TW200639417A - PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus - Google Patents
PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatusInfo
- Publication number
- TW200639417A TW200639417A TW095100679A TW95100679A TW200639417A TW 200639417 A TW200639417 A TW 200639417A TW 095100679 A TW095100679 A TW 095100679A TW 95100679 A TW95100679 A TW 95100679A TW 200639417 A TW200639417 A TW 200639417A
- Authority
- TW
- Taiwan
- Prior art keywords
- inspection logic
- logic setting
- inspection
- images
- board inspecting
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/70—Testing of connections between components and printed circuit boards
- G01R31/71—Testing of solder joints
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Image Analysis (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Processing (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005003724 | 2005-01-11 | ||
JP2005352001A JP4736764B2 (ja) | 2005-01-11 | 2005-12-06 | 基板検査装置並びにその検査ロジック設定方法および検査ロジック設定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200639417A true TW200639417A (en) | 2006-11-16 |
TWI291561B TWI291561B (en) | 2007-12-21 |
Family
ID=36168468
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095100679A TWI291561B (en) | 2005-01-11 | 2006-01-06 | PC board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus |
Country Status (4)
Country | Link |
---|---|
US (1) | US20060153439A1 (zh) |
EP (1) | EP1679520A1 (zh) |
JP (1) | JP4736764B2 (zh) |
TW (1) | TWI291561B (zh) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4830767B2 (ja) * | 2006-10-02 | 2011-12-07 | オムロン株式会社 | 部品実装基板の品質表示データの作成方法およびプログラム |
JP4814116B2 (ja) * | 2007-01-29 | 2011-11-16 | 三菱重工業株式会社 | 実装基板外観検査方法 |
JP4840327B2 (ja) * | 2007-10-22 | 2011-12-21 | 株式会社デンソー | 外観検査方法 |
DE102010064640B3 (de) | 2009-05-13 | 2018-05-09 | Koh Young Technology Inc. | Verfahren zur Messung eines Messungsziels |
DE102010028894B4 (de) * | 2009-05-13 | 2018-05-24 | Koh Young Technology Inc. | Verfahren zur Messung eines Messobjekts |
KR101205970B1 (ko) * | 2010-11-18 | 2012-11-28 | 주식회사 고영테크놀러지 | 브리지 연결불량 검출방법 |
KR101642897B1 (ko) * | 2011-07-13 | 2016-07-26 | 주식회사 고영테크놀러지 | 검사방법 |
JP6034109B2 (ja) * | 2012-09-25 | 2016-11-30 | 株式会社総合車両製作所 | 窓材の外観検査装置及び窓材の外観検査方法 |
JP6461692B2 (ja) * | 2015-04-10 | 2019-01-30 | 株式会社レクザム | 基板検査装置 |
JP6521735B2 (ja) * | 2015-05-20 | 2019-05-29 | Juki株式会社 | 検査装置、検査方法及び検査装置で用いられるプログラム |
CA2977847A1 (en) * | 2017-01-27 | 2018-07-27 | Hootsuite Media Inc. | Automated extraction tools and their use in social content tagging systems |
JP2019027922A (ja) * | 2017-07-31 | 2019-02-21 | セイコーエプソン株式会社 | 電子部品搬送装置および電子部品検査装置 |
KR20190084167A (ko) * | 2017-12-21 | 2019-07-16 | 주식회사 고영테크놀러지 | 인쇄 회로 기판 검사 장치, 스크린 프린터의 결함 유형 결정 방법 및 컴퓨터 판독 가능한 기록 매체 |
JP7214432B2 (ja) * | 2018-10-22 | 2023-01-30 | キヤノン株式会社 | 画像処理方法、画像処理プログラム、記録媒体、画像処理装置、生産システム、物品の製造方法 |
CN113240618A (zh) * | 2020-01-23 | 2021-08-10 | 株式会社理光 | 工件检测方法、装置及计算机可读存储介质 |
US11599988B2 (en) * | 2020-09-11 | 2023-03-07 | Super Micro Computer, Inc. | Inspection of circuit boards for unauthorized modifications |
JP2022123234A (ja) * | 2021-02-12 | 2022-08-24 | オムロン株式会社 | 画像検査装置、画像検査方法及び学習済みモデル生成装置 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG66545A1 (en) * | 1988-05-09 | 1999-07-20 | Omron Tateisi Electronics Co | Apparatus for inspecting printed circuit boards and the like and method of operating the same |
JP3250309B2 (ja) * | 1993-03-02 | 2002-01-28 | オムロン株式会社 | 実装部品検査用データの教示方法 |
JPH06273346A (ja) * | 1993-03-24 | 1994-09-30 | Hitachi Denshi Ltd | はんだ付け状態検査装置 |
US5544256A (en) * | 1993-10-22 | 1996-08-06 | International Business Machines Corporation | Automated defect classification system |
US5548697A (en) * | 1994-12-30 | 1996-08-20 | Panasonic Technologies, Inc. | Non-linear color corrector having a neural network and using fuzzy membership values to correct color and a method thereof |
JPH08247960A (ja) * | 1995-03-14 | 1996-09-27 | Adtec Eng:Kk | 外観検査装置 |
KR0176661B1 (ko) * | 1995-12-28 | 1999-05-15 | 김광호 | 납땜부 검사방법 및 검사장치 |
KR100200215B1 (ko) * | 1996-04-08 | 1999-06-15 | 윤종용 | 상관 신경 회로망을 이용한 납땜 검사 장치 및방법 |
US6236747B1 (en) * | 1997-02-26 | 2001-05-22 | Acuity Imaging, Llc | System and method for image subtraction for ball and bumped grid array inspection |
ATE246803T1 (de) * | 1997-05-05 | 2003-08-15 | Macrotron Process Technologies | Verfahren und schaltungsanordnung zur prüfung von lötstellen |
JP3120767B2 (ja) * | 1998-01-16 | 2000-12-25 | 日本電気株式会社 | 外観検査装置、外観検査方法及び外観検査プログラムを記録した記録媒体 |
US6088109A (en) * | 1998-09-24 | 2000-07-11 | Advanced Semiconductor Engineering, Inc. | System for detecting the presence of deposited metals on soldering points of an integrated circuit board substrate |
US7062080B2 (en) * | 2001-11-26 | 2006-06-13 | Omron Corporation | Method of inspecting curved surface and device for inspecting printed circuit board |
JP3551188B2 (ja) * | 2002-01-10 | 2004-08-04 | オムロン株式会社 | 表面状態検査方法および基板検査装置 |
JP4190243B2 (ja) * | 2002-09-30 | 2008-12-03 | 日本特殊陶業株式会社 | 電子回路用部品の外観検査方法及び外観検査装置並びに電子回路用部品の製造方法。 |
US7019826B2 (en) * | 2003-03-20 | 2006-03-28 | Agilent Technologies, Inc. | Optical inspection system, apparatus and method for reconstructing three-dimensional images for printed circuit board and electronics manufacturing inspection |
-
2005
- 2005-12-06 JP JP2005352001A patent/JP4736764B2/ja not_active Expired - Fee Related
-
2006
- 2006-01-06 TW TW095100679A patent/TWI291561B/zh active
- 2006-01-11 EP EP06100242A patent/EP1679520A1/en not_active Withdrawn
- 2006-01-11 US US11/329,432 patent/US20060153439A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
EP1679520A1 (en) | 2006-07-12 |
TWI291561B (en) | 2007-12-21 |
JP2006220648A (ja) | 2006-08-24 |
JP4736764B2 (ja) | 2011-07-27 |
US20060153439A1 (en) | 2006-07-13 |
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