TW200732294A - Cleaning liquid for chemical supply apparatus for semiconductor manufacturing - Google Patents
Cleaning liquid for chemical supply apparatus for semiconductor manufacturingInfo
- Publication number
- TW200732294A TW200732294A TW095142437A TW95142437A TW200732294A TW 200732294 A TW200732294 A TW 200732294A TW 095142437 A TW095142437 A TW 095142437A TW 95142437 A TW95142437 A TW 95142437A TW 200732294 A TW200732294 A TW 200732294A
- Authority
- TW
- Taiwan
- Prior art keywords
- supply apparatus
- semiconductor manufacturing
- chemical supply
- cleaning liquid
- cleaning
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/11—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers having cover layers or intermediate layers, e.g. subbing layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005332193 | 2005-11-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200732294A true TW200732294A (en) | 2007-09-01 |
Family
ID=38111741
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095142437A TW200732294A (en) | 2005-11-16 | 2006-11-16 | Cleaning liquid for chemical supply apparatus for semiconductor manufacturing |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR20070052205A (zh) |
CN (1) | CN1970715A (zh) |
TW (1) | TW200732294A (zh) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009147293A (ja) * | 2007-11-22 | 2009-07-02 | Renesas Technology Corp | 半導体装置の製造方法 |
JP6187778B2 (ja) * | 2012-07-19 | 2017-08-30 | 日産化学工業株式会社 | 半導体用洗浄液及びそれを用いた洗浄方法 |
KR102478194B1 (ko) * | 2017-06-26 | 2022-12-15 | 에이지씨 가부시키가이샤 | 진공 증착용의 마스크의 세정 방법 및 린스 조성물 |
-
2006
- 2006-11-15 KR KR1020060112539A patent/KR20070052205A/ko not_active Application Discontinuation
- 2006-11-16 CN CNA2006101467223A patent/CN1970715A/zh active Pending
- 2006-11-16 TW TW095142437A patent/TW200732294A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
KR20070052205A (ko) | 2007-05-21 |
CN1970715A (zh) | 2007-05-30 |
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