200809162 九、發明說明： 【發明所屬之技術領域】 本發明係隸屬一種光學檢測之校正技術，具體而 言係指一種可快速檢測印刷電路板鑽孔孔位之可準確 才父正印刷電路板偵測孔位的檢測裝置及其方法。 【發明之先前技術】200809162 IX. INSTRUCTIONS: [Technical field of invention] The present invention belongs to a correction technique for optical detection, and specifically refers to an accurate detection of the hole position of a printed circuit board. A device for detecting a hole position and a method thereof. [Prior Art of the Invention]
10 1510 15
20 、按，受到電子科技及精密加工技術發展的影響， 為了因應電子組件微細化的趨勢，印刷電路板上二帝 路與接點鑽孔的孔徑大小也越來越細小，而其對孔= 準確度的要求也越來越高，傳統上印刷電路板對於鑽 ^的檢測主要有二：其—係利用⑽圖點或鐵孔加工 上之位置進行檢測，以逐孔移動的CCD相機去逐 里測，此種方式雖可量測孔位、孔徑及孔數，但因 /、係逐孔檢測，因此其檢測的速度極為緩慢；豆二係 =光學掃_，透過其置板平台可載送印刷電路板 與橫向位移的運轉方式，配合事先载入之印 路板鑽孔資料，而能快速的檢測出孔數與孔徑， 但由於其定位性不佳，因此無法騎隸與鑽孔毛 、扭曲的檢測。 為了解決前述傳統檢測設備的問題 ::公告第4細號之「可偵測印刷電路板上 度；裝置及其方法」，該專利前案提供-種檢 ^ ' /、係①先设定起始掃瞄點及固定區間、②設 =了-區間起始掃瞒點、③判斷是否為最後一區間， 右疋則執行下—步驟1否則重複前-步驟、④結束 25 200809162 掃瞄；而其中步驟②則可分別為取得跨區間邊緣上鑽 孔與區間邊緣之距離最大者加上一預設之安全距離、 又或取得該印刷電路板中最大孔徑加上一預設之安全 距離’以形成一重豐區域，如此在母次檢測時即可以 5 固定檢測區間減去該重豐區域，以做為下· 區間之起 始掃瞄點，如此即可避免發生鑽孔適位於檢測區間邊 緣，而無法有效檢測的問題。 但前述的專利前案僅能用於預防偵測遺漏的問題 ，對於光學檢測單元或置板平台移位時所產生的機械 10 誤差，以及光學檢測單元所產生的影像誤差，並無法 進行補償與校正，換言之，在目前印刷電路板對於鑽 孔之孔位精密度要求日益提高的狀況，並未提供有效 的解決方案，因此本發明之主要目的即在於探討如何 準確的校正印刷電路板上之鑽孔孔位偵測因影像誤差 15 或機械誤差的檢測值。 有鑑於此，本發明人乃藉由多年從事相關產業之 研發與製造經驗，針對前述現#印刷電路板之孔位量 測所面臨的問題深入探討，並積極尋求解決之道，經 過長期努力之研究與發展，終於成功的開發出一種可 20 校正印刷電路板偵測孔位之檢測裝置及其方法，以克 服以往之偵測誤差及無法進行孔位偵測的問題。 【發明内容】 因此，本發明之主要目的係在提供一種可校正印刷 電路板偵測孔位之檢測裝置及其檢測方法，藉以提升其 25 偵測孔位的準確度。 200809162 為此，本發明主要係透過下列的技術手段，來具體 實現前述的目的與效能；其包含有： 一機台，機台上設有一框體及一可前後滑移之置板 平台，其中框體上設有一光學尺； 5 一光學檢測單元，該可上、下對焦之光學檢測單元 可於框體上左、右滑移； 一平台定位單元，該平台定位單元係設於置板平台 端緣，其分別設有複數背板，且背板係呈間隔設置，相 鄰背板之寬度小於光學檢測單元每一掃瞄區間之寬度， 10 再者背板上形成有複數等距之對位孔； 藉此，透過前述技術手段的展現，可讓本發明藉由 參考光學尺檢測之區間掃瞄起始點距離與對位孔距離 的計算取得機械與影像的誤差值，進而得到校正孔位 距離之補償值，大幅增進其檢測的準確度，而能用於 15 快速且準確的檢測印刷電路板之孔位，而能增加其附 加價值，進一步可增進其經濟效益。 為使貴審查委員能進一步了解本發明的構成、特 徵及其他目的，以下乃舉本發明之若干較佳實施例，並 配合圖式詳細說明如后，同時讓熟悉該項技術領域者能 20 夠具體實施，惟以下所述者，僅在於說明本發明之較佳 實施例，並非用以限制本發明之範圍，故凡有以本發明 之精神為基礎，而為本發明任何形式之修飾或變更，皆 仍應屬於本發明意圖保護之範疇。 【實施方式】 200809162 本發明係一種可校正印刷電路板上鑽孔位置之偵測 值的偵測裝置及其方法，如第-圖所示，該偵測裝置主 要係於一機台（10)中段兩侧間跨設有一门形框體（20 i、’ ί框體（20)上設有一可左、右滑移【X軸】之光學 才双測單7L (30) ’且機台（1〇)頂面於框體（2〇)範圍 内設有一承載印刷電路板（60)之置板平台（40)，該 置板平台（40)並可相對光學檢測單元（3〇)前、後滑 移【Υ軸】； _ ^於本發明檢測裝置特徵之詳細構成，則請配合 10 苓看第一、二及三圖所示，框體（20)上設有一可量測 光學檢測單元（30)移動距離之光學尺（25)，再者可 上、下對焦之光學檢測單元（3〇)具有一光源接收器（ 31)，並於光源接收器（31)下方設有一倍率鏡頭（32 \，且於倍率鏡頭（32)上套設有一聚焦框架（35)， 15 ♦焦框架（35)上於倍率鏡頭（32)兩側分設有一光源 發射裔（36) ’該兩光源發射器（36)之光源可聚焦於 _ 置板平台（40)上之印刷電路板（60)表面，並反射經 倍率鏡頭（32)後由光源接收器（31)接收； 再者，置板平台（40)於端緣設有一平台定位單元 2〇 (50)，平台定位單元（50)係由複數對應之背板（51 )所組成，其中背板（51)係呈間隔設置，且相鄰背板 (51)之間距小於光學檢測單元（3〇)之每一檢測區間 寬度，再者背板（51)上形成有複數等距之對位孔（55 )，以供反饋定位之參考用； 25 藉此，透過框體（20)光學尺（25)能準確量測光 200809162 學檢測單元（30)移動距離，以及配合置板平台（40) 之平台定位單元（50)的對位孔（55)的定值回饋，而 能有效的補償校正其量測值，而組構成一可準確校正機 械誤差與影像誤差的可校正印刷電路板偵測孔位之檢測 5 裝置者。 而關於本發明之實際運用則係如第一、四圖所示， 當光學檢測單元（30)之兩光源發射器（36)對置板平 台（40)上之印刷電路板（60)投射光源，兩光源適可 於印刷電路板（60)表面聚焦、且向上反射，而經光學 ίο 檢測單元（30)之倍率鏡頭（32)後，由光源接收器（ 31)接收，同時配合印刷電路板（60)上鑽孔之圖像、 光學尺（25)檢測的區間掃瞄起始點移動距離及對位孔 (55)的圖像之相對位置與距離，再經電腦運算後，可 計算出鑽孔的孔位，同時進行機械誤差與影像誤差的校 15 正補償，而得到正碟的量測值，大幅提升其量測的速度 與準確性。 至於其校正補償方法係當光學檢測單元（30)可橫 向移動時【如第四、五及六圖所示】，光學尺（25)量 測光學檢測單元（30)每一偵測區間掃瞄起始點之移動 20 .距離為【Kl〜Kn-l】； 其中如第四、五及六圖所示，當光學檢測單元（30 )可橫向移動時，光學檢測單元（30)每一掃瞄區間寬 度為W ’相鄰知目苗區間並有一固定之重豐區域’該重豐 區域等於印刷電路板（60 )中已知最大徑之鑽孔直徑， 故下一掃瞄區間之掃瞄起始點為上一掃瞄區間寬度減去 9 25 200809162 該重疊區域； 點相對第—(25)量測第二掃瞄區間之掃瞄起始 類推由光學區間：晦起始點的移動距離為L，依此 對第二掃晦區間掃二掃猫起始點相 尺⑵）量難技 夕動距離為K2，而由光學 猫區間掃目苗起^ 區間之掃目苗起始點相對第η-ι掃 ^始4的移動距離為Kn-丨； 二掃瞄則单元(3〇)第-次掃瞄時，於第-、 位孔（55) ί疊區域之平台定位單元（5G)中預定對 間掃晦起〜由ί光學檢測單元（3Q)對應第一掃晦區 此類：由二二前述對位孔（55)的影像距離為，依 始點am (55)至對應第二掃晦區間掃瞒起 15 _ 20 )福測正相影像輯為&，*光學檢測單元（3。 至斟處#弟η-1、n掃瞄區間的重疊區域之對位孔（55) 離為ίΐ弟.ηι掃目㈣間伽起始點為經校正後的影像距 _ 者當光學檢測單元（30)進行第二次掃瞄時， 瞄區間之掃瞄起始點至位於前述第-、二掃瞄區間 璺區域之對位孔（55)的影像距離為Μ!，依此頬推由 光學檢測單元（30)偵測之第二、三掃瞄區間的重疊區 域之對位孔（55)至對應第三掃瞄區間掃瞄起始點的影 像距離為Μ2 ’由光學檢測單元（30)偵測之第n—丨、η $ 瞄區間的重疊區域之對位孔（55)至對應第η掃瞄區= 掃瞄起始點的影像距離為Μη ; " 25 200809162 因此當第一次掃瞄時，— 域内的對位孔（55)孔、、於第一、二掃瞄區間重疊區 二次掃胳日寺，其孔位為，而該對位孔（55)在第 520, according to the influence of the development of electronic technology and precision processing technology, in order to cope with the trend of miniaturization of electronic components, the aperture size of the second emperor and the contact hole on the printed circuit board is also smaller and smaller, and its pair of holes = The accuracy requirements are also getting higher and higher. Traditionally, there are two main types of printed circuit boards for the detection of drills: they are detected by (10) the position of the dots or the processing of the iron holes, and the CCD cameras are moved by the holes. In the measurement, although this method can measure the hole position, the aperture and the number of holes, the detection speed is extremely slow because of the /, and the detection speed is very slow; the bean second system = optical scan _, can be carried through the plate platform The printed circuit board and the lateral displacement operation mode can be used to quickly detect the number of holes and the aperture with the pre-loaded printed circuit board drilling data. However, due to its poor positioning, it is impossible to ride and drill the hair. Distorted detection. In order to solve the above problems of the conventional detecting device:: Announcement No. 4, "Detectable printed circuit board degree; device and method thereof", the patent pre-file provides - type test ^ /, system 1 is set first Start scan point and fixed interval, 2 set = - interval start broom point, 3 determine whether it is the last interval, right 疋 execute next - step 1 otherwise repeat before - step, 4 end 25 200809162 scan; Step 2 can be obtained by adding a preset safety distance to the largest distance between the hole on the edge of the interval and the edge of the interval, or obtaining the maximum aperture in the printed circuit board plus a preset safety distance. Forming a heavy abundance area, so that in the parental detection, the fixed detection interval can be subtracted from the weighted area as the starting scanning point of the lower interval, so that the drilling is prevented from being located at the edge of the detection interval. Problems that cannot be detected effectively. However, the aforementioned patent case can only be used to prevent the detection of missing problems. The mechanical 10 error caused by the displacement of the optical detection unit or the platen platform, and the image error generated by the optical detection unit cannot be compensated. Correction, in other words, does not provide an effective solution to the current situation that the precision requirements of the printed circuit board for drilling holes are increasing, so the main purpose of the present invention is to explore how to accurately correct the drill on the printed circuit board. The hole position is detected due to an image error of 15 or a mechanical error. In view of this, the inventors have intensively explored the problems faced by the above-mentioned current printed circuit board hole measurement by actively conducting R&D and manufacturing experience of related industries for many years, and actively sought solutions, after long-term efforts. Research and development have finally succeeded in developing a detection device and method for correcting the detection hole position of a printed circuit board, thereby overcoming the problems of detection errors and the inability to perform hole detection. SUMMARY OF THE INVENTION Accordingly, it is a primary object of the present invention to provide a detection apparatus and a detection method thereof for correcting a detection hole position of a printed circuit board, thereby improving the accuracy of detecting 25 hole positions. For this reason, the present invention mainly implements the foregoing objects and effects through the following technical means; the method includes: a machine platform having a frame body and a front and rear sliding plate platform, wherein An optical ruler is disposed on the frame; 5 an optical detecting unit, the optical detecting unit capable of focusing up and down can slide left and right on the frame; a platform positioning unit, the platform positioning unit is disposed on the plate platform The edge is respectively provided with a plurality of back plates, and the back plates are arranged at intervals, the width of the adjacent back plates is smaller than the width of each scanning interval of the optical detecting unit, and 10 is formed by a plurality of equidistant alignments on the back plate. Therefore, through the display of the foregoing technical means, the present invention can obtain the error value of the mechanical and image by calculating the distance between the scanning starting point distance and the matching hole distance detected by the reference optical ruler, thereby obtaining the corrected hole position. The compensation value of the distance greatly improves the accuracy of the detection, and can be used for 15 fast and accurate detection of the hole position of the printed circuit board, thereby increasing the added value and further enhancing the economy. Benefits. In order to make the present invention a better understanding of the composition, features and other objects of the present invention, the following are a few preferred embodiments of the present invention, and the detailed description of the present invention is as follows, and at the same time, it is sufficient for those skilled in the art to reach 20 The following is a description of the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention. All should still fall within the scope of the intended protection of the present invention. [Embodiment] 200809162 The present invention is a detecting device and method for correcting a detected value of a drilling position on a printed circuit board. As shown in the first figure, the detecting device is mainly used in a machine (10). There is a door frame between the two sides of the middle section (20 i, ' ί frame body (20) is provided with a left and right sliding [X axis] optical double test order 7L (30) 'and machine ( 1)) The top surface of the frame (2〇) is provided with a plate platform (40) carrying a printed circuit board (60), and the plate platform (40) is opposite to the optical detection unit (3〇), After the sliding structure [Υ axis]; _ ^ in the detailed configuration of the detection device of the present invention, please cooperate with 10 苓 to see the first, second and third figures, the frame (20) is provided with a measurable optical detection unit (30) An optical scale (25) for moving distance, and an optical detecting unit (3〇) capable of focusing up and down has a light source receiver (31), and a magnification lens is disposed under the light source receiver (31) ( 32 \, and a focusing frame (35) is arranged on the magnification lens (32), and 15 ♦ focal frame (35) is arranged on both sides of the magnification lens (32) Light Source Emitter (36) 'The light source of the two light source emitters (36) can be focused on the surface of the printed circuit board (60) on the plate platform (40) and reflected by the magnification lens (32) and then by the light source receiver (31) receiving; further, the plate platform (40) is provided with a platform positioning unit 2〇(50) at the end edge, and the platform positioning unit (50) is composed of a plurality of corresponding back plates (51), wherein the back plate (51) is arranged at intervals, and the distance between adjacent back plates (51) is smaller than the width of each detection interval of the optical detecting unit (3〇), and the complex plate is formed with complex equidistant alignment holes on the back plate (51). (55), for reference for feedback positioning; 25, through the frame (20) optical ruler (25) can accurately measure the moving distance of the 200809162 learning unit (30), and cooperate with the plate platform (40) The positioning of the alignment hole (55) of the platform positioning unit (50) can be effectively compensated for correcting the measured value, and the group constitutes a correctable printed circuit board detection capable of accurately correcting mechanical errors and image errors. The detection of the hole position is 5 devices. The practical application of the present invention is as the first and fourth As shown, when the two light source emitters (36) of the light source emitters (36) project a light source on the printed circuit board (60) on the opposite plate platform (40), the two light sources are adapted to focus on the surface of the printed circuit board (60). And upwardly reflected, and after receiving the magnification lens (32) of the optical unit (30), it is received by the light source receiver (31), and is matched with the image of the hole drilled on the printed circuit board (60), and the optical ruler (25) The detected scanning distance of the scanning starting point and the relative position and distance of the image of the registration hole (55), and then calculated by computer, the hole position of the drilling hole can be calculated, and the mechanical error and image error are corrected. 15 Positive compensation, and get the measured value of the positive disc, greatly improving the speed and accuracy of its measurement. As for the correction compensation method, when the optical detecting unit (30) can move laterally [as shown in the fourth, fifth and sixth figures], the optical measuring unit (25) measures the optical detecting unit (30) for each detecting interval scanning. The movement of the starting point is 20. The distance is [Kl~Kn-1]; wherein, as shown in the fourth, fifth and sixth figures, when the optical detecting unit (30) is laterally movable, each optical detecting unit (30) scans The width of the interval is W 'the adjacent eye-catching range and has a fixed heavy area' which is equal to the diameter of the hole of the known maximum diameter in the printed circuit board (60), so the scan start of the next scan interval The point is the width of the previous scan interval minus 9 25 200809162. The overlap area; the point relative to the (25) measurement of the second scan interval of the scan start analogy by the optical interval: 移动 the starting point of the moving distance is L, According to this, the second sweeping interval sweeps the starting point of the cat (2), and the distance is K2, and the starting point of the sweeping seedling from the optical cat interval is opposite to the first η- The movement distance of the first scan 4 is Kn-丨; the second scan is the unit (3〇), the first scan, at the first -, Bit hole (55) ί The area of the platform positioning unit (5G) in the stacking area is preset to the broom - by the ί optical detection unit (3Q) corresponding to the first broom area. This is made up of two or two of the aforementioned alignment holes (55) The image distance is from the starting point am (55) to the corresponding second broom interval broom 15 _ 20) The measured positive phase image is &, * optical detection unit (3. to 斟处#弟η- 1. The alignment hole (55) of the overlap region of the n scan interval is separated from the ΐ ΐ .. ηι scan (4) The starting point of the gamma is the corrected image distance _ when the optical detection unit (30) performs the second time During scanning, the image distance from the scanning start point of the aiming interval to the registration hole (55) located in the first and second scanning intervals is Μ!, and then the optical detecting unit (30) is detected. The image distance between the alignment hole (55) of the overlapping area of the second and third scanning sections to the scanning starting point of the third scanning section is Μ2 'the nth detected by the optical detecting unit (30)丨, η $ Alignment of the overlapping area of the alignment hole (55) to the corresponding η scan area = scan starting point of the image distance is Μη; " 25 200809162 So when the first time When aiming, - domain alignment hole (55) in the first hole,,, two secondary scan retrace interval overlapping region armpit day Temple, which is a hole, and the alignment hole (55) at its 5
10 1510 15
理論上同一定位孔卜 時的孔位距離應為Nl==Ki+M .之孔位在第—、二次掃瞄 Μι 0 ; 也就是說⑷ 但受到機械誤差盎旦，德上 生細微的正、負誤差，、㈣雙重影響下，其會產 補償值； 此適為第二次掃瞄區間的校正 因此當第 的孔位繼γ次掃目苗時’第二掃猫區間内之所有鑽孔 的Η巨_ χ2，而各鑽孔之校正孔位距In theory, the hole distance of the same positioning hole should be Nl==Ki+M. The hole position is in the first and second scans Μι 0; that is, (4) but the mechanical error is undone, and the German is subtle. Positive and negative errors, (4) under the double influence, it will produce compensation value; this is suitable for the correction of the second scanning interval. Therefore, when the first hole position is followed by γ times, the second sweeping cat interval The borehole is _ χ 2, and the corrected hole spacing of each hole
得到下列的公式： T J X2S=X2+ (Ni-Ki^Mi) 進步而έ，當第三次掃瞄時，第三掃瞄區間内之 所有鑽孔的孔位距離為χ3，而各鑽孔之校正孔位距離為 Xss時，可得到下列的公式： X3S=X3+ (N2—L — M2) 依此類推，當第n次掃瞄時，第n掃瞄區間内之所 有鑽孔的孔位距離為χη，而各鑽孔之校正孔位距離為Xns 時，可得到下列的公式··The following formula is obtained: TJ X2S=X2+ (Ni-Ki^Mi) Progressively, when the third scan is performed, the hole distance of all the holes in the third scan interval is χ3, and each hole is drilled. When the correction hole distance is Xss, the following formula can be obtained: X3S=X3+ (N2—L — M2) and so on, when the nth scan, the hole distance of all the holes in the nth scan interval For χη, and the correction hole distance of each hole is Xns, the following formula can be obtained··
XnS = Xn + ( Nn-1 ~ Kn~l — Μη-1 ) 綜上所述，本發明具有上述眾多的實用價值，因此 本發明確實為一新穎進步的創作，在相同的技術領域中 20 200809162 未見相同或近似的產品公開使用，故本發明已符合發明 專利的要件，乃依法提出申請，祈請早日賜准本案發明 專利。XnS = Xn + ( Nn-1 ~ Kn~l - Μη-1 ) In summary, the present invention has many of the above-mentioned practical values, and thus the present invention is indeed a novel and progressive creation, in the same technical field 20 200809162 The same or similar products are not disclosed for public use, so the invention has met the requirements of the invention patent, and is submitted in accordance with the law, praying for the early grant of the invention patent.
_ 12 200809162 【圖式簡單說明】 第一圖：係本發明檢测裝置之外觀示意圖。 第二圖：係本發明檢測裝置之局部放大示意圖，用以說明其 光學檢測單元之狀態及其相對關係。 5第三圖：係本發明檢測裝置之另一局部放大示意圖，其揭示 平台定位單元之狀態及其相關位置。 第四圖：係本發明正常檢測之路徑示意圖。 第五圖：係本發明之實際檢測示意圖。 φ 第六圖··係本發明實際檢测路徑之局部放大示意圖，其顯示 10 本發明之校正設定狀態。 【主要元件符號說明】 (10) 機台 (20) 框體 (25) 光學尺 (30) 光學檢測單元 (31) 光源接收器 (32) 倍率鏡頭 (35) 聚焦框架 (36) 光源發射器 (40) 置板平台 (50) 平台定位單元 (51) 背板 (55) 對位孔 (60) 印刷電路板 W 掃目苗區間寬度 X!〜χη 孔位距離 XlS 〜XnS 校正孔位距離 K1〜Κ η -1 掃瞄區間掃瞄起始點的移動距離 %〜1-1 經校正後之前區間掃瞄起始點至對位孔的影像 距離 Μ1〜Μ η - 1 次區間掃瞄起始點至對位孔之影像距離 13_ 12 200809162 [Simple description of the drawings] The first figure is a schematic view of the appearance of the detecting device of the present invention. Fig. 2 is a partially enlarged schematic view showing the state of the optical detecting unit of the present invention and its relative relationship. 5Third: Another partially enlarged schematic view of the detection device of the present invention, which reveals the state of the platform positioning unit and its associated position. The fourth figure is a schematic diagram of the path of the normal detection of the present invention. Fig. 5 is a schematic view showing the actual detection of the present invention. φ Fig. 6 is a partially enlarged schematic view of the actual detection path of the present invention, showing the calibration setting state of the present invention. [Main component symbol description] (10) Machine (20) Frame (25) Optical ruler (30) Optical detection unit (31) Light source receiver (32) Magnification lens (35) Focus frame (36) Light source transmitter ( 40) Platen platform (50) Platform positioning unit (51) Back plate (55) Alignment hole (60) Printed circuit board W Sweeping seedling interval width X!~χη Hole position distance XlS ~XnS Correction hole distance K1~ Κ η -1 Scanning range of scanning start point %~1-1 Image distance from the scanning start point to the registration hole before correction Μ1~Μ η - 1 interval scanning starting point Image distance to the alignment hole 13