TW200734664A - Test equipment and pin-electronic card - Google Patents

Test equipment and pin-electronic card

Info

Publication number
TW200734664A
TW200734664A TW095147026A TW95147026A TW200734664A TW 200734664 A TW200734664 A TW 200734664A TW 095147026 A TW095147026 A TW 095147026A TW 95147026 A TW95147026 A TW 95147026A TW 200734664 A TW200734664 A TW 200734664A
Authority
TW
Taiwan
Prior art keywords
dut
transmitting path
test equipment
comparator
pin
Prior art date
Application number
TW095147026A
Other languages
English (en)
Inventor
Naoki Matsumoto
Takashi Sekino
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200734664A publication Critical patent/TW200734664A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW095147026A 2005-12-15 2006-12-15 Test equipment and pin-electronic card TW200734664A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005361920 2005-12-15

Publications (1)

Publication Number Publication Date
TW200734664A true TW200734664A (en) 2007-09-16

Family

ID=38162953

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095147026A TW200734664A (en) 2005-12-15 2006-12-15 Test equipment and pin-electronic card

Country Status (2)

Country Link
TW (1) TW200734664A (zh)
WO (1) WO2007069648A1 (zh)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6144372A (ja) * 1984-08-08 1986-03-04 Hitachi Ltd 論理ｌｓｉの試験装置
JP2897660B2 (ja) * 1994-10-07 1999-05-31 日本電気株式会社 半導体集積回路検査装置のテストパターンメモリの制御方式
JP2001074816A (ja) * 1999-09-09 2001-03-23 Advantest Corp 半導体試験装置

Also Published As

Publication number Publication date
WO2007069648A1 (ja) 2007-06-21

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