TW200737389A - Measuring a damaged structure formed on a wafer using optical metrology - Google Patents

Measuring a damaged structure formed on a wafer using optical metrology

Info

Publication number
TW200737389A
TW200737389A TW096110545A TW96110545A TW200737389A TW 200737389 A TW200737389 A TW 200737389A TW 096110545 A TW096110545 A TW 096110545A TW 96110545 A TW96110545 A TW 96110545A TW 200737389 A TW200737389 A TW 200737389A
Authority
TW
Taiwan
Prior art keywords
damaged
diffraction signal
periodic structure
measuring
optical metrology
Prior art date
Application number
TW096110545A
Other languages
English (en)
Other versions
TWI342595B (en
Inventor
Kevin Lally
Merritt Funk
Radha Sundararajan
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of TW200737389A publication Critical patent/TW200737389A/zh
Application granted granted Critical
Publication of TWI342595B publication Critical patent/TWI342595B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4788—Diffraction
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW096110545A 2006-03-30 2007-03-27 Measuring a damaged structure formed on a wafer using optical metrology TWI342595B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/396,214 US7324193B2 (en) 2006-03-30 2006-03-30 Measuring a damaged structure formed on a wafer using optical metrology

Publications (2)

Publication Number Publication Date
TW200737389A true TW200737389A (en) 2007-10-01
TWI342595B TWI342595B (en) 2011-05-21

Family

ID=38558385

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096110545A TWI342595B (en) 2006-03-30 2007-03-27 Measuring a damaged structure formed on a wafer using optical metrology

Country Status (6)

Country Link
US (2) US7324193B2 (zh)
JP (1) JP5137942B2 (zh)
KR (1) KR101281264B1 (zh)
CN (1) CN101416043B (zh)
TW (1) TWI342595B (zh)
WO (1) WO2007117434A2 (zh)

Cited By (2)

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TWI476366B (zh) * 2011-04-22 2015-03-11 Nanometrics Inc 使用縮減程式庫之薄膜及表面形狀量測
TWI768046B (zh) * 2017-05-22 2022-06-21 美商克萊譚克公司 用於配方最佳化及量測之區域分析

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US7324193B2 (en) * 2006-03-30 2008-01-29 Tokyo Electron Limited Measuring a damaged structure formed on a wafer using optical metrology
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI476366B (zh) * 2011-04-22 2015-03-11 Nanometrics Inc 使用縮減程式庫之薄膜及表面形狀量測
TWI768046B (zh) * 2017-05-22 2022-06-21 美商克萊譚克公司 用於配方最佳化及量測之區域分析

Also Published As

Publication number Publication date
JP2009532869A (ja) 2009-09-10
US20070229807A1 (en) 2007-10-04
JP5137942B2 (ja) 2013-02-06
US20080137078A1 (en) 2008-06-12
WO2007117434A3 (en) 2008-04-24
CN101416043B (zh) 2011-01-26
TWI342595B (en) 2011-05-21
US7324193B2 (en) 2008-01-29
KR20090005122A (ko) 2009-01-12
WO2007117434A2 (en) 2007-10-18
CN101416043A (zh) 2009-04-22
KR101281264B1 (ko) 2013-07-03

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