TW200714893A - Apparatus for inspecting a substrate - Google Patents
Apparatus for inspecting a substrateInfo
- Publication number
- TW200714893A TW200714893A TW095134444A TW95134444A TW200714893A TW 200714893 A TW200714893 A TW 200714893A TW 095134444 A TW095134444 A TW 095134444A TW 95134444 A TW95134444 A TW 95134444A TW 200714893 A TW200714893 A TW 200714893A
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- stationary plate
- link levers
- back light
- inspecting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Nonlinear Science (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
An apparatus for inspecting a substrate 1 is provided with a holder rotating mechanism 3 for holding and rotating a test substrate W, a back light 5 which irradiates light onto a back side surface W2 that is opposed to a front side surface W1 of the test substrate W, and moving means 6 for moving the back light 5. A rotating arm 17, which constitutes the moving means 6, includes two link levers 19 and 20 and a stationary plate 21 which is a stationary member. The two link levers 19 and 20 are rotatably supported on a supporting member 16 at one ends (19a, 20a) thereof, respectively, the one ends being separated from one another by a predetermined distance. Further, the link levers 19 and 20 are rotatably supported on the stationary plate 21 at the other ends (19b, 20b) thereof, respectively, the other ends being separated from one another by a predefined distance. The back light 5 is fixedly secured to the stationary plate 12.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005283776A JP2007093411A (en) | 2005-09-29 | 2005-09-29 | Substrate inspection apparatus |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200714893A true TW200714893A (en) | 2007-04-16 |
TWI338775B TWI338775B (en) | 2011-03-11 |
Family
ID=37958913
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095134444A TWI338775B (en) | 2005-09-29 | 2006-09-18 | Apparatus for inspecting a substrate |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2007093411A (en) |
KR (1) | KR100824395B1 (en) |
CN (1) | CN100578202C (en) |
TW (1) | TWI338775B (en) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102033336B (en) * | 2009-09-24 | 2012-09-05 | 北京京东方光电科技有限公司 | Detection equipment and detection method of liquid crystal display device |
JP2011141127A (en) * | 2010-01-05 | 2011-07-21 | Avanstrate Taiwan Inc | Visual inspection method and visual inspection device for defect part of glass plate |
JP5854370B2 (en) * | 2012-02-13 | 2016-02-09 | 日本電気硝子株式会社 | Inspection apparatus and inspection method for phosphor-containing glass member |
CN105699400A (en) * | 2014-11-28 | 2016-06-22 | 中电电气(上海)太阳能科技有限公司 | Visual inspection device of toughened glass |
CN104865272A (en) * | 2015-05-11 | 2015-08-26 | 天津三瑞塑胶制品有限公司 | Glass adhesive tape appearance tester |
CN106950485A (en) * | 2017-03-24 | 2017-07-14 | 京东方科技集团股份有限公司 | A kind of tester substrate microscope carrier and substrate test equipment |
CN108508030A (en) * | 2018-05-17 | 2018-09-07 | 江苏东旭亿泰智能装备有限公司 | Glass substrate inspecting apparatus and the method for checking glass substrate using it |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05264992A (en) * | 1992-03-18 | 1993-10-15 | Mitsubishi Electric Corp | Lighting device |
JPH0973809A (en) * | 1995-09-05 | 1997-03-18 | Mitsubishi Denki Shomei Kk | Universal arm stand |
JP4182745B2 (en) * | 2002-12-17 | 2008-11-19 | 住友化学株式会社 | Visual inspection table |
JP4365603B2 (en) * | 2003-03-24 | 2009-11-18 | オリンパス株式会社 | Substrate inspection apparatus and substrate inspection method |
KR100506702B1 (en) * | 2003-05-06 | 2005-08-09 | 주식회사 디이엔티 | Substrate Inspection Apparatus |
KR20050013491A (en) * | 2003-07-28 | 2005-02-04 | 닛토덴코 가부시키가이샤 | Inspection method and inspection system of sheet type product |
JP2005249423A (en) * | 2004-03-01 | 2005-09-15 | Tokyo Cathode Laboratory Co Ltd | Visual inspection device for flat display panel |
-
2005
- 2005-09-29 JP JP2005283776A patent/JP2007093411A/en active Pending
-
2006
- 2006-09-18 TW TW095134444A patent/TWI338775B/en not_active IP Right Cessation
- 2006-09-26 KR KR1020060093479A patent/KR100824395B1/en not_active IP Right Cessation
- 2006-09-27 CN CN200610139399A patent/CN100578202C/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1940541A (en) | 2007-04-04 |
KR100824395B1 (en) | 2008-04-22 |
KR20070036680A (en) | 2007-04-03 |
JP2007093411A (en) | 2007-04-12 |
TWI338775B (en) | 2011-03-11 |
CN100578202C (en) | 2010-01-06 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |