TW200746486A - Method and apparatus for repairing wire of circuit board - Google Patents
Method and apparatus for repairing wire of circuit boardInfo
- Publication number
- TW200746486A TW200746486A TW096100031A TW96100031A TW200746486A TW 200746486 A TW200746486 A TW 200746486A TW 096100031 A TW096100031 A TW 096100031A TW 96100031 A TW96100031 A TW 96100031A TW 200746486 A TW200746486 A TW 200746486A
- Authority
- TW
- Taiwan
- Prior art keywords
- wire
- circuit board
- plasma
- gas
- particles
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0266—Marks, test patterns or identification means
- H05K1/0269—Marks, test patterns or identification means for visual or optical inspection
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/16—Inspection; Monitoring; Aligning
- H05K2203/161—Using chemical substances, e.g. colored or fluorescent, for facilitating optical or visual inspection
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nanotechnology (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Composite Materials (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Operations Research (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
To provide a method capable of easily repairing a wire of a wiring board by means of atmospheric plasma treatment. Fine metallic particles are supplied to a wire defective part of a circuit board to be repaired. Plasma gas from an atmospheric plasma generator employing oxidation gas as plasma generation gas is blown to the supplied particles. The blowing of the plasma gas applies annealing treatment to the metallic particles to integrate the particles with a wire.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006076738A JP4950532B2 (en) | 2006-03-20 | 2006-03-20 | Circuit board wiring repair method and apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200746486A true TW200746486A (en) | 2007-12-16 |
Family
ID=38632183
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW096100031A TW200746486A (en) | 2006-03-20 | 2007-01-02 | Method and apparatus for repairing wire of circuit board |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4950532B2 (en) |
KR (1) | KR100817567B1 (en) |
TW (1) | TW200746486A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010027660A (en) * | 2008-07-15 | 2010-02-04 | Micronics Japan Co Ltd | Method and apparatus for repairing wire of circuit board |
CN101646308B (en) * | 2008-08-05 | 2011-09-21 | 富葵精密组件(深圳)有限公司 | Circuit compensation system of circuit board and method for circuit compensation thereby |
KR101055507B1 (en) * | 2009-04-09 | 2011-08-08 | 삼성전기주식회사 | Repair structure and repair method of pattern part |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63139756A (en) * | 1986-12-02 | 1988-06-11 | Alps Electric Co Ltd | Manufacture of thermal head |
JP2677086B2 (en) * | 1991-11-22 | 1997-11-17 | 三菱電機株式会社 | Defect repair method for phase shift mask |
JP3312703B2 (en) * | 1993-04-15 | 2002-08-12 | 大日本印刷株式会社 | How to fix a phase shift photomask |
JPH09181319A (en) * | 1995-12-25 | 1997-07-11 | Kyocera Corp | Manufacture of thin film transistor |
JPH09321413A (en) * | 1996-05-30 | 1997-12-12 | Hitachi Ltd | Correction method of wiring on electronic circuit board and device therefor |
JPH10270843A (en) * | 1997-03-28 | 1998-10-09 | Vacuum Metallurgical Co Ltd | Method and device for repairing conductive pattern |
JPH11145148A (en) * | 1997-11-06 | 1999-05-28 | Tdk Corp | Apparatus and method for heat plasma annealing |
CN1286349C (en) * | 2002-02-20 | 2006-11-22 | 松下电工株式会社 | Plasma processing device and plasma processing method |
JP4932150B2 (en) * | 2003-10-21 | 2012-05-16 | 株式会社半導体エネルギー研究所 | Manufacturing method of semiconductor element |
-
2006
- 2006-03-20 JP JP2006076738A patent/JP4950532B2/en not_active Expired - Fee Related
-
2007
- 2007-01-02 TW TW096100031A patent/TW200746486A/en unknown
- 2007-01-19 KR KR1020070006010A patent/KR100817567B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR100817567B1 (en) | 2008-03-27 |
JP2007258213A (en) | 2007-10-04 |
KR20070095183A (en) | 2007-09-28 |
JP4950532B2 (en) | 2012-06-13 |
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