TW200714896A - Thermal shock test apparatus - Google Patents

Thermal shock test apparatus

Info

Publication number
TW200714896A
TW200714896A TW095122947A TW95122947A TW200714896A TW 200714896 A TW200714896 A TW 200714896A TW 095122947 A TW095122947 A TW 095122947A TW 95122947 A TW95122947 A TW 95122947A TW 200714896 A TW200714896 A TW 200714896A
Authority
TW
Taiwan
Prior art keywords
room
testing
temperature
low
high temperature
Prior art date
Application number
TW095122947A
Other languages
Chinese (zh)
Other versions
TWI308213B (en
Inventor
Hidehiro Sonoda
Yasuo Kawamoto
Shintaro Masuda
Haruyuki Inuzuka
Original Assignee
Hitachi Appliances Inc
Hitachi Kucho Se Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=37749237&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=TW200714896(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Hitachi Appliances Inc, Hitachi Kucho Se Ltd filed Critical Hitachi Appliances Inc
Publication of TW200714896A publication Critical patent/TW200714896A/en
Application granted granted Critical
Publication of TWI308213B publication Critical patent/TWI308213B/en

Links

Landscapes

  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

To improve the accuracy of a cold impact test by removing a test interruption time caused by a useless treating time of frosting or the like, and by setting quickly the internal temperature of a testing room at a prescribed low/high temperature. In this cold impact testing device equipped with the testing room 1 having a testing room door 23 opened/closed for storing a sample, a low temperature room 9, a high temperature room 14, and a machine room 21 wherein a refrigerator is arranged, cold wind from the low temperature room 9 or hot wind from the high temperature room 14 is supplied into the testing room 1. In the device also equipped with a packing 24 provided between the testing room 1 and the testing room door 23, and a pressure adjusting room 19 communicated with the testing room 1, wherein the air is enclosed, the air can flow into the testing room 1 from the pressure adjusting room 19 at a low-temperature testing time.
TW95122947A 2005-07-01 2006-06-26 Thermal shock test apparatus TWI308213B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005193294A JP3973224B2 (en) 2005-07-01 2005-07-01 Thermal shock test equipment

Publications (2)

Publication Number Publication Date
TW200714896A true TW200714896A (en) 2007-04-16
TWI308213B TWI308213B (en) 2009-04-01

Family

ID=37749237

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95122947A TWI308213B (en) 2005-07-01 2006-06-26 Thermal shock test apparatus

Country Status (2)

Country Link
JP (1) JP3973224B2 (en)
TW (1) TWI308213B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102356291A (en) * 2008-07-31 2012-02-15 汉密尔顿存储技术公司 Tube picking mechanism for automated, ultra-low temperature storage and retrieval system

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7861540B2 (en) * 2008-01-25 2011-01-04 Hamilton Storage Technologies, Inc. Automated storage and retrieval system for storing biological or chemical samples at ultra-low temperatures
JP5054599B2 (en) * 2008-04-17 2012-10-24 エスペック株式会社 Condensation suppression device and environmental test device equipped with the same
JP5006246B2 (en) * 2008-04-17 2012-08-22 エスペック株式会社 Environmental test equipment
JP5006247B2 (en) * 2008-04-17 2012-08-22 エスペック株式会社 Condensation suppression device and environmental test device equipped with the same
JP4960293B2 (en) * 2008-04-17 2012-06-27 エスペック株式会社 Thermal insulation panel and environmental test equipment
JP4997168B2 (en) * 2008-04-17 2012-08-08 エスペック株式会社 Condensation suppression device and environmental test device equipped with the same
JP2010085365A (en) * 2008-10-02 2010-04-15 Espec Corp Environmental testing apparatus and coldness storage device
JP5291534B2 (en) * 2009-05-22 2013-09-18 エスペック株式会社 Environmental test equipment
US9163869B2 (en) 2010-09-09 2015-10-20 Hamilton Storage Technologies, Inc. Tube picking mechanisms with an ultra-low temperature or cryogenic picking compartment
US20120060539A1 (en) 2010-09-10 2012-03-15 Hamilton Storage Technologies, Inc. Cassette Puller
CN105372143A (en) * 2015-11-18 2016-03-02 芜湖凯尔电气科技有限公司 Battery hot and cold impact resistance test case
JP6988722B2 (en) * 2018-07-17 2022-01-05 トヨタ自動車株式会社 All-solid-state battery test equipment
CN111521508B (en) * 2020-05-14 2023-04-07 安徽法雷特热交换科技有限公司 Cold and hot impact vibration-resistant test device for automobile radiator
CN113976190A (en) * 2021-11-12 2022-01-28 深圳市帝晶光电科技有限公司 Improve blind hole product crescent pixel light leak constant temperature and humidity machine for
CN114034594A (en) * 2021-11-22 2022-02-11 深圳市诺赛特系统有限公司 Chip pressing heat exchange device and cold-hot impact chip testing system
CN114674653B (en) * 2022-03-29 2023-03-24 盐城市泽楷建设有限公司 Concrete shrinkage test variable-temperature cabin for improving test comprehensiveness for building construction

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102356291A (en) * 2008-07-31 2012-02-15 汉密尔顿存储技术公司 Tube picking mechanism for automated, ultra-low temperature storage and retrieval system

Also Published As

Publication number Publication date
JP3973224B2 (en) 2007-09-12
TWI308213B (en) 2009-04-01
JP2007010531A (en) 2007-01-18

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Legal Events

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MM4A Annulment or lapse of patent due to non-payment of fees