TW200726095A - Analog-to-digital converter operating under two different modes - Google Patents

Analog-to-digital converter operating under two different modes

Info

Publication number
TW200726095A
TW200726095A TW095121248A TW95121248A TW200726095A TW 200726095 A TW200726095 A TW 200726095A TW 095121248 A TW095121248 A TW 095121248A TW 95121248 A TW95121248 A TW 95121248A TW 200726095 A TW200726095 A TW 200726095A
Authority
TW
Taiwan
Prior art keywords
analog
digital converter
different modes
operating under
converter operating
Prior art date
Application number
TW095121248A
Other languages
English (en)
Other versions
TWI313104B (en
Inventor
Chao-Chi Yang
Chung-An Tang
Original Assignee
Elan Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elan Microelectronics Corp filed Critical Elan Microelectronics Corp
Publication of TW200726095A publication Critical patent/TW200726095A/zh
Application granted granted Critical
Publication of TWI313104B publication Critical patent/TWI313104B/zh

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1014—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H03M1/1019—Calibration at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error by storing a corrected or correction value in a digital look-up table
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
TW095121248A 2005-12-21 2006-06-14 Analog-to-digital converter operating under two different modes TWI313104B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/306,257 US7158070B1 (en) 2005-12-21 2005-12-21 Analog-to-digital converter capable of performing self-test

Publications (2)

Publication Number Publication Date
TW200726095A true TW200726095A (en) 2007-07-01
TWI313104B TWI313104B (en) 2009-08-01

Family

ID=37592309

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095121248A TWI313104B (en) 2005-12-21 2006-06-14 Analog-to-digital converter operating under two different modes

Country Status (3)

Country Link
US (1) US7158070B1 (zh)
CN (1) CN100499376C (zh)
TW (1) TWI313104B (zh)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI342125B (en) * 2006-12-29 2011-05-11 Elan Microelectronics Corp Signal converting apparatus with built-in self test
US7880650B2 (en) * 2008-09-30 2011-02-01 Freescale Semiconductor, Inc. Method and apparatus for testing data converter
US7868795B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Data conversion circuitry with an extra successive approximation step and method therefor
US7876254B2 (en) * 2008-09-30 2011-01-25 Freescale Semiconductor, Inc. Data conversion circuitry having successive approximation circuitry and method therefor
US7733258B2 (en) 2008-09-30 2010-06-08 Freescale Semiconductor, Inc. Data conversion circuitry for converting analog signals to digital signals and vice-versa and method therefor
US7868796B2 (en) * 2008-09-30 2011-01-11 Freescale Semiconductor, Inc. Self-calibrating data conversion circuitry and method therefor
US7944386B2 (en) * 2008-10-21 2011-05-17 Analog Devices, Inc. Apparatus for and method of performing an analog to digital conversion
US8106801B2 (en) * 2009-02-12 2012-01-31 Qualcomm, Incorporated Methods and apparatus for built in self test of analog-to-digital convertors
EP2288033B1 (en) * 2009-08-18 2014-12-31 STMicroelectronics Srl Successive approximation analog-to-digital converter
US8477052B2 (en) 2011-04-05 2013-07-02 Freescale Semiconductor, Inc. Method and apparatus for self-test of successive approximation register (SAR) A/D converter
US8686884B2 (en) * 2012-08-15 2014-04-01 International Business Machines Corporation Testing of digital to analog converters in serial interfaces
US8816892B2 (en) * 2012-09-19 2014-08-26 Forza Silicon Corporation Segmented column-parallel analog-to-digital converter
US8860599B1 (en) * 2013-06-06 2014-10-14 Mediatek Inc. Analog-to-digital conversion apparatus and method capable of achieving fast settling
US10121048B2 (en) * 2016-07-29 2018-11-06 Elan Microelectronics Corporation Operating method for a fingerprint sensing device and fingerprint sensing system
TWI650567B (zh) * 2018-01-04 2019-02-11 瑞昱半導體股份有限公司 應用於比較器之自我測試電路及自我測試方法
US10516408B2 (en) * 2018-03-08 2019-12-24 Analog Devices Global Unlimited Company Analog to digital converter stage
US10505561B2 (en) 2018-03-08 2019-12-10 Analog Devices Global Unlimited Company Method of applying a dither, and analog to digital converter operating in accordance with the method
US10511316B2 (en) 2018-03-08 2019-12-17 Analog Devices Global Unlimited Company Method of linearizing the transfer characteristic by dynamic element matching
US11206035B2 (en) 2019-03-13 2021-12-21 Texas Instruments Incorporated Analog to digital (A/D) converter with internal diagnostic circuit
US11101811B2 (en) * 2019-12-06 2021-08-24 Texas Instruments Incorporated Systems and methods for testing analog to digital (A/D) converter with built-in diagnostic circuit with user supplied variable input voltage
IT202100009269A1 (it) * 2021-04-13 2022-10-13 St Microelectronics Srl Circuito elettronico comprendente un convertitore da digitale ad analogico, procedimento per sottoporre a test un circuito elettronico comprendente un convertitore da digitale ad analogico, e relativo prodotto informatico

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3657218B2 (ja) * 2001-11-12 2005-06-08 Ｎｅｃマイクロシステム株式会社 差動入力ａ／ｄ変換器
US6828927B1 (en) * 2002-11-22 2004-12-07 Analog Devices, Inc. Successive approximation analog-to-digital converter with pre-loaded SAR registers
US6956512B1 (en) * 2003-01-24 2005-10-18 Altera Corporation Analog-to-digital converter for programmable logic

Also Published As

Publication number Publication date
TWI313104B (en) 2009-08-01
CN1988390A (zh) 2007-06-27
CN100499376C (zh) 2009-06-10
US7158070B1 (en) 2007-01-02

Similar Documents

Publication Publication Date Title
TW200726095A (en) Analog-to-digital converter operating under two different modes
US8717221B2 (en) Successive approximation register analog-to-digital converter
US8957794B2 (en) A/D converter and method for calibrating the same
WO2004095512A3 (en) Sample and hold circuits and methods with offset error correction and systems using the same
US7796077B2 (en) High speed high resolution ADC using successive approximation technique
US8497790B1 (en) Gain calibration
US20150029048A1 (en) Successive approximation register analog-to-digital converter and method of operating built-in self-test device for testing the converter
US20060284750A1 (en) Gain error correction in an analog-to-digital converter
US7944387B2 (en) ADC with low-power sampling
WO2010051244A3 (en) Method to digitize analog signals in a system utilizing dynamic analog test multiplexer for diagnostics
CN106888020A (zh) Dac开关失配误差的数字测量
CN106888018A (zh) Dac时序失配误差的数字测量
KR101419804B1 (ko) 아날로그 디지털 변환 장치
TW200718033A (en) Current steering digital-to-analog converter
JP2014175898A (ja) 半導体集積回路装置
AU2003233923A1 (en) Method and device for functionally testing an analog-to-digital converter, and a corresponding analog-to-digital converter
WO2006119303A3 (en) Apparatus and methods for measurement of analog voltages in an integrated circuit
CN101286961B (zh) 对设备输出的直流偏移进行校准的装置和方法
TWI644519B (zh) 類比數位轉換器裝置與待測訊號產生方法
TW200642289A (en) Signal converting apparatus for integrated analog-to-digital converter and digital-to-analog converter and integrator unit thereof
WO2006071635A3 (en) Using a parametric measurement unit for converter testing
US20180191362A1 (en) Pattern based estimation of errors in adc
US8284089B2 (en) Cyclic digital-to-analog converter (DAC) with capacitor swapping
US10326465B1 (en) Analog to digital converter device and method for generating testing signal
JP2005249690A5 (zh)