TW200837364A - Device batch testing tool and method thereof - Google Patents
Device batch testing tool and method thereof Download PDFInfo
- Publication number
- TW200837364A TW200837364A TW96107571A TW96107571A TW200837364A TW 200837364 A TW200837364 A TW 200837364A TW 96107571 A TW96107571 A TW 96107571A TW 96107571 A TW96107571 A TW 96107571A TW 200837364 A TW200837364 A TW 200837364A
- Authority
- TW
- Taiwan
- Prior art keywords
- component
- tested
- detecting
- test
- batch
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 238000000034 method Methods 0.000 title claims abstract description 10
- 238000007689 inspection Methods 0.000 claims abstract description 12
- 238000001514 detection method Methods 0.000 claims description 35
- 230000002950 deficient Effects 0.000 claims description 2
- 208000027418 Wounds and injury Diseases 0.000 claims 1
- 230000006378 damage Effects 0.000 claims 1
- 230000009977 dual effect Effects 0.000 claims 1
- 208000014674 injury Diseases 0.000 claims 1
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 241001494479 Pecora Species 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200837364A true TW200837364A (en) | 2008-09-16 |
| TWI338785B TWI338785B (enExample) | 2011-03-11 |
Family
ID=44820185
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96107571A TW200837364A (en) | 2007-03-05 | 2007-03-05 | Device batch testing tool and method thereof |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200837364A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI416652B (zh) * | 2010-08-20 | 2013-11-21 | Chroma Ate Inc | With a single through the shuttle shuttle of the semiconductor components test machine |
| TWI760897B (zh) * | 2019-12-05 | 2022-04-11 | 仁寶電腦工業股份有限公司 | 測試治具及測試方法 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9373534B2 (en) | 2012-09-05 | 2016-06-21 | Industrial Technology Research Institute | Rotary positioning apparatus with dome carrier, automatic pick-and-place system, and operating method thereof |
-
2007
- 2007-03-05 TW TW96107571A patent/TW200837364A/zh not_active IP Right Cessation
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI416652B (zh) * | 2010-08-20 | 2013-11-21 | Chroma Ate Inc | With a single through the shuttle shuttle of the semiconductor components test machine |
| TWI760897B (zh) * | 2019-12-05 | 2022-04-11 | 仁寶電腦工業股份有限公司 | 測試治具及測試方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI338785B (enExample) | 2011-03-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MC4A | Revocation of granted patent | ||
| MC4A | Revocation of granted patent |