GB2383848A - Method for evaluating creep lifetime - Google Patents
Method for evaluating creep lifetimeInfo
- Publication number
- GB2383848A GB2383848A GB0303077A GB0303077A GB2383848A GB 2383848 A GB2383848 A GB 2383848A GB 0303077 A GB0303077 A GB 0303077A GB 0303077 A GB0303077 A GB 0303077A GB 2383848 A GB2383848 A GB 2383848A
- Authority
- GB
- United Kingdom
- Prior art keywords
- creep
- maximum value
- actual machine
- microscope
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/20—Metals
- G01N33/204—Structure thereof, e.g. crystal structure
- G01N33/2045—Defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/0069—Fatigue, creep, strain-stress relations or elastic constants
- G01N2203/0071—Creep
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/02—Details not specific for a particular testing method
- G01N2203/0202—Control of the test
- G01N2203/0212—Theories, calculations
- G01N2203/0218—Calculations based on experimental data
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biochemistry (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Investigating And Analyzing Materials By Characteristic Methods (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
A part where a creep void is recognized is observed at an arbitrary magnification by a scanning electron microscope, an optical microscope, and a laser microscope, and the maximum value of creep void crystal grain boundary occupancy is measured in the field of view. The maximum value is applied to a master curve corrected from the results of a test of simulating an actual machine and a test piece of actual machine size, taking account of internal damage of the machine. Thus the creep lifetime consumption rate of a member is estimated easily with high accuracy.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2000/005470 WO2002014835A1 (en) | 2000-08-16 | 2000-08-16 | Method for evaluating creep lifetime |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0303077D0 GB0303077D0 (en) | 2003-03-19 |
GB2383848A true GB2383848A (en) | 2003-07-09 |
GB2383848B GB2383848B (en) | 2004-07-28 |
Family
ID=11736358
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0303077A Expired - Lifetime GB2383848B (en) | 2000-08-16 | 2000-08-16 | Creep life evaluation method |
Country Status (5)
Country | Link |
---|---|
US (1) | US6810748B1 (en) |
JP (1) | JP4464043B2 (en) |
DE (1) | DE10085483T1 (en) |
GB (1) | GB2383848B (en) |
WO (1) | WO2002014835A1 (en) |
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3643806B2 (en) * | 2001-09-28 | 2005-04-27 | 三菱重工業株式会社 | High-accuracy creep damage evaluation method |
US7168327B2 (en) * | 2003-04-28 | 2007-01-30 | Harrell Jr E Ray | Method of prediction of in-vivo polymer performance by external experimentation |
WO2005124314A1 (en) * | 2004-06-21 | 2005-12-29 | The Chugoku Electric Power Co., Inc. | Method of evaluating creep life expectancy or life span |
JP4054834B2 (en) * | 2004-06-21 | 2008-03-05 | 中国電力株式会社 | Comprehensive evaluation method of creep remaining life |
JP4618061B2 (en) * | 2005-09-06 | 2011-01-26 | 株式会社Ihi | Creep rupture life evaluation method |
US20070276627A1 (en) * | 2006-05-25 | 2007-11-29 | Westerman Everett A | Repair determination for heat damaged composite structures |
US7715991B2 (en) * | 2007-05-17 | 2010-05-11 | General Electric Company | Systems and methods for monitoring energy system components |
JP5090142B2 (en) * | 2007-11-28 | 2012-12-05 | ポリプラスチックス株式会社 | Prediction method for brittle creep rupture remaining life of molded parts |
JP4979563B2 (en) * | 2007-12-13 | 2012-07-18 | 中国電力株式会社 | Creep life evaluation method |
GB0821168D0 (en) | 2008-11-19 | 2008-12-24 | Univ Nottingham | Specimen creep test and methods of using such tests |
AU2011253711B2 (en) * | 2009-03-19 | 2012-06-14 | Mitsubishi Power, Ltd. | Method for assessing remaining lifespan of bolt used at high temperatures |
JP4750868B2 (en) * | 2009-03-19 | 2011-08-17 | 株式会社日立製作所 | Remaining life diagnosis method for bolts used at high temperatures |
JP4979730B2 (en) * | 2009-03-24 | 2012-07-18 | 中国電力株式会社 | Creep damage evaluation method |
JP5492057B2 (en) * | 2010-11-18 | 2014-05-14 | バブコック日立株式会社 | Damage prediction method for heat-resistant steel welds |
JP5931381B2 (en) * | 2011-09-13 | 2016-06-08 | 三菱日立パワーシステムズ株式会社 | Damage evaluation method and maintenance evaluation index formulation method |
US20150323432A1 (en) * | 2014-05-09 | 2015-11-12 | Balhassn S. M. Ali | Pin loaded small one-bar specimen (OBS) |
US20150377757A1 (en) * | 2014-06-30 | 2015-12-31 | Balhassn S. M. Ali | Small Two bar specimen (TBS) |
ES2817932T3 (en) * | 2014-10-01 | 2021-04-08 | Chugoku Electric Power | Remaining Life Estimation Procedure for Estimating Remaining Life of High Chromium Steel Pipe |
MX359799B (en) * | 2015-01-15 | 2018-10-10 | Mitsubishi Hitachi Power Sys | Method for extending life of high-temperature piping and life-extending structure for high-temperature piping. |
JP6564231B2 (en) * | 2015-04-23 | 2019-08-21 | 日立Geニュークリア・エナジー株式会社 | Damage evaluation method for members, creep damage evaluation method, and damage evaluation system |
KR102047065B1 (en) | 2017-05-19 | 2019-11-21 | 중앙대학교 산학협력단 | Estimation Apparatus and Method of Creep Crack Rate and Relevant Growth Fracture Parameters for Small Punch Specimen with a Micro Groove |
CN112730065B (en) * | 2020-12-29 | 2022-04-26 | 北京航空航天大学 | Method for evaluating creep damage of dissimilar steel welded joint |
CN114544349B (en) * | 2022-02-25 | 2024-04-09 | 中国航空工业集团公司西安飞机设计研究所 | Structure and method for testing strength of airtight top plate connection structure of cabin of conveyor |
CN116050228B (en) * | 2023-03-31 | 2023-06-20 | 天津大学 | Creep life prediction method for P92 main steam pipeline welded joint |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53125888A (en) * | 1977-04-11 | 1978-11-02 | Babcock Hitachi Kk | Estimation method of life of reaction tube in chemical equipments |
JPH0499945A (en) * | 1990-08-20 | 1992-03-31 | Mitsubishi Heavy Ind Ltd | Method evaluating high temperature damage of heat resistant steel |
JPH04240552A (en) * | 1991-01-23 | 1992-08-27 | Nippon Steel Corp | Method for evaluating residual life of metal welding member under high temperature stress |
JP2000258306A (en) * | 1999-03-05 | 2000-09-22 | Chugoku Electric Power Co Inc:The | Evaluation technique for creep life by maximum void grain boundary occupation rate method |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4875170A (en) * | 1986-04-10 | 1989-10-17 | Hitachi, Ltd. | Method and apparatus for estimating life expectancy of mechanical structures |
GB2208000B (en) * | 1987-07-27 | 1991-07-31 | Mitsubishi Heavy Ind Ltd | Method of evaluating residual life of heat-resistant steel |
US5045283A (en) * | 1988-08-02 | 1991-09-03 | Jp Labs Inc. | Moving boundary device for monitoring shelf-life of a perishable product |
JP3643806B2 (en) * | 2001-09-28 | 2005-04-27 | 三菱重工業株式会社 | High-accuracy creep damage evaluation method |
-
2000
- 2000-08-16 JP JP2002519915A patent/JP4464043B2/en not_active Expired - Lifetime
- 2000-08-16 WO PCT/JP2000/005470 patent/WO2002014835A1/en active Application Filing
- 2000-08-16 GB GB0303077A patent/GB2383848B/en not_active Expired - Lifetime
- 2000-08-16 US US10/344,638 patent/US6810748B1/en not_active Expired - Lifetime
- 2000-08-16 DE DE10085483T patent/DE10085483T1/en not_active Ceased
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS53125888A (en) * | 1977-04-11 | 1978-11-02 | Babcock Hitachi Kk | Estimation method of life of reaction tube in chemical equipments |
JPH0499945A (en) * | 1990-08-20 | 1992-03-31 | Mitsubishi Heavy Ind Ltd | Method evaluating high temperature damage of heat resistant steel |
JPH04240552A (en) * | 1991-01-23 | 1992-08-27 | Nippon Steel Corp | Method for evaluating residual life of metal welding member under high temperature stress |
JP2000258306A (en) * | 1999-03-05 | 2000-09-22 | Chugoku Electric Power Co Inc:The | Evaluation technique for creep life by maximum void grain boundary occupation rate method |
Also Published As
Publication number | Publication date |
---|---|
WO2002014835A1 (en) | 2002-02-21 |
GB0303077D0 (en) | 2003-03-19 |
JP4464043B2 (en) | 2010-05-19 |
US6810748B1 (en) | 2004-11-02 |
GB2383848B (en) | 2004-07-28 |
DE10085483T1 (en) | 2003-07-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2383848A (en) | Method for evaluating creep lifetime | |
TW200737389A (en) | Measuring a damaged structure formed on a wafer using optical metrology | |
AU2003216997A1 (en) | Dynamic artefact comparison | |
EP1509796A4 (en) | Laser production and product qualification via accelerated life testing based on statistical modeling | |
DE50213222D1 (en) | Apparatus and method for a scanning probe microscope | |
GB0411072D0 (en) | Apparatus and method for performing in-vitro dnp-nmr measurements | |
WO2004047058A3 (en) | Method of improving the output uniformity of a display device | |
TW200508630A (en) | Method and equipment for inspecting electric characteristics of specimen | |
EP1898246A3 (en) | Microscope apparatus control method and microscope apparatus | |
MY134469A (en) | Stub having an optical fiber | |
IL183488A0 (en) | Method for testing the leakage rate of vacuum encapsulated devices | |
TW200641366A (en) | Apparatus, program, and method for substrate inspection | |
WO2002075334A3 (en) | Apparatus and method for measuring and probability estimating for clock skews | |
ATE506682T1 (en) | METHOD AND DEVICE FOR DETECTING HIGH PRESSURE CONDITIONS IN A VACUUM SWITCHING DEVICE | |
EP1359470A3 (en) | Management system and apparatus, method therefor, and device manufacturing method | |
EP1712916A4 (en) | Biological sample discrimination apparatus, biological sample discrimination method, and biological sample discrimination plate | |
AU2003270138A1 (en) | A method for measuring diffraction patterns from a transmission electron microscopy to determine crystal structures and a device therefor | |
EP1329703A3 (en) | Apparatus and method of measuring optical properties of diffractive optical element | |
MY131237A (en) | Process controls for improved wafer uniformity using integrated or standalone metrology | |
WO2004083980A3 (en) | Method of mitigating effects of component deflection in a probe card analyzer | |
EP1328048A3 (en) | Light-emitting element controller, optical transmitting apparatus, and method and computer program for determining driving current | |
AU2466902A (en) | Method for in vitro culture of ovarian follicles | |
TW200731047A (en) | Device and method for compensating for voltage drops | |
TW200520132A (en) | Method for using conductive atomic force microscopy to measure contact leakage current | |
WO2001059466A8 (en) | Testing arrangement and testing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PE20 | Patent expired after termination of 20 years |
Expiry date: 20200815 |