Use liquid to supply the solution to a gasifier that has been heated to 2 Torr, and

貫施例所取得之S r (p r μ e 4 C p 乂風/ Α1 )氣2 0◦ s c c m作為載體氣體,並以0 1n之流量藉由液體流量計-面控制一面使苴氣 :用=取得 Sr (PrMe‘CP)2 氣體(A)。; 使用液肢供給系統將Ru (E t 至1 2 〇°c之氣化哭,曰、導業已加熱 作為載體氣體:並:〇 =氣2〇〇SCCm 量計一而批4|一 U . 1 g/m i n之流量藉由液體流 P L面使其氣化,同時取得Ru (E t CP) π孔。又,氧化劑係使〇2/N2 = cm混合氣通往臭氧發 3 ^ S ° Ο 31 ^ r r ^ ^ +王。°向取传1 〇 〇 g/m3濃度之 將;(:)’再者’沖洗氣係使用Ar2〇〇sccm。 寻脈動及沖洗以A、B脈動-秒、。脈動—秒、 29 200906836 沖洗兩秒進行下述A L D操作。 將利用(A脈動一沖洗一c脈動一沖洗)之S r 〇形 成周期及利用(Β脈動一沖洗一◦脈動一沖洗)之r u〇 2形成周期合計進行2 4 〇周期,且構成s r〇/R u 〇2 周期比=1,具體而言,將(A脈動—沖洗一 c脈動〜沖 洗)2周期、(B脈動一沖洗一◦脈動一沖洗)2周期之一 連串程序設為一次,並將其反覆六十次而形成厚度2 8 n m 之 S r R u 0 3 膜。 〔第七實施例〕使用S r ( p r μ e 4 C p ) 2且利用 c VD法之s r T i 〇3膜之製造 P ) 2的汽紅起泡, 到C V D室。The S r (pr μ e 4 C p hurricane / Α 1 ) gas obtained as a carrier gas was used as a carrier gas, and the helium gas was controlled by a liquid flow meter-surface at a flow rate of 0 1 n: Obtain Sr (PrMe'CP) 2 gas (A). Using the liquid limb supply system, the gas of Ru (E t to 1 2 〇 °c is cried, and the crucible has been heated as a carrier gas: and: 〇 = gas 2 〇〇 SCCm meter and batch 4 | one U. The flow rate of 1 g/min is vaporized by the PL surface of the liquid stream, and Ru (E t CP) π pores are obtained at the same time. Further, the oxidant system makes the 〇2/N2 = cm mixture gas to the ozone generation 3 ^ S ° Ο 31 ^ rr ^ ^ + Wang. ° to pass the 1 〇〇g / m3 concentration; (:) 'More' flushing gas system using Ar2 〇〇 sccm. Pulsing and flushing with A, B pulsation - seconds, Pulsation-second, 29 200906836 Flush for two seconds to perform the following ALD operation. The S r 〇 will be used to form the cycle and use (A pulsation-flush-c pulsation-flush). 〇2 formation cycle totals 2 4 〇 cycles, and constitutes sr〇/R u 〇2 cycle ratio =1, specifically, (A pulsation-flush-c pulsation-flush) 2 cycles, (B pulsation-flush one ◦Pulse-flush) One of the two cycles of the series is set to one time, and it is repeated sixty times to form a S r R u 0 3 film having a thickness of 28 nm. [Seventh embodiment Using S r (p r μ e 4 C p) 2 and s r c VD using the method of manufacturing a 〇3 membrane of T i P) 2 red foaming steam, to the chamber C V D.

M e 2 ) 4蒸氣送到c V D室。 於1 6 0 〇C、内壓約5 丁 〇 r r下以氬氣5 〇 s c c m將填充有藉由第一實施例所取得之s r ( p r e 1匚 並將S r (p rMe/lCp) 2蒸氣送 r下以氬氣50 s c :起泡,並將T i ( ]\j 又,將氧軋1 〇〇s c c m送到c v D室。M e 2 ) 4 vapor is sent to the c V D chamber. The sr (pre 1匚 and S r (p rMe/lCp) 2 vapor obtained by the first embodiment will be filled with argon gas 5 〇 sccm at 1 600 ° C and an internal pressure of about 5 〇 rr rr. R was sent with argon 50 sc: foaming, and T i ( ]\j again, oxygen rolling 1 〇〇 sccm was sent to the cv D chamber.

30 200906836 p ) 2的汽缸起泡,並將s r (p r M e 4 c p ) 2蒸氣送 到C V D室。 同時於3 0 °C、内壓約7 丁 〇 r r下以氬氣5 〇 s c c m將填充有r u ( E t c p) 2的汽缸起泡,並將R u (E t Cp) 2蒸氣送到CVD室。 於C VD室入口混合該等氣體並導入保持在5 τ 〇 r 1、700C之3 1'丁1〇3(1〇〇)基板上時,可於 三十分鐘生成厚度8 0 nm之S r R u Os膜。 ,惟,以上所述,僅為本發明最佳之一的具體實施例之 詳細說明與圖式,惟本發明之特徵並不侷限於此,並非用 以限制本發明,本發明之所有範圍應以下述之申請專利範 圍為準,凡合於本發明申請專利範圍之精神與其類似變化 =實施例,皆應包含於本發明之範疇中,任何熟悉該項技 ,者在本發明之領域内’可輕易思及之變化或修飾皆可涵 蓋在以下本案之專利範圍。 【圖式簡單說明】 第一圖係顯示有關第一實施例之二次蒸餾品之2 Η— nm R之測定光譜圖; 第二圖係顯示有關第一實施例之減壓乾燥品之! H— nm R之測定光譜圖; 第三圖係顯示有關第一實施例之二次蒸鶴品於!大氣壓下 之T G — D T A測定結果圖; 第四圖係顯示有關第—實施例之減壓乾燥品於工大氣壓下 之T G — D T A測定結果圖; 第五圖係顯示有關第—比較例之二次蒸餘品之iH — nm 31 200906836 R之測定光譜圖;及 第六圖係顯示有關第一比較例之二次蒸餾品於1大氣壓下 之T G — D T A測定結果圖。 【主要元件符號說明】 /、》、 f / k 3230 200906836 p ) 2 cylinders are foamed and s r (p r M e 4 c p ) 2 vapor is sent to the C V D chamber. At the same time, the cylinder filled with ru (E tcp) 2 was bubbled with argon gas 5 〇sccm at 30 ° C and an internal pressure of about 7 〇 rr, and the Ru (E t Cp) 2 vapor was sent to the CVD chamber. . When the gas is mixed at the inlet of the C VD chamber and introduced into the 3 1 '1 丁 1 〇 3 (1 〇〇) substrate held at 5 τ 〇r 1, 700 C, S r can be formed at a thickness of 80 nm in thirty minutes. R u Os film. The above description is only a detailed description of the specific embodiments of the present invention, and the present invention is not limited thereto, and is not intended to limit the present invention, and all the scope of the present invention should be In the following claims, the spirit of the claims and the similar changes to the embodiments of the invention are included in the scope of the invention, and any one skilled in the art is within the scope of the invention. Variations or modifications that can be easily conceived are covered by the patents in this case below. BRIEF DESCRIPTION OF THE DRAWINGS The first figure shows the measured spectrum of 2 Η-nm R of the second distillation product of the first embodiment; the second figure shows the vacuum-dried product of the first embodiment! The measured spectrum of H-nm R; the third figure shows the second steamed crane product of the first embodiment! The TG-DTA measurement result chart at atmospheric pressure; the fourth figure shows the TG-DTA measurement result chart of the vacuum drying product of the first embodiment at the atmospheric pressure; the fifth figure shows the second comparison of the first comparative example. The measured spectrum of iH - nm 31 200906836 R of the evaporated product; and the sixth figure shows the results of the TG-DTA measurement of the second distillation product of the first comparative example at 1 atm. [Main component symbol description] /, ", f / k 32

Claims (1)

200906836 、申請專利範圍: 1、一種用以形成含有锶的薄膜之原料,係雔 曱環戍二烯)锶。 又 四 一 2+、如申請專利範圍第1項所述之用以形成含有鋰 的薄膜之原料,其中N a及K之各含量係5 0 p p b以下: 3 —種用以形成含有魏的薄膜之原料之掣迕方 法,係經由以下程序取得雙(丙四曱環戊二稀)锶者,即: 使丙四甲環戊一烯鈉或丙四環戊二食 中反應,並生成雙(丙四甲環戍二稀 呋喃加成體之程序; a 之程除去四氫七南,且藉由曱苯萃取而作成曱苯溶液 去甲苯並進行減壓乾燥之程序;及 氡二ίΐ::熱至10 0〜16 〇。° ’並於解離除去四 鼠夫南後進仃畨餾之程序。200906836, the scope of application for patents: 1. A raw material for forming a film containing bismuth, which is 雔 曱 戍 戍 锶). Further, according to the first aspect of the patent application, the raw material for forming a film containing lithium, wherein the content of Na and K is less than 50 ppb: 3 - for forming a film containing Wei The raw material method is obtained by the following procedure to obtain bis(propanthene cyclopentadienyl) hydrazine, that is, to react with sodium tetramethylcyclopentene or propyltetradecyl pentoxide, and to produce double (c) Procedure for removing tetrahydrofuran-addition of tetramethylcyclohexane; a procedure for removing tetrahydro-seven, and extracting toluene by deuterated benzene to remove toluene and drying under reduced pressure; and 氡二ΐ::heat To 10 0~16 〇. ° 'And the process of removing the four mouse after the dissociation and distilling.
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