TW200811443A - Vertical probing apparatus - Google Patents
Vertical probing apparatus Download PDFInfo
- Publication number
- TW200811443A TW200811443A TW95131453A TW95131453A TW200811443A TW 200811443 A TW200811443 A TW 200811443A TW 95131453 A TW95131453 A TW 95131453A TW 95131453 A TW95131453 A TW 95131453A TW 200811443 A TW200811443 A TW 200811443A
- Authority
- TW
- Taiwan
- Prior art keywords
- vertical probe
- holes
- positioning piece
- plate
- support portion
- Prior art date
Links
- 239000000523 sample Substances 0.000 claims abstract description 90
- 238000006073 displacement reaction Methods 0.000 claims abstract description 5
- 125000006850 spacer group Chemical group 0.000 claims description 14
- 230000000694 effects Effects 0.000 claims description 5
- 239000000126 substance Substances 0.000 claims description 5
- 230000004308 accommodation Effects 0.000 claims description 2
- 239000007769 metal material Substances 0.000 claims description 2
- 239000011810 insulating material Substances 0.000 claims 1
- 210000001747 pupil Anatomy 0.000 claims 1
- 238000000926 separation method Methods 0.000 claims 1
- 238000012423 maintenance Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 235000008331 Pinus X rigitaeda Nutrition 0.000 description 1
- 235000011613 Pinus brutia Nutrition 0.000 description 1
- 241000018646 Pinus brutia Species 0.000 description 1
- 241001422033 Thestylus Species 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95131453A TW200811443A (en) | 2006-08-25 | 2006-08-25 | Vertical probing apparatus |
| SG200704040-5A SG140525A1 (en) | 2006-08-25 | 2007-06-05 | Vertical probe device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95131453A TW200811443A (en) | 2006-08-25 | 2006-08-25 | Vertical probing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200811443A true TW200811443A (en) | 2008-03-01 |
| TWI299085B TWI299085B (OSRAM) | 2008-07-21 |
Family
ID=39205054
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95131453A TW200811443A (en) | 2006-08-25 | 2006-08-25 | Vertical probing apparatus |
Country Status (2)
| Country | Link |
|---|---|
| SG (1) | SG140525A1 (OSRAM) |
| TW (1) | TW200811443A (OSRAM) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI565951B (zh) * | 2015-08-24 | 2017-01-11 | 旺矽科技股份有限公司 | 探針頭 |
| TWI767876B (zh) * | 2020-03-04 | 2022-06-11 | 中國探針股份有限公司 | 探針定位載具 |
| TWI771658B (zh) * | 2020-03-04 | 2022-07-21 | 中國探針股份有限公司 | 探針檢測設備及探針的三維檢測方法 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI521212B (zh) | 2014-03-10 | 2016-02-11 | A method and a method of assembling a vertical probe device, and a vertical probe device | |
| TW201537181A (zh) | 2014-03-25 | 2015-10-01 | Mpi Corp | 垂直式探針裝置及使用於該垂直式探針裝置之支撐柱 |
-
2006
- 2006-08-25 TW TW95131453A patent/TW200811443A/zh unknown
-
2007
- 2007-06-05 SG SG200704040-5A patent/SG140525A1/en unknown
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI565951B (zh) * | 2015-08-24 | 2017-01-11 | 旺矽科技股份有限公司 | 探針頭 |
| CN106483345A (zh) * | 2015-08-24 | 2017-03-08 | 旺矽科技股份有限公司 | 探针头 |
| TWI767876B (zh) * | 2020-03-04 | 2022-06-11 | 中國探針股份有限公司 | 探針定位載具 |
| TWI771658B (zh) * | 2020-03-04 | 2022-07-21 | 中國探針股份有限公司 | 探針檢測設備及探針的三維檢測方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| SG140525A1 (en) | 2008-03-28 |
| TWI299085B (OSRAM) | 2008-07-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5426161B2 (ja) | プローブカード | |
| TWI465740B (zh) | 用於測試電測試樣本之電測試設備及電測試方法 | |
| JP3791689B2 (ja) | プローブカード | |
| JP3505495B2 (ja) | 基板検査用検査治具、該検査治具を備えた基板検査装置および基板検査用検査治具の組立方法 | |
| US7795892B2 (en) | Probe card | |
| TWI342401B (OSRAM) | ||
| JP2005321305A (ja) | 電子部品測定治具 | |
| CN101093231A (zh) | 探针卡 | |
| KR20070083187A (ko) | 프로브 조립체 | |
| US9013199B2 (en) | Contact-connection unit for a test apparatus for testing printed circuit boards | |
| TW201142324A (en) | Capacitive opens testing in low signal environments | |
| JP5095604B2 (ja) | 導電性接触子ユニット | |
| TW200905204A (en) | Probe assembly for probe card | |
| TW200848749A (en) | Probe card | |
| WO2008013273A1 (en) | Socket for inspection | |
| TWI351524B (en) | Apparatus for planarizing a probe card and method | |
| EP1742073A1 (en) | Electric connecting device | |
| JP3976276B2 (ja) | 検査装置 | |
| TW200811443A (en) | Vertical probing apparatus | |
| TW200827731A (en) | Electrical connecting apparatus and method for use thereof | |
| JP2004053409A (ja) | プローブカード | |
| CN112666492B (zh) | 杠杆式测试导通装置 | |
| TWI250284B (en) | Contactor probe and electric probe unit | |
| JP2005127752A (ja) | チップ型電子部品の特性測定装置 | |
| KR100771476B1 (ko) | 전기적 접속장치 |