TW200741373A - Exposure apparatus and device production method - Google Patents

Exposure apparatus and device production method

Info

Publication number
TW200741373A
TW200741373A TW096109034A TW96109034A TW200741373A TW 200741373 A TW200741373 A TW 200741373A TW 096109034 A TW096109034 A TW 096109034A TW 96109034 A TW96109034 A TW 96109034A TW 200741373 A TW200741373 A TW 200741373A
Authority
TW
Taiwan
Prior art keywords
light beams
exposure
exposure apparatus
exposure light
production method
Prior art date
Application number
TW096109034A
Other languages
English (en)
Inventor
Hiroyuki Nagasaka
Original Assignee
Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of TW200741373A publication Critical patent/TW200741373A/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B27/00—Photographic printing apparatus
    • G03B27/32—Projection printing apparatus, e.g. enlarger, copying camera
    • G03B27/42—Projection printing apparatus, e.g. enlarger, copying camera for automatic sequential copying of the same original
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70283—Mask effects on the imaging process
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
    • G03F7/70466—Multiple exposures, e.g. combination of fine and coarse exposures, double patterning or multiple exposures for printing a single feature
TW096109034A 2006-03-17 2007-03-16 Exposure apparatus and device production method TW200741373A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006074243 2006-03-17

Publications (1)

Publication Number Publication Date
TW200741373A true TW200741373A (en) 2007-11-01

Family

ID=38517419

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096109034A TW200741373A (en) 2006-03-17 2007-03-16 Exposure apparatus and device production method

Country Status (6)

Country Link
US (1) US8982322B2 (zh)
EP (1) EP2003682A1 (zh)
JP (1) JPWO2007108414A1 (zh)
KR (1) KR20090004905A (zh)
TW (1) TW200741373A (zh)
WO (1) WO2007108414A1 (zh)

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EP2009678A4 (en) * 2006-04-17 2011-04-06 Nikon Corp OPTICAL LIGHTING DEVICE, EXPOSURE DEVICE AND COMPONENT MANUFACTURING METHOD
KR101399768B1 (ko) * 2006-12-28 2014-05-27 칼 짜이스 에스엠티 게엠베하 기울어진 편향 미러를 갖는 반사굴절식 투영 대물렌즈, 투영 노광 장치, 투영 노광 방법 및 미러
US8665418B2 (en) * 2007-04-18 2014-03-04 Nikon Corporation Projection optical system, exposure apparatus, and device manufacturing method
US20090303454A1 (en) * 2008-06-10 2009-12-10 Nikon Corporation Exposure apparatus with a scanning illumination beam
US8736813B2 (en) * 2008-08-26 2014-05-27 Nikon Corporation Exposure apparatus with an illumination system generating multiple illumination beams
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US20100091257A1 (en) * 2008-10-10 2010-04-15 Nikon Corporation Optical Imaging System and Method for Imaging Up to Four Reticles to a Single Imaging Location
US20100123883A1 (en) * 2008-11-17 2010-05-20 Nikon Corporation Projection optical system, exposure apparatus, and device manufacturing method
KR101215094B1 (ko) 2010-10-25 2012-12-24 삼성전자주식회사 피측정체 정렬장치

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Also Published As

Publication number Publication date
WO2007108414A1 (ja) 2007-09-27
KR20090004905A (ko) 2009-01-12
US8982322B2 (en) 2015-03-17
JPWO2007108414A1 (ja) 2009-08-06
EP2003682A1 (en) 2008-12-17
US20070216884A1 (en) 2007-09-20

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