TW200707528A - System and method for wafer visual inspection - Google Patents

System and method for wafer visual inspection

Info

Publication number
TW200707528A
TW200707528A TW094126918A TW94126918A TW200707528A TW 200707528 A TW200707528 A TW 200707528A TW 094126918 A TW094126918 A TW 094126918A TW 94126918 A TW94126918 A TW 94126918A TW 200707528 A TW200707528 A TW 200707528A
Authority
TW
Taiwan
Prior art keywords
wafer
visual inspection
backside
carrying apparatus
light source
Prior art date
Application number
TW094126918A
Other languages
English (en)
Other versions
TWI278910B (en
Inventor
Kuo-Chung Liu
Tan-Cheng Chen
Ching-Sung Tai
Renn-Chung Chiu
Original Assignee
Powerchip Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Powerchip Semiconductor Corp filed Critical Powerchip Semiconductor Corp
Priority to TW094126918A priority Critical patent/TWI278910B/zh
Priority to US11/458,986 priority patent/US20070076196A1/en
Publication of TW200707528A publication Critical patent/TW200707528A/zh
Application granted granted Critical
Publication of TWI278910B publication Critical patent/TWI278910B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/9501—Semiconductor wafers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW094126918A 2005-08-09 2005-08-09 System and method for wafer visual inspection TWI278910B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW094126918A TWI278910B (en) 2005-08-09 2005-08-09 System and method for wafer visual inspection
US11/458,986 US20070076196A1 (en) 2005-08-09 2006-07-20 System and method for visual inspection of wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094126918A TWI278910B (en) 2005-08-09 2005-08-09 System and method for wafer visual inspection

Publications (2)

Publication Number Publication Date
TW200707528A true TW200707528A (en) 2007-02-16
TWI278910B TWI278910B (en) 2007-04-11

Family

ID=37901567

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094126918A TWI278910B (en) 2005-08-09 2005-08-09 System and method for wafer visual inspection

Country Status (2)

Country Link
US (1) US20070076196A1 (zh)
TW (1) TWI278910B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI671789B (zh) * 2016-07-12 2019-09-11 惠普發展公司有限責任合夥企業 複合式晶圓及其形成方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4789294A (en) * 1985-08-30 1988-12-06 Canon Kabushiki Kaisha Wafer handling apparatus and method
US5102280A (en) * 1989-03-07 1992-04-07 Ade Corporation Robot prealigner
US5043589A (en) * 1990-05-18 1991-08-27 Trigon/Adcotech Semiconductor device inspection apparatus using a plurality of reflective elements
KR100267617B1 (ko) * 1993-04-23 2000-10-16 히가시 데쓰로 진공처리장치 및 진공처리방법
US6405610B1 (en) * 1995-11-14 2002-06-18 Nikon Corporation Wafer inspection apparatus
US5887160A (en) * 1996-12-10 1999-03-23 Fujitsu Limited Method and apparatus for communicating integer and floating point data over a shared data path in a single instruction pipeline processor
US5909285A (en) * 1997-05-05 1999-06-01 Beaty; Elwin M. Three dimensional inspection system
US5959461A (en) * 1997-07-14 1999-09-28 Wentworth Laboratories, Inc. Probe station adapter for backside emission inspection
US5963315A (en) * 1997-08-18 1999-10-05 Motorola, Inc. Method and apparatus for processing a semiconductor wafer on a robotic track having access to in situ wafer backside particle detection
US6915007B2 (en) * 1998-01-16 2005-07-05 Elwin M. Beaty Method and apparatus for three dimensional inspection of electronic components
KR100364559B1 (ko) * 1998-09-17 2002-12-12 주식회사 뷰웰 반도체 리드 검사장치
US6204917B1 (en) * 1998-09-22 2001-03-20 Kla-Tencor Corporation Backside contamination inspection device
US6532063B1 (en) * 2000-11-10 2003-03-11 Semiconductor Technologies & Instruments 3-D lead inspection
KR20040039372A (ko) * 2001-09-21 2004-05-10 올림푸스 가부시키가이샤 결함 검사 장치
US7119351B2 (en) * 2002-05-17 2006-10-10 Gsi Group Corporation Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system
US7068363B2 (en) * 2003-06-06 2006-06-27 Kla-Tencor Technologies Corp. Systems for inspection of patterned or unpatterned wafers and other specimen
US7227628B1 (en) * 2003-10-10 2007-06-05 Kla-Tencor Technologies Corp. Wafer inspection systems and methods for analyzing inspection data

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI671789B (zh) * 2016-07-12 2019-09-11 惠普發展公司有限責任合夥企業 複合式晶圓及其形成方法
US10815121B2 (en) 2016-07-12 2020-10-27 Hewlett-Packard Development Company, L.P. Composite wafers

Also Published As

Publication number Publication date
US20070076196A1 (en) 2007-04-05
TWI278910B (en) 2007-04-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees