TW200723415A - TCP handling apparatus - Google Patents

TCP handling apparatus

Info

Publication number
TW200723415A
TW200723415A TW095130793A TW95130793A TW200723415A TW 200723415 A TW200723415 A TW 200723415A TW 095130793 A TW095130793 A TW 095130793A TW 95130793 A TW95130793 A TW 95130793A TW 200723415 A TW200723415 A TW 200723415A
Authority
TW
Taiwan
Prior art keywords
handling apparatus
tcp handling
retest
tcps
faulty
Prior art date
Application number
TW095130793A
Other languages
Chinese (zh)
Other versions
TWI321818B (en
Inventor
Takeshi Onishi
Hisashi Murano
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200723415A publication Critical patent/TW200723415A/en
Application granted granted Critical
Publication of TWI321818B publication Critical patent/TWI321818B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

A TCP handling apparatus (2) wherein when TCPs determined to be faulty in a first test are brought into contact, for use in a retest, with a probe (81) different from a probe (81) which was brought into contact with an external terminal when it was determined to be faulty, acceptable products can be picked up by the retest, the yielding of the TCPs can be increased, and the retest can be automatically performed without stopping the TCP handling apparatus (2). As a result, the throughput of the test can be increased.
TW095130793A 2005-08-25 2006-08-22 TCP handling apparatus TW200723415A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2005/015479 WO2007023556A1 (en) 2005-08-25 2005-08-25 Tcp handling apparatus

Publications (2)

Publication Number Publication Date
TW200723415A true TW200723415A (en) 2007-06-16
TWI321818B TWI321818B (en) 2010-03-11

Family

ID=37771314

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095130793A TW200723415A (en) 2005-08-25 2006-08-22 TCP handling apparatus

Country Status (3)

Country Link
JP (1) JP4829889B2 (en)
TW (1) TW200723415A (en)
WO (1) WO2007023556A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG146468A1 (en) * 2007-03-16 2008-10-30 Teradyne Asia Pte Ltd A material handler for devices on a reel
US8059547B2 (en) * 2008-12-08 2011-11-15 Advantest Corporation Test apparatus and test method
US8666691B2 (en) 2008-12-08 2014-03-04 Advantest Corporation Test apparatus and test method
JP5323621B2 (en) * 2009-09-09 2013-10-23 日置電機株式会社 Contact probe probing method and probing apparatus

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2512032B2 (en) * 1987-11-10 1996-07-03 東京エレクトロン株式会社 Inspection methods
JPH0262971A (en) * 1988-08-29 1990-03-02 Teru Tohoku Kk Method for inspecting tape carrier
JP3191790B2 (en) * 1999-01-08 2001-07-23 日本電気株式会社 Handler with search function
JP2001099891A (en) * 1999-09-28 2001-04-13 Ando Electric Co Ltd Autohandler for tab and processing method thereof
JP2004271428A (en) * 2003-03-11 2004-09-30 Matsushita Electric Ind Co Ltd Test system for multi chip module, and manufacturing method therefor
DE60318124T2 (en) * 2003-06-04 2008-12-04 Advantest Corp. DEVICE FOR HANDLING ELECTRONIC COMPONENTS AND METHOD FOR TEMPERATURE APPLICATION IN A HANDLING DEVICE FOR ELECTRONIC COMPONENTS

Also Published As

Publication number Publication date
WO2007023556A1 (en) 2007-03-01
JP4829889B2 (en) 2011-12-07
TWI321818B (en) 2010-03-11
JPWO2007023556A1 (en) 2009-02-26

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees