TW200736135A - Testing machine for integrated circuits - Google Patents
Testing machine for integrated circuitsInfo
- Publication number
- TW200736135A TW200736135A TW095109049A TW95109049A TW200736135A TW 200736135 A TW200736135 A TW 200736135A TW 095109049 A TW095109049 A TW 095109049A TW 95109049 A TW95109049 A TW 95109049A TW 200736135 A TW200736135 A TW 200736135A
- Authority
- TW
- Taiwan
- Prior art keywords
- integrated circuits
- carrying
- tested
- pick
- onto
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The present invention relates to a testing machine for integrated circuits, which comprises a first feeding means provided with at least one holding tray, wherein said at least holding tray is used to hold untested integrated circuits thereon; a passing means used to pick untested integrated circuits and then place them onto a first carrying means and a second carrying means, respectively; a testing means having a plurality of testing apparatus and pick-and-place mechanisms which are respectively arranged at back side of the first and the second carrying mechanism, wherein the respective pick-and-place mechanisms can place tested integrated circuits onto the first and the second carrying mechanism, respectively, and then pick other untested integrated circuits of the first and the second carrying mechanism onto the testing apparatus so as to have a testing process. In addition, the first and the second carrying means can transport tested integrated circuits to the passing means by which said tested integrated circuits can be picked out, then other untested integrated circuits will be placed onto the first and the second carrying means so as to be tested, also, the passing means will further transmit the tested integrated circuits to a second collection means for storage, thereby enabling to enhance the production efficiency.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95109049A TWI274029B (en) | 2006-03-16 | 2006-03-16 | Testing machine for integrated circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95109049A TWI274029B (en) | 2006-03-16 | 2006-03-16 | Testing machine for integrated circuits |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TWI274029B TWI274029B (en) | 2007-02-21 |
| TW200736135A true TW200736135A (en) | 2007-10-01 |
Family
ID=38623013
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95109049A TWI274029B (en) | 2006-03-16 | 2006-03-16 | Testing machine for integrated circuits |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TWI274029B (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102116831A (en) * | 2009-12-30 | 2011-07-06 | 上海允科自动化有限公司 | Integrated circuit (IC) detection device |
| TWI456220B (en) * | 2012-12-27 | 2014-10-11 | Chroma Ate Inc | Test apparatus with dry environment |
| CN103926480A (en) * | 2013-01-10 | 2014-07-16 | 致茂电子(苏州)有限公司 | Test machine table with dry environment |
-
2006
- 2006-03-16 TW TW95109049A patent/TWI274029B/en active
Also Published As
| Publication number | Publication date |
|---|---|
| TWI274029B (en) | 2007-02-21 |
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