TW200710417A - Testing device and program - Google Patents

Testing device and program

Info

Publication number
TW200710417A
TW200710417A TW095130965A TW95130965A TW200710417A TW 200710417 A TW200710417 A TW 200710417A TW 095130965 A TW095130965 A TW 095130965A TW 95130965 A TW95130965 A TW 95130965A TW 200710417 A TW200710417 A TW 200710417A
Authority
TW
Taiwan
Prior art keywords
control information
section
register
testing device
control
Prior art date
Application number
TW095130965A
Other languages
Chinese (zh)
Inventor
Mitsuru Sakai
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200710417A publication Critical patent/TW200710417A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

A testing device which tests a tested device is provided, the testing device includes a hardware section, which is connected with the tested device and performs the test of the tested device according to the given control information; and a control section, which pre-stores the control information and controls the hardware section. The control section includes a first register and a second register which store the control information; a control circuit, which is connected with the hardware section and controls the hardware section according to the first control information stored in the first register; and a write-in section, which writes the second control information that should be performed after the first control information into the second register during the period when the hardware section is operated according to the first control information.
TW095130965A 2005-08-23 2006-08-23 Testing device and program TW200710417A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005241710A JP2007057333A (en) 2005-08-23 2005-08-23 Tester and program

Publications (1)

Publication Number Publication Date
TW200710417A true TW200710417A (en) 2007-03-16

Family

ID=37771478

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095130965A TW200710417A (en) 2005-08-23 2006-08-23 Testing device and program

Country Status (3)

Country Link
JP (1) JP2007057333A (en)
TW (1) TW200710417A (en)
WO (1) WO2007023730A1 (en)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2551939B2 (en) * 1986-08-15 1996-11-06 日本電信電話株式会社 IC test equipment
JP2591199B2 (en) * 1989-12-13 1997-03-19 三菱電機株式会社 Semiconductor test equipment
JPH052249U (en) * 1991-06-21 1993-01-14 株式会社アドバンテスト Test pattern generator for logic semiconductor test equipment

Also Published As

Publication number Publication date
WO2007023730A1 (en) 2007-03-01
JP2007057333A (en) 2007-03-08

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