TW200721186A - Output circuit, semiconductor memory device having the same, and method of expanding a valid output data window - Google Patents

Output circuit, semiconductor memory device having the same, and method of expanding a valid output data window

Info

Publication number
TW200721186A
TW200721186A TW095143312A TW95143312A TW200721186A TW 200721186 A TW200721186 A TW 200721186A TW 095143312 A TW095143312 A TW 095143312A TW 95143312 A TW95143312 A TW 95143312A TW 200721186 A TW200721186 A TW 200721186A
Authority
TW
Taiwan
Prior art keywords
bits
output circuit
memory device
semiconductor memory
read data
Prior art date
Application number
TW095143312A
Other languages
English (en)
Inventor
Woo-Jin Lee
Hyun-Dong Kim
Seong-Jin Jang
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of TW200721186A publication Critical patent/TW200721186A/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/12015—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising clock generation or timing circuitry
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/14—Implementation of control logic, e.g. test mode decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1069—I/O lines read out arrangements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
TW095143312A 2005-11-25 2006-11-23 Output circuit, semiconductor memory device having the same, and method of expanding a valid output data window TW200721186A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050113327A KR100655379B1 (ko) 2005-11-25 2005-11-25 유효 출력 데이터 윈도우를 확장시킬 수 있는 출력회로,이를 구비한 반도체 메모리 장치, 및 유효 출력 데이터확장방법

Publications (1)

Publication Number Publication Date
TW200721186A true TW200721186A (en) 2007-06-01

Family

ID=37732569

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095143312A TW200721186A (en) 2005-11-25 2006-11-23 Output circuit, semiconductor memory device having the same, and method of expanding a valid output data window

Country Status (3)

Country Link
US (1) US7499341B2 (zh)
KR (1) KR100655379B1 (zh)
TW (1) TW200721186A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402683B (zh) * 2009-02-04 2013-07-21 Via Tech Inc 具有共享機制的資訊存取方法及其電腦系統

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100907927B1 (ko) * 2007-06-13 2009-07-16 주식회사 하이닉스반도체 반도체메모리소자 및 그의 구동방법
US7529962B1 (en) 2008-04-04 2009-05-05 International Business Machines Corporation System for expanding a window of valid data
KR101187642B1 (ko) * 2011-05-02 2012-10-08 에스케이하이닉스 주식회사 집적 회로의 모니터링 장치

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6275444B1 (en) * 1998-02-24 2001-08-14 Matsushita Electric Industrial Co., Ltd. Semiconductor integrated circuit
JP4540137B2 (ja) 1998-07-24 2010-09-08 ルネサスエレクトロニクス株式会社 同期型半導体記憶装置
JP2001319500A (ja) * 2000-05-10 2001-11-16 Mitsubishi Electric Corp 半導体集積回路装置
KR100543203B1 (ko) 2003-03-20 2006-01-20 주식회사 하이닉스반도체 유효 데이타 윈도우의 조절이 가능한 반도체 메모리장치의 데이타 출력 버퍼
KR20040105060A (ko) 2003-06-04 2004-12-14 삼성전자주식회사 유효 출력 데이터 윈도우（Ｖａｌｉｄ ｏｕｔｐｕｔｄａｔａ ｗｉｎｄｏｗ）를 확장시킬 수 있는 출력회로를구비하는 동기식 메모리장치 및 유효 출력 데이터 윈도우확장 방법
US6855607B2 (en) * 2003-06-12 2005-02-15 Advanced Micro Devices, Inc. Multi-step chemical mechanical polishing of a gate area in a FinFET

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI402683B (zh) * 2009-02-04 2013-07-21 Via Tech Inc 具有共享機制的資訊存取方法及其電腦系統

Also Published As

Publication number Publication date
US7499341B2 (en) 2009-03-03
US20070121397A1 (en) 2007-05-31
KR100655379B1 (ko) 2006-12-08

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